EIA-364-99-1999
EIA-364-1000_01A
ANSI/EIA-364-1000.01AEIASTANDARDTS-1000.01AE NVIRONMENTAL TEST METHODOLOGY FOR ASSESSING THE PERFORMANCE OF ELECTRICAL CONNECTORS AND SOCKETS USED IN CONTROLLED ENVIRONMENT APPLICATIONSEIA/ECA-364-1000.01A(Revision of EIA-364-1000.01)APRIL 2006THE ELECTRONIC COMPONENTS SECTOR OF THE ELECTRONIC INDUSTRIES ALLIANCENOTICEEIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically or internationally.Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication.This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC document can be made.This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use.(From Standards Proposal No. 5038 formulated under the cognizance of the CE-2.0 National Connector Standards Committee.Published by©ELECTRONIC INDUSTRIES ALLIANCE 2006Technology Strategy & Standards Department2500 Wilson BoulevardArlington, VA 22201PRICE: Please refer to the currentCatalog of EIA Electronic Industries Alliance Standards andEngineering Publicationsor call Global Engineering Documents, USA and Canada (1-800-854-7179)International (303-397-7956)All rights reservedPrinted in U.S.A.中国可靠性网 PLEASE !DON'T VIOLATETHELAW!This document is copyrighted by the EIA and may not be reproduced without permission.Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact:Global Engineering Documents15 Inverness Way EastEnglewood, CO 80112-5704 or callUSA and Canada (1-800-854-7179), International (303-397-7956)iCONTENTSClause Page (1)1 Introduction (1)1.1 Scope2 Test specimen (1) (1)2.1 Condition2.2 Sample (2)size (2)3 Testgroups4 Details to be specified (11) (11)documentation5 TestTable1 Test Group 1 (required for all connectors or sockets) (3)2 Test Group 2 (required for all connectors and sockets) (4)3 Test Group 3 (required for all connectors or sockets) (5)4 Test Group 4 (required for connectors or sockets with a precious metal platingon the contacts) (6)5 Test Group 5 (required for connectors or sockets with a tin-based platingon the contacts and optional for connectors or sockets with < 0.38 micronsof gold plating on the contacts) (8)6 Test Group 6 (required for connectors or sockets with a surface treatmenton the contacts or for connectors or sockets with a wipe length of0.127 mm or less) (9)7 Test Group 7 (required for connectors or sockets rated for> 50 mating/unmating cycles) (10)8 Test durations (hours) for temperature life (13)9 Test durations (hours) for temperature life (preconditioning) (14)ii中国可靠性网 CONTENTS (continued)Annex Page................................................................................................................. A-1 A Normative................................................................................................................ B-1 B Informativeiii中国可靠性网 EIA-364-1000.01APage 1TEST SEQUENCE No. 1000.01AENVIRONMENTAL TEST METHODOLOGY FOR ASSESSINGTHE PERFORMANCE OF ELECTRICAL CONNECTORS AND SOCKETSUSED IN CONTROLLED ENVIRONMENT APPLICATIONS(From EIA Standards Proposal No. 5038, formulated under the cognizance of EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-364-1000.01.)1 Introduction1.1 ScopeThis standard establishes the test procedures and test sequences to be followed when evaluating the performance of electrical connectors and sockets used in controlled environments. 1) Furthermore, it applies to contacts operating under low level circuit conditions. 2)The assumption is made that the contacts are metal. Polymer contacts, or other contact types, may require a different test methodology.2 Test specimen2.1 ConditionConnectors or sockets to be tested may be prototype parts to assess their design, or production parts to evaluate against an end user’s criteria. In either case, preparation of them for testing should consider board carrier or cable assembly processes. When access to a production or prototype soldering process to attach test specimens to a board carrier is not available, chemical and temperature exposure may be simulated by the procedures of EIA-364-11 (Resistance to Solvents Test Procedure for Electrical Connectors); and EIA-364-56, procedure 3 test condition E for a wave solder process, procedure 4 for a vapor phase reflow process, or procedure 5 level #3 for an infrared reflow process (Resistance to Soldering Heat Test Procedure for Electrical Connectors). When pressing test specimens to a board carrier or when terminating test specimens to a cable, appropriate tools should be used.1) Controlled environments are classified as no more severe than class number G1.2, according to the latest revision of EIA-364 (Electrical Connector/Socket Test Procedures Including Environmental Classifications).2) The applied voltage, generally < 50 millivolts, is not sufficient to break through any surface film. For contacts not operating under low level circuit conditions, such as those used in power applications; see the latest revision of EIA-364-70 (Test Procedure for Current vs. Temperature Rise of Electrical Connectors).EIA-364-1000.01APage 2NOTE ⎯Board carrier assembly operations are typically setup to attach all solderable components before press-fit connectors. Even so, the connectors may still besubjected to manual or automated soldering conditions during componentrework. This circumstance should be considered by the test engineer whenpreparing test specimens.2.2 Sample size2.2.1 For the test sequences in each of the test groups of clause 3, at least 100 separable contact interfaces from at least 5 connector or socket systems (plug/receptacle) should be evaluated. For low contact counts, at least 10 connector or socket systems should be tested. If Option #1A and Option #1B of test group 4 are chosen, then twice this sample size for that test sequence is required. If the connector or socket contains contacts that differ in the design of the critical area, then the sample size requirement should be applied to each design and the test results should be distinguishable.2.2.2 When a failure rate is desired, a significantly larger sample size for the test sequence in test group 4 should be tested. The user may require a larger sample size for other test groups, as well. The increase is dictated by the method of calculation chosen by the user.3 Test groupsFor an understanding of the objective of each test contained in the test groups; see annex B.中国可靠性网 EIA-364-1000.01APage 3 Table 1 - Test Group 1 (required for all connectors or sockets)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Temperature life EIA-364-17, method A (see table 8for durations and temperatures)Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by userEIA-364-1000.01APage 4Table 2 - Test Group 2 (required for all connectors and sockets)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Thermal shock EIA-364-32, test condition I(10 cycles with the exception ofexposure times. Place athermocouple in the center of thelargest mass component of theconnector or socket that is in thecenter of the test chamber to insurethat the contacts reach thetemperature extremes beforeramping to the other temperature. )Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Cyclic temperature &humidity EIA-364-31 (Cycle the connector orsocket between 25 °C ± 3 °C at80 % ± 3% RH and 65 °C ± 3 °C at50 % ± 3% RH. Ramp times shouldbe 0.5 hour and dwell times shouldbe 1.0 hour. Dwell times start whenthe temperature and humidity havestabilized within the specifiedlevels. Perform 24 such cycles.)Mated None6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user7 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage8 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user中国可靠性网 Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Temperaturelife(preconditioning) EIA-364-17, method A (see table 9for durations and temperatures)Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Vibration EIA-364-28, test condition VII, testcondition letter D (15 minutes ineach of 3 mutually perpendiculardirections. Both mating halvesshould be rigidly fixed so as not tocontribute to the relative motion ofone contact against another. Themethod of fixturing should bedetailed in the test report.) Mated No evidence of physicaldamage6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by usera precious metal plating on the contacts)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Temperaturelife(preconditioning) EIA-364-17, method A (see table 9for durations and temperatures)Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Mixed flowing gas EIA-364-65, class IIA (5 days tosimulate a 3-year field life; 7 days tosimulate a 5-year field life; or 14days to simulate a 10-year field life)See note None6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user7 Thermal disturbance Cycle the connector or socketbetween 15 °C ± 3 °C and 85 °C ±3 °C, as measured on the part.Ramps should be a minimum of 2°C per minute, and dwell timesshould insure that the contacts reachthe temperature extremes (aminimum of 5 minutes). Humidityis not controlled. Perform 10 suchcycles.Mated None8 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by usera precious metal plating on the contacts) (continued)Test Order Test Test procedure Condition oftest specimensTest criteria9 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage10 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by userNOTE ⎯ For 1-piece connectors or sockets: 1) expose unmated for 2/3 of the test duration; 2) mate each connector or socket to the same part that it was mated to during temperature life (preconditioning); and 3) expose for the remainder of the test duration. For 2-piece connectors, select either Options #1A and #1B or select Option #2.⎯Option #1A (plugs): 1) expose 1/2 of the specimens unmated for 2/3 of the test duration; 2) mate each specimen to the same receptacle that it was mated to during temperature life (preconditioning); and, 3) expose for the remainder of the test duration.⎯Option #1B (receptacles): 1) expose 1/2 of the specimens unmated for 2/3 of the test duration; 2) mate each specimen to the same plug that it was mated to during temperature life (preconditioning); and, 3) expose for the remainder of the test duration.⎯Option #2: 1) expose all plugs and receptacles unmated for 2/3 of the test duration; 2) mate each piece to the same piece that it was mated to during temperature life (preconditioning); and, 3) expose for the remainder of the test duration.Table 5 - Test Group 5 (required for connectors or sockets with a tin-based plating on the contacts and optional for connectors or sockets with< 0.38 microns of gold plating on the contacts)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Temperaturelife(preconditioning) EIA-364-17, method A (see table 9for durations and temperatures)Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Thermal cycling Cycle the connector or socketbetween 15 °C ± 3°C. and 85 °C ±3 °C, as measured on the part.Ramps should be a minimum of2 °C per minute, and dwell timesshould insure that the contacts reachthe temperature extremes (aminimum of 5 minutes). Humidityis not controlled. Perform 500 suchcycles.Mated None6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user7 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage8 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by userTable 6 - Test Group 6 (required for connectors or sockets with a surface treatment on the contacts or for connectors or sockets with a wipe length of 0.127 mm or less)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Dust EIA-364-91 (benign dustcomposition)Unmated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user (see note)5 Thermal disturbance Cycle the connector or socketbetween 15 °C ± 3 °C and 85 °C ±3 °C , as measured on the part.Ramps should be a minimum of20C./minute, and dwell times shouldinsure that the contacts reach thetemperature extremes (a minimumof 5 minutes). Humidity is notcontrolled. Perform 10 such cycles.Mated None6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user (see note)7 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage8 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user (see note)NOTE ⎯ Failure to meet the criteria does not necessarily disqualify the connector or socket. Rather, it may indicate the need for protection against particulate contamination, such as that afforded by a dust cover. For a connector or socket with a surface treatment on the contacts, a comparison of the test results to those obtained for the same connector or socket without a surface treatment on the contacts should be made. Only then can the impact of the surface treatment be determined.Table 7 - Test Group 7 (required for connectors or sockets rated for> 50 mating/unmating cycles)Test Order Test Test procedure Condition of test specimensTest criteria 1 Dielectric withstanding voltage EIA-364-20 (voltage level, ac or dc,and the orientation of the connectoror socket should be defined in thedetails of the test report)Mated No disruptive discharge No leakage current in excess of the maximum specified by user 2 Low level contact resistance EIA-364-23 (Termination of theconnector or socket to the boardcarrier or cable shall be included in the measurements. The orientation of the connector or socket should be defined in the details of the test report.)Mated None (base line measurements) 3 Durability EIA-364-09 (Perform the ratednumber of unplug/plug cycles.Retention features, such as latches, should not be deactivated. The orientation of the connector or socket should be defined in the details of the test report.)No evidence of physical damage 4 Low level contact resistance EIA-364-23 (Termination of theconnector or socket to the boardcarrier or cable shall be included inthe measurements. The orientation of the connector or socket should be defined in the details of the test report.)Mated Change in measurements evaluated against criteria specified by user 5 Dielectric withstanding voltage EIA-364-20 (voltage level, ac or dc,and the orientation of the connectoror socket should be defined in thedetails of the test report)Mated No disruptive discharge No leakage current in excess of the maximum specified by user NOTES1 Separate sets of test specimens may be used to assess dielectric withstanding voltage and the change in low level contactresistance.2 Dielectric withstanding voltage testing should involve different contacts than low level contact resistance testing.4 Details to be specifiedThe following details shall be specified in the referencing document:4.1 Rated number of durability cycles4.2 Temperature and duration for temperature life test; see table 84.3 Temperature and duration for temperature life (preconditioning) test; see table 94.4 Option used for test group 4 (see note at the bottom of table 4) and the duration of exposure to mixed flowing gas4.5 Connector or socket to be tested (supplier part number and family name)4.6 Contact plating types and thicknesses (with measurement location and technique to be used) 4.7 Plastic material(s) (generic type, color, and glass and/or mineral content)4.8 Contact alloy (CA number or other industry material designation)4.9 Surface treatment (lubricant or other, if any)NOTE ⎯If present, do not remove during preparation of test specimens.4.10 Pass/Fail criteria (if any)4.11 Any information that differs from that described in this standard.5 Test documentationDocumentation shall contain the following. Some items may be provided by the connector or socket supplier. Others may be determined by the testing laboratory.5.1 Description of test specimen(s)5.1.1 Supplier part number(s)5.1.2 Supplier family name5.1.3 Applicable industry standards5.1.4 Contact count and spacing5.1.5 Number of rows of contacts5.1.6 Plastic material (generic type, color, and glass and/or mineral content)5.1.7 Contact alloy (CA number or other industry material designation)5.1.8 Contact plating types5.1.9 Test specimen plating thicknesses, including statistical summary of the measurements 5.1.10 Surface treatment, if any5.1.10.1 Supplier name and/or generic description5.1.10.2 How and when applied to contacts5.1.11 For card edge connectors, thickness and bevel of mating card5.1.12 Photographs (optional)5.2 Preparation of test specimens5.2.1 Description of board carrier attachment method5.2.1.1 Chemical (flux, solvent, rinse, etc.) and temperature exposure5.2.1.2 Application tools used5.2.2 Description of cable/wire termination method5.2.2.1 Application tools used5.2.2.2 Cable/wire size5.2.2.3 Cable/wire type5.2.2.3.1 Plating5.2.2.3.2 Number of strands5.3 Test equipment used, and date of last and next calibration5.4 Test procedures used5.4.1 Deviation(s) to those specified, if any, including explanation(s)5.5 Schematic diagram of the circuit used to measure low level contact resistance5.6 Test results5.6.1 Mean, minimum, and maximum change in low level contact resistance, and the standard deviation of the changes, as calculated at each interval of measurement in each of the test groups5.6.2 Plots of the change in low level contact resistance (y-axis) versus cumulative % of the readings less than that change (x-axis) for each interval of measurement in each of the test groups (if requested)5.6.3 Tabulated data of the change in low level contact resistance of each circuit that includes a separable contact interface, as calculated at each interval of measurement in each of the test groups (if requested)5.6.4 Photographs (optional)5.7 A discussion of the test results5.8 Name of operator and date of testsTable 8 - Test durations (hours) for temperature lifeField temperatureTest temperatureand field life 90 °C 105 °C 115 °C57 °C for 3 years 192 24 857 °C for 5 years 288 48 1257 °C for 10 years 552 72 2460 °C for 3 years 288 48 1260 °C for 5 years 456 72 2460 °C for 10 years 840 120 4865 °C for 3 years 600 96 2465 °C for 5 years 960 120 4865 °C for 10 years 1,848 240 7285 °C for 3 years 4,176 528 14485 °C for 5 years 6,912 840 24085 °C for 10 years 13,680 1,584 432 NOTES1 Test durations pertaining to field temperatures of 57 °C, 60 °C, and 65 °C. are based on theassumption that the contact spends its entire field life at that temperature, whereas those associated with a field temperature of 85 °C are based on the assumption that the contact spends 1/3 of its field life at that temperature.2 The materials used in the construction of the connector or socket and in the components ofthe test vehicle (e.g., printed circuit cards, wiring, etc.) should be considered when selectinga test temperature.。
EIA-364_List
环境 环境
EIA-364-82 EIA-364-91 EIA-364-89
A A A
Corrosivity of Plastics Dust Space Application
塑料腐蚀性 灰尘
A B 1988 A A 1989 1990 1998 1996 1996 1997 1997 1997 1999 1997 1997 R2006 C B E R2006 01 A A B 2006 B B B B B C F B B B A 1993 B D 1987 A A C 1997 2002 A
Rev. E C 2003 D D C A 1990 1983 A A A 1989 B 1999 1996 1995 2000 R2006 1999 2000 2000 2000 2000 B A B B B C A E A 1988 B A D C F C B C C B E B
简称 Abbr. Introduction EIA-364规范介绍 CR 接触电阻 Loop inductance 电感(回路) DWV 耐电压 IR 绝缘电阻 LLCR 接触电阻 Capacitance 电容 Inductance 电感 Ice Resistance 低温阻抗 Magnetic 磁导率 Current 电流 EMI 电磁屏蔽 Inductance 微电感 Temp. Rise vs Current 温升与电流 Shell and Bulkhead Resistance Nanosecond Event Detection Residual Magnetism Attenuation 衰减 Rise time 爬升时间 Propagation Delay 传播延迟 SWR 驻波比 Eye and Jitter 眼图和抖动 Impedance, RL, VSWR 阻抗,反射损耗,电压驻波比 Crosstalk 串音 Acceleration 加速度 Normal Force 正向力 插拔力 Contact axial concentricity 接触轴心度 Crimp tensile strength 拉力 Durability 耐久 Restricted entry 束口 Mating and Unmating Force 匹配 Contact Strength 接触强度 Stripping force 抗剥离力 Visual 文文字 外观尺寸 Torsional insert retention 扭转插入保持力 Probe Damage 探针损伤 Mechanical Shock 机械冲击 Vibration 振动 Contact retention 接触保持力 Insert Retention 插入保持 Contact Engagement and Sparation Force Cable pull-out 电缆拔拉 Crush 挤压 Flexing 摇摆 Impact 摔落冲击
连接器可靠性测试项目介绍
连接器可靠性测试项目介绍连接器是将一个回路上的两个导体桥接起来，使得电流或者讯号可以从一个导体流向另一个导体的导体设备。
连接器形式和结构是千变万化的，随着应用对象、频率、功率、应用环境等不同，有各种不同形式的连接器。
连接器做可靠性测试项目有插拔力测试、耐久性测试、绝缘电阻测试、振动测试、机械冲击测试、冷热冲击测试、混合气体腐蚀测试等。
连接器可靠性测试方法：1、插拔力测试参考标准：EIA-364-13目的：验证连接器的插拔力是否符合产品规格要求；原理：将连接器按规定速率进行完全插合或拔出，记录相应的力值。
2、耐久性测试参考标准：EIA-364-09目的：评估反复插拔对连接器的影响，模拟实际使用中连接器的插拔状况。
原理：按照规定速率连续插拔连接器直至达到规定次数。
3、绝缘电阻测试参考标准：EIA-364-21目的：验证连接器的绝缘性能是否符合电路设计的要求或经受高温，潮湿等环境应力时，其阻值是否符合有关技术条件的规定。
原理：在连接器的绝缘部分施加电压，从而使绝缘部分的表面或内部产生漏电流而呈现出来的电阻值。
4、耐电压测试参考标准：EIA-364-20目的：验证连接器在额定电压下是否能安全工作，能否耐受过电位的能力，从而评定连接器绝缘材料或绝缘间隙是否合适原理：在连接器接触件与接触件之间，接触件与外壳之间施加规定电压并保持规定时间，观察样品是否有击穿或放电现象。
5、接触电阻测试参考标准：EIA-364-06/EIA-364-23目的：验证电流流经接触件的接触表面时产生的电阻值原理：通过对连接器通规定电流，测量连接器两端电压降从而得出电阻值6、振动测试：参考标准：EIA-364-28目的：验证振动对电连接器及其组件性能的影响。
振动类型：随机振动，正弦振动7、机械冲击测试参考标准：EIA-364-27目的：验证连接器及其组件耐冲击的能力或评定其结构是否牢固；测试波形：半正弦波，方波。
8、冷热冲击测试参考标准：EIA-364-32目的：评估连接器在急速的大温差变化下，对于其功能品质的影响。
[讲解]EIA-364系列标准
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EIA-364系列标准EIA-364系列标准，带目录，总共53个标准，6个压缩包EIA-CB18 固体的钽式电容器储存期限EIA-364 D 电子连接器/ 插座测试过程包括环境类别EIA-364 01B 加速度电子连接的测试过程EIA-364 02C 空气渗漏电子连接的测试过程EIA-364 03B 高度浸入电子连接的测试过程EIA-364 05B 接触插入，释放，移动迫使电子连接的测试过程EIA-364 06B 接触电阻电子连接的测试过程EIA-364 07b 与轴向的Concentricity电子连接的测试过程联系EIA-364 08B 卷曲抗拉的力量电子连接的测试过程EIA-364 09C 耐久性电子连接和接触的测试过程EIA-364 10C 流动的浸入电子连接和插座的测试过程EIA-364 11A 电阻到溶剂电子连接和插座的测试过程EIA-364 13B Mating和Unmating 力量电子连接的测试过程EIA-364 14B 臭氧暴露电子连接的测试过程EIA-364 17B 有或没有电负荷电子连接和插座的测试过程的温度生命EIA-364 20C 禁得住电压电子连接，插座和同轴的接触的测试过程EIA-364 21C 绝缘电阻电子连接，插座和同轴的接触的测试过程EIA-364 22B 类比生命电子连接的测试过程EIA-364 23B 低的水准接触电阻电子连接和插座的测试过程EIA-364 24B 维修使电子连接的测试过程变老EIA-364 25C 探查损坏电子连接的测试过程EIA-364 26B 盐水雾电子连接器，接触和插座的测试过程EIA-364 27B 机械震动(指定的脉搏)电子连接的测试过程EIA-364 28D 振动电子连接和插座的测试过程EIA-364 29B 接触保留电子连接的测试过程EIA-364 31B 湿度电子连接和插座的测试过程EIA-364 32C 热震(温度周期变化)电子连接和插座的测试过程EIA-364 35B 插入保留电子连接的测试过程EIA-364 37B 接触约会和分离力量电子连接的测试过程EIA-364 38B 电报拔电子连接的测试过程EIA-364 39B 电子连接器，接触和插座的液压静力测试过程EIA-364 40B 压坏电子连接的测试过程EIA-364 41C 电报在电子连接的测试过程屈曲EIA-364 42B 影响电子连接的测试过程EIA-364 45A 防火墙火焰电子连接的测试过程EIA-364 53B 氮的Adic 蒸汽测试，金完成电子连接和插座的测试过程EIA-364 54A 有磁性的渗透性电子连接器，接触和插座的测试过程EIA-364 56B 为了焊接热电子连接和插座的测试过程的电阻EIA-364 66A EMI 保护效力电子连接的测试过程EIA-364 71B 焊接灯芯(波焊接技术)测试过程适合电子连接器和插座EIA-364 81A 燃烧特性电子连接器住房，连接器会议和插座的测试过程EIA-364 82A 塑胶电子连接和插座住房的测试过程的CorrosivityEIA 364-83 壳牌公司轰炸和轰炸在舱壁测试过程抵抗适合电动汽车连接器EIA 364-90 串音比率电子连接，插座，电缆组件的测试过程或者相互连接系统EIA-364 91A 灰尘电子连接和插座的测试过程EIA 364-95 充分的铺席子和铺席子稳定电子连接的测试过程EIA 364-99 规格位置和保留电子连接的测试过程EIA 364-100 标明永久为电子连接和插座的测试过程EIA 364-101 Attentuation电子连接器，插座，电报会议或者相互联系系统的测试过程EIA 364-102 上升时间堕落电子连接器，插座，电报会议或者相互联系系统的测试过程EIA 364-103 传播延迟电子连接器，插座，电报会议或者相互联系系统的测试过程EIA-364 104A 可燃性电子连接的测试过程EIA 364-105 高度低温电子连接的测试过程EIA 364-106 驻波比率(SWR)电子连接的测试过程EIA 364-107 眼睛图案和在电子连接器，插座，电报会议或者相互联系系统的测试过程感到紧张EIA 364-108 阻抗，反射系数，返回损失，并且VSWR在时间和频率领土电子连接器，电报会议或者相互联系系统的测试过程测量EIA 364 1000.01 评价电子连接器的性能的环境考试方法学和插座在生意办公室应用方面使用EIA 364-109 环电感测量电子连接(1 nH 10 nH)的测试过程。
EIA-364-D中文
Qualification Procedure-Sequence
• 此建議測試順序是最低限度要求，適 用所有的等級。 • 依照不同應用，特定測試項目可自 測試順序、補充測試、及/或接合測 試項中增加或刪除。
Qualification Procedure-Sample Size
測試件應含對應端。每一特性量測的數據數量應為 測試件25%的端子量，但不應低於25筆數據。若低於 25筆數據，則所有端子必頇量測; 若還不足25筆，就 必頇提供額外的測試件。
EIA-364-D目的/範圍
針對電子連接器及插座建議基本的 (recommended minimum) 測試次序(Sequence) 及方法(Procedures) 依照預定的應用環境分級, 以便對每一分級能 作合適的評估 定義各環境分級的儀器操作狀況, 包含溫度與 溼度的最大範圍, 以及海洋氣候與嚴苛環境之 可能性
Contact resistance at rated current shall be used in those applications where the current levels are in excess of 100 milliamperes and the voltage levels are in excess of 3.0 volts. 選定電流的電阻測試(CRRC)用於 I>100mA & V>3V.
Qualification Procedure-Sequence
Visual examination shall be performed on the test specimens initially and after each environmental and stress test. Unless otherwise specified, unmating of the test specimens shall not be permitted until completion of the test sequence. The referencing document shall specify if the test specimens are to be unmated after vibration, physical shock and salt spray for visual examination. If not specified, the test samples shall remain mated.測試前後的外觀檢驗之必要性與解除互配狀態之許可. Unless otherwise specified, IR and/or DWV shall be tested between the closest spaced contacts (adjacent and/or between rows). Six contact pairs or 25% of the positions whichever is greater shall be tested per specimen. In the event that hardware and/or metal shells are used, the test shall also be performed between the metal accessories and the contacts closest to them in accordance with EIA-364-20 and/or EIA-364-21. IR與DWV之 測試點數量要求6對或25%的端子, 及端子與鐵殼/其他鐵件之測試 必要.
EIA-364-09耐插拔 实验规范
電子連接器的耐插拔測試方法公告EIA工程標准和出版物是為服務於公眾利益而制定的,它是為了消除生產者和購買者之間的誤解,促進產品的交流和提高,並幫助購買者在最短時間內挑選到他所需要的滿意的產品﹒該標準的提出會促使EIA的成員在生產和銷售產品時遵循該標準﹐而它也可以由國內外非EIA成員自愿使用。
對于推荐標准和出版物中采用的文章﹑材料﹑方法﹐EIA在選取時未考慮其專利內容,故在此過程中EIA對任何專利所有者不承擔責任﹐對任何采用該標準的機構也不承擔責任。
EIA標準根据國際標準制定﹐但是國際電工協會還沒有提出EIA標準與IEC 標準的有效的對照。
該標準的提出不是意在安全問題或适用性做硬性規定﹒標準使用者的職責是在使用前建立起一個安全健康的實踐体系和确定某些標準的适用性。
（摘自NO.2377建議標準，EIA P-5.1下屬連接器委員會形成）電子工業協會（EIA）工程部出版2001年華盛頓D.C.20006，N.W.賓西法尼亞大道。
價格：請參照時價EIA，JEDEC標準，工程出版物或者稱為全球工程文件，美國、加拿大（1-800-854-7179），國際（714-261-1455）1992年印刷版權所有,U.S.A印制電子工業協會測試方法#09B電子連接器耐插拔測試方法此EIA所推荐的標准是基于國際電子技術委員會(IEC)的技術內容;推荐512—5,測試9a,机械操作,1977.它符合此IEC推荐的所有必要方面.電子工業協會測試方法#09B電子連接器的耐插拔測試方法1.0TP—09A 耐插拔2.0目的﹕此測試程序的目的是介紹一种統一的測試方法，此方法模擬連接器的預期壽命來測試電子連接器周圍環境對插拔造成的影響﹒帶有量規的插拔只用來產生机械應力﹐而帶有裝配元件的耐力測試產生机械應力和磨損應力。
3.0儀器3.1參考文件要求的配合元件。
3.2夾片，夾鉗或其它連接器夾持工具或測試量規通過半系統測試恰當結合使用可以自由滑動（假如連接器規格說明有要求）。
EIA-364连接器专项测试标准简介
Firewall Flame Test Procedure for Electrical Connectors
EIA-364-46B
MICROSECOND DISCONTINUITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS,CONTACTS AND SOCKETS
Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets
EIA-364-35B
Insert Retention Test Procedure for Electrical Connectors
EIA-364-90
Crosstalk Ratio Test Procedures for Electrical Connectors, Sockets, Cable Assemblies or Interconnect Systems
EIA-364-91A
Dust Test Procedure for Electrical Connector and Sockets
EIA-364-56C
Resistance to Soldering Heat Test Procedure for Electrical Connectors and Sockets
EIA-364-59A
LOW TEMPERATURE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS
EIA-364-95
Full Mating and Mating Stability Test Procedures for Electrical Connectors
EIA364-09C
5
Annex
A Normative ........................................................................................................... ` A-1 A.1 Acceptance criteria ............................................................................................... A-1
2
3.1 Description ...........................................................................................................
2
3.2 Preparation ...........................................................................................................
2
4.1 Alignment .............................................................................................................
2
4.2 Cycle rate .............................................................................................................
#EIA-364-09电子连接器的耐插拔测试方法
电子连接器的耐插拔测试方法公告EIA工程标准和出版物是为服务于公众利益而制定的,它是为了消除生产者和购买者之间的误解,促进产品的交流和提高,并帮助购买者在最短时间内挑选到他所需要的满意的产品﹒该标准的提出会促使EIA的成员在生产和销售产品时遵循该标准﹐而它也可以由国内外非EIA成员自愿使用。
对于推荐标准和出版物中采用的文章﹑材料﹑方法﹐EIA在选取时未考虑其专利内容,故在此过程中EIA对任何专利所有者不承担责任﹐对任何采用该标准的机构也不承担责任。
EIA标准根据国际标准制定﹐但是国际电工协会还没有提出EIA标准与IEC 标准的有效的对照。
该标准的提出不是意在安全问题或适用性做硬性规定﹒标准使用者的职责是在使用前建立起一个安全健康的实践体系和确定某些标准的适用性。
（摘自NO.2377建议标准，EIA P-5.1下属连接器委员会形成）电子工业协会（EIA）工程部出版2001年华盛顿D.C.20006，N.W.宾西法尼亚大道。
价格：请参照时价EIA，JEDEC标准，工程出版物或者称为全球工程文件，美国、加拿大（1-800-854-7179），国际（714-261-1455）1992年印刷版权所有,U.S.A印制电子工业协会测试方法#09B电子连接器耐插拔测试方法此EIA所推荐的标准是基于国际电子技术委员会(IEC)的技术内容;推荐512—5,测试9a,机械操作,1977.它符合此IEC推荐的所有必要方面.电子工业协会测试方法#09B电子连接器的耐插拔测试方法1.0TP—09A 耐插拔2.0目的﹕此测试程序的目的是介绍一种统一的测试方法，此方法模拟连接器的预期寿命来测试电子连接器周围环境对插拔造成的影响﹒带有量规的插拔只用来产生机械应力﹐而带有装配组件的耐力测试产生机械应力和磨损应力。
3.0仪器3.1参考文件要求的配合组件。
3.2夹片，夹钳或其它连接器夹持工具或测试量规通过半系统测试恰当结合使用可以自由滑动（假如连接器规格说明有要求）。
EIA-364-C规范介绍
3.溫濕度循環試驗目的：連接器在高溫高濕環境下﹐所產生的反應和受損程度，
與正常條件下測試結果做一比較﹐分析每一項數據﹐ 以確認它們是否在的有效范圍內。
4.蒸氣老化測試目的：是在對電子連接器或插座接點端子軟焊接性的預處理。
5. 溫度循環(熱沖擊)試驗目的:是想知道連接器在高溫及低溫衝擊下，電阻值 是多少﹖并盡可能模擬在儲藏﹑運輸及操作的實際情況
壽命效果.。
一
5〃振動試驗測試目的:在決定產品的效果﹐在各種振動及可能在使用過程中遭遇的振動壽命。 6.機械沖擊試驗測試目的：是評估電連接器承受額定機械沖擊程度能力.男中中中中
1.鹽水噴霧試驗目的：當連接器曝露在允滿鹽份的大氣中
所獲得其成分﹑表面﹑結構及電氣的變化。
2.高溫試驗目的：是想知道連接器在經過一段高溫時間后，電氣及機特性的變化。
不同﹐而有不同要求，一般錫鉛表面要求約200g的正向力﹐而 鍍金表面則在100g附近，由此正向力會衍生出與接觸阻抗及 其它參數的關系.
2.插拔力測試目的：在決定連結器在正常位置下﹐端子插入和拔出所需的力量。
3.保持力測試目的：是在連接器端子拔出時易於從其適當位置移動端子的抵抗力量﹐
4. 插拔耐久性目的：是在評估以連接器經多次配合與分離後﹐是否可達預期的
溫度壽命(高低溫試驗)
接觸電阻 分離力
低階接觸電阻
組：1
2
3
4
5
6
備注：樣品數量：第一組樣品4個(2個用于電阻另2個用于斷訊測試) 第二、五測試組2個樣品﹔第六組：依其它規定
接觸電阻與低階接觸電阻的差異：
1.低階接觸電阻測試（ＴＰ－23Ａ）﹐ 主要適用於傳輸訊號用的連接器。
2.接觸電阻測試(TP-6A)則適用於傳輸電力之連接器﹐ 所通之電流高出甚多。
EIA-364-98
EIA STANDARDEIA-364-98電子連接器Housing封密機械強度測試程序電子工業協會工程部EIA工程標準和刊物是為服務公眾利益而設計的，目的在于減少生產廠商與用戶購買者之間的誤解，促進產品的替代性與發展，幫助購買者為了自己的需求在最短時間內選擇并獲得合适的產品，EIA標準和刊物的出現，在任何方面都不會妨礙EIA成員或非成員的生產與銷售產品，即使在EIA的標準與刊物不一致，同時也不會妨礙非EIA成員自愿使用這些標準或刊物，無論國內還是國外。
EIA標準和刊物與美國國家標準委員會的專利政策一致，基于此，EIA不對任何專利持有人員負責，也不對任何組織來這種標準或刊物承擔這種義務。
EIA標準被認為與國際標準有聯系，但國際電子工業委員會在對EIA標準和IEC文件進行有效比較方面沒有取得進展。
EIA標準并沒有打算提出所有其使用的全部安全問題或全部适當的規則要求，在使用ＥＩＡ標準之前，建立适當的安全與健康措施和限定規定範圍的适用性是用戶自己的責任。
(出自NO.3812推荐標準，在國家連接器標準委員會（E-2.0的監視下形成）由電子工業協會工程部1997年出版2500 Wilson BolilevardArlinglon, V A 22201价格：請參照當前市价EIA, JEDEC,TIA STANDARDS和工程文獻目錄或稱全球工程文獻美國和加拿大（1-800-854-7179）國際(303-397-7956)所有權保留美國印制請不要違法此文獻版權歸EIA所有，不經允許，不得翻印；團體組織在獲得EIA的書面同意后，可以印製數量受限的COPICS；索取信息，請聯系；全球工業文獻15 Inverness Way Eait.Englewood, lo 80112-5704或Call美國與加拿大1-800-854-7179國際(303) 397-7956目錄條款1.介紹2.測試資源2.1設備3.測試樣品4.測試步驟4.1準備4.2安裝4.3所施力量4.4數據記錄5.詳細規定6.測試文件1.介紹此規格描述了一個測試程序，用來判定耦合塑膠連接器Housing密封保持性能的機械牢固強度；2.測試資源：2.1設備設備應包括如下內容：2.1.1夾子、鉗子或其他固定裝置，分別鉗夾耦合連接器Housing的一半；2.1.2能以13mm每分鍾(0.5inch每分鍾)的恆定速率分開固持設備的力量機械；2.1.3測量軸向力正確率誤差在＋２％以內的記錄器或記錄規；3.測試樣品按具體說明中的規定，選擇合尺寸的連接器；4.測試步驟4.1準備無端子連接器Housing應被耦合，反折應恰當完好地安裝；4.2安裝耦合的連接器Housing應擱置于力量機械的合适固定物中，一固定物應被固定，相對的固定裝置保持自己狀態（或自成一直線），來保證所施力量是設軸向的；4.3施用力量施力機械應能產生一個恆定速率為13mm每分鍾(0.5inch每分鍾)的軸向力，來分离Housing的兩部分；4.4記錄數據最大力量和目測內容應被記錄；5.詳細規定：下列明細應在具體說明是有所規定；5.1測試Housing的數量與尺寸；5.2最小封密強度力量；5.3所采用的環境條件及測試結果；5.4標準氣壓條件之外的其他氣壓條件；5.5施力速率（如果不同于4.3規定的施力速度）；5.6特殊固定設備（如果使用了）；6.測試文件文件應包含下列內容：6.1測試標題；6.2樣品和固定物描述；6.3所用測試設備；6.4數值與觀測；6.5環境氣溫和溫度；6.6操作者姓名與測試日期。
eia-364系列标准（EIA-364seriesstandard）
eia-364系列标准（EIA-364 series standard）EIA-364 series standard, with directory, a total of 53 standards, 6 compression packagesEIA-CB18 solid tantalum capacitor storage periodThe EIA-364 D electronic connector / socket test process includes environmental categoriesTest procedure of EIA-364 01B acceleration electronic connectionTest procedure for EIA-364 02C air leakage electronic connectionsTest procedure for highly immersed electronic connections of EIA-364 03BEIA-364, 05B contact, insertion, release, movement, forcing, electronic connection, testing processTest procedure for electronic connection of EIA-364 06B contact resistanceThe connection process between the EIA-364 07B and the axial Concentricity electronic connectionTest procedure for EIA-364 08B Crimp Tensile Force electronic connectionsEIA-364 09C durability test procedures for electronicconnections and contactsEIA-364 10C flow test procedures for immersed electronic connections and socketsEIA-364 11A resistance to solvent electronic connections and sockets test processTest procedures for EIA-364, 13B, Mating, and Unmating power electronic connectionsTest procedure for EIA-364 14B ozone exposure electronic connectionsEIA-364 17B has or has no electrical load, electronic connections, and sockets for testing the temperature lifeEIA-364 20C withstand voltage, electronic connections, sockets, and coaxial contact test proceduresEIA-364, 21C, insulation, resistance, electronic connections, sockets and coaxial contact test proceduresThe test process of EIA-364 22B analog life electronic connectionsEIA-364, 23B low level contact resistance, electronic connections and sockets test processEIA-364 24B maintenance keeps the test process of electronic connections getting olderEIA-364 25C examines the test process for damaging electronic connectionsEIA-364 26B brine mist electronic connector, contact and socket test procedureEIA-364 27B mechanical shock (designated pulse) electronic connection test procedureTest procedure for EIA-364 28D vibration electronic connections and socketsEIA-364 29B contact test procedure for retention of electronic connectionsEIA-364, 31B humidity, electronic connections and sockets test processEIA-364, 32C thermal shock (temperature cycle changes), electronic connections and sockets test processThe EIA-364 35B inserts the test process that retains the electronic connectionThe test process for EIA-364 37B engagement, engagement and separation of forces, electronic connectionsThe test process of EIA-364 38B telegraph electronic connectionHydrostatic test procedures for EIA-364 and 39B electronicconnectors, contacts and socketsEIA-364 40B crushed electronic connection testing processEIA-364 41C telegraphy in electronic connection test procedure bucklingEIA-364 42B affects the testing process of electronic connectionsTest process of flame electronic connection of EIA-364 45A firewallEIA-364 53B nitrogen Adic vapor test, gold complete electronic connection and socket test processThe EIA-364 54A has magnetic permeability electronic connectors, contacts and sockets for the testing processEIA-364 56B in order to weld the resistance of the hot electronic connections and sockets during the test processEIA-364 66A EMI test procedures for protecting the effectiveness of electronic connectionsThe EIA-364 71B welding wick (wave soldering technology) test procedure is suitable for electronic connectors and socketsEIA-364 81A combustion characteristics, electronic connectors, housing, connector, conference and socket test processEIA-364 82A plastic electronic connections and sockets housing test process CorrosivityEIA 364-83, Shell Companies bombing and bombing in bulkhead test procedure resists resistance to electric car connectorEIA 364-90 crosstalk ratios, electronic connections, sockets, test procedures for cable assemblies, or interconnected systemsTest procedure for EIA-364, 91A dust, electronic connections and socketsEIA 364-95 adequate placement of mats and mats to stabilize electronic connections during testingTest procedure for EIA 364-99 specification position and retention of electronic connectionsEIA 364-100 indicates permanent testing procedures for electronic connections and socketsTest procedures for EIA 364-101 Attentuation electronic connectors, sockets, telegraph conferences, or interconnected systemsEIA 364-102 rise time, degradation, electronic connectors, sockets, telegraph conferences, or test procedures for Interconnected SystemsEIA 364-103 propagation delays, electronic connectors, sockets,telegraph conferences, or test procedures for Interconnected SystemsTest procedure for EIA-364 104A flammability electronic connectionsTest procedure for EIA 364-105 high temperature electronic connectionTest procedure for EIA 364-106 standing wave ratio (SWR) electronic connectionEIA 364-107 eye patterns and tension in electronic connectors, sockets, telegraph conferences, or interconnected system testingEIA 364-108 impedance, reflection coefficient, return loss, and VSWR measurements in time and frequency, territory, electronic connectors, telegraph conferences, or interconnected system testing processesEIA 3641000.01 environmental testing methods and sockets for evaluating the performance of electronic connectors are used in business office applicationsTest procedure for EIA 364-109 ring inductance measurement of electronic connections (1, nH, 10, nH)。
EIA-364-1000%20final
EIA-364-1000
(Redesignation of EIA-364-1000.01A)
OCTOBER 2008
EIA Standards Electronic Components Association
NOTICE
EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically or internationally.
ANSIEIA-364-09C-1999
3
4.5 Measurements ......................................................................................... to be specified ...........................................................................................
Clause
Page
1 Introduction ..........................................................................................................
1
1.1 Scope ...................................................................................................................
This standard is based upon the major technical content of International Electrotechnical Commission standard 512-5, test 9a, mechanical operation, 1992-08. It conforms in all essential respects to this IEC standard.
2
3.1 Description ...........................................................................................................
00-EIA-364系列标准
EIA-364系列标准EIA-CB18 固體的鉭式電容器儲存期限EIA-364-E 電子連接器/ 插座測試過程包括環境類別EIA-364-01B 加速度電子連接的測試過程EIA-364-02C 空氣滲漏電子連接的測試過程EIA-364-03B 高度浸入電子連接的測試過程EIA-364-05B 接觸插入，釋放，移動迫使電子連接的測試過程EIA-364-06C 接觸電阻電子連接的測試過程EIA-364-07C 與軸向的Concentricity電子連接的測試過程聯繫EIA-364-08B 捲曲抗拉的力量電子連接的測試過程EIA-364-09C 耐久性電子連接和接觸的測試過程EIA-364-10E 流動的浸入電子連接和插座的測試過程EIA-364-11B 電阻到溶劑電子連接和插座的測試過程EIA-364-13D Mating和Unmating 力量電子連接的測試過程EIA-364-14B 臭氧暴露電子連接的測試過程EIA-364-17B 有或沒有電負荷電子連接和插座的測試過程的溫度生命EIA-364-18B 接线盒和插座的外观与尺寸检查的测试流程EIA-364-20D 禁得住電壓電子連接，插座和同軸的接觸的測試過程EIA-364-21D 絕緣電阻電子連接，插座和同軸的接觸的測試過程EIA-364-22B 類比生命電子連接的測試過程EIA-364-23C 低的水準接觸電阻電子連接和插座的測試過程EIA-364-24B 維修使電子連接的測試過程變老EIA-364-25C 探查損壞電子連接的測試過程EIA-364-26B 鹽水霧電子連接器，接觸和插座的測試過程EIA-364-27B 機械震動(指定的脈搏)電子連接的測試過程EIA-364-28D 振動電子連接和插座的測試過程EIA-364-29C 接觸保留電子連接的測試過程EIA-364-31B 濕度電子連接和插座的測試過程EIA-364-32D 熱震(溫度週期變化)電子連接和插座的測試過程EIA-364-35B 插入保留電子連接的測試過程EIA-364-36B DETERMINATION OF GAS-TIGHT CHARACTERISTICS TEST PROCEDURE FOR ELECTRICAL CONNECTORS, AND OR CONTACT SYSTEMSEIA-364-37B 接觸約會和分離力量電子連接的測試過程EIA-364-38B 電報拔電子連接的測試過程EIA-364-39B 電子連接器，接觸和插座的液壓靜力測試過程EIA-364-40B 壓壞電子連接的測試過程EIA-364-41C 電報在電子連接的測試過程屈曲EIA-364-42B 影響電子連接的測試過程EIA-364-45A 防火牆火焰電子連接的測試過程EIA-364-46BEIA-364-48AEIA-364-50AEIA-364-53B 氮的Adic 蒸汽測試，金完成電子連接和插座的測試過程EIA-364-54A 有磁性的滲透性電子連接器，接觸和插座的測試過程EIA-364-56D 為了焊接熱電子連接和插座的測試過程的電阻EIA-364-66A EMI 保護效力電子連接的測試過程EIA-364-70BEIA-364-71B 焊接燈芯(波焊接技術)測試過程適合電子連接器和插座EIA-364-75EIA-364-81A 燃燒特性電子連接器住房，連接器會議和插座的測試過程EIA-364-82A 塑膠電子連接和插座住房的測試過程的Corrosivity EIA-364-83 殼牌公司轟炸和轟炸在艙壁測試過程抵抗適合電動汽車連接器EIA-364-89AEIA-364-90 串音比率電子連接，插座，電纜組件的測試過程或者相互連接系統EIA-364 91A 灰塵電子連接和插座的測試過程EIA-364-95 充分的鋪席子和鋪席子穩定電子連接的測試過程EIA-364-99 規格位置和保留電子連接的測試過程EIA-364-100 標明永久為電子連接和插座的測試過程EIA-364-101 Attentuation電子連接器，插座，電報會議或者相互聯繫系統的測試過程EIA 364-102 上升時間墮落電子連接器，插座，電報會議或者相互聯繫系統的測試過程EIA-364-103 傳播延遲電子連接器，插座，電報會議或者相互聯繫系統的測試過程EIA-364 104A 可燃性電子連接的測試過程EIA-364-105A 高度低溫電子連接的測試過程EIA-364-106 駐波比率(SWR)電子連接的測試過程EIA-364-107 眼睛圖案和在電子連接器，插座，電報會議或者相互聯繫系統的測試過程感到緊張EIA-364-108 阻抗，反射系數，返回損失，並且VSWR在時間和頻率領土電子連接器，電報會議或者相互聯繫系統的測試過程測量EIA-364 1000.01 評價電子連接器的性能的環境考試方法學和插座在生意辦公室應用方面使用EIA-364-109 環電感測量電子連接(1 nH 10 nH)的測試過程EIA-364-110。
EIA-364-29C_(2006-08-14)_Contact_Retention
3 Test specimen ............................................................................................................ 2
3.1 Description ................................................................................................................ 2 3.2 Preparation ................................................................................................................ 2
5 Details to be specified ............................................................................................... 4
6 Test documentation ................................................................................................... 5
TEST PROCEDURE No. 29C
CONTACT RETENTION TEST PROCEDURE FOR
ELECTRICAL CONNECTORS
(From EIA Standards Proposal No. 4945, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and was previously published in EIA-364-29B.)
16M连接器参考标准
16M连接器参考标准
连接器的测试标准
随着社会发展、科技进步，连接器在各领域都扮演着越来越重要的角色，为为保证其安全性、耐用性等性能，对连接器进行测试可谓是必不可少的。
德索为了保证送往客户手中的连接器都是质量过关的，性能良好的，在出厂之前我们都会对生产的连接器进行一系列测试。
但是您知道连接器的测试标准吗？下面就听听工程师为您介绍我们
平时测试连接器所参考的标准的是什么吧。
通常来说，连接器的测试标准主要包含了插拔力、绝缘电阻、耐久性、耐电压、接触电阻、振动、机械冲击7个方面，具体如下：
1.连接器插拔力测试。
参考标准： EIA-364-13
2.连接器绝缘电阻测试。
参考标准： EIA-364-21
3.连接器耐久性测试。
参考标准： EIA-364-09
4.连接器耐电压测试。
参考标准： EIA-364-20
5.连接器接触电阻测试。
参考标准： EIA-364-06/EIA-364-23
6.连接器振动测试。
参考标准： EIA-364-28
7.连接器机械冲击测试。
参考标准： EIA-364-27
但是，这里提醒您注意的是，不同的厂家根据自身实际，所参考的标准也有所不同。
例如，一些电子连接器需要在极高或极低的温度下工作，一般的参考标准在这里就不再适用。
无论参考哪种标准对
连接器进行测试，最终目的都是为了保证连接器在其工作环境中发挥作用。
以上介绍的是一般通用的连接器测试标准。