ict测试PPT课件
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Clock/synchronus/trigger board Privides event tim ing and event detection
D river/Sensor reference Supplies program m ed dc reference voltages for the D /S pin boards
* 测试覆盖率。 * 测试时间。 * 稳定性 * 故障定位 * 信息反馈
.
7
Agilent ICT Tester
Agilent 307x Series 3 Architecture
Testhead Layout BRC:Bank,Row,Column :20378,203178
Configuring a Four-Module System
Double Density Analog Pin Card
Serial Test Pin Card
System config file
PATH:/hp3070/diagnostic/th1/config testhead name "testhead1" line frequency 50 relay 1 controls vacuum 2,3 relay 2 controls vacuum 0,1 bank 1
Run Tim e Controller B us interface for the analog subsystem directs & coordinaes pin board activities; data transfers betw een cpu and the digital subsystem
!@ cards 8 hybrid standard double density !@ cards 9 hybrid standard double density !@ cards 10 hybrid standard double density !@ cards 11 hybrid standard double density
.
4
ICT 简易示意图
PCB Fixture ICT TESTER
.
5
ICT的优点 （相对于FT）
* 统一的硬件平台
--易于投资
* 统一的流程
--易于控制
* 速度较快
--当然，这决定于工程师的能力
* 故障定位精确
--维修费用较低
* 能抓到电子隐性故障的唯一方法
--提高产品质量
.
6
衡量ICT的5大要素
cards 6 control plus cards 7 hybrid standard double density cards 8 hybrid standard double density cards 9 hybrid standard double density cards 10 hybrid standard double density cards 11 hybrid standard double density supplies 1 to 4 end module
faon
fbon
Vacuum well a is 2,3 Vacuum well b is 0,1
GenRad 2287 tester
GenRad Hardware Overview
Windows NT MXI Bus
Fixture GenRad RECEIVER
IEE-488
MTG RST C/S/T
Typical Example of Analog Test
Resistor typical test program:
disconnect all connect s to “N1” connect I to “N2” connect g to “N100” resistor 10k, 5.5,5,re5,ar0.1
Short Wire Fixture Architecture
Command control testhead
Testhead power on
fix lock, fix unlock-----compressed air
faon,faoff
------Vacuum
vacuum well is
supplies 5 to 8 end module
module 3 cards 1 asru c revision
!@ cards 2 hybrid standard double density !@ cards 3 hybrid standard double density !@ cards 4 hybrid standard double density !@ cards 5 hybrid standard double density
report parallel devices report "q23 q23:fet 100, 20.0" end on failure disconnect all connect s to "TREE89" connect i to "B0" connect g to "VF" nfetr 81.6, 10.0, re1, ar50.0m
1. S bus 2. I bus 3. G bus
4. A bus 5. B bus 6. L bus
enhancement
Capacitor Test
Capacitor test:
Zc=1/2fc
C=1/2 f Zc
Inductor test:
ZL =2fL
Capacitor test file
end module module 1 ……. End module end bank bank 2 …… end bank
Board level config file
module 2 cards 1 asru c revision cards 2 hybrid standard double density cards 3 hybrid standard double density cards 4 hybrid standard double density cards 5 hybrid standard double density cards 6 control plus cards 7 hybrid standard double density
REFERENCE
PIN CARD PIN CARD PIN CARD PIN CARD DSM BOARD AFTM CARD ICA
UUT PS
0 1 3 3 4 5 6 •••31 32 33 34 PIN BAY
M TG RTC
C ST R eferΒιβλιοθήκη n ceD SM A FTM
IC A
M X I to G enR ad board Functional blocks are M X I to G R businterface
.
28
Diode & Zener Test
.
29
Diode Test File
!!!! 2 0 1 885232159 0000 ! IPG: rev B.02.54 Mon Jan 19 09:49:20 1998 ! Common Lead Resistance 500m, Common Lead Inductance 1.00u ! Fixture: EXPRESS disconnect all connect s to "VCC" connect i to "$34" diode 728m, 413m, idc5.0m, co3.0, ar828m
module 0 cards 1 asru cards 2 hybrid advanced ! double density cards 3 hybrid advanced ! double density cards 4 hybrid advanced ! double density cards 5 hybrid advanced ! double density cards 6 control plus cards 7 hybrid advanced ! double density cards 8 hybrid advanced ! double density cards 9 hybrid advanced ! double density cards 10 hybrid advanced ! double density cards 11 hybrid advanced ! double density supplies hp6624 13 to 16 ! asru channels 1 to 4 ports ext7, ext8
Cards
HybridPlus Pin Card Double Density Hybrid ChannelPlus Pin Card AccessPlus Pin card Analog Pin Card
ASRU - Rev A,B or C Control ControlPlus ControlXT
.
30
FET Test Configuration
FET Test File
!!!! 2 0 1 924217662 0000 ! IPG: rev B.03.13 Wed Mar 31 11:25:15 1999 ! Common Lead Resistance 500m, Common Lead Inductance 1.00u ! Fixture: EXPRESS on failure
Sub Characterize learn capacitance on learn capacitance off subend
Sub Pre_Shorts ……… Subend Sub Shorts Test “shorts” Subend Sub Analog_Tests Test “analog/c4” Test “analog/r56” ……… subend ……… Sub Digital_Tests Test “digital/u1” Test “digital/u2” …… subend ………
D eep Serial M em ory
D
Analog Functional Test M odule
In-Circuit Analog M odule
GenRad 228x Series Architecture
Solectron Confidential
TESTPLAN
…… call Pre_shorts …… call Shorts ……. Call Analog_tests …… Call testjet …… Call digital ……
!!!! 2 0 1 1002945327 0000 ! IPG: rev B.03.42 Sat Oct 13 11:55:28 2001 ! Common Lead Resistance 100m, Common Lead Inductance 1.00u ! Fixture: EXPRESS on failure
在线测试技术
ICT (In Circuit Test)
在线测试
一种元器件级的测试方法用来测试 装配后的电路板上的每个元器件。
如果功能测试是一种黑盒测试的话 ，那么在线测试就是一种白盒测试。
.
1
ICT 测试设备 – Agilent 3070
.
2
ICT 测试设备 – GenRad 228x
.
3
ICT 测试设备 – Teradyne Spectrum
report parallel devices report "r1 15.0k" end on failure disconnect all connect s to "GND"; a to "GND" connect i to "TREE__1022" connect g to "+5" capacitor 100n, 13.4, 8.66, fr1024, re3, wb, ar100m, sa, en, nocomp off failure
D river/Sensor reference Supplies program m ed dc reference voltages for the D /S pin boards
* 测试覆盖率。 * 测试时间。 * 稳定性 * 故障定位 * 信息反馈
.
7
Agilent ICT Tester
Agilent 307x Series 3 Architecture
Testhead Layout BRC:Bank,Row,Column :20378,203178
Configuring a Four-Module System
Double Density Analog Pin Card
Serial Test Pin Card
System config file
PATH:/hp3070/diagnostic/th1/config testhead name "testhead1" line frequency 50 relay 1 controls vacuum 2,3 relay 2 controls vacuum 0,1 bank 1
Run Tim e Controller B us interface for the analog subsystem directs & coordinaes pin board activities; data transfers betw een cpu and the digital subsystem
!@ cards 8 hybrid standard double density !@ cards 9 hybrid standard double density !@ cards 10 hybrid standard double density !@ cards 11 hybrid standard double density
.
4
ICT 简易示意图
PCB Fixture ICT TESTER
.
5
ICT的优点 （相对于FT）
* 统一的硬件平台
--易于投资
* 统一的流程
--易于控制
* 速度较快
--当然，这决定于工程师的能力
* 故障定位精确
--维修费用较低
* 能抓到电子隐性故障的唯一方法
--提高产品质量
.
6
衡量ICT的5大要素
cards 6 control plus cards 7 hybrid standard double density cards 8 hybrid standard double density cards 9 hybrid standard double density cards 10 hybrid standard double density cards 11 hybrid standard double density supplies 1 to 4 end module
faon
fbon
Vacuum well a is 2,3 Vacuum well b is 0,1
GenRad 2287 tester
GenRad Hardware Overview
Windows NT MXI Bus
Fixture GenRad RECEIVER
IEE-488
MTG RST C/S/T
Typical Example of Analog Test
Resistor typical test program:
disconnect all connect s to “N1” connect I to “N2” connect g to “N100” resistor 10k, 5.5,5,re5,ar0.1
Short Wire Fixture Architecture
Command control testhead
Testhead power on
fix lock, fix unlock-----compressed air
faon,faoff
------Vacuum
vacuum well is
supplies 5 to 8 end module
module 3 cards 1 asru c revision
!@ cards 2 hybrid standard double density !@ cards 3 hybrid standard double density !@ cards 4 hybrid standard double density !@ cards 5 hybrid standard double density
report parallel devices report "q23 q23:fet 100, 20.0" end on failure disconnect all connect s to "TREE89" connect i to "B0" connect g to "VF" nfetr 81.6, 10.0, re1, ar50.0m
1. S bus 2. I bus 3. G bus
4. A bus 5. B bus 6. L bus
enhancement
Capacitor Test
Capacitor test:
Zc=1/2fc
C=1/2 f Zc
Inductor test:
ZL =2fL
Capacitor test file
end module module 1 ……. End module end bank bank 2 …… end bank
Board level config file
module 2 cards 1 asru c revision cards 2 hybrid standard double density cards 3 hybrid standard double density cards 4 hybrid standard double density cards 5 hybrid standard double density cards 6 control plus cards 7 hybrid standard double density
REFERENCE
PIN CARD PIN CARD PIN CARD PIN CARD DSM BOARD AFTM CARD ICA
UUT PS
0 1 3 3 4 5 6 •••31 32 33 34 PIN BAY
M TG RTC
C ST R eferΒιβλιοθήκη n ceD SM A FTM
IC A
M X I to G enR ad board Functional blocks are M X I to G R businterface
.
28
Diode & Zener Test
.
29
Diode Test File
!!!! 2 0 1 885232159 0000 ! IPG: rev B.02.54 Mon Jan 19 09:49:20 1998 ! Common Lead Resistance 500m, Common Lead Inductance 1.00u ! Fixture: EXPRESS disconnect all connect s to "VCC" connect i to "$34" diode 728m, 413m, idc5.0m, co3.0, ar828m
module 0 cards 1 asru cards 2 hybrid advanced ! double density cards 3 hybrid advanced ! double density cards 4 hybrid advanced ! double density cards 5 hybrid advanced ! double density cards 6 control plus cards 7 hybrid advanced ! double density cards 8 hybrid advanced ! double density cards 9 hybrid advanced ! double density cards 10 hybrid advanced ! double density cards 11 hybrid advanced ! double density supplies hp6624 13 to 16 ! asru channels 1 to 4 ports ext7, ext8
Cards
HybridPlus Pin Card Double Density Hybrid ChannelPlus Pin Card AccessPlus Pin card Analog Pin Card
ASRU - Rev A,B or C Control ControlPlus ControlXT
.
30
FET Test Configuration
FET Test File
!!!! 2 0 1 924217662 0000 ! IPG: rev B.03.13 Wed Mar 31 11:25:15 1999 ! Common Lead Resistance 500m, Common Lead Inductance 1.00u ! Fixture: EXPRESS on failure
Sub Characterize learn capacitance on learn capacitance off subend
Sub Pre_Shorts ……… Subend Sub Shorts Test “shorts” Subend Sub Analog_Tests Test “analog/c4” Test “analog/r56” ……… subend ……… Sub Digital_Tests Test “digital/u1” Test “digital/u2” …… subend ………
D eep Serial M em ory
D
Analog Functional Test M odule
In-Circuit Analog M odule
GenRad 228x Series Architecture
Solectron Confidential
TESTPLAN
…… call Pre_shorts …… call Shorts ……. Call Analog_tests …… Call testjet …… Call digital ……
!!!! 2 0 1 1002945327 0000 ! IPG: rev B.03.42 Sat Oct 13 11:55:28 2001 ! Common Lead Resistance 100m, Common Lead Inductance 1.00u ! Fixture: EXPRESS on failure
在线测试技术
ICT (In Circuit Test)
在线测试
一种元器件级的测试方法用来测试 装配后的电路板上的每个元器件。
如果功能测试是一种黑盒测试的话 ，那么在线测试就是一种白盒测试。
.
1
ICT 测试设备 – Agilent 3070
.
2
ICT 测试设备 – GenRad 228x
.
3
ICT 测试设备 – Teradyne Spectrum
report parallel devices report "r1 15.0k" end on failure disconnect all connect s to "GND"; a to "GND" connect i to "TREE__1022" connect g to "+5" capacitor 100n, 13.4, 8.66, fr1024, re3, wb, ar100m, sa, en, nocomp off failure