Significant difference method of detection null of

专利名称：Significant difference method of detection null of sheet condition suffering inspection 发明人：大西 隆嗣
申请号：JP特願昭62-258683
申请日：19871014
公开号：JP第2597370号B2
公开日：
19970402
专利内容由知识产权出版社提供
摘要：PURPOSE:To prevent an image from affecting on the detection of a defect, by masking an image detection signal in a mask range irrelevant to the contour of the image. CONSTITUTION:Reflected light from a sheetlike material 1 to be inspected is scanned axially with a camera 5, video information obtained is taken into a contour extracting means 6 to extract the contour of an image 2 and a defect 3. An output from the extracting means 6 is written sequentially into a memory means 10 capable of simultaneously writing and reading performing an automatic updating by scrolling in synchronization with a running position information of the object 1 being inspected. Then, after a set frequency, pattern information written into the memory means 10 is read out sequentially as contour mask output to be inputted into a comparison means together with the current output to be inspected. This comparison means 12 detects pattern information differing from the subsequent frequency of pattern information read out of a binary coding circuit 13 for defects as significant difference.
申请人：株式会社ヒューテック
地址：香川県高松市林町1217番地
国籍：JP
代理人：鈴江 武彦 (外2名)更多信息请下载全文后查看。