DEFECT PIXEL DETECTION APPARATUS AND METHOD FOR DE
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专利名称：DEFECT PIXEL DETECTION APPARATUS AND
METHOD FOR DETECTING DEFECT PIXEL
发明人：Shigeru Ichikawa
申请号：US12544691
申请日：20090820
公开号：US20100053383A1
公开日：
20100304
专利内容由知识产权出版社提供
专利附图：
摘要：A defect pixel detection apparatus includes an image sensor which includes an effective pixel configured to have a photoelectric conversion element and an output unit configured to output a pixel signal generated by the photoelectric conversion element, a
first reference pixel configured to have the same pixel configuration as the effective pixel and be optically shielded, and a second reference pixel configured to have a pixel configuration different from that of the effective pixel, a defect level acquiring unit configured to acquire a defect level of a target pixel in the image sensor, and a defect pixel determination unit configured to determine whether the target pixel is a defect pixel by comparing a defect level of the target pixel with a defect detection threshold according to a type of the pixel.
申请人：Shigeru Ichikawa
地址：Kawasaki-shi JP
国籍：JP
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