6N140A资料

Hermetically Sealed, Low Current High Gain Optocoupler
Reliability Data Sheet
Description
The reliability data shown includes Agilent reliability test data from the past three years on this product family. All of these products use the same LEDs, the same logic gate ICs, the same DSCC approved packaging materials, processes, stress conditions and testing.
The data in Tables 1 and 2 reflect actual test data on dual channel devices. The single channel HCPL-5701 data in Table 3 is inferred from the demonstrated life test data using the factor (1.5) found in the “Photodiode Detector Isolator” section of MIL-HDBK-217, combined with any single channel data obtained. This data
Definition of Failure
Inability to switch, i.e., “functional failure”, is the definition of failure in this data sheet. Specifically,failure occurs when the device fails to switch ON with 2 times the minimum recommended drive current (but not exceeding the max. rating) or fails to switch OFF when there is no input current.Failure Rate Projections
The demonstrated point mean time to failure (MTTF) is measured at the absolute
maximum stress condition. The failure rate projections in Tables 2
and 3 use the Arrhenius
acceleration relationship, where a 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217.
Applications Information
The data of Tables 1, 2, and 3 were obtained on MIL-PRF-38534screened devices with high temperature operating life duration up to 5000 hours. An exponential (random) failure
distribution is assumed, expressed in units of FIT (failures per billion
is taken from testing on Agilent Technologies devices using internal Agilent processes,material specifications, design standards, and statistical process controls. THEY ARE NOT TRANSFERABLE TO OTHER MANUFACTURERS’ SIMILAR PART TYPES.
device hours) are only defined in the random failure portion of the reliability curve.
For valid system reliability calculations, it is necessary to adjust for the time when the system is not in operation.Note that if you are using MIL-HDBK-217 for predicting
component reliability, the results may not be comparable to those given in Tables 2 and 3 due to the different conditions and factors
Operating Life Test
Table 1. Demonstrated Operating Life Test Performance, 6N140A/883B
Demonstrated Demonstrated Stress Test Total Devices Total Device Number of MTTF (hr)@FITs @
Condition Tested Hours Failed Units T A = +125°C T A = +125°C I f = 5 mA 474
1,762,000
2
881,000
1135
I out = 10 mA V CC = 18 V T A = +125°C T j = +140°C
Agilent
8302401EX, 5962-9800201KEX 6N140A/883B, HCPL-177K
5962-8978501PX, 5962-8978503KPX HCPL-5731, HCPL-573K
5962-8981001PX, 5962-8981002KPX HCPL-5701, HCPL-570K
5962-89785022A, 5962-8978504K2A HCPL-6731, HCPL-673K
8302401FC, 5962-9800201KFC HCPL-6751, HCPL-675K
Data subject to change.
Copyright © 2000 Agilent Technologies, Inc.Obsoletes 5967-6009E 5968-9396E (2/00)
Environmental Testing
All high reliability hermetic
optocouplers listed meet the 100%screening and quality
conformance inspection testing of MIL-PRF-38534, class H or class K as applicable.
Table 4. ESDS Classification per Method 3015, MIL-STD-883that have been accounted for in MIL-HDBK-217. For example, it is unlikely that your application will exercise all available channels at
full rated power with the LED(s)always ON as Agilent testing does.Thus, your application total power and duty cycle must be carefully
considered when comparing Tables 2 and 3 to predictions using MIL-HDBK-217.
Electrostatic Discharge Sensitivity
Part Number
ESD Class 5962-9800201KEX, HCPL-177K 38302401EX, 6N140A/883B 35962-8978503KPX, HCPL-573K 35962-8978501PX, HCPL-573135962-8981002KPX, HCPL-570K 25962-8981001PX, HCPL-570125962-8978504K2A, HCPL-673K 25962-89785022A, HCPL-673125962-9800201KFC, HCPL-675K 38302401FC, HCPL-6751
3
Table 3. Reliability Projections for Single Channel Devices Listed in Title Typical (60% Confidence)90% Confidence Ambient
Junction
MTTF FITs MTTF FITs Temperature (°C)Temperature (°C)(hr/fail)(fail/109hr)(hr/fail)(fail/109hr))125140851,0001,175499,0002,005120135986,0001,014578,0001,7291101251,339,000747786,0001,2711001151,846,0005421,086,000920901052,588,0003861,527,00065580953,697,0002702,186,00045870855,387,0001863,192,00031360758,022,0001254,765,000210506512,229,000827,283,000137405519,128,0005211,423,00088304530,773,0003218,431,0005425
40
39,480,000
25
23,682,000
42
Table 2. Reliability Projections for Dual Channel Devices Listed in Title Typical (60% Confidence)90% Confidence Ambient
Junction
MTTF FITs MTTF FITs Temperature (°C)Temperature (°C)(hr/fail)(fail/109hr)(hr/fail)(fail/109hr))125140568,0001,762333,0003,007120135658,0001,521386,0002,539110125892,0001,120524,0001,9071001151,230,000813724,0001,381901051,726,0005801,018,00098280952,465,0004061,457,00068670853,592,0002782,128,00047060755,348,0001873,177,00031550658,153,0001234,855,000206405512,752,000787,615,000131304520,516,0004912,287,0008125
40
26,320,000
38
15,788,000
63。