波分传输工程中对AGILENT86100宽频示波器的使用(020513)

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agilent信号分析仪操作步骤.doc

Agilent信号分析仪操作步骤1，矢量信号分析仪功能进入出现频率设置界面设置中心频率：双击center旁边的数字，在弹出的窗口设置频率和单位。

设置扫宽：双击Span旁边的数字，一般都将其设置为8Mhz设置range 单击range旁边的数字按向下键将波形图调至中心位置。

（-20dbm左右）选择菜单中的MeasSetup——Demodulator——Digital Demod。

进入数字信号分析功能。

选择图形个数查看星座图（双击左侧绿色方框，在弹出的对话框中选择constellation）查看I眼图（双击左侧绿色方框，在弹出的对话框中选择I-Eye）查看Q眼图（双击左侧绿色方框，在弹出的对话框中选择Q-Eye）进入扫频仪后界面如下设置起始频率，选择功能键Stop Freq设置终止频率，选择Center Freq设置中心频率。

按控制面板上的SPAN x Scale键出现如下界面，选择功能键Span设置扫宽按控制面板上的AMPTD y Scale键出现如下界面，选择功能键More 1of2选择Y Axis Unit 设置电平的单位。

按控制面板上的Trace Delecter键，选择功能键盘Trace Average后出现平滑的曲线。

按控制面板上的Input/Output键，选择功能键RF Input [AC，50欧]，选择75欧。

按控制面板上的BW键，出现如下界面。

分别对RBW和VBW进行设置使曲线接近平滑，建议RBW设置为500-600khz左右，VBW设置为20khz左右，这样兼顾了曲线的平滑与扫频的速度。

按控制面板上的Maker 键后输入频率与单位，设置游标。

按控制面板上的Maker Function后可以选择有一定带宽范围的游标，出现如下界面。

选择功能键Band/Interval Density。

选择功能键Band Adjust调整宽度，如需关闭选择Maker Function Off。

频谱仪使用说明

频谱仪使用简单指导目录频谱仪使用简单指导 (1)设备连接 (1)主界面 (2)扫频设置 (3)频段输入操作 (4)设置起始频段 (4)设置结束频段 (5)扫频操作 (5)干扰排查 (6)设备连接将频谱仪与天线（八木天线、吸顶天线）相连，详见下图：连接设备后确定天线与频谱仪连接处扭紧。

主界面扫频设置在扫频之前需要输入要扫的频段，如上图所示1按钮，开始设置起始频段与结束频段。

频段输入操作如WCDMA上行起始频段1920MHz，输入完1920后选择MHz单位，ENTER确认，输入完毕。

设置起始频段按F3键设置起始频段。

设置结束频段按F4键设置结束频段。

扫频操作将起始结束频段设置完毕后开始扫频，扫频时用天线对干扰区域进行排查，排查干扰区时不可移动过快，如本套设备天线为八木天线为垂直极化天线，要垂直于地面，如下图所示：干扰排查设置完起始频段与结束频段后，开始干扰排查，设备主界面显示如下：按F1按钮可以观察该频段的中心频点，如上图所示中心频点为1.95GHz，如果在该中心频点附近扫到较强下行信号，则会对我们设定的频段（WCDMA上行频段）产生一定干扰，造成RTWP抬升。

具体频点如下图所示：此处可以看出主界面共分为10个单元格，红色框取区域为检测到的信号强度，WCDMA上行频段为1920-1980MHz，即每个单元格为6MHz，如在单元格3处扫到将强信号，则在1938MHz频点处存在干扰源，如小灵通PHS下行频段在1920MHz左右，确定干扰频点、干扰源方向后，延干扰源方向移动，观察干扰变化强弱，再选取另外位置对干扰源进行第二次扫频测试，取前后两次扫频路线交点，可大致确定干扰源存在，具体模拟如下图所示：在未确定干扰源位置时可结合后台RTWP值较高的几个小区主覆盖方向做交集，大致确定干扰源所在范围。

示波器带宽限制怎么调示波器是如何工作的

示波器带宽限制怎么调示波器是如何工作的示波器带宽是指输入一个幅度相同，频率变化的信号，当示波器读数比真值衰减3dB时，此时的频率即为示波器的带宽。

也就是说，输入信号在示波器带宽处测试值为真值示波器带宽是指输入一个幅度相同，频率变化的信号，当示波器读数比真值衰减3dB时，此时的频率即为示波器的带宽。

也就是说，输入信号在示波器带宽处测试值为真值—3dB，带宽不是示波器能显示的最高频率。

一般情况下，示波器带宽应为所测信号最高频率的3～5倍。

与示波器带宽规格紧密相关的是其上升时间参数。

具备高斯频响的示波器，依照10%到90%的标准衡量，上升时间约为0.35/fBW。

具备最大平坦频响的示波器上升时间规格一般在0.4/fBW范围上，随示波器频率滚降特性的陡度不同而有所差异。

假如在进行上升时间和下降时间参数测量时允许20%的定时误差，那么带宽为1GHz的示波器就能充分该数字测量应用的要求。

但假如要求定时精度在3％范围内，那么接受带宽为2GHz的示波器更好。

示波器带宽限制怎么调？在的通道按钮里面，你按下CH1按钮，显现的菜单上应当就有带宽限制的选项了大多数示波器中存在限制示波器带宽的电路。

限制带宽开启后，可以削减显示波形中不时显现的噪声，显示的波形会显得更为清楚。

但请注意，在除去噪声的时候，带宽限制同样会削减或者除去高频信号成分。

鼎阳示波器，带宽限制开启后将有效滤除20M以上的噪声信号—专业分析仪器服务平台,试验室仪器设备交易网,仪器行业专业网络宣扬媒体。

相关热词：等离子清洗机,反应釜,旋转蒸发仪,高精度温湿度计,露点仪,高效液相色谱仪价格,霉菌试验箱,跌落试验台,离子色谱仪价格,噪声计,高压灭菌器,集菌仪,接地电阻测试仪型号,柱温箱,旋涡混合仪,电热套,场强仪万能材料试验机价格,洗瓶机,匀浆机,耐候试验箱,熔融指数仪,透射电子显微镜。

示波器种类及工作原理示波器用来测量交流电或脉冲电流波的形状的仪器，由电子管放大器、扫描振荡器、阴极射线管等构成。

Agilent(86140B)光谱分析仪使用指导书

Agilent (86140B) 光谱分析仪操作指导书—测试
文件编号版本号生效日期
5.使用注意:
提示：常见问题解决指南：
1）仪器必须安放在温度变化小,无振动的场所,温度变化和振动会导致光谱分析仪内 1. 无法设置或无光状态：请确认是否连接宽带光
部的单色仪光路失准从而造成幅度误差；
源或打开宽带光源输出；
第6页共9页
Agilent (86140B) 光谱分析仪操作指导书—测试
E.扫描参数设置（1）深度扫描（默认设置-85dB，常应用于双级隔离器）
（2））普通扫描（默认设置 1KHz，常应用于单级隔离器）
第7页共9页
文件编号版本号生效日期
E.说明：设置扫描参数(普通模式设为 1KHz,深度扫描为-85dB)[图 10—图 11] [图 10]Amplitude（21）--Sensitivity（22） ---85—dB /{[图 11]Bangwith Sweep（23）—Vide BW（24）—1—KHz.}（大括号中为普通设置）
参考：关于标识操作(MARKER)（内容相关：[5 页图 9] 基本标识及设定:MARKER 、SET MARKER（ACTIVE MARKER）、 MARKER SETUP 带宽标识：BANDWIDTH MARKER（-3dB,-6dB,-10dB）峰/谷搜索:SEARCH MODE(---PEAK MODE -ACTIVE MARKER --PEAK SEARCH(最大值搜索) SEARCH MODE — PIT MODE -ACTIVE MARKER --PIT SEARCH(最小值搜索) 相关操作：NEXT PEAK DOWN、NEXT PEAK LEFT 、NEXT PEAK RIGHTT 改变中心波长标识：MARKER TO CENTER 三角标识：DELTA MARKER 波长标识：Wavelength Marker

Agilent安捷伦功率器件分析仪-操作指导说明

Scale：选择曲线显示格式
Anode：二极管正极接电流源（依据
规格书测试条件合理选择，大于 1A
VF 测试-方法二
则需要选择 HC 通道） VfStart：开始电压
3.2 3.2 参数设置
VfStop：结束电压 VfStep：每个测试点电压间隔值
均有“Force”和“Sence”双孔，实际内部相当于短路，即通过双线并绕以降低测试误差；应用 HC 模块时，下方 low 双孔默认接地即可；可看成将 HP/HC/HV 作为电源正极， GNDU1 作为电源负极
Agilent 安捷伦功率器件分析仪-操作指导说明
测试台说明： 2.2
2.2 接线模块
2.3 数据读取
▷ 点击“ ”启动测试；
完成测试后点击自动刻度； List Display 下拉数据，可以查看每个
Vr 下的反向漏电流 Ir，一般 Ir=250μA 时对应的最小 Vr 作为击穿电压
Agilent 安捷伦功率器件分析仪-操作指导说明
VF 测试 3.1
3.1 连线
按测试电路原理图，正确连接各接线柱。
IfSpec@Vf：自动读取所设正向电流
下对应的正向压降
Agilent 安捷伦功率器件分析仪-操作指导说明
▷ 点击“ ”启动测试；
完成测试后点击自动刻度；
VF 测试-方法一 List Display 下拉数据，可以查看每个
3.3
If 下的正向压降 Vf
3.3 数据读取
Agilent 安捷伦功率器件分析仪-操作指导说明
依次从 Application Test 选择 PowerDiode，再选择 Ir-Vr 测试模块：
VR/IR 测试 2.2

Agilgent86143B测试使用指导书

Agilgent86143B测试使用指导书Agilent 86145B 测试使用指导书目录目录第一部分Agilent 86145B 的功能菜单 (2)1.1 仪表概述 (2)1.1.1功能键 (2)1.1.2测试端子 (3)1.1.3菜单结构 (3)1.1.4开机与关机 (3)1.2仪表的功能 (4)1.2.1System（系统设置） (4)1.2.2 SOFTKEY PANEL（设置测试环境） (6) 1.2.3 Appl's（测试固定模式选择） (7)1.2.4 Save/Recall (8)第二部分测试指导 (9)2.1 光源测试 (9)2.1.1 常测指标 (9)2.1.2 测试操作 (9)2.1.3 结果打印 (10)2.2 波分光谱测试 (10)2.2.1 常测指标 (10)2.2.2 测试操作 (10)2.2.3 结果查看与打印保存 (11)2.3 光放大器测试 (11)2.3.1 常测指标 (11)2.3.2 测试操作 (11)2.3.3 结果查看与打印保存 (12)2.4 无源器件测试 (12)2.4.1 常测指标 (12)2.4.2 测试操作 (12)第一部分Agilent 86145B 的功能菜单1.1 仪表概述1.1.1功能键图1-1 Agilent 86145B面板示意图上图为Agilent 86145B面板图，主要功能键常用功能简单描述如下：屏幕下方功能键：Auto Meas：自动测试；Auto Align：自动校准，每次测试时，输入一个G.692的标准光，按该键进行自动校准，可以使测试的值更准确可靠；Print：打印；Save/Recall：保存/读取测试设置；System ：系统设置（包括波长校准）Appl's：四种常用的测试模式；右方按键：1、屏幕右方有七个空白的按键，是用来选择屏幕上相应位置的选项的；2、数字键及旋钮，是用来输入数字的；3、SOFTKEY PANEL 区五个按键，用来设置测试选项，例如波长范围等等；4、CURSOR 区有滑鼠，可以使用来通过屏幕上的菜单进行设置，它的作用与通过面板上的按键设置有殊途同归之功效。

AgilentEB频谱解析总结计划仪使用说明

Agilent E4402BESA-E Series Spectrum Analyzer使用方法简介宁波之猫2009-6-17目录1简介Agilent ESA-E系列是能适应将来需要的Agilent中性能频谱剖析仪解决方案。

该系列在丈量速度、动向范围、精度和功率分辨能力上，都为近似价位的产品成立了性能标准。

它灵巧的平台设计使研发、制造和现场服务工程师能自定义产品，以知足特定测试要求，和在需要时用新的特征升级产品。

该产品采纳单键丈量解决方案，并拥有易于阅读的用户界面和高速丈量的性能，使工程师能把较少的时间用于测试，而把更多的时间用在元件和产品的设计、制作和查错上。

2.面板操作区1.察看角度键，用于调理显示，以适于使用者的察看角度。

2.Esc 键，能够撤消输入，停止打印。

3.无表记键，实现左侧屏幕上紧挨的右侧栏菜单的功能。

4. Frequency Channel （频次通道）、Span X Scale（扫宽 X 刻度）和 AmplitudeY scale（幅度 Y 刻度）三个键，能够激活主要的调理功能（频次、X 轴、 Y 轴）并在右侧栏显示相应的菜单。

5.Control （控制）功能区。

6.Measure（丈量）功能区。

7.System（系统）功能区。

8.Marker （标志）功能区。

9.软驱和耳机插孔。

10.步进键和旋钮，用于改变所选中有效功能的数值。

11.音量调理。

12.外接键盘插口。

13.探头电源，为高阻抗沟通探头或其余附件供给电源。

14.Return 键，用于返回先前选择过的一级菜单。

15.Amptd Ref Out ，可供给－ 20dBm 的 50MHz 幅度参照信号。

16.Tab（制表）键，用于在界线编写器和修正编写器中四周挪动，也用于在有 File 菜单键所接见对话框的域中挪动。

17.信号输进口（50Ω）。

在使用中，接 50Ω BNC 电缆，探头上一定串连一隔直电容（ 30PF 左右，陶瓷封装）。

安捷伦示波器使用方法..课件

通过操作界面上的导出按钮或菜单中的导出选项来进行，选择存储位置和文件格式后即可保存。
数据处理方法
可以对导出的数据进行进一步处理和分析，如计算均值、标准差等统计参数，或进行信号处理如
滤波、傅里叶变换等。
04
示波器的高
频率特性分析
频率特性分析是示波器在信号处理和电子工程领域的重要应用之一。
03
示波器基本操作
波形显示与调节
01
02
03
垂直灵敏度调节
用于控制波形的幅度大小，通过调节衰减器或探头来进行。
水平时基调节
用于控制波形的显示时间范围，通过调节时基旋钮或菜单中的时间设置来进行。
波形触发调节
用于使波形稳定显示，通过调节触发源、触发电平、触发模式等参数来实现。
触发方式与调节
数字信号捕获与分析
总结词
示波器可以准确地捕获和分析数字信号，帮助工程师调试和优化数字系统。
详细描述
使用示波器观察和分析数字信号的时域和频域特性，检查信号的质量和完整性，帮助工程师找出系统故障和优化设计方案。
高频信号测量
总结词
示波器适用于高频信号的测量和分析，满足通信、雷达等高频应用的需求。
触发源选择
选择需要触发的信号源，可以是通道1、通道2或外部触发。
触发电平调节
用于控制触发信号的幅度阈值，以适应不同情况的波形显示。
触发模式选择
包括自动、正常、单次等模式，以满足不同观察需求。
存储与导出数据
数据存储方式
支持将波形数据保存为多种文件格式，如CSV、PDF、PNG等。
数据导出步骤
安捷示波器使用方法件
• 示波器概述 • 示波器使用前的准备 • 示波器基本操作 • 示波器的高级应用 • 示波器的维护与保养 • 示波器的应用案例

安捷伦示波器使用方法..

如果您看到波形，但方波形状不正确，与上面所示有所不同，执行步骤 “补偿示波器探头” 。如果未看到波形，请确保电源符合要求、示波器加电正确、探头已牢固连接到前面板示波器通道输入 BNC 和 Probe Comp 端子上。
2、显示屏解释
状态行显示屏的最上一行包括垂直、水平和触发设置信息。显示区域显示区域包括波形采集、通道标识符以及触发和接地电平指示器。每个通道的信息以不同颜色显示。测量线此线一般包含自动测量和游标结果，但也可以显示高级触发设置数据和菜单信息。软键使用软键可以为所选的模式或菜单设置其他参数。
因技术得品质
以服务
安捷伦示波器使用方法
部门：作者：日期：
目录
1、示波器按键功能介绍 2、示波器常用操作 3、注意事项
目录
1、示波器按键功能介绍 2、示波器常用操作 3、注意事项
1、示波器实物图
2、面板介绍
3、按键功能说明
1. 电源开关按一次打开电源；再按一次关闭电源。 2. 亮度控制顺时针旋转提高波形亮度，逆时针旋转降低亮度。您可以像操作模拟示波器那样通过改变亮度控制显示信号细节。。 3. USB 主机端口连接
10. 通道输入 BNC 连接器将示波器探头或 BNC 电缆连接到BNC 连接器。这是通道的输入连接器。 11. Label 键按此键访问 Label 菜单，可以输入标签以识别示波器显示屏上的每个轨迹。 12. File 键按 File 键访问文件功能，如保存或调用波形或设置。或按 Quick Print 键打印显示屏上的波形。 13. Utility 键按此键访问 Utility 菜单，可以配置示波器的 I/O 设置、打印机配置、文件资源管理器、服务菜单和其他选项。 14. 触发控制装置些控制装置确定示波器如何触发以捕获数据。 15. 运行控制装置按 Run/Stop 使示波器开始寻找触发。 Run/Stop键将点亮为绿色。如果触发模式设置为“Normal” ，则直到找到触发才会更新显示屏。如果触发模式设置为“Auto”，则示波器寻找触发，如果未找到，它将自动触发，而显示屏将立即显示输入信号。在这种情况下，显示屏顶部的 Auto 指示灯的背景将闪烁，表示示波器正在强制触发。再次按 Run/Stop 将停止采集数据。键将点亮为红色。现在您可以对采集的数据进行平移和放大。按 Single 进行数据的单次采集。键将点亮为黄色，直到示波器触发为止。 16. Waveform 键使用 Acquire 键可以设置示波器以正常、峰值检测、平均或高分辨率模式进行采集，还可打开或关闭实时采样。使用Display 键可以访问能够选择无限余辉菜单、打开或关闭矢量或调节显示网格亮度。 17. 水平延迟控制装置示波器运行时，使用此控制装置可以设置触发点相应的采集窗口。当示波器停止时，可以转动此旋钮在数据中水平平移。这样就可以在触发之前（顺时针转动旋钮）或触发之后（逆时针转动旋钮）查看捕获的波形。

86120B Agilent安捷伦波长计指标与说明

Description:The HP86120B Multi-Wavelength Meter is a Michelson interferometer-based instrument that measures wavelengthand optical power of laser light in the700to1650nm wavelength range. Simultaneous measurements of multiple laserlines are performed allowing measurements of WDM(wavelength division multiplexed)signals and multiple lines of Fabry-Perotlasers.Each laser line is assumed to have a linewidth of less than10GHz.This unit has the following specifications:WavelengthRange:700to1650nm(182to428THz)Absolute accuracy:laser lines separated by>30GHz±3ppm(±0.005nm at1550 nm,±0.004nm at1310nm)Differential accuracy:±2ppmMinimum resolvable separation:20GHz(0.16nm at1550nm,0.11nm at1300nm) (equal power lines input)Display resolution:0.001nm,normal update mode;0.01nm,fast update mode PowerCalibration accuracy:±0.5dB(at±30nm from780,1310,and1550nm) Flatness:(30nm from any wavelength)1200to1600nm l±0.2dB700to1650nm l±0.5dBLinearity:±0.3dBPolarization dependence:1200to1600nm±0.5dB700to1650nm l±1.0dBDisplay resolution:0.01dB描述：惠普86120B波长计是一个为Michelson基础的仪器波长的措施和光功率在700至1650nm的波长范围的激光。

86100A简易使用说明

86100A简易使用说明Agilent 86100A 常见指标的测量步骤由于该示波器只有2.5G和10G的滤波器，故仅限于2.5G和10G 设备光口/电口的测量。

86100A示波器配有两个模块：1)Agilent 86105A;2)Agilent 83493A一．以2.5G为例讲述其常见指标的测量方法a.开机校表开机后将两个模块中光输入信号端口用光纤帽子套上，然后选择菜单Calibrate ?All Calibrations ?Vertical(Amplitude),选择Calibrate Left Module ?Continue。

校表完毕，拔下光纤帽子。

b.光信号输入及仪表基本设置将2.5G输出光信号与模块2中Optical Input端口用光纤相连，Optical Output端口(提取时钟信号)与模块1中光输入信号端口用光纤相连?按仪表上Channel 1键，选择光通道?在模块2中SELECT(Trigger On Data)中选择2488Mb/s ?在仪表下方Trigger(source)中选择Right Module.c. 光眼图的测量按仪表上Eye/Mask Mode按钮?选择屏幕左侧Mask Test菜单?在Open Mask中选择STMO16_OC48.msk模板?在Filter中将Filter 设置为on，Filter选择2.488Gb/s ?按仪表右上侧Run键?按仪表上Auto Scale 键开始自动扫描?按屏幕左侧Mask Test菜单下Start Mask Test键，开始套模板。

如果屏幕下侧Mask项中total wfms 达到1000个点无failed smpls,则认为眼图合格。

d. 消光比，上升时间，下降时间，相关抖动（峰峰值）的测量在c步骤的基础上，选择屏幕左侧NRZ菜单? NRZ Eye Measure ?分别依次选择Extinction Ratio,Rise Time,Fall Time,Jitter P_P项?按仪表右上侧Auto Scale键重新自动扫描?在屏幕下侧按Measure键，可读出以上4项的测量值。

Agilent-86100A眼图仪设定指引内容

Agilent-86100A眼图仪设定指引内容Agilent 86100设定指引内容设定指引是您可以使用仪器去执行许多一般工作的逐步程序1、NRZ眼图2、RZ眼图3、示波器量测4、TDR/TDT量测5、模板测试6、校准7、设定和使用印表机8、管理的档案NRZ眼图量测设定指引设定指引是您可以使用仪器去执行许多一般工作的逐步程序1、消减率2、颤动3、平均功率4、交叉百分比5、上升时间6、下降时间7、位元率8、0位准9、1位准10、眼状高度11、眼状宽度12、信噪比13、信号周期失真14、眼状振幅消减率概念您可以量测NRZ肯眼图的消减率。

消减率是眼图的1位准和0位准比率1、选择NRZ的Eye/Mask(眼状./模板)模式2、执行消减率校准3、定义眼状视窗界限。

4、定义量测单位5、执行消减率量测选择NRZ眼状/模板模式A）按仪器前面板上的Eye /Mask Mode(眼状/模板模式)按钮。

您也可以开启（Setup(设定)功能表然后按一下/轻触Eye /Mask Mode。

B）如果仪器处于RZ眼状模式，请按一下/轻触位于仪器工具列底下的RZ/NRZ按钮以显示NRZ眼状模式量测C）按仪器前纲板上的Autoscale (自动刻度选择)按钮以便快带将眼图的水平和垂直的水平和垂直刻度最佳化。

您也可以开启Control(控制)功能表然后按一下/轻触Autoscale.执行减率校准执行消减率校准A）在Cakuvrate(校准)功能表上选择All Calibrations(所有校准)。

All Calibrations(所有校准)对话方会开启。

B）按一下/轻触Extinction ratio(消减率)标识。

消减率标识页面开启并允许您在仪器频道之一减謴校准确。

C）移除所有至即将进行校准频道的讯号D）按一下/轻触（Calibrate (校准)。

将会出现进度表作为校准状太的目测指示器E）完成校准时按一下/轻触Close关闭。

定义眼状视窗界限A）请在Measure(测量)功能表选取Configure Meas (设定量测)。

示波器使用方法和步骤及相关注意事项

示波器使用方法和步骤及相关注意事项示波器是一种用途十分广泛的电子测量仪器。

它能把肉眼看不见的电信号变换成看得见的图像，便于人们研究各种电现象的变化过程。

示波器利用狭窄的、由高速电子组成的电子束，打在涂有荧光物质的屏面上，就可产生细小的光点（这是传统的模拟示波器的工作原理）。

在被测信号的作用下，电子束就好像一支笔的笔尖，可以在屏面上描绘出被测信号的瞬时值的变化曲线。

利用示波器能观察各种不同信号幅度随时间变化的波形曲线，还可以用它测试各种不同的电量，如电压、电流、频率、相位差、调幅度等等。

示波器使用方法用示波器能观察各种不同电信号幅度随时间变化的波形曲线，在这个基础上示波器可以应用于测量电压、时间、频率、相位差和调幅度等电参数。

下面介绍用示波器观察电信号波形的使用步骤。

1、示波管和电源系统1）电源（Power）：示波器主电源开关。

当此开关按下时，电源指示灯亮，表示电源接通。

2）辉度（Intensity）：旋转此旋钮能改变光点和扫描线的亮度。

观察低频信号时可小些，高频信号时大些。

3）聚焦（Focus）：聚焦旋钮调节电子束截面大小，将扫描线聚焦成最清晰状态。

4）标尺亮度（Illuminance）：此旋钮调节荧光屏后面的照明灯亮度。

正常室内光线下，照明灯暗一些好。

室内光线不足的环境中，可适当调亮照明灯。

2、荧光屏根据被测信号在屏幕上占的格数乘以适当的比例常数（V/DIV，TIME/DIV）能得出电压值与时间值。

根据输入通道的选择，将示波器探头插到相应通道插座上，示波器探头上的地与被测电路的地连接在一起，示波器探头接触被测点。

示波器探头上有一双位开关。

此开关拨到X1位置时，被测信号无衰减送到示波器，从荧光屏上读出的电压值是信号的实际电压值。

此开关拨到X10位置时，被测信号衰减为1/10，然后送往示波器，从荧光屏上读出的电压值乘以10才是信号的实际电压值。

3、垂直偏转因数和水平偏转因数每个波段开关上往往还有一个小旋钮，微调每档垂直偏转因数。

安捷伦示波器使用方法

安捷伦⽰波器使⽤⽅法Jitter Analysis Techniques Using an Agilent Infiniium OscilloscopeProduct NoteIntroductionWith higher-speed clocking and data transmission schemes in the computer and communications industries, timing margins are becoming increasingly tight.Sophisticated techniques are required to ensure that timing margins are being met and to find the source of problems if they are not.This product note discussesvarious techniques for measuring jitter and points out theiradvantages and disadvantages. It describes how to set up an Agilent Infiniium oscilloscope to make effective jitter measure-ments and the accuracy of these measurements. Some of themeasurement techniques are only available on Agilent 54845A/B and 54846A/B oscilloscopes with version A.04.00 or later software.These measurement techniques are indicated as such in the text.Jitter FundamentalsJitter is defined as the deviation of a transition from its ideal time.Jitter can be measured relative to an ideal time or to another transition. Several factors can affect jitter. Since jitter sources are independent of each other,a system will rarely encounter a worst-case jitter scenario. Only when each independent jitter source is at its worst and is aligned with the other sources will this occur. As a result, jitter is statistical in nature. Predicting the worst-case jitter in a system can take time.Jitter can be broken down into two categories:Random jitter is uncorrelated jitter caused by thermal or other physical, randomprocesses. The shape of the jitter distribution is Gaussian.For example, a well-behaved phase lock loop (PLL) wanders randomly around its nominal clock frequency.?Deterministic or systematic jitter can be caused by inter-symbol interference,crosstalk, sub-harmonicdistortion and other spurious events such as power-supply switching. It is important to understand the nature of the jitter to help diagnose its cause and, if possible, correct it. Deterministic jitter is more easily reduced or eliminated once the source has been identified.Jitter Measurement TechniquesThis product note will discuss four methods that can be used to characterize jitter in a system:Infinite persistenceHistogramsMeasurement statisticsMeasurement functionsInfinite PersistenceAgilent’s Infiniium oscilloscopes present several different views of jitter. One way to measure jitter is to trigger on one waveform edge and look at another edge while infinite persistence is turned on. To use this technique, set up the scope to trigger on a rising or falling edge and set the horizontal scale to examine the next rising or falling edge. In the Display dialog box, set persistence to infinite.This technique measurespeak-to-peak jitter and does not provide information about jitter distribution. Infinite persistence is easy to set up and will acquire data quickly, giving you the best chance to see worst-case jitter. However, since the tails of the jitter distribution theoretically go on forever, it will take a long time to measure the worst-case, peak-to-peak jitter.It is important to understandtheerror sources of this measurement. This technique is subject to oscilloscope trigger jitter–the largest contributor to timingerror in an oscilloscope. Trigger jitter results from the failure to place the waveform correctly relative to when a trigger event occurs. Since the infinite persistence technique overlaps multiple waveform acquisitions onto the scope display, and each acquisition is subject to trigger jitter, the accuracy of this technique can be limited. If your jitter margins are being met using this technique, then more advanced measurement techniques are not necessary. This product note will discuss Infiniium’s timebase and trigger specifications in detail in alater section.HistogramsThis technique not only shows worst-case jitter, but also gives a perspective on jitter distribution. Histograms do not acquire infor-mation as quickly as infinite persistence since each acquisition must be counted in the histogram measurement.To set up a histogram, trigger on an edge and set the horizontalscale and position so that you canview the next rising or fallingedge. In the Histogram dialog box,turn on a horizontal histogramand set both Y window markersto the same voltage. For example,if a clock threshold is at 800 mV,set both Y markers to this voltage.Set the X markers to the left andright of the edge (figure 1). Figure 1. Histogram of edge showing bi-modal distribution23It is often possible to determine if the jitter is random or deter-ministic by the shape of the histogram. Random jitter will have a Gaussian distribution.Infiniium displays the percentage of points within mean +/- 1, 2,and 3 standard deviations to help in determining how Gaussian the distribution is. For a Gaussian distribution these values should be 68%, 95%, and 99.7%, respec-tively. Non-Gaussian distributions usually indicate that the jitter has deterministic components.This technique has the same limitation on accuracy as the infinite persistence technique.Multiple acquisitions contribute to the histogram and they all contain the oscilloscope trigger jitter mentioned above. Measurement StatisticsThe next method involvescomputing statistics on waveform measurement results. For example,the scope can measure the period of a waveform on successive acquisitions. Simply drag the period measurement icon to the waveform that is to be measured.The statistics will indicate the mean, standard deviation, and min and max of the period measurements. You can let the scope run for a while to determine the amount of clock jitter present. This measurement is not subject to trigger jitter because it is a delta-time or relative measure-ment. Even if the waveform is not placed correctly relative to the trigger, the edges are measuredaccurately relative to each other.Figure 2. Setting up a jitter measurementThis measurement is subject to the timebase stability of the instrument, which is typically very good. This is a valid measurement technique but is slow to gather statistical information. Since the scope acquires a waveform, makes a measurement, and then acquires a waveform at a later time, most clock periods are not measured.With this technique, it is impossible to see how the period jitter varies over short periods of time. For example, if you have spread-spectrum clocking, this measurement will lump the slowest and fastest periods together.The Agilent 54845A/B and54846A/B Infiniium oscilloscopes can compute statistics on every instance of a measurement in asingle acquisition. To enable this capability, select the Jitter tab,then check “Measure all edges” in the Measurement Definitions dia-log box (figure 2).For example, instead of only measuring the first period on every acquisition or trigger event,every period can be measured and statistics gathered. This greatly increases the speed at which statistics are gathered and reduces the overall time to make jitter measurements. Statistics are accumulated across allmeasurements in the acquisition and across acquisitions.Pressing “Clear Display” will reset the measurement statistics.This feature is useful if you are probing the clock at different locations and want to reset the measurements.It is important to set up the scope correctly to make effective jitter measurements. Set the vertical scale of the channel being measured to offer the largest waveform that will fit on screen vertically. This will make the most effective use of the scope’s A/D converter.The scope should be set toreal-time acquisition mode inthe Acquisition dialog box. Since equivalent-time sampling can combine samples from different acquisitions, the scope’s trigger jitter would adversely affect jitter measurements. The averaging function should be turned off since, again, this combines multiple acquisition data.You may want to set the scopeto its maximum memory depth. This will make the scope less responsive to operate, but the scope can make many measure-ments on a single acquisition. Since jitter measurements are statistical, many measurements are desirable. Taking many acquisitions of small records will give a more random selection but will take longer than fewer large acquisitions. Having extremely deep memory is not necessary to getting good jitter measurements. Normally, measurements aremade at 10%, 50%, and 90% of thewaveform amplitude. This isconvenient for quickly makingmeasurements; however, whenmaking measurements acrossacquisitions and combiningtheir statistics this is not thebest solution.In the Measurement Definitiondialog box, Thresholds tab, themeasurement thresholds shouldbe set to absolute voltages. Forexample, if you are makingcycle-cycle jitter or periodmeasurements, set the middlevoltage threshold to your clockthreshold. Set the upper andlower voltage thresholds toroughly +/- 10% of the signalamplitude in voltage. This willestablish a band around thethreshold that the edge must gothrough to be measured and willeliminate false edge detection.In addition to the period jitter measurement, the cycle-cycle jitter measurement uses the same technique. The cycle-cycle jitter measurement, available on Agilent 54845A/B and 54846A/B oscilloscopes, is the differenceof two consecutive period measurements.Pi – P(i-1), 2 ≤i ≤nWhereP is a period measurement and n is the number of periods inthe waveform.Cycle-cycle jitter is a measure of the short-term stability of a clock. It may be acceptable for the clock frequency to change slowly over time but not vary from cycle to cycle. For this measurement, every period in the acquisition is measured regardless of how the “Measure all edges” selection is set. In this case, the statistics represent all of the cycle-cycle jitter measurements in one acquisition, or all acquisitionsif the scope is running.If absolute clock stability is required, then a period measurement should be made. If your system can track with small changes in the clock frequency, then cycle-cycle jitter should be measured.Again, if your timing marginsare being met with thistechnique, more advancedtechniques are not necessary. Itis only fairly recently that tightertiming margins have causedengineers to need other jittermeasurement techniques.45Measurement FunctionAgilent 54845A/B and 54846A/B Infiniium oscilloscopes can plot measurement results correlated to the signal being measured. For example, if every period is meas-ured, as in the case above, the measurement function will plot period measurement results on the vertical axis, time-correlated to the waveform that the period measurement is measuring (figure 3).In this example, the secondperiod is slightly longer than the first. The third period is shorter than the second. Also notice that the lengths of the measurement function lines correspond to the period and their placement corresponds to channel 1 because we are measuring period on channel 1.Using this technique, the shape of the jitter is apparent. For example, with spread-spectrum clocking you can see the modulation frequency as the period gets progressively slower and faster. This allows you to see sinusoidal shapes or other patterns in the measurement function plot (figure 4). It is also possible to correlate poor jitter results with the source waveform that caused them. This can aid not only in your design but can also ensure that the scope is measuring appropriate voltage levels when gatheringjitter statistics.Figure 3. Measurement function on a few cyclesFigure 4. Measurement function on many cyclesTo turn on the measurement function, first turn on the desired measurement to track. Measurements that can be tracked with the measurement function are rise time, fall time, period, frequency, cycle-cycle jitter, + width, - width and duty cycle. The measurement function is enabled in the Waveform Math dialog box (figure 5). Select a function that is a different color than the channel you are measuring to make it easier to see. Set the function operator to “measurement.” Select the measurement you wish to track and turn on the measurement function. The math function now plots the measurement results on the vertical axis, time-correlated to the channel being measured. Only one measurement function can be enabled at a time; however, the function can beset to track any of the currently active measurements listed above.Set up the acquisition by selectingthe maximum memory depth inthe Acquisition dialog box. Turnoff averaging and Sin(X)/Xinterpolation in the Acquisitiondialog box. Set the sample rateso that you are getting at leastseveral sample points on theedges that you are measuring.Measurements are made on thedata that is windowed by thescreen. To see something slowerthat may be coupling into yourclock, for example, you will needto compress the channel data onthe screen.Now that the memory depth andsample rate are fixed, you canadjust the horizontal scale sothat all of the acquired data ison screen. In order to make fulluse of the A/D converter andseparate the waveforms on thedisplay, you may want to split thegrid into two parts. If you havea very dense waveform that isbeing measured, it will be nearlyimpossible to see the measurementfunction on top of it. Turn on thesplit grid in the Display dialog box. Figure 5. Setting up a measurement function6Sources of Measurement ErrorIn this section we will examine some of the principal sources of jitter measurement error. For best accuracy, the scope should be making measurements at the same temperature as when the scope was last calibrated. If the temperature has varied by more than 5 degrees, the softwareself-calibration should be performed again. The Calibration dialog box shows the change from the calibration temperature. Trigger JitterThe most common source of error across multiple acquisitions is trigger jitter. This is the error associated with placing the first point and all subsequent points of the waveform relative towhen the trigger occurs.For Infiniium models 54830B, 54831B, and 54832B, trigger jitter is 8 ps RMS. For the 54845A/B and 54846A/B, trigger jitter is8ps RMS. Figure 6 shows a 54845B measuring its trigger jitter using its own aux out signal. If the jitter is Gaussian, youcan convert RMS jitter topeak-to-peak jitter by multiplyingthe RMS jitter by 6. Trigger jitteris only relevant if you aremeasuring absolute times asopposed to relative times. Forexample, the histogram techniquedescribed above has this errorsource, but a period measurementdoes not since it is a delta-time orrelative measurement.Figure 6. Histogram of trigger jitterThis source of error can also bepresent in period measurementsif the scope is in equivalent time.In equivalent time, the scope maycombine data points from multipleacquisitions. The scope alsocombines points from multipleacquisitions in real-time averagingmode. If it is possible, jittermeasurements should be maderelative to other edges inreal-time, non-averaged mode.78Sources of Measurement Error (continued)Timebase StabilityInfiniium uses a highly stable crystal oscillator as a source for the sample clock. Errors resulting from instability of the timebase are the least significant. Timebase stability is not a specified quantity but is typically 5 ps RMS for the 54845 and 54846. For the 54830,54831, and 54832, it is typically 2ps RMS. These measurements were made at the sametemperature as the calibration.Vertical NoiseErrors in the vertical portion of the signal path including the A/D converter and preamplifier also contribute to the scope’s jitter.Any misplacement of thewaveform vertically will translate through the slew rate of the signal into time error (figure 7). If the slew rate of the signal atthe point of measurement issteep, then the vertical error will translate into a small time jitter.If the slew rate is slow, however,this can be the most significantsource of error.Figure 7. How vertical errors contribute to time errorsAliasing and InterpolationFrom the previous section, it is clear that the signal should have a high slew rate to alleviate vertical errors. However, this can lead to signal aliasing. If the signal is not sampled sufficiently, significant time errors will be present up to the sample interval. When the scope makes measurements, it interpolates the samples above and below the measurement threshold to get the time of the level crossing. If the interpolation filter is enabled, up to 16interpolated points may be placed between two adjacent acquisition samples. Beyond this, linearinterpolation is used to determine the threshold crossing times.However, samples will only be added if the record length is less than 16K samples.A Case StudyTo illustrate how to use the jitter analysis capability of an Agilent Infiniium oscilloscope, let’s examine a typical problem. You suspect that your power supply or another slower speed clock is coupling into the main clock on the board that you are designing. In order to understand how to eliminate the problem, you would like to know the frequency and wave shape of the signal that is coupling into your clock. Traditionally, you would use an FFT magnitude spectrum and look at the side bands from the fundamental. For example, in figure 8 we have acquired a long record of a number of clock pulses and computed the FFT magnitude with a waveform math function. After we zoom in on the fundamental frequency of the clock, you can see side bands.If we take the difference in frequency from the fundamental to the nearest side band, we can determine the frequency of the coupling signal. In this example, it is measured at 198 kHz. We can also notice the odd harmonics and guess that the coupling signal would not be a sine wave. The resolution of the FFT will not give us a great deal of accuracy in determining the frequency, and we can not really see the shape of the coupling signal.To solve this problem using thejitter analysis capability, we needto think about the problem in adifferent way. If a slower signalwere modulating a higherfrequency signal, then we wouldexpect the period of the higherfrequency signal to get slightlylonger, then slightly shorter, etc.,according to the slower signal(figure 8). The measurementfunction method described earlierin this product note could beused to plot how the periodchanges across the waveform.To set up the scope, acquirethe channel data with a longacquisition record in real-timeacquisition mode. Put all of thewaveform on screen by settingthe sample rate to manual andadjusting the time per division.This will allow you to see how theperiod varies across the entireacquisition. In the MeasurementDefinitions dialog box, Jitter tab,set the control to Measure AllEdges (figure 2). Now, turn ona period measurement. In theMath dialog box, turn on theMeasurement function and setto the period measurement. Figure 8. FFT of clock910A Case Study (continued)You can now see how the period measurement varies across the signal (figure 9). Adjust the time per division until you can see several periods of the slower speed signal in the measurement function. To measure the frequency, use the markers or simply drag the frequencymeasurement to the measurement function. Using this technique, we measure 197 kHz and we can see that the signal is a square wave.This confirms that another signal on the board is coupling into the clock. Armed with this knowledge,we are better equipped to find a solution.SummaryThis product note presents several methods for measuring jitter with Agilent’s Infiniium oscilloscopes. The following quick reference will help you choose the best method for a number of circumstances. Infinite PersistenceShows absolute time or edge jitter Works best when the jitter to be measured is greater than the scope’s jitter Sets up easily ?Acquires data quickly ?Measures only worst-case,peak-to-peak jitterFigure 9. Measurement function showing coupling signalHistogramsShows absolute time or edge jitter Works best when the jitter to be measured is greater than the scope’s jitter Shows a distribution of the jitterHelps determine if the jitter is random or deterministic Measures worst-case, peak-to-peak jitter Measures RMS jitterMeasurement StatisticsShows worst-case, peak-to-peak delta time or measurement jitter Sets up easily Measurement FunctionsShows how measurements vary as a function of timeShows the shape and frequency of a jitter source Helps determine if the jitter is random or deterministic/doc/e26170104431b90d6c85c778.htmlAgilent Technologies’ Test and Measurement Support, Services, and AssistanceAgilent Technologies aims to maximize the value you receive, while minimizing your risk and problems. We strive to ensure that you get the test and measurement capabilities you paid for and obtain the support you need. Our extensive support resources and services can help you choose the right Agilent products for your applications and apply them successfully. Every instrument and system we sell has a global warranty. Support is available for at least five years beyond the production life of the product. Two concepts underlie Agilent's overall support policy: "Our Promise" and "Your Advantage."Our PromiseOur Promise means your Agilent test and measurement equipment will meet its advertised performance and functionality. When you are choosing new equipment, we will help you with product information, including realistic performance specifications and practical rec-ommendations from experienced test engineers. When you use Agilent equipment, we can verify that it works properly, help with product operation, and provide basic measurement assistance for the use of specified capabilities, at no extra cost upon request. Many self-help tools are available.Your AdvantageYour Advantage means that Agilent offers a wide range of additional expert test and meas-urement services, which you can purchase according to your unique technical and business needs. Solve problems efficiently and gain a competitive edge by contracting with us for cal-ibration, extra-cost upgrades, out-of-warranty repairs, and on-site education and training, as well as design, system integration, project management, and other professional engineering services. Experienced Agilent engineers and technicians worldwide can help you maximize your productivity, optimize the return on investment of your Agilent instruments and sys-tems, and obtain dependable measurement accuracy for the life of those products./doc/e26170104431b90d6c85c778.html /find/emailupdatesGet the latest information on the productsand applications you select.By internet, phone, or fax, get assistance with all your test & measurement needsOnline assistance:/doc/e26170104431b90d6c85c778.html /find/assistPhone or FaxUnited States:(tel) 800 452 4844Canada:(tel) 877 894 4414(fax) 905 282 6495China:(tel) 800 810 0189(fax) 800 820 2816Europe:(tel) (31 20) 547 2323(fax) (31 20) 547 2390Japan:(tel) (81) 426 56 7832(fax) (81) 426 56 7840Korea:(tel) (82 2) 2004 5004(fax) (82 2) 2004 5115Latin America:(tel) (305) 269 7500(fax) (305) 269 7599Taiwan:(tel) 0800 047 866(fax) 0800 286 331Other Asia Pacific Countries:(tel) (65) 6375 8100(fax) (65) 6836 0252Email: tm_asia@/doc/e26170104431b90d6c85c778.htmlProduct specifications and descriptions in this document subject to change without notice. Agilent Technologies, Inc. 2002 Printed in USA October 15, 20025988-6109EN。

利用Agilent86100校准宽带取样示波器

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波器的校准问题，是由于这些方法本身存在的弊但
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准技术（以下简称ＮＴＮ技术）。利用该方法可一 “ 以实现对双微波二极管取样头的宽带取样示波器的
取样示波器测量ｌｊ６。可以证明，脉冲正比于取该样示波器的冲激响应，此可以从测量结果中分离因得到取样示波器的冲激响应，而完成对示波器的从校准。同时，还可以通过该脉冲和取样示波器的函数关系得到脉冲的时域特性，样该脉冲可以作为这

频谱仪说明书

AnritsuMS2711B手持式频谱分析仪用户指南用于测量，监视和分析信号环境的手持式频谱分析仪担保安立公司的产品从发货之日起，对于材料和制造工艺的缺陷承担一年的担保。

在担保期内，对于确证有缺陷的产品，安立公司将予以修理或更换，买方预付设备返回安立公司的运输费用。

此担保只限于直接买方，对于间接损坏安立公司不承担责任。

担保限制上述担保不包括由于正常磨损损坏的连接器，以及买方不适当或不应该的维修和未经许可的调整及超出产品技术条件的操作所造成的损坏。

商标认证MS-DOS，Windows，Windows for Workgroups，Windows95/98/NT4/2000/ME/XP是微软公司的注册商标。

Anritsu是安立公司的注册商标。

注意这本手册供安立公司人员和用户使用，用于安立公司的设备、计算机程序的正确安装、操作和维护。

其中的图表、技术指标和信息属于安立公司所有，禁止任何未经授权的使用或盗用；更新如果需要更新本手册，请从下载。

目录第1章概述前言………………………………………………………………………………………………………. 1-1 说明………………………………………………………………………………………………………. 1-1 标准附件…………………………………………………………………………………………………..1-1 选件………………………………………………………………………………………………………..1-2 打印机……………………………………………………………………………………………………..1-2 可选附件…………………………………………………………………………………………………..1-3 性能说明…………………………………………………………………………………………………..1-5 预防性维修………………………………………………………………………………………………..1-8 校准………………………………………………………………………………………………………..1-8 周检………………………………………………………………………………………………………..1-8 ESD警告…………………………………………………………………………………………………..1-8 安立公司服务中心………………………………………………………………………………………...1-9第2章快速入门指南前言………………………………………………………………………………………………………. 2-1 第一次打开MS2711B…………………………………………………………………………………….2-1 前面板介绍………………………………………………………………………………………………..2-2 显示介绍…………………………………………………………………………………………………..2-3 测试面板连接器…………………………………………………………………………………………..2-8 用频谱分析仪测量………………………………………………………………………………………..2-9 做基本测量………………………………………………………………………………………………..2-15 例子：测量一个900MHz的信号………………………………………………………………………..2-15 打印………………………………………………………………………………………………………..2-20 电池信息…………………………………………………………………………………………………..2-22 新电池充电………………………………………………………………………………………………..2-22 在HHSA中充电…………………………………………………………………………………………..2-22 在可选充电器中充电……………………………………………………………………………………..2-22 确定剩余电池的寿命……………………………………………………………………………………..2-23 符号………………………………………………………………………………………………………..2-26 自检………………………………………………………………………………………………………..2-27 错误信息…………………………………………………………………………………………………..2-27 便携式仪器箱的使用……………………………………………………………………………………..2-29第3章键盘功能前言………………………………………………………………………………………………………. 3-1硬按键……………………………………………………………………………………………………..3-1软按键……………………………………………………………………………………………………..3-4第4章基本测量前言………………………………………………………………………………………………………. 4-1基本测量…………………………………………………………………………………………………..4-1第5章电场测量前言………………………………………………………………………………………………………. .5-1占有的带宽…………………………………………………………………………………………………5-1 通道功率测量………………………………………………………………………………………………5-3 CDMA通道功率测量………………………………………………………………………………………5-3 GSM通道功率测量…………………………………………………………………………………………5-5 AMPS通道功率测量……………………………………………………………………………….……....5-7 相邻通道功率比…………………………………………………………………………………………….5-9 相邻通道功率测量……………………………………………………………………………….…………5-9 GSM相邻通道功率测量…………………………………………………………………………………...5-11 AMPS（TDMA）相邻通道功率测量……………………………………………………………………..5-13 带外谐波发射……………………………………………………………………………………………….5-14 带外谐波发射测量………………………………………………………………………………………….5-14 带内/通道外测量……………………………………………………………………………………………5-16 带内谐波测量……………………………………………………………………………………………….5-16 电场强度…………………………………………………………………………………………………….5-18 用功率监视器测量功率（选件5）………………………………………………………………………..5-20 动态衰减控制………………………………………………………………………………………………..5-22第6章预放前言…………………………………………………………………………………………………………. 6-1 预放的操作…………………………………………………………………………………………………..6-1 使用预放测量的实例………………………………………………………………………………………..6-2第7章跟踪信号发生器前言…………………………………………………………………………………………………………. 7-1 跟踪信号发生器……………………………………………………………………………………………. 7-1第8章软件工具前言…………………………………………………………………………………………………………. 8-1 性能………………………………………………………………………………………………………. …8-1 系统需要……………………………………………………………………………………………………..8-1 安装…………………………………………………………………………………………………………..8-1 软件工具的使用……………………………………………………………………………………………..8-3 下载线迹……………………………………………………………………………………………………..8-3 记录曲线到PC………………………………………………………………………………………………8-4 下载曲线到仪器……………………………………………………………………………………………..8-4 曲线参数……………………………………………………………………………………………………..8-4索引第1章概述前言这一章主要介绍安立公司手持式频谱仪MS2711B（频率范围从100KHz到3000MHz）的性能、技术条件、选件、维修和所需的校准。

10G光模块安捷伦公司86100D示波器介绍 2010

10Gb/s光电器件测试新挑战Hu HaiyangApplication EngineerAgilent Technologies2010-10-15Standardsand Application Testing? Agilent Technologies, Inc. 2010? Agilent Technologies, Inc. 2010内容安排?10G 光接口模块&测试标准?10G 光接口测试需求及解决方案?10G 光接口测试常见问题?86100D 简介? Agilent Technologies, Inc. 2010光收发模块的发展光接口的优点¨高带宽¨传输距离远¨电气干扰小¨可靠性高¨传输密度大经济性维护性扩展性发展方向复杂性&多样性:多标准智能化:热插拔/具有数字诊断功能高速:>10G 速率模块需求快速稳定增长高密度:并行光器件波长可调: DWDM 应用主要应用?以太网交换机?存储局域网?磁盘阵列/RAID 系统?主机总线适配器?高端服务器和网关?城域网中的路由器10G 光模块将进入稳定成长期? Agilent Technologies, Inc. 2010不同的封装光接口模块CFP LR44x10GQSFP 4x10GSNAP12 12x10G光纤通道: 1G(1x) ⇒2G(2x) ⇒4.25G(4x) ⇒8.5G(8x) ⇒14.2G(16x) ⇒40G?以太网: 1G ⇒10 G, next 25G? 40G? 100G?SFP+? Agilent Technologies, Inc. 2010MSA 多源协议MSA¡s SFP SFP+QSFP Xenpak X2XFP 300 Pin协议光纤通道以太网Sonet/SDH DWDM CWDM选件SR LR ER LRM Extended距离>100m >300m >500m >1km >10km速率(<10G)155Mb 1.0625 Gig 1.25 Gig 2.488Gig 2.5Gig 2.7Gig 3.125Gig 4.25Gig 5Gig 6.25Gig 8.5Gig速率(>10G)9.953 Gig 10.3125 Gig 10.519 Gig 10.709Gig 11.1Gig 11.3Gig? Agilent Technologies, Inc. 2010比较各种封装尺寸10Gb/s 主流产品? Agilent Technologies, Inc. 2009以太网名称如何理解描述(m ):?S: 短波长(850nm, 多模)?L: 长波长(1310nm, 主要是单模, 少量多模)?E: 扩展波长(1550nm, 单模)?T: 双绞线电缆?C: 同轴电缆(铜)?K: 背板描述(n ):?X: 8B/10B 编码?R: 64B/66B 编码?W: STS-192 封装64B/66B 编码（SONET ）第2参数:?M 在-LRM 意味着多模?附加在最后的数字表明通道（lanes ）数量, 比如-CX4, -LX410G BASE -(m )(n )数据速率基带传输媒质? Agilent Technologies,Inc. 200910GE网络规范?2002, IEEE802.3ae-2002包含7个光纤标准和XAUI 接口::¨10GBASE-LX4:4x3.125Gb/s, CWDM, >300m¨10GBASE-ER, -LR, -SR¨10GBASE-EW, -LW, -SW¨XAUI接口是10G以太网连接MAC 和PHY之间的电口.?2004, 10GBASE-CX4推出（IEEE802.3ak-2004）:XAUI信号在同轴电缆传输(15m，4x2.5G Infiniband，预加重）?20069月.¨10GBASE-T 随IEEE802.3an-2006推出. 规范10GE在双绞线铜揽传输.¨10GBASE-LRM 随IEEE802.3aq-2006推出. 10GE在已铺设多模光纤传输?2007, IEEE802.3ap-2007:背板接口标准.¨1000BASE-KX¨1x1.25Gb/s¨10GBASE-KX4¨4x 3.125Gbps¨10GBASE-KR¨1x 10.3125Gbps10GbESwitch CardComputerBlade or LineCard 10G Electrical25G Electrical25G Optical 4 @ 25G Optical40GBASE-KR4? Agilent Technologies, Inc. 2010? Agilent Technologies, Inc. 201010G 光通信应用标准10 G 以太网( ) ¨本地网络(LAN)Overview: /w/index.php?title=10_gigabit_Ethernet&oldid=158488764?802.3ae:10 GbE: 10GBASE-SR, -LR, -ER, -SW, -LW, -EW ?802.3aq:10 Gb/s 多模光纤以太网: 10GBASE-LRM ?802.3ab:40G/100G ?SFP+ 模块被802.3aq 标准采纳光纤通道( ) ¨存储网络(SAN)Overview: /w/index.php?title=Fibre_Channel&oldid=157471662)?FC-PI-5: 物理层10x FC/16x FC ?FC-FS-5: 协议层: 帧和信令标准?其它协议层标准T11.3SFF ( ) ¨小尺寸封装Small Form Factor?SFF-8431: 8.5G & 10G 增强型SFF 即插即用模块¡SFP+¡?SFF-8432: 针对¡SFP+¡机械性能指标?SFF-8083:¡SFP+¡ 一致性板卡边沿连接器? Agilent Technologies, Inc. 2009光纤通道名称如何理解1200-SM -LC -L数据速率1 600 --1 600 MB/s 16xFC 14.02Gb/s 1 200 --1 200 MB/s 10xFC 10.3125Gb/s 800 --800 MB/s 8x FC 8.5gb/s 400 --400 MB/s 4xFC 4.25Gb/s 200 --200 MB/s 2xFC 2.125Gb/s 100 --100 MB/s 1x FC 1.063Gb/s传输媒质SM ¨单模M5 --50¦m 多模(OM2)M5E ¨50¦m 多模(OM3)M5F --50¦m 多模(OM4)M6 --62.5¦m 多模(OM1)SE ¨非平衡电接口DF ¨平衡电接口交互类型SN ¨短波长(850 nm) &限幅接收机SA --短波长(850 nm) &线性接收机LL ¨长波长(1310 nm / 1550 nm) &限幅接收机LC ¨低成本长波长(1310 nm ) &限幅接收机LZ --长波长(1490nm) &限幅接收机LA --长波长(1310 nm / 1550 nm) &线性接收机EL ¨电口&无均衡接收机EA --电口&带均衡接收机距离V ¨超长距离(>50 km)L ¨长距离(>10 km)M ¨中等距离(>4 km)I ¨短距离(>2 km)S ¨超短距离(>70 m)限幅和线性接收机V outP inV outP in? Agilent Technologies, Inc. 2010内容安排?10G 光接口模块&测试标准?10G 光接口测试需求及解决方案?10G 光接口测试常见问题?86100D 简介? Agilent Technologies, Inc. 201010G 光接口测试参数IEEE802.3ae/ab(2008)& FC-PI-5(2010)参数解释SM MM 参数解释SM MM发射机测试CW 中心波长√√接收及测试RMS BW RMS 光谱宽度√SMRR 边模抑制比√BW 20dB 谱宽√P out 平均功率√√OMA 光调制幅度√√Tr/Tf 上升/下降时间√√RIN OMA 相对噪声强度√√P over 过载功率√√ER 消光比√√JT接收抖动容限(OMA)√√TDP 色散代价√P unstress (OMA)接收灵敏度(OMA)√√TJ 总抖动√√RL 回波损耗√√DJ 确定抖动√√F 3dB 3dB 截止频率√√DDPWS 数据相关脉冲宽度收缩√√F 10dB10dB 截止频率√UJ 不相关抖动√√P Stress (OMA)压力眼图灵敏度√VECP 垂直眼图闭合代价√TWDP发射波形色散代价√? Agilent Technologies, Inc. 2010¡抖动分析¡ & ¡幅度分析¡-86100X-200抖动分析选件& 300幅度分析选件?时间噪声(抖动)/幅度噪声→眼图闭合→误码?抖动分析帮助我们探测隐藏在数据上升/下降变化边沿不在预期时间出现背后的机制. 能否采用同样的手段分析信号的幅度电平偏离理想位置??理解什么原因造成眼图闭合可以帮助我们解决问题DeterministicJitter (DJ)RandomJitter (RJ)Data DependentJitter (DDJ)Inter-symbolInterference (ISI)Duty CycleDistortion (DCD)PeriodicJitter PJTotalJitter (TJ)DeterministicInterference( (DI)RandomInterference( (RI)Data DependentInterference(DDI)Inter-symbolInterference (ISI)Periodic Interference( PI)TotalInterference(TI)周期性? Agilent Technologies, Inc. 2010光调制幅度OMAOMA: 光发射机输出信号1电平和0电平的幅度差大多数标准要求特殊的测试码型以测量OMA测试波形/不是眼图典型情况是测量如下的方波码型例如: 11111000001111100000¡.86100X-300 幅度分析选件支持任意码型(自动找到1码序列和0码序列而无论其长度新参数86100C V7.00以上版本直接支持OMA 测试N? Agilent Technologies, Inc. 2010Haiyang HU? Agilent Technologies, Inc. 20102132n+1n ? Agilent Technologies, Inc. 2010(锁定) ? Agilent Technologies, Inc. 2010A0OMAJitter为内眼的高度，垂直眼图VECP = 10* log(OMA/A0)? Agilent Technologies, Inc. 201086100X如何进行压力眼图校准测试?消光比 & 交叉点眼图模式码型:PRBS, ERCF ON)TJ (BER 1 e-3), RJ, DCD & ISI 抖动模式 (#200)TJ (BER 1e-2) = TJ (BER 1e-3) ¨ 2* RJ? Agilent Technologies, Inc. 20010OMA 眼图模式码型:1100 参数: 眼图幅度)A0 (BER 1 e-3) 抖动模式/ 幅度分析 (#300), 参数: 眼张开度光域/电域色散电通道TXASIC RX光通道100 差分的传输线多模光纤E/O O/E收发模块? Agilent Technologies, Inc. 20010Race conditions cause pulse overlap 走的路径条件不一样造成脉冲重叠预加重色散补偿 ¨ 发射机(Tx)端发射信号没有预加重接收信号N4916B 4-阶预加重转换器3.125 Gb/s发射信号有预加重6.25 Gb/s12.5 Gb/s接收信号那些应用需要? ?>5Gb/s信号在长电缆或 PCB中传输需要3- 和 4- 阶预加重? Agilent Technologies, Inc. 20010均衡器色散补偿 ¨ 接收机(Rx)端假设 ? 系统线形 ? 信号劣化主要由于码间干扰 (ISI) ? ISI是确定和可不补偿的经过均衡均衡之前-86100X -201选件内置线性反馈均衡器算法s(t)TX色散通道r(t)均衡器e(t) 符号解码噪声? Agilent Technologies, Inc. 20010新的测试参数 TWDP发射机波形色散代价? 量化评估接收机眼图的相对闭合Transmitter Waveform Dispersion Penalty¨ 参考理想发射机, 理想通道,接收机噪声高斯分布¨ 代价: 信噪比由于发射机波形失真/通道色散造成的劣化? 由ClariPhy Communications, Inc.提出* for IEEE 802.3aq? 8G 光纤通道和IEEE 802.3ax (其他标准也均采纳) 都采纳这个概念系统功率预算发射机功率最大通道损耗发射机功率最大通道损耗TWDPSNR RN 接收机噪声SNR effective RX NoiseSNR RN* MATLAB? scripts for TWDP calculations may contain intellectual property owned by ClariPhy Communications, Inc.? Agilent Technologies, Inc. 2010TWDP 测量-86100X -201选件外部处理? 码型锁定数据，进行捕获 ? 最高的灵活性 ? 高精度86100C DCA-J-86100X -201选件支持在线TWDP测试DCA-J +内置MATLAB? 标准数据捕获 ? 使用测量方便 ? 实时显示结果? Agilent Technologies, Inc. 20010光模块测量结果RIN 测试一致性眼图模板测试消光比/功率测试抖动分析TWDP 测试? Agilent Technologies, Inc. 2010内容安排? 10G光接口模块&测试标准 ? 10G光接口测试需求及解决方案 ? 10G光接口测试常见问题 ? 86100D简介? Agilent Technologies, Inc. 2010测量示波器带宽问题? 发射机测量结果依赖于示波器带宽¨ 带宽太大: 噪声高, 过冲, 纹波 ¨ 带宽太小: 高码间干扰, 抖动? 通用规则: 参考接收机¨ 定义测试系统的频响 ¨ 典型的4th 阶贝塞尔滤波器=汤姆逊低通滤波响应 ¨ 带宽近似于75% 数据速率? 接收机频响有一定的容限参考接收机? Agilent Technologies, Inc. 2010O/E 转换器放大器（选件）硬件滤波采样器A/D 转换测量示波器带宽问题示波器带宽的影响不加滤波器适合:? 激光器和驱动设计 ? 光器件故障排查加滤波器适合:? 一致性验证 ? ER & OMA 调节 ? 生产质量控制? Agilent Technologies, Inc. 2010? Agilent Technologies, Inc. 2010-9.00.0 1.0 2.0摘自FC-PI-4¡A.1.2.1.1注意：8.5G 速率信号采用，进? Agilent Technologies, Inc. 2010? Agilent Technologies, Inc. 200108条或者10条等光通道? Agilent Technologies, Inc. 2010? Agilent Technologies, Inc. 20010眼图模板测试问题?标准模板¨单次冲击模板(眼图测量模式)意味着¡失败¡¨通过/失败依赖于事件速率和测量时间?统计模板¨标准: 模板失败<= BER * 采样/UI¨显著提高测试重复性, 降低不确定度?模板富余度¨用户可以在*.msk文件定义/编辑目标(100% 富余度)¨Rev 8.0 to 包括基于误码率的1-shot自动富余度测试XFP HCTBXAUI HCTB? Agilent Technologies, Inc. 2009IEEE 802.3ba 针对40G/100G 以太网Sinx/x 函数频谱? Agilent Technologies, Inc. 2010Page 37? Agilent Technologies, Inc. 2009高级眼图分析(401选件)86100X-200抖动分析软件: 最长分析数据码型<215-1 如何分析更长的数据码型的抖动呢? 86100X-401选件帮助解决这个问题。

Keysight 86100D DCA-X系列示波器新增脉冲幅度调制(PAM-4)分析功能

Keysight 86100D DCA-X系列示波器新增脉冲幅度调制
(PAM-4)分析功能
佚名
【期刊名称】《国外电子测量技术》
【年(卷),期】2015(0)2
【摘要】是德科技公司（NYSE：KEYS）日前发布全新测量功能：Keysight 86100D-9FP PAM—N分析软件。

该软件可以提供全面的光和电PAM-4信号分析，帮助工程师应用Keysight 86100D DCA-X示波器平台完成快速且精确的PAM-4（4电平脉冲幅度调制）信号测试和验证。

【总页数】1页(P87-87)
【关键词】脉冲幅度调制;测量功能;示波器;信号分析;信号测试;PAM;工程师;软件【正文语种】中文
【中图分类】TN92
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