Measuring the linear polarization of $gamma$s in 20-170 GeV range
圆极化与线计划的设置
圆极化与线计划的设置英文回答:Circular polarization and linear polarization are two different settings used in various applications,particularly in the field of optics and telecommunications. Let's discuss each of them separately.Circular polarization refers to the polarization stateof an electromagnetic wave in which the electric fieldvector rotates in a circular pattern as the wave propagates. This rotation can be either clockwise or counterclockwise. Circular polarization is achieved by combining two orthogonal linearly polarized waves with a phase difference of 90 degrees. The resulting circularly polarized wave has equal amplitude in both orthogonal directions and aconstant magnitude of electric field vector.Circular polarization has several advantages overlinear polarization. One of the main advantages is itsimmunity to certain types of interference, such as reflections. This makes circularly polarized waves idealfor applications where signal degradation due toreflections is a concern, such as satellite communications. Circular polarization also allows for better penetration through obstacles, making it suitable for applications in wireless communication systems.Linear polarization, on the other hand, refers to the polarization state of an electromagnetic wave in which the electric field vector oscillates in a single plane. This can be either horizontal or vertical, or any other angle in between. Linear polarization is achieved by transmitting a wave with a specific orientation of the electric field vector.Linear polarization is commonly used in many applications, including television broadcasting, radar systems, and optical communication. It allows for efficient transmission and reception of signals, as the receiver antenna can be aligned with the same polarization as the transmitted signal. However, linearly polarized waves aremore susceptible to interference from reflections andcross-polarization effects, which can lead to signal degradation.In terms of setting up circular polarization and linear polarization, different techniques and devices can be used. For circular polarization, a combination of two orthogonal linearly polarized waves with a phase difference of 90 degrees is required. This can be achieved using devices such as quarter-wave plates or circular polarizers.For linear polarization, the orientation of theelectric field vector needs to be controlled. This can be done using devices such as polarizers or waveplates. Polarizers are commonly used to convert unpolarized light into linearly polarized light by selectively transmitting waves with a specific polarization orientation. Waveplates, on the other hand, can be used to rotate the polarization state of a wave by a desired angle.中文回答:圆极化和线极化是在光学和通信领域中使用的两种不同设置。
相对强度噪声(rin)测量程序
Relative intensity noise (RIN) measuring procedure相对强度噪声(RIN)测量程序This procedure describes a component test which may not be appropriate for a system level test depending on the implementation.这是一个组件测试流程,根据应用环境来看,它可能不适合于系统级的测试。
A.5.1 Test objective 测试目标When lasers which are subject to reflection induced noise effects are operated in a cable plant with a low optical return loss the lasers will produce an amount of noise which is a function of the magnitude and polarization state of the reflected light.当受到反射引起的噪声影响的激光器在具有低光回损的电缆设备中工作时,激光器将产生一定量的噪声,这个噪声是反射光的大小和偏振态的函数。
The magnitude of the reflected light tends to be relatively constant. However,the polarization state varies significantly as a function of many cable parameters,particularly cable placement. 反射光的大小趋于相对恒定。
然而,偏振态受许多电缆参数的影响而呈现出一定的函数关系,特别是随电缆的放置而显著变化.In a cable plant which is physically fixed in place the variation is slow. If the fibre is subject to motion, such as occurs in a jumper cable, the change may be sudden and extreme. The effect is unpredictable changes in the noise from the laser with the result that the communication link may exhibit sudden and unexplainable bursts of errors.在固定的电缆设备中,变化是缓慢的。
O(alpha) QED Corrections to Polarized Elastic $mu e$ and Deep Inelastic l N Scattering
a r X i v :h e p -p h /9711228v 1 4 N o v 1997hep-ph/9711228October 1997O (α)QED Corrections to Polarized Elastic µe and Deep Inelastic lN ScatteringDima Bardin a,b,c ,Johannes Bl¨u mlein a ,Penka Christova a,d ,and Lida Kalinovskaya a,caDESY–Zeuthen,Platanenallee 6,D–15735Zeuthen,GermanybINFN,Sezione di Torino,Torino,ItalycJINR,ul.Joliot-Curie 6,RU–141980Dubna,RussiadBishop Konstantin Preslavsky University of Shoumen,9700Shoumen,BulgariaAbstractTwo computer codes relevant for the description of deep inelastic scattering offpolarized targets are discussed.The code µe la deals with radiative corrections to elastic µe scattering,one method applied for muon beam polarimetry.The code HECTOR allows to calculate both the radiative corrections for unpolarized and polarized deep inelastic scattering,including higher order QED corrections.1IntroductionThe exact knowledge of QED,QCD,and electroweak (EW)radiative corrections (RC)to the deep inelastic scattering (DIS)processes is necessary for a precise determination of the nucleon structure functions.The present and forthcoming high statistics measurements of polarized structure functions in the SLAC experiments,by HERMES,and later by COMPASS require the knowledge of the RC to the DIS polarized cross-sections at the percent level.Several codes based on different approaches for the calculation of the RC to DIS experiments,mainly for non-polarized DIS,were developped and thoroughly compared in the past,cf.[1].Later on the radiative corrections for a vast amount of experimentally relevant sets of kinematic variables were calculated [2],including also semi-inclusive situations as the RC’s in the case of tagged photons [3].Furthermore the radiative corrections to elastic µ-e scattering,a process to monitor (polarized)muon beams,were calculated [4].The corresponding codes are :•HECTOR 1.00,(1994-1995)[5],by the Dubna-Zeuthen Group.It calculates QED,QCD and EW corrections for variety of measuremets for unpolarized DIS.•µe la 1.00,(March 1996)[4],calculates O (α)QED correction for polarized µe elastic scattering.•HECTOR1.11,(1996)extends HECTOR1.00including the radiative corrections for polarized DIS[6],and for DIS with tagged photons[3].The beta-version of the code is available from http://www.ifh.de/.2The Programµe laMuon beams may be monitored using the processes ofµdecay andµe scattering in case of atomic targets.Both processes were used by the SMC experiment.Similar techniques will be used by the COMPASS experiment.For the cross section measurement the radiative corrections to these processes have to be known at high precision.For this purpose a renewed calculation of the radiative corrections toσ(µe→µe)was performed[4].The differential cross-section of polarized elasticµe scattering in the Born approximation reads,cf.[7],dσBORNm e Eµ (Y−y)2(1−P e Pµ) ,(1)where y=yµ=1−E′µ/Eµ=E′e/Eµ=y e,Y=(1+mµ/2/Eµ)−1=y max,mµ,m e–muon and electron masses,Eµ,E′µ,E′e the energies of the incoming and outgoing muon,and outgoing electron respectively,in the laboratory frame.Pµand P e denote the longitudinal polarizations of muon beam and electron target.At Born level yµand y e agree.However,both quantities are different under inclusion of radiative corrections due to bremsstrahlung.The correction factors may be rather different depending on which variables(yµor y e)are used.In the SMC analysis the yµ-distribution was used to measure the electron spin-flip asymmetry A expµe.Since previous calculations,[8,9],referred to y e,and only ref.[9]took polarizations into account,a new calculation was performed,including the complete O(α)QED correction for the yµ-distribution,longitudinal polarizations for both leptons,theµ-mass effects,and neglecting m e wherever possible.Furthermore the present calculation allows for cuts on the electron re-coil energy(35GeV),the energy balance(40GeV),and angular cuts for both outgoing leptons (1mrad).The default values are given in parentheses.Up to order O(α3),14Feynman graphs contribute to the cross-section forµ-e scattering, which may be subdivided into12=2×6pieces,which are separately gauge invariantdσQEDdyµ.(2) One may express(2)also asdσQEDdyµ+P e Pµdσpol kk=1−Born cross-section,k=b;2−RC for the muonic current:vertex+bremsstrahlung,k=µµ;3−amm contribution from muonic current,k=amm;4−RC for the electronic current:vertex+bremsstrahlung,k=ee;5−µe interference:two-photon exchange+muon-electron bremsstrahlung interference,k=µe;6−vacuum polarization correction,runningα,k=vp.The FORTRAN code for the scattering cross section(2)µe la was used in a recent analysis of the SMC collaboration.The RC,δA yµ,to the asymmetry A QEDµeshown infigures1and2is defined asδA yµ=A QEDµedσunpol.(4)The results may be summarized as follows.The O(α)QED RC to polarized elasticµe scattering were calculated for thefirst time using the variable yµ.A rather general FORTRAN codeµe la for this process was created allowing for the inclusion of kinematic cuts.Since under the conditions of the SMC experiment the corrections turn out to be small our calculation justifies their neglection. 3Program HECTOR3.1Different approaches to RC for DISThe radiative corrections to deep inelastic scattering are treated using two basic approaches. One possibility consists in generating events on the basis of matrix elements including the RC’s. This approach is suited for detector simulations,but requests a very hughe number of events to obtain the corrections at a high precision.Alternatively,semi-analytic codes allow a fast and very precise evaluation,even including a series of basic cuts andflexible adjustment to specific phase space requirements,which may be caused by the way kinematic variables are experimentally measured,cf.[2,5].Recently,a third approach,the so-called deterministic approach,was followed,cf.[10].It treats the RC’s completely exclusively combining features of fast computing with the possibility to apply any cuts.Some elements of this approach were used inµe la and in the branch of HECTOR1.11,in which DIS with tagged photons is calculated.Concerning the theoretical treatment three approaches are in use to calculate the radiative corrections:1)the model-independent approach(MI);2)the leading-log approximation(LLA); and3)an approach based on the quark-parton model(QPM)in evaluating the radiative correc-tions to the scattering cross-section.In the model-independent approach the QED corrections are only evaluated for the leptonic tensor.Strictly it applies only for neutral current processes.The hadronic tensor can be dealt with in its most general form on the Lorentz-level.Both lepton-hadron corrections as well as pure hadronic corrections are neglected.This is justified in a series of cases in which these corrections turn out to be very small.The leading logarithmic approximation is one of the semi-analytic treatments in which the different collinear singularities of O((αln(Q2/m2l))n)are evaluated and other corrections are neglected.The QPM-approach deals with the full set of diagrams on the quark level.Within this method,any corrections(lepton-hadron interference, EW)can be included.However,it has limited precision too,now due to use of QPM-model itself. Details on the realization of these approaches within the code HECTOR are given in ref.[5,11].3.2O (α)QED Corrections for Polarized Deep Inelastic ScatteringTo introduce basic notation,we show the Born diagramr rr r j r r r r l ∓( k 1,m )l ∓( k 2,m )X ( p ′,M h )p ( p ,M )γ,Z ¨¨¨¨B ¨¨¨¨£¢ ¡£¢ ¡£¢ ¡£¢ ¡£¢ ¡£¢ ¡£¢ ¡£¢ ¡£¢ ¡£¢ ¡z r r r r r r r r r r r r r rr ¨¨¨¨B ¨¨¨¨r r r r j r r r r and the Born cross-section,which is presented as the product of the leptonic and hadronic tensordσBorn =2πα2p.k 1,x =Q 2q 2F 1(x,Q 2)+p µ p ν2p.qF 3(x,Q 2)+ie µνλσq λs σ(p.q )2G 2(x,Q 2)+p µ s ν+ s µ p νp.q1(p.q )2G 4(x,Q 2)+−g µν+q µq νp.qG 5(x,Q 2),(8)wherep µ=p µ−p.qq 2q µ,and s is the four vector of nucleon polarization,which is given by s =λp M (0, n )in the nucleonrest frame.The combined structure functions in eq.(8)F1,2(x,Q2)=Q2e Fγγ1,2(x,Q2)+2|Q e|(v l−p eλl a l)χ(Q2)FγZ1,2(x,Q2)+ v2l+a2l−2p eλl v l a l χ2(Q2)F ZZ1,2(x,Q2),F3(x,Q2)=2|Q e|(p e a l−λl v l)χ(Q2)FγZ3(x,Q2),+ 2p e v l a l−λl v2l+a2l χ2(Q2)F ZZ3(x,Q2),G1,2(x,Q2)=−Q2eλl gγγ1,2(x,Q2)+2|Q e|(p e a l−λl v l)χ(Q2)gγZ1,2(x,Q2),+ 2p e v l a l−λl v2l+a2l χ2(Q2)g ZZ1,2(x,Q2),G3,4,5(x,Q2)=2|Q e|(v l−p eλl a l)χ(Q2)gγZ3,4,5(x,Q2),+ v2l+a2l−2p eλl v l a l χ2(Q2)g ZZ3,4,5(x,Q2),(9) are expressed via the hadronic structure functions,the Z-boson-lepton couplings v l,a l,and the ratio of the propagators for the photon and Z-bosonχ(Q2)=Gµ2M2ZQ2+M2Z.(10)Furthermore we use the parameter p e for which p e=1for a scattered lepton and p e=−1for a scattered antilepton.The hadronic structure functions can be expressed in terms of parton densities accounting for the twist-2contributions only,see[12].Here,a series of relations between the different structure functions are used in leading order QCD.The DIS cross-section on the Born-leveld2σBorndxdy +d2σpol Borndxdy =2πα2S ,S U3(y,Q2)=x 1−(1−y)2 ,(13) and the polarized partdσpol BornQ4λp N f p S5i=1S p gi(x,y)G i(x,Q2).(14)Here,S p gi(x,y)are functions,similar to(13),and may be found in[6].Furthermore we used the abbrevationsf L=1, n L=λp N k 12πSy 1−y−M2xy2π1−yThe O(α)DIS cross-section readsd2σQED,1πδVRd2σBorndx l dy l=d2σunpolQED,1dx l dy l.(16)All partial cross-sections have a form similar to the Born cross-section and are expressed in terms of kinematic functions and combinations of structure functions.In the O(α)approximation the measured cross-section,σrad,is define asd2σraddx l dy l +d2σQED,1dx l dy l+d2σpol radd2σBorn−1.(18)The radiative corrections calculated for leptonic variables grow towards high y and smaller values of x.Thefigures compare the results obtained in LLA,accounting for initial(i)andfinal state (f)radiation,as well as the Compton contribution(c2)with the result of the complete calculation of the leptonic corrections.In most of the phase space the LLA correction provides an excellent description,except of extreme kinematic ranges.A comparison of the radiative corrections for polarized deep inelastic scattering between the codes HECTOR and POLRAD[17]was carried out.It had to be performed under simplified conditions due to the restrictions of POLRAD.Corresponding results may be found in[11,13,14].3.3ConclusionsFor the evaluation of the QED radiative corrections to deep inelastic scattering of polarized targets two codes HECTOR and POLRAD exist.The code HECTOR allows a completely general study of the radiative corrections in the model independent approach in O(α)for neutral current reac-tions including Z-boson exchange.Furthermore,the LLA corrections are available in1st and2nd order,including soft-photon resummation and for charged current reactions.POLRAD contains a branch which may be used for some semi-inclusive DIS processes.The initial state radia-tive corrections(to2nd order in LLA+soft photon exponentiation)to these(and many more processes)can be calculated in detail with the code HECTOR,if the corresponding user-supplied routine USRBRN is used together with this package.This applies both for neutral and charged current processes as well as a large variety of different measurements of kinematic variables. Aside the leptonic corrections,which were studied in detail already,further investigations may concern QED corrections to the hadronic tensor as well as the interference terms. References[1]Proceedings of the Workshop on Physics at HERA,1991Hamburg(DESY,Hamburg,1992),W.Buchm¨u ller and G.Ingelman(eds.).[2]J.Bl¨u mlein,Z.Phys.C65(1995)293.[3]D.Bardin,L.Kalinovskaya and T.Riemann,DESY96–213,Z.Phys.C in print.[4]D.Bardin and L.Kalinovskaya,µe la,version1.00,March1996.The source code is availablefrom http://www.ifh.de/~bardin.[5]A.Arbuzov,D.Bardin,J.Bl¨u mlein,L.Kalinovskaya and T.Riemann,Comput.Phys.Commun.94(1996)128,hep-ph/9510410[6]D.Bardin,J.Bl¨u mlein,P.Christova and L.Kalinovskaya,DESY96–189,hep-ph/9612435,Nucl.Phys.B in print.[7]SMC collaboration,D.Adams et al.,Phys.Lett.B396(1997)338;Phys.Rev.D56(1997)5330,and references therein.[8]A.I.Nikischov,Sov.J.Exp.Theor.Phys.Lett.9(1960)757;P.van Nieuwenhuizen,Nucl.Phys.B28(1971)429;D.Bardin and N.Shumeiko,Nucl.Phys.B127(1977)242.[9]T.V.Kukhto,N.M.Shumeiko and S.I.Timoshin,J.Phys.G13(1987)725.[10]G.Passarino,mun.97(1996)261.[11]D.Bardin,J.Bl¨u mlein,P.Christova,L.Kalinovskaya,and T.Riemann,Acta Phys.PolonicaB28(1997)511.[12]J.Bl¨u mlein and N.Kochelev,Phys.Lett.B381(1996)296;Nucl.Phys.B498(1997)285.[13]D.Bardin,J.Bl¨u mlein,P.Christova and L.Kalinovskaya,Preprint DESY96–198,hep-ph/9609399,in:Proceedings of the Workshop‘Future Physics at HERA’,G.Ingelman,A.De Roeck,R.Klanner(eds.),Vol.1,p.13;hep-ph/9609399.[14]D.Bardin,Contribution to the Proceedings of the International Conference on High EnergyPhysics,Warsaw,August1996.[15]M.Gl¨u ck,E.Reya,M.Stratmann and W.Vogelsang,Phys.Rev.D53(1996)4775.[16]S.Wandzura and F.Wilczek,Phys.Lett.B72(1977)195.[17]I.Akushevich,A.Il’ichev,N.Shumeiko,A.Soroko and A.Tolkachev,hep-ph/9706516.-20-18-16-14-12-10-8-6-4-200.10.20.30.40.50.60.70.80.91elaFigure 1:The QED radiative corrections to asymmetry without experimental cuts.-1-0.8-0.6-0.4-0.200.20.40.60.810.10.20.30.40.50.60.70.80.91elaFigure 2:The QED radiative corrections to asymmetry with experimental cuts.-50-40-30-20-100102030405000.10.20.30.40.50.60.70.80.91HectorFigure 3:A comparison of complete and LLA RC’s in the kinematic regime of HERMES for neutral current longitudinally polarized DIS in leptonic variables.The polarized parton densities [15]are used.The structure function g 2is calculated using the Wandzura–Wilczek relation.c 2stands for the Compton contribution,see [6]for details.-20-100102030405000.10.20.30.40.50.60.70.80.91HectorFigure 4:The same as in fig.3,but for energies in the range of the SMC-experiment.-20-10010203040500.10.20.30.40.50.60.70.80.91HectorFigure 5:The same as in fig.4for x =10−3.-200-150-100-5005010015020000.10.20.30.40.50.60.70.80.91HectorFigure 6:A comparison of complete and LLA RC’s at HERA collider kinematic regime for neutral current deep inelastic scattering offa longitudinally polarized target measuring the kinematic variables at the leptonic vertex.。
布朗运动 瞬时速度测量 Measurement of the Instantaneous Velocity of a Brownian Particle
27.F.Banhart,J.Mater.Sci.41,4505(2006).28.V.H.Crespi,N.G.Chopra,M.L.Cohen,A.Zettl,S.G.Louie,Phys.Rev.B 54,5927(1996).29.The extent of displacement may vary depending on the tiltangle,because the local thickness of the specimen along the axis of the excitation may change.However,the skin depth of the MWNT ring specimen for the 532-nm light is deduced to be 2m m [absorption coefficient a =1.0×104cm −1(35)],which exceeds the largest local thickness along the ring specimen at a tilt angle of 35°.In addition,the absorption cross section of MWNTs is reported to be weakly dependent on the polarization of the incident beam for thick tubes (36).To further suppress any polarizationdependence,we set the polarization of the optical excitation beam so that it was not along the long axis of the tube.Consequently,the heat gradient and thermal stress are uniform for the tilt angles recorded in this study.30.P.Poncharal,Z.L.Wang,D.Ugarte,W.A.de Heer,Science 283,1513(1999).31.L.Meirovich,Elements of Vibration Analysis (McGraw-Hill,New York,ed.2,1986).32.X.-L.Wei,Y.Liu,Q.Chen,M.-S.Wang,L.-M.Peng,Adv.Funct.Mater.18,1555(2008).33.M.M.J.Treacy,T.W.Ebbesen,J.M.Gibson,Nature 381,678(1996).34.G.V.Hartland,Annu.Rev.Phys.Chem.57,403(2006).35.T.Nakamiya et al .,Thin Solid Films 517,3854(2009).36.C.Ni,P.R.Bandaru,Carbon 47,2898(2009).37.S.Jonic,C.Vénien-Bryan,Curr.Opin.Pharmacol.9,636(2009).38.Supported by NSF (grant DMR-0964886)and Air ForceOffice of Scientific Research (grant FA9550-07-1-0484)in the Physical Biology Center for Ultrafast Science and Technology supported by Gordon and Betty Moore Foundation at Caltech.A patent application has been filed by Caltech based on the methodology presented herein.Supporting Online Material/cgi/content/full/328/5986/1668/DC1Movies S1to S35April 2010;accepted 19May 201010.1126/science.1190470Measurement of the Instantaneous Velocity of a Brownian ParticleTongcang Li,Simon Kheifets,David Medellin,Mark G.Raizen *Brownian motion of particles affects many branches of science.We report on the Brownian motion of micrometer-sized beads of glass held in air by an optical tweezer,over a wide range of pressures,and we measured the instantaneous velocity of a Brownian particle.Our results provide direct verification of the energy equipartition theorem for a Brownian particle.For short times,the ballistic regime of Brownian motion was observed,in contrast to the usual diffusive regime.We discuss the applications of these methods toward cooling the center-of-mass motion of a bead in vacuum to the quantum ground motional state.In 1907,Albert Einstein published a paper in which he considered the instantaneous ve-locity of a Brownian particle (1,2).By mea-suring this quantity,one could prove that “the kinetic energy of the motion of the centre of grav-ity of a particle is independent of the size and nature of the particle and independent of the nature of its environment.”This is one of the basic tenets of statistical mechanics,known as the equipartition theorem.However,because of the very rapid randomization of the motion,Einstein concluded that the instantaneous veloc-ity of a Brownian particle would be impossible to measure in practice.We report here on the measurement of the instantaneous velocity of a Brownian particle in a system consisting of a single,micrometer-sized SiO 2bead held in a dual-beam optical tweezer in air,over a wide range of pressures.The velocity data were used to verify the Maxwell-Boltzmann velocity distribution and the equipartition theorem for a Brownian particle.The ability to measure instantaneous velocity enables new fundamental tests of statistical mechanics of Brownian par-ticles and is also a necessary step toward the cool-ing of a particle to the quantum ground motional state in vacuum.The earliest quantitative studies of Brownian motion were focused on measuring velocities,and they generated enormous controversy (3,4).The measured velocities of Brownian particles (3)were almost 1000-fold smaller than what was predicted by the energy equipartition theorem.Recent experiments with fast detectors that studied Brownian motion in liquid (5–7)and gaseous (8–10)environments observed nondiffusive mo-tion of a Brownian particle.Einstein ’s theory predicts that 〈[D x (t )]2〉¼2Dt ,where 〈[D x (t )]2〉is the mean square displace-ment (MSD)in one dimension of a free Brown-ian particle during time t ,and D is the diffusion constant (11).The diffusion constant can be cal-culated by D ¼k B T =g ,where k B is Boltz-mann ’s constant,T is the temperature,and g is the Stokes friction coefficient.The mean veloc-ity measured over an interval of time t is v ≡ffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi〈[D x (t )]2〉p /t ¼ffiffiffiffiffiffi2D p /ffit p .This diverges as t ap-proaches 0and therefore does not represent the real velocity of the particle (1,2).The equation 〈[D x (t )]2〉¼2Dt ,however,is valid only when t >>t p ;that is,in the diffusive regime.Here,t p ¼m =g is the momentum relaxa-tion time of a particle with mass m .At very short time scales (t <<t p ),the dynamics of a particle are dominated by its inertia,and the motion is ballistic.The dynamics of a Brownian particle over all time scales can be described by a Langevin equation (12).The MSD of a Brownian particle at very short time scales is predicted to be 〈[D x (t )]2〉¼(k B T /m )t 2,and its instantaneous velocity can be measured as v ¼D x ðt Þ=t ,when t <<t p (13).For a 1-m m-diameter silica (SiO 2)sphere in water,t p is about 0.1m s and the root mean square (rms)velocity is about 2mm/s in one dimension.To measure the instantaneous velocity with 10%uncertainty,one would require 2-pm spatial res-olution in 10ns,far beyond what is experimen-tally achievable today (7).Because of the lower viscosity of gas,compared with liquid,the t p of a particle in air is much larger.This lowers the technical demand for both temporal and spatial resolution.The main difficulty of performing high-precision measurements of a Brownian particle in air,however,is that the particle will fall under the influence of gravity.We overcome this problem by using optical tweezers to simultaneously trap and monitor a silica bead in air and vacuum,al-lowing long-duration,ultra –high-resolution mea-surements of its motion.Center for Nonlinear Dynamics and Department of Physics,University of Texas at Austin,Austin,TX 78712,USA.*To whom correspondence should be addressed.E-mail:raizen@Fig.1.Simplified schematic showing the counterpropa-gating dual-beam optical tweezers,and a novel detec-tion system that has a 75-MHz bandwidth and ultralow noise.The s -polarized beam is re-flected by a polarizing beam-splitter cube after it passes through a trapped bead inside a vacuum chamber.For detec-tion,it is split by a mirror with a sharp edge.The p -polarized beam passes through the cube.Vacuum Chambers -polarized SCIENCE VOL 32825JUNE 20101673REPORTSo n M a y 21, 2017h t t p ://s c i e n c e .s c i e n c e m a g .o r g /D o w n l o a d e d f r o mFor small displacements,the effect of optical tweezers on the bead ’s motion can be approxi-mated by a harmonic potential.The MSD of a Brownian particle in an underdamped harmon-ic trap in air can be obtained by solving the Langevin equation (14)〈[D x (t )]2〉¼2k B T 01−e −t =2t pcos w 1t þsin w 1t 1t p ð1Þwhere w 0is the resonant frequency of the trapand w 1≡ffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiw 20−1/(2t p )2q .The normalized veloc-ity autocorrelation function (V ACF)of the par-ticle is (14)y (t )¼e−t =2t pcos w 1t −sin w 1t2w 1t pð2ÞIn the simplified scheme of our optical trap and vacuum chamber (Fig.1),the trap is formed inside a vacuum chamber by two counterpropa-gating laser beams focused to the same point by two identical aspheric lenses with focal lengths of 3.1mm and numerical apertures of 0.68(15).The two 1064-nm-wavelength laser beams are orthogonally polarized,and their frequencies dif-fer by 160MHz to avoid interference.The scat-tering forces exerted on the bead by the two beams cancel,and the gradient forces near the center of the focus create a three-dimensional harmonic potential for the bead.When the bead deviates from the center of the trap,it deflects both trapping beams.The position of the bead ismonitored by measuring the deflection of one of the beams,which is split by a mirror with a sharp edge.The difference between the two halves is measured by a fast balanced detector (7,16).The lifetime of a bead in our trap in air is much longer than our measurement times over a wide range of pressures and trap strengths.We have tested it by trapping a 4.7-m m bead in air con-tinuously for 46hours,during which the power of both laser beams was repeatedly changed from 5mW to 2.0W.The trap becomes less stable in vacuum.The lowest pressure at which we have trapped a bead without extra stabilization is about 0.1Pa.For studying the Brownian motion of a trapped bead,unless otherwise stated,the powers of the two laser beams were 10.7and 14.1mW (15),the diameter of the bead was 3m m,the temperature of the system was 297K,and the air pressure was 99.8or 2.75kPa.The trapping was stable and the heating due to laser absorption was negligible un-der these conditions.In typical samples of position and velocity traces of a trapped bead (Fig.2),the position traces of the bead at these two pressures appear to be very similar.On the other hand,the velocity traces are clearly different.The instanta-neous velocity of the bead at 99.8kPa changes more frequently than that at 2.75kPa,because the momentum relaxation time is shorter at higher pressure.Figure 3shows the MSDs of a 3-m m silica bead as a function of time.The measured MSDs fit with Eq.1over three decades of time for both pressures.The calibration factor a =position/voltage of the detection system is the only fit-ting parameter of Eq.1for each pressure.t p and w 0are obtained from the measured normalized V ACF.The two values of a obtained for these two pressures differ by 10.8%.This is because the vacuum chamber is distorted slightly when the pressure is decreased from 99.8to 2.75kPa.The measured MSDs are completely different from those predicted by Einstein ’s theory of Brownian motion in a diffusive regime.TheFig.3.(A )The MSDs of a 3-m m silica bead trapped in air at 99.8kPa (red square)and 2.75kPa (black circle).They are calculated from 40mil-lion position measure-ments for each pressure.The “noise ”signal (blue triangle)is recorded when there is no particle in the optical trap.The solid lines are theoretical predictions of Eq.1.The prediction of Einstein ’s theory of free Brownian motion in the diffusive regime is shown in dashed lines for com-parison.(B )MSDs at shorttime scales are shown in detail.The dash-dotted line indicates ballistic Brownian motion of a freeparticle.AFig.2.One-dimensional trajectories of a 3-m m-diameter silica bead trapped in air at 99.8kPa (A )and 2.75kPa (B ).The instantaneous velocities of the bead corresponding to these trajectories are shown in (C )and (D ).25JUNE 2010VOL 328SCIENCE 1674REPORTSo n M a y 21, 2017h t t p ://s c i e n c e .s c i e n c e m a g .o r g /D o w n l o a d e d f r o mslopes of measured MSD curves at short time scales are double those of the MSD curves of diffusive Brownian motion in the log-log plot (Fig.3A).This is because the MSD is propor-tional to t 2for ballistic Brownian motion,whereas it is proportional to t for diffusive Brownian mo-tion.In addition,the MSD curves are indepen-dent of air pressure at short time scales,which is predicted by 〈½D x ðt Þ 2〉¼ðk B T =m Þt 2for bal-listic Brownian motion,whereas the MSD in the diffusive regime does depend on the air pressure.At long time scales,the MSD saturates at a con-stant value because of the optical trap.Figure 3B displays more detail of the Brownian motion at short time scales.It clearly demonstrates that we have observed ballistic Brownian motion.The distributions of the measured instanta-neous velocities (Fig.4A)agree very well with the Maxwell-Boltzmann distribution.The mea-sured rms velocities are v rms =0.422mm/s at 99.8kPa and v rms =0.425mm/s at 2.75kPa.These values are very close to the prediction of the energy equipartition theorem,v rms ¼ffiffiffiffiffiffiffiffiffiffiffiffiffik B T /m p ,which is 0.429mm/s.As expected,the velocity distribution is independent of pressure.The rms value of the noise signal is 0.021mm/s,which means we have 1.0Åspatial resolution in 5m s.This measurement noise is about 4.8%of the rms velocity.Figure 4A represents direct verification of the Maxwell-Boltzmann distribution of veloc-ities and the equipartition theorem of energy for Brownian motion.For a Brownian particle in liquid,the inertial effects of the liquid become im-portant.The measured rms velocity of the particle will be v rms ¼ffiffiffiffiffiffiffiffiffiffiffiffiffiffiffik B T /m *p in the ballistic regime,where the effective mass m *is the sum of the mass of the particle and half of the mass of the displaced fluid (17).This is different from the equipar-tition theorem.To measure the true instantaneous velocity in liquid as predicted by the equiparti-tion theorem,the temporal resolution must be much shorter than the time scale of acoustic damping,which is about 1ns for a 1-m m particle in liquid (17).Figure 4B shows the normalized V ACF of the bead at two different pressures.At 2.75kPa,one can see the oscillations due to the optical trap.Equation 2is independent of the calibration factor a of the detection system.The only in-dependent variable is time t ,which we can mea-sure with high precision.Thus the normalized V ACF provides an accurate method to measure t p and w 0.By fitting the normalized V ACF with Eq.2,we obtained t p =48.5T 0.1m s,w 0=2p ·(3064T 4)Hz at 99.8kPa and t p =147.3T 0.1m s,w 0=2p ·(3168T 0.5)Hz at 2.75kPa.The trapping frequency changed by 3%because of the distortion of the vacuum chamber at dif-ferent pressures.For a particle at a certain pres-sure and temperature,t p should be independent of the trapping frequency.We verified this by changing the total power of the two laser beams from 25to 220mW.The measured t p changed less than 1.3%for both pressures,thus proving that the fitting method is accurate,and the heat-ing due to the laser beams (which would change the viscosity and affect t p )is negligible.We can also calculate the diameter of the silica bead from the t p value at 99.8kPa (18).The obtained diameter is 2.79m m.This is within the uncer-tainty range given by the supplier of the 3.0-m m silica beads.We used this value in the calcu-lation of MSD and normalized V ACF.The ability to measure the instantaneous ve-locity of a Brownian particle will be invaluable in studying nonequilibrium statistical mechanics (19,20)and can be used to cool Brownian mo-tion by applying a feedback force with a direction opposite to the velocity (21,22).In a vacuum,our optically trapped particle should be an ideal system for investigating quantum effects in a mechanical system (16,23–25)because of its near-perfect isolation from the thermal bining feedback cooling and cavity cooling,we expect to cool the Brownian motion of a bead starting from room temperature to the quantum regime,as predicted by recent theoret-ical calculations (24,25).We have directly ver-ified the energy equipartition theorem of Brownian motion.However,we also expect to observe de-viation from this theorem when the bead is cooled to the quantum regime.The kinetic energy of thebead will not approach zero even at 0K because of its zero-point energy.The rotational energy of the bead should also become quantized.References and Notes1.A.Einstein,Zeit.f.Elektrochemie 13,41(1907).2.A.Einstein,Investigations on the Theory of the Brownian Movement ,R.Fürth,Ed.,A.D.Cowper,Transl.(Methuen,London,1926),pp.63–67.3.F.M.Exner,Ann.Phys.2,843(1900).4.M.Kerker,c.51,764(1974).5.B.Luki ćet al .,Phys.Rev.Lett.95,160601(2005).6.Y.Han et al .,Science 314,626(2006).7.I.Chavez,R.Huang,K.Henderson,E.-L.Florin,M.G.Raizen,Rev.Sci.Instrum.79,105104(2008).8.P.D.Fedele,Y.W.Kim,Phys.Rev.Lett.44,691(1980).9.J.Blum et al .,Phys.Rev.Lett.97,230601(2006).10.D.R.Burnham,P.J.Reece,D.McGloin,Brownian dynamicsof optically trapped liquid aerosols.In press;preprint available at /abs/0907.4582.11.A.Einstein,Ann.Phys.17,549(1905).ngevin,C.R.Acad.Sci.(Paris)146,530(1908).13.G.E.Uhlenbeck,L.S.Ornstein,Phys.Rev.36,823(1930).14.M.C.Wang,G.E.Uhlenbeck,Rev.Mod.Phys.17,323(1945).15.Materials and methods are available as supportingmaterial on Science online.16.K.G.Libbrecht,E.D.Black,Phys.Lett.A 321,99(2004).17.R.Zwanzig,M.Bixon,J.Fluid Mech.69,21(1975).18.A.Moshfegh,M.Shams,G.Ahmadi,R.Ebrahimi,Colloids Surf.A Physicochem.Eng.Asp.345,112(2009).19.R.Kubo,Science 233,330(1986).20.G.M.Wang,E.M.Sevick,E.Mittag,D.J.Searles,D.J.Evans,Phys.Rev.Lett.89,050601(2002).21.A.Hopkins,K.Jacobs,S.Habib,K.Schwab,Phys.Rev.B68,235328(2003).22.D.Kleckner,D.Bouwmeester,Nature 444,75(2006).23.A.Ashkin,J.M.Dziedzic,Appl.Phys.Lett.28,333(1976).24.D.E.Chang et al .,Proc.Natl.Acad.Sci.U.S.A.107,1005(2010).25.O.Romero-Isart,M.L.Juan,R.Quidant,J.Ignacio Cirac,N.J.Phys.12,033015(2010).26.M.G.R.acknowledges support from the Sid W.RichardsonFoundation and the R.A.Welch Foundation grant number F-1258.D.M.acknowledges support fromEl Consejo Nacional de Ciencia y Tecnología (CONACYT)for his graduate fellowship (206429).The authors would also like to thank E.-L.Florin and Z.Yin for helpfuldiscussions and I.Popov for his help with the experiment.Supporting Online Material/cgi/content/full/science.1189403/DC1Materials and Methods10March 2010;accepted 10May 2010Published online 20May 2010;10.1126/science.1189403Include this information when citing this paper.Fig.4.(A )The distribu-tion of the measured in-stantaneous velocities of a 3-m m silica bead.The statistics at each pressure is calculated from 4mil-lion instantaneous veloc-ities.The solid lines are Maxwell-Boltzmann dis-tributions.We obtained v rms =0.422mm/s at 99.8kPa (red square)and v rms =0.425mm/s at 2.75kPa (black circle)from the measurements.The rms value of the noise (blue triangle)is 0.021mm/s.(B )The normalizedvelocity autocorrelation functions of the 3-m m bead at two different pressures.The solid lines are fittings with Eq.2.A B SCIENCEVOL 32825JUNE 20101675REPORTSo n M a y 21, 2017h t t p ://s c i e n c e .s c i e n c e m a g .o r g /D o w n l o a d e d f r o moriginally published online May 20, 2010(5986), 1673-1675. [doi: 10.1126/science.1189403]328Science (May 20, 2010)Tongcang Li, Simon Kheifets, David Medellin and Mark G. Raizen ParticleMeasurement of the Instantaneous Velocity of a BrownianEditor's Summarythe technique also has practical implications for cooling particles to ultralow temperatures.short-time-scale behavior predicted a century ago. As well as testing fundamental principles of physics, Brownian motion, measuring the predicted instantaneous velocity of the particle and verifying the1673, published online 20 May) use a single, optically trapped silica bead to probe the dynamics of (p.et al.Li Einstein described this Brownian motion in terms of statistical thermodynamics. Now, displayed a random motion, jittering under the microscope as if the particles were alive. In 1905, Albert Nearly 200 years ago, the botanist Robert Brown noted that pollen particles floating on a liquid Dancing in the LightThis copy is for your personal, non-commercial use only.Article Tools/content/328/5986/1673article tools:Visit the online version of this article to access the personalization and Permissions/about/permissions.dtlObtain information about reproducing this article: is a registered trademark of AAAS.Science Advancement of Science; all rights reserved. The title Avenue NW, Washington, DC 20005. Copyright 2016 by the American Association for thein December, by the American Association for the Advancement of Science, 1200 New York (print ISSN 0036-8075; online ISSN 1095-9203) is published weekly, except the last week Science o n M a y 21, 2017h t t p ://s c i e n c e .s c i e n c e m a g .o r g /D o w n l o a d e d f r o m。
“散射光偏振态检测水质~~~”课题结题分析方案
“散射光偏振态检测水质颗粒含量的理论与实践研究”课题结题报告光极课题组执笔:梁美怡课题负责人:梁美怡指导老师:冯杰<华南师范大学,物电学院,副教授)彭力<华南师范大学,物电学院,助教)课题组成员:丁友根张俊莲尹凤婷刘斌1、课题研究的意义①用椭偏仪测量水中颗粒的大小,在现代光学研究上具有重要的实际意义。
随着工农业的发展,测量水中颗粒的大小是工农业生产中的控制因素。
因此,椭偏法和水中颗粒大小测量的研究是有现实意义的。
b5E2RGbCAP②使光学从课堂和实验室走进现实生活,提高我们发现问题,分析问题,解决问题的能力,开拓我们的思维。
2、课题研究的理论依据利用在测量散射光的偏振性时,自然光的矢量在oyz平面内沿着一切可能的方向振动,可平均地分解成y和z两个相等的分量[6] 。
入射偏振方向为y方向的线偏振光时,在oxy平面出射的是y方向的线偏振光;入射偏振方向为x方向的线偏振光时,在oxy平面出射的是x方向的线偏振光。
因此,在实验时可把水平和垂直两方向上的y和z两相等的分量替代常在光学实验中使用的自然光,以此为依据设计新的实验方法来测量散射光的偏振度。
p1EanqFDPw用散射光的偏振特性来测量溶液的颗粒线度。
利用微粒散射自然光时,正侧方向的散射光都是线偏振光,且振动面垂直于入射光束的传播方向的性质,通过对正侧方向散射光的光强和偏振度的测量,探究其与散射颗粒线度之间的关系,从而根据有关Mie散射理论,寻求颗粒物线度的测量方法。
DXDiTa9E3d3、课题研究的目标①通过课题研究,获取事实,发现规律,发展理论,探索偏振叠加发在现代光学中的运用,并在实际中实施,在此基础上,收集相关资料数据,不断总结反思,积累一批有价值的实验资料与实验数据.②通过课题研究推进偏振度测量的改进,提高偏振度测量的准确度.RTCrpUDGiT③通过课题研究培养创新精神和实践能力。
促进合作能力,建立严谨的科学态度和科学道德,提高信息素养和学习能力.5PCzVD7HxA④坚持做到理论学习与实践研究相结合,课内与课外相结合,以点带面,辐射到所有学科。
ZEISS Axio Observer 逆向显微镜系统说明书
ZEISS Axio ObserverYour Inverted Microscope System for MetallographyProduct InformationVersion 1.050 µmSpherulitic graphite in nodular cast iron seen in C-DIC contrast.Your Inverted Microscope System for MetallographyFast, flexible, economic: Take advantage of Axio Observer’s inverted construction to investigate a large number of samples in no time at all – or to explore heavy ones, just as efficiently. There’s no need to refocus, even when changing magnifi-cation or switching samples. Axio Observer combines the proven quality of ZEISS optics with automated components to give you reliable, reproducible results. Using dedicated software modules you can analyze, for example, non-metallic inclusions, grain sizes and phases – it’s fully automatic. Axio Observer is your open imaging platform: invest in only the features you need today.As requirements change, a simple upgrade keeps your system ready for all materials applications.› In Brief › The Advantages › The Applications › The System› Technology and Details ›ServiceAnimationSimpler. More intelligent. More integrated.Save Time in Metallographic Investigations As an inverted microscope platform, Axio Observer makes work so much more enjoyable. Whether investigating a large number or even heavy samples, you’ll save time in both sample preparation and investigation. Meanwhile, its inverted design facilitates parallel alignment to the objective lens. Observe more samples in less time: simply put your specimen on the stage, focus once and keep the focus for all further magnifications and samples.Upgrade Your SystemKeep an eye on your budget as well as your samples.With Axio Observer, you invest only in the featuresyou need now. You can always upgrade your system,simply and economically, any time you need to.Choose between encoded or motorized compo-nents and a range of accessories – you can dependon having any relevant contrasting techniques yourapplication requires.Count on Reliable Results and Brilliant ImagesYou will appreciate the stable imaging conditionsof Axio Observer, especially when working withhigh magnifications. Homogeneous illuminationacross the entire field of view produces brilliantimages. And you will get reliable, reproducibleresults every time, thanks to the proven opticalquality of ZEISS combined with automated com-ponents. Profit from short time-to-image for yourmetallographic structure analysis with dedicatedsoftware modules, e.g. NMI, Grains, Multiphase.› In Brief› The Advantages› The Applications› The System› Technology and Details › ServiceExpand Your PossibilitiesChoose Between Three Different Stands• Control all motorized components of yourAxio Observer 7 materials with its touchscreendisplay. Automatic Component Recognition(ACR) means it will always recognize the settingsfor objectives and filtersets you have chosen.• Axio Observer 5 materials – nearly all compo-nents can be read out or even motorized• Axio Observer 3 materials with an encodednosepiece, light manager, CAN and USB inter-face that enables a read-out of the magnificationGet Crisp Images with Polarization ContrastInvestigate your samples with polarization contrastusing fixed analyzers, a measuring analyzer rotatingthrough 360° and a rotating analyzer with rotatingfull-wave plate.Now, you can also use a rotatable polarizer tochange the direction of incidence of the polarizedlight. This also makes bireflection and pleochroismvisible on anisotropic samples. In addition, someore phases display anisotropy in the polarized re-flected light, whereby a color change is generateddepending on the placement of the polarizer a fewdegrees +/- from the marked position.Take Advantage of a Variety of Stage InsertsSelect from a variety of stage inserts to tailor thesystem to your needs. The high-grade spring steelwill not yield under loads, even when examiningmany samples. Thus you can be sure that the opticalreference plane is maintained. Stage inserts comewith different inside apertures to match standardspecimen diameters, plus a 10 mm aperture forvery small specimens.› In Brief› The Advantages› The Applications› The System› Technology and Details› ServiceTailored Precisely to Your Applications› The Advantages› The Applications› The System› Technology and Details› Service50 µm50 µm50 µm50 µmBrightfieldDarkfieldPolarization ContrastPolarization with Additional Lambda PlateZEISS Axio Observer at WorkSpherulitic graphite in nodular grey cast iron, spheruliths with ferrite envelope and perlitic ground mass, same position acquired in reflected light with different contrasting techniques, objective: EC Epiplan-NEOFLUAR 50×/0.80 HD DIC› In Brief › The Advantages › The Applications › The System› Technology and Details › Service50 µm50 µm50 µm50 µm50 µmCast aluminum-silicon, reflected light, brightfield, objective: EC Epiplan-NEOFLUAR 20×/0.50 HD DICZEISS Axio Observer at WorkCast aluminum-silicon, reflected light, darkfield, objective: EC Epiplan-NEOFLUAR 20×/0.50 HD DICNiccolite, reflected light, polarization contrast with lambda plate, objective: EC Epiplan-NEOFLUAR 20×/0.50 HD DICZinc, reflected light, polarization contrast with lambda plate, objective: EC Epiplan-NEOFLUAR 20×/0.50 HD DICNiccolite, reflected light, polarization contrast with slightly twisted polarizers, objective: EC Epiplan-NEOFLUAR 20×/0.50 HD DIC› In Brief › The Advantages › The Applications › The System› Technology and Details › Service500 µm500 µm500 µm500 µmBarker-etched aluminum, reflected light, polarization contrast, objective: EC Epiplan-NEOFLUAR 5×/0.13 HD DICZEISS Axio Observer at WorkBarker-etched aluminum, reflected light, polarization contrast with lambda plate, objective: EC Epiplan-NEOFLUAR 5×/0.13 HD DICBarker-etched aluminum, reflected light, circular polarization contrast, objective: EC Epiplan-NEOFLUAR 5×/0.13 HD DICBarker-etched aluminum, reflected light, differential interference contrast with circular polarized light (C-DIC), objective: EC Epiplan-NEOFLUAR 5×/0.13 HD DIC› In Brief › The Advantages › The Applications › The System› Technology and Details › Service1234561 Microscope• Axio Observer 3 materials (encoded)• Axio Observer 5 materials (encoded, partly motorized)• Axio Observer 7 materials (motorized)2 Objectives • EC Epiplan• EC Epiplan-NEOFLUAR • EC Epiplan-APOCHROMATYour Flexible Choice of Components3 Illumination Reflected light:• microLED • HAL 100• HBOTransmitted light:• HAL 100• microLED4 Cameras • Axiocam HRc • Axiocam MRc 5• Axiocam MRc • Axiocam 506 color • Axiocam 503 color • Axiocam ICc 5• Axiocam ICc 1• Axiocam 105 color5 Software • AxioVision • AxioVision LE • ZEN 2 core • ZEN 2 starter6 Accessories• Correlative Microscopy • Fixed, measuring,rotating analyzer and polarizers • Gliding stage, scanning stages› In Brief › The Advantages › The Applications › The System› Technology and Details › ServiceSystem Overview› The Advantages› The Applications› The System› Technology and Details› ServiceSystem Overview› The Advantages› The Applications› The System› Technology and Details› ServiceTechnical Specifications› The Advantages› The Applications› The System› Technology and Details› ServiceTechnical Specifications› The Advantages› The Applications› The System› Technology and Details› ServiceTechnical Specifications› The Advantages› The Applications› The System› Technology and Details› ServiceTechnical Specifications› The Advantages› The Applications› The System› Technology and Details› ServiceTechnical Specifications› The Advantages› The Applications› The System› Technology and Details› ServiceTechnical Specifications› The Advantages› The Applications› The System› Technology and Details› ServiceTechnical Specifications› The Advantages› The Applications› The System› Technology and Details› ServiceBecause the ZEISS microscope system is one of your most important tools, we make sure it is always ready to perform. What’s more, we’ll see to it that you are employing all the options that get the best from your microscope. You can choose from a range of service products, each delivered by highly qualified ZEISS specialists who will support you long beyond the purchase of your system. Our aim is to enable you to experience those special moments that inspire your work.Repair. Maintain. Optimize.Attain maximum uptime with your microscope. A ZEISS Protect Service Agreement lets you budget for operating costs, all the while reducing costly downtime and achieving the best results through the improved performance of your system. Choose from service agreements designed to give you a range of options and control levels. We’ll work with you to select the service program that addresses your system needs and usage requirements, in line with your organization’s standard practices.Our service on-demand also brings you distinct advantages. ZEISS service staff will analyze issues at hand and resolve them – whether using remote maintenance software or working on site. Enhance Your Microscope System.Your ZEISS microscope system is designed for a variety of updates: open interfaces allow you to maintain a high technological level at all times. As a result you’ll work more efficiently now, while extending the productive lifetime of your microscope as new update possibilities come on stream.Profit from the optimized performance of your microscope system with services from ZEISS – now and for years to come.Count on Service in the True Sense of the Word› In Brief › The Advantages › The Applications › The System› Technology and Details › ServiceE N _42_011_176 | C Z 10-2015 | D e s i g n , s c o p e o f d e l i v e r y , a n d t e c h n i c a l p r o g r e s s s u b j e c t t o c h a n g e w i t h o u t n o t i c e . | © C a r l Z e i s s M i c r o s c o p y G m b HCarl Zeiss Microscopy GmbH 07745 Jena, Germany ********************。
金属反射镜的偏振特性及其正交反射消偏研究
金属反射镜的偏振特性及其正交反射消偏研究
天上去。40年代的探空火箭技术和气球技术,50年代末人造卫星的上天,使天 文学家的宿愿终于实现。从此天文观测从地基观测跃进到空基观测,天文观测从 可见波段、射电波段扩展到整个电磁波段,天空宇宙在人类面前展示了一幅更加 绚丽多彩的画面。 1.1.2在白昼实现天文观测手段 1)光谱滤波提高白天观测能力
金属反射镜的偏振特性及其正交反射消偏研究 姓名:邱成锋
申请学位级别:硕士 专业:光学
指导教师:洪津;孙晓兵 20070101
摘要
摘要
在白天天文观测时,可利用大气散射的偏振特性来抑制天空背景光,从而 增加目标与天空背景的对比度,并提高白昼晴空条件下的天文观测能力。天文 望远镜采用金属反射镜折转光路设计时,会对大气背景偏振抑制效果有较大的 削弱。本文针对此应用需求开展了金属反射镜反射偏振特性及正交反射镜消偏 作用的研究。
changes,the polarization angles of incident light and emergent light are orthogonal,
which ensures the application of polarimetric restraint technique.
19世纪中叶,随着玻璃工业的发展,大型折射式反射镜得到了广泛的发展。 1870年美国人克拉克为美国海军天文台建造了一架当时世界最大最好的折射望 远镜,1877年美国天文学家霍尔用它发现了火星的卫星。20世纪初,随着材料 磨制工艺的进步和镀膜的发展,大型反射式望远镜在天文观测中起到越来越重要 的作用,1917年11月“胡克望远镜"正式启用了,整个望远镜重90吨,可以 很方便地操作,并以很高的精度跟踪恒星,能够提供银河系实际大小和太阳系所 处位置信息。1948年当时世界上最为完善的“海尔反射望远镜”在美国交付使 用,它拍摄和分辨遥远天体的能力比“胡克望远镜”要优越得多,它能拍摄23 星等的暗星,能探测距离我们远达几亿光年的暗弱星系。
圆极化与线计划的设置
圆极化与线计划的设置英文回答:Circular polarization and linear polarization are two different ways of describing the orientation of electromagnetic waves. In circular polarization, the electric field vector of the wave rotates in a circular pattern as the wave propagates. This rotation can be clockwise or counterclockwise. In linear polarization, the electric field vector of the wave oscillates in a straight line.Circular polarization can be achieved by combining two perpendicular linearly polarized waves with a phase difference of 90 degrees. This can be done using a device called a quarter-wave plate or a combination of a half-wave plate and a linear polarizer. The resulting wave will have a rotating electric field vector.Linear polarization can be achieved by using a linearpolarizer, which is a device that only allows waves with a specific orientation of the electric field vector to pass through. The polarizer absorbs or blocks waves with orientations perpendicular to the desired polarization.The choice between circular polarization and linear polarization depends on the specific application. Circular polarization is often used in satellite communication to minimize signal loss due to the rotation of the satellite and to improve signal reception in areas with high levelsof interference. It is also used in some optical systems to eliminate the effects of birefringence. Linear polarization, on the other hand, is commonly used in antennas, optical filters, and polarization-sensitive detectors.中文回答:圆极化和线极化是描述电磁波方向的两种不同方式。
光的偏振演示实验报告
polarized light姓名: 班级 学号: 实验名称:偏振光的实验The purpose of the experiment: to master the spectrometer works, familiar with theprinciples and properties of polarized light. Verify Malus law, and the refractive index of the medium is determined according to Brewster's law.Experimental principle:The various analyzes and measurements in order to study the polarization properties of the polarization state of light and the use of light, various polarizing element: generating a polarized light component, and to change the polarization state of the light elements, etc., the following classification introduced.1..Produce polarized light componentsLight generated from the laser before the invention, the natural light in general are non-polarized light, and therefore produce the components of the polarized light must produce polarized. Based on the role of these elements in the experiment were divided into a polarizer and an analyzer. The polarizer is an element which converts natural light into linearly polarized light, the analyzer is a polarization state of the element used to identify light. In the laser resonator can take advantage of the Brewster angle of the output laser beam is a linearly polarized light.A lot of natural light becomes polarized, a method using light polarization phenomena in the interface reflection and transmission time. Our ancestors in the very early reflection of the horizontal plane light some research, but quantitative study was first performed in 1815 by Brewster. The reflected light perpendicular to the incident surface of the light vibration (called the s component) than parallel to the incident surface of the light vibration (called p component); while the transmitted light is opposite. Changing the incident angle at the time, there is a special phenomenon, i.e., when the incident angle of a specific value, the reflected light becomes completely linearly polarized light (s-component). Refracted light is partially polarized light, and at this time of the reflected light and refracted light vertical, a phenomenon known as Brewster's law. The method is one of the methods of the linearly polarized light can be obtained. As shown inFigure 1. Because this case, {EMBED Equation.3|20πγ=+i ,,if n1 = 1 (for the refractive index of air), then (1)The Called the Brewster angle, so the refractive index of the medium can be measured by the size of the measurement of Brewster angle.Introduced above, we can know that the use of reflection can produce polarized light, the same can also take advantage of transmission (several transmission) to produce polarized light (glass heap). The second is an optical prism, a Nicol prism, a Glan prism, etc., it is birefringence using a crystal made of the principle. When there is a particular direction (optical axis direction) in the crystal, when the spread of the beam in this direction, the light beam does not split, the beamto deviate from the direction of propagation, the light beam will be split into two beams, wherein the light beam comply with the law of refraction called unusual light (o light), another beam of light is generally non-compliance with the law of refraction is called the extraordinary light (e light). O are linearly polarized light and e light (also called completely polarized light), both of the vibration direction of the light vector (in the normal use state) mutually perpendicular. Changing the direction of the incident light ray toward the crystals can be found in the optical axis direction, in this direction, the O ray and e-ray is equal to the velocity of propagation, the same refractive index. The crystals can have an optical axis, called uniaxial crystal, such as calcite, quartz, can have two optical axes, called biaxial crystal, such as mica, sulfur, etc.. Including the optical axis and the plane of each light line called corresponds to the main plane of the light, o photoelectric vector oscillation direction perpendicular to the main plane of o light, e photoelectric vector parallel to the vibration direction of the main plane of the e-ray.Glan prism constituted by two calcite rectangular prism, the air gap, parallel to the optical axis of the calcite prism ridge between the two prisms. Natural light vertically the interface injection prism into o light and e light, o light in the air gap on total reflection, only e light through the prism.The third is the polarizing plate, it is the use of polyvinyl alcohol made of a plastic film, it has a long chain of the comb-shaped structure of molecules, these molecules are arranged in parallel in the same direction, the film allows only perpendicular to the arrangement direction of the light vibrations is passed, resulting in linearly polarized light. Its polarization performance as a Glan prism, but the advantage is cheap, and a large area can be obtained. Polarizer as the polarizer and the analyzer used in this experiment.2.Wave chip:Also known phase retardation plate is to change the polarization state of light elements. It is a plane-parallel plate cut from a uniaxial crystal, due to the wave chip speed vo, ve different (so the refractive index is different), so the resulting o light and e is the light passes through the optical path of the wave wafer. The o light phase when the two beams through wave chip e light relative to the amount of delay,(2)If satisfied, that we call sheet, if met, i.e., we call the sheet, if satisfied, i.e. we call a full-wave plate (M is an integer).Wave chip can be used to test and change the light polarization state, as shown in Figure 4, after the polarizer plus a wave plate, rotating the polarizer or wave plate can be obtained park or elliptical polarized light [details and methods see Document 2,3]. Wave plate is an the ellipsometer important element the ellipsometer can accurately measure the thickness and refractive index of the film, and precision instruments used in materials science.The polarized light from Malus law, Malus law is the most basic and most important laws polarization. Marius discovered in 1809, completely linearly polarized light through the analyzer strong can be expressed as(3)Wherein E is the angle of the direction of polarization of the analyzer and the polarization direction of the polarizer.Experimental apparatus:1, a semiconductor laser (wavelength 650nm), a polarizer 3, the analyzer 4, the spectrometer, and digital galvanometer.Experimental procedures and data processing and analysis:1, the instrument adjustment:(1) First, the two-plane mirror adjust discharge of the semiconductor laser light tube (hereinafter referred to as the tube 1) it is perpendicular to the rotary spindle of the instrument (ie parallel to the plane) and dial, while the spectrometer table and dial plane parallel.(2) check whether the output signal with digital galvanometer connected to the switch of the galvanometer measurement process to select a file on a file, adjust the zero knob, so that the data show "- .000" (minus sign flashing).2, measuring the degree of polarization of the semiconductor laserPolarizer P1 put in tube 1 hit 4th gear range selector 4 stages switch (from the vertical direction of the polarizer will be transferred to 0 ), rotating polarizer find the intensity, the strongest position to record angle and light intensity value Imax. Then, the polarizer is rotated 90 , record the angle and light intensity value Imin. Calculated according to the formula degree of polarization of the laser beam P:(4)Imin = 1.2 Imax = 145.9By (4) can be calculated was:P = 0.9833, verify Malus lawThe galvanometer is still in 4 files do not shift during the measurement. The polarizer on the light intensity and the strongest position analyzer P2 put on the other end the tube 2 and the vertical direction is 0 . Then rotating analyzer P2 the galvanometer light intensity minimum (still in 4th gear can be adjusted to 0). The angle between P1 and P2 are the direction of polarization can be considered at this time for of 90 recording P2 polarization direction at this time the absolute angle value , the value of the relative angle and light intensity value I, after every 10 records once, until P1 and P2 the angle between the direction of polarization of -90 , I0 is the angle between the polarization direction of the P1 and P2 for the light intensity values at 0 made I/I0 cos2 curve (0 90 0 - 90 each one, find the slope and intercept of the least squares method, according to the Malus law slope should be 1, the intercept should be 0, the analysis of the experimental error).1)-90~0Theta Ip Cos^2-90 0 1.06939E-26-85 2 0.0076-80 6.4 0.03015-75 13.2 0.06699-70 22 0.11698-65 32.2 0.17861-60 44.6 0.25-55 57.6 0.32899-50 71.1 0.41318-45 85.3 0.5-40 100 0.58682-35 113 0.67101-30 126 0.75-25 137.6 0.82139-20 146.8 0.88302-15 154.6 0.93301-10 160.2 0.96985-5 163.3 0.99240 164 1Origin linear the contemplated merger analysis error:2)0~90Theta Ip Cos^20 164 15 161.8 0.992410 157.1 0.9698515 150.1 0.9330120 141.3 0.8830225 130.2 0.8213930 118.1 0.7535 104.4 0.6710140 90 0.5868245 75.6 0.550 61.4 0.4131855 48.2 0.3289960 35.7 0.2565 23.7 0.1786170 15 0.1169875 8.3 0.0669980 3 0.0301585 0.3 0.007690 0.1 1.06939E-26 Origin linear the contemplated merger analysis error:4, t he measurement of the Brewster angle:θθ’Δθ84º34’140º25’55º51’124º55’181º45’56º50’40º96º40’56º40’Δθ=56º21’≈57ºAnd theoretically in line with。
金属腐蚀速率测定实验报告
金属腐蚀速率测定实验报告实验报告AbstractThe corrosion rate of metals is a crucial parameter in various industries, as it directly affects the longevity and performance of metallic structures. In this experiment, the corrosion rate of a metal sample was determined using two different methods: the weight loss method and the polarization resistance method. The results showed a correlation between the corrosion rate and the exposure time, as well as the effectiveness of the two methods in measuring corrosion rates. These findings provide valuable insights for industries dealing with metal corrosion prevention and control.1. IntroductionCorrosion is the process of deterioration of materials, especially metals, due to chemical reactions with the environment. It poses significant challenges in various sectors, such as infrastructure, manufacturing, and transportation. Understanding the corrosion rate of metals is essential for designing corrosion-resistant materials and structures. This experiment aims to determine the corrosion rate of a metal sample and compare the effectiveness of different measurement techniques.2. Experimental Procedure2.1 Sample PreparationA metal sample of known composition, in this case, mild steel, was selected for the experiment. The sample was carefully cleaned and dried toremove any surface contaminants that could interfere with the corrosion measurement.2.2 Weight Loss MethodThe weight loss method is a widely used technique for measuring the corrosion rate of metals. In this method, the metal sample is exposed to a corrosive environment for a specific period. After exposure, the sample is cleaned to remove any corrosion products and re-weighed. The difference in weight before and after exposure is used to calculate the corrosion rate.2.3 Polarization Resistance MethodThe polarization resistance method is an electrochemical technique for measuring the corrosion rate. It is based on the measurement of the polarization resistance, which is related to the rate of metal corrosion. In this method, a potentiostat is used to apply a small potential difference to the metal sample while measuring the resulting current. From this data, the polarization resistance and corrosion rate can be calculated.3. Results and DiscussionThe corrosion rate of the metal sample was measured using both the weight loss method and the polarization resistance method. The experiments were conducted over a period of 30 days, and measurements were taken at regular intervals.3.1 Weight Loss Method ResultsThe weight loss method involved immersion of the metal sample in a corrosive solution. After a specified period, the sample was removed,cleaned, and re-weighed. The corrosion rate was calculated by dividing the weight loss by the exposure time and the sample area. The results showed an increase in corrosion rate with increasing exposure time, indicating progressive corrosion of the metal sample.3.2 Polarization Resistance Method ResultsThe polarization resistance method involved applying a small potential difference to the metal sample and measuring the resulting current. Using this data, the polarization resistance and corrosion rate were calculated. The results demonstrated a similar trend to the weight loss method, with a higher corrosion rate observed as the exposure time increased.4. Comparison of Measurement TechniquesBoth the weight loss method and the polarization resistance method provided valuable insights into the corrosion rate of the metal sample. The weight loss method is relatively simple and cost-effective, making it a popular choice in various industries. However, it is limited by factors such as the need for sample removal and potential errors associated with cleaning and weighing. The polarization resistance method, although more complex and expensive, offers higher accuracy and provides real-time data without the need for sample removal. It is particularly suitable for continuous monitoring of corrosion rates in complex environments.5. ConclusionIn this experiment, the corrosion rate of a metal sample was successfully determined using the weight loss method and the polarization resistance method. The results showed a clear correlation between the corrosion rateand the exposure time. Both methods proved effective in measuring the corrosion rate, with the polarization resistance method offering higher accuracy and real-time monitoring capabilities. These findings contribute to the understanding and prevention of metal corrosion in various industries. Future research can explore the application of these methods to different metals and corrosive environments, as well as the development of advanced corrosion prevention techniques.。
光纤传感器概述(英文)
Overview of Fiber Optic SensorsOver the past twenty years two major product revolutions have taken place due to the growth of the optoelectronics and fiber optic communications industries. The optoelectronics industry has brought about such products as compact disc players, laser printers, bar code scanners and laser pointers. The fiber optic communication industry has literally revolutionized the telecommunication industry by providing higher performance, more reliable telecommunication links with ever decreasing bandwidth cost. This revolution is bringing about the benefits of high volume production to component users and a true information superhighway built of glass.In parallel with these developments fiber optic sensor [1-6] technology has been a major user of technology associated with the optoelectronic and fiber optic communication industry. Many of the components associated with these industries were often developed for fiber optic sensor applications. Fiber optic sensor technology in turn has often been driven by the development and subsequent mass production of components to support these industries. As component prices have fallen and quality improvements have been made, the ability of fiber optic sensors to displace traditional sensors for rotation, acceleration, electric and magnetic field measurement, temperature, pressure, acoustics, vibration, linear and angular position, strain, humidity, viscosity, chemical measurements and a host of other sensor applications, has been enhanced. In the early days of fiber optic sensor technology most commercially successful fiber optic sensors were squarely targeted at markets where existing sensor technology was marginal or in many cases nonexistent. The inherent advantages of fiber optic sensors which include their ability to be lightweight, of very small size, passive, low power, resistant to electromagnetic interference, high sensitivity, wide bandwidth and environmental ruggedness were heavily used to offset their major disadvantages of high cost and unfamiliarity to the end user.The situation is changing. Laser diodes that cost $3000 in 1979 with lifetimes measured in hours now sell for a few dollars in small quantities, have reliability of tens of thousands of hours and are used widely in compact disc players, laser printers, laser pointers and bar code readers. Single mode optical fiber that cost $20/m in 1979 now costs less than $0.10/m with vastly improved optical and mechanical properties. Integrated optical devices that were not available in usable form at that time are now commonly used to support production models of fiber optic gyros. Also, they could drop dramatically in price in the future while offering ever more sophisticated optical circuits. As these trends continue, the opportunities for fiber optic sensor designers to produce competitive products will increase and the technology can be expected to assume an ever more prominent position in the sensor marketplace. In the following sections the basic types of fiber optic sensors that are being developed will be briefly reviewed followed by a discussion of how these sensors are and will be applied.Basic Concepts and Intensity Based Fiber Optic SensorsFiber optic sensors are often loosely grouped into two basic classes referred to as extrinsic or hybrid fiber optic sensors, and intrinsic or all fiber sensors. Figure 1 illustrates the case of an extrinsic or hybrid fiber optic sensor.Light ModulatorEnvironmental SignalFigure 1. Extrinsic fiber optic sensors consist of optical fibers that lead up to and out of a "black box" that modulates the light beam passing through it in response to an environmental effect.In this case an optical fiber leads up to a "black box" which impresses information onto the light beam in response to an environmental effect. The information could be impressed in terms of intensity, phase, frequency, polarization, spectral content or other methods. An optical fiber then carries the light with the environmentally impressed information back to an optical and/or electronic processor. In some cases the input optical fiber also acts as the output fiber. The intrinsic or all fiber sensor shown in Figure 2 uses an optical fiber to carry the light beam and the environmental effect impresses information onto the light beam while it is in the fiber. Each of these classes of fibers in turn has many subclasses with, in some cases sub subclasses (1) that consist of large numbers of fiber sensors.Figure 2. Intrinsic fiber optic sensors rely on the light beam propagating through the optical fiber being modulated by the environmental effect either directly or through environmentally induced optical path length changes in the fiber itself.In some respects the simplest type of fiber optic sensor is the hybrid type that is based on intensity modulation [7-8]. Figure 3 shows a simple closure or vibration sensor that consist of two optical fibers that are held in close proximity to each other. Light is injected into one of the optical fibers and when it exits the light expands into a cone oflight whose angle depends on the difference between the index of refraction of the core and cladding of the optical fiber. The amount of light captured by the second optical fiber depends on its acceptance angle and the distance d between the optical fibers. When the distance d is modulated, it in turn results in an intensity modulation of the light captured.dFigure 3. Closure and vibration fiber optic sensors based on numerical aperture can be used to support door closure indicators and measure levels of vibration in machinery.A variation on this type of sensor is shown in Figure 4. Here a mirror is used that is flexibly mounted to respond to an external effect such as pressure. As the mirror position shifts the effective separation between the optical fibers shift with a resultant intensity modulation. These types of sensors are useful for such applications as door closures where a reflective strip, in combination with an optical fiber acting to input and catch the output reflected light, can be used.Input LightCollectionFibersFigure 5. Fiber optic translation sensor based on numerical aperture uses the ratio of the output on the detectors to determine the position of the input fiber.Several companies have developed rotary and linear fiber optic position sensors to support applications such as fly-by-light [9]. These sensors attempt to eliminate electromagnetic interference susceptibility to improve safety, and to reduce shielding needs to reduce weight. Figure 6 shows a rotary position sensor [10] that consists of a code plate with variable reflectance patches placed so that each position has a unique code. A series of optical fibers are used to determine the presence or absence of a patch.VariableReflectanceShaftFigure 6. Fiber optic rotary position sensor based on reflectance used to measure rotational position of the shaft via the amount of light reflected from dark and light patches.An example of a linear position sensor using wavelength division multiplexing [11] is illustrated by Figure 7. Here a broadband light source which might be a light emitting diode is used to couple light into the system. A single optical fiber is used to carry the light beam up to a wavelength division multiplexing (WDM) element that splits the light into separate fibers that are used to interrogate the encoder card and determine linear position. The boxes on the card of Figure 7 represent highly reflective patches while the rest of the card has low reflectance. The reflected signals are then recombined and separated out by a second wavelength division multiplexing element so that each interrogating fiber signal is read out by a separate detector.λ1 λ2λ3Figure 7. Linear position sensor using wavelength division multiplexing decodes position by measuring the presence or absence of reflective patch at each fiber position as the card slides by via independent wavelength separated detectors.A second common method of interrogating a position sensor using a single optical fiber is to use time division multiplexing methods [12]. In Figure 8 a light source is pulsed. The light pulse then propagates down the optical fiber and is split into multiple interrogating fibers. Each of these fibers is arranged so that they have delay lines that separate the return signal from the encoder plate by a time that is longer than the pulse duration. When the returned signals are recombined onto the detector the net result is an encoded signal burst corresponding to the position of the encoded card.Figure 8. Linear position sensor using time division multiplexing measure decodes card position via a digital stream of on’s and off’s dictated by the presence or absence of a reflective patch.These sensors have been used to support tests on military and commercial aircraft that have demonstrated performance comparable to conventional electrical position sensors used for rudder, flap and throttle position [9]. The principal advantages of the fiber position sensors are immunity to electromagnetic interference and overall weight savings. Another class of intensity based fiber optic sensors is based on the principle of total internal reflection. In the case of the sensor in Figure 9, light propagates down the fiber core and hits the angled end of the fiber. If the medium into which the angled end of thefiber is placed has a low enough index of refraction then virtually all the light is reflected when it hits the mirrored surface and returns via the fiber. If however the index of refraction of the medium starts to approach that of the glass some of the light propagates out of the optical fiber and is lost resulting in an intensity modulation.OutputFigure 9. Fiber sensor using critical angle properties of a fiber for pressure/index of refraction measurement via measurements of the light reflected back into the fiber.This type of sensor can be used for low resolution measurement of pressure or index of refraction changes in a liquid or gel with one to ten percent accuracy. Variations on this method have also been used to measure liquid level [13] as shown by the probe configuration of Figure 10. When the liquid level hits the reflecting prism the light leaks into the liquid greatly attenuating the signal.Figure 10. Liquid level sensor based on total internal reflection detects the presence or absence of liquid by the presence or absence of a return light signal.Confinement of a propagating light beam to the region of the fiber cores and power transfer from two closely placed fiber cores can be used to produce a series of fiber sensors based on evanescence [14-16]. Figure 11 illustrates two fiber cores that have been placed in close proximity to one another. For single mode optical fiber [17] this distance is on the order of 10 to 20 microns.Light InFigure 11. Evanescence based fiber optic sensors rely on the cross coupling of light between two closely spaced fiber optic cores. Variations in this distance due to temperature, pressure or strain offer environmental sensing capabilities.When single mode fiber is used there is considerable leakage of the propagating light beam mode beyond the core region into the cladding or medium around it. If a second fiber core is placed nearby this evanescent tail will tend to cross couple to the adjacent fiber core. The amount of cross coupling depends on a number of parameters including the wavelength of light, the relative index of refraction of the medium in which the fiber cores are placed, the distance between the cores and the interaction length. This type of fiber sensor can be used for the measurement of wavelength, spectral filtering, index of refraction and environmental effects acting on the medium surrounding the cores (temperature, pressure and strain). The difficulty with this sensor that is common to many fiber sensors is optimizing the design so that only the desired parameters are sensed. Another way that light may be lost from an optical fiber is when the bend radius of the fiber exceeds the critical angle necessary to confine the light to the core area and there is leakage into the cladding. Microbending of the fiber locally can cause this to result with resultant intensity modulation of light propagating through an optical fiber. A series of microbend based fiber sensors have been built to sense vibration, pressure and other environmental effects [18-20]. Figure 12 shows a typical layout of this type of device consisting of a light source, a section of optical fiber positioned in a microbend transducer designed to intensity modulate light in response to an environmental effect and a detector. In some cases the microbend transducer can be implemented by using special fiber cabling or optical fiber that is simply optimized to be sensitive to microbending loss.Figure 12. Microbend fiber sensors are configured so that an environmental effect results in an increase or decrease in loss through the transducer due to light loss resulting from small bends in the fiber.One last example of an intensity based sensor is the grating based device [21] shown in Figure 13. Here an input optical light beam is collimated by a lens and passes through a dual grating system. One of the gratings is fixed while the other moves. With acceleration the relative position of the gratings changes resulting in an intensity modulated signal on the output optical fiber.SpringFigure 13. Grating based fiber intensity sensors measure vibration or acceleration via a highly sensitive shutter effect.One of the limitations of this type of device is that as the gratings move from a totally transparent to a totally opaque position the relative sensitivity of the sensor changes as can be seen from Figure 14. For optimum sensitivity the gratings should be in the half open half closed position. Increasing sensitivity means finer and finer grating spacings which in turn limit dynamic range.Position of GratingFigure 14. Dynamic range limitations of the grating based sensor of Figure 13 are due to smaller grating spacing increasing sensitivity at the expense of range.To increase sensitivity without limiting dynamic range, use multiple part gratings that are offset by 90 degrees as shown in Figure 15. If two outputs are spaced in this manner the resulting outputs are in quadrature as shown in Figure 16.Figure 15. Dual grating mask with regions 90 degrees out of phase to support quadrature detection which allows grating based sensors to track through multiple lines.When one output is at optimal sensitivity the other is at its lowest sensitivity and vice versa. By using both outputs for tracking, one can scan through multiple grating lines enhancing dynamic range and avoiding signal fade out associated with positions of minimal sensitivity.Figure 16. Diagram illustrating quadrature detection method that allows one area of maximum sensitivity while the other reaches a minimum and vice versa, allowing uniform sensitivity over a wide dynamic range.Intensity based fiber optic sensors have a series of limitations imposed by variable losses in the system that are not related to the environmental effect to be measured. Potential error sources include variable losses due to connectors and splices, microbending loss,macrobending loss, and mechanical creep and misalignment of light sources and detectors.To circumvent these problems many of the successful higher performance intensity based fiber sensors employ dual wavelengths. One of the wavelengths is used to calibrate out all of the errors due to undesired intensity variations by bypassing the sensing region. An alternative approach is to use fiber optic sensors that are inherently resistant to errors induced by intensity variations. In the next section a series of spectrally based fiber sensors that have this characteristic are discussed.Spectrally Based Fiber Optic SensorsSpectrally based fiber optic sensors depend on a light beam being modulated in wavelength by an environmental effect. Examples of these types of fiber sensors include those based on blackbody radiation, absorption, fluorescence, etalons and dispersive gratings.One of the simplest of these types of sensors is the blackbody sensor of Figure 17. A blackbody cavity is placed at the end of an optical fiber. When the cavity rises intemperature it starts to glow and act as a light source.Narrow Band FilterDetectorFigure 17. Blackbody fiber optic sensors allow the measurement of temperature at a hot spot and are most effective at temperatures of higher than 300 degrees C.Detectors in combination with narrow band filters are then used to determine the profile of the blackbody curve and in turn the temperature as in Figure 18. This type of sensor has been successfully commercialized and has been used to measure temperature to within a few degrees C under intense RF fields. The performance and accuracy of this sensor is better at higher temperatures and falls off at temperatures on the order of 200 degrees C because of low signal to noise ratios. Care must be taken to insure that the hottest spot is the blackbody cavity and not on the optical fiber lead itself as this can corrupt the integrity of the signal.51015Wavelength (microns)0.20.40.6S p e c t r a l R a d i a n t E m i t t a n c e (W c m -2m i c r o n -1)Figure 18. Blackbody radiation curves provide unique signatures for each temperature.Another type of spectrally based temperature sensor is shown in Figure 19 and is based on absorption [22]. In this case a Gallium Arsenide (GaAs) sensor probe is used in combination with a broadband light source and input/output optical fibers. The absorption profile of the probe is temperature dependent and may be used to determine temperature.Figure 19. Fiber optic sensor based on variable absorption of materials such as GaAs allow the measurement of temperature and pressure.Fluorescent based fiber sensors [23-24] are being widely used for medical applications,chemical sensing and can also be used for physical parameter measurements such as temperature, viscosity and humidity. There are a number of configurations for these sensors and Figure 20 illustrates two of the most common ones. In the case of the end tip sensor, light propagates down the fiber to a probe of fluorescent material. The resultant fluorescent signal is captured by the same fiber and directed back to an output demodulator. The light sources can be pulsed and probes have been made that depend onthe time rate of decay of the light pulse.GaAsSensorProbeFigure 20. Fluorescent fiber optic sensor probe configurations can be used to support the measurement of physical parameters as well as the presence or absence of chemical species. These probes may be configured to be single ended or multipoint by using side etch techniques and attaching the fluorescent material to the fiber.In the continuous mode, parameters such as viscosity, water vapor content and degree of cure in carbon fiber reinforced epoxy and thermoplastic composite materials can be monitored.An alternative is to use the evanescent properties of the fiber and etch regions of the cladding away and refill them with fluorescent material. By sending a light pulse down the fiber and looking at the resulting fluorescence, a series of sensing regions may be time division multiplexed.It is also possible to introduce fluorescent dopants into the optical fiber itself. This approach would cause the entire optically activated fiber to fluoresce. By using time division multiplexing, various regions of the fiber could be used to make a distributed measurement along the fiber length.In many cases users of fiber sensors would like to have the fiber optic analog of conventional electronic sensors. An example is the electrical strain gauge that is used widely by structural engineers. Fiber grating sensors [25-28] can be configured to have gauge lengths from 1 mm to approximately 1 cm, with sensitivity comparable to conventional strain gauges.This sensor is fabricated by "writing" a fiber grating onto the core of a Germanium doped optical fiber. This can be done in a number of ways. One method, which is illustrated by Figure 21, uses two short wavelength laser beams that are angled to form an interference pattern through the side of the optical fiber. The interference pattern consists of bright and dark bands that represent local changes in the index of refraction in the core region of the fiber. Exposure time for making these gratings varies from minutes to hours, depending on the dopant concentration in the fiber, the wavelengths used, the optical power level and the imaging optics.FiberFigure 21. Fabrication of a fiber grating sensor can be accomplished by imaging to short wavelength laser beams through the side of the optical fiber to form an interference pattern. The bright and dark fringes which are imaged on the core of the optical fiber induce an index of refraction variation resulting in a grating along the fiber core.Other methods that have been used include the use of phase masks, and interference patterns induced by short high-energy laser pulses. The short duration pulses have the potential to be used to write fiber gratings into the fiber as it is being drawn.Substantial efforts are being made by laboratories around the world to improve the manufacturability of fiber gratings as they have the potential to be used to support optical communication as well as sensing technology.Once the fiber grating has been fabricated the next major issue is how to extract information. When used as a strain sensor the fiber grating is typically attached to, or embedded in, a structure. As the fiber grating is expanded or compressed, the grating period expands or contracts, changing the gratings spectral response.For a grating operating at 1300 nm the change in wavelength is about 10-3 nm per microstrain. This type of resolution requires the use of spectral demodulation techniques that are much better than those associated with conventional spectrometers. Several demodulation methods have been suggested using fiber gratings, etalons and interferometers [29-30]. Figure 22 illustrates a system that uses a reference fiber grating. The action of the reference fiber grating is to act as a modulator filter. By using similar gratings for the reference and signal gratings and adjusting the reference grating to line up with the active grating, an accurate closed loop demodulation system may be implemented.Light SourceModulated Reference Fiber GratingFigure 22. Fiber grating demodulation systems require very high resolution spectral measurements. One way to accomplish this is to beat the spectrum of light reflected by the fiber grating against the light transmission characteristics of a reference grating.An alternative demodulation system would use fiber etalons such as those shown in Figure 23. One fiber can be mounted on a piezoelectric and the other moved relative to a second fiber end. The spacing of the fiber ends as well as their reflectivity in turn determines theFigure 23. Intrinsic fiber etalons are formed by in line reflective mirrors that can be embedded into the optical fiber. Extrinsic fiber etalons are formed by two mirrored fiber ends in a capillary tube. A fiber etalon based spectral filter or demodulator is formed by two reflective fiber ends that have a variable spacing.T r a n s m i s sio n 1.00.0Figure 24. Diagram illustrating the transmission characteristics of a fiber etalon as a function of finesse,which increases with mirror reflectivity.The fiber etalons in Figure 23 can also be used as sensors [31-33] for measuring strain as the distance between mirrors in the fiber determines their transmission characteristics. The mirrors can be fabricated directly into the fiber by cleaving the fiber, coating the end with titanium dioxide, and then resplicing. An alternative approach is to cleave the fiber ends and insert them into a capillary tube with an air gap. Both of these approaches are being investigated for applications where multiple, in line fiber sensors are required.For many applications a single point sensor is adequate. In these situations an etalon can be fabricated independently and attached to the end of the fiber. Figure 25 shows a series of etalons that have been configured to measure pressure, temperature and refractive index respectively.In the case of pressure the diaphragm has been designed to deflect. Pressure ranges of 15 to 2000 psi can be accommodated by changing the diaphragm thickness with accuracy of about 0.1 percent full scale [34]. For temperature the etalon has been formed by silicon/silicon dioxide interfaces. Temperature ranges of 70 to 500 degree K can be selected and for a range of about 100 degree K a resolution of about 0.1 degree K is achievable [34]. For refractive index of liquids a hole has been formed to allow the flow of the liquid to be measured without the diaphragm deflecting. These devices have been commercialized and are sold with instrument packages [34].Interferometeric Fiber Optic SensorsOne of the areas of greatest interest has been in the development of high performance interferometeric fiber optic sensors. Substantial efforts have been undertaken on Sagnac interferometers, ring resonators, Mach-Zehnder and Michelson interferometers as well as dual mode, polarimetric, grating and etalon based interferometers. In this section, the Sagnac, Mach-Zehnder, and Michelson interferometers are briefly reviewed.The Sagnac InterferometerThe Sagnac interferometer has been principally used to measure rotation [35-38] and is a replacement for ring laser gyros and mechanical gyros. It may also be employed to measure time varying effects such as acoustics, vibration and slowly varying phenomenon such as strain. By using multiple interferometer configurations it is possible to employ the Sagnac interferometer as a distributed sensor capable of measuring the amplitude and location of a disturbance.The single most important application of fiber optic sensors in terms of commercial value is the fiber optic gyro. It was recognized very early that the fiber optic gyro offered the prospect of an all solid-state inertial sensor with no moving parts, unprecedented reliability, and had the prospect of being very low cost.The potential of the fiber optic gyro is being realized as several manufacturers worldwide are producing them in large quantities to support automobile navigation systems, pointing and tracking of satellite antennas, inertial measurement systems for commuter aircraft and missiles, and as the backup guidance system for the Boeing 777. They are also being baselined for such future programs as the Commanche helicopter and are being developed to support long duration space flights.Other applications where fiber optic gyros are being used include mining operations, tunneling, attitude control for a radio controlled helicopter, cleaning robots, antenna pointing and tracking, and guidance for unmanned trucks and carriers.Two types of fiber optic gyros are being developed. The first type is an open loop fiber optic gyro with a dynamic range on the order of 1000 to 5000 (dynamic range is unitless), with scale factor accuracy of about 0.5 percent (this accuracy number includes non-linearity and hysterisis effects) and sensitivities that vary from less than 0.01 deg/hr to 100 deg/hr and higher [38]. These fiber gyros are generally used for low cost applications where dynamic range and linearity are not the crucial issues. The second type is the closed loop fiber optic gyro that may have a dynamic range of 106 and scale factor linearity of 10 ppm or better [38]. These types of fiber optic gyros are primarily targeted at medium to high accuracy navigation applications that have high turning rates and require high linearity and large dynamic ranges.The basic open loop fiber optic gyro is illustrated by Figure 26. A broadband light source such as a light emitting diode is used to couple light into an input/output fiber coupler. The input light beam passes through a polarizer that is used to insure the reciprocity of the counterpropagating light beams through the fiber coil. The second central coupler splits the two light beams into the fiber optic coil where they pass through a modulator that is used to generate a time varying output signal indicative of rotation. The modulator is offset from the center of the coil to impress a relative phase difference between the counterpropagating light beams. After passing through the fiber coil the two light beams recombine and pass back though the polarizer and are directed onto the output detector.LightFiber OpticCoilFigure 26. Open loop fiber optic gyro is the simplest and lowest cost rotation sensor. They are widely used in commercial applications where their dynamic range and linearity limitations are not constraining. When the fiber gyro is rotated in a clockwise direction the entire coil is displaced slightly increasing the time it takes light to traverse the fiber optic coil. (Remember that the speed of light is invariant with respect to the frame of reference, thus coil rotation increases path length when viewed from outside the fiber.) Thus the clockwise propagating light beam has to go through a slightly longer optical pathlength than the counterclockwise beam which is moving in a direction opposite to the motion of the fiber coil. The net phase difference between the two beams is proportional to the rotation rate.By including a phase modulator loop offset from the fiber coil a time difference in the arrival of the two light beams is introduced, and an optimized demodulation signal can be realized. This is shown on the right side in Figure 27. In the absence of the loop the two。
光纤环和 Y 波导调制器直接耦合偏振轴测量说明书
第35卷第11期2015年11月Vol.35,No.11November,2015光学学报ACTA OPTICA SINICA光纤环和Y波导调制器直接耦合偏振轴测量甄洪旭杨德伟姚天龙宋凝芳北京航空航天大学仪器科学与光电工程学院,北京100191摘要提出一种保偏光纤环和Y波导调制器直接耦合偏振轴测量方法。
设计并搭建了偏振轴在线检测系统,通过将检测光路插入到直接耦合工艺过程中,使空间中平行的Y波导和光纤组件端面同时清晰成像于CCD像面;通过图像处理判断两端面边缘相互平行关系获取两者偏振轴的角度偏差。
实验结果表明,搭建的系统用于Y波导和保偏光纤偏振轴对准时,系统实测值与理论值能较好地吻合,且系统测量精度在1°之内,对应于偏振轴角度误差产生的尾纤输出串音优于-35dB,证明了方法的可行性。
关键词集成光学;偏振轴对准;在线测量;端面成像中图分类号TN252文献标识码Adoi:10.3788/AOS201535.1112004Polarization Axis Measurement in Direct Coupling of Y Waveguide Modulator to the Polarization-Maintaining Fiber CoilZhen Hongxu Yang Dewei Yao Tianlong Song NingfangSchool of Instrument Science and Opto-Electronics Engineering,Beijing University ofAeronautics and Astronautics,Beijing100191,ChinaAbstract A measuring method for the alignment of polarization axis in direct coupling of Y waveguide modulator to the polarization maintaining fiber(PMF)coil is presented.For precisely measuring the polarization axis,an on-line measurement system including an optical path and an image processing unit is designed and accomplished.End-view image of the two paralleled component-Y waveguide and fiber component will be imaged to CCD target surface by inserting the detected path into the direct-coupled process.The process system is used to judge the parallel relationship between the two end edges in the captured image and acquire angle deviation of polarization axis.The waveguide-PMF alignment experimental result shows that the measured data fit the calculated line well.And the measurement error is less than1°,which means that the polarization crosstalk of the coil pigtail is better than-35dB caused by the angular error of polarization axis.It is confirmed that the accuracy of the end-view measurement method is feasible for alignment of polarization axis indirect coupling of Y waveguide modulator to the PMF coil.Key words integrated optics;alignment of polarization axis;online measurement;end-viewOCIS codes130.3120;060.2370;060.28001引言保偏光纤(PMF)环和Y波导的直接耦合是为了满足高精度光纤陀螺的发展需求而提出的,相对于现有光路方案,省去了Y波导和保偏光纤环之间的两个熔接点,使波导输出通道中的偏振交叉耦合得以减弱,有利于提高系统的检测精度和可靠性[1-2]。
圆极化与线计划的设置
圆极化与线计划的设置英文回答:Circular polarization and linear polarization are two different ways of setting up the polarization of electromagnetic waves.Circular polarization refers to the polarization state in which the electric field vector rotates in a circular pattern as the wave propagates. It can be further divided into two types: right-handed circular polarization andleft-handed circular polarization. In right-handed circular polarization, the electric field vector rotates in a clockwise direction as viewed from the source of the wave, while in left-handed circular polarization, it rotates in a counterclockwise direction.Linear polarization, on the other hand, refers to the polarization state in which the electric field vector oscillates in a straight line as the wave propagates. Itcan be vertically polarized, horizontally polarized, or at any angle in between.The choice between circular polarization and linear polarization depends on the specific application and requirements. Circular polarization is often used in applications where the wave needs to maintain its polarization state regardless of the orientation of the receiving antenna. This can be useful in satellite communications, where the orientation of the satellite and the receiving antenna on the ground can vary. Circular polarization can also help mitigate the effects of multipath interference.Linear polarization, on the other hand, is commonly used in applications where the polarization needs to be aligned with a specific direction. For example, most television and radio antennas are designed to receive horizontally polarized waves, so the transmitted signals are also horizontally polarized. Linear polarization is also used in many wireless communication systems.To set up circular polarization, one can use a combination of two orthogonal linearly polarized waves with a phase difference of 90 degrees. This can be achieved using a device called a quarter-wave plate. The quarter-wave plate converts linearly polarized light intocircularly polarized light by introducing a phasedifference between the two orthogonal components.To set up linear polarization, one can use a polarizer, which is a device that allows only waves with a specific polarization direction to pass through. A common example of a polarizer is a polarizing filter used in sunglasses or camera lenses. By adjusting the orientation of the polarizer, one can select the desired linear polarization direction.中文回答:圆极化和线极化是设置电磁波偏振的两种不同方式。
变压器试验类型的分类英语
1、下图为一蒸汽加热器的温度控制系统。
冷物料经换热器与蒸汽换热后流出,通过改变进后,分析入换热器的蒸汽量来保持热物料出口温度为某设定值。
当冷物料流量突然增大Q该系统如何实现自动控制?试画出该系统的方框图。
凝液由蒸汽加热器、温度变送器TT 22、温度控制器TC 22、蒸汽流量控制阀组成。
控制的目标是保持流体出口温度T恒定。
当进料流量RF或者温度Ti变化,会引起物料出口温度变化,通过温度变送器TT 22 测得温度的变化,并将信号Tm送至温度控制器TC 22,与给定值Tsp 比较,温度控制器TC 22根据偏差将控制命令u送至控制阀,改变蒸汽量RV来维持温度的恒定。
2、下图所示为一液位控制系统,试指出该系统中的(1)被控变量、(2)操纵变量、(3)主要扰动、(4)输入信号、(5)输出信号各是什么,并画出该系统的方框图。
被控变量:液位h 操纵变量: Qo 主要扰动: Qi 输入变量:h sp输出变量:h(t)3、某一被控过程为若采用PI 控制器对该被控过程进行控制,试采用Zirgler-Nichols 方法确定控制器参数。
假设继电器幅度为2d =± ,基于该继电器的反馈系统输入输出响应如下图所示,系统在微量外部扰动的作用下,进入等幅振荡状态解:由振荡曲线可知:2d =±,振幅0.3a =,周期11min u T =,因而对应的临界控制增益4428.53.140.3u d K a π⨯==≈⨯ PI 控制器参数为()()()20.55121sp G s e s s -=++0.4 3.4c u K K =⨯=0.89mini u T T =⨯=4、某一热交换控制系统如下图所示,考虑到控制系统在断电断气情况下的安全性,蒸汽阀应为气开阀还是气关阀?试分析为使控制回路成为“负反馈”系统,TC22 应为反作用控制器还是正作用控制器?答:蒸汽阀应为气开阀。
假设控制器TC 22为正作用(当被控变量的测量值增大时,控制器的输出也增大)。
磁化率的测量实验步骤
磁化率的测量实验步骤1.将标样莫尔盐及其他固体样品在相应研钵中研细,各样品粉末粗细尽量均匀,装在小广口瓶中备用,注意盖上瓶盖以防样品风化。
(注:步骤1不必每组同学都做,可使用上周同学回收的样品。
只有当发现样品严重风化时,经实验教员允许,方可取用新样品重新研磨。
)2.在打开磁天平电源前确定已将励磁电流调回0 A。
称量天平悬丝空重后,将擦拭干净的空样品管挂在磁天平悬钩上,调节极缝使样品管与两磁极距离相等,并调节样品管上吊线(铜丝或牙线)长度,使样品管的底部恰好处在极缝中心高度处,若中心高度不好判断,则可使样品底部略高于极缝中心高度。
注意样品底部不可低于极缝中心高度,否则将影响称量值的精度。
先在励磁电流为0 A时称重,然后调节变压器,分别在励磁电流为3 A和4 A的磁场下称重。
将励磁电流调至4.5 A并停留一定时间(至少1分钟),将励磁电流调小,再依次在4 A,3 A和0 A下称重,注意回到0 A后天平示数是否随时间有所变化。
3.将莫尔盐粉末小心装入样品管中至5cm高,将样品管挂在磁天平的悬钩上,在励磁电流分别为0 A,3 A和4 A下测定其质量,并记录此时的室温。
将励磁电流调至4.5 A并停留一定时间,再将电流调小,依次在4 A,3 A和0 A下称重,注意回到0 A后天平示数是否随时间有所变化。
将样品管倒空,按同样方法装样至6 cm,重新测量。
4.倒出样品管中的莫尔盐,将样品管里外用脱脂棉擦净,依次小心装入CuSO4•5H2O及K4Fe(CN)6•3H2O粉末,注意保持样品与莫尔盐标样在粉末粗细程度、装填高度及填充密实度的一致,按步骤3中的程序进行称量。
5.同法测量未知样品,建议在每个高度平行测定2次(倒出并重新装样,可同时测定装填重复性,估计装填误差),结果取平均值以增加可信性。
处理未知样品数据,将计算出的未知样品的比磁化率(5cm平均值、6cm平均值)报给实验教员,若结果不在应处范围内,则依据具体情况,或者重新称量,或者重新处理数据。
金的等离子共振等综述
a b s t r a c t
This review describes the fundamental aspects of laser–gold nanoparticle (Au NP) interaction that leads to nanoscale energy deposition to the surroundings through light amplification and heat generation. Besides the importance of the primary process in physics and chemistry, application of the light–NP interaction has attracted significant interest from various areas ranging from analytical chemistry to material chemistry and biomedicine. Here we consider both mechanistic and application aspects. Our attention is focused on pulsed-laser-induced fast processes that revealed the heating–cooling dynamics of electrons, lattice (particle), and particle’s environment. On the application side, we focus on material fabrication and processing that beat diffraction-limited resolution. Together, we will shed a light on the essence of research activities carried out in the past 10 years. In addition to an abundance of latest information obtained from currently available literature, this review includes figures obtained by our own calculations to provide readers with a better understanding of the basics of the optical properties and energy and heat-transfer processes of Au NPs, which are not familiar to photochemists. © 2012 Elsevier B.V. All rights reserved.
极化曲线英文缩写
极化曲线英文缩写The abbreviation of Polarization Curve is PC. The polarization curve is a plot of the voltage (or potential) versus the current density for an electrochemical cell. It is a fundamental tool for understanding the behavior of electrochemical systems, and it provides important information about the kinetics and mechanisms of electrochemical reactions.The polarization curve is typically obtained by measuring the current density as a function of the applied voltage, while the cell is operating under steady-state conditions. The resulting curve can be divided into three regions: the activation region, the ohmic region, and the concentration region.In the activation region, the current density increases rapidly with increasing voltage, due to the activation overpotential associated with the electrochemical reaction. This region provides information about the rate at which the electrochemical reaction takes place, and it is often used to determine the exchange current density and the Tafel slope.The ohmic region of the polarization curve is characterized by a linear relationship between the current density and the voltage, and it is related to the resistance of the electrolyte and the electrodes. By analyzing this region, it is possible to determine the ohmic resistance of the electrochemical cell, as well as the conductivity of the electrolyte.The concentration region of the polarization curve occurs at high current densities, where mass transport limitations begin to affect the electrochemical reaction. In this region, the current density becomes independent of the voltage, and it is governed by the diffusion of reactants to the electrode surface. The concentration region provides valuable information about the mass transport properties of the electrochemical system, and it can be used to determine the diffusion coefficient of the reactants.Overall, the polarization curve is a powerful tool for characterizing the behavior of electrochemical systems. By analyzing the different regions of the curve, it is possible to gain insights into the kinetics, mechanisms, and transport properties of electrochemicalreactions. This information is crucial for the design and optimization of electrochemical devices and processes, such as fuel cells, batteries, and corrosion protection systems.In conclusion, the polarization curve is an essential tool for understanding the behavior of electrochemical systems. Its ability to provide detailed information about the kinetics, mechanisms, and transport properties of electrochemical reactions makes it invaluable for researchers and engineers working in the field of electrochemistry. By carefully analyzing the polarization curve, it is possible to gain a deeper understanding of electrochemical processes and to develop more efficient and reliable electrochemical technologies.。
圆极化与线计划的设置
圆极化与线计划的设置The debate between circular polarization and linear polarization is a common topic in the field of electromagnetic wave theory. Circular polarization involves the propagation of electromagnetic waves in a rotating manner, while linear polarization involves waves oscillating in a single plane. The choice between the two depends on the specific requirements of the application.在电磁波理论领域,圆极化和线极化之间的辩论是一个常见的话题。
圆极化涉及电磁波以旋转方式传播,而线极化涉及波在一个平面内振荡。
选择两者之间的取决于具体应用的要求。
Circular polarization offers some advantages over linear polarization in certain situations. For example, circularly polarized waves are more tolerant to multipath interference, making them a preferred choice for satellite communications where signals may undergo reflection and scattering. Additionally, circular polarization allows for better penetration through obstacles such as foliage, making it suitable for applications in forested areas.在某些情况下,圆极化在某些情况下比线极化具有一些优势。
后向散射系数英文
后向散射系数英文Backscattering CoefficientBackscattering is a fundamental concept in the field of remote sensing and is a crucial parameter in the analysis of various electromagnetic phenomena. The backscattering coefficient is a measure of the amount of energy that is scattered back to the sensor or receiver from a target or surface. This coefficient is widely used in a variety of applications, including Earth observation, weather monitoring, and target detection.The backscattering coefficient is a dimensionless quantity that is typically expressed in decibels (dB) or as a linear ratio. It is a function of several factors, including the characteristics of the incident electromagnetic wave, the properties of the target or surface, and the geometry of the observation. The backscattering coefficient is influenced by factors such as the wavelength of the incident radiation, the polarization of the wave, the incidence angle, and the surface roughness or dielectric properties of the target.In the context of remote sensing, the backscattering coefficient is commonly used to characterize the reflective properties of varioussurfaces and objects on the Earth's surface. For example, in the field of agriculture, the backscattering coefficient can be used to monitor crop growth, soil moisture, and even the presence of vegetation. In the field of oceanography, the backscattering coefficient can be used to study ocean waves, sea ice, and even the presence of oil spills.The measurement of the backscattering coefficient is typically performed using specialized instruments, such as radar systems or lidar (light detection and ranging) systems. These systems transmit an electromagnetic signal and measure the amount of energy that is scattered back from the target or surface. The backscattering coefficient can then be calculated from the received signal and the known characteristics of the transmitted signal.One of the key applications of the backscattering coefficient is in the field of target detection and identification. By analyzing the backscattering characteristics of a target, it is possible to determine its size, shape, and even its material composition. This information can be used in a variety of applications, such as military surveillance, border security, and even environmental monitoring.Another important application of the backscattering coefficient is in the field of atmospheric remote sensing. By measuring the backscattering from particles in the atmosphere, such as dust, aerosols, or clouds, it is possible to obtain information about thecomposition and distribution of these particles. This information can be used to study a variety of atmospheric phenomena, such as weather patterns, air quality, and climate change.In addition to its use in remote sensing, the backscattering coefficient is also important in the field of radar system design and analysis. By understanding the backscattering characteristics of targets and surfaces, radar engineers can design more effective and efficient systems for a variety of applications, such as air traffic control, weather monitoring, and military surveillance.Overall, the backscattering coefficient is a fundamental parameter in the field of remote sensing and has a wide range of applications in various fields, from Earth observation to target detection and atmospheric monitoring. As the field of remote sensing continues to evolve, the importance of understanding and accurately measuring the backscattering coefficient will only continue to grow.。
圆极化天线在远场条件下的测试方法(1)
lent83630A、定向耦合器Agilent87300C和被测天 线组成。由于考虑到测试的方便性,将被测天线放 置在可以三轴灵活运动的转台上,以测试天线的方 向性图和增益。接收子系统由接收天线、参考电缆、 频率变换器和接收机Agilent8530A组成。测试场 的辅助源天线一般希望有特定的极化、较宽的频 带、适当的增益和波瓣宽度等。南航微波暗室采用 的源天线都是NSI公司生产的标准增益天线,分 为5个波段,频段范围为l~26.5 GHz。位置控制 系统由wH23F三自由度测试转台和转台控制软 件组成,两者相互独立,也可由计算机控制联动。记 录系统主要有系统软件包NSl2000组成。NSl2000 的数据处理软件包可实时对测量数据进行分析,获 得天线远场辐射特性信息,如方向性图、增益值等, 然后将表格或图形显示在屏幕上或打印输出。
万方数据
对该天线在测试系统中进行多次测量,测量不 同频率的天线方向性图和增益,所得结果均与仿真 结果相符,具有较高的重复性(具体的测量结果由于
66
南京航空航天大学学报
第41卷
篇幅所限就不在这里给出)。测试结果表明,该测量 方法是一种实际有效的圆极化天线远场测试方法。
5 结束语
圆极化天线的精确测量较为困难,本文结合南 京航空航天大学远场天线自动测试系统的特点,在 已知天线极化方式为圆极化的前提下,设计了一种 利用线极化天线来测量圆极化天线方向性图和增 益的方法。通过在微波暗室内的实际测试,证明该 方法简单、有效,能够满足目前科研和生产对圆极 化天线测试的需要,具有一定的应用价值。
(3)
在最简单的位置2=0处观察,式(3)变成
E(0,f)=E1sin(叫)P,+E2sin(叫+艿)P,(4) 对于圆极化波来说,E。=E:=E。,且艿=±
- 1、下载文档前请自行甄别文档内容的完整性,平台不提供额外的编辑、内容补充、找答案等附加服务。
- 2、"仅部分预览"的文档,不可在线预览部分如存在完整性等问题,可反馈申请退款(可完整预览的文档不适用该条件!)。
- 3、如文档侵犯您的权益,请联系客服反馈,我们会尽快为您处理(人工客服工作时间:9:00-18:30)。
a r X i v :h e p -e x /0212001v 1 29 N o v 2002Measuring the linear polarization of γs in 20-170GeV rangeG.Unel,6,∗A.Apyan,1R.O.Avakian,1B.Badelek,2S.Ballestrero,3C.Biino,4,5I.Birol,6P.Cenci,7S.H.Connell,8S.Eichblatt,6T.Fonseca,6A.Freund,9B.Gorini,5R.Groess,8K.Ispirian,1T.Ketel,10Yu.V.Kononets,11A.Lopez,12A.Mangiarotti,3U.Uggerhoj,14A.Perego,3B.van Rens,10J.P.F.Sellschop,8,†M.Shieh,6P.Sona,3V.Strakhovenko,13E.Uggerhoj,14,‡M.Velasco,6,‡Z.Z.Vilakazi,8and U.Wessley 2(The NA59Collaboration)1Institute of Physics,Yerevan,Armenia2Uppsala University,Uppsala,Sweden3INFN and University of Firenze,Firenze,Italy 4INFN and University of Torino,Torino,Italy5CERN,Geneva,Switzerland6Northwestern University,Chicago,USA7INFN,Perugia,Italy8Schonland Research Centre,Johannesburg,South Africa9ESRF,Grenoble,France10NIKHEF,Amsterdam,Netherlands11Kurchatov Institute,Moscow,Russia12University of Santiago de Compostela,Santiago de Compostela,Spain13Institute of Nuclear Physics,Novosibirsk,Russia14Institute for Storage Ring Facilities,University of Aarhus,DenmarkThe Na59collaboration aims to measure the linear polarization of its photon beam in the 20-170GeV range,using an aligned thin crystal.The tracks of e −/e +pairs created in two different crystal targets,germanium and diamond,are reconstructed to obtain the photon ing the polarization dependence of the pair production cross section in an aligned crystal,photon polarization is obtained to be 55%at the vicinity of 70GeV.I.INTRODUCTIONThe pair conversion in a thin crystal was proposed in the 1960s as a polarization measurement method for γs in the few-GeV range [1].The fact that both the pair production cross section and the sensitivity to γpolarization increase with increasing γenergy makes this method superior to others,such as the pair production and photonuclear methods,for present and future γbeamlines.The Na59collaboration utilized it to map the polarization of its γbeam.A convenient way of creating a γbeam with a predictable linear polarization spectrum is using the Coherent Bremsstrahlung (CB)[3]radiation from unpolarized electrons.If the electron beam interacts coherently with the atoms in different planes in the crystal,thus satisfying the Laue condition,bremsstrahlung photons emerge with peaked energy values corresponding to selected vectors of the reciprocal lattice.The energy and intensity of these peaks are tunable by carefully aligning the lattice planes with respect to the beam.In CB,the maximum of the polarization degree coincides with the maximum of the intensity peak and polarizations up to 70%have already been observed [4]for 6GeV electrons,and up to 60%for higher energies [5].E γ(GeV)L i n e a r P o l a r i z a t i o n %Apyan Prediction0102030405060020406080100120140160180FIG.1:Expected γpolarization 0204060020406080100120140160180A n a l y z i n g P o w e r %DiamondDiamond, y cut0.35<y <0.652040020406080100120140160180E γ (GeV)GeGe, y cut0.3<y <0.7FIG.2:A for different targets (y ≡E e /E γ)The Na59collaboration used 1.5cm thick Si single crystal with the electron beam making an angle of 5m rad from the <001>crystallographic axis and about 70µrad from the (110)plane.This choice yields a γbeam with a maximum polarization of about 55%in the vicinity of 70GeV,as can be seen from Figure 1.This Monte Carlo calculation took into account the divergence (48µrad horizontally and 33µrad vertically)of the electron beam as well as its energy uncertainty of 1%.The notation used is Stoke’s polarization decomposition with Landau convention:P linear =η22P total =another of η1to show that it was consistent with zero.The method for these two measurements is based on the birefringence properties of the crystals.Since the imaginary part of the refraction index is proportional to the pair production probability,we defined σ (σ⊥)as the pair production cross section when the selected crystallographic plane on the analyzer was parallel (perpendicular)to the photon polarization.The experimentally relevant quantity is the asymmetry between these two cross sections and it gives the γpolarization,P ,througha ≡σ −σ⊥a=a 2(N +N ⊥).(3)II.EXPERIMENTAL SETUP AND ANALYSISFIG.3:Experimental setupThe schematic view of the Na59experimental setup is given in Figure 3.A tertiary 180GeV electron beam from CERN SPS was sent onto the radiator crystal aligned with a goniometer of 2µrad precision.Three upstream tracking chambers defined the entrance and exit angles of the electron beam.The scattered electron beam is deflected toward the beam dump with a dipolemagnet,and passed through a tracking chamber to measure its remaining energy.Theγbeam is assumed to follow the direction of the incoming electrons impinged on the crystal target called the analyzer.The momenta of the pairs produced in the analyzer crystal are measured with a magnetic spectrometer consisting of a dipole magnet,two drift chambers(dch)downstream and one drift chamber upstream of it for the Ge target.For the case of the multi-tile synthetic diamond target [8],a second dch(dch05)was added right after it to improve the tracking.The dch tracked charged particles with a resolution of100µm.The total radiated energy was recorded with a12segment leadglass calorimeter with a resolution ofσE.In the offline analysis,after applying beam quality cuts,the e−beam trajectory was found and the impact point on both radiator and analyzer crystals were determined forfiducial volume requirements.To reconstruct the photon energy in the pair spectrometer,an optimizing algorithm compensating for chamber inefficiencies and limited geometrical acceptances was employed[9].The vertex reconstruction on the diamond analyzer allowed veto of the inter-tile events as well as the ones coming from a misaligned tile[8].III.RESULTS AND CONCLUSIONSTo measure a polarization component,the asymmetry in Equation2was experimentally con-structed by taking data at two perpendicular analyzer crystal angular orientations.After the mapping of both crystals was done,the data recording time for each pair of angles was two hours at the Na59e−rate of20KHz.To minimize the systematics,two measurements were performed with the analyzer180degrees apart.The measurement shown in Figure4ensures that there is no“false”asymmetry introduced due to analyzer crystal angular setting.The zero asymmetry in Figure5shows that all linear polarization was inη3direction as expected.Figures6and7show the measured asymmetries with and without the y cut for different analyzer crystals.The asymmetries are in good agreement with theoretical predictions in both cases.In all Figures,the shaded region is the statistical error band for the increase in asymmetry(∆asy)due to quasisymmetrical pair selection and it confirms the non statistical nature of the effparing Figures6and7,we conclude that multi-tile synthetic diamond is a better choice than Ge as an analyzer,since for the sameγpolarization it yields a bigger asymmetry thus an easier measurement.These results show that Na59setup measures the polarization of high energy photons with good accuracy.This measurement capability was used in other studies[10]in Na59research program,and will be reported elsewhere.We believe the presently investigated crystal polarimetry technique is also applicable in future high energy photon beamlines as a fast monitoring tool.∆a s ya s y m m e t r y (%)E γ (GeV)FIG.5:η1measurement with Ge targetE γ (GeV)FIG.6:η3measurement with Ge target[1]G.Barbiellini et al.,Nouvo Cimento 28(1963)435.[2]G.Unel et al.,Int.J.Mod.Phys.A 16S1C,1071(2001).[3]H.Bilokon et al.,Nucl.Instrum.Meth.204,(1983)299.G.Diambrini-Palazzi,Rev.Mod.Phys.,40,(1968)611.[4]L.Criegee et al.,Phys.Rev.Lett.V16N23,(1966)1031.[5]P.J.Bussey et al.,Nucl.Instrum.Meth.V211,2-3,(1983)301.[6]N.Cabibbo et al.,Phys.Rev.Lett.V9N10,(1962)435.[7] A.B.Apyan et al.,Nucl.Instrum.Meth.B V173,(2001)149.[8]M.Velasco,Proceedings of Luderitz2000,World scientific,(2000)269.[9]Na59Collaboration,in preparation.[10]Na59Collaboration,in preparation.。