INSPECTION SYSTEM AND ENDOSCOPE SYSTEM
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专利名称：INSPECTION SYSTEM AND ENDOSCOPE SYSTEM
发明人：OTSUKA Shin,大塚慎
申请号：JP2017/012256
申请日：20170327
公开号：WO2017/183392A1
公开日：
20171026
专利内容由知识产权出版社提供
专利附图：
摘要：During an inspection, an image capturing element 11 of an object to be inspected is placed in a placement unit 2a, after which a plurality of optical lenses 5a ... having different optical conditions are placed selectively in a placement unit 2b. In this
state, a plurality of types of illuminating light having different light source conditions are radiated from an inspection light source 4, black-spot characteristic values unique to the image capturing element 11 are calculated by a black-spot characteristic value calculating unit 31 on the basis of an obtained imaging signal, and unique black-spot characteristic value information is stored in a storage unit 61. In addition, said information is transferred from the storage unit 61 to an ID memory 12 of an endoscope 102 in which the image capturing element 11 is to be mounted. During use, an identification information acquiring unit 131a and a black-spot characteristic value information acquiring unit 131b in a video processor 103 acquire identification information and the black-spot characteristic value information from the ID memory 12, and a black-spot characteristic correcting unit 132a corrects the black-spot characteristics of the image capturing element 11.
申请人：OLYMPUS CORPORATION,オリンパス株式会社
地址：2951 Ishikawa-machi, Hachioji-shi, Tokyo 1928507 JP,〒1928507 東京都八王子市石川町２９５１番地 Tokyo JP
国籍：JP,JP
代理人：ITOH Susumu,伊藤進
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