TESTER
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专利名称：TESTER
发明人：YAMAMOTO MASANOBU 申请号：JP15548087
申请日：19870624
公开号：JPS641978A
公开日：
19890106
专利内容由知识产权出版社提供
摘要：PURPOSE:To perform a test for product classification based on electric characteristics by the one judgment of an output waveform by inputting the same output waveform to a plurality of comparators and giving different judging timings and different comparison levels. CONSTITUTION:One signal outputted from the output pin 21 of a semiconductor device 20 is inputted in common to the input terminals of comparators 11a, 11b and 11c. A judging timing signal STBa is supplied from a timing generating circuit 12a to the comparator 11a, a little later, the judging timing signal is supplied from a timing generating circuit 12b to the comparator 11b and, further a little later, the judging timing signal is supplied from a timing generating circuit 12c to the comparator 11c. The comparators 11a, 11b and 11c compare comparison levels VOH and VOL and the values of output waveforms at judging timings with one another.
申请人：HITACHI LTD,HITACHI VLSI ENG CORP
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