电容测试方法

W.V. 25V : D.F. 0.025
W.V. = 10/16V : D.F. 0.035
W.V. = 6.3V :
C 3.3uF : D.F. 0.05 C C 3.3uF : D.F. 0.1
W.V. 25V :
C
C 0.1uF : D.F. 0.05
C 0.1uF : D.F. 0.09
W.V. = 10/16V : D.F. 0.125
D.F. 0.1
Y5V/F
-
(F5/F1)
D.F. 0.2
*) However, following P/Ns will be tested by "0.5±0.1 kHz, AC 0.5±0.1 V(r.m.s.)". GRM155R61A154KE19 GRM155R61A224KE19 GRM185R61A105KE36 GRM219R61A475KE19
Classification
Temp. Char.
(CODE)
C0G/CH
(5C/2C)
Class 1
Temperature
U2J/UJ
C
Compensation Type (7U/3U)
C
SL
(1X)
X7R/B/R
-
(R7/B1/R1)
Class 2
X5R/B
-
(R6/B3)
High Dielectric Type
这是我们标准项目的规格。执行一个在150 +0/-10的热处理，最少为60±5 。然后，室内等待24±2 小 时。
3. Q/D.F. Specification & Test Condition
Q/D.F.的规格和测试条件（MLCC）
3. MLCC - Medium High Voltage Series -
April 2nd,2005.
Component Business Unit Murata Manufacturing Co.,Ltd. 株式会社 村田制作所 元件事业本部
Chip Monolithic Ceramic Capacitor 贴片独石陶瓷电容器
Testing / Measuring Condition
Class 2
High Dielectric Type
X7R
-
(R7)
D.F. 0.010 D.F. 0.025
Test Method
Applying Frequency,Voltage
1.0±0.2 MHz, AC 0.5 ~ 5.0 V(r.m.s.)
1.0±0.2 kHz, AC 1±0.2 V(r.m.s.)
16034E 16334A Photo 2. Picture of measurement test fixture
图片2. 测量测试的固定设备的图片
2. Calibration of Measuring Equipment
测量设备的校正
Calibration is one of the important factor for accurate measuring. 校正是精确测量的一个重要因素 Calibration is done with COMPEN of MEAS SETUP.
4. Measuring Procedure
测量程序
This is explanation that we measure capacitance and DF by using measurement instrument 4248A and measurement test fixture16034E. 这是我们测量容量和DF运用测量工具4248A和测量测试治具16034E。
一般来说，我们都运用“LCR 测定计”作为测量电容量和“D.F.”的工具. 典型的LCR测定计是 Agilent 的“4284A”和 “4286A”。 我们可以测试高容量的电容器。（ 1uF≦容量 ）
4284A 4268A Photo 1. Picture of measurement instrument 图片1. 测量工具的图片
Contents
内容
1. Measuring Equipment & Fixture
测量设备和治具
2. Calibration of Measuring Equipment
校正测量设备
3. Q/D.F. Specification & Test Condition (MLCC)
Q/D.F.的规格和测试条件（MLCC）
3. Q/D.F. Specification & Test Condition
Q/D.F.的规格和测试条件（MLCC）
2. MLCC - Thin Layer Large Capacitance Series -
Classification
Temp. Char.
(CODE)
Class 1
Temperature
Classification
Temp. Char.
(CODE)
Specification Q
Class 1
Temperature Compensation Type
C0G/CH
(5C/2C)
SL
(1X)
Q 1000
-
C 30pF : Q 400+20C C 30pF : Q 1000
D.F.
R
-
(R3)
测试/测定条件
Note : 注 :
The information of this material are as of the date mentioned above. They are subject to change without advance notБайду номын сангаасce. If there are any questions, please contact our sales representatives or product engineers. 对于这些材料信息以上面的日期为准。信息若有变更，恕不另行通知。若有任何疑问，请与我公司销售代表或产品工程师联系。
校正在MEAS SETUP下的COMPEN
Short 短路 Ω Please wash the terminal with the acetone etc.
when not becoming below 0.03Ω. 校正先做短路。请参考以下短路条件的图片。在这个时候，请确认Rs是小于 Ω。请用丙酮 等冲洗终端 如果校正结果大于 Ω。
<Note> This is the specification for our standard items. Perform a heat treatment at 150 +0/-10℃ for 60±5 min. and then, let sit for 24±2 hrs. at room condition. 这是我们标准项目的规格。执行一个在150 +0/-10的热处理，最少为60±5 。然后，室内等待24±2 小 时。
16034E 16334A Photo 3. Calibration - Short condition 图片3. 标度 – 简略条件
2. Calibration of Measuring Equipment
测量设备的标度
Open 开路 Next, please match Open to size L of the chip. Please refer to the following photograph for the Open condition. 接下来，请打开贴片的“L”尺寸 大小的距离进行“:开路”。 请参考以下开路条件的图片。
4. Measuring Procedure 测量程序
5. Additional Information
附加信息
1. Measuring Equipment
测量设备 Generally, we use the “LCR Meter” as instrument for measuring ‘Capacitance Value’ and ‘D.F.’. Typical LCR Meters is “4284A” and “4286A” of Agilent Technologies. We can proceed testing including HI-CAP.(1uF≦Capacitance Value)
16034E 16334A Photo 4. Calibration – Open Condition 图片4. 标度 – 开路条件
3. Q/D.F. Specification & Test Condition
Q/D.F.的规格和测试条件（MLCC）
1. MLCC - General Series -
W.V. = 6.3V : D.F. 0.15
10uF : 1.0±0.1 kHz, AC 1±0.2 V(r.m.s.)
10uF : 120±24Hz, AC 0.5±0.1 V(r.m.s.)
<Note> This is the specification for our standard items. Perform a heat treatment at 150 +0/-10℃ for 60±5 min. and then, let sit for 24±2 hrs. at room condition. 这是我们标准项目的规格。执行一个在150 +0/-10的热处理，最少为60±5 。
-
-
Compensation Type
Specification
Q
D.F.
-
Test Method
Applying Frequency,Voltage
-
X7R/B/R
-
(R7/B1/R1)
Class 2
X5R/B
-
(R6/B3)
High Dielectric Type X7S/X6S
-
(C7/C8)
<Note>
C 10uF : W.V. 10V : 1±0.1 kHz, AC 1±0.2 V(r.m.s.) *) W.V. 6.3V : 1±0.1 kHz, AC 0.5±0.1 V(r.m.s.)
C 10uF : 120±24Hz, AC 0.5±0.1 V(r.m.s.)
This is the specification for our standard items. Perform a heat treatment at 150 +0/-10℃ for 60±5 min. and then, let sit for 24±2 hrs. at room condition.
Y5V/F
-
(F5/F1)
Specification
Q
D.F.
Test Method
Applying Frequency,Voltage
-
30pF : Q 400+20C
30pF : Q 1000
-
-
C 1000pF : 1.0±0.2 MHz, AC 0.5 ~ 5.0 V(r.m.s.)
C 1000pF : 1.0±0.1 kHz, AC 1±0.2 V(r.m.s.)
1. Measuring Equipment (Fixture)
测量设备（固定设备）
The measurement test fixture should choose the one suitable for the LCR meter. The typical test fixture used for the chip type is as followings. There are two type measurement test fixture. The one like 16034E, we put a chip at certain spot of the test fixture, and chip is measured by putting a pin to edge side of a chip. The other like 16334E, the shape is tweezers, we grip both ends of a chip and measure. 测试治具应该选择一个合适于LCR测定计的测试治具。 典型的适应于贴片类型测试治具如下所示。 有两种测量测试治具。 其中一个如16034E，将一个贴片放测试治具的测试点，然后贴片就会被一个顶针的一边所测量。 另外如16334E，形状是镊子，紧夹着一个贴片的两端进行测试。