shielding_of_gamma_radiation
磁星能量注入模型拟合伽玛射线暴X射线余辉光变曲线
天 文 学 报
ACTA TRONOM I AS CA I CA S NI
V015 N O. .2 4 Ju1.2011 .
磁 星能量注 入模 型拟合伽 玛射 线暴 X 射线 余辉光变 曲线术
胡 方 浩 , 2 十
( 1南京大学天文系 南京 2 0 9 ) 1 0 3 ( 2中国科学 院紫金 山天文 台 南京 2 0 0 ) 1 0 8
2 1 - 一 7收 到 原 稿 , 2 1 -21 收到 修 改 稿 0 1叭 2 0 10 —8
国家 自然科学基金项 目 (0 7 0 9 1 8 3 0 )资助
十fl u ̄pm o a C . n lh c
.
4期
胡方浩:磁星能量注入模型拟合伽玛射线暴 X 射线余辉光变曲线
29 8
摘 要
某些伽玛射线暴 ( 简称伽玛暴) 心致密天体可能是一颗具有强磁场的 的中 毫秒
脉冲星,它通过磁偶极辐射可对伽玛暴外激波注入能量,从 而导致早期余辉光变 曲线的变 平.近年来,从 S i 卫 星观测到的大量伽玛暴 x 射线余辉 中发现,很多 x 射线余辉 光 wf t 变 曲线在暴后 1 0 期间的确存在 明显 的变平现象.利用周期为毫秒 量级 的磁 星能量 0 一l S 注入模 型对 1 1个伽玛暴的 x 射线余辉光变 曲线进行 了拟合,显示该模型在解 释余辉变平 现象上的有效性和广泛性,通过对余辉光变曲线的拟合,同时也给出了相 关中心磁 星的磁 场强度和旋转周期.
出并 且偏 离观测 者视 线 ,则 因为 集束效 应 ,开始 的时 候观 测者 将无 法看 到辐射 .之后 , 因为喷流 减速 ,集 束效应 变 弱,辐射 进入 观 测者 的视 线之 内,如 此可 以导致 光变 曲线 变 平 .基 于偏轴 观测模 型 , G ao 等 _ 和 J rn t 9 ] i n等 分别 进 一步提 出双 成分 的喷流 ,其 中 窄成分 的 洛伦兹 因子很 高 ,产 生伽 玛暴 的 瞬时辐 射 ,而 宽成 分 的洛伦 兹 因子 相对 较低 但
QG2000 放射性源容器说明书
TI427F/00/en/05.0971063732Technical InformationSource Container QG2000US versionRadiometric MeasurementContainer with sliding source holder rod for manual ON/OFF switchingApplicationThe source container QG2000 encloses the radioactive source used for radiometric limit, level and density measurement. It allows the beam to emerge unattenuated only in one direction and gives an extremely high attenuation in all other directions.When operating with very high sensitivity rodscintillation detectors, the QG2000 provides the lowest possible radiation loads in the surrounding.It is therefore always used if the shielding effects of smaller source containers (QG020/100) are too low due to the high activity of the source or if no control area is permitted.The QG2000 complies to all international standards and fulfils the strict requirements of the chemical industry.Features and Benefits•Extremely high shielding ensure that no control areas are generally required and that installation in accessed areas is possible.•Simple and safe source replacement.•Highest safety classification for the source supplied (DIN 25426/ISO 2919, Classification C 66646).•Additional metallic protective hood with O-ring seal to protect the source against mechanical and chemical influences.•Low space requirement and simple mounting•Various angles of emission for optimum adaption to the application.•Padlock for fixing the OFF switch position and to pro-tect against theft.•Easy identification of switch status through sight glasses on the cover or by remote display withproximity switches.Source Container QG2000 US2Endress+HauserTable of ContentsFunction and System Design . . . . . . . . . . . . . . . . . . . . .3Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3System Design . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3Attenuation factor and half-value layers . . . . . . . . . . . . . . . 3Radioactive Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . .4Level Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4Density measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4Level limit detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5Mounting position. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5Ambient conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5Mechanical Construction . . . . . . . . . . . . . . . . . . . . . . . .6Design, size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6Fitting position/emission angle (when switched on). . . . . . 6Width of the beam emission channel (when switched on) . 7Weight . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7Housing materials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7Shielding material . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7Mounting plate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7Bracket . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7Ambient conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . .8Protection against external influences . . . . . . . . . . . . . . . . 8Ambient temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8Fire resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8Operating elements . . . . . . . . . . . . . . . . . . . . . . . . . . . .8Standard design . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8Design with proximity switches for remote displayof switch status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8Certificates and Approvals . . . . . . . . . . . . . . . . . . . . . . .9Specific license . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9PTB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9German Lloyd . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9Proximity switches supplied by Pepperl+Fuchs . . . . . . . . . .9Ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . .9Product structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9Delivery . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9Supplementary Documentation . . . . . . . . . . . . . . . . . .10System Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10Operating Instructions. . . . . . . . . . . . . . . . . . . . . . . . . . . 10Technical Information . . . . . . . . . . . . . . . . . . . . . . . . . . .10Certificates . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10Special documentation . . . . . . . . . . . . . . . . . . . . . . . . . . .10Safety manual . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10Source Container QG2000 USEndress+Hauser 3Function and System DesignFunctionThe radioactive source is surrounded by a lead shielding in the QG2000 source container to screen the gamma radiation. The radiation can only be emitted along one channel almost unattenuated. The limit values set for local dosages are not exceeded even with maximum activity.System DesignThe stainless steel housing ensures that the radiation source and lead shielding cannot be lost when the housing is heated above the melting point of lead (tested to DIN VDE 0412-1, Section 6.4, i.e. 30 min at 800 °C (1472 °F)).The double sealed source itself is protected from mechanical and chemical influences by a stainless steel pro-tective hood with an O-ring seal and can be placed in the emission channel (switching ON the radiation) and removed from it (switching OFF) by sliding the source holder rod. The mechanical resistance of the switching device has been tested according to DIN VDE 0412-1, Section 9.4.The switch position OFF is secured by a padlock. It can easily be observed through the sight glasses from outside the container or can be transmitted to a remote electronic display in the control room.Attenuation factor and half-value layers* approximate valuesRadioactive SourceThe following table identifies the source model, isotope and activity level that can be used in the QG2000 series gauges:!Note!Cesium-137 is not authorized for use in the QG 2000 series.#Warning!This source container contains radioactive material.For safety instructions see Radiation Safety Manual SD276F/00/en.60CoAttenuation factor F S *4.096Number of half-value layers *12QG Series Source ModelIsotope Maximum Activity QG2000CKC.P4Co-601 Ci (37 GBq)Source Container QG2000 US4Endress+HauserOperating ConditionsLevel MeasurementIn order to ensure stable measurement and lasting radiation protection, the QG2000 must be tightly screwed onto a rugged, low-vibration bracket that can withstand a weight of 315 kg (695 lb) under all operating con-ditions. Additional supports are generally required when mounting directly onto the vessel. A fastening for a crane on the QG2000 is provided for transporting it.The source container must be mounted slightly above or at the same height as the maximum level. The radi-ation must be exactly directed towards the compact transmitter mounted opposite. To avoid control areas, the source container and compact transmitter should be mounted as near to the vessel as possible.Density measurementFor density measurements, a clamp connection is available for pipe mounting.The clamp connection must be separately supported to ensure that the weight of the source container (315kg!/ 695lb!) does not cause the pipe to bend.When using the QG2000 on ships or dredgers, the fastenings on the piping must be suited to the loads occuring and appropriate supports should be provided.Mount the sensor to vertical pipelines with the direction of conveyance from bottom to top to obtain the most constant conditions for density measurements in pipes. If only horizontal piping is accessible, then the radiation path should be horizontal to reduce the effects of air bubbles and build-up of material. A clamping device is available for mounting on piping. Support the clamping device separately to avoid the weight of the QG2000 (315kg / 695lb) from acting on the pipe.Source Container QG2000 USLevel limit detectionthat the radiation runs horizontally.Mounting position Note!The radiation source container QG2000 may not be mounted at a height greater than 27 feet.Ambient conditions Entry of particles or waterThe source holder rod of the QG2000 has an additional metallic hood with an O-ring seal to prevent particlesand streams of water from entering (ingress protection IP 65 acc. to IEC EN 60529).Ambient temperature (without proximity switches for remote display):T = -20 °C...200 °C (-4 °F...392 °F)Ambient temperature (with proximity switches for remote display):T = -20 °C...100 °C (-4 °F...392 °F)Fire resistanceTested to DIN VDE 0412-01, Section 6.4, i.e. 30 min at 800 °C (1472 °F).Endress+Hauser5Source Container QG2000 US6Endress+HauserMechanical ConstructionDesign, sizeFitting position/emission angle (when switched on):•standing/horizontal •standing/verticalwith horizontal beam emission with one angle (standard):α = 20° or α = 40° (measured from the horizontal downwards)with horizontal beam emission with two angles (individually selectable):α = 0°...45° (measured from the horizontal downwards)β = 0°...75° (measured from the horizontal upwards)Both angles can be selected in steps of 5°.with vertical beam emission with one angle (standard):α = 20° or α= 40°Source Container QG2000 USEndress+Hauser 7Width of the beam emission channel (when switched on)The width of the emission channel is 6° for all designs.The emission channel is marked on the external container wall.Weightapprox. 315 kg (695 lb) for all designsHousing materialsStainless steel SS 316Ti (1.4571), for surface treated versions:•glass bead blasted •epoxy enamel coating •seawater-resistant coating Shielding material LeadMounting plateBracketNote!In order to ensure stable measurement and lasting radiation safety officer, the QG2000 must be tightly screwed onto a rugged, low-vibration bracket that can withstand a weight of 315 kg (695 lb) under all operating con-ditions. Additional supports are generally required when mounting directly on the vessel.Especially when using the QG2000 on ships or dredgers, the fastenings on the piping must be able to take the weight of any loads placed on them and appropriate supports provided.The screw joint dimensions are contained in the table (see figure).Source Container QG2000 US8Endress+HauserAmbient conditionsProtection against external influencesThe source holder rod of the QG2000 is protected from external influences by an additional metallic hood sealed by O-ring (ingress protection IP 65 to acc. IEC EN 60529).Ambient temperaturewithout initiators for remote displayT = -20 o C...200 o C (-4 °F...392 °F) (Class 3 to DIN VDE 0412-01)with initiators for remote displayT = -20o C...100 o C (-4 °F...212 °F) (Class 2 to DIN VDE 0412-01)Fire resistanceTested to DIN VDE 0412-1, Section 6.4, i.e. 30 min at 800 °C (1472 °F).Operating elementsStandard design•ON/OFF switching by manually sliding the source holder rod •Fixing and securing the switching status in OFF with a padlock •Reading off the switching status through the sight glassesDesign with proximityswitches for remote display of switch statusIn addition to the sight glasses supplied, with this design the switching status is also detected by two proximity switches NJ4-12GK-SN supplied by Pepperl+Fuchs.For signal evaluation, the following isolating switch amplifiers from, e.g. Pepperl+Fuchs can be used:KFD2-SH-Ex1 (24V DC)The Pg 12 cable glands on the connecting box are assigned to the proximity switches on delivery. The Pg 16 cable gland connects the isolating switch amplifier.The Pg 12 cable glands on the connecting box are assigned to the initiators on delivery. The Pg 16 cable gland connects the isolating switch amplifierThe table below shows the pin assignment:The connecting diagram is also provided inside the connecting box cover.Terminals 1, 2Initiator for position "radiation ON"Terminals 3, 4Initiator for position "radiation OFF"11234234Pg 12ONOFFSource Container QG2000 USEndress+Hauser 9Certificates and ApprovalsSpecific license The QG2000 series is only authorized to be distributed as a specifically licensed device.PTBIsodose curve with 60Co (37GBq/1000 mCi).German LloydFor applications on dredgers.Proximity switches supplied by Pepperl+FuchsIngress protection IP 67 to IEC 60529.Ordering informationProduct structure1)α: 0...45° / β: 0...75°DeliveryGermanyRadioactive sources may only be delivered when we have received a copy of the authorisation for handling radioactive materials. Endress+Hauser will gladly help you acquire the necessary documents. Please contact your nearest Sales Organization.For reasons of safety and cost, the radioactive source is usually shipped already loaded in the source container. Arrangements can also be made to ship the source seperately in a special transport drum.They will only be transported by approved shipping agents according to current GGVS/ADR guidelines, with all safety regulations being observed.Other countriesRadioactive sources may only be delivered when we have received a copy of the import license. Endress+Hauser will gladly help you acquire the necessary documents. Please contact your nearest Sales Organization.We can only deliver radioactive sources in their source containers.They will only be transported by approved shipping agents according to current GGVS/ADR and DGR/IATA guidelines, with all safety regulations being observed.DesignV US, manual ON/OFFW US, manual ON/OFF, remote indicationRadiation shielding 1Standard shieldingFitting position/Emission angle A Standing/horizontal B Standing/verticalEmission angle 120°240°3Specified in 5°-steps (α and β) 1)MaterialA SS 316Ti (1.4571) glass bead blastedB SS 316Ti (1.4571) epoxy enamel coatingC SS 316Ti (1.4571) seawater-resistant coatingAdditional options 1Option not selectedS GL (Germanischer Lloyd) marine certificateDocumentation A No documentationC PTB isodose curve with 60Co (37 GBq/1000 mCi)D Isodose curve for 60CoQG2000Product designationSource Container QG2000 USUSAThe source container must be shipped with the radioactive source already installed. The shutter will be securedin the OFF position with a padlock and security seal. The shipment will be a "Type A" package and all marking,labeling and documentation will comply with U.S. Department of Transportation (DOT) regulations. Transportwill be by common carrier, or other entity authorized to carry radioactive material.Shipments to Specific Licensees cannot be made until we have a copy of the Specific License authorizingreceipt, possession and use of the radioactive material. Endress+Hauser will be happy to assist with procuringthis license if desired.Shipments to General Licensees (a regulatory license issued for certain inherently safe devices containing sealedsources) cannot be made until we have written authorization from the user which contains the name andtelephone number of the person on site who will be responsible for the device.Contact our local sales center for questions or assistance.Supplementary DocumentationSystem Information CP017F/00/enRadiometric measurement technologyOperating Instructions BA370/00/enOperating instructions for the source container QG2000Technical Information TI213F/00/enTechnical Information on gamma radiation sourcesTI428/00/enTechnical Information for the source container QG020/100TI363/00/enTechnical Information for Gammapilot FMG60Certificates ZE251F/00/deTest certificate Germanischer Lloyd (for applications on dredgers)Special documentation SD142F/00/enSupplementary Safety Instructions for Radioactive Sources and Source Containers approved for Use in Canada Safety manual SD276F/00/enRadiation Safety Manual10Endress+HauserSource Container QG2000 USEndress+Hauser11TI427F/00/en/05.0971063732FM+SGML 6.0 ProMoDo 71063732Instruments International Endress+HauserInstruments International AG Kaegenstrasse 24153 ReinachSwitzerlandTel.+41 61 715 81 00Fax +41 61 715 25 ***************.com。
美采取措施保护伽玛射线观测台
美 国 防部 从 1 9 8 0 年 以来对 辐 射造 成 的影 响 是 很 清楚 的
到 1 9 8 8 年才公 开
。
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但 一 直保 密
直
美 国 防 情报 局 利影 响
。
(DIA )
:
的报 告 指 出
“
,
核 反应 堆 对某 些 科 学任 务有不
1 8 和 1 8 6 7 卫 星 等 系 统产 生的
N A SA
, ,
。
官员说 近 期 内 仪器 损坏 还 不 致成为问题
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但 如果 空 间 核反 仪 器
应堆越 来越 多
总有 一 天 要 酿 成灾难
”
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G R O 可 能 受 到影 响 的主 要
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是
“
爆 发 与 瞬变源 试 验 仪
。
(B A T S E )
它用 于研 究不 明 天 体 源 引 起
的伽 玛 射 线 的爆 发
,
其 中一 份 报告说
像 苏联 宇 宙 1 8
,
正 电 子 及 电 子 辐 射在 日 益 增 强
其 轨道 寿命 也在 延 长
使 在 近 地轨 道 运
行的 高 灵 敏度 伽 玛 射 线仪 器造 成 了根本性 损害
,
“
那 些 飞 得 高的核 动力
卫 星 已严 重影 响 了 高 灵 敏度 的进行 天 体和 太 阳观 测 的伽玛光 谱 仪 的 性
美 采 取 措 施 保 护 伽 玛 射 线 观 测 合
美 国航 宇局 因 日 益 恶化 的局 面
玛 射线观 测 台 ( G R O ) 的运 行 射对 美 G 员说
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不 得 不 改变其价值
核电英语
钴60全挡所需要的铅厚度
钴60全挡所需要的铅厚度1. 引言钴60(Co-60)是一种广泛应用于医疗、工业和科学研究领域的放射性同位素。
由于其高能射线的特性,使用钴60需要采取适当的辐射防护措施,以保护人员和环境免受辐射伤害。
在辐射防护中,铅常被用作一种屏蔽材料,本文将探讨在钴60全挡过程中所需的铅厚度。
2. 钴60全挡原理钴60发出的主要辐射是高能伽马射线。
为了有效地阻挡这些伽马射线,我们需要使用具有高密度和高原子序数的材料进行屏蔽。
铅是一种常用的屏蔽材料,因其密度高、吸收能力强而被广泛应用于放射性同位素的防护。
3. 确定铅厚度的方法确定钴60全挡所需的铅厚度需要考虑以下几个因素: - 辐射源活度:活度越高,所需屏蔽厚度越大。
- 距离辐射源的距离:距离越远,所需屏蔽厚度越小。
- 辐射防护目标:不同应用领域对辐射防护的要求不同,因此所需屏蔽厚度也会有所差异。
一种常用的方法是根据半衰期和活度计算所需的半衰厚度,然后通过查表或使用计算工具确定相应的铅厚度。
4. 半衰期与半衰厚度钴60的半衰期为5.27年。
半衰厚度是指在材料中使辐射强度减半所需穿透材料的厚度。
根据指数衰减定律,可以使用以下公式计算半衰厚度:H = (0.693 * T) / μ其中,H为半衰厚度(单位:cm),T为半衰期(单位:年),μ为线性吸收系数(单位:cm^-1)。
5. 线性吸收系数线性吸收系数是一个材料特性,表示材料对射线吸收能力的大小。
它与材料的密度和原子序数有关。
铅具有较高的线性吸收系数,因此是用于钴60全挡的理想材料之一。
6. 铅厚度计算通过将半衰厚度与铅的线性吸收系数结合,我们可以计算出钴60全挡所需的铅厚度。
以下是一个示例计算:假设钴60辐射源活度为100 Ci,距离辐射源1米,我们希望将辐射强度降低到背景水平以下(通常为0.1 mR/h)。
根据半衰期和活度的关系,我们可以计算出半衰厚度为0.257 cm。
根据线性吸收系数的表格,铅的线性吸收系数约为0.15 cm^-1。
辐射安全常识-PPT精品
Microwave cell phone radio / TV heat lamp
light bulb UV lamp laser x-rays
Ionizing Radiation
Alpha Particles
2 Protons + 2 Neutrons Short Range in Air Not an External Hazard Internal Hazard
Detectors/ Monitors
Detectors/ Monitors
1) Capable of Detecting 2) Efficiency 3) Calibration
Industrial Uses of Radiation
/rpdweb00/source-reduction-management/applications.html
Spent Fuel - Withdrawn from a nuclear reactor following irradiation
High-level waste - Highly radioactive material from reprocessing spent nuclear fuel
Activity
• Decay is a statistical process.
– Cannot predict when a particular atom will decay.
– Can predict when certain amount (%) will have decayed.
Units of Activity
Curie (Ci)
– 1 Ci = 37,000,000,000 dps (3.7 x 1010 dps) or 1 Ci = 2.22 x 1012 dpm
伽玛暴X射线耀发
X射线耀发:BeppoSAX的早期观测
GRB 011121
GRB 011211
Piro et al., 2005, ApJ 623, 314
X射线耀发:Swift的发现
t-1.6
XRF 050406
t-0.5
t9.5 t-9.5
t-0.8
GRB 050502B
长暴
Burrows et al., 2005, Science 309, 1833
内容
1997-2005伽玛暴研究进展 X射线耀发的中心能源机制 X射线耀发时变的“滞后内激波和外激波”解释
内容
1997-2005伽玛暴研究进展 X射线耀发的中心能源机制 X射线耀发时变的“滞后内激波和外激波”解释
伽玛暴现象
伽玛暴的空间各向同性分布
伽玛暴光变曲线
轮廓
2.8Msun的中子星有可能存在
B-field (initially poloidal)
当
大质量中子星
core
可忽略
crust
Dai, Wang, Wu & Zhang, 2006, Science, 311, 1127
B-field (poloidal)
大质量中子星
core B-field (toroidal)
谢谢!
1. 红移较低 (050509b,z=0.225;050709,z=0.16;050724,z=0.257;050823,z=0.722;0512 21,z=0.546);
2. 典型的各向同性能量为1048 – 1050 erg, 比长暴低2-3个 量级(051221除外,1051.3 erg,MHD?,Prof.Wang DX );
放射性同位素伽玛源准直照射辐射场模拟研究
·核科学与工程·放射性同位素伽玛源准直照射辐射场模拟研究*黄宇晨1,2, 钱易坤1,2, 冯 鹏2, 刘易鑫1, 张 颂1,2,何 鹏2, 魏 彪2, 毛本将1, 朱亚地1(1. 中国工程物理研究院 核物理与化学研究所,四川 绵阳 621900; 2. 重庆大学 光电技术及系统教育部重点实验室,重庆 400044)摘 要: 针对各向同性伽玛源参考辐射场尺寸关键技术问题,GB/T 12162系列标准虽然进行了相关规定,但是该规定并未对准直照射状态下照射室尺寸提出具体要求。
为减小用于辐射检测或监测类仪器仪表检定与量值校准时伽玛参考辐射场内散射影响,本文采用蒙特卡罗方法,研究了同位素放射源准直照射时,照射室尺寸变化对检验点处的剂量率值与能量分布的影响情况,获得了准直照射时伽玛辐射场照射室尺寸的边界条件,建立并完善了伽玛参考辐射场边界研究方法及相关标准细节,为准直照射状态下照射室尺寸设计提供了一种新方法或途径。
关键词: 核仪器仪表校准; 参考辐射; 准直照射; 蒙特卡罗; 边界条件 中图分类号: TL72 文献标志码: A doi : 10.11884/HPLPB202133.200294Simulation of radiation field from isotopic gamma source collimationHuang Yuchen 1,2, Qian Yikun 1,2, Feng Peng 2, Liu Yixin 1, Zhang Song 1,2,He Peng 2, Wei Biao 2, Mao Benjiang 1, Zhu Yadi 1(1. Institute of Nuclear Physics and Chemistry , CAEP , Mianyang 621900, China ;2. Key Laboratory of Optoelectronic Technology & Systems , Ministry of Education , Chongqing University , Chongqing 400044, China )Abstract : Aiming at the key technical issues of the reference radiation field size of isotropic sources, GB/T 12162 series of GB standards stipulates the size of the reference radiation field when using an isotropic source.However, there is no specific regulation for the size of the irradiation under collimation. To reduce the influence of scattering in the gamma reference radiation field when used for radiation detection or monitoring instrument verification and value calibration, Monte Carlo simulation was carried out to explore the effect of the size change of the irradiation chamber on the energy distribution and dose rate value during the radiation source collimation. The boundary conditions of the collimated gamma radiation irradiation chamber were obtained, and the details of the gamma reference radiation field boundary research method and related standards are established and improved. The study provides a new method or approach for the size design of the irradiation chamber under the collimated irradiation state.Key words : nuclear instrument calibration ; reference radiation ; collimated irradiation ; Monte Carlo ;boundary conditions众所周知,核电站与核设施场所中,伽玛射线辐射剂量(率)仪表不仅是辐射防护工作必需的重要工具,更是监测和保障核应用场所与射线应用装置安全的必要条件。
ROHS最新豁免清单
ROHS最新豁免清单RoHS(2011/65/EU)指令附件IIIRoHS Directive (2011/65 / EU) annex III附件III是指投放市场的电⼦电⽓产品包括其维修部件或再利⽤或者电缆或者升级其功能/容量的部件中的豁免条例。
RoHS directive (2011/65 / EU) annex III is the exemption rules of EEE placed on the market, including cables and spare parts for its repair, its reuse, updating of its functionalities or upgrading of its capacity.RoHS Annex III最新豁免条款RoHS Annex III Exemption list——截⽌2015年1⽉30⽇ROHS Annex IV-医疗设备和监测/控制设备豁免清单ROHS Annex IV-Applications exempted to medical devices and monitoring and control instruments—截⽌⽇期2015年1⽉30⽇利⽤或检测电离辐射的设备Equipment utilising or detecting ionising radiation1、电离辐射检测器中的铅、镉和汞Lead, cadmium and mercury in detectors for ionising radiation.2、 X射线管中的铅轴承Lead bearings in X-ray tubes.3、电磁辐射放⼤器(微通道板和⽑细板)中的铅Lead in electromagnetic radiation amplification devices: micro-channel plate and capillary plate.4、 X射线管和图像增强器的玻璃粉中的铅,⽓体激光器和真空电⼦管中将电磁辐射转换为电⼦的部件所⽤的玻璃粉粘合剂中的铅。
医用电子直线加速器的屏蔽计算
医用电子直线加速器的屏蔽计算摘要:本程序依据NCRP REPORT No.151《Structural Shielding Design andEvaluation for Megavoltage X- and Gamma-Ray Radiotherapy Facilities 》编制而成,可用于低能(≤10MV )及高能(>10MV )医用电子直线加速器的屏蔽计算。
注:以上各点通常取墙体或者防护门外0.3m 处一、主屏蔽墙(Primary barriers )(a 、b 点)利用下列公式对初级辐射进行屏蔽计算:2pri pri pri B WUT H d = 1{1[]}10barrier e t TVL TVL pri B −−+=式中:H pri —距离加速器等中心点(isocenter )dpri 米处,屏蔽条件下的剂量当量率(Sv/a 或者Sv/week )。
加速器中,各种运动的基准轴线围绕一个公共中心点运动,辐射束以此为中心的最小球体内通过,此点即为等中心。
辐射源正常治疗距离辐射束轴等中心机架旋转轴B pri—主屏蔽墙的厚度对应的透射因子;t barrier—主屏蔽墙的厚度,m;TVL1—第一个十分之一值层厚度(取值见TableB.2),cm;TVL e—平衡时的十分之一值层厚度(取值见TableB.2),cm;W—工作负荷,Gy/a或者Gy/week;NCRP建议:对于低能(≤10MV)加速器W可取1000Gy/week;对于高能(>10MV)加速器W可取500Gy/week。
(NCRP Report No. 49 (NCRP, 1976) recommended using W = 1,000 Gy week–1 for accelerators up to 10 MV, and NCRP Report No. 51 (NCRP 1977) recommended W = 500 Gy week–1 for higher energy accelerators. These workloads were recommended if a value for W could not be determined from direct knowledge of the accelerator use.)U—使用因子,即初级辐射束(有用束)向某有用束屏蔽方向照射的时间占总照射时间的份额,使用因子U 的取值见表1。
国外主要无损检测标准(含中英文名称对照)
ASTM A 754/A 754M-1996X射线荧光法测量涂层厚度的试验方法Test Method for Coating Thickness by X-Ray FluorescenceASTM B567-1998用β射线背散射法测量涂层厚度的试验方法Test Method for Measurement of Coating Thickness by the Beta Backscatter MethodASTM B568-1998χ射线光谱仪法测量涂层厚度的试验方法Test Method for Measurement of Coating Thickness by X-Ray SpectrometryASTM C637-1998辐射屏蔽混凝土用集料的标准规Standard Specification for Aggregates for Radiation-Shielding ConcreteASTM C638-1992辐射屏蔽混凝土集料组分的描述术语Descriptive Nomenclature of Constituents of Aggregates for Radiation-Shielding Concrete ASTM C1455-2000用γ射线谱法无损检定仍然有效特殊核材料指南ASTM D2599-1987X射线光谱法测定汽油含铅量的试验方法(05.02)Test Method for Lead in Gasoline by X-Ray Spectrometry (05.02)ASTM D4294-1998用非色散X射线荧光光谱法测定石油产品中含硫量试验方法Sulfur in Petroleum Products by Non-Dispersive X-Ray Fluorescence Spectrometry, Method of Test for (05.02)ASTM D4452-1985土壤样品的X射线照相法X-Ray Radiography of Soil SamplesASTM D5059-1998X-射线光谱法测定汽油含铅量的试验方法Test Method for Lead in Gasoline by X-Ray Spectroscopy (05.03)ASTM D5187-1991X射线衍射法测定煅烧石油焦炭中结晶尺寸(LC)的试验方法Test Method for Crystallite Size (LC) of Calcined Petroleum Coke by X-Ray Diffraction (05.03) ASTM D6247-1998X射线荧光光谱法分析聚烯烃中元素含量的试验方法Test Method for Analysis of Elemental Content in Polyolefins by X-Ray Fluorescence Spectrometry ASTM E94-2004(2010)射线照相检验标准指南Standard Guide for Radiographic Examination ASTM E142-1996射线照相检测的质量控制方法Method for Controlling Quality of Radiographic TestingASTM E155-2010铝镁合金铸件射线照相检验标准参考照片Standard Reference Radiographs for Inspection of Aluminum and Magnesium CastingsASTM E170-1999有关辐射测量和剂量测定的术语ASTM E181-1998放射性核素探测器的校准和分析的一般方法General Methods for Detector Calibration and Analysis of RadionuclidesASTM E186-2010厚壁(50.8-114mm)钢铸件标准参考射线照片Standard Reference Radiographs for Heavy-Walled (2 to 4 1/2-In./50.8 to 114-mm) Steel Castings ASTM E192-2004(2010)e1宇航用熔模钢铸件标准参考射线照片Standard Reference Radiographs for Investment Steel Castings of AerospaceApplicationsASTM E242-2001(2010)某些参数改变时射线照相图象显示的标准参考射线照片Standard Reference Radiographs for Appearances of Radiographic Images asCertain Parameters Are ChangedASTM E272-2010高强度铜基及镍铜合金铸件的标准参考射线照片Standard Reference Radiographs for High-Strength Copper-Base andNickel-Copper Alloy CastingsASTM E280-2010厚壁(114-305mm)铸钢件标准参考射线照片Standard Reference Radiographs for Heavy-Walled (4 1/2 to 12-in. (114 to305-mm)) Steel CastingsASTM E310-2010锡青铜铸件标准参考射线照片Standard Reference Radiographs for Tin Bronze CastingsASTM E390-2011钢熔焊焊缝标准参考射线照片Standard Reference Radiographs for Steel Fusion WeldsASTM E431-96(2011)半导体和相关器件射线照片判读指南Standard Guide to Interpretation of Radiographs of Semiconductors andRelated DevicesASTM E446-2010厚度至50.8mm钢铸件的标准参考射线照片Standard Reference Radiographs for Steel Castings up to 2 in. (50.8 mm) inThicknessASTM E505-2001(2011)铝和镁压铸件检验的标准参考射线照片Standard Reference Radiographs for Inspection of Aluminum and MagnesiumDie CastingsASTM E545-2005(2010)确定直接热中子射线照相检验成象质量的标准试验方法Standard Test Method for Determining Image Quality in Direct ThermalNeutron Radiographic ExaminationASTM E586-88γ与χ射线照相检测的术语定义ASTM E592-1999(2009)e16~51mm厚钢板X射线照相检验和25~152mm厚钢板钴60照相检验获得ASTM当量穿透灵敏度的标准指南Standard Guide to Obtainable ASTM Equivalent Penetrameter Sensitivity forRadiography of Steel Plates 1/4 to 2 in. (6 to 51 mm) Thick with X Raysand 1 to 6 in. (25 to 152 mm) Thick with Cobalt-60ASTM E665-1994测量暴露在X闪光射线机的X射线照射下的材料中相对深度的吸收剂量Determining Absorbed Dose Versus Depth in Materials Exposed to the X-RayOutput of Flash X-Ray MachinesASTM E666-1997γ或X射线剂量吸收的计算Calculating Absorbed Dose from Gamma or X RadiationASTM E689-2010球墨铸铁标准参考射线照片Standard Reference Radiographs for Ductile Iron CastingsASTM E746-2007测定工业射线照相成像系统相关图象质量响应的标准方法Standard Practice for Determining Relative Image Quality Response ofIndustrial Radiographic Imaging SystemsASTM E747-2004(2010)射线照相用线型象质计(IQI)的设计、制造及材料组分类的标准方法Standard Practice for Design, Manufacture, and Material GroupingClassification of Wire Image Quality Indicators (Iqi) Used for RadiologyASTM E748-2002(2008)材料热中子射线照相标准方法Standard Practices for Thermal Neutron Radiography of MaterialsASTM E801-2006(2011)电子装置射线照相检验的质量控制标准方法Standard Practice for Controlling Quality of Radiological Examination ofElectronic DevicesASTM E802-1995(2010)厚度至114mm的灰口铸铁标准参考射线照片Standard Reference Radiographs for Gray Iron Castings up to 4 1/2 in. (114mm) in ThicknessASTM E803-1991(2008)确定中子射线透照束长径比的标准方法Standard Method for Determining the L/D Ratio of Neutron Radiography BeamsASTM E915-1996残余应力测量用X射线衍射仪校准检定的试验方法Test Method for Verifying the Alignment of X-Ray DiffractionInstrumentation for Residual Stress MeasurementASTM E999-2010工业射线照相胶片处理的质量控制标准指南Standard Guide for Controlling the Quality of Industrial Radiographic FilmProcessingASTM E1000-98(2009)射线照相检测标准指南Standard Guide for RadioscopyASTM E1025-2011射线照相检测用孔型象质计设计、制造和材料组分类的标准方法Standard Practice for Design, Manufacture, and Material GroupingClassification of Hole-Type Image Quality Indicators(IQI) Used forRadiographyASTM E1030-2005(2011)金属铸件射线照相检验的标准试验方法Standard Test Method for Radiographic Examination of Metallic CastingsASTM E1032-2012焊缝射线照相检验的标准试验方法Standard Test Method for Radiographic Examination of WeldmentsASTM E1079-2010透射密度计校准的标准方法Standard Practice for Calibration of Transmission DensitometersASTM E1114-2009e1测定铱192工业射线照相源尺寸的标准试验方法Standard Test Method for Determining the Size of Iridium -192 IndustrialRadiopraphic SourcesASTM E1161-2009半导体和电子元件射线检验的标准方法Standard Practice for Radiologic Examination of Semiconductors andElectronic ComponentsASTM E1165-2004(2010)用针孔成象法测量工业X射线管焦点的标准试验方法Standard Test Method for Measurement of Focal Spots of Industrial X-RayTubes by Pinhole ImagingASTM E1168-1995核设施工人辐射防护训练Radiological Protection Training for Nuclear Facility WorkersASTM E1254-2008射线照片及未曝光工业射线照相胶片储藏的标准指南Standard Guide for Storage of Radiographs and Unexposed IndustrialRadiographic FilmsASTM E1255-2009射线透视检验标准方法Standard Practice for RadioscopyASTM E1320-2010钛铸件标准参考射线照片Standard Reference Radiographs for Titanium CastingsASTM E1390-2012工业射线照相观片灯标准规Standard Specification for Illuminators Used for Viewing IndustrialRadiographsASTM E1400-1995高剂量辐射量测定校准实验室的特性和性能规程Characterization and Performance of a High-Dose Radiation DosimetryCalibration Laboratory, Practice for (12.02)ASTM E1411-2009射线照相系统鉴定的标准方法Standard Practice for Qualification of Radioscopic SystemsASTM E1416-2009焊缝射线检验的标准试验方法Standard Test Method for Radioscopic Examination of WeldmentsASTM E1441-2011计算机层析(CT)成像的标准指南Standard Guide for Computed Tomography (CT) ImagingASTM E1441-2000计算机层析成像(CT)指南Guide for Computed Tomography (CT) Imaging ASTM E1453-2009含模拟或数字射线照相数据的磁带媒体存储标准指南Standard Guide for Storage of Magnetic Tape Media that Contains Analog orDigital Radioscopic DataASTM E1475-2002(2008)数字射线照相检验数据计算机化传输的数据区标准指南Standard Guide for Data Fields for Computerized Transfer of DigitalRadiological Examination DataASTM E1496-2005(2010)中子射线照相尺寸测量的标准试验方法Standard Test Method for Neutron Radiographic DimensionalMeasurements(With drawn 2012)ASTM E1570-2011计算机层析(CT)检验标准方法Standard Practice for Computed Tomographic (CT) ExaminationASTM E1647-2009确定射线照相检测对比度灵敏度的标准方法Standard Practice for Determining Contrast Sensitivity in RadiologyASTM E1648-1995(2011)铝熔焊焊缝检验标准参考射线照片Standard Reference Radiographs for Examination of Aluminum Fusion WeldsASTM E1672-2006选择计算机层析(CT)系统的标准指南Standard Guide for Computed Tomography (Ct) System SelectionASTM E1695-1995(2006)e1计算机层析(CT)系统性能测量的标准试验方法Standard Test Method for Measurement of Computed Tomography (Ct) SystemPerformanceASTM E1734-2009铸件射线照相检验标准方法Standard Practice for Radioscopic Examination of CastingsASTM E1735-2007确定经4-25MV X射线曝光的工业射线胶片相关成像质量的标准试验方法Standard Test Method for Determining Relative Image Quality of IndustrialRadiographic Film Exposed to X-Radiation from 4 to 25 MVASTM E1742/E1742M-2011射线照相检验标准方法Standard Practice for Radiographic ExaminationASTM E1814-1996(2007)铸件计算机层析(CT)检验标准方法Standard Practice for Computed Tomographic (CT) Examination of CastingsASTM E1815-2008工业射线照相胶片系统分类的标准试验方法Standard Test Method for Classification of Film Systems for IndustrialRadiographyASTM E1817-2008使用典型象质计(RQIs)控制射线检验质量的标准方法Standard Practice for Controlling Quality of Radiological Examination byUsing Representative Quality Indicators(RQI-s)ASTM E1894-1997选择脉冲X射线源用的剂量测定系统的标准指南Standard Guide for Selecting Dosimetry Systems for Application in PulsedX-Ray SourcesASTM E1931-2009X射线康普顿散射层析技术标准指南Standard Guide for X-ray Compton Scatter TomographyASTM E1935-1997(2008)校准和测量计算机层析(CT) 密度的标准试验方法Standard Test Method for Calibrating and Meausring CT DensityASTM E1936-2003(2011)评估射线照相数字化系统性能的标准参考射线照片Standard Reference Radiograph for Evaluating the Performance ofRadiographic Digitization SystemsASTM E1955-2004(2009)与美国材料与试验协会ASTM E 390 参考射线照片等级比较钢中焊缝完善性的标准射线检验Standard Radiographic Examination for Soundness of Welds in Steel byComparison to Graded ASTM E390 Reference RadiographsASTM E2002-1998(2009)测定射线照相图象总不清晰度的标准方法Standard Practice for Determining Total Image Unsharpness in RadiologyASTM E2003-2010中子射线照相波束纯度指示计制作的标准方法Standard Practice for Fabrication of the Neutron Radiographic Beam PurityIndicators [Metric]ASTM E2007-2010计算机射线照相标准指南(用于CR的标准指南)(可激射线发光[PSL]法) Standard Guide for Computed Radiology (Photostimulable Luminescence (PSL)Method)ASTM E2023-2010制作中子射线照相灵敏度指示计的标准方法Standard Practice for Fabrication of Neutron Radiographic SensitivityIndicatorASTM E2033-1999(2006)计算机射线照相的标准方法(用于CR的标准实施方法)(可激射线发光[PSL]法)Standard Practice for Computed Radiology (Photostimulable LuminescenceMethod)ASTM E2104-2009优质航空与涡轮材料和构件射线照相检验的标准方法Standard Practice for Radiographic Examination of Advanced Aero andTurbine Materials and ComponentsASTM E2120-2000便携式X射线荧光光谱仪测量涂膜中铅含量的性能评估规程Practice for the Performance Evaluation of the Portable X-Ray FluorescenceSpectrometer for the Measurement of Lead in Paint FilmsASTM E2339-2004无损评价中的数字成像和通讯Digital Imaging and Communication in NDE(DICONDE)ASTM E2422-2011铝铸件标准参考数字射线图像(钛和钢铸件也适用)Standard Digital Reference Images for Al. Casting(Titanium & steel Castingalso available)ASTM E2445-2005(2010)计算机射线照相系统的长期稳定性与鉴定的标准方法(用于CR系统的质量认定和长期稳定性的标准实施方法)Standard Practice for Qualification and Long-Term Stability of ComputedRadiology SystemsASTM E2446-2005(2010)计算机射线照相系统分类的标准方法(用于CR系统分类的标准实施方法)Standard Practice for Classification of Computed Radiology SystemsASTM E2597-2007e1数字探测器阵列制造特性的标准规程Standard Practice for Manufacturing Characterization of Digital DetectorArraysASTM E2660-2011航空用优质钢铸件标准参考数字射线图像Standard Digital Reference Images for Investment Steel Castings forAerospace ApplicationsASTM E2662-2009航空用平面与夹芯复合材料射线照相检验的标准方法Standard Practice for Radiologic Examination of Flat Panel Composites andSandwich Core Materials Used in Aerospace ApplicationsASTM E2669-2011数字射线照相(DR)检测方法的数字图像与通信无损评价(DICONDE)的标准方法Standard Practice for Digital Imaging and Communication in NondestructiveEvaluation (DICONDE) for Digital Radiographic (DR) Test MethodsASTM E2698-2010使用数字探测器阵列的射线照相检验标准方法Standard Practice for Radiological Examination Using Digital DetectorArraysASTM E2736-2010数字探测器阵列射线照相检测标准指南Standard Guide for Digital Detector Array RadiologyASTM E2737-2010评价数字探测器阵列性能和长期稳定性的标准方法Standard Practice for Digital Detector Array Performance Evaluation andLong-Term StabilityASTM E2738-2011使用计算机射线照相(CR)检测方法的数字图像与通讯无损评价(DICONDE)的标准方法Standard Practice for Digital Imaging and Communication NondestructiveEvaluation (DICONDE) for Computed Radiography (CR) Test MethodsASTM E2767-2011使用X射线计算机层析(CT)检测方法的数字图像与通讯无损评价(DICONDE)的标准方法Standard Practice for Digital Imaging and Communication in NondestructiveEvaluation (DICONDE) for X-ray Computed Tomography (CT) Test MethodsASTM E2861-2011测量中子辐射束发散与校准的标准试验方法Standard Test Method for Measurement of Beam Divergence and Alignment inNeutron Radiologic BeamsASTM F629-1997铸造金属外科手术植入物射线照相检查实施方法(F-4)ASTM F727-1981透明照相干版透光度测量的试验方法Test Method for Measuring Transmittance of See-Through PhotoplateASTM F784-1982校准放射性同位素密封测试仪的试验方法Test Method for Calibrating Radioisotope Hermetic Test ApparatusASTM F864-1984硬表面玻璃照相干板的检验Inspection of Hard-Surface Glass Photoplates ASTM F947-1985测定照相胶片低能级X射线辐射灵敏度的试验方法Test Method for Determining Low-Level X-Radiation Sensitivity ofPhotographic FilmsASTM F1035-1991使用橡胶帘布圆盘验证轮胎X射线成象系统的辩别能力Use of Rubber-Cord Pie Disk to Demonstrate the Discernment Capability of aTire X-Ray Imaging SystemASTM F1039-1987X射线安全屏系统中测量低剂量X辐射的试验方法Test Method for Measurement of Low Level X-Radiation Used in X-RaySecurity Screening SystemsASTM F1467-1999微电子装置电离辐射效应中X射线测试仪(近似等于10keV辐射量子)的使用Use of an X-Ray Tester (is Approximately Equal to 10 keV Photons) inIonizing Radiation Effects Testing of Microelectronic DevicesASTM PS95-1998便携式X射线荧光(XRF)装置现场测定涂料或其它涂层含铅量的质量体系的标准临时操作规程Standard Provisional Practice for Quality Systems for Conducting In SituMeasurements of Lead Content in Paint or Other Coatings usingField-Portable X-Ray Fluorescence (XRF) DevicesASTM PS 116-1999测量涂膜含铅量用的便携式X射线荧光光谱仪性能评价的临时操作规程Provisional Practice for the Performance Evaluation of the Portable X-RayFluorescence Spectrometer for the Measurement of Lead in Paint FilmsANSI/ANS6.1.1-1991中子及r射线对剂量因素的影响Neutron and Gamma-Ray Fluence-to-DoseFactorsANSI/IEEE 309-1970盖革-弥勒计数器的试验程序Geiger-Muller Counters, Test Procedure for ANSI IT9.2-1991成象介质-已处理的照相胶片、平板和相纸-归档盒及储存箱Imaging Media - Photographic Processed Films, Plates and Papers - FilingEnclosures and Storage ContainersANSI IT9.8-1989成象介质-照相胶片耐折强度的测定Imaging Media - Photographic Film - Determination of Folding EnduranceANSI N13.2-1969辐射监测的管理规程指南Administrative Practices in Radiation Monitoring, Guide toANSI N13.5-1972直读和非直读式袖珍X和γ射线辐射剂量仪的性能Direct Reading and Indirect Reading Pocket Dosimeters for X- and GammaRadiation, PerformanceANSI N13.7-1983辐射防护照相胶片剂量仪性能标准Radiation Protection - Photographic Film Dosimeters - Criteria forPerformanceANSI N13.11-2001个人剂量测定的试验标准Personnel Dosimetry Performance, Criteria for TestingANSI N13.27-1981袖珍式报警辐射剂量仪和报警记数率计的性能要求Performance Requirements for Pocket-Sized Alarm Dosimeters and AlarmRatemetersANSI N15.36-1994核材料无损化验测量的控制和保证Nuclear materials - Nondestructive assay measurement control and assuranceANSI N15.37-1981核材料控制的自动无损化验系统指南Automation of Nondestructive Assay Systems for Nuclear Materials Control,Guide toANSI N42.16-1986用于液体闪烁计数器的密封放射检查源的规Specifications for sealed radioactive check sources used inliquid-scintillation countersANSI N42.20-1995个人辐射监视仪的性能标准Performance criteria for active personnel radiation monitorsANSI N42.26-1995辐射防护仪器监测设备X和γ辐射个人报警装置Radiation Protection Instrumentation - Monitoring Equipment - PersonalWarning Devices for X and Gamma RadiationsANSI N43.3-1993通用辐射安全非医疗应用的X射线和密封γ射线源的安装能量达10Mev General radiation safety - Installations using non-medical X-ray andsealed gamma-ray sources, energies up to 10 MeVANSI N43.6-1997密封放射性源的分类Classification of Sealed Radioactive SourcesANSI N43.9-1991γ射线照相仪器的设计和试验规Gamma Radiography - Specifications for Design and Testing of ApparatusANSI N322-1996直接和间接读取石英纤维袖珍剂量计的检验和试验规Inspection and Test Specifications for Direct and Indirect Reading QuartzFiber Pocket DosimetersASME Boiler & Pressure VesselCode(ASME锅炉压力容器规)第V卷《无损检测》2004版,第2篇“射线检测”,强制性附录-包含动态射线照相、实时射线成像检测容ASME SE-1647确定射线照相对比灵敏度的推荐实施方法ASME Code Case 2476使用荧光成像板的射线照相Radiography using phosphor imaging platesMIL-HDBK-55-66射线照相无损检测手册(已由MIL-HDBK-728/5取代)MIL-STD-139A-65射线检测铝镁合金铸件的完好性要求MIL-STD-453C-88射线照相检测MIL-STD-746A-63铸造爆破器材的射线照相检测要求MIL-STD-779-68钢焊缝参考χ射线照片(由ASTM E390取代)MIL-STD-1257A-87钴铬合金枪管射线照相及目视检验MIL-R-11470A-71对射线检验设备,操作方法和操作人员的合格审查(由MIL-STD-453取代) MIL-I-36013B-72折迭式χ射线观片灯MIL-R-45226-62石墨的射线照相检测(已停用)MIL-R-45774A(92)铝,镁导弹零件熔焊完好性要求-射线照相检测MIL-STD-1948(91)中子射线照相检验的术语和定义汇编MIL-HDBK-728/5(92)射线照相检验MIL-HDBK-733(92)复合材料无损检验方法-射线照相法MIL-STD-1166A(91)固体火箭推进剂射线照相检验要求MIL-STD-1264B(93)钢焊缝完好性射线照相检验-与ASTM E390 各级参考底片比较MIL-STD-1265A(92)钢铸件射线照相检验分类和完好性要求MIL-STD-1894A(86)不完全焊透钢焊缝的射线照相参考标准及射线照相程序MIL-STD-1895A(86)不完全焊透铝焊缝的射线照相参考标准及射线照相程序BAC 5915(美国波音公司) 射线检验DPS 4.736(美国麦道公司) 射线检验API 1104(美国石油协会) 管道及有关设备的焊接AWS B 5.15射线照相评片资格技术条件。
shielding化学含义
shielding化学含义1.简介在化学中,"sh ie ldi n g"(屏蔽)是指某些电子或原子核受到周围电子的层层包围,从而减少其受到外部环境的影响的现象。
屏蔽在不同化学领域中起到重要的作用,特别在核磁共振(N MR)和电子结构理论中有着广泛应用。
2.原子核屏蔽效应原子核屏蔽效应是指在分子中,由于电子云的存在,质子数量相同的原子核受到的环境电子的屏蔽效果而发生变化。
这种屏蔽现象会影响到原子核的化学性质。
具体而言:-屏蔽会影响原子核的化学位移。
原子核的屏蔽程度越高,其化学位移越小。
-屏蔽会影响核磁共振信号的产生。
在核磁共振谱图中,屏蔽效应将导致不同化学环境的核具有不同的共振频率。
-屏蔽可由电子云的密度和电子云与原子核之间的空间分布来界定。
电子云越密集,屏蔽效应越强。
3.电子屏蔽效应电子屏蔽效应是指电子在原子核周围的排列方式会对外部电场的作用产生屏蔽效应。
主要有以下几个方面:-电子屏蔽能力与电子排布有关。
内层电子对外部电场有很好的屏蔽效应,而外层电子对外部电场的屏蔽能力较弱。
-电子屏蔽效应影响原子的化学性质。
屏蔽效应会改变原子的有效核电荷,从而改变原子的化学性质。
-电子屏蔽效应在元素周期表中表现为周期性变化。
原子序数越大,电子屏蔽效应越明显。
4.屏蔽效应的应用屏蔽效应在化学领域中具有广泛的应用,尤其在核磁共振和电子结构理论方面:4.1核磁共振(N M R)屏蔽效应在核磁共振谱图解析中起到关键作用。
通过测量原子核的化学位移,可以确定化合物的结构和化学环境。
屏蔽效应使得不同原子核具有不同的共振频率,从而为化学分析提供了准确的信息。
4.2电子结构理论在量子化学的研究中,屏蔽效应被用于预测和解释分子的电子结构。
通过考虑电子屏蔽的影响,可以计算原子和分子的能级结构、键长、键角等。
这对于理解分子的性质和反应机理非常重要。
5.结论屏蔽化学含义是原子核或电子受到周围电子的包围,减少其受到外部环境的影响。
J.1-shielding-电磁干扰的屏蔽方法
電磁干擾的屏蔽方法電磁相容性(EMC)是指“一種器件、設備或系統的性能,它可以使其在自身環境下正常工作並且同時不會對此環境中任何其他設備產生強烈電磁干擾 (IEEE C63.12-1987)。
"對於無線收發設備來說,採用非連續頻譜, 可部份實現EMC性能,但是很多有關的例子也表明EMC 並不總是能夠做到。
例如在筆記本電腦和測試設備之間、列印機和台式電腦之間以及行動電話和醫療儀器之間等都具有高頻干擾,我們把這種干擾稱為電磁干擾(EMI)。
EMC問題來源所有電器和電子設備工作時都會有間歇或連續性電壓電流變化,有時變化速率還相當快,這樣會導致在不同頻率內或一個頻帶間產生電磁能量,而相應的電路則會將這種能量發射到周圍的環境中。
EMI有兩條途徑離開或進入一個電路:輻射和傳導。
信號輻射是藉由外殼的縫、槽、開孔或其他缺口泄漏出去;而信號傳導則藉由耦合到電源、信號和控制線上離開外殼,在開放的空間中自由輻射,從而產生干擾。
很多EMI抑制都採用外殼屏蔽和縫隙屏蔽結合的方式來實現,大多數時候下面這些簡單原則可以有助於實現EMI屏蔽:從源頭處降低干擾;藉由屏蔽、過濾或接地將干擾產生電路隔離, 以及增強敏感電路的抗干擾能力等。
EMI抑制性、隔離性和低敏感性應該作為所有電路設計人員的目標,這些性能在設計階段的早期就應完成。
對設計工程師而言,採用屏蔽材料是一種有效降低EMI的方法。
如今已有多種外殼屏蔽材料得到廣泛使用,從金屬罐、薄金屬片和箔帶到在導電織物或卷帶上噴射塗層及鍍層(如導電漆及鋅線噴塗等)。
無論是金屬還是塗有導電層的塑料,一旦設計人員確定作為外殼材料之後,就可著手開始選擇襯墊。
金屬屏蔽效率可用屏蔽效率(SE)對屏蔽罩的適用性進行評估,其單位是分貝,計算公式為SE(dB) = A+R+B其中 A:吸收損耗(dB); R:反射損耗(dB); B:校正因子(dB)(適用於薄屏蔽罩內存在多個反射的情況)一個簡單的屏蔽罩會使所產生的電磁場強度降至最初的十分之一,即SE等於20dB;而有些場合可能會要求將場強降至為最初的十萬分之一,即SE要等於100dB。
核能工程专业英语单词
原本打算每人交一篇论文,但估计一部分同学会网上下载,凑数,所以,我们考试就是词汇,范围包括下面我列出来的和课后的,只要能根据英语写出汉语即可。
下周上课时间我们简单考一下,请大家复习一下。
第一课element(元素), fundamental particles(基本粒子),protons, neutrons and electrons(质子,中子,电子),chemical identity(化学特性),nucleus (原子核),positively charged (带正电的),uncharged(不带电的),negatively charged (带负电的),electrically neutral(电中性的),atomic number(原子序数),Periodic Table(元素周期表),mass number(质量数),nucleon(核子),carbon(碳),orbital electrons(轨道电子),innermost electron(内壳层电子),naturally occurring(天然存在的),stable isotope(稳定同位素),unstable (不稳定的)or radioactive(放射性的),artificial means(人工手段),chemical bonds(化学键),nuclei(原子核nucleus的复数),chemical symbol(化学符号), subscript(下角标),superscript (上角标),oxygen(氧),radioactive isotopes(放射性同位素),Hydrogen(氢),nuclear engineering(核工程),heavy hydrogen(重氢)or deuterium(氘),tritium(氚)mass and charge(质量和电荷), atomic and nuclear physics(原子和原子核物理),atomic mass unit (u)(原子质量单位),one twelfth (十二分之一)carbon 12 (碳12),weighted mean (加权平均数),Avogadro’s Number(阿伏加德罗常数),compounds and molecules(化合物和分子),equal in magnitude and opposite in sign(数量相等,符号相反),electron-volt(电子伏特),mega electron-volt(兆电子伏特)( MeV),unit electronic charge(单位电荷),potential difference (势差),classical principle(经典原理),conservation of mass(质量守恒定律),mass defect (质量亏损),principle of the equivalence of mass and energy(质能相当原理),interchange of mass and energy(质能转换),laws of conservation of mass and conservation of energy(质量守恒和能量守恒定律),release of energy(能量的释放), absorption of energy(能量的吸收),equivalence between mass and energy(质能相当),force of electrostatic repulsion between like charge(同种电荷之间的静电排斥力), force of attraction(吸引力),nuclear force(核力),nucleon(核子),Binding Energy(结合能),energy of chemical binding(化学结合能),Energy Level(能级),ground state of energy(能量基态),nuclear reaction (核反应),excited states or levels (激发态或激发能级),discrete excited states (分立的激发态),spacing of the levels (能级间隔),excitation energy (激发能),average lifetime (平均寿命),decay, or become de-excited(衰变或退激发),emission of high energy electromagnetic radiation (发射高能电磁辐射),fission (裂变),uranium (铀),transuranium elements(超铀元素),radioactive barium 139(放射性钡139),split into fragments (分裂成碎片),intermediate mass elements (中间质量的元素),medium mass number(中等质量数), chain reaction (链式反应)uranium 235(铀235), Thorium 232(钍232), fissionable (可裂变的), fissile(易裂变的),uranium 233 and plutonium 239(钚239), low energy neutrons(低能中子),liquid drop model(液滴模型),short range nuclear forces(短程核力), surface tension (表面张力), action of the nuclear forces(核力作用),dumbbell shape (哑铃形),Coulomb force of repulsion (库仑排斥力),emission of gamma radiation(发射伽玛辐射),fission fragments (裂变碎片),neutrinos (中微子),macroscopic(宏观的)第二课radiation(辐射),material or electromagnetic origin(物质或电磁起源), nuclear decay(核衰变),particle accelerator(粒子加速器), cosmic rays(宇宙射线), molecules, atoms, electrons, and nuclei(分子,原子,电子,原子核),photons(光子),target(靶),projectile (入射粒子),nuclear energy field(核能领域),nuclear reactor(核反应堆), inert substances(惰性物质),protective shielding(防护屏),Excitation and Ionization (电离和激发),fluorescent light bulb(荧光灯泡), vacuum tube (真空管),impart energy to (传递能量),excitation of electrons to higher energy states(激发电子到更高能态),emission of light(发光).inner orbits (内层轨道),high energy radiation(高能辐射),heavy element target(重元素靶,X-rays due to transitions in the electronic orbits(电子在轨道间跃迁产生的X射线), bremsstrahlung (韧致辐射),ion pair(离子对),range(射程), millimeter(毫米),meter (米),Charged particles(带电粒子),fragments of fission (裂变碎片),heavy particles (重离子), inertia(惯性),electrostatic interaction (静电相互作用),kinetic energy (动能),inversely proportional to(成反比例),million-electron-volt (百万电子伏特)high-speed charged ion (高速带电离子),mutual repulsion (相互排斥),hyperbolic path (双曲线轨迹),scatter(散射),initial energy (初始能量),scattering of the photon(光散射), ionization by the photon(光电离), pair production(电子对产生). Photon-Electron Scattering(光-电子散射),rest mass (静止质量),bound to their nucleus(受原子核的束缚), free stationary particles(自由静止粒子),physical principles of energy and momentum conservation(能量和动量守恒物理原理. Compton effect(康普顿效应), scattered backward(背散射),the special theory of relativity (狭义相对论),cross section(截面),Photoelectric Effect(光电效应),incident photon (入射光子),light emission (发光), Electron-Positron Pair Production(电子正电子对产生),be converted into matter(转变成物质),theory of the equivalence of mass and energy(质能相当理论),law of conservation of charge (电荷守恒定律),be annihilated as material particles(作为物质粒子湮灭), substance(物质), attenuation of gamma rays in matter (伽马射线在物质中的衰减),mean free path (平均自由程),helium 4 (氦4),positive charge(正电荷),density of the material (物质密度),aluminum (铝),health hazard (健康危害),alpha-emitting isotope(α放射性同位素),be ingested in the body(摄入人体),radioactive isotope(放射性同位素),a spectrum of energies(能谱),ingestion hazard(摄入危害). penetrating power(穿透本领),radiation hazards (辐射危害),reactor shielding(反应堆屏蔽).light elements (轻元素),beryllium(铍),Neutron(中子),average lifetime (平均寿命),Neutron Source(中子源),radium 226(镭226),potential scattering (势散射),compound nucleus formation(复合核形成),capture(俘获)。
国内某伴生放射性固体废物刚性填埋设施设计
第39卷第3期2022年9月World Nuclear Geoscience世界核地质科学Vol.39No.3Sep.2022国内某伴生放射性固体废物刚性填埋设施设计安田鑫1,王煦晋2(1.中核四川环保工程有限责任公司四川广元628000;2.中核资源再生有限公司北京100022)[摘要]伴生放射性固体废物的处理处置及辐射环境监管目前仍是我国核与辐射安全监管体系中较为薄弱的领域。
研究针对国内新出台的《伴生放射性物料贮存及固体废物填埋辐射环境保护技术规范(试行)》(HJ 1114—2020)标准中未明确的刚性填埋设施设计要求,通过总结国内相关标准规范要求,对比低中水平放射性废物近地表处置设施及危险废物刚性填埋设施工程案例,以国内某伴生放射性固体废物填埋设施工程为例,提出了伴生放射性固体废物刚性填埋单元的防渗系统、渗滤液导排系统、渗漏检测系统的可行设计方案,以及短周期运行的填埋设施填埋模式的合理化建议,考虑封场覆盖系统对伽马辐射的屏蔽作用以及对氡析出率的影响,经计算确定覆盖层结构形式、厚度及工程材料选择,并在封场后通过对周围辐射环境监测,对设计方案的有效性进行了验证,为今后国内类似工程提供参考。
[关键词]伴生放射性固体废物;刚性填埋单元设计;填埋方式;封场设计[文章编号]1672-0636(2022)03-0493-11[中图分类号]X591[文献标志码]AThe Design of a Rigid Landfill Facility for AssociatedRadioactive Solid WasteAN Tianxin 1,WANG Xujin 2(1.Sichuan Environmental Protection Engineering Co.,Ltd.,CNNC,Guangyuan ,Sichuan 628000,China ;NC Renewable Resources Co.,Ltd.,Beijing 100022,China )Abstract :At present,the disposal of associated radioactive solid waste and the supervision of radiation environment are still a relatively weak area in China s nuclear and radiation safety supervision system.In this paper,a domestic associated radioactive solid waste landfill project was used as case to study the design requirements of rigid landfill facilities which are not clearlydefined in the new domestic standard Technical Specifications of Radiation Environmental Protection for Other Radioactive Material s Storage and Solid Waste s Landfill (Trial )(HJ 1114—2020).By summarizing the domestic specifications and requirements and comparing with the engineering cases of near surface disposal facilities of low and intermediate level radioactive wastes and hazardous waste rigid landfill facilities.The feasible design scheme of the anti-seepage system ,leachate diversion system and leakage detection system of the rigid landfill unit of associated radioactive solid waste was proposed with the reasonable suggestions for the landfillmode of landfill facilities with short period operation.Considering the shielding effect of the closedDOI:10.3969/j.issn.1672-0636.2022.03.011[收稿日期]2022-05-07[改回日期]2022-06-17[作者简介]安田鑫(1986—),男,河北石家庄人,工程师,硕士,主要从事核设施退役治理工作。
辐射英文翻译
辐射英文翻译Radiation refers to the emission of energy as waves or particles, either through natural sources or as a result of human activities. It can come in various forms such as electromagnetic waves (e.g., radio waves, microwaves, infrared, visible light, ultraviolet, X-rays, gamma rays) or as particles (e.g., alpha particles, beta particles, neutrons).Natural sources of radiation include the sun, cosmic rays from space, radioactive elements in the earth's crust, and radon gas. Human activities can also lead to the creation of radiation, such as through nuclear power plants, X-ray machines, and radioactive materials used in medicine and industry.Radiation is classified into two types: ionizing and non-ionizing radiation. Ionizing radiation has enough energy to remove tightly bound electrons from atoms, leading to the formation of ions. This type of radiation includes X-rays and gamma rays. Non-ionizing radiation, on the other hand, does not have enough energy to remove electrons from atoms but can still cause damage to living organisms. This includes ultraviolet light, visible light, and radio waves.Radiation can have both beneficial and harmful effects. In medicine, radiation is often used for diagnostic imaging and cancer treatment. X-rays, for example, can help doctors identify broken bones or detect diseases. Radiation therapy can also be used to kill cancer cells. However, exposure to high levels of radiation can be hazardous and lead to acute radiation syndrome, a condition that can cause symptoms like nausea, vomiting, and even death. Long-term exposure to low levels of radiation can also increase the risk of cancer and other health problems.To protect against the harmful effects of radiation, various safety measures and guidelines have been established. These include monitoring radiation levels in workplaces, using protective clothing and equipment, and implementing safety protocols when handling radioactive materials. Radiation shielding materials, such as lead or concrete, are used to minimize exposure to radiation in certain situations.In conclusion, radiation is the emission of energy as waves or particles, and can occur naturally or as a result of human activities. It can be classified into ionizing and non-ionizing radiation, and can have both beneficial and harmful effects. Safety measures and guidelines are in place to protect against the hazards of radiation exposure.。
无损检测NDT常用词汇中英文对照
A.C magnetic saturation 交流磁饱和Absorbed dose 吸收剂量Absorbed dose rate 吸收剂量率Acceptanc limits 验收范围Acceptance level 验收水平Acceptance standard 验收标准Accumulation test 累积检测Acoustic emission count(emission count)声发射计数(发射计数)Acoustic emission transducer 声发射换能器(声发射传感器)Acoustic emission(AE) 声发射Acoustic holography 声全息术Acoustic impedance 声阻抗Acoustic impedance matching 声阻抗匹配Acoustic impedance method 声阻法Acoustic wave 声波Acoustical lens 声透镜Acoustic—ultrasonic 声-超声(AU)Activation 活化Activity 活度Adequate shielding 安全屏蔽Ampere turns 安匝数Amplitude 幅度Angle beam method 斜射法Angle of incidence 入射角Angle of reflection 反射角Angle of spread 指向角Angle of squint 偏向角Angle probe 斜探头Angstrom unit 埃(A)Area amplitude response curve 面积幅度曲线Area of interest 评定区Arliflcial disconlinuity 人工不连续性Artifact 假缺陷Artificial defect 人工缺陷Artificial discontinuity 标准人工缺陷A-scan A型扫描A-scope; A-scan A型显示Attenuation coefficient 衰减系数Attenuator 衰减器Audible leak indicator 音响泄漏指示器Automatic testing 自动检测Autoradiography 自射线照片Avaluation 评定Barium concrete 钡混凝土Barn 靶Base fog 片基灰雾Bath 槽液Bayard- Alpert ionization gage B- A型电离计Beam 声束Beam ratio 光束比Beam angle 束张角Beam axis 声束轴线Beam index 声束入射点Beam path location 声程定位Beam path; path length 声程Beam spread 声束扩散Betatron 电子感应加速器Bimetallic strip gage 双金属片计Bipolar field 双极磁场Black light filter 黑光滤波器Black light; ultraviolet radiation 黑光Blackbody 黑体Blackbody equivalent temperature 黑体等效温度Bleakney mass spectrometer 波利克尼质谱仪Bleedout 渗出Bottom echo 底面回波Bottom surface 底面Boundary echo(first) 边界一次回波Bremsstrahlung 轫致辐射Broad-beam condition 宽射束Brush application 刷涂B-scan presenfation B型扫描显示B-scope; B-scan B型显示C- scan C型扫描Calibration,instrument 设备校准Capillary action 毛细管作用Carrier fluid 载液Carry over of penetrate 渗透剂移转Cassette 暗合Cathode 阴极Central conductor 中心导体Central conductor method 中心导体法Characteristic curve 特性曲线Characteristic curve of film 胶片特性曲线Characteristic radiation 特征辐射Chemical fog 化学灰雾Cine-radiography 射线(活动)电影摄影术Cintact pads 接触垫Circumferential coils 圆环线圈Circumferential field 周向磁场Circumferential magnetization method 周向磁化法Clean 清理Clean- up 清除Clearing time 定透时间Coercive force 矫顽力Coherence 相干性Coherence length 相干长度(谐波列长度)Coi1,test 测试线圈Coil size 线圈大小Coil spacing 线圈间距Coil technique 线圈技术Coil method 线圈法Coilreference 线圈参考Coincidence discrimination 符合鉴别Cold-cathode ionization gage 冷阴极电离计Collimator 准直器Collimation 准直Collimator 准直器Combined colour comtrast and fluorescent penetrant 着色荧光渗透剂Compressed air drying 压缩空气干燥Compressional wave 压缩波Compton scatter 康普顿散射Continuous emission 连续发射Continuous linear array 连续线阵Continuous method 连续法Continuous spectrum 连续谱Continuous wave 连续波Contract stretch 对比度宽限Contrast 对比度Contrast agent 对比剂Contrast aid 反差剂Contrast sensitivity 对比灵敏度Control echo 监视回波Control echo 参考回波Couplant 耦合剂Coupling 耦合Coupling losses 耦合损失Cracking 裂解Creeping wave 爬波Critical angle 临界角Cross section 横截面Cross talk 串音Cross-drilled hole 横孔Crystal 晶片C-scope; C-scan C型显示Curie point 居里点Curie temperature 居里温度Curie(Ci) 居里Current flow method 通电法Current induction method 电流感应法Current magnetization method 电流磁化法Cut-off level 截止电平Dead zone 盲区Decay curve 衰变曲线Decibel(dB) 分贝Defect 缺陷Defect resolution 缺陷分辨力Defect detection sensitivity 缺陷检出灵敏度Defect resolution 缺陷分辨力Definition 清晰度Definition, image definition 清晰度,图像清晰度Demagnetization 退磁Demagnetization factor 退磁因子Demagnetizer 退磁装置Densitometer 黑度计Density 黑度(底片)Density comparison strip 黑度比较片Detecting medium 检验介质Detergent remover 洗净液Developer 显像剂Developer station 显像工位Developer, agueons 水性显象剂Developer, dry 干显象剂Developer, liquid film 液膜显象剂Developer, nonaqueous (sus- pendible)非水(可悬浮)显象剂Developing time 显像时间Development 显影Diffraction mottle 衍射斑Diffuse indications 松散指示Diffusion 扩散Digital image acquisition system 数字图像识别系统Dilatational wave 膨胀波Dip and drain station 浸渍和流滴工位Direct contact magnetization 直接接触磁化Direct exposure imaging 直接曝光成像Direct contact method 直接接触法Directivity 指向性Discontinuity 不连续性Distance- gain- size-German AVG 距离- 增益- 尺寸(DGS德文为AVG)Distance marker; time marker 距离刻度Dose equivalent 剂量当量Dose rate meter 剂量率计Dosemeter 剂量计Double crystal probe 双晶片探头Double probe technique 双探头法Double transceiver technique 双发双收法Double traverse technique 二次波法Dragout 带出Drain time 滴落时间Drain time 流滴时间Drift 漂移Dry method 干法Dry powder 干粉Dry technique 干粉技术Dry developer 干显像剂Dry developing cabinet 干显像柜Dry method 干粉法Drying oven 干燥箱Drying station 干燥工位Drying time 干燥时间D-scope; D-scan D型显示Dual search unit 双探头Dual-focus tube 双焦点管Duplex-wire image quality indicator 双线像质指示器Duration 持续时间Dwell time 停留时间Dye penetrant 着色渗透剂Dynamic leak test 动态泄漏检测Dynamic leakage measurement 动态泄漏测量Dynamic range 动态范围Dynamic radiography 动态射线透照术Echo 回波Echo frequency 回波频率Echo height 回波高度Echo indication 回波指示Echo transmittance of sound pressure 往复透过率Echo width 回波宽度Eddy current 涡流Eddy current flaw detector 涡流探伤仪Eddy current testiog 涡流检测Edge 端面Edge effect 边缘效应Edge echo 棱边回波Edge effect 边缘效应Effective depth penetration (EDP)有效穿透深度Effective focus size 有效焦点尺寸Effective magnetic permeability 有效磁导率Effective permeability 有效磁导率Effective reflection surface of flaw 缺陷有效反射面Effective resistance 有效电阻Elastic medium 弹性介质Electric displacement 电位移Electrical center 电中心Electrode 电极Electromagnet 电磁铁Electro-magnetic acoustic transducer 电磁声换能器Electromagnetic induction 电磁感应Electromagnetic radiation 电磁辐射Electromagnetic testing 电磁检测Electro-mechanical coupling factor 机电耦合系数Electron radiography 电子辐射照相术Electron volt 电子伏恃Electronic noise 电子噪声Electrostatic spraying 静电喷涂Emulsification 乳化Emulsification time 乳化时间Emulsifier 乳化剂Encircling coils 环绕式线圈End effect 端部效应Energizing cycle 激励周期Equalizing filter 均衡滤波器Equivalent 当量Equivalent I.Q. I. Sensitivity 象质指示器当量灵敏度Equivalent nitrogen pressure 等效氮压Equivalent penetrameter sensifivty 透度计当量灵敏度Equivalent method 当量法Erasabl optical medium 可探光学介质Etching 浸蚀Evaluation 评定Evaluation threshold 评价阈值Event count 事件计数Event count rate 事件计数率Examination area 检测范围Examination region 检验区域Exhaust pressure/discharge pressure 排气压力Exhaust tubulation 排气管道Expanded time-base sweep 时基线展宽Exposure 曝光Exposure table 曝光表格Exposure chart 曝光曲线Exposure fog 曝光灰雾Exposure,radiographic exposure 曝光,射线照相曝光Extended source 扩展源Facility scattered neutrons 条件散射中子False indication 假指示Family 族Far field 远场Feed-through coil 穿过式线圈Field, resultant magnetic 复合磁场Fill factor 填充系数Film speed 胶片速度Film badge 胶片襟章剂量计Film base 片基Film contrast 胶片对比度Film gamma 胶片γ值Film processing 胶片冲洗加工Film speed 胶片感光度Film unsharpness 胶片不清晰度Film viewing screen 观察屏Filter 滤波器/滤光板Final test 复探Flat-bottomed hole 平底孔Flat-bottomed hole equivalent 平底孔当量Flaw 伤Flaw characterization 伤特性Flaw echo 缺陷回波Flexural wave 弯曲波Floating threshold 浮动阀值Fluorescence 荧光Fluorescent examination method 荧光检验法Fluorescent magnetic particle inspection 荧光磁粉检验Fluorescent dry deposit penetrant 干沉积荧光渗透剂Fluorescent light 荧光Fluorescent magnetic powder 荧光磁粉Fluorescent penetrant 荧光渗透剂Fluorescent screen 荧光屏Fluoroscopy 荧光检查法Flux leakage field 磁通泄漏场Flux lines 磁通线Focal spot 焦点Focal distance 焦距Focus length 焦点长度Focus size 焦点尺寸Focus width 焦点宽度Focus(electron) 电子焦点Focused beam 聚焦声束Focusing probe 聚焦探头Focus-to-film distance(f.f.d) 焦点-胶片距离(焦距)Fog 底片灰雾Fog density 灰雾密度Footcandle 英尺烛光Freguency 频率Frequency constant 频率常数Fringe 干涉带Front distance 前沿距离Front distance of flaw 缺陷前沿距离Full- wave direct current(FWDC)全波直流Fundamental frequency 基频Furring 毛状迹痕Gage pressure 表压Gain 增益Gamma radiography γ射线透照术Gamma ray source γ射线源Gamma ray source container γ射线源容器Gamma rays γ射线Gamma-ray radiographic equipment γ射线透照装置Gap scanning 间隙扫查Gas 气体Gate 闸门Gating technique 选通技术Gauss 高斯Geiger-Muller counter 盖革.弥勒计数器Geometric unsharpness 几何不清晰度Gray(Gy) 戈瑞Grazing incidence 掠入射Grazing angle 掠射角Group velocity 群速度Half life 半衰期Half- wave current (HW)半波电流Half-value layer(HVL) 半值层Half-value method 半波高度法Halogen 卤素Halogen leak detector 卤素检漏仪Hard X-rays 硬X射线Hard-faced probe 硬膜探头Harmonic analysis 谐波分析Harmonic distortion 谐波畸变Harmonics 谐频Head wave 头波Helium bombing 氦轰击法Helium drift 氦漂移Helium leak detector 氦检漏仪Hermetically tight seal 气密密封High vacuum 高真空High energy X-rays 高能X射线Holography (optical) 光全息照相Holography, acoustic 声全息Hydrophilic emulsifier 亲水性乳化剂Hydrophilic remover 亲水性洗净剂Hydrostatic text 流体静力检测Hysteresis 磁滞Hysteresis 磁滞IACS IACSID coil ID线圈Image definition 图像清晰度Image contrast 图像对比度Image enhancement 图像增强Image magnification 图像放大Image quality 图像质量Image quality indicator sensitivity 像质指示器灵敏度Image quality indicator(IQI)/image quality indication 像质指示器Imaging line scanner 图像线扫描器Immersion probe 液浸探头Immersion rinse 浸没清洗Immersion testing 液浸法Immersion time 浸没时间Impedance 阻抗Impedance plane diagram 阻抗平面图Imperfection 不完整性Impulse eddy current testing 脉冲涡流检测Incremental permeability 增量磁导率Indicated defect area 缺陷指示面积Indicated defect length 缺陷指示长度Indication 指示Indirect exposure 间接曝光Indirect magnetization 间接磁化Indirect magnetization method 间接磁化法Indirect scan 间接扫查Induced field 感应磁场Induced current method 感应电流法Infrared imaging system 红外成象系统Infrared sensing device 红外扫描器Inherent fluorescence 固有荧光Inherent filtration 固有滤波Initial permeability 起始磁导率Initial pulse 始脉冲Initial pulse width 始波宽度Inserted coil 插入式线圈Inside coil 内部线圈Inside- out testing 外泄检测Inspection 检查Inspection medium 检查介质Inspection frequency/ test frequency 检测频率Intensifying factor 增感系数Intensifying screen 增感屏Interal,arrival time (Δtij)/arrival time interval(Δtij)到达时间差(Δtij) Interface boundary 界面Interface echo 界面回波Interface trigger 界面触发Interference 干涉Interpretation 解释Ion pump 离子泵Ion source 离子源Ionization chamber 电离室Ionization potential 电离电位Ionization vacuum gage 电离真空计Ionography 电离射线透照术Irradiance, E 辐射通量密度, EIsolation 隔离检测Isotope 同位素K value K值Kaiser effect 凯塞(Kaiser)效应Kilo volt kv 千伏特Kiloelectron volt keV千电子伏特Krypton 85 氪85L/D ratio L/D比Lamb wave 兰姆波Latent image 潜象Lateral scan 左右扫查Lateral scan with oblique angle 斜平行扫查Latitude (of an emulsion) 胶片宽容度Lead screen 铅屏Leak 泄漏孔Leak artifact 泄漏器Leak detector 检漏仪Leak testtion 泄漏检测Leakage field 泄漏磁场Leakage rate 泄漏率Leechs 磁吸盘Lift-off effect 提离效应Light intensity 光强度Limiting resolution 极限分辨率Line scanner 线扫描器Line focus 线焦点Line pair pattern 线对检测图Line pairs per millimetre 每毫米线对数Linear (electron) accelerator(LINAC) 电子直线加速器Linear attenuation coefficient 线衰减系数Linear scan 线扫查Linearity (time or distance)线性(时间或距离)Linearity, anplitude 幅度线性Lines of force 磁力线Lipophilic emulsifier 亲油性乳化剂Lipophilic remover 亲油性洗净剂Liquid penetrant examination 液体渗透检验Liquid film developer 液膜显像剂Local magnetization 局部磁化Local magnetization method 局部磁化法Local scan 局部扫查Localizing cone 定域喇叭筒Location 定位Location accuracy 定位精度Location computed 定位,计算Location marker 定位标记Location upon delta-T 时差定位Location, clusfer 定位,群集Location,continuous AE signal 定位,连续AE信号Longitudinal field 纵向磁场Longitudinal magnetization method 纵向磁化法Longitudinal resolution 纵向分辨率Longitudinal wave 纵波Longitudinal wave probe 纵波探头Longitudinal wave technique 纵波法Loss of back reflection 背面反射损失Loss of back reflection 底面反射损失Love wave 乐甫波Low energy gamma radiation 低能γ辐射Low-enerugy photon radiation 低能光子辐射Luminance 亮度Luminosity 流明Lusec 流西克Maga or million electron volts MeV兆电子伏特Magnetic history 磁化史Magnetic hysteresis 磁性滞后Magnetic particle field indication 磁粉磁场指示器Magnetic particle inspection flaw indications 磁粉检验的伤显示Magnetic circuit 磁路Magnetic domain 磁畴Magnetic field distribution 磁场分布Magnetic field indicator 磁场指示器Magnetic field meter 磁场计Magnetic field strength 磁场强度(H)Magnetic field/field,magnetic 磁场Magnetic flux 磁通Magnetic flux density 磁通密度Magnetic force 磁化力Magnetic leakage field 漏磁场Magnetic leakage flux 漏磁通Magnetic moment 磁矩Magnetic particle 磁粉Magnetic particle indication 磁痕Magnetic particle testing/magnetic particle examination 磁粉检测Magnetic permeability 磁导率Magnetic permeability 磁导率Magnetic pole 磁极Magnetic saturataion 磁饱和Magnetic saturation 磁饱和Magnetic slorage meclium 磁储介质Magnetic writing 磁写Magnetizing 磁化Magnetizing current 磁化电流Magnetizing coil 磁化线圈Magnetostrictive effect 磁致伸缩效应Magnetostrictive transducer 磁致伸缩换能器Main beam 主声束Manual testing 手动检测Markers 时标MA-scope; MA-scan MA型显示Masking 遮蔽Mass attcnuation coefficient 质量吸收系数Mass number 质量数Mass spectrometer (M.S.)质谱仪Mass spectrometer leak detector 质谱检漏仪Mass spectrum 质谱Master/slave discrimination 主从鉴别MDTD 最小可测温度差Mean free path 平均自由程Medium vacuum 中真空Mega or million volt MV兆伏特Micro focus X - ray tube 微焦点X 光管Microfocus radiography 微焦点射线透照术Micrometre 微米Micron of mercury 微米汞柱Microtron 电子回旋加速器Milliampere 毫安(mA)Millimetre of mercury 毫米汞柱Minifocus x- ray tube 小焦点调射线管Minimum detectable leakage rate 最小可探泄漏率Minimum resolvable temperature difference (MRTD)最小可分辨温度差(MRDT)Mode 波型Mode conversion 波型转换Mode transformation 波型转换Moderator 慢化器Modulation transfer function (MTF)调制转换功能(MTF)Modulation analysis 调制分析Molecular flow 分子流Molecular leak 分子泄漏Monitor 监控器Monochromatic 单色波Movement unsharpness 移动不清晰度Moving beam radiography 可动射束射线透照术Multiaspect magnetization method 多向磁化法Multidirectional magnetization 多向磁化Multifrequency eddy current testiog 多频涡流检测Multiple back reflections 多次背面反射Multiple reflections 多次反射Multiple back reflections 多次底面反射Multiple echo method 多次反射法Multiple probe technique 多探头法Multiple triangular array 多三角形阵列Narrow beam condition 窄射束NC NCNear field 近场Near field length 近场长度Near surface defect 近表面缺陷Net density 净黑度Net density 净(光学)密度Neutron 中子Neutron radiograhy 中子射线透照Neutron radiography 中子射线透照术Newton (N)牛顿Nier mass spectrometer 尼尔质谱仪Noise 噪声Noise 噪声Noise equivalent temperature difference (NETD)噪声当量温度差(NETD)Nominal angle 标称角度Nominal frequency 标称频率Non-aqueous liquid developer 非水性液体显像剂Noncondensable gas 非冷凝气体Nondcstructivc Examination(NDE)无损试验Nondestructive Evaluation(NDE)无损评价Nondestructive Inspection(NDI)无损检验Nondestructive Testing(NDT)无损检测Nonerasble optical data 可固定光学数据Nonferromugnetic material 非铁磁性材料Nonrelevant indication 非相关指示Non-screen-type film 非增感型胶片Normal incidence 垂直入射(亦见直射声束)Normal permeability 标准磁导率Normal beam method; straight beam method 垂直法Normal probe 直探头Normalized reactance 归一化电抗Normalized resistance 归一化电阻Nuclear activity 核活性Nuclide 核素Object plane resolution 物体平面分辨率Object scattered neutrons 物体散射中子Object beam 物体光束Object beam angle 物体光束角Object-film distance 被检体-胶片距离Object一film distance 物体- 胶片距离Over development 显影过度Over emulsfication 过乳化Overall magnetization 整体磁化Overload recovery time 过载恢复时间Overwashing 过洗Oxidation fog 氧化灰雾P PPair production 偶生成Pair production 电子对产生Pair production 电子偶的产生Palladium barrier leak detector 钯屏检漏仪Panoramic exposure 全景曝光Parallel scan 平行扫查Paramagnetic material 顺磁性材料Parasitic echo 干扰回波Partial pressure 分压Particle content 磁悬液浓度Particle velocity 质点(振动)速度Pascal (Pa)帕斯卡(帕)Pascal cubic metres per second 帕立方米每秒(Pa?m3/s )Path length 光程长Path length difference 光程长度差Pattern 探伤图形Peak current 峰值电流Penetrameter 透度计Penetrameter sensitivity 透度计灵敏度Penetrant 渗透剂Penetrant comparator 渗透对比试块Penetrant flaw detection 渗透探伤Penetrant removal 渗透剂去除Penetrant station 渗透工位Penetrant, water- washable 水洗型渗透剂Penetration 穿透深度Penetration time 渗透时间Permanent magnet 永久磁铁Permeability coefficient 透气系数Permeability,a-c 交流磁导率Permeability,d-c 直流磁导率Phantom echo 幻象回波Phase analysis 相位分析Phase angle 相位角Phase controlled circuit breaker 断电相位控制器Phase detection 相位检测Phase hologram 相位全息Phase sensitive detector 相敏检波器Phase shift 相位移Phase velocity 相速度Phase-sensitive system 相敏系统Phillips ionization gage 菲利浦电离计Phosphor 荧光物质Photo fluorography 荧光照相术Photoelectric absorption 光电吸收Photographic emulsion 照相乳剂Photographic fog 照相灰雾Photostimulable luminescence 光敏发光Piezoelectric effect 压电效应Piezoelectric material 压电材料Piezoelectric stiffness constant 压电劲度常数Piezoelectric stress constant 压电应力常数Piezoelectric transducer 压电换能器Piezoelectric voltage constant 压电电压常数Pirani gage 皮拉尼计Pirani gage 皮拉尼计Pitch and catch technique 一发一收法Pixel 象素Pixel size 象素尺寸Pixel, disply size 象素显示尺寸Planar array 平面阵(列)Plane wave 平面波Plate wave 板波Plate wave technique 板波法Point source 点源Post emulsification 后乳化Post emulsifiable penetrant 后乳化渗透剂Post-cleaning 后清除Post-cleaning 后清洗Powder 粉未Powder blower 喷粉器Powder blower 磁粉喷枪Pre-cleaning 预清理Pressure difference 压力差Pressure dye test 压力着色检测Pressure probe 压力探头Pressure testing 压力检测Pressure- evacuation test 压力抽空检测Pressure mark 压痕Pressure,design 设计压力Pre-test 初探Primary coil 一次线圈Primary radiation 初级辐射Probe gas 探头气体Probe test 探头检测Probe backing 探头背衬Probe coil 点式线圈Probe coil 探头式线圈Probe coil clearance 探头线圈间隙Probe index 探头入射点Probe to weld distance 探头-焊缝距离Probe/ search unit 探头Process control radiograph 工艺过程控制的射线照相Processing capacity 处理能力Processing speed 处理速度Prods 触头Projective radiography 投影射线透照术Proportioning probe 比例探头Protective material 防护材料Proton radiography 质子射线透照Pulse 脉冲波Pulse 脉冲Pulse echo method 脉冲回波法Pulse repetition rate 脉冲重复率Pulse amplitude 脉冲幅度Pulse echo method 脉冲反射法Pulse energy 脉冲能量Pulse envelope 脉冲包络Pulse length 脉冲长度Pulse repetition frequency 脉冲重复频率Pulse tuning 脉冲调谐Pump- out tubulation 抽气管道Pump-down time 抽气时间Q factor Q值Quadruple traverse technique 四次波法Quality (of a beam of radiation) 射线束的质Quality factor 品质因数Quenching 阻塞Quenching of fluorescence 荧光的猝灭Quick break 快速断间Rad(rad) 拉德Radiance, L 面辐射率,LRadiant existence, M 幅射照度MRadiant flux; radiant power,ψe 辐射通量、辐射功率、ψe Radiation 辐射Radiation does 辐射剂量Radio frequency (r- f) display 射频显示Radio- frequency mass spectrometer 射频质谱仪Radio frequency(r-f) display 射频显示Radiograph 射线底片Radiographic contrast 射线照片对比度Radiographic equivalence factor 射线照相等效系数Radiographic exposure 射线照相曝光量Radiographic inspection 射线检测Radiographic inspection 射线照相检验Radiographic quality 射线照相质量Radiographic sensitivity 射线照相灵敏度Radiographic contrast 射线底片对比度Radiographic equivalence factor 射线透照等效因子Radiographic inspection 射线透照检查Radiographic quality 射线透照质量Radiographic sensitivity 射线透照灵敏度Radiography 射线照相术Radiological examination 射线检验Radiology 射线学Radiometer 辐射计Radiometry 辐射测量术Radioscopy 射线检查法Range 量程Rayleigh wave 瑞利波Rayleigh scattering 瑞利散射Real image 实时图像Real-time radioscopy 实时射线检查法Rearm delay time 重新准备延时时间Rearm delay time 重新进入工作状态延迟时间Reciprocity failure 倒易律失效Reciprocity law 倒易律Recording medium 记录介质Recovery time 恢复时间Rectified alternating current 脉动直流电Reference block 参考试块Reference beam 参考光束Reference block 对比试块Reference block method 对比试块法Reference coil 参考线圈Reference line method 基准线法Reference standard 参考标准Reflection 反射Reflection coefficient 反射系数Reflection density 反射密度Reflector 反射体Refraction 折射Refractive index 折射率Refrence beam angle 参考光束角Reicnlbation 网纹Reject; suppression 抑制Rejection level 拒收水平Relative permeability 相对磁导率Relevant indication 相关指示Reluctance 磁阻Rem(rem) 雷姆Remote controlled testing 机械化检测Replenisers 补充剂Representative quality indicator 代表性质量指示器Residual magnetic field/field, residual magnetic 剩磁场Residual technique 剩磁技术Residual magnetic method 剩磁法Residual magnetism 剩磁Resistance (to flow)气阻Resolution 分辨力Resonance method 共振法Response factor 响应系数Response time 响应时间Resultant field 复合磁场Resultant magnetic field 合成磁场Resultant magnetization method 组合磁化法Retentivity 顽磁性Reversal 反转现象Ring-down count 振铃计数Ring-down count rate 振铃计数率Rinse 清洗Rise time 上升时间Rise-time discrimination 上升时间鉴别Rod-anode tube 棒阳极管Roentgen(R) 伦琴Roof angle 屋顶角Rotational magnetic field 旋转磁场Rotational magnetic field method 旋转磁场法Rotational scan 转动扫查Roughing 低真空Roughing line 低真空管道Roughing pump 低真空泵S SSafelight 安全灯Sampling probe 取样探头Saturation 饱和Saturation,magnetic 磁饱和Saturation level 饱和电平Scan on grid lines 格子线扫查Scan pitch 扫查间距Scanning 扫查Scanning index 扫查标记Scanning directly on the weld 焊缝上扫查Scanning path 扫查轨迹Scanning sensitivity 扫查灵敏度Scanning speed 扫查速度Scanning zone 扫查区域Scattared energy 散射能量Scatter unsharpness 散射不清晰度Scattered neutrons 散射中子Scattered radiation 散射辐射Scattering 散射Schlieren system 施利伦系统Scintillation counter 闪烁计数器Scintillator and scintillating crystals 闪烁器和闪烁晶体Screen 屏Screen unsharpness 荧光增感屏不清晰度Screen-type film 荧光增感型胶片SE probe SE探头Search-gas 探测气体Second critical angle 第二临界角Secondary radiation 二次射线Secondary coil 二次线圈Secondary radiation 次级辐射Selectivity 选择性Semi-conductor detector 半导体探测器Sensitirity va1ue 灵敏度值Sensitivity 灵敏度Sensitivity of leak test 泄漏检测灵敏度Sensitivity control 灵敏度控制Shear wave 切变波Shear wave probe 横波探头Shear wave technique 横波法Shim 薄垫片Shot 冲击通电Side lobe 副瓣Side wall 侧面Sievert(Sv) 希(沃特)Signal 信号Signal gradient 信号梯度Signal over load point 信号过载点Signal overload level 信号过载电平Signal to noise ratio 信噪比Single crystal probe 单晶片探头Single probe technique 单探头法Single traverse technique 一次波法Sizing technique 定量法Skin depth 集肤深度Skin effect 集肤效应Skip distance 跨距Skip point 跨距点Sky shine(air scatter) 空中散射效应Sniffing probe 嗅吸探头Soft X-rays 软X射线Soft-faced probe 软膜探头Solarization 负感作用Solenoid 螺线管Soluble developer 可溶显像剂Solvent remover 溶剂去除剂Solvent cleaners 溶剂清除剂Solvent developer 溶剂显像剂Solvent remover 溶剂洗净剂Solvent-removal penetrant 溶剂去除型渗透剂Sorption 吸着Sound diffraction 声绕射Sound insulating layer 隔声层Sound intensity 声强Sound intensity level 声强级Sound pressure 声压Sound scattering 声散射Sound transparent layer 透声层Sound velocity 声速Source 源Source data label 放射源数据标签Source location 源定位Source size 源尺寸Source-film distance 射线源-胶片距离Spacial frequency 空间频率Spark coil leak detector 电火花线圈检漏仪Specific activity 放射性比度Specified sensitivity 规定灵敏度Standard 标准Standard 标准试样Standard leak rate 标准泄漏率Standard leak 标准泄漏孔Standard tast block 标准试块Standardization instrument 设备标准化Standing wave; stationary wave 驻波Step wedge 阶梯楔块Step- wadge calibration film 阶梯楔块校准底片Step- wadge comparison film 阶梯楔块比较底片Step wedge 阶梯楔块Step-wedge calibration film 阶梯-楔块校准片Step-wedge comparison film 阶梯-楔块比较片Stereo-radiography 立体射线透照术Subject contrast 被检体对比度Subsurface discontinuity 近表面不连续性Suppression 抑制Surface echo 表面回波Surface field 表面磁场Surface noise 表面噪声Surface wave 表面波Surface wave probe 表面波探头Surface wave technique 表面波法Surge magnetization 脉动磁化Surplus sensitivity 灵敏度余量Suspension 磁悬液Sweep 扫描Sweep range 扫描范围Sweep speed 扫描速度Swept gain 扫描增益Swivel scan 环绕扫查System exanlillatien threshold 系统检验阈值System inclacel artifacts 系统感生物System noise 系统噪声Tackground, target 目标本底Tandem scan 串列扫查Target 耙Target 靶Television fluoroscopy 电视X射线荧光检查Temperature envelope 温度范围Tenth-value-layer(TVL) 十分之一值层Test coil 检测线圈Test quality level 检测质量水平Test ring 试环Test block 试块Test frequency 试验频率Test piece 试片Test range 探测范围Test surface 探测面Testing,ulrasonic 超声检测Thermal neutrons 热中子Thermocouple gage 热电偶计Thermogram 热谱图Thermography, infrared 红外热成象Thermoluminescent dosemeter(TLD) 热释光剂量计Thickness sensitivity 厚度灵敏度Third critiical angle 第三临界角Thixotropic penetrant 摇溶渗透剂Thormal resolution 热分辨率Threading bar 穿棒Three way sort 三档分选Threshold setting 门限设置Threshold fog 阈值灰雾Threshold level 阀值Threshotd tcnet 门限电平Throttling 节流Through transmission technique 穿透技术Through penetration technique 贯穿渗透法Through transmission technique; transmission technique 穿透法Through-coil technique 穿过式线圈技术Throughput 通气量Tight 密封Total reflection 全反射Totel image unsharpness 总的图像不清晰度Tracer probe leak location 示踪探头泄漏定位Tracer gas 示踪气体Transducer 换能器/传感器Transition flow 过渡流Translucent base media 半透明载体介质Transmission 透射Transmission densitomefer 发射密度计Transmission coefficient 透射系数Transmission point 透射点Transmission technique 透射技术Transmittance,τ 透射率τTransmitted film density 检测底片黑度Transmitted pulse 发射脉冲Transverse resolution 横向分辨率Transverse wave 横波Traveling echo 游动回波Travering scan; depth scan 前后扫查Triangular array 正三角形阵列Trigger/alarm condition 触发/报警状态Trigger/alarm level 触发/报警标准Triple traverse technique 三次波法True continuous technique 准确连续法技术Trueattenuation 真实衰减Tube current 管电流Tube head 管头Tube shield 管罩Tube shutter 管子光闸Tube window 管窗Tube-shift radiography 管子移位射线透照术Two-way sort 两档分选Ultra- high vacuum 超高真空Ultrasonic leak detector 超声波检漏仪Ultrasonic noise level 超声噪声电平Ultrasonic cleaning 超声波清洗Ultrasonic field 超声场Ultrasonic flaw detection 超声探伤Ultrasonic flaw detector 超声探伤仪Ultrasonic microscope 超声显微镜Ultrasonic spectroscopy 超声频谱Ultrasonic testing system 超声检测系统Ultrasonic thickness gauge 超声测厚仪Ultraviolet radiation 紫外辐射Under development 显影不足Unsharpness 不清晰Useful density range 有效光学密度范围UV-A A类紫外辐射UV-A filter A类紫外辐射滤片Vacuum 真空Vacuum cassette 真空暗盒Vacuum testing 真空检测Vacuum cassette 真空暗合Van de Graaff generator 范德格喇夫起电机Vapor pressure 蒸汽压Vapour degreasing 蒸汽除油Variable angle probe 可变角探头Vee path V型行程Vehicle 载体Vertical linearity 垂直线性Vertical location 垂直定位Visible light 可见光Vitua limage 虚假图像Voltage threshold 电压阈值Voltage threshold 阈值电压Wash station 水洗工位Water break test 水膜破坏试验Water column coupling method 水柱耦合法Water column probe 水柱耦合探头Water path; water distance 水程Water tolerance 水容限Water-washable penetrant 可水洗型渗透剂Wave 波Wave guide acoustic emission 声发射波导杆Wave train 波列Wave from 波形Wave front 波前Wave length 波长Wave node 波节Wave train 波列Wedge 斜楔Wet slurry technique 湿软磁膏技术Wet technique 湿法技术Wet method 湿粉法Wetting action 润湿作用Wetting action 润湿作用Wetting agents 润湿剂Wheel type probe; wheel search unit 轮式探头White light 白光White X-rays 连续X射线Wobble 摆动Wobble effect 抖动效应Working sensitivity 探伤灵敏度Wrap around 残响波干扰Xeroradiography 静电射线透照术X-radiation X射线X-ray controller X射线控制器X-ray detection apparatus X射线探伤装置X-ray film 射线胶片X-ray paper X射线感光纸X-ray tube X射线管。
核临界和辐射防护术语中英文对照
[Particle] fluence rate Energy fluence rate Particle radiance Energy radiance Energy imparted Linear energy Specific energy[imparted] Absorbed dose Absorbed dose rate kerma Kerma rate Exposure Exposure rate Decay constant Radioactive half-life Biological half-life Effective half-life Activity Surface activity Activity concentration Specific activity Air kerma rate constant Dose equicalent Dose equivalent Dose equivalent rate Adsorbed dose index Quality factor Dose equivalent indx Surface dose equivalent index Depth dose equivalent index Cross section Lethargy Attenuation coefficient Mass attenuation coefficient Mass energy transfer coefficient adsorption coefficient Mass energy adsorption coefficient Total mass stopping coefficient Linear energy transfer, LET
核临界术语 临界的,临界 中子反照率 吸收剂量 中子吸收 临界事故报警系统 α 粒子 β 粒子 曲率 瞬发脉冲 核闪变周期(T) 指数柱体 照射量 几何良好 易裂变核素 易裂变系统 核裂变 裂变产物 核闪变的裂变产额 可裂变核素 γ 辐射 戈瑞 危险 倒时数 致电离辐射 “辐照” 辐射 反应性 非补偿反应性 反射层 反射层节省 相对生物效应 雷姆 雷普 危险度 伦琴 紧急停堆 停堆机制 Critical,Criticality Albedo,neutron Absorbed dose Absorption,neutron Alarm system,criticality accident Alpha particle Beta particle buckling Burst,prompt Excursion period Exponential column exposure Favorable geometry Fissile nucleus Fissile system Fission,nuclear Fission products Fissionyield,excursion Fissionable nucleus Gamma radiation Gray (Gy) hazard inhour Ionizing radiation irradiation radiation reactivity Reactivity,uncompensated reflector Reflector savings (RBE) rem rep risk roentgen scram Shutdown mechanism
无损检测专业英语对照表
外语英语英文专业词汇术语翻译:无损检测(non-destructive )A.C magnetic saturation 交流磁饱和Absorbed dose 吸收剂量Absorbed dose rate 吸收剂量率Acceptanc limits 验收范围Acceptance level 验收水平Acceptance standard 验收标准Accumulation test 累积检测Acoustic emission count(emission count)声发射计数(发射计数)Acoustic emission transducer 声发射换能器(声发射传感器)Acoustic emission(AE) 声发射Acoustic holography 声全息术Acoustic impedance 声阻抗Acoustic impedance matching 声阻抗匹配Acoustic impedance method 声阻法Acoustic wave 声波Acoustical lens 声透镜Acoustic—ultrasonic 声-超声(AU)Activation 活化Activity 活度Adequate shielding 安全屏蔽Ampere turns 安匝数Amplitude 幅度Angle beam method 斜射法Angle of incidence 入射角Angle of reflection 反射角Angle of spread 指向角Angle of squint 偏向角Angle probe 斜探头Angstrom unit 埃(A)Area amplitude response curve 面积幅度曲线Area of interest 评定区Arliflcial disconlinuity 人工不连续性Artifact 假缺陷Artificial defect 人工缺陷Artificial discontinuity 标准人工缺陷A-scan A型扫描A-scope; A-scan A型显示Attenuation coefficient 衰减系数Attenuator 衰减器Audible leak indicator 音响泄漏指示器Automatic testing 自动检测Autoradiography 自射线照片Avaluation 评定Barium concrete 钡混凝土Barn 靶Base fog 片基灰雾Bath 槽液Bayard- Alpert ionization gage B- A型电离计Beam 声束Beam ratio 光束比Beam angle 束张角Beam axis 声束轴线Beam index 声束入射点Beam path location 声程定位Beam path; path length 声程Beam spread 声束扩散Betatron 电子感应加速器Bimetallic strip gage 双金属片计Bipolar field 双极磁场Black light filter 黑光滤波器Black light; ultraviolet radiation 黑光Blackbody 黑体Blackbody equivalent temperature 黑体等效温度Bleakney mass spectrometer 波利克尼质谱仪Bleedout 渗出Bottom echo 底面回波Bottom surface 底面Boundary echo(first) 边界一次回波Bremsstrahlung 轫致辐射Broad-beam condition 宽射束Brush application 刷涂B-scan presenfation B型扫描显示B-scope; B-scan B型显示C- scan C型扫描Calibration,instrument 设备校准Capillary action 毛细管作用Carrier fluid 载液Carry over of penetrate 渗透剂移转Cassette 暗合Cathode 阴极Central conductor 中心导体Central conductor method 中心导体法Characteristic curve 特性曲线Characteristic curve of film 胶片特性曲线Characteristic radiation 特征辐射Chemical fog 化学灰雾Cine-radiography 射线(活动)电影摄影术Cintact pads 接触垫Circumferential coils 圆环线圈Circumferential field 周向磁场Circumferential magnetization method 周向磁化法Clean 清理Clean- up 清除Clearing time 定透时间Coercive force 矫顽力Coherence 相干性Coherence length 相干长度(谐波列长度)Coi1,test 测试线圈Coil size 线圈大小Coil spacing 线圈间距Coil technique 线圈技术Coil method 线圈法Coilreference 线圈参考Coincidence discrimination 符合鉴别Cold-cathode ionization gage 冷阴极电离计Collimator 准直器Collimation 准直Collimator 准直器Combined colour comtrast and fluorescent penetrant 着色荧光渗透剂Compressed air drying 压缩空气干燥Compressional wave 压缩波Compton scatter 康普顿散射Continuous emission 连续发射Continuous linear array 连续线阵Continuous method 连续法Continuous spectrum 连续谱Continuous wave 连续波Contract stretch 对比度宽限Contrast 对比度Contrast agent 对比剂Contrast aid 反差剂Contrast sensitivity 对比灵敏度Control echo 监视回波Control echo 参考回波Couplant 耦合剂Coupling 耦合Coupling losses 耦合损失Cracking 裂解Creeping wave 爬波Critical angle 临界角Cross section 横截面Cross talk 串音Cross-drilled hole 横孔Crystal 晶片C-scope; C-scan C型显示Curie point 居里点Curie temperature 居里温度Curie(Ci) 居里Current flow method 通电法Current induction method 电流感应法Current magnetization method 电流磁化法Cut-off level 截止电平Dead zone 盲区Decay curve 衰变曲线Decibel(dB) 分贝Defect 缺陷Defect resolution 缺陷分辨力Defect detection sensitivity 缺陷检出灵敏度Defect resolution 缺陷分辨力Definition 清晰度Definition,image definition 清晰度,图像清晰度Demagnetization 退磁Demagnetization factor 退磁因子Demagnetizer 退磁装置Densitometer 黑度计Density 黑度(底片)Density comparison strip 黑度比较片Detecting medium 检验介质Detergent remover 洗净液Developer 显像剂Developer station 显像工位Developer,agueons 水性显象剂Developer,dry 干显象剂Developer,liquid film 液膜显象剂Developer,nonaqueous (sus- pendible)非水(可悬浮)显象剂Developing time 显像时间Development 显影Diffraction mottle 衍射斑Diffuse indications 松散指示Diffusion 扩散Digital image acquisition system 数字图像识别系统Dilatational wave 膨胀波Dip and drain station 浸渍和流滴工位Direct contact magnetization 直接接触磁化Direct exposure imaging 直接曝光成像Direct contact method 直接接触法Directivity 指向性Discontinuity 不连续性Distance- gain- size-German AVG 距离- 增益- 尺寸(DGS德文为AVG)Distance marker; time marker 距离刻度Dose equivalent 剂量当量Dose rate meter 剂量率计Dosemeter 剂量计Double crystal probe 双晶片探头Double probe technique 双探头法Double transceiver technique 双发双收法Double traverse technique 二次波法Dragout 带出Drain time 滴落时间Drain time 流滴时间Drift 漂移Dry method 干法Dry powder 干粉Dry technique 干粉技术Dry developer 干显像剂Dry developing cabinet 干显像柜Dry method 干粉法Drying oven 干燥箱Drying station 干燥工位Drying time 干燥时间D-scope; D-scan D型显示Dual search unit 双探头Dual-focus tube 双焦点管Duplex-wire image quality indicator 双线像质指示器Duration 持续时间Dwell time 停留时间Dye penetrant 着色渗透剂Dynamic leak test 动态泄漏检测Dynamic leakage measurement 动态泄漏测量Dynamic range 动态范围Dynamic radiography 动态射线透照术Echo 回波Echo frequency 回波频率Echo height 回波高度Echo indication 回波指示Echo transmittance of sound pressure 往复透过率Echo width 回波宽度Eddy current 涡流Eddy current flaw detector 涡流探伤仪Eddy current testiog 涡流检测Edge 端面Edge effect 边缘效应Edge echo 棱边回波Edge effect 边缘效应Effective depth penetration (EDP)有效穿透深度Effective focus size 有效焦点尺寸Effective magnetic permeability 有效磁导率Effective permeability 有效磁导率Effective reflection surface of flaw 缺陷有效反射面Effective resistance 有效电阻Elastic medium 弹性介质Electric displacement 电位移Electrical center 电中心Electrode 电极Electromagnet 电磁铁Electro-magnetic acoustic transducer 电磁声换能器Electromagnetic induction 电磁感应Electromagnetic radiation 电磁辐射Electromagnetic testing 电磁检测Electro-mechanical coupling factor 机电耦合系数Electron radiography 电子辐射照相术Electron volt 电子伏恃Electronic noise 电子噪声Electrostatic spraying 静电喷涂Emulsification 乳化Emulsification time 乳化时间Emulsifier 乳化剂Encircling coils 环绕式线圈End effect 端部效应Energizing cycle 激励周期Equalizing filter 均衡滤波器Equivalent 当量Equivalent I.Q. I. Sensitivity 象质指示器当量灵敏度Equivalent nitrogen pressure 等效氮压Equivalent penetrameter sensifivty 透度计当量灵敏度Equivalent method 当量法Erasabl optical medium 可探光学介质Etching 浸蚀Evaluation 评定Evaluation threshold 评价阈值Event count 事件计数Event count rate 事件计数率Examination area 检测范围Examination region 检验区域Exhaust pressure/discharge pressure 排气压力Exhaust tubulation 排气管道Expanded time-base sweep 时基线展宽Exposure 曝光Exposure table 曝光表格Exposure chart 曝光曲线Exposure fog 曝光灰雾Exposure,radiographic exposure 曝光,射线照相曝光Extended source 扩展源Facility scattered neutrons 条件散射中子False indication 假指示Family 族Far field 远场Feed-through coil 穿过式线圈Field,resultant magnetic 复合磁场Fill factor 填充系数Film speed 胶片速度Film badge 胶片襟章剂量计Film base 片基Film contrast 胶片对比度Film gamma 胶片γ值Film processing 胶片冲洗加工Film speed 胶片感光度Film unsharpness 胶片不清晰度Film viewing screen 观察屏Filter 滤波器/滤光板Final test 复探Flat-bottomed hole 平底孔Flat-bottomed hole equivalent 平底孔当量Flaw 伤Flaw characterization 伤特性Flaw echo 缺陷回波Flexural wave 弯曲波Floating threshold 浮动阀值Fluorescence 荧光Fluorescent examination method 荧光检验法Fluorescent magnetic particle inspection 荧光磁粉检验Fluorescent dry deposit penetrant 干沉积荧光渗透剂Fluorescent light 荧光Fluorescent magnetic powder 荧光磁粉Fluorescent penetrant 荧光渗透剂Fluorescent screen 荧光屏Fluoroscopy 荧光检查法Flux leakage field 磁通泄漏场Flux lines 磁通线Focal spot 焦点Focal distance 焦距Focus length 焦点长度Focus size 焦点尺寸Focus width 焦点宽度Focus(electron) 电子焦点Focused beam 聚焦声束Focusing probe 聚焦探头Focus-to-film distance(f.f.d) 焦点-胶片距离(焦距)Fog 底片灰雾Fog density 灰雾密度Footcandle 英尺烛光Freguency 频率Frequency constant 频率常数Fringe 干涉带Front distance 前沿距离Front distance of flaw 缺陷前沿距离Full- wave direct current(FWDC)全波直流Fundamental frequency 基频Furring 毛状迹痕Gage pressure 表压Gain 增益Gamma radiography γ射线透照术Gamma ray source γ射线源Gamma ray source container γ射线源容器Gamma rays γ射线Gamma-ray radiographic equipment γ射线透照装置Gap scanning 间隙扫查Gas 气体Gate 闸门Gating technique 选通技术Gauss 高斯Geiger-Muller counter 盖革.弥勒计数器Geometric unsharpness 几何不清晰度Gray(Gy) 戈瑞Grazing incidence 掠入射Grazing angle 掠射角Group velocity 群速度Half life 半衰期Half- wave current (HW)半波电流Half-value layer(HVL) 半值层Half-value method 半波高度法Halogen 卤素Halogen leak detector 卤素检漏仪Hard X-rays 硬X射线Hard-faced probe 硬膜探头Harmonic analysis 谐波分析Harmonic distortion 谐波畸变Harmonics 谐频Head wave 头波Helium bombing 氦轰击法Helium drift 氦漂移Helium leak detector 氦检漏仪Hermetically tight seal 气密密封High vacuum 高真空High energy X-rays 高能X射线Holography (optical) 光全息照相Holography,acoustic 声全息Hydrophilic emulsifier 亲水性乳化剂Hydrophilic remover 亲水性洗净剂Hydrostatic text 流体静力检测Hysteresis 磁滞Hysteresis 磁滞IACS IACSID coil ID线圈Image definition 图像清晰度Image contrast 图像对比度Image enhancement 图像增强Image magnification 图像放大Image quality 图像质量Image quality indicator sensitivity 像质指示器灵敏度Image quality indicator(IQI)/image quality indication 像质指示器Imaging line scanner 图像线扫描器Immersion probe 液浸探头Immersion rinse 浸没清洗Immersion testing 液浸法Immersion time 浸没时间Impedance 阻抗Impedance plane diagram 阻抗平面图Imperfection 不完整性Impulse eddy current testing 脉冲涡流检测Incremental permeability 增量磁导率Indicated defect area 缺陷指示面积Indicated defect length 缺陷指示长度Indication 指示Indirect exposure 间接曝光Indirect magnetization 间接磁化Indirect magnetization method 间接磁化法Indirect scan 间接扫查Induced field 感应磁场Induced current method 感应电流法Infrared imaging system 红外成象系统Infrared sensing device 红外扫描器Inherent fluorescence 固有荧光Inherent filtration 固有滤波Initial permeability 起始磁导率Initial pulse 始脉冲Initial pulse width 始波宽度Inserted coil 插入式线圈Inside coil 内部线圈Inside- out testing 外泄检测Inspection 检查Inspection medium 检查介质Inspection frequency/ test frequency 检测频率Intensifying factor 增感系数Intensifying screen 增感屏Interal,arrival time (Δtij)/arrival time interval(Δtij)到达时间差(Δtij) Interface boundary 界面Interface echo 界面回波Interface trigger 界面触发Interference 干涉Interpretation 解释Ion pump 离子泵Ion source 离子源Ionization chamber 电离室Ionization potential 电离电位Ionization vacuum gage 电离真空计Ionography 电离射线透照术Irradiance,E 辐射通量密度,E Isolation 隔离检测Isotope 同位素K value K值Kaiser effect 凯塞(Kaiser)效应Kilo volt kv 千伏特Kiloelectron volt keV千电子伏特Krypton 85 氪85L/D ratio L/D比Lamb wave 兰姆波Latent image 潜象Lateral scan 左右扫查Lateral scan with oblique angle 斜平行扫查Latitude (of an emulsion) 胶片宽容度Lead screen 铅屏Leak 泄漏孔Leak artifact 泄漏器Leak detector 检漏仪Leak testtion 泄漏检测Leakage field 泄漏磁场Leakage rate 泄漏率Leechs 磁吸盘Lift-off effect 提离效应Light intensity 光强度Limiting resolution 极限分辨率Line scanner 线扫描器Line focus 线焦点Line pair pattern 线对检测图Line pairs per millimetre 每毫米线对数Linear (electron) accelerator(LINAC) 电子直线加速器Linear attenuation coefficient 线衰减系数Linear scan 线扫查Linearity (time or distance)线性(时间或距离)Linearity,anplitude 幅度线性Lines of force 磁力线Lipophilic emulsifier 亲油性乳化剂Lipophilic remover 亲油性洗净剂Liquid penetrant examination 液体渗透检验Liquid film developer 液膜显像剂Local magnetization 局部磁化Local magnetization method 局部磁化法Local scan 局部扫查Localizing cone 定域喇叭筒Location 定位Location accuracy 定位精度Location computed 定位,计算Location marker 定位标记Location upon delta-T 时差定位Location,clusfer 定位,群集Location,continuous AE signal 定位,连续AE信号Longitudinal field 纵向磁场Longitudinal magnetization method 纵向磁化法Longitudinal resolution 纵向分辨率Longitudinal wave 纵波Longitudinal wave probe 纵波探头Longitudinal wave technique 纵波法Loss of back reflection 背面反射损失Loss of back reflection 底面反射损失Love wave 乐甫波Low energy gamma radiation 低能γ辐射Low-enerugy photon radiation 低能光子辐射Luminance 亮度Luminosity 流明Lusec 流西克Maga or million electron volts MeV兆电子伏特Magnetic history 磁化史Magnetic hysteresis 磁性滞后Magnetic particle field indication 磁粉磁场指示器Magnetic particle inspection flaw indications 磁粉检验的伤显示Magnetic circuit 磁路Magnetic domain 磁畴Magnetic field distribution 磁场分布Magnetic field indicator 磁场指示器Magnetic field meter 磁场计Magnetic field strength 磁场强度(H)Magnetic field/field,magnetic 磁场Magnetic flux 磁通Magnetic flux density 磁通密度Magnetic force 磁化力Magnetic leakage field 漏磁场Magnetic leakage flux 漏磁通Magnetic moment 磁矩Magnetic particle 磁粉Magnetic particle indication 磁痕Magnetic particle testing/magnetic particle examination 磁粉检测Magnetic permeability 磁导率Magnetic permeability 磁导率Magnetic pole 磁极Magnetic saturataion 磁饱和Magnetic saturation 磁饱和Magnetic slorage meclium 磁储介质Magnetic writing 磁写Magnetizing 磁化Magnetizing current 磁化电流Magnetizing coil 磁化线圈Magnetostrictive effect 磁致伸缩效应Magnetostrictive transducer 磁致伸缩换能器Main beam 主声束Manual testing 手动检测Markers 时标MA-scope; MA-scan MA型显示Masking 遮蔽Mass attcnuation coefficient 质量吸收系数Mass number 质量数Mass spectrometer (M.S.)质谱仪Mass spectrometer leak detector 质谱检漏仪Mass spectrum 质谱Master/slave discrimination 主从鉴别MDTD 最小可测温度差Mean free path 平均自由程Medium vacuum 中真空Mega or million volt MV兆伏特Micro focus X - ray tube 微焦点X 光管Microfocus radiography 微焦点射线透照术Micrometre 微米Micron of mercury 微米汞柱Microtron 电子回旋加速器Milliampere 毫安(mA)Millimetre of mercury 毫米汞柱Minifocus x- ray tube 小焦点调射线管Minimum detectable leakage rate 最小可探泄漏率Minimum resolvable temperature difference (MRTD)最小可分辨温度差(MRDT)Mode 波型Mode conversion 波型转换Mode transformation 波型转换Moderator 慢化器Modulation transfer function (MTF)调制转换功能(MTF)Modulation analysis 调制分析Molecular flow 分子流Molecular leak 分子泄漏Monitor 监控器Monochromatic 单色波Movement unsharpness 移动不清晰度Moving beam radiography 可动射束射线透照术Multiaspect magnetization method 多向磁化法Multidirectional magnetization 多向磁化Multifrequency eddy current testiog 多频涡流检测Multiple back reflections 多次背面反射Multiple reflections 多次反射Multiple back reflections 多次底面反射Multiple echo method 多次反射法Multiple probe technique 多探头法Multiple triangular array 多三角形阵列Narrow beam condition 窄射束NC NCNear field 近场Near field length 近场长度Near surface defect 近表面缺陷Net density 净黑度Net density 净(光学)密度Neutron 中子Neutron radiograhy 中子射线透照Neutron radiography 中子射线透照术Newton (N)牛顿Nier mass spectrometer 尼尔质谱仪Noise 噪声Noise 噪声Noise equivalent temperature difference (NETD)噪声当量温度差(NETD)Nominal angle 标称角度Nominal frequency 标称频率Non-aqueous liquid developer 非水性液体显像剂Noncondensable gas 非冷凝气体Nondcstructivc Examination(NDE)无损试验Nondestructive Evaluation(NDE)无损评价Nondestructive Inspection(NDI)无损检验Nondestructive Testing(NDT)无损检测Nonerasble optical data 可固定光学数据Nonferromugnetic material 非铁磁性材料Nonrelevant indication 非相关指示Non-screen-type film 非增感型胶片Normal incidence 垂直入射(亦见直射声束)Normal permeability 标准磁导率Normal beam method; straight beam method 垂直法Normal probe 直探头Normalized reactance 归一化电抗Normalized resistance 归一化电阻Nuclear activity 核活性Nuclide 核素Object plane resolution 物体平面分辨率Object scattered neutrons 物体散射中子Object beam 物体光束Object beam angle 物体光束角Object-film distance 被检体-胶片距离Object一film distance 物体- 胶片距离Over development 显影过度Over emulsfication 过乳化Overall magnetization 整体磁化Overload recovery time 过载恢复时间Overwashing 过洗Oxidation fog 氧化灰雾P PPair production 偶生成Pair production 电子对产生Pair production 电子偶的产生Palladium barrier leak detector 钯屏检漏仪Panoramic exposure 全景曝光Parallel scan 平行扫查Paramagnetic material 顺磁性材料Parasitic echo 干扰回波Partial pressure 分压Particle content 磁悬液浓度Particle velocity 质点(振动)速度Pascal (Pa)帕斯卡(帕)Pascal cubic metres per second 帕立方米每秒(Pa•m3/s )Path length 光程长Path length difference 光程长度差Pattern 探伤图形Peak current 峰值电流Penetrameter 透度计Penetrameter sensitivity 透度计灵敏度Penetrant 渗透剂Penetrant comparator 渗透对比试块Penetrant flaw detection 渗透探伤Penetrant removal 渗透剂去除Penetrant station 渗透工位Penetrant,water- washable 水洗型渗透剂Penetration 穿透深度Penetration time 渗透时间Permanent magnet 永久磁铁Permeability coefficient 透气系数Permeability,a-c 交流磁导率Permeability,d-c 直流磁导率Phantom echo 幻象回波Phase analysis 相位分析Phase angle 相位角Phase controlled circuit breaker 断电相位控制器Phase detection 相位检测Phase hologram 相位全息Phase sensitive detector 相敏检波器Phase shift 相位移Phase velocity 相速度Phase-sensitive system 相敏系统Phillips ionization gage 菲利浦电离计Phosphor 荧光物质Photo fluorography 荧光照相术Photoelectric absorption 光电吸收Photographic emulsion 照相乳剂Photographic fog 照相灰雾Photostimulable luminescence 光敏发光Piezoelectric effect 压电效应Piezoelectric material 压电材料Piezoelectric stiffness constant 压电劲度常数Piezoelectric stress constant 压电应力常数Piezoelectric transducer 压电换能器Piezoelectric voltage constant 压电电压常数Pirani gage 皮拉尼计Pirani gage 皮拉尼计Pitch and catch technique 一发一收法Pixel 象素Pixel size 象素尺寸Pixel,disply size 象素显示尺寸Planar array 平面阵(列)Plane wave 平面波Plate wave 板波Plate wave technique 板波法Point source 点源Post emulsification 后乳化Post emulsifiable penetrant 后乳化渗透剂Post-cleaning 后清除Post-cleaning 后清洗Powder 粉未Powder blower 喷粉器Powder blower 磁粉喷枪Pre-cleaning 预清理Pressure difference 压力差Pressure dye test 压力着色检测Pressure probe 压力探头Pressure testing 压力检测Pressure- evacuation test 压力抽空检测Pressure mark 压痕Pressure,design 设计压力Pre-test 初探Primary coil 一次线圈Primary radiation 初级辐射Probe gas 探头气体Probe test 探头检测Probe backing 探头背衬Probe coil 点式线圈Probe coil 探头式线圈Probe coil clearance 探头线圈间隙Probe index 探头入射点Probe to weld distance 探头-焊缝距离Probe/ search unit 探头Process control radiograph 工艺过程控制的射线照相Processing capacity 处理能力Processing speed 处理速度Prods 触头Projective radiography 投影射线透照术Proportioning probe 比例探头Protective material 防护材料Proton radiography 质子射线透照Pulse 脉冲波Pulse 脉冲Pulse echo method 脉冲回波法Pulse repetition rate 脉冲重复率Pulse amplitude 脉冲幅度Pulse echo method 脉冲反射法Pulse energy 脉冲能量Pulse envelope 脉冲包络Pulse length 脉冲长度Pulse repetition frequency 脉冲重复频率Pulse tuning 脉冲调谐Pump- out tubulation 抽气管道Pump-down time 抽气时间Q factor Q值Quadruple traverse technique 四次波法Quality (of a beam of radiation) 射线束的质Quality factor 品质因数Quenching 阻塞Quenching of fluorescence 荧光的猝灭Quick break 快速断间Rad(rad) 拉德Radiance,L 面辐射率,LRadiant existence,M 幅射照度MRadiant flux;radiant power,ψe辐射通量、辐射功率、ψe Radiation 辐射Radiation does 辐射剂量Radio frequency (r- f)display 射频显示Radio- frequency mass spectrometer 射频质谱仪Radio frequency(r-f) display 射频显示Radiograph 射线底片Radiographic contrast 射线照片对比度Radiographic equivalence factor 射线照相等效系数Radiographic exposure 射线照相曝光量Radiographic inspection 射线检测Radiographic inspection 射线照相检验Radiographic quality 射线照相质量Radiographic sensitivity 射线照相灵敏度Radiographic contrast 射线底片对比度Radiographic equivalence factor 射线透照等效因子Radiographic inspection 射线透照检查Radiographic quality 射线透照质量Radiographic sensitivity 射线透照灵敏度Radiography 射线照相术Radiological examination 射线检验Radiology 射线学Radiometer 辐射计Radiometry 辐射测量术Radioscopy 射线检查法Range 量程Rayleigh wave 瑞利波Rayleigh scattering 瑞利散射Real image 实时图像Real-time radioscopy 实时射线检查法Rearm delay time 重新准备延时时间Rearm delay time 重新进入工作状态延迟时间Reciprocity failure 倒易律失效Reciprocity law 倒易律Recording medium 记录介质Recovery time 恢复时间Rectified alternating current 脉动直流电Reference block 参考试块Reference beam 参考光束Reference block 对比试块Reference block method 对比试块法Reference coil 参考线圈Reference line method 基准线法Reference standard 参考标准Reflection 反射Reflection coefficient 反射系数Reflection density 反射密度Reflector 反射体Refraction 折射Refractive index 折射率Refrence beam angle 参考光束角Reicnlbation 网纹Reject; suppression 抑制Rejection level 拒收水平Relative permeability 相对磁导率Relevant indication 相关指示Reluctance 磁阻Rem(rem) 雷姆Remote controlled testing 机械化检测Replenisers 补充剂Representative quality indicator 代表性质量指示器Residual magnetic field/field,residual magnetic 剩磁场Residual technique 剩磁技术Residual magnetic method 剩磁法Residual magnetism 剩磁Resistance (to flow)气阻Resolution 分辨力Resonance method 共振法Response factor 响应系数Response time 响应时间Resultant field 复合磁场Resultant magnetic field 合成磁场Resultant magnetization method 组合磁化法Retentivity 顽磁性Reversal 反转现象Ring-down count 振铃计数Ring-down count rate 振铃计数率Rinse 清洗Rise time 上升时间Rise-time discrimination 上升时间鉴别Rod-anode tube 棒阳极管Roentgen(R) 伦琴Roof angle 屋顶角Rotational magnetic field 旋转磁场Rotational magnetic field method 旋转磁场法Rotational scan 转动扫查Roughing 低真空Roughing line 低真空管道Roughing pump 低真空泵S SSafelight 安全灯Sampling probe 取样探头Saturation 饱和Saturation,magnetic 磁饱和Saturation level 饱和电平Scan on grid lines 格子线扫查Scan pitch 扫查间距Scanning 扫查Scanning index 扫查标记Scanning directly on the weld 焊缝上扫查Scanning path 扫查轨迹Scanning sensitivity 扫查灵敏度Scanning speed 扫查速度Scanning zone 扫查区域Scattared energy 散射能量Scatter unsharpness 散射不清晰度Scattered neutrons 散射中子Scattered radiation 散射辐射Scattering 散射Schlieren system 施利伦系统Scintillation counter 闪烁计数器Scintillator and scintillating crystals 闪烁器和闪烁晶体Screen 屏Screen unsharpness 荧光增感屏不清晰度Screen-type film 荧光增感型胶片SE probe SE探头Search-gas 探测气体Second critical angle 第二临界角Secondary radiation 二次射线Secondary coil 二次线圈Secondary radiation 次级辐射Selectivity 选择性Semi-conductor detector 半导体探测器Sensitirity va1ue 灵敏度值Sensitivity 灵敏度Sensitivity of leak test 泄漏检测灵敏度Sensitivity control 灵敏度控制Shear wave 切变波Shear wave probe 横波探头Shear wave technique 横波法Shim 薄垫片Shot 冲击通电Side lobe 副瓣Side wall 侧面Sievert(Sv) 希(沃特)Signal 信号Signal gradient 信号梯度Signal over load point 信号过载点Signal overload level 信号过载电平Signal to noise ratio 信噪比Single crystal probe 单晶片探头Single probe technique 单探头法Single traverse technique 一次波法Sizing technique 定量法Skin depth 集肤深度Skin effect 集肤效应Skip distance 跨距Skip point 跨距点Sky shine(air scatter) 空中散射效应Sniffing probe 嗅吸探头Soft X-rays 软X射线Soft-faced probe 软膜探头Solarization 负感作用Solenoid 螺线管Soluble developer 可溶显像剂Solvent remover 溶剂去除剂Solvent cleaners 溶剂清除剂Solvent developer 溶剂显像剂Solvent remover 溶剂洗净剂Solvent-removal penetrant 溶剂去除型渗透剂Sorption 吸着Sound diffraction 声绕射Sound insulating layer 隔声层Sound intensity 声强Sound intensity level 声强级Sound pressure 声压Sound scattering 声散射Sound transparent layer 透声层Sound velocity 声速Source 源Source data label 放射源数据标签Source location 源定位Source size 源尺寸Source-film distance 射线源-胶片距离Spacial frequency 空间频率Spark coil leak detector 电火花线圈检漏仪Specific activity 放射性比度Specified sensitivity 规定灵敏度Standard 标准Standard 标准试样Standard leak rate 标准泄漏率Standard leak 标准泄漏孔Standard tast block 标准试块Standardization instrument 设备标准化Standing wave; stationary wave 驻波Step wedge 阶梯楔块Step- wadge calibration film 阶梯楔块校准底片Step- wadge comparison film 阶梯楔块比较底片Step wedge 阶梯楔块Step-wedge calibration film 阶梯-楔块校准片Step-wedge comparison film 阶梯-楔块比较片Stereo-radiography 立体射线透照术Subject contrast 被检体对比度Subsurface discontinuity 近表面不连续性Suppression 抑制Surface echo 表面回波Surface field 表面磁场Surface noise 表面噪声Surface wave 表面波Surface wave probe 表面波探头Surface wave technique 表面波法Surge magnetization 脉动磁化Surplus sensitivity 灵敏度余量Suspension 磁悬液Sweep 扫描Sweep range 扫描范围Sweep speed 扫描速度Swept gain 扫描增益Swivel scan 环绕扫查System exanlillatien threshold 系统检验阈值System inclacel artifacts 系统感生物System noise 系统噪声Tackground,target 目标本底Tandem scan 串列扫查Target 耙Target 靶Television fluoroscopy 电视X射线荧光检查Temperature envelope 温度范围Tenth-value-layer(TVL) 十分之一值层Test coil 检测线圈Test quality level 检测质量水平Test ring 试环Test block 试块Test frequency 试验频率Test piece 试片Test range 探测范围Test surface 探测面Testing,ulrasonic 超声检测Thermal neutrons 热中子Thermocouple gage 热电偶计Thermogram 热谱图Thermography,infrared 红外热成象Thermoluminescent dosemeter(TLD) 热释光剂量计Thickness sensitivity 厚度灵敏度Third critiical angle 第三临界角Thixotropic penetrant 摇溶渗透剂Thormal resolution 热分辨率Threading bar 穿棒Three way sort 三档分选Threshold setting 门限设置Threshold fog 阈值灰雾Threshold level 阀值Threshotd tcnet 门限电平Throttling 节流Through transmission technique 穿透技术Through penetration technique 贯穿渗透法Through transmission technique; transmission technique 穿透法Through-coil technique 穿过式线圈技术Throughput 通气量Tight 密封Total reflection 全反射Totel image unsharpness 总的图像不清晰度Tracer probe leak location 示踪探头泄漏定位Tracer gas 示踪气体Transducer 换能器/传感器Transition flow 过渡流Translucent base media 半透明载体介质Transmission 透射Transmission densitomefer 发射密度计Transmission coefficient 透射系数Transmission point 透射点Transmission technique 透射技术Transmittance,τ透射率τTransmitted film density 检测底片黑度Transmitted pulse 发射脉冲Transverse resolution 横向分辨率Transverse wave 横波Traveling echo 游动回波Travering scan; depth scan 前后扫查Triangular array 正三角形阵列Trigger/alarm condition 触发/报警状态Trigger/alarm level 触发/报警标准Triple traverse technique 三次波法True continuous technique 准确连续法技术Trueattenuation 真实衰减Tube current 管电流Tube head 管头Tube shield 管罩Tube shutter 管子光闸Tube window 管窗Tube-shift radiography 管子移位射线透照术Two-way sort 两档分选Ultra- high vacuum 超高真空Ultrasonic leak detector 超声波检漏仪Ultrasonic noise level 超声噪声电平Ultrasonic cleaning 超声波清洗Ultrasonic field 超声场Ultrasonic flaw detection 超声探伤Ultrasonic flaw detector 超声探伤仪Ultrasonic microscope 超声显微镜Ultrasonic spectroscopy 超声频谱Ultrasonic testing system 超声检测系统Ultrasonic thickness gauge 超声测厚仪Ultraviolet radiation 紫外辐射Under development 显影不足Unsharpness 不清晰Useful density range 有效光学密度范围UV-A A类紫外辐射UV-A filter A类紫外辐射滤片Vacuum 真空Vacuum cassette 真空暗盒Vacuum testing 真空检测Vacuum cassette 真空暗合Van de Graaff generator 范德格喇夫起电机Vapor pressure 蒸汽压Vapour degreasing 蒸汽除油Variable angle probe 可变角探头Vee path V型行程Vehicle 载体Vertical linearity 垂直线性Vertical location 垂直定位Visible light 可见光Vitua limage 虚假图像Voltage threshold 电压阈值Voltage threshold 阈值电压Wash station 水洗工位Water break test 水膜破坏试验Water column coupling method 水柱耦合法Water column probe 水柱耦合探头Water path; water distance 水程Water tolerance 水容限Water-washable penetrant 可水洗型渗透剂Wave 波Wave guide acoustic emission 声发射波导杆Wave train 波列Wave from 波形Wave front 波前Wave length 波长Wave node 波节Wave train 波列Wedge 斜楔Wet slurry technique 湿软磁膏技术Wet technique 湿法技术Wet method 湿粉法Wetting action 润湿作用Wetting action 润湿作用Wetting agents 润湿剂Wheel type probe; wheel search unit 轮式探头White light 白光White X-rays 连续X射线Wobble 摆动Wobble effect 抖动效应Working sensitivity 探伤灵敏度Wrap around 残响波干扰Xeroradiography 静电射线透照术X-radiation X射线X-ray controller X射线控制器X-ray detection apparatus X射线探伤装置X-ray film 射线胶片X-ray paper X射线感光纸X-ray tube X射线管X-ray tube diaphragm X射线管光阑Yoke 磁轭Yoke magnetization method 磁轭磁化法Zigzag scan 锯齿扫查。
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Shielding of Gamma RadiationGeorge E. Chabot, Jr., PhD, CHPIntroductionIn the discussion that follows, we assume that gamma rays are the radiation of interest. The principles discussed also apply to monoenergetic x rays; in many cases of concern in x-ray shielding, however, the photons are produced in the bremsstrahlung process that yields a wide and continuous distribution of photon energies. Specialized shielding approaches have been developed to carry out shielding estimations for such x rays (e.g., NCRP 2003, NCRP 2004), and these will not be explicitly discussed.Our emphasis here will be on the development of an analytical expression based on what is often referred to as the point kernel method. We will obtain an expression for the shielded dose rate from a point isotropic source and show how that can be used to obtain deterministic solutions for other source geometries. For fixed input parameter values, deterministic methods always produce the same answer. Deterministic solutions are, by their nature, single-valued, fixed solutions, not subject to random kinds of fluctuations associated with other approaches (which are usually being called stochastic or probabilistic methods).In the category of probabilistic methods are the well-known and very popular Monte Carlo techniques embodied in computer codes such as MCNP (Monte Carlo N-Particle transport code) and EGS4 (Electron Gamma Shower code); both codes are available from the Radiation Safety Information Computational Center at Oak Ridge. In Monte Carlo simulations of shielding problems, the code tracks the fates of individual photons as they move through the shield; decisions as to how far a photon travels before interacting, what type of interaction occurs, what direction is taken by scattered photons, etc., are all made on a probabilistic basis in which random numbers are selected and associated with specific probabilities that are used to specify the decision outcome.Thus, if the fates of two identical photons are followed, we would expect them to be different much of the time, and it is only by investigating enough photons that we might expect the overall results to be representative of reality—e.g., that the determined dose at a receptor location will be correct. Two individuals running the same Monte Carlo code to solve the same problem will not necessarily arrive at exactly the same answers. Deterministic methods have the advantage that the computations are very fast and relatively easy to carry out. Some disadvantages are that they are not very useful for complex source and/or shield geometries, dispersed energy sources, inhomogeneous sources and/or shields, laminated shields, and streaming-type calculations in which one might be concerned about the leakage of radiation through a shield penetration such as a conduit. Monte Carlo codes are amenable to these more complex shielding problems and have become more and more popular as high-speed computing has become available to so many people. In general, however, they do require considerably more expertise and training to use and are often much slower in reaching a solution than are the deterministic methods.Photon interactions and secondary radiationsWhen gamma radiation is incident on a finite thickness of material, there exists some probability that the radiation will interact in the material and be attenuated. In some instances a photon may interact by the photoelectric effect, in which case the photon disappears after transferring all of its energy to a bound electron, which gets ejected from the atom. When the vacancy left in the shell by the removed electron gets filled by an electron dropping into it from a higher energy level, the difference in energy between the two transition states may appear as a fluorescent photon. These photons are characteristically low in energy, but some may be capable of reaching the dose point inside or outside the shielding material. The photoelectric process is favored for low-energy photons interacting in a high atomic number (Z) material.At moderate and higher energies another process, called Compton scattering, prevails; in this process only a portion of the photon energy is transferred to an electron, and a scattered photon moves away from the interaction site, often in a direction different from that of the original photon. This scattered photon may find its way to a dose point of interest inside or outside the attenuating material.At energies exceeding 1.022 MeV, especially in higher-Z materials, the pair production interaction process may occur. In this event the photon interacts in the Coulomb field of the nucleus, with all of its energy being transformed into mass in the form of a conventional electron and a positively charged electron (positron). Any original photon energy beyond the 1.022 MeV required to generate the mass associated with the electron-positron pair will appear as kinetic energy of the pair. After the positron has dissipated its kinetic energy it will disappear in an annihilation event with a conventional electron, in the process producing two 0.511 MeV annihilation photons that move apart in opposite directions. Occasionally, the positron may annihilate during its flight, and in this case whatever kinetic energy it has will be transferred to the annihilation photons, one or both of which may now have energy greater than 0.511 MeV. In this instance the annihilation photons do not expectedly move in opposite directions. In any case, annihilation photons may also find their way to the dose point. Pair production events may also occur in the Coulomb field of an electron, but the incident photon energy must exceed 2.044 MeV for this to occur. Thus, any of the common gamma interaction processes may result in secondary photons that have a finite probability of reaching the dose point. The extent to which such secondary photons add to the fluence or dose at the dose point is usually described through the use of an appropriate buildup factor.Buildup factors may refer to various quantities of interest, such as photon fluence, photon energy fluence, exposure, or dose, and the values among all are somewhat different. For most of our discussion here we shall assume that the dose or exposure buildup factor is of interest. Much of the available buildup data relates to determination of exposure or kerma in a small air volume envisioned to be located within the shielding medium of interest. These data are also suitable for evaluation of dose to water or other low-Z material of interest.The dose buildup factor is a dimensionless quantity that represents the ratio of total dose (including the dose from secondary photons) at the dose point to primary photon dose at the same point. The primary photon dose naturally comes from original photons that have penetrated the shielding material without interacting. Magnitudes of buildup factors vary widely, ranging from a minimum of 1.0 to very large values, depending on source and shield characteristics.Good geometry shielding situationWhen a narrow parallel beam of photons passes through a relatively thin shield, and if the dose point is many beam diameters away from the exit surface of the shield, we have a situation referred to in photon shielding as good geometry. This means, simply, that virtually all of the photons arriving at the dose point will be primary photons, and the dose, D, or dose rate, at a point of interest outside the shield, is related to the unshielded dose, D0, or dose rate, at the point byx=Dμ−eD(1),where : is the linear attenuation coefficient for the photons of the energy of interest in the shield material, and x is the shield linear thickness. Values of : are available in a variety of sources, one convenient one being the National Institute of Standards and Technology (NIST). The values at the NIST Web site are actually mass attenuation coefficients, and the values must be multiplied by the shield material mass density to obtain the respective linear attenuation coefficients.Point isotropic sourceProbably the most popular source geometry involved in many calculations is the point isotropic source. While no real source is a true point, many sources are sufficiently small in dimensions that they can be treated mathematically as point sources. In practice, if the distance from source to dose point exceeds about three times the maximum source dimension, and self-attenuation within the source volume is not a concern, the errors resulting from treating the source as a point will not exceed a few percent. The assumption that the source is isotropic means that radiation of concern is emitted uniformly in all directions throughout a 4B geometry. We shall define such a source of monoenergetic gamma radiation that emits S gamma rays per second and that is situated at a distance r (cm) from the dose point. Further, we shall assume a shield of thickness T (cm) through which the gamma radiation passes before reaching the dose point (see sketch below): Point isotropic source shielding configurationrUnshielded dose rateThe unshielded dose rate at the dose point is given by24/r kSE D en πρμ=• (2),where E is the photon energy, MeV,:en /D is the mass energy absorption coefficient for the material at the dosepoint, cm 2 g -1 (values also available at NIST ), andk is a collective constant to convert energy fluence rate to dose rate; if thedose rate is in gray/hour, k will have a value of 5.76 x 10-7.Shielded primary photon dose rateThe primary photon dose rate is attenuated exponentially, and the dose rate from primary photons, taking account of the shield, is given by24re kSE D T en πρμμ−•= (3),where : is the linear attenuation coefficient for the photons in the shield material. Thisexpression does not account for the buildup of secondary radiation and will generallyunderestimate the true dose rate, especially for thick shields and when the dose point isclose to the shield surface.Shielded dose rate accounting for buildupThe added effect of the buildup is taken into account by incorporating a point isotropic source dose buildup factor, B, into equation 3:24r Be kSE D T en πρμμ−•= (4).The magnitude of the buildup factor depends on the photon energy, the shield material and thickness, the source and shield geometry, and the distance from the shield surface to the dose point. In most cases, dose buildup factors for point isotropic sources have beendetermined under the assumption that both the source and the dose point reside within an infinite volume of the shield material. As a consequence, shielded doses evaluated usingsuch buildup factors tend to be conservative for most practical situations in which the dose point is outside the shield and not subject to backscattering from shield material behind the dose point.Tabulated values of buildup factors for point isotropic dose may be found in a number ofsources (e.g., Bureau of Radiological Health 1970, Shultis & Faw 1996). Such values arearranged according to shield material, photon energy, and shield thickness, usuallyexpressed as the product :T, which represents the number of photon mean free pathsrepresented by the shield thickness. Such tabulated values are useful, especially if oneknows the shield thickness and wants to determine the dose rate. When one wishes todetermine the shield thickness to yield a specific dose rate, equation 4 cannot be solvedexplicitly for T because the value of B depends on T. Solutions can be obtained by making educated guesses for the value of T, looking up the corresponding values of B, and solving for the dose rates; results can be plotted, and the correct value of T determined for thedesired value of dose rate. Alternatively, we can use an analytical form of the buildupfactor that can be incorporated into equation 4 and, through an iterative process using acomputer or calculator, solve for the desired thickness. There are a number of algebraicexpressions that have been used to represent B.Among the most popular is an expression referred to as Taylor’s form of the buildup factor, given byT T e A e A B μαμα21)1(11−−−+= (5),where A 1, "1, and "2 are constants for a given energy and shield material. Tabulations ofthese parameters can be found in various engineering and shielding sources (e.g., Shultisand Faw 1996, 2000). It should be noted that there are a variety of individual values ofA 1,"1, and "2 that will yield the correct value ofB for a given energy, shield material, andshield material thickness, so different literature sources may have quite different respective parameter values. A few other analytical forms that have been used for the buildup factorare given below:Berger’s form: , where a and b are constants for a given energy and shieldmaterial,T b Te a B μμ+=1Linear form: T k B μ+=1, where k is often taken as a constant (e.g., 0.3 to 1), butactually varies significantly with shield thickness and photonenergy (not often a very accurate form), andPolynomial form: , where ", &, and ( are constants32)()(1T T T B μγμβαμ+++= for a given energy and shield material.Taylor’s form has the advantage that it has only exponential terms in :T, and when it isused in an equation that expresses the shielded dose rate, the form of the ultimate solution is fundamentally the same as the solution for the primary photons alone, except that it willhave twice as many terms because of the two exponential terms in the buildup factor.When the expression for B from equation 5 is inserted into equation 4 we obtain2114])1([21r e e A e A kSE D T T T en πρμμμαμα−−−•−+= (6), or2)1(1)1(14))1((21r e A e A kSE D T T en πρμμαμα+−+−•−+= (7).Multiple photon energiesIn the above expressions we have assumed a single gamma-ray energy. When a gamma-emitting radionuclide emits more than one gamma energy, the same expressions as above may be used individually for each gamma energy; the appropriate values for S, E, :en /D , :, A 1, "1, and "2 must be used for each distinct photon energy. The total dose rate is the sum of results for the individual photons. In some instances, when photon energies are close to each other, the photons may be grouped together by using the average energy and thecombined yields. A classic example of this is for 60Co, which emits 1 gamma perdisintegration at 1.17 MeV and 1 gamma per disintegration at 1.33 MeV. Many shieldingcalculations for this nuclide have been done using an energy of 1.25 MeV and a combined yield of 2 gammas per disintegration. When energies are more disparate it is often notsuitable to attempt to combine them. When quite low-energy photons are emitted alongwith moderate yield high-energy photons, one may often neglect the low-energy photons in doing shielding calculations because they will not contribute appreciably to the shieldeddose rate. Such decisions must be made with some care, however, and generally improve with experience.Example of shielded point isotropic source calculationProblem: Determine the soft tissue dose rate, in gray per hour (Gy h -1), at the outer surface of a 2-inch thick lead shield from a 3.0 Ci source of 137Cs. Assume that the source may be treated as a point isotropic source and that its effective distance from the dose point is6.35 cm. We shall also assume that soft tissue can reasonably be simulated by water and use the mass energy absorption coefficient for water.Solution: Following are the values of parameters that are necessary for the solution:k = 5.76 x 10-7,S = (3.0 Ci)(3.7 x 1010 d s -1 Ci -1)(0.85 ( d -1) = 9.44 x 1010 ( s -1,E = 0.662 MeV, (Note: The 0.662 MeV photons of concern have a yield of 0.85 perdisintegration and actually come from the daughter product 137m Ba, which has a short half-life and quickly achieves equilibrium with the 137Cs.):= 1.289 cm -1,T = 5.08 cm,:en /D = 0.0326 cm 2 g -1,A 1 = 2.632,"1 = -0.0145,"2 = 0.136, andr = 6.35 cm.Inserting values into equation 7 yields2)08.5)(289.1)(136.01()08.5)(289.1)(0145.01(107)35.6(4)632.1632.2)(0326.0)(662.0)(1044.9)(1076.5(π+−−−−•−=e e x x D , and 7.38 x 10-3 Gy h -1 or 0.738 rad h -1.=•DWe can readily calculate the part of this dose rate that is due to the primary gamma rays,alone, by solving equation 3. If we do this we will obtain a dose rate of 3.32 x 10-3 Gy h -1,about 45% of the total dose rate. Thus, for this example, the secondary photons, whichwould be almost all Compton scattered photons, account for more than half of the doserate. The magnitude of the buildup factor, given by the ratio of the total dose rate to theprimary photon dose rate, is 2.22. In general, as shield thickness increases, the fraction of the dose attributable to secondary photons increases. The shield in this example had athickness of 6.55 mean free paths (:T = (1.289)(5.08)). Had we had a shield that was 20mean free paths thick we would have found that the buildup factor was about 3.4, implying that more than 70% of the dose rate would have been from secondary photons.It is interesting to observe that if the above problem had dealt with a 137Cs source that was shielded by water rather than by lead, but with the same number of mean free paths ofmaterial (i.e., 6.55), the buildup factor would have been larger than that calculated aboveby about a factor of 10; thus, the portion of the dose rate that would have been associated with the secondary photons would have been about 95%. This is because in water thephotons must undergo many more scattering processes than they do in lead before theyare ultimately captured and disappear in a photoelectric interaction. The reason for this isbecause the probability of a photoelectric event has a strong dependence on atomicnumber of the material, increasing as about the 4th to 5th power of atomic number, and lead has a much higher atomic number than water (82 for lead compared to about 7 for water).In water the photon energy must be reduced to somewhat less than 30 keV before thephotoelectric and Compton interactions occur with equal probability, while in lead theanalogous energy is slightly less than 600 keV.We should recognize that to solve the above problem we could have simply looked up thevalue of the point isotropic source buildup factor in one of the cited compilations. Rather,we did the problem using the analytical form of the buildup factor to illustrate its use forother applications. If, for example, we had been asked to determine what shield thicknessof lead would have been appropriate to yield a specified dose rate at the shield surface, we could have plugged the required dose rate into equation 6 or 7 and used either computersoftware or an appropriate pocket calculator equipped with a hard-wired “solve” routine todetermine the necessary lead thickness. Additionally, the use of an algebraic expressionfor buildup allows extension of the point kernel method employed above to other source geometries.Extended geometriesOnce we have an expression for the point isotropic source, we can write reasonable expressions that will apply to other nonpoint source geometries by recognizing that any extended source geometry can be represented by an infinite number of points distributed throughout the source dimensions. The unfortunate aspect of this approach is that even for the next simplest geometry—i.e., a uniform line source—we cannot obtain a neat closed form algebraic solution to shielding problems. We can, however, write the differential equations that describe the dose rate from one generalized differential element in the source and then, by numerical integration, add up the contributions from all such elements to obtain final dose rates. We will demonstrate this through a line source application. Let us assume that we have a gamma-emitting source distributed uniformly along the length of a line. In reality many sources that have one straight line dimension much greater than any other dimensions may be treated as a line source. We shall assume a source of length, L, with the dose point opposite the end of the line source and along a line perpendicular to the source. The gamma-ray emission rate per unit length of source will be given by S l, which has units of gammas per cm per second. The shield of uniform thickness, T, will be between the source and the dose point as shown below:Line source shielding configurationLDose PointLine sourceShieldLet us select a small (differential) length element, dl, of the line source, located at a distance, l, from the lower end of the source at the point in the above diagram where the oblique line, D, from the dose point meets the source line. The angle between R and D we shall call 2. From the geometry shown we can specify the following:D = R sec 2;l = R tan 2 and, by differentiation, dl = R sec22 d2z = radiation path length through shield = T sec 2, andS l dl = gamma emission rate from differential source element, dl.The shielded differential dose rate at the dose point from primary photons emitted from the differential source element may then be written:Rd e E kS R e E d R kS e dlE kS D d T en l T en l T en l πθρμθπρμθθπρρμθμθμθμ4sec 4sec 4sec 22sec 22sec −−−•=== (8).To obtain the total primary photon dose rate from all differential source elements along the line source we have simply to integrate the above expression over the range of thevariable, 2, i.e., from zero to the angle whose tangent is L/R:∫−−•=RL T enl d e R E kS D 1tan 0sec 4θπρμθμ (9).The integral is of a form usually identified as the Sievert integral or the secant integral. An exact solution is not available for this integral, but it is easily solved using availablecomputer software or a programmable calculator that has integration capability. There are also tables available that yield acceptable approximate solutions of the integral for givenvalues of 2 and :T. One advantage to performing the above calculation for the dose rate at a point opposite the end of the line source is that if the dose point in another case isopposite some other part of the line source, the result for such case can be readilyobtained by adding together the dose rates from two line sources where the dose point is opposite the end of each line source. Thus, for a situation where the dose point was on a line perpendicular to the line source, and the source length above the dose point was L 1and the source length below the dose point was L 2, the primary photon dose rate would be∫∫−−−−•+=R L T R L T en l d e d e R E kS D 2111tan 0sec tan 0sec ][4θθπρμθμθμ (10).In order to account for the added dose from buildup from a single line source, again withthe dose point opposite the end of the line, we would insert Taylor’s expression for B into equation 8 and then proceed as earlier to obtain))1((41121tan 0tan 0sec )1(1sec )1(1∫∫−−+−+−•−+=R L R L T T en l d e A d e A R E kS D θθπρμθμαθμα (11).It is clear that the form of the solution with buildup is fundamentally the same as that forthe primary photons except that there are two similar terms that arise from the two terms in the buildup factor, and where the parameter : appeared in the equation for primaryphotons the parameters (1+"1): and (1+"2): appear in each of the respective terms in thesolution when buildup is considered. For the case when the dose point is opposite someother point on the line source we would obtain∫∫∑−−+−+−=•−+=R L RL T T i enl i i d e A d e A R E kS D 1121tan 0tan 0sec )1(1sec )1(121))1((4θθπρμθμαθμα (12).The summation from i = 1 to i = 2 accounts for the two line segments, L 1 and L 2. Again, the solution is of the expected form, now with four terms, two for the dose rate contributionfrom each line segment.Example of shielded line source calculationWe will perform a calculation again for 3 Ci of 137Cs with the same two inches of leadshielding, but in this case we will assume the activity is distributed uniformly along a line 1meter in length and that the dose point is at a perpendicular distance of R = 6.35 cm fromthe source and opposite the center of the source. All the attenuation and buildupparameter values are the same as those used in the point source calculation. Since thedose point is opposite the source center we will use equation 11, with L = 50 cm, andmultiply the result by two (or use equation 12 with L 1 = L 2). The value of S l is obtained bydividing the total gamma emission rate by the length of the source, which yields 9.44 x1010 ( s -1/100 cm = 9.44 x 108 ( s -1 cm -1. Note that the upper limit of the angle 2 is thearctangent of L/R = tan -1(50/6.35) = 1.44 radians.∫∫+−−−−•−=44.10sec )08.5)(289.1)(136.01(44.10sec )08.5)(289.1)(0145.01(87]632.1632.2[)35.6(4)0326.0)(662.0)(1044.9)(1076.5)(2(θθπθθd e d e x x DThe first integral yields a numerical integration value of 1.884 x 10-3, the second integralvalue is 4.099 x 10-4, and the terms in front of the integrals combine to a value of 0.294,the final dose rate then being 4.33 x 10-4 Gy h -1. This dose rate is almost 20 times lessthan that from the equivalent activity point source analyzed above; this is expectedbecause, although the perpendicular distance from the dose point to the line source is thesame distance used for the point source calculation, most of the source activity of the linesource is considerably farther away from the dose point than in the case of the pointsource. In addition the shield is more effective for the line source because much of thegamma radiation travels oblique paths through the shield, thus increasing the distancetraveled through the shield material. We might also note that if we solved for the primaryphoton dose rate alone, we would have obtained 1.90 x 10-4 Gy h -1. If we divide thisnumber into the total dose rate obtained above we get 2.28, which conceptually represents the average value of the dose buildup factor for this shielding situation. This value isslightly larger than the value of 2.22 obtained for the point source because of the effect ofphotons traversing longer path lengths through the shield in the case of the line source.It is a fairly easy matter to extend the analyses to other regular geometries, including area sources and volume sources, but these cases are somewhat beyond the scope of intentions here. In such cases we proceed in a fashion similar to what we did for the line source except that we must take proper account of the different geometries. For area sources the differential source element will be an area element, and the source strength will be defined in terms of gamma emission rate per unit area; for volume sources we must specify a differential source volume element and a gamma emission rate per unit volume. In the case of a volume source we may also have to account for attenuation within the source volume, the volume itself becoming a shield for the radiation.ReferencesBureau of Radiological Health. Radiological health handbook. Rockville, Maryland: US Department of Health Education and Welfare, Public Health Service, Food and Drug Administration; 1970.National Council on Radiation Protection and Measurements. Radiation protection for particle accelerator facilities. Bethesda, MD: NCRP; Report No. 144; 2003.National Council on Radiation Protection and Measurements. Structural shielding design for medical x-ray imaging facilities. Bethesda, MD: NCRP; Report No. 147; 2004.Shultis JK, Faw RE. Radiation shielding. Upper Saddle River, New Jersey: Prentice Hall; 1996: republished in 2000 under same title by the American Nuclear Society.。