Pipelined Subranging ADCs
应用于流水线ADC的参考电压源及其输出缓冲器
( T he S t ate K e y L ab of AS I C an d Sy ste ms, Fud an U niv er sit y , Shang hai 201203, P . R . Chi na)
本文第二部分分析了参考电压波动对流水线结 构 ADC 整体转换性能的影响, 并通过 m at lab 系统
仿真予以验证。第三部分基于带隙基准源, 设计了 参考电压产生电路。文章第四部分分析了参考电压 的驱动方式, 及其输出缓冲放大器的设计。第五部 分给出了电路的整体仿真结果。第六部分对本文的 工作进行了总结。
收稿日期: 2006- 03- 27; 定稿日期: 2006- 06- 12 基金项目: 上海市科委 2005 年集成电路设计专项重点项目 低电压、低功耗、流水线 CM OS 高速模数转换器 ( SDC47062005)
第 6期
姜 杰等: 应用于流水线 A DC 的参考电压源及其输出缓冲器
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图 1 单级流水线结构
图 2 单级输入输出特性曲线
实际曲线偏离理想曲线有两方面的原因: 一是 子 A DC 中原来阈值电压为 1/ 4 V r 的比较器, 阈值 电压从 1/ 4 V r 变化到 1/ 4( V r + V ) ; 二是子 DA C 转换器的一个模拟输出电平由 1/ 2 V r 变化 到 1/ 2 ( V r + V) 。
MT-024:Pipelined Decimation ADCs说明书
MT-024指南ADC架构V:流水线式分级ADC作者:Walt Kester简介目前对于需要5 MSPS至10 MSPS以上采样速率的应用,流水线式分级ADC架构占优势。
尽管flash(全并行)架构(参见指南MT-020)在上世纪80年代和90年代早期主导8位视频IC ADC市场,但现代应用中流水线式架构已大面积取代Flash ADC。
也有少量采样速率高于1 GHz的高功率砷化镓(GaAs)工艺Flash转换器,但分辨率仅限于6或8位。
不过,Flash转换器仍然是较高分辨率流水线式ADC的常用构建模块。
流水线式ADC的应用包括视频、图像处理、通信和各种其他应用。
该架构有助于较低成本的IC工艺,最常见的有CMOS和BiCMOS。
目前的技术在高于100 MSPS的采样速率下可产生12至16位分辨率。
基本分级ADC架构流水线式ADC源于上世纪50年代首次使用的分级架构,该架构用于减少隧道二极管和真空管Flash ADC 中的元件数和功率(参见参考文献1、2)。
分级架构的框图如图1所示,其中显示了一个6位、二级ADC。
Array图1:6位、二级分级ADC通过第一级3位子ADC(SADC)——Flash转换器,将输入采样保持电路(SHA)的输出数字化。
接着使用3位子DAC (SDAC)将粗略3位MSB转换结果转换回至模拟信号。
SDAC输出则从SHA输出减除,经放大后施加于第二级3位SADC。
接着通过3位第二级SADC数字化“残余信号”,从而产生总共6位输出字的三个LSB。
此类型的ADC通常称为“分级”ADC,因为输入范围细分为若干个较小范围(子范围),这些较小范围又可进一步细分。
通过考察第二级ADC输入端的残余波形,可对此分级ADC执行最佳分析,如图2所示。
该波形假定整体ADC接收的是低频斜坡输入信号。
为了确保无失码,残余波形必须恰好填满第二级ADC的输入范围,如图2A的理想情况所示。
这意味着N1 SADC和N1 SDAC的精度必须均优于N1 + N2位,所示例子中,N1 = 3,N2 = 3,N1 + N2 = 6。
一种pipeline ADC低功耗设计方案
– MDAC1:反馈电容double,输出幅度减半 – MDAC2:输入范围减半,相应地量程减半,可通过与MDAC1用相同的Vref,
但令接±Vref的电容与Cf2的比值减半来实现 – 后续级电路:相当于量程减半,与MDAC2一样处理
输出幅度控制
传统3b+2.5b级电路的输 入输出关系: 1)第一级采用1b冗余位, 可将运放输出摆幅控制在 1/2量程内; 2)后续级采用0.5b冗余位, 由于输入在1/2量程内, 故运放输出也控制在1/2 量程内。
f1相时间:Tp1 ~= Tck/2‐td1 f3相时间:Tp3 ~= Tck/2‐(td2‐td1) f2相时间:Tp2 ~= Tck‐Tp1‐Tp3
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用于Pipeline ADC的参考电压和参考电流的电路系统
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pipeline-sar adc 原理 -回复
pipeline-sar adc 原理-回复Pipelines是一种在计算机科学中广泛使用的概念,旨在优化数据处理和计算任务的执行效率。
在本文中,我们将专注于pipelines在应用程序设计中的应用,特别是在ADC(模数转换器)中的原理。
首先,让我们了解一下ADC的基本原理。
ADC是一种将模拟信号转换为数字信号的电子设备。
在许多应用中,如音频和视频处理,传感器数据采集等,我们需要将连续时间的模拟信号转换为离散时间的数字信号,以便进行进一步的处理。
ADC通常由三个主要部分组成:采样和保持电路(S&H),模数转换器(ADC),数字信号处理器(DSP)。
在这些部分中,ADC是其中最核心的组件,因为它实现了模拟到数字的转换。
ADC的基本原理是通过将模拟信号离散化为一系列离散时间点的取样值,然后将这些取样值转换为相应的数字表示。
这个过程可以分为三个主要的步骤:采样,量化和编码。
采样是将模拟信号在时间上分割成多个取样点的过程。
为了保持信号的准确性,ADC使用采样和保持电路(S&H)来获取每个取样点的电压或电流值。
采样速率决定了信号从模拟到数字的转换的精度。
更高的采样速率可以提供更准确的数字表示,但同时也需要更多的计算和存储资源。
量化是将连续的模拟信号转换为离散的数字表示。
在此过程中,ADC将每个取样点的模拟信号值映射到最近的可用数字值。
量化的精度通常由ADC 的位数来决定。
例如,一个12位ADC将模拟信号映射到4096个离散的数字值。
较高的位数可以提供更精确的量化结果,但也需要更多的存储空间和计算资源。
编码是将量化后的数字值转换为二进制码表示的过程。
在这步中,ADC将量化后的数字值转换为相应的二进制码。
编码通常采用二进制补码表示,以便进行进一步的数字信号处理。
编码的格式通常取决于ADC的设计和应用。
在ADC设计中,pipelines广泛应用于提高转换速率和精度。
一个典型的ADC pipeline结构包含多个级别,每个级别都包含采样,量化和编码等子功能。
ADC分类及全参数
ADC分类∙直接转换模拟数字转换器(Direct-conversion ADC),或称Flash模拟数字转换器(Flash ADC)∙循续渐近式模拟数字转换器(Successive approximation ADC)∙跃升-比较模拟数字转换器(Ramp-compare ADC)∙威尔金森模拟数字转换器(Wilkinson ADC∙集成模拟数字转换器(Integrating ADC)∙Delta编码模拟数字转换器(Delta-encoded ADC)∙管道模拟数字转换器(Pipeline ADC)∙Sigma-Delta模拟数字转换器(Sigma-delta ADC)∙时间交织模拟数字转换器(Time-interleaved ADC)∙带有即时FM段的模拟数字转换器∙时间延伸模拟数字转换器(Time stretch analog-to-digital converter, TS-ADC1、闪速型2、逐次逼近型3、Sigma-Delta型1. 闪速ADC闪速ADC是转换速率最快的一类ADC。
闪速ADC在每个电压阶跃中使用一个比较器和一组电阻。
2. 逐次逼近ADC逐次逼近转换器采用一个比较器和计数逻辑器件完成转换。
转换的第一步是检验输入是否高于参考电压的一半,如果高于,将输出的最高有效位(MSB)置为1。
然后输入值减去输出参考电压的一半,再检验得到的结果是否大于参考电压的1/4,依此类推直至所有的输出位均置“1”或清零。
逐次逼近ADC所需的时钟周期与执行转换所需的输出位数相同。
3. Sigma-delta ADCSigma-delta ADC采用1位DAC、滤波和附加采样来实现非常精确的转换,转换精度取决于参考输入和输入时钟频率。
Sigma -delta转换器的主要优势在于其较高的分辨率。
闪速和逐次逼近ADC采用并联电阻或串联电阻,这些方法的问题在于电阻的精确度将直接影响转换结果的精确度。
尽管新式ADC采用非常精确的激光微调电阻网络,但在电阻并联中仍然不甚精确。
基于流水线ADC的高速数据采集系统设计
基于流水线ADC的高速数据采集系统设计黄峰【摘要】Pipelined Analog-to-Digital Converter(ADC)can achieves high conversion rate and medium to high resolution at very low power consumption,which is widely used in data acquisition systems in the application of radar,communication,medical image and precision control area.The basic principle and the latest development of pipelined ADC are introduced.A 14-bit 125 MSPS data acquisition system based on pipelined ADC is designed to meet the need of high-speed signal sampling.Tested results show the data acquisition system achieves spurious free dynamic range(SFDR)of 84 dB,signal-to-noise ratio(SNR)of 65dB for a 4.9MHz input at 75Msps sampling rate.%由于流水线模数转换器(ADC)能在较低的功耗条件下实现中、高精度高速数据采样功能,因而被广泛应用于雷达、通信、医学成像、精确控制等技术领域的数据采集系统。
文章介绍了流水线ADC的基本原理及其最新研究成果,并且基于流水线ADC完成了一种14位精度125Msps高速数据采集系统的设计。
高精度Pipeline ADC中的电容匹配
高精度Pipeline ADC中的电容匹配很多初学者应该都听说过:“pipeline ADC中最初几级MDAC的采样电容由热噪声决定,后续MDAC的采样电容由匹配决定。
”这句话其实是很有道理的,因为Vn^2=kT/C,热噪声受限的电容值按级间增益的平方递减;而根据工艺手册,电容值的匹配精度与近似与面积呈反比,因此匹配受限的电容值按级间增益递减。
理论上如此,但实际情况却要复杂一些……对于第一级MDAC,根据kT/C= LSB^2 / 12。
假设为Vpp=1.6V的14bit ADC,计算得到的C已经是5.2pF了。
但要注意这仅仅是考虑了采样电容。
如果要仔细的考虑之前的T&H和backend ADC的噪声,以及T&H,MDAC都有采样相和保持相两部分噪声需要相加。
其实需要的采样电容值已经在5.2pF的基础上翻了好多倍了。
事实上商用14bit ADC datasheet 上注明的输入电容一般也就在5~6pF的数量级,而SNR一般都不超过75dB。
虽然输入噪声无法满足ADC分辨率要求,但在线性度方面,学术界和业界的指标都在不断刷新。
在业界,不使用额外的辅助、校准技术,14bit 100MSPS pipeline的SFDR就可以做到大约90dB。
除了设计,这对制作工艺来说同样是一个巨大的考验。
根据smic18工艺手册,电容的匹配精度拟合式为sigma =79.2% / Area (um^2)。
Chartered18好一点,sigma =27.8% / Area。
而电容值大约都是1fF / um^2。
则对于典型的MDAC1的反馈电容Cf=500fF,以Chartered为例,sigma=0.056%,即当输入信号的量化余量在MDAC的模拟输出端重建时,它的INL以70%的概率只相当于不到11bit的一个LSB了。
Notice:既然MDAC1的重建误差只与Cf和对应的每一个Cs单元的比值有关,而与整个MDAC1对信号的增益倍数无关,那么对于确定的工艺来说,把MDAC做成更高bit数直观上可以提升整个ADC的线性度。
Pipeline ADC中高精度基准电压源的设计的开题报告
Pipeline ADC中高精度基准电压源的设计的开题报告一、选题背景及意义随着科技的不断发展,高精度ADC的需求不断增大,而ADC的高精度则与基准电压源的高精度密不可分。
为提高ADC的转换精度,设计一种高精度基准电压源是非常必要的。
二、研究内容本文主要研究Pipeline ADC中高精度基准电压源的设计,研究内容包括:1. 基准电压源的定义与分类2. 基准电压源的设计原则3. 目前常用的基准电压源设计方法及其优缺点分析4. 基于集成电路技术的高精度基准电压源设计方案及其实现方法5. 实验测试并对结果进行分析与讨论三、研究方法本文采用文献调研法、实验研究法和数据分析法,通过查阅相关文献,了解目前常用的基准电压源的设计方法及其优缺点,分析其适用范围,基于集成电路技术提出高精度基准电压源的设计方案,实验测试并分析数据,对结果进行讨论。
四、预期研究成果1. 理解基准电压源的设计原则,掌握目前常用的基准电压源设计方法。
2. 提出一种基于集成电路技术的高精度基准电压源设计方案。
3. 实验测试并对结果进行分析,对提出的高精度基准电压源设计方案进行验证。
4. 探究高精度基准电压源设计对Pipeline ADC转换精度的影响。
五、研究进度安排第一周:查阅相关文献,了解基准电压源的定义、分类和设计原则。
第二周:研究常用的基准电压源设计方法及其优缺点,并进行分析。
第三周-第六周:基于集成电路技术提出高精度基准电压源的设计方案并进行模拟仿真、验证。
第七周-第八周:开展实验,采集数据并进行分析。
第九周-第十周:对结果进行讨论,撰写论文,并进行修正。
六、参考文献[1] 刘斌, 周绍根. 高分辨率ADC测试中的基准电压源及其测试复杂度分析. 测试技术学报, 2018, 32(5):962-972.[2] 付鹏程, 张明桃, 董志国. 1.2V参考电压源的设计. 中山大学学报(自然科学版), 2018, 57(3):10-15.[3] 胡宇峰, 吕端旗, 张志勤, et al. 高精度基准电压源及其在A/D转换中的应用. 大连理工大学学报, 2017, 57(5):475-482.。
Pipeline ADC
b1 = (comp1+).(comp2+) = (comp1+) + (comp2 +) = (comp1−) + (comp2−) b2 = (comp1−).(comp2+) = (comp1−) + (comp2 +) = (comp1+) + (comp2−)
Decoder
c=(co p+ com 2+ =(co p ++(co p2+ =(co p−+(co p2− m1 ).( p ) m1 ) m ) m1) m ) b=(com1 ).(com 2+)=(com1−+(com 2+)=(com1 )+(com 2− p− p p ) p p+ p )
1.5Bit/pipelined ADC
Vout = 2Vin −Vref , d =10,Vref ≥Vi+ −Vi− ≥Vref /4+ Vout = 2Vin , d = 01,Vref /4− ≤Vi+ −Vi− < Vref /4+
Vout = 2Vin +Vref , d = 00, −Vref ≤Vi+ −Vi− <Vref /4+
• • • • • •
F Accuracy Sampling frequency :KSPS,MSPS output data rate conversion time conversion rate
1 conversion rate = (conversion time +reset time)
Optimization
ADC参考电压和电流
用于Pipeline ADC的参考电压和参考电流的电路系统美国模拟器件(上海代表处)宋浩然摘要 – 稳定、精密的参考电压和参考电流是pipeline ADC电路中必不可少的。
尤其是系统工作在高速转换的情况下,设计如此的参考系统更成为电子工程师的挑战。
本文通过系统的设计方法,详细地介绍了参考电压电流系统的设计流程。
最后,测试的结果验证了本文描述的系统的精度以及设计方法的高效性。
关键字:电源,模数转换器、参考电压、参考电流、系统设计方法I. 简介目前许多通讯系统中需要高速、高分辨率的模数转换器。
相比较其他结构的ADC,流水线结构(pipeline)的ADC具有速度和功耗的优势。
在每一级量化器和余量增益放大器都需要精密的参考电压。
尤其是在多级并带有很大电容负载的高分辨率ADC上,增加了参考电压的负载。
因此在高速、高分辨率的流水线ADC,精密的参考电压必须要有缓冲器来保证一定的精度和建立时间,对于高速系统,需要参考电压保持精度和速度的情况下对电容进行充放电,这对电路设计工程师来说是一个很大的挑战。
这也是很多高速ADC一般都采用外部的参考电压或参考电流的原因。
因此本文着重于在此工作条件下参考电压和参考电流的设计,同时也贯穿了系统设计的方法。
文章从设计目标到芯片测试,描述了整个设计流程。
这种设计方法对模拟电路设计自动化也很有借鉴意义,尤其是对模拟电路的拓扑选择和产生。
本文所描述的参考系统在实际的ADC电路中实现,测试结果显示电源抑制比和温度特性比较好,非常成功的集成在10bit采样率40MSPS的pipeline ADC中。
本文第二节描述系统的架构,第三节详细介绍系统的电路实现,第四节给出了测试结果,最后总结了本文的工作。
II电路架构设计整个电路系统是为pipeline ADC产生对工作电源电压、生产工艺和工作温度都不敏感的参考电压和电流。
带隙基准源(Bandgap)是在CMOS工艺中常用的对温度不敏感的结构,系统中还需有电压电流转换电路(V/I converter)。
一种基于伪随机噪声注入的流水线ADC数字校准算法
一种基于伪随机噪声注入的流水线ADC数字校准算法包晴晴;彭析竹;符土建;刘小乔;唐鹤【摘要】流水线ADC中运算放大器在设计过程中为了满足建立速度的要求,往往无法达到较高的信号建立精度,从而导致流水线ADC中的乘法数模转换器(MDAC)出现增益误差.提出一种基于伪随机噪声注入的数字后台校准方法,对MDAC的级间增益进行校准.将该校准算法应用于一款12 bit 250 MS/s的流水线ADC,仿真结果表明,校准后流水线ADC的有效位数(ENOB)可达到11.826 bit,信噪失真比(SNDR)可达72.95 dB,无杂散动态范围(SFDR)可达89.023 dB.【期刊名称】《电子与封装》【年(卷),期】2019(019)008【总页数】5页(P16-20)【关键词】流水线ADC;数字校准;伪随机噪声【作者】包晴晴;彭析竹;符土建;刘小乔;唐鹤【作者单位】电子科技大学,成都610054;电子科技大学,成都610054;电子科技大学,成都610054;电子科技大学,成都610054;电子科技大学,成都610054【正文语种】中文【中图分类】TN4021 引言随着工艺的快速发展,工艺尺寸不断缩小,模拟电源电压逐渐降低,流水线ADC中的运算放大器、开关电容电路等模块的设计面临越来越多的困难[1],运放的有限增益、开关的电荷注入等非理想因素也都限制了流水线ADC 精度的提高。
此外,芯片生产过程中,由于受工艺环境和过程的影响,很多参数会随时间发生变化。
为了降低模拟电路的设计难度及参数变化产生的不利因素,需要引入校准的功能。
目前的校准方法主要分为模拟域和数字域两种,前者主要通过采用小电容对电路中的大电容进行校准[2-3],对电容的设计精度要求高,实现起来比较困难,因此普遍采用数字校准。
数字校准又分为前台校准[4-5]和后台校准[6-7],前台校准需要打断系统的正常转化过程,且一般难以跟踪参数变化带来的影响,而后台校准则不会打断系统的正常工作,且能够实时追踪参数的变化,对参数变化进行校准和修正,在实际电路中得到了广泛的应用。
应用于CMOS图像传感器的Pipelined SAR模数转换器设计
应用于CMOS图像传感器的Pipelined SAR模数转换器设计李臻;李冬梅【期刊名称】《微电子学与计算机》【年(卷),期】2016(33)11【摘要】设计实现一种应用于CMOS图像传感器的10bit模数转换器(ADC),采用基于逐次逼近的新型流水线结构(Pipelined SAR ADC).提出了一种优化选取其中高精度倍增数模转换器(MDAC)和单位电容值的解析方法.通过采用第一级高精度、半增益MDAC和动态比较器等技术提高了整体电路的线性度,并降低了系统功耗.通过对版图面积的优化设计,满足了CMOS图像传感器对芯片面积的要求.本设计基于180nm CMOS工艺,仿真结果显示电路实现了60.37dB的信噪失真比(SNDR)和76.37dB的无杂散动态范围(SFDR),有效精度(ENOB)达到了9.74bit.ADC的核心面积仅为140μmⅹ280μm,约为0.04mm2.在2.8V电压下,功耗为9.8mW.【总页数】5页(P64-68)【关键词】逐次逼近;流水线模数转换器;半增益MDAC;动态锁存比较器;低功耗;小面积【作者】李臻;李冬梅【作者单位】清华大学电子工程系【正文语种】中文【中图分类】TN432【相关文献】1.用于CMOS图像传感器的12位低功耗单斜坡模数转换器设计 [J], 唐枋;唐建国2.基于Pipelined结构的电流型CMOS模数转换器电路设计 [J], 周选昌;胡晓慧3.一种用于时延积分CMOS图像传感器的10 bit全差分双斜坡模数转换器 [J], 张鹤玖;余宁梅;吕楠;刘尕4.一种采用时间交织结构的低功耗Pipelined SAR模数转换器设计 [J], 周浩;沈骁樱;陈迟晓;叶凡;任俊彦因版权原因,仅展示原文概要,查看原文内容请购买。
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MT-024TUTORIAL ADC Architectures V: Pipelined Subranging ADCsby Walt KesterINTRODUCTIONThe pipelined subranging ADC architecture dominates today's applications where sampling rates of greater than 5 MSPS to 10 MSPS are required. Although the flash (all-parallel) architecture (see Tutorial MT-020) dominated the 8-bit video IC ADC market in the 1980s and early 1990s, the pipelined architecture has largely replaced the flash ADC in modern applications. There are a small number of high power Gallium Arsenide (GaAs) flash converters with sampling rates greater than 1 GHz, but resolution is limited to 6 or 8 bits. However, the flash converter still remains a popular building block for higher resolution pipelined ADCs.Applications for pipelined ADCs include video, image processing, communications, and a myriad of others. The architecture lends itself to a variety of relatively low cost IC processes, CMOS and BiCMOS being the most popular. Current technology yields 12- to 16-bit resolution at sampling rates greater than 100 MSPS.BASIC SUBRANGING ADC ARCHITECTUREThe pipelined ADC had its origins in the subranging architecture which was first used in the 1950s as a means to reduce the component count and power in tunnel diode and vacuum tube flash ADCs (see References 1, 2). A block diagram of the subranging architecture is shown in Figure 1, where a 6-bit, two-stage ADC is shown.N1 MSBs (3) N2 LSBs (3)DATA OUTPUT, N-BITS = N1 + N2 = 3 + 3 = 6See: R. Staffin and R. Lohman, "Signal Amplitude Quantizer,"U.S. Patent 2,869,079, Filed December 19, 1956, Issued January 13, 1959Figure 1: A 6-Bit, Two-Stage Subranging ADCThe output of the input sample-and-hold (SHA) is digitized by the first-stage 3-bit sub-ADC (SADC)—a flash converter. The coarse 3-bit MSB conversion is then converted back to an analog signal using a 3-bit sub-DAC (SDAC). The SDAC output is then subtracted from the SHA output, amplified, and applied to a second-stage 3-bit SADC. The "residue signal" is then digitized by the 3-bit second-stage SADC, thereby generating the three LSBs of the total 6-bit output word. This type of ADC is generally referred to as "subranging" because the input range is subdivided into a number of smaller ranges (subranges) which are, in turn, further subdivided.This subranging ADC can best be analyzed by examining the residue waveform at the input to the second-stage ADC as shown in Figure 2. This waveform assumes a low frequency ramp input signal to the overall ADC. In order for there to be no missing codes, the residue waveform must exactly fill the input range of the second-stage ADC, as shown in the ideal case of Figure 2A. This implies that both the N1 SADC and the N1 SDAC must be better than N1 + N2 bits accurate—in the example shown, N1 = 3, N2 = 3, and N1 + N2 = 6. This architecture, as shown, is useful for resolutions up to about 8 bits (N1 = N2 = 4), however maintaining better than 8-bit alignment between the two stages (over temperature variations, in particular) can be difficult. The situation shown in Figure 2B will result in missing codes when the residue waveform goes outside the range of the N2 SADC, "R", and falls within the "X" or "Y" regions—caused by a nonlinear N1 SADC or interstage gain and/or offset mismatch .01232N1–12N1–2R = RANGE OF N2 SADC XR Y (A)IDEAL N1 SADC (B)NONLINEAR N1 SADCFigure 2: Residue Waveform at Input of Second-Stage SADCWhen the interstage alignment is not correct, missing codes will appear in the overall ADC transfer function as shown in Figure 3. If the residue signal goes into positive overrange (the "X" region), the output first "sticks" on a code and then "jumps" over a region leaving missing codes. The reverse occurs if the residue signal is negative overrange.ANALOG INPUTDIGITAL OUTPUTFigure 3: Missing Codes Due to MSB SADC Nonlinearityor Interstage MisalignmentAt this point it is worth noting that there is no particular reason—other than certain design issues beyond the scope of this discussion—why there must be an equal number of bits per stage in the subranging architecture. In addition, there can be more than two stages. Regardless, the architecture as shown in Figure 1 is limited to approximately 8-bit resolution unless some form of error correction is added. Figure 4 shows a popular 8-bit 15-MSPS subranging ADC manufactured by Computer Labs, Inc. in the mid-1970s. This converter was a basic two-stage subranging ADC with two 4-bit flash converters—each composed of 8 dual AM687 high speed comparators. The interstage offset adjustment potentiometer allowed the transfer function to be optimized in the field. This ADC was popular in early digital video products such as frame stores and time base correctors. 25 watts AM687 Dual Comparators (16 Total)RESIDUE WAVEFORM OFFSET ADJUST 7" ×6"×2.5"Figure 4: MOD-815, 8-Bit, 15 MSPS 4×4 Subranging ADC, 1976,Computer Labs, Inc.SUBRANGING ADCs WITH DIGITAL ERROR CORRECTIONIn order to reliably achieve higher than 8-bit resolution using the subranging approach, a technique generally referred to as digitally corrected subranging , digital error correction , overlap bits , redundant bits , etc. is utilized. This method was referred to in literature as early as 1964 by T. C. Verster (Reference 3) and quickly became widely known and utilized (References 4-7). The fundamental concept is illustrated using the residue waveform shown in Figure 5.000001010011100101110111R X Y –FS +FS 0CORRECTED MSBs + 001 TO N1 MSBs –001 TO N1 MSBs 000001010011100101110111UNCORRECTED MSBsFigure 5: Error Correction Using Added Quantization Levels for N1 = 3The residue waveform is shown for the specific case where N1 = 3 bits. In a standard subranging ADC, the residue waveform must exactly fill the input range of the N2 SADC—it must stay within the region designated R. The missing code problem is solved by adding extra quantization levels in the positive overrange region X and the negative overrange region Y. These additional levels require additional comparators in the basic N2 flash SADC. The scheme works as follows. As soon as the residue enters the X region, the N2 SADC should return to all-zeros and start counting up again. Also, the code 001 must be added to the output of the N1 SADC to make the MSBs read the correct code. The figure labels the uncorrected MSB regions on the lower part of the waveform and the corrected MSB regions on the upper part of the waveform. A similar situation occurs when the residue waveform enters the negative overrange region Y. Here, the first quantization level in the Y region should generate the all-ones code, and the additional overrange comparators should cause the count to decrease. In the Y region, the code 001 must be subtracted from the MSBs to produce the corrected MSB code. It is important to understand that in order for this correction method to work properly, the N1 SDAC must be more accurate than the total resolution of the ADC. Nonlinearity or gain errors in the N1 SDAC affect the amplitudeof the vertical "jump" portions of the residue waveform and therefore can produce missing codes in the output.Horna in a 1972 paper (Reference 6) describes an experimental 8-bit 15-MSPS error corrected subranging ADC using Motorola MC1650 dual ECL comparators as the flash converter building blocks. Horna adds additional comparators in the second flash converter and describes this procedure in more detail. He points out that the correction logic can be greatly simplified by adding an appropriate offset to the residue waveform so that there is never a negative overrange condition. This eliminates the need for the subtraction function—only an adder is required. The MSBs are either passed through unmodified, or 1 LSB (relative to the N1 SADC) is added to them, depending on whether the residue signal is in range or overrange.Modern digitally corrected subranging ADCs generally obtain the additional quantization levels by using an internal ADC with higher resolution for the N2 SADC. For instance, if one additional bit is added to the N2 SADC, its range is doubled—then the residue waveform can go outside either end of the range by ½ LSB referenced to the N1 SADC. Adding two extra bits to N2 allows the residue waveform to go outside either end of the range by 1½ LSBs referenced to the N1 SADC. The residue waveform is offset using Horna's technique such that only a simple adder is required to perform the correction logic. The details of how all this works are not immediately obvious, and can best be explained by going through an actual example of a 6-bit ADC with a 3-bit MSB SADC and a 4-bit LSB SADC providing one bit of error correction. The block diagram of the example ADC is shown in Figure 6.DATA OUTPUTSEE: T. C. Verster, "A Method to Increase the Accuracy of Fast Serial-Parallel Analog-to-Digital Converters," IEEE Transactions on ElectronicComputers,EC-13, 1964, pp. 471-473Figure 6: A 6-Bit Subranging Error Corrected ADC, N1 = 3, N2 = 4After passing through an input sample-and-hold, the signal is digitized by the 3-bit SADC, reconstructed by a 3-bit SDAC, subtracted from the held analog signal and then amplified and applied to the second 4-bit SADC. The gain of the amplifier, G, is chosen so that the residuewaveform occupies ½ the input range of the 4-bit SADC. The 3 LSBs of the 6-bit output data word go directly from the second SADC to the output register. The MSB of the 4-bit SADC controls whether or not the adder adds 001 to the 3 MSBs. The carry output of the adder is used in conjunction with some simple overrange logic to prevent the output bits from returning to the all-zeros state when the input signal goes outside the positive range of the ADC.The residue waveform for a full-scale ramp input will now be examined in more detail to explain how the correction logic works. Figure 7 shows the ideal residue waveform assuming perfect linearity in the first ADC and perfect alignment between the two stages. Notice that the residue waveform occupies exactly ½ the range of the N2 SADC. The 4-bit digital output of the N2 SADC are shown on the left-hand side of the figure. The regions defined by the 3-bit uncorrected N1 SADC are shown on the bottom of the figure. The regions defined by the 3-bit corrected N1 ADC are shown are shown at the top of the figure.N2UNCORRECTED MSBsFigure 7: Residue Waveform for 6-Bit Error Corrected Subranging ADC N1 = 3,N2 = 4, Ideal MSB SADCFollowing the residue waveform from left-to-right—as the input first enters the overall ADC range at –FS, the N2 SADC begins to count up, starting at 0000. When the N2 SADC reaches the 1000 code, 001 is added to the N1 SADC output causing it to change from 000 to 001. As the residue waveform continues to increase, the N2 SADC continues to count up until it reaches the code 1100, at which point the N1 SADC switches to the next level, the SDAC switches and causes the residue waveform to jump down to the 0100 output code. The adder is now disabled because the MSB of the N2 SADC is zero, so the N1 SADC output remains 001. The residue waveform then continues to pass through each of the remaining regions until +FS is reached. This method has some clever features worth mentioning. First, the overall transfer function is offset by ½ LSB referred to the MSB SADC (which is 1/16th FS referred to the overall ADCanalog input). This is easily corrected by injecting an offset into the input sample-and-hold. It is well-known that the points at which the internal N1 SADC and SDAC switch are the most likely to have additional noise and are the most likely to create differential nonlinearity in the overall ADC transfer function. Offsetting them by 1/16th FS ensures that low level signals (less than ±1/16th FS) near zero volts analog input do not exercise the critical switching points and gives low noise and excellent DNL where they are most needed in communications applications. Finally, since the ideal residue signal is centered within the range of the N2 SADC, the extra range provided by the N2 SADC allows up to a ±1/16th FS error in the N1 SADC conversion while still maintaining no missing codes.Figure 8 shows a residue signal where there are errors in the N1 SADC. Notice that there is no effect on the overall ADC linearity provided the residue signal remains within the range of the N2 SADC. As long as this condition is met, the error correction method described corrects for the following errors: sample-and-hold droop error, sample-and-hold settling time error, N1 SADC gain error, N1 SADC offset error, N1 SDAC offset error, N1 SADC linearity error, residue amplifier offset error. In spite of its ability to correct all these errors, it should be emphasized that this method does not correct for gain and linearity errors associated with the N1 SDAC or gain errors in the residue amplifier. The errors in these parameters must be kept less than 1 LSB referred to the N-bits of the overall subranging ADC. Another way to look at this requirement is to realize that the amplitude of the vertical "jump" transitions of the residue waveform, corresponding to the N1 SADC and SDAC changing levels, must remain within ±½ LSB referenced to the N2 SADC input in order for the correction to prevent missing codes.CORRECTED MSBsUNCORRECTED MSBsFigure 8: Residue Waveform for 6-Bit Error Corrected Subranging ADC, N1 = 3, N2= 4, Nonlinear MSB SADCThe error-corrected subranging ADC shown in Figure 6 does not have "pipeline" delay. The input SHA remains in the hold mode during the time required for the following events occur: the first-stage SADC makes its decision, its output is reconstructed by the first-stage SDAC, the SDAC output is subtracted from the SHA output, amplified, and digitized by the second-stage SADC. After the digital data passes through the error correction logic and the output registers, it is ready for use, and the converter is ready for another sampling clock input.PIPELINED SUBRANGING ADCs INCREASE SPEEDThe pipelined architecture shown in Figure 9 is a digitally corrected subranging architecture in which each stage operates on the data for one-half the sampling clock cycle and then passes its residue output to the next stage in the pipeline, prior the next half cycle. The interstage track-and-hold (T/H) serves as an analog delay line—timing is set such that it enters the hold mode when the first stage conversion is complete. This gives more settling time for the internal SADCs, SDACs, and amplifiers, and allows the pipelined converter to operate at a much higher overall sampling rate than a non-pipelined version.Figure 9: Generalized Pipelined Stages in a Subranging ADCwith Error CorrectionThe term "pipelined" architecture refers to the ability of one stage to process data from the previous stage during any given phase of the sampling clock cycle. At the end of each phase of a particular clock cycle, the output of a given stage is passed on to the next stage using the T/H functions, and new data is shifted into the stage. Of course this means that the digital outputs of all but the last stage in the "pipeline" must be stored in the appropriate number of shift registers so that the digital data arriving at the correction logic corresponds to the same sample.Figure 10 shows a timing diagram of a typical pipelined subranging ADC. Notice that the phases of the clocks to the T/H amplifiers are alternated from stage to stage such that when a particular T/H in the ADC enters the hold mode it holds the sample from the preceding T/H, and the preceding T/H returns to the track mode. The held analog signal is passed along from stage to stage until it reaches the final stage in the pipelined ADC—in this case, a flash converter. When operating at high sampling rates, it is critical that the differential sampling clock be kept at a 50% duty cycle for optimum performance. Duty cycles other than 50% affect all the T/H amplifiers in the chain—some will have longer than optimum track times and shorter than optimum hold times; while others suffer exactly the reverse condition. Many newer pipelined ADCs including the 12-bit, 65-MSPS AD9235 and the 12-bit, 170-/210-MSPS AD9430 have on-chip clockconditioning circuits to control the internal duty cycle and maintain rated performance even if there is some variation in the external clock duty cycle.CLOCK INPUT T/H STAGE 1STAGE 2STAGE 3FLASHTTHHHTTTH HH TDATA OUT T T H T H T H TFigure 10: Clock Issues in Pipelined ADCsThe effects of the "pipeline" delay (sometimes called "latency") in the output data are shown in Figure 11 for the AD9235 12-bit 65-MSPS ADC where there is a 7-clock cycle pipeline delay.Figure 11: Typical Pipelined ADC Timing for AD9235 12-Bit, 65-MSPS ADCNote that the pipeline delay is a function of the number of stages and the particular architecture of the ADC under consideration—the data sheet should always be consulted for the exact details of the relationship between the sampling clock and the output data timing. In many applications the pipeline delay will not be a problem, but if the ADC is inside a feedback loop the pipeline delay may cause instability. The pipeline delay can also be troublesome in multiplexed applications or when operating the ADC in a "single-shot" mode. Other ADC architectures—such as successive approximation—are better suited to these types of applications.A subtle issue relating to most CMOS pipelined ADCs is their performance at low sampling rates. Because the internal timing generally is controlled by the external sampling clock, very low sampling rates extend the hold times for the internal track-and-holds to the point where excessive droop causes conversion errors. Therefore, most pipelined ADCs have a specification for minimum as well as maximum sampling rate. Obviously, this precludes operation in single-shot or burst-mode applications—where the SAR ADC architecture is more appropriate.It is often erroneously assumed that all subranging ADCs are pipelined, and that all pipelined ADCs are subranging. While it is true that most modern subranging ADCs are pipelined in order to achieve the maximum possible sampling rate, they don't necessarily have to be pipelined if designed for use at much lower speeds. For instance, the leading edge of the sampling clock could initiate the conversion process, and any additional clock pulses required to continue the conversion could be generated internal to the ADC using an on-chip timing circuit. At the end of the conversion process, an end-of-conversion or data-ready signal could be generated as an external indication that the data corresponding to that particular sampling edge is valid. This "no latency" approach is not often used for the obvious reason that the overall sampling rate is greatly reduced by eliminating the pipelined structure.Conversely, there are some ADCs which use other architectures than subranging and are pipelined. For instance, most flash converters use an extra set of output latches (in addition to the latch associated with the parallel comparators) which introduces pipeline delay in the output data (see Tutorial MT-020. Another example of a non-subranging architecture which generally has quite a bit of pipeline delay is sigma-delta which is covered in detail in Tutorial MT-022 and Tutorial MT-023. Note, however, that it is possible to modify the timing of a normal sigma-delta ADC, reduce the output data rate, and make a "no latency" sigma-delta ADC. RECIRCULATING SUBRANGING PIPELINED ADCAnother less popular type of error corrected subranging architecture is the recirculating subranging ADC. This is shown in Figure 12 and was proposed in a 1966 paper by Kinniment, et.al. (Reference 5). The concept is similar to the error corrected subranging architecture previously discussed, but in this architecture, the residue signal is recirculated through a single ADC and DAC stage using switches and a programmable gain amplifier (PGA). Figure 12 shows the additional buffer registers required to store the pipelined data resulting from each conversion such that the data into the correction logic (adder) corresponds to the same sample. The recirculating architecture show in Figure 12 is similar to some integrated circuit ADCs introduced in the early 1990s, such as the AD678 (12-bits, 200 kSPS) and AD679 (14-bits, 128 kSPS). Today, ADCs with these resolutions and sampling rates are implemented in a much moreefficient and cost effective manner using the successive approximation architecture discussed in Tutorial MT-021.Figure 12: Kinniment, et. al., 1966 Pipelined 7-bit, 9-MSPSRecirculating ADC ArchitectureMODERN MONOLITHIC PIPELINED ADCs FOR VIDEO AND IMAGE PROCESSINGThe discussion of error corrected pipelined ADCs concludes with a few examples of modern integrated circuit implementations of the popular architecture. These examples show the flexibility of the technique in optimizing ADC performance at different resolutions, sampling rates, power dissipation, etc.The video market currently uses ADCs with resolutions of 8 to 12-bits, and sampling rates from 54 MSPS to 140 MSPS. Most of these ADCs are now integrated into chips which perform further digital signal processing, such as the conversion between the various existing video standards (composite, RGB, Y/C, Y/Pb/Pr). These ICs perform a considerable amount of digital processing as shown in the ADV-Series Video Decoders from Analog Devices. The ADC architecture is generally pipelined, the process CMOS, and total package power dissipation ranges from 250 mW to 600 mW. Another family of similar products is used in CCD Image Processing applications for cameras and camcorders.In the current "stand-alone" 8-bit ADC market, the pipelined architecture is implemented in the 8-bit 250 MSPS, AD9480 (LVDS outputs) and AD9481 (demuxed CMOS outputs) which dissipate 700 mW and 600 mW, respetively.PIPELINED ADCs FOR WIDEBAND COMMUNICATIONSThe demand for wide dynamic range (high SFDR) ADCs suitable for communications applications led to the development of a breakthrough product in 1995, the AD9042 12-bit, 41-MSPS ADC (see Reference 8). A block diagram of the converter is shown in Figure 13.DELAY DELAYFigure 13: AD9042 12-Bit 41-MSPS ADC, 1995The AD9042 uses an error corrected subranging architecture composed of a 6-bit MSB ADC/DAC followed by a 7-bit LSB ADC and uses one bit of error correction in the second stage. The AD9042 yields 80-dB SFDR performance over the Nyquist bandwidth at a sampling rate of 41 MSPS. Fabricated on a high speed complementary bipolar process, the device dissipates 600 mW and operates on a single +5 V supply.In order to meet the need for lower cost, lower power devices, Analog Devices initiated a family of CMOS high performance ADCs such as the AD9225 12-bit, 25-MSPS ADC released in 1998. The AD9225 dissipates 280 mW, has 85-dB SFDR, and operates on a single +5 V supply.The AD9235 12-bit 65-MSPS CMOS ADC released in 2001 shows the progression of CMOS high performance converters. The AD9235 operates on a single +3 V supply, dissipates 300 mW (at 65 MSPS), and has a 90-dB SFDR over the Nyquist bandwidth.The 12-bit 210-MSPS AD9430 released in 2002 is fabricated on a BiCMOS process, has 80-dB SFDR up to 70-MHz inputs, operates on a single +3 V supply and dissipates 1.3 W at 210 MSPS. Output data is provided on two demuxed ports at 105 MSPS each in the CMOS mode or on a single port at 210 MSPS in the LVDS mode.Another breakthrough product was the 14-bit 105-MSPS AD6645 ADC released in 2002 and fabricated on a high speed complementary bipolar process (XFCB), has 90-dB SFDR, operates on a single +5 V supply and dissipates 1.5 W.THE LATEST IN PIPELINED ADCsThe 12-bit high speed ADC segment has seen significant improvements in speed, power, and performance, as reflected by the AD9236 12-bit 80 MSPS CMOS ADC with only 360 mW of power dissipation. The AD9236 is part of the pin-compatible family which includes the AD9215 (10-bit, 105 MSPS), AD9235 (12-bit, 65 MSPS) and the AD9245 (14-bit, 80 MSPS). These pin-compatible devices allow easy migration from 10-bits to 14-bits and sampling rates from 20 MSPS to higher rates.In addition to single ADCs, dual ADCs and quad ADCs are available, including the AD9229 quad 12-bit 65 MSPS ADC with LVDS outputs. Power dissipation is 1.5 W, and the part is ideally suited for high density applications such as medical ultrasound.In the 14-bit communications ADC area, the AD9244 14-bit, 65 MSPS is optimized for Nyquist input signals (dc to f s/2), has an SFDR of 86 dB, and dissipates only 550 mW on a CMOS process.For higher input bandwidths and IF sampling, the AD9445 14-bit, 125 MSPS ADC is available with an SFDR of 95 dB (measured with a 170 MHz input), and a power dissipation of 2.6 W. The AD9445 is designed on a BiCMOS process.Also for communications applications, the AD9446 16-bit, 100 MSPS ADC is optimized for high SNR (84 dB), dissipates 2.8 W, and is also designed on a BiCMOS process.SUMMARYThe pipelined subranging ADC architecture virtually dominates where sampling rates of greater than a few MHz are required. There is some overlap between the SAR architecture and the pipelined architecture in the 2 to 5 MSPS region, but the application should easily dictate which architecture is more appropriate.Resolutions from 8- to 16-bits are available in a variety of packages and configurations (signals, duals, triples, quads, etc.). Fine-line CMOS is by far the most popular process for these converters, and BiCMOS is used where it is necessary to obtain the ultimate in dynamic performance.For a given sampling rate and resolution, pipelined ADCs are often differentiated by their dynamic performance. For example, the AD9244 14-bit, 65 MSPS ADC is optimized to handle input signals from dc to Nyquist (f s/2) and dissipates only 550 mW. If signals in higher Nyquist zones must be processed, the AD9445 14-bit, 125 MSPS ADC is available at 2.6 W on a more expensive BiCMOS process.Selecting the proper pipelined ADC for a particular application requires a thorough understanding of not only system requirements but also a working knowledge of the architecture and the possible tradeoffs available. Simply treating the ADC as a "black box" often leads to the wrong choice.REFERENCES1.R. Staffin and R. D. Lohman, "Signal Amplitude Quantizer," U.S. Patent 2,869,079, filed December 19, 1956,issued January 13, 1959. (describes flash and subranging conversion using tubes and transistors).2.H. R. Schindler, "Using the Latest Semiconductor Circuits in a UHF Digital Converter," Electronics, August1963, pp. 37-40. (describes a 6-bit 50-MSPS subranging ADC using three 2-bit tunnel diode flash converters). 3.T. C. Verster, "A Method to Increase the Accuracy of Fast Serial-Parallel Analog-to-Digital Converters," IEEETransactions on Electronic Computers, EC-13, 1964, pp. 471-473. (one of the first references to the use of error correction in a subranging ADC).4.G. G. Gorbatenko, "High-Performance Parallel-Serial Analog to Digital Converter with Error Correction," IEEENational Convention Record, New York, March 1966. (another early reference to the use of error correction ina subranging ADC).5. D. J. Kinniment, D. Aspinall, and D.B.G. Edwards, "High-Speed Analogue-Digital Converter," IEEProceedings, Vol. 113, pp. 2061-2069, Dec. 1966. (a 7-bit 9MSPS three-stage pipelined error corrected converter is described based on recircuilating through a 3-bit stage three times. Tunnel (Esaki) diodes are used for the individual comparators. The article also shows a proposed faster pipelined 7-bit architecture using three individual 3-bit stages with error correction. The article also describes a fast bootstrapped diode-bridge sample-and-hold circuit).6.O. A. Horna, "A 150Mbps A/D and D/A Conversion System," Comsat Technical Review, Vol. 2, No. 1, pp. 52-57, 1972. (a detailed description and analysis of a subranging ADC with error correction).7.J. L. Fraschilla, R. D. Caveney, and R. M. Harrison, "High Speed Analog-to-Digital Converter," U.S. Patent3,597,761, filed Nov. 14, 1969, issued Aug. 13, 1971. (Describes an 8-bit, 5-MSPS subranging ADC with switched references to second comparator bank).8.Roy Gosser and Frank Murden, "A 12-bit 50MSPS Two-Stage A/D Converter," 1995 ISSCC Digest ofTechnical Papers, p. 278. (a description of the AD9042 error corrected subranging ADC using MagAMP stages for the internal ADCs).9.Walt Kester, Analog-Digital Conversion, Analog Devices, 2004, ISBN 0-916550-27-3, Chapter 3. Alsoavailable as The Data Conversion Handbook, Elsevier/Newnes, 2005, ISBN 0-7506-7841-0, Chapter 3. Copyright 2009, Analog Devices, Inc. All rights reserved. Analog Devices assumes no responsibility for customer product design or the use or application of customers’ products or for any infringements of patents or rights of others which may result from Analog Devices assistance. All trademarks and logos are property of their respective holders. Information furnished by Analog Devices applications and development tools engineers is believed to be accurate and reliable, however no responsibility is assumed by Analog Devices regarding technical accuracy and topicality of the content provided in Analog Devices Tutorials.。