WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCE SPECTROME
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专利名称：WAVELENGTH-DISPERSIVE X-RAY
FLUORESCENCE SPECTROMETER
发明人：KATO, Shuichi,YAMADA, Takashi,KATAOKA, Yoshiyuki
申请号：EP17855565.2
申请日：20170831
公开号：EP3521813A4
公开日：
20200624
专利内容由知识产权出版社提供
摘要：A wavelength dispersive X-ray fluorescence spectrometer includes a single one-dimensional detector (10) having detection elements (7) arranged linearly, and includes a detector position change mechanism (11) for setting a position of the one-dimensional detector (10) to either a parallel position at which an arrangement direction of the detection elements (7) is parallel to a spectral angle direction of a spectroscopic device (6) or an intersection position at which the arrangement direction intersects the spectral angle direction. At the parallel position, a receiving surface of the one-dimensional detector (10) is located at a focal point of focused secondary X-rays (42). At the intersection position, a receiving slit (9) is disposed at the focal point of the focused secondary X-rays (42), and the receiving surface is located at a traveling direction side of the focused secondary X-rays (42) farther from the spectroscopic device (6) than the receiving slit (9).
申请人：Rigaku Corporation
地址：9-12, Matsubara-cho 3-chome Akishima-shi Tokyo 196-8666 JP
国籍：JP
代理机构：Dr. Gassner & Partner mbB 更多信息请下载全文后查看。