LEAKAGE CURRENT DETECTION APPARATUS AND LEAKAGE C
- 1、下载文档前请自行甄别文档内容的完整性，平台不提供额外的编辑、内容补充、找答案等附加服务。
- 2、"仅部分预览"的文档,不可在线预览部分如存在完整性等问题,可反馈申请退款(可完整预览的文档不适用该条件!)。
- 3、如文档侵犯您的权益，请联系客服反馈,我们会尽快为您处理(人工客服工作时间：9:00-18:30)。
专利名称：LEAKAGE CURRENT DETECTION APPARATUS AND LEAKAGE CURRENT DETECTION
METHOD
发明人：KONDOU, Yasumasa,NAKAYAMA,
Shinichi,KOMIYA, Tatsuhiko
申请号：JP2006313505
申请日：20060706
公开号：WO07/004698P1
公开日：
20070111
专利内容由知识产权出版社提供
摘要：A leakage current detection apparatus for detecting a leakage current occurring at an electric line under test and caused by the capacitance relative to the ground. A leakage current I is detected from an electric line (A) under test, and the detected leakage current I is amplified by a first amplifier circuit (11). The signal amplified by the first amplifier circuit (11) is further amplified by a second amplifier circuit (13). On the basis of the signal amplified by the first amplifier circuit (11) and the signal amplified by the first and second amplifier circuits (11, 13), a multiplexer (20) selects a signal most suitable to be input to an A/D converter (21). A voltage applied to the electric line (A) under test is detected and the detected voltage is divided, after which the multiplexer (20) selects a signal most suitable to be input to the A/D converter (21). On the basis of the digital signal converted by the A/D converter (21), an arithmetic circuit (22) performs a predetermined calculation, thereby detecting a leakage current Igc caused by the capacitance relative to the ground.
申请人：KONDOU, Yasumasa,NAKAYAMA, Shinichi,KOMIYA, Tatsuhiko
地址：JP,JP,JP,JP
国籍：JP,JP,JP,JP
代理机构：TAMURA, Eiichi 更多信息请下载全文后查看。