IMPROVEMENTS IN OR RELATING TO SUPER-RESOLUTION MI
- 1、下载文档前请自行甄别文档内容的完整性，平台不提供额外的编辑、内容补充、找答案等附加服务。
- 2、"仅部分预览"的文档,不可在线预览部分如存在完整性等问题,可反馈申请退款(可完整预览的文档不适用该条件!)。
- 3、如文档侵犯您的权益，请联系客服反馈,我们会尽快为您处理(人工客服工作时间：9:00-18:30)。
专利名称：IMPROVEMENTS IN OR RELATING TO SUPER-RESOLUTION MICROSCOPY 发明人：HARTELL, Nicholas, Anthony
申请号：GB2014/053137
申请日：20141021
公开号：WO2015/059462A2
公开日：
20150430
专利内容由知识产权出版社提供
专利附图：
摘要：The present invention relates to a method of processing images captured following structured illumination of a sample, the method comprising the steps of: identifying emission spots within each captured image; verifying the emission spots; and
reconstructing an enhanced image of the sample from the emission spots. The method may comprise identifying only in focus emission spots. By identifying and processing only in focus spots, whether or not they are centred on expected illumination positions, improvements in resolution can be achieved compared to known SIM methods. In particular, by suitable selection of in focus spots, significant improvements in lateral and axial resolution can be achieved.
申请人：UNIVERSITY OF LEICESTER
地址：University Road Leicester LE1 7RH GB
国籍：GB
代理人：SLATTERY, David et al.
更多信息请下载全文后查看。