各测试参数定义
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Progress in Power Switching
High Voltage MOSFET
Power MESH II – “NC” Series Competitive standard MOSFETs Cost effective High volume production Power MESH III – “NC-Z” Series Very high voltage market ZENER Diode: added value at no costs SuperMesh - New “NK-Z” Series High volume markets (cost competitiveness) Even better Rdson* Qg and very good ruggedness MDmesh - “NM” Series High-End applications Evolving as “future” high voltage leading technology
Low Breakdown values: Low Rdson values: High current: Low Driving Gate Voltage:
12V – 1000V Till 1.5 mΩ Till 250A/160A Till 2.5V .. 1.8V
Progress in Power Switching
Development and Characterization Activities
Datasheet Reliability ..
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Main Electrical Parameters
BVdss VGS(th) Igss Idss VDSon RDSon Vsd DVSD UIS UID Breakdown Voltage Threshold Voltage Gate Source leakage Current Drain Source leakage Current Drain Source On Voltage Drain Source On Resistence Reverse Diode Voltage Delta Vsd Unclamped Inductive Switching Unclamped Inductive Discharge
MOSFET Basic Operation
VGS VTh
inversion layer
VDS > 0
S G +
ID 0
40 40
30 30
N
N+
20 20
P
ID [A]
10 10
0
0 0
10
10 VDS [V]
20
20
30
30
D
+
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Note: This parameter is a function of the resistivity and thickness of the N- Epi layer. The value is directly proportional to Junction Temperature as shown after.
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Drain-Source Breakdown Voltage [BVdss]
Drain-Source Breakdown Voltage: Measurement conditions: BVDSS [V] Vgs=0 [V], Id=250[mA] / Id=1[mA]
D
Id
Ids
Id2=1mA
BV2>BV1
G
Id1=250mA Vds
1 2
S
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Threshold Voltage [Vgs(th)]
Gate Threshold Voltage: Measurement conditions: VGS(th) [V] Vgd=0[V], Id=250[mA] / Id=1[mA]
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Low Voltage MOSFET
Technology From cell to strip (EHD technology – 1996) Strip width (2.6um EHD1 1.2um EHD2 0.6um EHD3) Cells density equivalent increase Very low gate charge (new SP3 technology)
Note: Normally we don’t measure these parameters in production. We characterize and guarantees by F/E process. Progress in Power Switching
Main MOSFET Features
MOSFET Basic Operation
1000
RON AREA [mW cm2 ]
100
10
1
0.1 10
BVDSS [ V ]
100
1000
10000
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MOSFET’s Capacitances
D
Cgd Cds G Cgs S
Ciss = CGD + CGS Coss = CDS + CGD Crss = CGD Input Capacitance Output Capacitance Miller Capacitance
P+
NN+ D
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G
C Rp
S
MOSFET Basic Operation
VGS < VTh
VDS > 0
S G +
ID = 0
40 40
30 30
20 20
ID [A]
10 10
0
0 0
10
10 VDS [V]
20
20
30
30
+
Progress in Power Switching
Vertically oriented four layer structure (n+ p n- n+) High input impedance- voltage controlled device- easy to drive Unipolar device- majority carrier device- fast switching speed Wide SOA
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Zoom on MOSFET Structure
Polysilicon Gate Oxide Metal Dielettric
NN
+
P
P+
N++
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MOS PIN individuation on the Structure
MOSFET Division
Technical Training
7th April 2005
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AGENDA
MOSFET Technical Training
MOSFET Basic Information
Main Electrical Parameters
Macropackages optimization for very low Rdson / Rth
Micropackages optimization for very low Rdson / Rth
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Main applications to focus
Production (Assy & Testing) Flow Chart
Development and Characterization Activities
Datasheet Reliability ..
Progress in Power Switching
Device Structure & Characteristics
Indicative Current Range
E = EHD1 (STripFET 1st generation) F = EHD2 (STripFET 2nd generation) H = EHD3 (STripFET 3rd generation) FS = EHD2 +Schottky Diode S = PowerMESH Medium Volt B = PowerMESH I C = PowerMESH II C…Z = PowerMESH III Channel Polarity K…Z = SuperMESH M = MDmesh N = N-Channel M…N = MDmesh II P = P-Channel DN or DP = Dual N-Ch or Dual P-Ch C = Complementray Pair
SMPS: AC to DC, PFC, Adapters Power Management (including those for electronic games)
Lighting: CFL, HF Ballast, PFC
High frequency DC to DC Converter for computer
Battery Chargers
Automotive
Progress in Power Switching
AGENDA
MOSFET Technical Training
MOSFET Basic Information
Main Electrical Parameters
Production (Assy & Testing) Flow Chart
MOSFET Basic Operation
VGS > VTh
VDS > 0
S G +
ID > 0
40 40
On state resistance RON
30 30
Increasing VG 20 20
ID [A]
10 10
0
0 0
10
10 VDS [V]
20
20
30
30
D
+
Progress in Power Switching
S
G
D
P+
NN+
G
S
D
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MOS Parassitic Elements: C, Rp
S G D
P+
NN+
G
C Rp
S
D
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MOS Parassitic Elements: JFET
D S G
P/N Nomenclature for MOSFET Devices
ST
P 70 N F 03 L
Speciaຫໍສະໝຸດ Baidu Features
Package TYPE
C = TSSOP8 T = SOT23-6L N = SOT-223 L = PowerFLAT SJ = PowerSO-8 SR= PowerSO-8 Reverse S = SO-8 D…T4 = DPAK (Tape & Reel) B…T4 = D2PAK (Tape & Reel) V = PowerSO-10 Q = TO-92 D…-1 = IPAK B…-1 = I2PAK P = TO-220 P…FP = TO-220FP F = TO-220FP for new products W = TO-247 Y = Max247 E = ISOTOP with the exception of: • 55V and 75V • TSSOP8, SOT23-6L, SO-8
S
G
D
G
P+
NN+ D
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S
MOS Parassitic Elements: Body Diode
S
G D G P+ N-
P+
NN+
S D
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MOS Parassitic Elements: BJT