JESD22-A114F
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2.3 Current probe
The current probe shall have a minimum pulse-current bandwidth of 350 MHz. The probe (transformer and cable with a nominal length of 1 meter) shall have a 1 GHz bandwidth, a minimum current rating of 12 amperes peak pulse-current capability and a rise time of less than one nanosecond.
Arlington, VA 22201-2107 or call (703) 907-7559
JEDEC Standard No. 22-A114F Page 1
TEST METHOD A114F
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)
be used either domestically or internationally.
JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting
viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard.
2.4 Evaluation loads
An 18-24 AWG tinned copper wire is recommended for the short waveform verification test. The lead length should be as short as practicable to span the distance between the two farthest pins in the socket while passing through the current probe. The ends of the wire may be ground to a point where clearance is needed to make contact on fine-pitch socket pins.
JEDEC SOLID STATE TECHNOLOGY ASSOCIATION
NOTICE
JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved
Published by ©JEDEC Solid State Technology Association 2008
3103 North 10th Street Suite 240 South
Arlington, VA 22201-2107
This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individual agrees not to
by the JEDEC legal counsel.
JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to
JEDEC STANDARD
Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM)
JESD22-A114F
(Revision of JESD22-A114E, January 2007)
DECEMBER 2008
the JEDEC standards or publications.
The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer
A 500 Ω +/-1%, 4000 V, low-inductance resistor shall be used for initial system checkout and periodic system recalibration.
Test Method A114F (Revision of Test Method A114E)
Printed in the U.S.A. All rights reserveTHE LAW!
This document is copyrighted by JEDEC and may not be reproduced without permission.
Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact:
JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South
(From JEDEC Board Ballot JCB-00-27, JCB-04-103, JCB-04-104, JCB-04-105, JCB-05-137, JCB-05-138, JCB-06-69, and JCB-08-84 formulated under the cognizance of JC-14.1 Committee on Reliability Test Methods for Packaged Devices.)
No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met.
Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or call (703) 907-7559 or
JEDEC Standard No. 22-A114F Page 2
2
Apparatus (cont’d)
2.5 Calibration
All apparatus used for tester evaluation shall be calibrated according to a documented, traceable calibration system and in accordance with manufacturer’s recommendations.
1
Scope
This method establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined electrostatic Human Body Model (HBM) discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed.
2
Apparatus
This test method requires the following equipment.
2.1 An ESD pulse simulator and a Device Under Test (DUT) socket equivalent to the circuit of Figure 1. The simulator must be capable of supplying pulses with the characteristics required by Figure 2 and Figure 3.
charge for or resell the resulting material.
PRICE: Please refer to the current Catalog of JEDEC Engineering Standards and Publications online at
/Catalog/catalog.cfm
2.2 Oscilloscope
The oscilloscope and amplifier combination shall have a 350 MHz minimum single-shot bandwidth and a visual writing speed of 4 cm/ns minimum.
Figure 1 — Typical equivalent HBM ESD circuit NOTE 1 The performance of any simulator is influenced by its parasitic capacitance and inductance. NOTE 2 Precautions must be taken in tester design to avoid recharge transients and multiple pulses. NOTE 3 R2, used for initial equipment qualification and requalification as specified in 3.1, shall be a low inductance, 4000 V, 500 Ω resistor with +/-1% tolerance. NOTE 4 Stacking of DUT socket adaptors (piggybacking) is allowed only if the waveforms can be verified to meet the specifications in Table 1. NOTE 5 Reversal of terminals A and B to achieve dual polarity is not permitted. NOTE 6 S2 shall be closed at least 10 milliseconds after the pulse delivery period to ensure the DUT socket is not left in a charged state. NOTE 7 R1, 1500 Ω +/- 1%. NOTE 8 C1, 100 pF +/- 10% (effective capacitance).
The current probe shall have a minimum pulse-current bandwidth of 350 MHz. The probe (transformer and cable with a nominal length of 1 meter) shall have a 1 GHz bandwidth, a minimum current rating of 12 amperes peak pulse-current capability and a rise time of less than one nanosecond.
Arlington, VA 22201-2107 or call (703) 907-7559
JEDEC Standard No. 22-A114F Page 1
TEST METHOD A114F
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)
be used either domestically or internationally.
JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting
viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard.
2.4 Evaluation loads
An 18-24 AWG tinned copper wire is recommended for the short waveform verification test. The lead length should be as short as practicable to span the distance between the two farthest pins in the socket while passing through the current probe. The ends of the wire may be ground to a point where clearance is needed to make contact on fine-pitch socket pins.
JEDEC SOLID STATE TECHNOLOGY ASSOCIATION
NOTICE
JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved
Published by ©JEDEC Solid State Technology Association 2008
3103 North 10th Street Suite 240 South
Arlington, VA 22201-2107
This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individual agrees not to
by the JEDEC legal counsel.
JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to
JEDEC STANDARD
Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM)
JESD22-A114F
(Revision of JESD22-A114E, January 2007)
DECEMBER 2008
the JEDEC standards or publications.
The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer
A 500 Ω +/-1%, 4000 V, low-inductance resistor shall be used for initial system checkout and periodic system recalibration.
Test Method A114F (Revision of Test Method A114E)
Printed in the U.S.A. All rights reserveTHE LAW!
This document is copyrighted by JEDEC and may not be reproduced without permission.
Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact:
JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South
(From JEDEC Board Ballot JCB-00-27, JCB-04-103, JCB-04-104, JCB-04-105, JCB-05-137, JCB-05-138, JCB-06-69, and JCB-08-84 formulated under the cognizance of JC-14.1 Committee on Reliability Test Methods for Packaged Devices.)
No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met.
Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or call (703) 907-7559 or
JEDEC Standard No. 22-A114F Page 2
2
Apparatus (cont’d)
2.5 Calibration
All apparatus used for tester evaluation shall be calibrated according to a documented, traceable calibration system and in accordance with manufacturer’s recommendations.
1
Scope
This method establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined electrostatic Human Body Model (HBM) discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed.
2
Apparatus
This test method requires the following equipment.
2.1 An ESD pulse simulator and a Device Under Test (DUT) socket equivalent to the circuit of Figure 1. The simulator must be capable of supplying pulses with the characteristics required by Figure 2 and Figure 3.
charge for or resell the resulting material.
PRICE: Please refer to the current Catalog of JEDEC Engineering Standards and Publications online at
/Catalog/catalog.cfm
2.2 Oscilloscope
The oscilloscope and amplifier combination shall have a 350 MHz minimum single-shot bandwidth and a visual writing speed of 4 cm/ns minimum.
Figure 1 — Typical equivalent HBM ESD circuit NOTE 1 The performance of any simulator is influenced by its parasitic capacitance and inductance. NOTE 2 Precautions must be taken in tester design to avoid recharge transients and multiple pulses. NOTE 3 R2, used for initial equipment qualification and requalification as specified in 3.1, shall be a low inductance, 4000 V, 500 Ω resistor with +/-1% tolerance. NOTE 4 Stacking of DUT socket adaptors (piggybacking) is allowed only if the waveforms can be verified to meet the specifications in Table 1. NOTE 5 Reversal of terminals A and B to achieve dual polarity is not permitted. NOTE 6 S2 shall be closed at least 10 milliseconds after the pulse delivery period to ensure the DUT socket is not left in a charged state. NOTE 7 R1, 1500 Ω +/- 1%. NOTE 8 C1, 100 pF +/- 10% (effective capacitance).