CMA3000 offset and gain accuracy_sinocom

CMA3000 Sensitivity and Offset Accuracy
Pekka Kostiainen 13-Feb-09 CONFIDENTIAL
CONFIDENTIAL
•Unit %/°C •Statistics
–N=90 (30 pcs from three wafers)–Stdev approx 0,007 %/°C
Sensitivity Change over Temperature (-40…+85°C) after Soldering
0.030.020.010.00-0.01-0.02-0.03Median
Mean 0.0095
0.0090
0.0085
0.0080
0.0075
1st Q uartile 0.004723Median
0.0087193rd Q uartile 0.012009Maximum 0.0263940.0073600.0095570.007462
0.0093320.004574
0.006146
A -Squared 0.45P-V alue 0.277Mean 0.008459StDev 0.005244V ariance 0.000027Skew ness 0.294183Kurtosis 0.934850
N
90Minimum -0.003131A nderson-Darling Normality Test
95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev
95%Confidence Intervals
Summary for Sensitivity Temp Dependency X
0.030.020.010.00-0.01-0.02-0.03Median
Mean 0.0000
-0.0005
-0.0010
-0.0015
-0.0020
-0.0025
-0.0030
1st Q uartile -0.004284Median
-0.0014113rd Q uartile 0.001476Maximum 0.014007-0.0018850.000133-0.002825
0.0000000.004200
0.005644
A -Squared 0.97P-V alue 0.014Mean -0.000876StDev 0.004816V ariance 0.000023Skew ness 0.780517Kurtosis 0.812583
N
90Minimum -0.010257A nderson-Darling Normality Test
95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev
95%Confidence Intervals
Summary for Sensitivity Temp Dependency Y
0.03
0.020.010.00-0.01-0.02-0.03Median
Mean 0.0095
0.0090
0.0085
0.0080
0.0075
0.0070
1st Q uartile 0.005771Median
0.0085133rd Q uartile 0.011455Maximum 0.0307800.0072720.0094130.007332
0.0089220.004456
0.005988
A -Squared 0.72P-V alue 0.057Mean 0.008343StDev 0.005109V ariance 0.000026Skew ness 0.93510Kurtosis 3.24407
N
90Minimum -0.001465A nderson-Darling Normality Test
95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev
95%Confidence Intervals
Summary for Sensitivity Temp Dependency Z
CONFIDENTIAL
Offset Change over Temperature (-40…+85°C) after Soldering
•Unit mg/°C •Statistics
–N=90 (30 pcs from three wafers)–Stdev approx 1,6 mg/°C
•Opportunities
–Optimize sensing element's design (ongoing) and thus improve Y&Z see-saw's tolerance to mechanical stress.
4.83.21.60.0-1.6-3.2-4.8Median
Mean 1.35
1.20
1.05
0.90
0.75
0.60
1st Q uartile 0.06429Median
1.164293rd Q uartile 1.73571Maximum 3.614290.66176 1.143320.63535
1.300001.00269
1.34733
A -Squared 0.56P-V alue 0.146Mean 0.90254StDev 1.14959V ariance 1.32156Skew ness -0.314092Kurtosis 0.171222
N
90Minimum -2.67143A nderson-Darling Normality Test
95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev
95% Confidence Intervals
Summary for Offset Temp Dependency X
4.83.21.60.0-1.6-3.2-4.8Median
Mean 0.75
0.50
0.25
0.00
-0.25
-0.50
1st Q uartile -1.29286Median
0.421433rd Q uartile 1.30357Maximum 3.44286-0.264700.40406-0.40412
0.682321.39248
1.87109
A -Squared 0.98P-V alue 0.013Mean 0.06968StDev 1.59649V ariance 2.54877Skew ness -0.176497Kurtosis -0.917743
N
90Minimum -2.98571A nderson-Darling Normality Test
95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev
95% Confidence Intervals
Summary for Offset Temp Dependency Y
4.8
3.21.60.0-1.6-3.2-
4.8Median
Mean 2.40
2.25
2.10
1.95
1.80
1st Q uartile 1.2929Median
2.01433rd Q uartile 2.9571Maximum 4.58571.9066 2.38961.7278
2.26461.0056
1.3513
A -Squared 0.86P-V alue 0.026Mean 2.1481StDev 1.1529V ariance 1.3293Skew ness 0.268635Kurtosis -0.776114
N
90Minimum -0.0571A nderson-Darling Normality Test
95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev
95% Confidence Intervals
Summary for Offset Temp Dependency Z。