X-RAY-SPECTRUM ANALYZING CRYSTAL
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专利名称：X-RAY-SPECTRUM ANALYZING CRYSTAL 发明人：HORIUCHI SHUNSUKE,TAKAYAMA SEIJI 申请号：JP3488984
申请日：19840224
公开号：JPH0536760B2
公开日：
19930531
专利内容由知识产权出版社提供
摘要：PURPOSE:To remove restriction on a sample to be analyzed, by elongating a film comprising a macromolecular organic material in the thickness less than 1mum, attaching the film on the surface of a crystal, bonding the edges of the film to the side surfaces of the crystal with a bonding agent, thereby shielding the surface of the crystal from an atmosphere. CONSTITUTION:A film 2 of polypropylene, which can be readily elongated in a film state having a thickness of less than 1mum, is attracted to the surface of a crystal 1 by utilizing the charging property. Then both edges of the film 2 are bent to the side surfaces of the crystal 1 and bonded thereto by a bonding agent 3. Thus the surface of the crystal is protected from an atmosphere with almost no reduction in intensity of X rays, and the restriction on the material to be analyzed can be eased.
申请人：SHIMADZU CORP
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