固体材料中快重离子辐照损伤建立过程中的离子速度效应
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[32]
,
4
((∆C/C0 )/φ)e ,
, , ,
. . , , . P (= , ,
, A. Dunlop
.
1120
( HEP & NP )
29
(References)
1 Groult D, Hervieu M, Nguyen N et al. Defect and Diffusion Forum, 1988, 57-58: 391 2 Klaumunzer S, Schumacher G. Phys. Rev. Lett., 1983, 51: 1987 3 Audouard A, Balanzat E, Bouffard S et al. Phys. Rev. Lett., 1990, 65(7): 875 4 Dunlop A, Lesueur D, Legrand P et al. Nucl. Instrum. Methods, 1994, B90: 330 5 Costantini J M, Brisard F, Flament J L et al. Nucl. Instrum. Methods, 1992, B65: 568 6 Costantini J M, Rave F l, Brisar F et al. Nucl. Instrum. Methods.,1993, B80/81: 1249 7 Meftah A, Brisard F, Costantini J M et al. Phys. Rev., 1993, B48: 920 8 WANG Z G, Dufour Ch, Cabeau B et al. Nucl. Instrum. Methods, 1996, B107: 175 9 Dammak H, Dunlop A, Lesueur D et al. Phys. Rev. Lett., 1995, 74(7): 1135 10 Gaiduk P I, Larsen A N, Hansen J L. Appl. Phys. Lett., 2003, 83: 1746 11 Kucheyev S O, Timmers H, Zou J J. Appl. Phys., 2004, 95: 5360 12 JIN Y F, TIAN H X, XIE E Q et al. Nucl. Instrum. Methods, 2002, B193: 288 13 JIN Y F, TIAN H X, LIU J et al. High Energy Phys. and Nucl. Phys., 2004, 28: 781 (in Chinese) ( , , . , 2004, 28: 781) 14 JIN Yun-Fan, YAO Cun-Feng, WANG Zhi-Guang et al. Nucl. Instrum. Methods, 2005, B230: 567
29 2005
11 11 HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS
Vol. 29, No. 11 Nov., 2005
*
1)
(
730000)
, , . , ,
1Байду номын сангаас
0.1—300MeV/u , ( (dE/dx)e , Se ), .
[1—4]
[8, 9]
[10, 11]
A, Re (66%
Rd ), . 1 ,
−1
MeV
32
S,
63
Cu,
84
Kr
Xe σd Re ,
YIG, (CRBS) F. YIG . (v/c 0.1) , 35MeV/u
84 [17]
X Studer GeV (0.15 1.5MeV/u Kr , ) . A. Meftah E
32
, , ε 0.44 ,
(a) Se = 12.81keV/nm, (b) Se = 13.50keV/nm, (c) Se = 15.44keV/nm, (d) Se = 15.46keV/nm,
4
“ ” (dJ/dx)4
dJ/dx
.
(e) Se = 18.05keV/nm.
[12—14]
2.4 C60 (fcc) ,
3
[12—14]
[15, 16]
.
,
, , . δ , ,
,
[7, 17]
. ,
[18]
g .
[15, 16]
. ,
, , ,
. , , , , ,
.
, , ,
[5—11]
. , .
.
J. M. Costantini Y3 Fe5 O12 (YIG)
[5, 6]
2
2.1
[7]
,
, A. Meftah .
g
, Se δ Se ( , , .
[31]
, . D(r ) , ) ,
, Waligorski
[17 ]
Ishikawa ,
[15]
80MeV—3.84GeV EuBa2 Cu3 Oy . C ,
4 Se
(35 Cl—238 U)
, ((∆C/C0 )/φ)e (dJ/dx) –
4
,
,
, ((∆C/C0 )/φ)e , (dJ/dx) . , , , . , , , , . , , .
2.3 3(a) ,
[15, 16, 27]
, Se ,
(v
2.6×109cm/s), Se C
((∆C/C0 )/φ)e . C . (dJ/dx)
4
4 Se
( 3(a)
3(b)). Se - V (
(v Se
1.7×109cm/s),
4 Se
N. Ishikawa ( Cl—
35 238
80MeV—3.84GeV EuBa2 Cu3 Oy , EuBa2 Cu3 Oy
U)
((∆C/C0 )/φ)e 3(b)),
,
1118
( HEP & NP )
29
3
(a)
,
Se
;
, (b)
(b)
Se
4 Se
.
, . ), ((∆C/C0 )/φ)e (dJ/dx)4 ( 4). ( .
. →
[12—14, 28]
C60
.
5 2.0GeV Xe ions/cm2
C60 1 × 1011 Raman
, 5
(Se=18.05keV/nm)
Se /(keV·nm−1 ) 13.50 15.44 18.05 15.46 12.81 Se /Sn 1.52±103 1.21±103 6.36±102 1.73±102 61.46
Xe
C60
Sn /(eV·nm−1 ) 8.9 12.8 28.4 89.6 208.4
V
/(cm·ns−1 ) 4.81 3.89 2.46 1.23 0.72
.
11
1119
(e) , (d) , ,
C60 5
(a)
(b), (d) ,
(c) (a)
2 Se /πRe )
, Re δ , , δ , P Se
(b) 1460cm
−1
(c) C60 Ag (2) , , , G. Szenes g ,
3.6MeV/u) S, 650MeV
181
F, 50MeV
238
Pb YIG
666MeV ,
U
Gd3 Ga5 O12
[7]
C-RBS YIG
YIG . , , . [1, 19—22]) [5, 7], △ ♦ dE/dx YIG
1
dE/dx/ (keV · nm−1 ) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Kr S K Cu Mo Kr Xe Xe Xe Xe Pb U Pb Ta U U 7.2 6.9 13 13 18 17 19 19 25 24.6 37 36 40 37.5 47 43.5 ¯ (MeV · u−1 ) E/ 33.3 1.56 10.7 0.8 8.0 2.8 19.6 0.42 8.3 1.4 16.5 1.4 12.0 3.6 10.5 2.8 v/(×109 cm · s−1 ) 8.1 1.7 4.5 1.3 3.9 2.3 6.3 0.9 3.9 1.7 5.7 1.7 4.8 2.6 4.5 2.3
[18]
.
, , . ,P . ,
C60 .
3
, , , , , . , ,
[29—32]
,g Se g , , , ,
Se
g
. , G. Szenes (E < 0.2MeV/u, E > 7.6MeV/u) , , , . N. g ,
, ,
[15, 16, 27]
(0.36 . , , ,
0.17),
15 Ishikawa N, Iwase A, Chimi Y et al. Nucl. Instrum. Methods, 2002, B193: 278 16 Ishikawa N, Chimi Y, Michikami O et al. Nucl. Instrum. Methods, 2005, B230: 136 17 Waligoriski M P R, Hamm R N, Katz R. Nucl. Tracks Radiat. Meas., 1986, 11: 309 18 Szenes G. Phys. Rev., 1999, B60: 3140 19 Studer F, Houpert Ch, Pascard H et al. Radiat. Eff. and Def. in Solids, 1991, 116: 59 20 Toulemonde M, Studer F. Philos. Mag., 1988, A58: 799 21 Toulemonde M, Fuchs G, Nguyen N et al. Phys. Rev., 1987, B35: 6560 22 Meftah A, Merrien N, Nguyen N et al. Nucl. Instrum. Methods, 1991, B59: 605 23 Hansen P, Heitmann H, Smit P M. Phys. Rev., 1982, 26: 3539 24 Timm A, Strocka B. Nucl. Instrum. Methods, 1985, B12: 479 25 Viegers M P A. J. Electro. Microsc., 1982, 2: 187 26 Durfour Ch, Audouard A, Beuneu F et al. J. Phys. Condens. Matter, 1993, 5: 4573 27 Ishikawa N, Chimi Y, Iwase A et al. Nucl. Instrum. Methods, 1998, B135: 184 28 Yogo A, Majima T, Itoh A. Nucl. Instrum. Methods, 2002, B193: 299 29 Szenes G. Phys. Rev., 1995, 52: 6154 30 Szenes G. Nucl. Instrum. Methods, 1998, B146: 420 31 Wang Z G, Dofour C, Paumier E et al. J Phys: Condens Matter,1994, 6: 6733 32 Denlop A, Jaskierowicz G, Jensen J et al. Nucl. Instrum. Methods, 1997, B132: 93
Xe , ,
2
,
(dE/dx)n / (keV·nm−1 ) 0.08 1.8 0.03 1.8 (dE/dx)e / (keV·nm−1 ) 36 43 41 44
V /(cm·ns−1 ) 2.80 0.22 6.71 0.22
Em /eV 8800 50 49000 50 10—20nm 5nm 15—25nm
ε 25—43.5keV/nm 0.23(eV/atom) , . 1 A , Rd , . , , , , Re
, v/c
32
0.3) S
(7MeV/µm), 1.1 × 10
−13
cm ( S
2 32
0.08 × 10
−13
cm ( Kr .
2 84
), ( 15MeV Ta, 750MeV
208 19
△ ♦)
) (
•
ε = A/dE/dx
11
1117
2.2 , . , . , . . U MeV C60 , Bi
, 2, 10
Kr 2—4 20MeV/u ,
[26]
Xe . Pb 20K
Bi
, Bi , . 18MeV Zr , TEM , ( GeV 2). U , . . , , . Pb C60
YIG
2004 – 12 – 31 , 2005 – 04 – 05 * (10175084, 10125522, 10475102) 1) E-mail: yfjin@impcas.ac.cn
1115 — 1120
1116
( HEP & NP )
29
, J. M. Costantini
132 [5, 6]
. H. Dammak
[9]
Ti
GeV Zr U Zr 18MeV 10—20nm
2 4MeV/u Bi
[8]
Pb
,
Kr( ) 42.9MeV/u ∆ρ
Xe(•)
,
Zr . MeV GeV , δ (Em ) U MeV , U 100eV/atom), Zr . δ C60 , C60 , δ U U U 1/30,
ions (b) (c) (e) (d) (a) : Se Sn Xe Xe Xe Xe Xe TRIM E /GeV 1.628 1.068 0.425 0.107 0.037
[14]
(HIRFL) Xe C60 Sn Se C60 Se /Sn Raman
2.0GeV Al E , .
136
C60 V 3 3 , .
100K
, , 4MeV/u Bi
17keV/ Kr ∆ρ 1/1000; GeV nm, 4MeV/u 42.9MeV/u , ˚3 ( 10eV/A
nm 42.9MeV/u Bi . Φt Kr Xe Bi 2—4
2
E /MeV Ti Zr : Em Pb C60 U C60 δ 845 18 5550 18
(dE/dx)e ( 1 ( [23—25]) . 1 ,
1 (• ) ( , ε = A/dE/dx dE/dx YIG
A/cm2 (8.1±1.6)×10−15 (3.5±0.4)×10−14 (1.2±0.4)×10−13 (5.3±0.9)×10−13 (2.3±0.7)×10−13 (5.3±0.8)×10−13 (3.0±0.6)×10−13 (6.7±1.0)×10−13 (5.5±0.5)×10−13 (1.3±0.2)×10−12 (9.7±0.9)×10−13 (1.5±0.4)×10−12 (8.2±1.5)×10−13 (1.4±0.3)×10−12 (9.8±1.4)×10−13 (1.2±0.3)×10−12 Re /nm 0.51±0.05 1.1±0.1 2.0±0.4 4.3±0.4 2.7±0.4 4.1±0.4 3.1±0.3 4.6±0.4 4.2±0.2 6.4±0.5 5.6±0.3 6.9±0.5 5.1±0.5 6.7±0.8 5.6±0.4 6.2±0.8 Rd /nm 9.3 3.3 6.3 2.4 5.6 4.0 7.7 1.8 5.6 3.2 7.2 3.2 6.5 4.3 6.2 4.0 [19] [7] [19] [5] [20] [5] [21] [5] [5,20] [5] [22] [23,24] [22] [7] [19] [7]
,
4
((∆C/C0 )/φ)e ,
, , ,
. . , , . P (= , ,
, A. Dunlop
.
1120
( HEP & NP )
29
(References)
1 Groult D, Hervieu M, Nguyen N et al. Defect and Diffusion Forum, 1988, 57-58: 391 2 Klaumunzer S, Schumacher G. Phys. Rev. Lett., 1983, 51: 1987 3 Audouard A, Balanzat E, Bouffard S et al. Phys. Rev. Lett., 1990, 65(7): 875 4 Dunlop A, Lesueur D, Legrand P et al. Nucl. Instrum. Methods, 1994, B90: 330 5 Costantini J M, Brisard F, Flament J L et al. Nucl. Instrum. Methods, 1992, B65: 568 6 Costantini J M, Rave F l, Brisar F et al. Nucl. Instrum. Methods.,1993, B80/81: 1249 7 Meftah A, Brisard F, Costantini J M et al. Phys. Rev., 1993, B48: 920 8 WANG Z G, Dufour Ch, Cabeau B et al. Nucl. Instrum. Methods, 1996, B107: 175 9 Dammak H, Dunlop A, Lesueur D et al. Phys. Rev. Lett., 1995, 74(7): 1135 10 Gaiduk P I, Larsen A N, Hansen J L. Appl. Phys. Lett., 2003, 83: 1746 11 Kucheyev S O, Timmers H, Zou J J. Appl. Phys., 2004, 95: 5360 12 JIN Y F, TIAN H X, XIE E Q et al. Nucl. Instrum. Methods, 2002, B193: 288 13 JIN Y F, TIAN H X, LIU J et al. High Energy Phys. and Nucl. Phys., 2004, 28: 781 (in Chinese) ( , , . , 2004, 28: 781) 14 JIN Yun-Fan, YAO Cun-Feng, WANG Zhi-Guang et al. Nucl. Instrum. Methods, 2005, B230: 567
29 2005
11 11 HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS
Vol. 29, No. 11 Nov., 2005
*
1)
(
730000)
, , . , ,
1Байду номын сангаас
0.1—300MeV/u , ( (dE/dx)e , Se ), .
[1—4]
[8, 9]
[10, 11]
A, Re (66%
Rd ), . 1 ,
−1
MeV
32
S,
63
Cu,
84
Kr
Xe σd Re ,
YIG, (CRBS) F. YIG . (v/c 0.1) , 35MeV/u
84 [17]
X Studer GeV (0.15 1.5MeV/u Kr , ) . A. Meftah E
32
, , ε 0.44 ,
(a) Se = 12.81keV/nm, (b) Se = 13.50keV/nm, (c) Se = 15.44keV/nm, (d) Se = 15.46keV/nm,
4
“ ” (dJ/dx)4
dJ/dx
.
(e) Se = 18.05keV/nm.
[12—14]
2.4 C60 (fcc) ,
3
[12—14]
[15, 16]
.
,
, , . δ , ,
,
[7, 17]
. ,
[18]
g .
[15, 16]
. ,
, , ,
. , , , , ,
.
, , ,
[5—11]
. , .
.
J. M. Costantini Y3 Fe5 O12 (YIG)
[5, 6]
2
2.1
[7]
,
, A. Meftah .
g
, Se δ Se ( , , .
[31]
, . D(r ) , ) ,
, Waligorski
[17 ]
Ishikawa ,
[15]
80MeV—3.84GeV EuBa2 Cu3 Oy . C ,
4 Se
(35 Cl—238 U)
, ((∆C/C0 )/φ)e (dJ/dx) –
4
,
,
, ((∆C/C0 )/φ)e , (dJ/dx) . , , , . , , , , . , , .
2.3 3(a) ,
[15, 16, 27]
, Se ,
(v
2.6×109cm/s), Se C
((∆C/C0 )/φ)e . C . (dJ/dx)
4
4 Se
( 3(a)
3(b)). Se - V (
(v Se
1.7×109cm/s),
4 Se
N. Ishikawa ( Cl—
35 238
80MeV—3.84GeV EuBa2 Cu3 Oy , EuBa2 Cu3 Oy
U)
((∆C/C0 )/φ)e 3(b)),
,
1118
( HEP & NP )
29
3
(a)
,
Se
;
, (b)
(b)
Se
4 Se
.
, . ), ((∆C/C0 )/φ)e (dJ/dx)4 ( 4). ( .
. →
[12—14, 28]
C60
.
5 2.0GeV Xe ions/cm2
C60 1 × 1011 Raman
, 5
(Se=18.05keV/nm)
Se /(keV·nm−1 ) 13.50 15.44 18.05 15.46 12.81 Se /Sn 1.52±103 1.21±103 6.36±102 1.73±102 61.46
Xe
C60
Sn /(eV·nm−1 ) 8.9 12.8 28.4 89.6 208.4
V
/(cm·ns−1 ) 4.81 3.89 2.46 1.23 0.72
.
11
1119
(e) , (d) , ,
C60 5
(a)
(b), (d) ,
(c) (a)
2 Se /πRe )
, Re δ , , δ , P Se
(b) 1460cm
−1
(c) C60 Ag (2) , , , G. Szenes g ,
3.6MeV/u) S, 650MeV
181
F, 50MeV
238
Pb YIG
666MeV ,
U
Gd3 Ga5 O12
[7]
C-RBS YIG
YIG . , , . [1, 19—22]) [5, 7], △ ♦ dE/dx YIG
1
dE/dx/ (keV · nm−1 ) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Kr S K Cu Mo Kr Xe Xe Xe Xe Pb U Pb Ta U U 7.2 6.9 13 13 18 17 19 19 25 24.6 37 36 40 37.5 47 43.5 ¯ (MeV · u−1 ) E/ 33.3 1.56 10.7 0.8 8.0 2.8 19.6 0.42 8.3 1.4 16.5 1.4 12.0 3.6 10.5 2.8 v/(×109 cm · s−1 ) 8.1 1.7 4.5 1.3 3.9 2.3 6.3 0.9 3.9 1.7 5.7 1.7 4.8 2.6 4.5 2.3
[18]
.
, , . ,P . ,
C60 .
3
, , , , , . , ,
[29—32]
,g Se g , , , ,
Se
g
. , G. Szenes (E < 0.2MeV/u, E > 7.6MeV/u) , , , . N. g ,
, ,
[15, 16, 27]
(0.36 . , , ,
0.17),
15 Ishikawa N, Iwase A, Chimi Y et al. Nucl. Instrum. Methods, 2002, B193: 278 16 Ishikawa N, Chimi Y, Michikami O et al. Nucl. Instrum. Methods, 2005, B230: 136 17 Waligoriski M P R, Hamm R N, Katz R. Nucl. Tracks Radiat. Meas., 1986, 11: 309 18 Szenes G. Phys. Rev., 1999, B60: 3140 19 Studer F, Houpert Ch, Pascard H et al. Radiat. Eff. and Def. in Solids, 1991, 116: 59 20 Toulemonde M, Studer F. Philos. Mag., 1988, A58: 799 21 Toulemonde M, Fuchs G, Nguyen N et al. Phys. Rev., 1987, B35: 6560 22 Meftah A, Merrien N, Nguyen N et al. Nucl. Instrum. Methods, 1991, B59: 605 23 Hansen P, Heitmann H, Smit P M. Phys. Rev., 1982, 26: 3539 24 Timm A, Strocka B. Nucl. Instrum. Methods, 1985, B12: 479 25 Viegers M P A. J. Electro. Microsc., 1982, 2: 187 26 Durfour Ch, Audouard A, Beuneu F et al. J. Phys. Condens. Matter, 1993, 5: 4573 27 Ishikawa N, Chimi Y, Iwase A et al. Nucl. Instrum. Methods, 1998, B135: 184 28 Yogo A, Majima T, Itoh A. Nucl. Instrum. Methods, 2002, B193: 299 29 Szenes G. Phys. Rev., 1995, 52: 6154 30 Szenes G. Nucl. Instrum. Methods, 1998, B146: 420 31 Wang Z G, Dofour C, Paumier E et al. J Phys: Condens Matter,1994, 6: 6733 32 Denlop A, Jaskierowicz G, Jensen J et al. Nucl. Instrum. Methods, 1997, B132: 93
Xe , ,
2
,
(dE/dx)n / (keV·nm−1 ) 0.08 1.8 0.03 1.8 (dE/dx)e / (keV·nm−1 ) 36 43 41 44
V /(cm·ns−1 ) 2.80 0.22 6.71 0.22
Em /eV 8800 50 49000 50 10—20nm 5nm 15—25nm
ε 25—43.5keV/nm 0.23(eV/atom) , . 1 A , Rd , . , , , , Re
, v/c
32
0.3) S
(7MeV/µm), 1.1 × 10
−13
cm ( S
2 32
0.08 × 10
−13
cm ( Kr .
2 84
), ( 15MeV Ta, 750MeV
208 19
△ ♦)
) (
•
ε = A/dE/dx
11
1117
2.2 , . , . , . . U MeV C60 , Bi
, 2, 10
Kr 2—4 20MeV/u ,
[26]
Xe . Pb 20K
Bi
, Bi , . 18MeV Zr , TEM , ( GeV 2). U , . . , , . Pb C60
YIG
2004 – 12 – 31 , 2005 – 04 – 05 * (10175084, 10125522, 10475102) 1) E-mail: yfjin@impcas.ac.cn
1115 — 1120
1116
( HEP & NP )
29
, J. M. Costantini
132 [5, 6]
. H. Dammak
[9]
Ti
GeV Zr U Zr 18MeV 10—20nm
2 4MeV/u Bi
[8]
Pb
,
Kr( ) 42.9MeV/u ∆ρ
Xe(•)
,
Zr . MeV GeV , δ (Em ) U MeV , U 100eV/atom), Zr . δ C60 , C60 , δ U U U 1/30,
ions (b) (c) (e) (d) (a) : Se Sn Xe Xe Xe Xe Xe TRIM E /GeV 1.628 1.068 0.425 0.107 0.037
[14]
(HIRFL) Xe C60 Sn Se C60 Se /Sn Raman
2.0GeV Al E , .
136
C60 V 3 3 , .
100K
, , 4MeV/u Bi
17keV/ Kr ∆ρ 1/1000; GeV nm, 4MeV/u 42.9MeV/u , ˚3 ( 10eV/A
nm 42.9MeV/u Bi . Φt Kr Xe Bi 2—4
2
E /MeV Ti Zr : Em Pb C60 U C60 δ 845 18 5550 18
(dE/dx)e ( 1 ( [23—25]) . 1 ,
1 (• ) ( , ε = A/dE/dx dE/dx YIG
A/cm2 (8.1±1.6)×10−15 (3.5±0.4)×10−14 (1.2±0.4)×10−13 (5.3±0.9)×10−13 (2.3±0.7)×10−13 (5.3±0.8)×10−13 (3.0±0.6)×10−13 (6.7±1.0)×10−13 (5.5±0.5)×10−13 (1.3±0.2)×10−12 (9.7±0.9)×10−13 (1.5±0.4)×10−12 (8.2±1.5)×10−13 (1.4±0.3)×10−12 (9.8±1.4)×10−13 (1.2±0.3)×10−12 Re /nm 0.51±0.05 1.1±0.1 2.0±0.4 4.3±0.4 2.7±0.4 4.1±0.4 3.1±0.3 4.6±0.4 4.2±0.2 6.4±0.5 5.6±0.3 6.9±0.5 5.1±0.5 6.7±0.8 5.6±0.4 6.2±0.8 Rd /nm 9.3 3.3 6.3 2.4 5.6 4.0 7.7 1.8 5.6 3.2 7.2 3.2 6.5 4.3 6.2 4.0 [19] [7] [19] [5] [20] [5] [21] [5] [5,20] [5] [22] [23,24] [22] [7] [19] [7]