overview

Documentation delivered withSoftware Release Edition 5.3 in April 2006Convert Data Set Up Device Create Test Flow Debug Test Flow Generate Test Program Analyze ResultsTest System Setup and Configuration Application Specific Documents Production TestOther Information•Full Text Search Instructions •List of Manuals •Test System Administration •Application Notes • Agilent TrainingAgilent 93000 SOC SeriesOnline User DocumentationList of Manuals• ASCII Interface Reference Manual• BIST Assist 6.4 User’s Manual• Command Interface• Command Reference Vol. 1• Command Reference Vol. 2• Command Reference Vol. 3• Command Reference Vol. 4• Developing a Production Test Program• Docking Hardware Reference• DUT Board Design Guide• Event Datalogging• High Speed Testing with NP Modules• Linux User Guide• Multi-Port Testing• Multi Site Testing• Pin Scale Digital Card User’s Guide• Pin Scale HX User’s Guide• Pin Scale Licensing and Model File• Preparing and Executing a Production Test• Prober / Handler Drivers• Results Analysis• RF Measurement Suite User Guide• System Reference• Scan Test with the Agilent 93000• Standard Test Function Reference• Test Flow Programming in C• Test Setup Vol. 1: Introduction, Data Manager, Test Flow• Test Setup Vol. 2: Pins, Levels, Timing, Vectors• Test Setup Vol. 3: Analog and Mixed Signal• Test Setup Vol. 4: Digital Capture, Digital Source Memory• Test Method Programming Reference• Testing LAN Devices• Testing Memories• The Testflow Merge Tool• Understanding the Application Model2Convert Data• ASCII Interface Reference Manual• High Speed Testing with NP Modules• Multi-Port Testing• Pin Scale Digital Card User’s Guide3Set Up Device• Test Setup Vol. 1: Introduction, Data Manager, Test Flow• Test Setup Vol. 2: Pins, Levels, Timing, Vectors• Test Setup Vol. 3: Analog and Mixed Signal• Test Setup Vol. 4: Digital Capture, Digital Source Memory• Test Method Programming Reference• Standard Test Function Reference• Test Flow Programming in C• System Reference• High Speed Testing with NP Modules• Command Reference Vol. 1• Command Reference Vol. 2• Command Reference Vol. 3• Command Reference Vol. 4• Multi-Port Testing• Scan Test with the Agilent 93000• Testing Memories4• Test Setup Vol. 1: Introduction, Data Manager, Test Flow• Test Flow Programming in C• Standard Test Function Reference• The Testflow Merge Tool• High Speed Testing with NP Modules• RF Measurement Suite User Guide5• Test Setup Vol. 1: Introduction, Data Manager, Test Flow• Test Setup Vol. 3: Analog and Mixed Signal• Test Flow Programming in C• Standard Test Function Reference• Test Method Programming Reference6Generate Test Program• Test Setup Vol. 1: Introduction, Data Manager, Test Flow• Test Method Programming Reference• Developing a Production Test Program• Understanding the Application Model7Analyze Results• Results Analysis• Event Datalogging 8Test System Administration• Command Interface9Application Specific DocumentsApplications• Testing Memories• Testing LAN Devices• BIST Assist 6.4 User’s Manual• RF Measurement Suite User Guide Test Approach• Scan Test with the Agilent 93000• High Speed Testing with NP Modules• Multi-Port Testing• Multi Site Testing• Pin Scale HX User’s Guide10Application Notes• Memory Testing Using Large Acquire Failure Mode• X-Mode Pattern Synchronization to Free Running Bitstreams• Beat Frequency Matchloop Synchronization• Testing LAN on the 93000 SOC Series Based on a Typical 10/100 Base TX LAN Transceiver• Testing Data Communication Device (LAN) on the Agilent 93000 SOCSeries• Audio DAC Test Program Generation• High Precision AWG and Digitizer Loopback Test Result• Fault analysis: the new hurdle to effective BIST test• Reducing Cost of Test Through DFT• Leveraging P1450.6 for faster production test development• Understanding Error Vector Magnitude Applied to Semiconductor Test• Ganging GPDPS Commands• Testing HyperTransport TM Backgrounder• Liquid-cooling on the Agilent 93000 SOC Series• High Speed Digitizer DC Offset Calibration for RAMDAC Application• Testing PCI Express TM Backgrounder• Adjacent Channel Power Ratio• Customizing Tester Output• A Collection Of SmartTestPG Test Generation Techniques• NP 2500 3G-XS Cook BookTest System Setup and Configuration• Docking Hardware Reference• Prober / Handler Drivers• System Reference• DUT Board Design GuideProduction Test• Preparing and Executing a Production Test• Developing a Production Test Program• Understanding the Application Model• Command Interface• Event DataloggingFull Text Search InstructionsYou can search the entire text of the online documentation. Follow theinstructions here to use Adobe’s full text search function.1 While using SmarTest, select the Report window.2 Select Help, then Documentation. The first page of the onlinedocumentation will open using Adobe Acrobat Reader.3 Click on the Search button.The Find button will only search in the first document.Figure 1: Adobe Acrobat Reader full text search button4 Enter your search word. Options for Search include:Word Stemming: finds words that contain part of the search word.Sounds Like: finds different spellingsThesaurus: finds similar wordsMatch Case: finds only words with the same capitalizationProximity: when you search for two words at one time using thekeyword AND, it finds only the first instance of the pair of words.5 The list of documents that have the word appears. Choose thedocument, select View, and the first occurrence of the word will bedisplayed.。