X-ray analytical system

专利名称：X-ray analytical system
发明人：Allan H. Smallbone,Yury M. Gurvich 申请号：US05/842522
申请日：19771017
公开号：US04134012A
公开日：
19790109
专利内容由知识产权出版社提供
摘要：An X-ray spectrometer is provided with two channels for detecting characteristic lines of the X-ray source after being scattered by a sample undergoing analysis, in addition to means for detecting electric signals primarily representative of the concentrations of analytes in the sample. In this way, data is collected which facilitates corrections of the measurements corresponding to individual analytes for deviations from linearity of intensity caused by variations in interelement effects, and by variations in total- solids concentration, or density, of the slurry, or matrix, in which the analytes are distributed, and by variations in particle size of the total-solids in the sample. Correction of measurements of total-solids concentration and average particle size of the matrix for each other and for effects of analytes, may also be made.
The invention may be applied to slurries where the total-solids concentration and particle size may both vary simultaneously from sample to sample, and to dried, solid, or powdered samples where density and particle size may both vary in a similar way.
< P>In an automatic control system, the sample is taken from a slurry and the output signal is employed to control the process to match a norm. The invention may be employed to improve recovery of desired materials and to reduce the discharge of waste materials likely to cause pollution.
申请人：BAUSCH & LOMB, INC.代理人：Theodore H. Lassagne 更多信息请下载全文后查看。