CY7C1069DV33-10ZXI中文资料

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CY7C64713资料

CY7C64713资料


The 8051 microprocessor embedded in the FX1 family has 256 bytes of register RAM, an expanded interrupt system, three timer/counters, and two USARTs. 4.2.1 8051 Clock Frequency
24 MHz Ext. XTAL High-performance micro using standard tools with lower-power options
• • • • • • •
• • •
— Supports multiple Ready (RDY) inputs and Control (CTL) outputs Integrated, industry standard 8051 with enhanced features — Up to 48-MHz clock rate — Four clocks per instruction cycle — Two USARTS — Three counter/timers — Expanded interrupt system — Two data pointers 3.3V operation with 5V tolerant inputs Smart SIE Vectored USB interrupts Separate data buffers for the Setup and DATA portions of a CONTROL transfer Integrated I2C controller, runs at 100 or 400 KHz 48-MHz, 24-MHz, or 12-MHz 8051 operation Four integrated FIFOs — Brings glue and FIFOs inside for lower system cost — Automatic conversion to and from 16-bit buses — Master or slave operation — FIFOs can use externally supplied clock or asynchronous strobes — Easy interface to ASIC and DSP ICs Vectored for FIFO and GPIF interrupts Up to 40 general purpose I/Os Three package options—128-pin TQFP, 100-pin TQFP, and 56-pin QFN Lead-free

NZX33B,133;NZX9V1C,133;NZX7V5C,133;NZX3V9B,133;NZX3V9A,133;中文规格书,Datasheet资料

NZX33B,133;NZX9V1C,133;NZX7V5C,133;NZX3V9B,133;NZX3V9A,133;中文规格书,Datasheet资料

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NXP Semiconductors
NZX series
Single Zener diodes
Table 8. Characteristics per type; NZX2V1B to NZX18C …continued Tj = 25 C unless otherwise specified. NZXxxx Sel Working voltage VZ (V) IZ = 5 mA Min 7V5 A B C D X 8V2 A B C D 9V1 A B C D E 10 A B C D 11 A B C D 12 A B C D X 13 A B C 14 A B C 7.0 7.2 7.3 7.5 7.07 7.7 7.9 8.1 8.3 8.5 8.7 8.9 9.1 9.3 9.5 9.7 9.9 10.2 10.4 10.7 10.9 11.1 11.4 11.6 11.9 12.2 11.44 12.4 12.6 12.9 13.2 13.5 13.8 Max 7.3 7.6 7.7 7.9 7.45 8.1 8.3 8.5 8.7 8.9 9.1 9.3 9.5 9.7 9.9 10.1 10.3 10.6 10.8 11.1 11.3 11.6 11.9 12.1 12.4 12.7 12.03 12.9 13.1 13.4 13.7 14.0 14.3 35 0.05 9.8 35 0.1 8 35 0.1 8 25 0.1 8 25 0.2 7 20 0.5 6 20 0.7 5 Differential resistance rdif () IZ = 5 mA Max 15 Max 1 VR (V) 5 Reverse current IR (A)

CY7C1051DV33芯片手册

CY7C1051DV33芯片手册

PRELIMINARY 8-Mbit (512K x 16) Static RAMCY7C1051DV33Features•High speed —t AA = 10 ns •Low active power—I CC = 110 mA @ 10 ns •Low CMOS standby power —I SB2 = 20 mA •2.0V data retention•Automatic power-down when deselected •TTL-compatible inputs and outputs•Easy memory expansion with CE and OE features•Available in lead-free 48-ball FBGA and 44-pin TSOP II packagesFunctional Description [1]The CY7C1051DV33 is a high-performance CMOS Static RAM organized as 512K words by 16 bits.Write to the device by taking Chip Enable (CE) and Write Enable (WE) inputs LOW. If Byte LOW Enable (BLE) is LOW,then data from IO pins (IO 0–IO 7), is written into the location specified on the address pins (A 0–A 18). If Byte HIGH Enable (BHE) is LOW, then data from IO pins (IO 8–IO 15) is written into the location specified on the address pins (A 0–A 18).Read from the device by taking Chip Enable (CE) and Output Enable (OE) LOW while forcing the Write Enable (WE) HIGH.If Byte LOW Enable (BLE) is LOW, then data from the memory location specified by the address pins will appear on IO 0–IO 7.If Byte HIGH Enable (BHE) is LOW, then data from memory will appear on IO 8 to IO 15. See the “Truth Table” on page 8 for a complete description of Read and Write modes.The input/output pins (IO 0–IO 15) are placed in a high-impedance state when the device is deselected (CE HIGH), the outputs are disabled (OE HIGH), the BHE and BLE are disabled (BHE, BLE HIGH), or a Write operation (CE LOW,and WE LOW) is in progress.The CY7C1051DV33 is available in a 44-pin TSOP II package with center power and ground (revolutionary) pinout, as well as a 48-ball fine-pitch ball grid array (FBGA) package.Note1.For guidelines on SRAM system design, please refer to the “System Design Guidelines” Cypress application note, available on the internet at .1415Logic Block DiagramA 1A 2A 3A 4A 5A 6A 7A 8COLUMN DECODERR O W D E C O D E RS E N S E A M P SINPUT BUFFER512K × 16ARRAYA 0A 11A 13A 12A A A 16A 17A 18A 9A 10IO 0–IO 7OE IO 8–IO 15CE WE BLEBHEPRELIMINARY CY7C1051DV33Selection Guide–10Unit Maximum Access Time 10ns Maximum Operating Current 110mA Maximum CMOS Standby Current20mAPin Configurations [2]48-ball Mini FBGAWE V CC A 11A 10NC A 6A 0A 3CE IO 10IO 8IO 9A 4A 5IO 11IO 13IO 12IO 14IO 15V SS A 9A 8OE V SS A 7IO 0BHE NC A 17A 2A 1BLE V CC IO 2IO 1IO 3IO 4IO 5IO 6IO 7A 15A 14A 13A 12NC A 18NC326541D E B A C F G HA 16(Top View)TSOP IIWE 1234567891011143132363534333740393812134144434216152930V CC A 5A 6A 7A 8A 0A 1OE V SS A 17IO 15A 2CE IO 2IO 0IO 1BHE A 3A 418172019IO 32728252622212324V SS IO 6IO 4IO 5IO 7A 16A 15BLE V CC IO 14IO 13IO 12IO 11IO 10IO 9IO 8A 14A 13A 12A 11A 9A 10A 18(Top View)Note2.NC pins are not connected on the diePRELIMINARY CY7C1051DV33Maximum Ratings(Exceeding the maximum ratings may impair the useful life of the device. These are for user guidelines, they are not tested.)Storage Temperature .................................–65°C to +150°C Ambient Temperature withPower Applied.............................................–55°C to +125°C Supply Voltage on V CC to Relative GND [3]....–0.5V to +4.6V DC Voltage Applied to Outputsin High-Z State [3]....................................–0.3V to V CC + 0.3V DC Input Voltage [3].................................–0.3V to V CC + 0.3VCurrent into Outputs (LOW).........................................20 mA Static Discharge Voltage............................................>2001V (per MIL-STD-883, Method 3015)Latch-up Current......................................................>200 mAOperating RangeRange Ambient Temperature V CC Industrial–40°C to +85°C3.3V ± 0.3VDC Electrical Characteristics Over the Operating RangeParameter DescriptionTest Conditions–10Unit Min MaxV OH Output HIGH Voltage V CC = Min, I OH = –4.0 mA 2.4V V OL Output LOW Voltage V CC = Min, I OL = 8.0 mA0.4V V IH Input HIGH Voltage 2.0V CC + 0.3V V IL [3]Input LOW Voltage –0.30.8V I IX Input Leakage Current GND < V I < V CC–1+1μA I OZ Output Leakage Current GND < V OUT < V CC , Output Disabled –1+1μA I CCV CC Operating Supply CurrentV CC = Max, f = f MAX = 1/t RC100 MHz 110mA83 MHz 100 66 MHz 9040 MHz80I SB1Automatic CE Power Down Current —TTL Inputs Max V CC , CE > V IH V IN > V IH or V IN < V IL , f = f MAX 40mA I SB2Automatic CE Power Down Current —CMOS Inputs Max V CC , CE > V CC – 0.3V,V IN > V CC – 0.3V or V IN < 0.3V, f = 020mACapacitance [4]Parameter DescriptionTest ConditionsMax.Unit C IN Input Capacitance T A = 25°C, f = 1 MHz, V CC = 3.3V12pF C OUTIO Capacitance12pFNotes3.V IL (min) = –2.0V and V IH (max) = V CC + 2.0V for pulse durations of less than 20 ns.4.Tested initially and after any design or process changes that may affect these parametersThermal Resistance [4]ParameterDescription Test ConditionsFBGA PackageTSOP II PackageUnit ΘJA Thermal Resistance (Junction to Ambient)Still Air, soldered on a 3 × 4.5 inch, four-layer printed circuit board28.3151.43°C/W ΘJCThermal Resistance (Junction to Case)11.415.8°C/WPRELIMINARYCY7C1051DV33AC Test Loads and Waveforms [5]AC Switching Characteristics [6] Over the Operating RangeParameterDescription–10UnitMinMaxRead Cycle t power [7]V CC (typical) to the first access 100μs t RC Read Cycle Time 10ns t AA Address to Data Valid10ns t OHA Data Hold from Address Change 3ns t ACE CE LOW to Data Valid 10ns t DOE OE LOW to Data Valid 5ns t LZOE OE LOW to Low-Z 0ns t HZOE OE HIGH to High-Z [8, 9]5ns t LZCE CE LOW to Low-Z [9]3ns t HZCE CE HIGH to High-Z [8, 9]5ns t PU CE LOW to Power Up 0ns t PD CE HIGH to Power Down 10ns t DBE Byte Enable to Data Valid 5ns t LZBE Byte Enable to Low-Z 0ns t HZBEByte Disable to High-Z6nsNotes5.AC characteristics (except High-Z) are tested using the load conditions shown in Figure (a). High-Z characteristics are tested for all speeds using the test loadshown in Figure (c).6.Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V.7.t POWER gives the minimum amount of time that the power supply should be at typical V CC values until the first memory access can be performed.8.t HZOE , t HZCE , t HZBE and t HZWE are specified with a load capacitance of 5 pF as in part (d) of AC Test Loads.Transition is measured when the outputs enter ahigh impedance state.9.At any given temperature and voltage condition, t HZCE is less than t LZCE , t HZOE is less than t LZOE , t HZBE is less than t LZBE , and t HZWE is less than t LZWE for anygiven device.90%10%3.0VGND90%10%ALL INPUT PULSES * CAPACITIVE LOAD CONSISTS OF ALL COMPONENTS OF THE TEST ENVIRONMENTRise Time: 1 V/nsFall Time: 1 V/ns30 pF*OUTPUTZ = 50Ω50Ω1.5V (a)3.3V OUTPUT5 pF(c)R 317ΩR2351ΩHigh-Z Characteristics(b)PRELIMINARY CY7C1051DV33Data Retention WaveformWrite Cycle [10, 11]t WC Write Cycle Time 10ns t SCE CE LOW to Write End 7ns t AW Address Setup to Write End 7ns t HA Address Hold from Write End 0ns t SA Address Setup to Write Start 0ns t PWE WE Pulse Width 7ns t SD Data Setup to Write End 5ns t HD Data Hold from Write End 0ns t LZWE WE HIGH to Low-Z [9]3ns t HZWE WE LOW to High-Z [8, 9]5ns t BWByte Enable to End of Write7nsData Retention Characteristics Over the Operating RangeParameter DescriptionConditions [12]Min MaxUnit V DR V CC for Data Retention 2.0V I CCDR Data Retention CurrentV CC = V DR = 2.0V , CE > V CC – 0.3V , V IN > V CC – 0.3V or V IN < 0.3V20mA t CDR [4]Chip Deselect to Data Retention Time 0ns t R [13]Operation Recovery Timet RCnsAC Switching Characteristics [6] Over the Operating Range (continued)ParameterDescription–10UnitMinMax3.0V 3.0V t CDRV DR > 2VDATA RETENTION MODEt RCEV CC Notes10.The internal Write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a Write, and the transition ofeither of these signals can terminate the Write. The input data setup and hold timing should be referenced to the leading edge of the signal that terminates the Write.11.The minimum Write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of t HZWE and t SD .12.No inputs may exceed V CC + 0.3V13.Full device operation requires linear V CC ramp from V DR to V CC (min) > 50 μs or stable at V CC (min) > 50 μs.PRELIMINARY CY7C1051DV33Switching WaveformsRead Cycle No. 1[14, 15]Read Cycle No. 2 (OE Controlled)[15, 16]Notes14.Device is continuously selected. OE, CE, BHE or BHE or both= V IL .15.WE is HIGH for Read cycle.16.Address valid prior to or coincident with CE transition LOW.PREVIOUS DATA VALIDDATA VALIDt RCt AAt OHAADDRESSDATA OUT50%50%DATA VALIDt RCt ACEt DOE t LZOE t LZCE t PUHIGH IMPEDANCEt HZOEt HZBEt PDHIGHOE CEICC ISB IMPEDANCEADDRESSDATA OUT V CC SUPPLY t DBE t LZBEt HZCE BHE,BLECURRENTI CCI SBPRELIMINARY CY7C1051DV33Write Cycle No. 1 (CE Controlled)[17, 18]Write Cycle No. 2 (BLE or BHE Controlled)Notes17.Data I/O is high-impedance if OE or BHE or BLE or both = V IH .18.If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.Switching Waveforms (continued)t HDt SDt SCEt SA t HAt AWt PWEt WCBWDATAI/OADDRESSCEWEBHE,BLEt t HDt SDt BWt SA t HAt AWt PWEt WCt SCEDATAI/OADDRESSBHE,BLEWECEPRELIMINARY CY7C1051DV33Write Cycle No. 3 (WE Controlled, OE LOW)Switching Waveforms (continued)t HDt SDt SCEt HAt AWt PWEt WCt BWDATA I/OADDRESSCEWEBHE,BLEt SAt LZWEt HZWETruth TableCE OE WE BLE BHE I/O 0–I/O 7I/O 8–I/O 15ModePower H X X X X High-Z High-Z Power-down Standby (I SB )L L H L L Data Out Data Out Read All Bits Active (I CC )L L H L H Data Out High-Z Read Lower Bits Only Active (I CC )L L H H L High-Z Data Out Read Upper Bits Only Active (I CC )L X L L L Data In Data In Write All Bits Active (I CC )L X L L H Data In High-Z Write Lower Bits Only Active (I CC )L X L H L High-Z Data In Write Upper Bits Only Active (I CC )LHHXXHigh-ZHigh-ZSelected, Outputs DisabledActive (I CC )Ordering InformationSpeed (ns)Ordering Code Package Diagram Package TypeOperating Range 10CY7C1051DV33-10BAXI 51-8510648-ball FBGA (Pb-Free)IndustrialCY7C1051DV33-10ZSXI51-8508744-pin TSOP II (Pb-Free)Please contact your local Cypress sales representative for availability of these parts.PRELIMINARY CY7C1051DV33 Package DiagramsPRELIMINARY CY7C1051DV33Document #: 001-00063 Rev. *C Page 10 of 11© Cypress Semiconductor Corporation, 2006-2007. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the All products and company names mentioned in this document may be the trademarks of their respective holders.Figure 2. 44-pin TSOP II (51-85087)Package Diagrams (continued)51-85087-*APRELIMINARY CY7C1051DV33Document #: 001-00063 Rev. *C Page 11 of 11Document History Page Document Title: CY7C1051DV33 8-Mbit (512K x 16) Static RAM Document Number: 001-00063REV.ECN NO.Issue Date Orig. of Change Description of Change **342195See ECN PCI New Data Sheet *A 380574See ECN SYT Redefined I CC values for Com’l and Ind’l temperature rangesI CC (Com’l): Changed from 110, 90 and 80 mA to 110, 100 and 95 mA for 8, 10and 12 ns speed bins respectivelyI CC (Ind’l): Changed from 110, 90 and 80 mA to 120, 110 and 105 mA for 8, 10and 12 ns speed bins respectivelyChanged the Capacitance values from 8 pF to 10 pF on Page # 3*B 485796See ECN NXR Changed address of Cypress Semiconductor Corporation on Page# 1 from“3901 North First Street” to “198 Champion Court”Removed -8 and -12 Speed bins from product offering,Removed Commercial Operating Range option,Modified Maximum Ratings for DC input voltage from -0.5V to -0.3V andV CC + 0.5V to V CC + 0.3VChanged the Description of I IX from Input Load Current toInput Leakage Current.Changed t HZBE from 5 ns to 6 nsUpdated footnote #7 on High-Z parameter measurementAdded footnote #11Updated the Ordering Information table and Replaced Package Name columnwith Package Diagram.*C 866000See ECN NXRChanged ball E3 from V SS to NC in FBGA pin configuration [+] FeedbThis datasheet has been downloaded from:Free DownloadDaily Updated Database100% Free Datasheet Search Site100% Free IC Replacement Search SiteConvenient Electronic DictionaryFast Search SystemAll Datasheets Cannot Be Modified Without PermissionCopyright © Each Manufacturing Company。

USB控制芯片cy7c68013中文手册

USB控制芯片cy7c68013中文手册
■ CY7C68014A:适合电池供电应用 ❐ 挂起电流:100 μA (typ)
■ CY7C68013A:适合非电池供电应用 ❐ 挂起电流:300 μA (typ)
■ 有五种无铅封装供选择,可包含多达 40 个 GPIO ❐ 128 引脚 TQFP (40 个 GPIO)、 100 引脚 TQFP (40 个 GPIO)、 56 引脚 QFN (24 个 GPIO)、 56 引脚 SSOP (24 个 GPIO)和 56 引脚 VFBGA (24 个 GPIO)
注 1. 以 115 KBaud 的速率运行也是可能的,只要分别针对 UART0、 UART1 或针对二者将 8051 SMOD0 或 SMOD1 位编程为 “1” 即可。
文件编号:001-50431 修订版 **
第 3 页,共 61 页
[+] Feedback
CY7C68013A, CY7C68014A CY7C68015A, CY7C68016A
■ 有商业和工业温度等级供选择 (除 VFBGA 外的所有封装)
Cypress Semiconductor Corporation • 198 Champion Court 文件编号:001-50431 修订版 **
• San Jose, CA 95134-1709 • 408-943-2600
修订时间 2008 年 12 月 11 日
1.2 特色 (仅限 CY7C68015A/16A)
■ CY7C68016A:适合电池供电应用 ❐ 挂起电流:100 μA (typ)
■ CY7C68015A:适合非电池供电应用 ❐ 挂起电流:300 μA (typ)
■ 采用无铅 56 引脚 QFN 封装 (26 个 GPIO) ❐ 比 CY7C68013A/14A 多 2 个 GPIO,可在同样的空间内实现 额外的功能

CY7C1041CV33-10ZXI中文资料

CY7C1041CV33-10ZXI中文资料

Industrial
100
95
Automotive-A
100
Automotive-E
Commercial/
10
10
Industrial
Automotive-A
10
Automotive-E
48-ball FBGA
(Top View)
12
3
4
5
6
CY7C1041CV33
-15
-20
Unit
15
20
ns
80
28
A6, E3, G2, H1, No Connect No Connects. This pin is not connected to the die
H6
17
G5
Input/Control Write Enable Input, active LOW. When selected LOW, a
A5 18 A6 19 A7 20 A8 21 A9 22
44 A17 43 A16 42 A15 41 OE
40 BHE 39 BLE
38 I/O15 37 I/O14 36 I/O13 35 I/O12 34 VSS 33 VCC 32 I/O11 31 I/O10 30 I/O9 29 I/O8 28 NC
WRITE is conducted. When selected HIGH, a READ is
conducted.
6
ห้องสมุดไป่ตู้B5
Input/Control Chip Enable Input, active LOW. When LOW, selects the chip.
When HIGH, deselects the chip.

CY7C63723-PC中文资料

CY7C63723-PC中文资料

元器件交易网CY7C63743CY7C63722/23CY7C63743enCoRe™ USBCombination Low-Speed USB & PS/2Peripheral ControllerTABLE OF CONTENTS1.0 FEATURES (5)2.0 FUNCTIONAL OVERVIEW (6)2.1 enCoRe USB - The New USB Standard (6)3.0 LOGIC BLOCK DIAGRAM (7)4.0 PIN CONFIGURATIONS (7)5.0 PIN ASSIGNMENTS (7)6.0 PROGRAMMING MODEL (8)6.1 Program Counter (PC) (8)6.2 8-bit Accumulator (A) (8)6.3 8-bit Index Register (X) (8)6.4 8-bit Program Stack Pointer (PSP) (8)6.5 8-bit Data Stack Pointer (DSP) (9)6.6 Address Modes (9)6.6.1 Data (9)6.6.2 Direct (9)6.6.3 Indexed (9)7.0 INSTRUCTION SET SUMMARY (10)8.0 MEMORY ORGANIZATION (11)8.1 Program Memory Organization (11)8.2 Data Memory Organization (12)8.3 I/O Register Summary (13)9.0 CLOCKING (14)9.1 Internal/External Oscillator Operation (15)9.2 External Oscillator (16)10.0 RESET (16)10.1 Low-voltage Reset (LVR) (16)10.2 Brown Out Reset (BOR) (16)10.3 Watchdog Reset (WDR) (17)11.0 SUSPEND MODE (17)11.1 Clocking Mode on Wake-up from Suspend (18)11.2 Wake-up Timer (18)12.0 GENERAL PURPOSE I/O PORTS (18)12.1 Auxiliary Input Port (21)13.0 USB SERIAL INTERFACE ENGINE (SIE) (22)13.1 USB Enumeration (22)13.2 USB Port Status and Control (22)14.0 USB DEVICE (24)14.1 USB Address Register (24)14.2 USB Control Endpoint (24)14.3 USB Non-control Endpoints (25)14.4 USB Endpoint Counter Registers (26)15.0 USB REGULATOR OUTPUT (27)16.0 PS/2 OPERATION (27)17.0 SERIAL PERIPHERAL INTERFACE (SPI) (28)17.1 Operation as an SPI Master (29)17.2 Master SCK Selection (29)17.3 Operation as an SPI Slave (29)17.4 SPI Status and Control (30)17.5 SPI Interrupt (31)17.6 SPI Modes for GPIO Pins (31)18.0 12-BIT FREE-RUNNING TIMER (31)19.0 TIMER CAPTURE REGISTERS (32)20.0 PROCESSOR STATUS AND CONTROL REGISTER (35)21.0 INTERRUPTS (36)21.1 Interrupt Vectors (37)21.2 Interrupt Latency (37)21.3 Interrupt Sources (37)22.0 USB MODE TABLES (42)23.0 REGISTER SUMMARY (47)24.0 ABSOLUTE MAXIMUM RATINGS (48)25.0 DC CHARACTERISTICS (48)26.0 SWITCHING CHARACTERISTICS (50)27.0 ORDERING INFORMATION (55)28.0 PACKAGE DIAGRAMS (55)LIST OF FIGURESFigure 8-1. Program Memory Space with Interrupt Vector Table (11)Figure 8-2. Data Memory Organization (12)Figure 9-1. Clock Oscillator On-chip Circuit (14)Figure 9-2. Clock Configuration Register (Address 0xF8) (14)Figure 10-1. Watchdog Reset (WDR, Address 0x26) (17)Figure 12-1. Block Diagram of GPIO Port (one pin shown) (19)Figure 12-2. Port 0 Data (Address 0x00) (19)Figure 12-3. Port 1 Data (Address 0x01) (19)Figure 12-4. GPIO Port 0 Mode0 Register (Address 0x0A) (20)Figure 12-5. GPIO Port 0 Mode1 Register (Address 0x0B) (20)Figure 12-6. GPIO Port 1 Mode0 Register (Address 0x0C) (20)Figure 12-7. GPIO Port 1 Mode1 Register (Address 0x0D) (20)Figure 12-8. Port 2 Data Register (Address 0x02) (21)Figure 13-1. USB Status and Control Register (Address 0x1F) (23)Figure 14-1. USB Device Address Register (Address 0x10) (24)Figure 14-2. Endpoint 0 Mode Register (Address 0x12) (25)Figure 14-3. USB Endpoint EP1, EP2 Mode Registers (Addresses 0x14 and 0x16) (26)Figure 14-4. Endpoint 0,1,2 Counter Registers (Addresses 0x11, 0x13 and 0x15) (26)Figure 17-1. SPI Block Diagram (28)Figure 16-1. Diagram of USB-PS/2 System Connections (28)Figure 17-2. SPI Data Register (Address 0x60) (29)Figure 17-3. SPI Control Register (Address 0x61) (30)Figure 17-4. SPI Data Timing (31)Figure 18-1. Timer LSB Register (Address 0x24) (31)Figure 18-2. Timer MSB Register (Address 0x25) (32)Figure 18-3. Timer Block Diagram (32)Figure 19-1. Capture Timers Block Diagram (33)Figure 19-2. Capture Timer A-Rising, Data Register (Address 0x40) (33)Figure 19-3. Capture Timer A-Falling, Data Register (Address 0x41) (34)Figure 19-4. Capture Timer B-Rising, Data Register (Address 0x42) (34)Figure 19-5. Capture Timer B-Falling, Data Register (Address 0x43) (34)Figure 19-6. Capture Timer Status Register (Address 0x45) (34)Figure 19-7. Capture Timer Configuration Register (Address 0x44) (34)Figure 20-1. Processor Status and Control Register (Address 0xFF) (35)Figure 21-1. Global Interrupt Enable Register (Address 0x20) (38)Figure 21-2. Endpoint Interrupt Enable Register (Address 0x21) (39)Figure 21-3. Interrupt Controller Logic Block Diagram (40)Figure 21-4. Port 0 Interrupt Enable Register (Address 0x04) (40)Figure 21-5. Port 1 Interrupt Enable Register (Address 0x05) (40)Figure 21-6. Port 0 Interrupt Polarity Register (Address 0x06) (41)Figure 21-7. Port 1 Interrupt Polarity Register (Address 0x07) (41)Figure 21-8. GPIO Interrupt Diagram (41)Figure 26-1. Clock Timing (51)Figure 26-2. USB Data Signal Timing (51)Figure 26-3. Receiver Jitter Tolerance (52)Figure 26-4. Differential to EOP Transition Skew and EOP Width (52)Figure 26-5. Differential Data Jitter (52)Figure 26-7. SPI Slave Timing, CPHA = 0 (53)Figure 26-6. SPI Master Timing, CPHA = 0 (53)Figure 26-8. SPI Master Timing, CPHA = 1 (54)Figure 26-9. SPI Slave Timing, CPHA = 1 (54)LIST OF TABLESTable 8-1. I/O Register Summary (13)Table 11-1. Wake-up Timer Adjust Settings (18)Table 12-1. Ports 0 and 1 Output Control Truth Table (21)Table 13-1. Control Modes to Force D+/D– Outputs (24)Table 17-1. SPI Pin Assignments (31)Table 19-1. Capture Timer Prescalar Settings (Step size and range for FCLK = 6 MHz) (35)Table 21-1. Interrupt Vector Assignments (37)Table 22-1. USB Register Mode Encoding for Control and Non-Control Endpoints (42)Table 22-2. Decode table for Table 22-3: “Details of Modes for Differing Traffic Conditions” (44)Table 22-3. Details of Modes for Differing Traffic Conditions (45)Table 28-1. CY7C63722-XC Probe Pad Coordinates in microns ((0,0) to bond pad centers) (57)1.0 Features•enCoRe™ USB - enhanced Component Reduction—Internal oscillator eliminates the need for an external crystal or resonator—Interface can auto-configure to operate as PS/2 or USB without the need for external components to switch between modes (no GPIO pins needed to manage dual mode capability)—Internal 3.3V regulator for USB pull-up resistor—Configurable GPIO for real-world interface without external components•Flexible, cost-effective solution for applications that combine PS/2 and low-speed USB, such as mice, gamepads, joysticks, and many others.•USB Specification Compliance—Conforms to USB Specification, Version 2.0—Conforms to USB HID Specification, Version 1.1—Supports 1 Low-Speed USB device address and 3 data endpoints—Integrated USB transceiver—3.3V regulated output for USB pull-up resistor•8-bit RISC microcontroller—Harvard architecture—6-MHz external ceramic resonator or internal clock mode—12-MHz internal CPU clock—Internal memory—256 bytes of RAM—8 Kbytes of EPROM—Interface can auto-configure to operate as PS/2 or USB—No external components for switching between PS/2 and USB modes—No GPIO pins needed to manage dual mode capability•I/O ports—Up to 16 versatile General Purpose I/O (GPIO) pins, individually configurable—High current drive on any GPIO pin: 50 mA/pin current sink—Each GPIO pin supports high-impedance inputs, internal pull-ups, open drain outputs or traditional CMOS outputs —Maskable interrupts on all I/O pins•SPI serial communication block—Master or slave operation—2 Mbit/s transfers•Four 8-bit Input Capture registers—Two registers each for two input pins—Capture timer setting with 5 prescaler settings—Separate registers for rising and falling edge capture—Simplifies interface to RF inputs for wireless applications•Internal low-power wake-up timer during suspend mode—Periodic wake-up with no external components•Optional 6-MHz internal oscillator mode—Allows fast start-up from suspend mode•Watchdog Reset (WDR)•Low-voltage Reset at 3.75V•Internal brown-out reset for suspend mode•Improved output drivers to reduce EMI•Operating voltage from 4.0V to 5.5VDC•Operating temperature from 0 to 70 degrees Celsius•CY7C63723 available in 18-pin SOIC, 18-pin PDIP•CY7C63743 available in 24-pin SOIC, 24-pin PDIP•CY7C63722 available in DIE form•Industry standard programmer support2.0 Functional Overview2.1enCoRe USB - The New USB StandardCypress has re-invented its leadership position in the low-speed USB market with a new family of innovative microcontrollers. Introducing...enCoRe USB—“enhanced Component Reduction.” Cypress has leveraged its design expertise in USB solutions to create a new family of low-speed USB microcontrollers that enables peripheral developers to design new products with a minimum number of components. At the heart of the enCoRe USB technology is the breakthrough design of a crystal-less oscillator. By integrating the oscillator into our chip, an external crystal or resonator is no longer needed. We have also integrated other external components commonly found in low-speed USB applications such as pull-up resistors, wake-up circuitry, and a 3.3V regulator. All of this adds up to a lower system cost.The CY7C637xx is an 8-bit RISC One Time Programmable (OTP) microcontroller. The instruction set has been optimized specif-ically for USB and PS/2 operations, although the microcontrollers can be used for a variety of other embedded applications. The CY7C637xx features up to 16 general purpose I/O (GPIO) pins to support USB, PS/2 and other applications. The I/O pins are grouped into two ports (Port 0 to 1) where each pin can be individually configured as inputs with internal pull-ups, open drain outputs, or traditional CMOS outputs with programmable drive strength of up to 50 mA output drive. Additionally, each I/O pin can be used to generate a GPIO interrupt to the microcontroller. Note the GPIO interrupts all share the same “GPIO” interrupt vector. The CY7C637xx microcontrollers feature an internal oscillator. With the presence of USB traffic, the internal oscillator can be set to precisely tune to USB timing requirements (6 MHz ±1.5%). Optionally, an external 6-MHz ceramic resonator can be used to provide a higher precision reference for USB operation. This clock generator reduces the clock-related noise emissions (EMI). The clock generator provides the 6- and 12-MHz clocks that remain internal to the microcontroller.The CY7C637xx has 8 Kbytes of EPROM and 256 bytes of data RAM for stack space, user variables, and USB FIFOs.These parts include low-voltage reset logic, a watchdog timer, a vectored interrupt controller, a 12-bit free-running timer, and capture timers. The low-voltage reset (LVR) logic detects when power is applied to the device, resets the logic to a known state, and begins executing instructions at EPROM address 0x0000. LVR will also reset the part when V CC drops below the operating voltage range. The watchdog timer can be used to ensure the firmware never gets stalled for more than approximately 8 ms. The microcontroller supports 10 maskable interrupts in the vectored interrupt controller. Interrupt sources include the USB Bus-Reset, the 128-µs and 1.024-ms outputs from the free-running timer, three USB endpoints, two capture timers, an internal wake-up timer and the GPIO ports. The timers bits cause periodic interrupts when enabled. The USB endpoints interrupt after USB transactions complete on the bus. The capture timers interrupt whenever a new timer value is saved due to a selected GPIO edge event. The GPIO ports have a level of masking to select which GPIO inputs can cause a GPIO interrupt. For additional flexibility, the input transition polarity that causes an interrupt is programmable for each GPIO pin. The interrupt polarity can be either rising or falling edge.The free-running 12-bit timer clocked at 1 MHz provides two interrupt sources as noted above (128 µs and 1.024 ms). The timer can be used to measure the duration of an event under firmware control by reading the timer at the start and end of an event, and subtracting the two values. The four capture timers save a programmable 8 bit range of the free-running timer when a GPIO edge occurs on the two capture pins (P0.0, P0.1).The CY7C637xx includes an integrated USB serial interface engine (SIE) that supports the integrated peripherals. The hardware supports one USB device address with three endpoints. The SIE allows the USB host to communicate with the function integrated into the microcontroller. A 3.3V regulated output pin provides a pull-up source for the external USB resistor on the D– pin.The USB D+ and D– USB pins can alternately be used as PS/2 SCLK and SDATA signals, so that products can be designed to respond to either USB or PS/2 modes of operation. PS/2 operation is supported with internal pull-up resistors on SCLK and SDATA, the ability to disable the regulator output pin, and an interrupt to signal the start of PS/2 activity. No external components are necessary for dual USB and PS/2 systems, and no GPIO pins need to be dedicated to switching between modes. Slow edge rates operate in both modes to reduce EMI.3.0 Logic Block Diagram4.0 Pin Configurations5.0 Pin AssignmentsNameI/O CY7C63723CY7C63743CY7C63722Description18-Pin 24-Pin 25-Pad D–/SDATA,D+/SCLK I/O 121315161617USB differential data lines (D– and D+), or PS/2 clock and data signals (SDATA and SCLK)P0[7:0]I/O1, 2, 3, 4,15, 16, 17, 181, 2, 3, 4,21, 22, 23, 241, 2, 3, 4,22, 23, 24, 25GPIO Port 0 capable of sinking up to 50 mA/pin, or sinking controlled low or high programmable current.Can also source 2 mA current, provide a resistive pull-up, or serve as a high-impedance input. P0.0 and P0.1 provide inputs to Capture Timers A and B, respec-tively.P1[7:0]I/O5, 145, 6, 7, 8,17, 18, 19, 205, 6, 7, 8,18, 19, 20, 21IO Port 1 capable of sinking up to 50 mA/pin, or sinking controlled low or high programmable current. Can alsosource 2 mA current, provide a resistive pull-up, or serve as a high-impedance input.Wake-Up 12-bit Timer USB &D+,D–P1.0–P1.7Interrupt ControllerPort 0P0.0–P0.7GPIO8-bit RISC Xtal RAM 256 Byte EPROM 8K ByteCoreBrown-out Reset XcvrWatch Timer Dog 3.3V Port 1GPIO Capture TimersUSB Engine PS/2Internal Oscillator Oscillator Low ResetVoltage RegulatorTimerSPIXTALOUTXTALIN/P2.1VREG/P2.01234569111516171819202221P0.0P0.1P0.2P0.3P1.0P1.2VSS VREG/P2.0P0.6P1.5P1.1P1.3D+/SCLK P1.7D–/SDATA VCC14P0.710VPPXTALIN/P2.1XTALOUT121378P1.4P1.62423P0.4P0.524-pin SOIC/PDIPCY7C6374312346781011121315161817P0.0P0.1P0.2P0.3VSS VREG/P2.0P0.4P0.6P0.7D+/SCLK D–/SDATA VCC18-pin SOIC/PDIPP0.59VPPXTALIN/P2.1XTALOUTCY7C63723514P1.0P1.1Top View4 5 6 7 8 93 P 0.21 P 0.0 2 P 0.125 P 0.4 24 P 0.523 P 0.622 21 20 19 1811121314151617P0.3P1.0P1.2P1.4P1.6 VSS VSS V P P X T A L I N /P 2.1V R E G X T A L O U T V C C D -/S D A T A D+/SCLK P0.7P1.1P1.3P1.5P1.7CY7C63722-XCDIE106.0 Programming ModelRefer to the CYASM Assembler User’s Guide for more details on firmware operation with the CY7C637xx microcontrollers.6.1Program Counter (PC)The 14-bit program counter (PC) allows access for up to 8 Kbytes of EPROM using the CY7C637xx architecture. The program counter is cleared during reset, such that the first instruction executed after a reset is at address 0x0000. This instruction is typically a jump instruction to a reset handler that initializes the application.The lower 8 bits of the program counter are incremented as instructions are loaded and executed. The upper 6 bits of the program counter are incremented by executing an XPAGE instruction. As a result, the last instruction executed within a 256-byte “page”of sequential code should be an XPAGE instruction. The assembler directive “XPAGEON” will cause the assembler to insert XPAGE instructions automatically. As instructions can be either one or two bytes long, the assembler may occasionally need to insert a NOP followed by an XPAGE for correct execution.The program counter of the next instruction to be executed, carry flag, and zero flag are saved as two bytes on the program stack during an interrupt acknowledge or a CALL instruction. The program counter, carry flag, and zero flag are restored from the program stack only during a RETI instruction.Please note the program counter cannot be accessed directly by the firmware. The program stack can be examined by reading SRAM from location 0x00 and up.6.28-bit Accumulator (A)The accumulator is the general-purpose, do everything register in the architecture where results are usually calculated.6.38-bit Index Register (X)The index register “X” is available to the firmware as an auxiliary accumulator. The X register also allows the processor to perform indexed operations by loading an index value into X.6.48-bit Program Stack Pointer (PSP)During a reset, the program stack pointer (PSP) is set to zero. This means the program “stack” starts at RAM address 0x00 and “grows” upward from there. Note that the program stack pointer is directly addressable under firmware control, using the MOV PSP ,A instruction. The PSP supports interrupt service under hardware control and CALL, RET, and RETI instructions under firmware control.During an interrupt acknowledge, interrupts are disabled and the program counter, carry flag, and zero flag are written as two bytes of data memory. The first byte is stored in the memory addressed by the program stack pointer, then the PSP is incremented.The second byte is stored in memory addressed by the program stack pointer and the PSP is incremented again. The net effect is to store the program counter and flags on the program “stack” and increment the program stack pointer by two.The return from interrupt (RETI) instruction decrements the program stack pointer, then restores the second byte from memory addressed by the PSP . The program stack pointer is decremented again and the first byte is restored from memory addressed by the PSP . After the program counter and flags have been restored from stack, the interrupts are enabled. The effect is to restore the program counter and flags from the program stack, decrement the program stack pointer by two, and re-enable interrupts.The call subroutine (CALL) instruction stores the program counter and flags on the program stack and increments the PSP by two.XTALIN/P2.1IN 912136-MHz ceramic resonator or external clock input, or P2.1 inputXTALOUT OUT1013146-MHz ceramic resonator return pin or internal oscillator outputV PP 71011Programming voltage supply, ground for normal operation V CC111415Voltage supplyVREG/P2.0 81112Voltage supply for 1.3-k Ω USB pull-up resistor (3.3V nominal). Also serves as P2.0 input.V SS699, 10Ground5.0 Pin Assignments (continued)NameI/O CY7C63723CY7C63743CY7C63722Description18-Pin 24-Pin 25-PadThe return from subroutine (RET) instruction restores the program counter, but not the flags, from program stack and decrements the PSP by two.Note that there are restrictions in using the JMP, CALL, and INDEX instructions across the 4-KB boundary of the program memory. Refer to the CYASM Assembler User’s Guide for a detailed description.6.58-bit Data Stack Pointer (DSP)The data stack pointer (DSP) supports PUSH and POP instructions that use the data stack for temporary storage. A PUSH instruction will pre-decrement the DSP, then write data to the memory location addressed by the DSP. A POP instruction will read data from the memory location addressed by the DSP, then post-increment the DSP.During a reset, the Data Stack Pointer will be set to zero. A PUSH instruction when DSP equals zero will write data at the top of the data RAM (address 0xFF). This would write data to the memory area reserved for a FIFO for USB endpoint 0. In non-USB applications, this works fine and is not a problem.For USB applications, the firmware should set the DSP to an appropriate location to avoid a memory conflict with RAM dedicated to USB FIFOs. The memory requirements for the USB endpoints are shown in Section 8.2. For example, assembly instructions to set the DSP to 20h (giving 32 bytes for program and data stack combined) are shown below:MOV A,20h; Move 20 hex into Accumulator (must be D8h or less to avoid USB FIFOs)SWAP A,DSP; swap accumulator value into DSP register6.6Address ModesThe CY7C637xx microcontrollers support three addressing modes for instructions that require data operands: data, direct, and indexed.6.6.1DataThe “Data” address mode refers to a data operand that is actually a constant encoded in the instruction. As an example, consider the instruction that loads A with the constant 0x30:•MOV A, 30hThis instruction will require two bytes of code where the first byte identifies the “MOV A” instruction with a data operand as the second byte. The second byte of the instruction will be the constant “0xE8h”. A constant may be referred to by name if a prior “EQU” statement assigns the constant value to the name. For example, the following code is equivalent to the example shown above:•DSPINIT: EQU 30h•MOV A,DSPINIT6.6.2Direct“Direct” address mode is used when the data operand is a variable stored in SRAM. In that case, the one byte address of the variable is encoded in the instruction. As an example, consider an instruction that loads A with the contents of memory address location 0x10h:•MOV A, [10h]In normal usage, variable names are assigned to variable addresses using “EQU” statements to improve the readability of the assembler source code. As an example, the following code is equivalent to the example shown above:•buttons: EQU 10h•MOV A,[buttons]6.6.3Indexed“Indexed” address mode allows the firmware to manipulate arrays of data stored in SRAM. The address of the data operand is the sum of a constant encoded in the instruction and the contents of the “X” register. In normal usage, the constant will be the “base” address of an array of data and the X register will contain an index that indicates which element of the array is actually addressed:•array: EQU 10h•MOV X,3•MOV A,[x+array]This would have the effect of loading A with the fourth element of the SRAM “array” that begins at address 0x10h. The fourth element would be at address 0x13h.7.0 Instruction Set SummaryRefer to the CYASM Assembler User’s Guide for detailed information on these instructions. Note that conditional jump instructions (i.e., JC, JNC, JZ, JNZ) take 5 cycles if jump is taken, 4 cycles if no jump.MNEMONIC Operand Opcode Cycles MNEMONIC Operand Opcode Cycles HALT 007NOP 204ADD A,expr data014INC A acc214ADD A,[expr] direct026INC X x224ADD A,[X+expr] index037INC [expr] direct237ADC A,expr data044INC [X+expr] index248ADC A,[expr] direct056DEC A acc254ADC A,[X+expr] index067DEC X x264SUB A,expr data074DEC [expr] direct277SUB A,[expr] direct086DEC [X+expr] index288SUB A,[X+expr] index097IORD expr address295SBB A,expr data0A4IOWR expr address2A5SBB A,[expr] direct0B6POP A2B4SBB A,[X+expr] index0C7POP X2C4OR A,expr data0D4PUSH A2D5OR A,[expr] direct0E6PUSH X2E5OR A,[X+expr] index0F7SWAP A,X2F5AND A,expr data104SWAP A,DSP305AND A,[expr] direct116MOV [expr],A direct315AND A,[X+expr] index127MOV [X+expr],A index326XOR A,expr data134OR [expr],A direct337XOR A,[expr] direct146OR [X+expr],A index348XOR A,[X+expr] index157AND [expr],A direct357CMP A,expr data165AND [X+expr],A index368CMP A,[expr] direct177XOR [expr],A direct377CMP A,[X+expr] index188XOR [X+expr],A index388MOV A,expr data194IOWX [X+expr] index396MOV A,[expr] direct1A5CPL 3A4MOV A,[X+expr] index1B6ASL 3B4MOV X,expr data1C4ASR 3C4MOV X,[expr] direct1D5RLC 3D4reserved 1E RRC 3E4XPAGE 1F4RET 3F8MOV A,X404DI 704MOV X,A414EI 724MOV PSP,A604RETI 738CALL addr50 - 5F10JMP addr80-8F5JC addr C0-CF 5 (or 4) CALL addr90-9F10JNC addr D0-DF 5 (or 4)JZ addr A0-AF 5 (or 4)JACC addr E0-EF7JNZ addr B0-BF 5 (or 4)INDEX addr F0-FF148.0 Memory Organization8.1Program Memory Organization[1]After reset Address14 -bit PC0x0000Program execution begins here after a reset.0x0002USB Bus Reset interrupt vector0x0004128-µs timer interrupt vector0x0006 1.024-ms timer interrupt vector0x0008USB endpoint 0 interrupt vector0x000A USB endpoint 1 interrupt vector0x000C USB endpoint 2 interrupt vector0x000E SPI interrupt vector0x0010Capture timer A interrupt Vector0x0012Capture timer B interrupt vector0x0014GPIO interrupt vector0x0016Wake-up interrupt vector0x0018Program Memory begins here0x1FDF8 KB PROM ends here (8K - 32 bytes). See Note below Figure 8-1. Program Memory Space with Interrupt Vector TableNote:1.The upper 32 bytes of the 8K PROM are reserved. Therefore, the user’s program must not overwrite this space.8.2Data Memory OrganizationThe CY7C637xx microcontrollers provide 256 bytes of data RAM. In normal usage, the SRAM is partitioned into four areas: program stack, data stack, user variables and USB endpoint FIFOs as shown below:After reset Address8-bit DSP8-bit PSP0x00Program Stack Growth(User’s firmware movesDSP)8-bit DSP User Selected Data Stack GrowthUser Variables0xE8USB FIFO for Address A endpoint 20xF0USB FIFO for Address A endpoint 10xF8USB FIFO for Address A endpoint 0Top of RAM Memory0xFFFigure 8-2. Data Memory Organization8.3I/O Register SummaryI/O registers are accessed via the I/O Read (IORD) and I/O Write (IOWR, IOWX) instructions. IORD reads the selected port into the accumulator. IOWR writes data from the accumulator to the selected port. Indexed I/O Write (IOWX) adds the contents of X to the address in the instruction to form the port address and writes data from the accumulator to the specified port. Note that specifying address 0 with IOWX (e.g., IOWX 0h) means the I/O port is selected solely by the contents of X.Note:All bits of all registers are cleared to all zeros on reset, except the Processor Status and Control Register (Figure20-1). All registers not listed are reserved, and should never be written by firmware. All bits marked as reserved should always be written as 0 and be treated as undefined by reads.Table 8-1. I/O Register SummaryRegister Name I/O Address Read/Write Function Fig. Port 0 Data0x00R/W GPIO Port 012-2 Port 1 Data0x01R/W GPIO Port 112-3 Port 2 Data0x02R Auxiliary input register for D+, D–, VREG, XTALIN 12-8 Port 0 Interrupt Enable0x04W Interrupt enable for pins in Port 021-4 Port 1 Interrupt Enable0x05W Interrupt enable for pins in Port 121-5 Port 0 Interrupt Polarity 0x06W Interrupt polarity for pins in Port 021-6 Port 1 Interrupt Polarity 0x07W Interrupt polarity for pins in Port 121-7 Port 0 Mode0 0x0A W Controls output configuration for Port 012-4 Port 0 Mode10x0B W12-5 Port 1 Mode00x0C W Controls output configuration for Port 112-6 Port 1 Mode10x0D W12-7 USB Device Address0x10R/W USB Device Address register14-1 EP0 Counter Register0x11R/W USB Endpoint 0 counter register14-4 EP0 Mode Register0x12R/W USB Endpoint 0 configuration register14-2 EP1 Counter Register0x13R/W USB Endpoint 1 counter register14-4 EP1 Mode Register0x14R/W USB Endpoint 1 configuration register14-3 EP2 Counter Register0x15R/W USB Endpoint 2 counter register14-4 EP2 Mode Register0x16R/W USB Endpoint 2 configuration register14-3 USB Status & Control0x1F R/W USB status and control register13-1 Global Interrupt Enable0x20R/W Global interrupt enable register21-1 Endpoint Interrupt Enable0x21R/W USB endpoint interrupt enables21-2 Timer (LSB)0x24R Lower 8 bits of free-running timer (1 MHz)18-1 Timer (MSB)0x25R Upper 4 bits of free-running timer18-2 WDR Clear0x26W Watchdog Reset clear-Capture Timer A Rising0x40R Rising edge Capture Timer A data register19-2 Capture Timer A Falling0x41R Falling edge Capture Timer A data register19-3 Capture Timer B Rising0x42R Rising edge Capture Timer B data register19-4 Capture Timer B Falling0x43R Falling edge Capture Timer B data register19-5 Capture TImer Configuration0x44R/W Capture Timer configuration register19-7 Capture Timer Status0x45R Capture Timer status register19-6 SPI Data0x60R/W SPI read and write data register17-2 SPI Control0x61R/W SPI status and control register17-3 Clock Configuration0xF8R/W Internal / External Clock configuration register9-2 Processor Status & Control0xFF R/W Processor status and control20-1。

cy7c68000中文翻译

cy7c68000中文翻译

CY7C68000TX2™ USB 2.0 UTMI 收发器Jude 译2009.111.0 EZ-USB TX2性能EZ-USB TX2 是一个符合usb2.0的收发器,把串行的解串成30M的16位或者60M的8位的并行接口。

EZ-USB TX2 提供一个高速的物理层接口,可以工作在usb2.0 允许的最大带宽。

这允许设计者把复杂的高速模拟的usb 部分放在数字ASIC的外面,以减少开发时间和关联两部分的风险。

它提供一个被usb2.0鉴定过的标准的接口,这个接口符合UTMI 1.05(dated 3/29/01)版本的协议。

图1-1 为功能模块,EZ-USB TX2的特性:●作为设备符合usb2.0 UTMI的标准●可作业在usb高速480MBIT/S, 和全速12MBIT/S●串到并,并到串转化●8位单向或者8位双向,或者16位双向外部数据接口●在接受包是检测同步场和EOP●在发送包的时候产生同步场和EOP●从usb 串行数据流恢复数据和时钟●位填充/不填充,为填充错误检测●分段运输寄存器,用来管理在位填充/不填充期间数据速率变化●16位30M ,8位60M的并行接口●全速和高速之间终止和发送信号的转换能力(Ability to switch between FS and HSterminations andsignaling翻译的不准,自己领会)●支持对usb 复位,挂起,回复的检测●支持usb2.0定义的高速的识别和检测●支持恢复信号的发射● 3.3v 工作●两种封装选择56脚QFN,56脚SSOP●所有必要的终止,包括DPLUS上的1.5k 的上拉,都在片内●支持usb2.0测试模式2.0 应用• DSL modems数字模拟语言模型• ATA interface ATA接口• Memory card readers存储卡读卡器• Legacy conversion devices遗产转化设备☺• Cameras照相机• Scanners扫描仪• Home PNA☹• Wireless LAN无线局域网• MP3 players mp3 播放器• Networking网络3.0 功能概述3.1 usb 发信号的速度TX2 工作在两种速率:全速:位时间为12Mbps高速:位时间为480Mbps不支持低速速率1.5Mbps3.2 收发器时钟频率TX2 有一个片上的可用24M晶振的振荡器电路,有以下特性:并行振荡基波模型500uw驱动级27-33pf负载电容片上的pll 把24M的时钟倍频为30M或者60M,作为并行数据传输的时钟,DataBus16_8 引脚决定clk 的频率。

CY7C0831AV资料

CY7C0831AV资料

Revised May 10, 2006
Logic Block Diagram[1]
OEL R/WL B0L B1L
CE0L CE1L
CY7C0837AV CY7C0830AV/CY7C0831AV CY7C0832AV/CY7C0833AV
OER R/WR
B0R B1R
CE0R CE1R
DQ9L–DQ17L
True Dual-Ported RAM Array
Address Decode
Address Decode
Interrupt Logic
MRST
Reset Logic
TMS TDI TCK
JTAG
Addr. Read Back
Mask Register
Counter/ Address Register Mirror Reg
1-Mbit (64K x 18)
CY7C0830AV
167
4.0
225
120 TQFP 144 FBGA
2-Mbit (128K x 18)
CY7C0831AV
167
4.0
225
120 TQFP 144 FBGA
4-Mbit (256K 18)
CY7C0832AV
167
4.0
225
120 TQFP 144 FBGA
CY7C093794V CY7C093894V CY7C09289V CY7C09369V CY7C09379V CY7C09389VFLEx18™ 3.3V 64K/128K x 36 and 128K/256K x 18 Synchronous Dual-Port RAM
CY7C0837AV CY7C0830AV/CY7C0831AV CY7C0832AV/CY7C0833AV

CY7C67300-100AI资料

CY7C67300-100AI资料

CY7C67300 EZ-Host™ Programmable EmbeddedUSB Host/Peripheral ControllerTABLE OF CONTENTS1.0 INTRODUCTION (10)1.1 EZ-Host Features (10)2.0 TYPICAL APPLICATIONS (11)3.0 FUNCTIONAL OVERVIEW (11)3.1 Processor Core (11)3.1.1 Processor (11)3.1.2 Clocking (11)3.1.3 Memory (11)3.1.4 Interrupts (11)3.1.5 General Timers and Watchdog Timer (11)3.1.6 Power Management (11)4.0 INTERFACE DESCRIPTIONS (11)4.1 USB Interface (13)4.1.1 USB Features (13)4.1.2 USB Pins. (14)4.2 OTG Interface (14)4.2.1 OTG Features (14)4.2.2 OTG Pins. (14)4.3 External Memory Interface (14)4.3.1 External Memory Interface Features (14)4.3.2 External Memory Access Strobes (14)4.3.3 Page Registers (15)4.3.4 Merge Mode (15)4.3.5 Program Memory Hole Description (15)4.3.6 DMA to External Memory Prohibited (15)4.3.7 External Memory Interface Pins (16)4.3.8 External Memory Interface Block Diagrams (17)4.4 General Purpose I/O Interface (GPIO) (18)4.4.1 GPIO Description (18)4.4.2 Unused Pin Descriptions (18)4.5 UART Interface (18)4.5.1 UART Features (18)4.5.2 UART Pins. (18)4.6 I2C EEPROM Interface (18)4.6.1 I2C EEPROM Features (18)4.6.2 I2C EEPROM Pins. (18)4.7 Serial Peripheral Interface (18)4.7.1 SPI Features (19)4.7.2 SPI Pins (19)4.8 High-speed Serial Interface (19)4.8.1 HSS Features (19)4.8.2 HSS Pins (20)4.9 Programmable Pulse/PWM Interface (20)4.9.1 Programmable Pulse/PWM Features (20)4.9.2 Programmable Pulse/PWM Pins. (20)4.10 Host Port Interface (20)4.10.1 HPI Features (20)4.10.2 HPI Pins. (21)TABLE OF CONTENTS (continued)4.11 IDE Interface (21)4.11.1 IDE Features (22)4.11.2 IDE Pins (22)4.12 Charge Pump Interface (22)4.12.1 Charge Pump Features (23)4.12.2 Charge Pump Pins. (23)4.13 Booster Interface (23)4.13.1 Booster Pins. (24)4.14 Crystal Interface (25)4.14.1 Crystal Pins (25)4.15 Boot Configuration Interface (25)4.16 Operational Modes (26)4.16.1 Coprocessor Mode (26)4.16.2 Standalone Mode (26)5.0 POWER-SAVINGS AND RESET DESCRIPTION (27)5.1 Power-Savings Mode Description (27)5.2 Sleep (27)5.3 External (Remote) wakeup Source (27)5.4 Power-On-Reset Description (27)5.5 Reset Pin (27)5.6 USB Reset (27)6.0 MEMORY MAP (28)6.1 Mapping (28)6.1.1 Internal Memory (28)6.1.2 External Memory (28)7.0 REGISTERS (30)7.1 Processor Control Registers (30)7.1.1 CPU Flags Register [0xC000] [R] (30)7.1.2 Bank Register [0xC002] [R/W] (31)7.1.3 Hardware Revision Register [0xC004] [R] (31)7.1.4 CPU Speed Register [0xC008] [R/W] (32)7.1.5 Power Control Register [0xC00A] [R/W] (33)7.1.6 Interrupt Enable Register [0xC00E] [R/W] (35)7.1.7 Breakpoint Register [0xC014] [R/W] (36)7.1.8 USB Diagnostic Register [0xC03C] [R/W] (37)7.1.9 Memory Diagnostic Register [0xC03E] [W] (38)7.2 External Memory Registers (39)7.2.1 Extended Page n Map Register [R/W] (39)7.2.2 Upper Address Enable Register [0xC038] [R/W] (39)7.2.3 External Memory Control Register [0xC03A] [R/W] (40)7.3 Timer Registers (41)7.3.1 Watchdog Timer Register [0xC00C] [R/W] (41)7.3.2 Timer n Register [R/W] (42)7.4 General USB Registers (42)7.4.1 USB n Control Register [R/W] (42)7.5 USB Host Only Registers (45)7.5.1 Host n Control Register [R/W] (45)7.5.2 Host n Address Register [R/W] (46)TABLE OF CONTENTS (continued)7.5.3 Host n Count Register [R/W] (46)7.5.4 Host n Endpoint Status Register [R] (47)7.5.5 Host n PID Register [W] (48)7.5.6 Host n Count Result Register [R] (49)7.5.7 Host n Device Address Register [W] (50)7.5.8 Host n Interrupt Enable Register [R/W] (50)7.5.9 Host n Status Register [R/W] (52)7.5.10 Host n SOF/EOP Count Register [R/W] (53)7.5.11 Host n SOF/EOP Counter Register [R] (53)7.5.12 Host n Frame Register [R] (54)7.6 USB Device Only Registers (54)7.6.1 Device n Endpoint n Control Register [R/W] (55)7.6.2 Device n Endpoint n Address Register [R/W] (56)7.6.3 Device n Endpoint n Count Register [R/W] (57)7.6.4 Device n Endpoint n Status Register [R/W] (57)7.6.5 Device n Endpoint n Count Result Register [R/W] (59)7.6.6 Device n Port Select Register [R/W] (60)7.6.7 Device n Interrupt Enable Register [R/W] (60)7.6.8 Device n Address Register [W] (63)7.6.9 Device n Status Register [R/W] (63)7.6.10 Device n Frame Number Register [R] (65)7.6.11 Device n SOF/EOP Count Register [W] (66)7.7 OTG Control Registers (66)7.7.1 OTG Control Register [0xC098] [R/W] (66)7.8 GPIO Registers (68)7.8.1 GPIO Control Register [0xC006] [R/W] (68)7.8.2 GPIO n Output Data Register [R/W] (70)7.8.3 GPIO n Input Data Register [R] (70)7.8.4 GPIO n Direction Register [R/W] (71)7.9 IDE Registers (71)7.9.1 IDE Mode Register [0xC048] [R/W] (71)7.9.2 IDE Start Address Register [0xC04A] [R/W] (72)7.9.3 IDE Stop Address Register [0xC04C] [R/W] (72)7.9.4 IDE Control Register [0xC04E] [R/W] (73)7.9.5 IDE PIO Port Registers [0xC050 - 0xC06F] [R/W] (74)7.10 HSS Registers (74)7.10.1 HSS Control Register [0xC070] [R/W] (75)7.10.2 HSS Baud Rate Register [0xC072] [R/W] (77)7.10.3 HSS Transmit Gap Register [0xC074] [R/W] (77)7.10.4 HSS Data Register [0xC076] [R/W] (78)7.10.5 HSS Receive Address Register [0xC078] [R/W] (78)7.10.6 HSS Receive Counter Register [0xC07A] [R/W] (79)7.10.7 HSS Transmit Address Register [0xC07C] [R/W] (79)7.10.8 HSS Transmit Counter Register [0xC07E] [R/W] (79)7.11 HPI Registers (80)7.11.1 HPI Breakpoint Register [0x0140] [R] (80)7.11.2 Interrupt Routing Register [0x0142] [R] (81)7.11.3 SIEXmsg Register [W] (82)7.11.4 HPI Mailbox Register [0xC0C6] [R/W] (83)7.11.5 HPI Status Port [] [HPI: R] (83)TABLE OF CONTENTS (continued)7.12 SPI Registers (85)7.12.1 SPI Configuration Register [0xC0C8] [R/W] (86)7.12.2 SPI Control Register [0xC0CA] [R/W] (87)7.12.3 SPI Interrupt Enable Register [0xC0CC] [R/W] (89)7.12.4 SPI Status Register [0xC0CE] [R] (89)7.12.5 SPI Interrupt Clear Register [0xC0D0] [W] (90)7.12.6 SPI CRC Control Register [0xC0D2] [R/W] (91)7.12.7 SPI CRC Value Register [0xC0D4] [R/W] (92)7.12.8 SPI Data Register [0xC0D6] [R/W] (92)7.12.9 SPI Transmit Address Register [0xC0D8] [R/W] (93)7.12.10 SPI Transmit Count Register [0xC0DA] [R/W] (93)7.12.11 SPI Receive Address Register [0xC0DC [R/W] (93)7.12.12 SPI Receive Count Register [0xC0DE] [R/W] (94)7.13 UART Registers (94)7.13.1 UART Control Register [0xC0E0] [R/W] (94)7.13.2 UART Status Register [0xC0E2] [R] (95)7.13.3 UART Data Register [0xC0E4] [R/W] (96)7.14 PWM Registers (96)7.14.1 PWM Control Register [0xC0E6] [R/W] (97)7.14.2 PWM Maximum Count Register [0xC0E8] [R/W] (98)7.14.3 PWM n Start Register [R/W] (99)7.14.4 PWM n Stop Register [R/W] (99)7.14.5 PWM Cycle Count Register [0xC0FA] [R/W] (100)8.0 PIN DIAGRAM (101)9.0 PIN DESCRIPTIONS (101)10.0 ABSOLUTE MAXIMUM RATINGS (105)11.0 OPERATING CONDITIONS (105)12.0 CRYSTAL REQUIREMENTS (XTALIN, XTALOUT) (105)13.0 DC CHARACTERISTICS (105)13.1 USB Transceiver (106)14.0 AC TIMING CHARACTERISTICS (107)14.1 Reset Timing (107)14.2 Clock Timing (107)14.3 SRAM Read Cycle (108)14.4 SRAM Write Cycle (109)14.5 I2C EEPROM Timing (110)14.6 HPI (Host Port Interface) Write Cycle Timing (111)14.7 HPI (Host Port Interface) Read Cycle Timing (112)14.8 IDE Timing (113)14.9 HSS BYTE Mode Transmit (113)14.10 HSS Block Mode Transmit (113)14.11 HSS BYTE and BLOCK Mode Receive (113)14.12 Hardware CTS/RTS Handshake (114)15.0 REGISTERS SUMMARY (114)16.0 ORDERING INFORMATION (118)17.0 PACKAGE DIAGRAMS (118)LIST OF FIGURESFigure 1-1. Block Diagram (10)Figure 4-1. Page n Registers External Address Pins Logic (15)Figure 4-2. Interfacing to 64k × 8 Memory Array (17)Figure 4-3. Interfacing up to 256k × 16 for External Code/Data (17)Figure 4-4. Interfacing up to 512k × 8 for External Code/Data (17)Figure 4-5. Charge Pump (23)Figure 4-6. Power Supply Connection With Booster (24)Figure 4-7. Power Supply Connection Without Booster (24)Figure 4-8. Crystal Interface (25)Figure 4-9. Minimum Standalone Hardware Configuration – Peripheral Only (26)Figure 6-1. Memory Map (29)Figure 7-1. Processor Control Registers (30)Figure 7-2. CPU Flags Register (30)Figure 7-3. Bank Register (31)Figure 7-4. Revision Register (31)Figure 7-5. CPU Speed Register (32)Figure 7-6. Power Control Register (33)Figure 7-7. Interrupt Enable Register (35)Figure 7-8. Breakpoint Register (36)Figure 7-9. USB Diagnostic Register (37)Figure 7-10. Memory Diagnostic Register (38)Figure 7-11. External Memory Control Registers (39)Figure 7-12. Extended Page n Map Register (39)Figure 7-13. External Memory Control Register (39)Figure 7-14. External Memory Control Register (40)Figure 7-15. Timer Registers (41)Figure 7-16. Watchdog Timer Register (41)Figure 7-17. Timer n Register (42)Figure 7-18. General USB Registers (42)Figure 7-19. USB n Control Register (43)Figure 7-20. USB Host Only Register (45)Figure 7-21. Host n Control Register (45)Figure 7-22. Host n Address Register (46)Figure 7-23. Host n Count Register (46)Figure 7-24. Host n Endpoint Status Register (47)Figure 7-25. Host n PID Register (49)Figure 7-26. Host n Count Result Register (49)Figure 7-27. Host n Device Address Register (50)Figure 7-28. Host n Interrupt Enable Register (50)Figure 7-29. Host n Status Register (52)Figure 7-30. Host n SOF/EOP Count Register (53)Figure 7-31. Host n SOF/EOP Counter Register (54)Figure 7-32. Host n Frame Register (54)Figure 7-33. USB Device Only Registers (55)Figure 7-34. Device n Endpoint n Control Register (55)Figure 7-35. Device n Endpoint n Address Register (57)Figure 7-36. Device n Endpoint n Count Register (57)Figure 7-37. Device n Endpoint n Status Register (58)Figure 7-38. Device n Endpoint n Count Result Register (60)LIST OF FIGURES (continued)Figure 7-39. Device n Port Select Register (60)Figure 7-40. Device n Interrupt Enable Register (61)Figure 7-41. Device n Address Register (63)Figure 7-42. Device n Status Register (63)Figure 7-43. Device n Frame Number Register (65)Figure 7-44. Device n SOF/EOP Count Register (66)Figure 7-45. OTG Registers (66)Figure 7-46. OTG Control Register (66)Figure 7-47. GPIO Registers (68)Figure 7-48. GPIO Control Register (68)Figure 7-49. GPIO n Output Data Register (70)Figure 7-50. GPIO n Input Data Register (70)Figure 7-51. GPIO n Direction Register (71)Figure 7-52. IDE Registers (71)Figure 7-53. IDE Mode Register (71)Figure 7-54. IDE Start Address Register (72)Figure 7-55. IDE Stop Address Register (72)Figure 7-56. IDE Control Register (73)Figure 7-57. HSS Registers (74)Figure 7-58. HSS Control Register (75)Figure 7-59. HSS Baud Rate Register (77)Figure 7-60. HSS Transmit Gap Register (77)Figure 7-61. HSS Data Register (78)Figure 7-62. HSS Receive Address Register (78)Figure 7-63. HSS Receive Counter Register (79)Figure 7-64. HSS Transmit Address Register (79)Figure 7-65. HSS Transmit Counter Register (79)Figure 7-66. HPI Registers (80)Figure 7-67. HPI Breakpoint Register (80)Figure 7-68. Interrupt Routing Register (81)Figure 7-69. SIEXmsg Register (82)Figure 7-70. HPI Mailbox Register (83)Figure 7-71. HPI Status Port (83)Figure 7-72. SPI Registers (85)Figure 7-73. SPI Configuration Register (86)Figure 7-74. SPI Control Register (87)Figure 7-75. SPI Interrupt Enable Register (89)Figure 7-76. SPI Status Register (89)Figure 7-77. SPI Interrupt Clear Register (90)Figure 7-78. SPI CRC Control Register (91)Figure 7-79. SPI CRC Value Register (92)Figure 7-80. SPI Data Register (92)Figure 7-81. SPI Transmit Address Register (93)Figure 7-82. SPI Transmit Count Register (93)Figure 7-83. SPI Receive Address Register (93)Figure 7-84. SPI Receive Count Register (94)Figure 7-85. UART Registers (94)Figure 7-86. UART Control Register (94)Figure 7-87. UART Status Register (95)LIST OF FIGURES (continued)Figure 7-88. UART Data Register (96)Figure 7-89. PWM Registers (96)Figure 7-90. PWM Control Register (97)Figure 7-91. PWM Maximum Count Register (98)Figure 7-92. PWM n Start Register (99)Figure 7-93. PWM n Stop Register (99)Figure 7-94. PWM Cycle Count Register (100)Figure 8-1. EZ-Host Pin Diagram (101)LIST OF TABLESTable 4-1. Interface Options for GPIO Pins (12)Table 4-2. Interface Options for External Memory Bus Pins (12)Table 4-3. USB Port Configuration Options (13)Table 4-4. USB Interface Pins (14)Table 4-5. OTG Interface Pins (14)Table 4-6. External Memory Interface Pins (16)Table 4-7. UART Interface Pins (18)Table 4-8. I2C EEPROM Interface Pins (18)Table 4-9. SPI Interface Pins (19)Table 4-10. HSS Interface Pins (20)Table 4-11. PWM Interface Pins (20)Table 4-12. HPI Interface Pins (21)Table 4-13. HPI Addressing (21)Table 4-14. IDE Throughput (22)Table 4-15. IDE Interface Pins (22)Table 4-16. Charge Pump Interface Pins (23)Table 4-17. Charge Pump Interface Pins (24)Table 4-18. Crystal Pins (25)Table 4-19. Boot Configuration Interface (25)Table 5-1. Wakeup Sources (27)Table 7-1. Bank Register Example (31)Table 7-2. CPU Speed Definition (32)Table 7-3. Force Select Definition (38)Table 7-4. Memory Arbitration Select (38)Table 7-5. Period Select Definition (41)Table 7-6. USB Data Line Pull-up and Pull-down Resistors (44)Table 7-7. Port A/B Force D± State (44)Table 7-8. Port Select Definition (47)Table 7-9. PID Select Definition (49)Table 7-10. Mode Select Definition (69)Table 7-11. Mode Select Definition (72)Table 7-12. IDE PIO Port Registers (74)Table 7-13. Scale Select Field Definition for SCK Frequency (86)Table 7-14. CRC Mode Definition (91)Table 7-15. UART Baud Select Definition (95)Table 7-16. Prescaler Select Definition (97)Table 9-1. Pin Descriptions (101)Table 12-1. Crystal Requirements (105)Table 13-1. DC Characteristics (105)Table 13-2. DC Characteristics: Charge Pump (106)Table 15-1. Register Summary (114)Table 16-1. Ordering Information (118)1.0 INTRODUCTIONEZ-Host™ (CY7C67300) is Cypress Semiconductor’s first full-speed, low-cost multiport host/peripheral controller. EZ-Host is designed to easily interface to most high-performance CPUs to add USB host functionality. EZ-Host has its own 16-bit RISC processor to act as a coprocessor or operate in standalone mode. EZ-Host also has a programmable I/O interface block allowing a wide range of interface options.Figure 1-1. Block Diagram1.1EZ-Host Features•Single-chip programmable USB dual-role (Host/Peripheral) controller with two configurable Serial Interface Engines (SIEs) and four USB ports•Support for USB On-The-Go (OTG) protocol•On-chip 48-MHz 16-bit processor with dynamically switchable clock speed•Configurable I/O block supporting a variety of I/O options or up to 32 bits of General Purpose I/O (GPIO)•4K x 16 internal masked ROM containing built-in BIOS that supports a communication ready state with access to I2C EEPROM Interface, external ROM, UART, or USB•8K x 16 internal RAM for code and data buffering•Extended memory interface port for external SRAM and ROM•16-bit parallel Host Port Interface (HPI) with a DMA/Mailbox data path for an external processor to directly access all of the on-chip memory and control on-chip SIEs•Fast serial port supports from 9600 baud to 2.0 Mbaud•SPI support in both master and slave•On-chip 16-bit DMA/Mailbox data path interface•Supports 12-MHz external crystal or clock•3.3V operation•Package option — 100-pin TQFP2.0 Typical ApplicationsEZ-Host is a very powerful and flexible dual role USB controller that supports a wide variety of applications. It is primarily intended to enable host capability in applications such as:•Set-top boxes•Printers•KVM switches•Kiosks•Automotive applications•Wireless access points.3.0 Functional Overview3.1Processor Core3.1.1ProcessorEZ-Host has a general-purpose 16-bit embedded RISC processor that runs at 48 MHz.3.1.2ClockingEZ-Host requires a 12-MHz source for clocking. Either an external crystal or TTL level oscillator may be used. EZ-Host has an internal PLL that produces a 48-MHz internal clock from the 12-MHz source.3.1.3MemoryEZ-Host has a built-in 4K × 16 masked ROM and an 8K × 16 internal RAM. The masked ROM contains the EZ-Host BIOS. The internal RAM can be used for program code or data.3.1.4InterruptsEZ-Host provides 128 interrupt vectors. The first 48 vectors are hardware interrupts and the following 80 vectors are software interrupts.3.1.5General Timers and Watchdog TimerEZ-Host has two built-in programmable timers and a Watchdog timer. All three timers can generate an interrupt to the EZ-Host.3.1.6Power ManagementEZ-Host has one main power saving mode, Sleep. Sleep mode pauses all operations and provides the lowest power state.4.0 Interface DescriptionsEZ-Host has a wide variety of interface options for connectivity. With several interface options available, EZ-Host can act as a seamless data transport between many different types of devices.See Table4-1 and Table4-2 to understand how the interfaces share pins and which can coexist. It should be noted that some interfaces have more then one possible port location selectable through the GPIO Control Register [0xC006]. Below are some general guidelines:•HPI and IDE interfaces are mutually exclusive.•If 16-bit external memory is required, then HSS and SPI default locations must be used.•I2C EEPROM and OTG do not conflict with any interfaces.Notes:1.Default interface location.2.Alternate interface location.Table 4-1. Interface Options for GPIO Pins GPIO Pins HPIIDEPWMHSSSPIUARTI2C OTGGPIO31SCL/SDA GPIO30SCL/SDAGPIO29OTGIDGPIO28TX [1]GPIO27RX [1]GPIO26PWM3CTS [1]GPIO25GPIO24INT IOREADY GPIO23nRD IOR GPIO22nWR IOW GPIO21nCS GPIO20A1CS1GPIO19A0CS0GPIO18A2PWM2RTS [1]GPIO17A1PWM1RXD [1]GPIO16A0PWM0TXD [1]GPIO15D15D15GPIO14D14D14GPIO13D13D13GPIO12D12D12GPIO11D11D11MOSI [1]GPIO10D10D10SCK [1]GPIO9D9D9nSSI [1]GPIO8D8D8MISO [1]GPIO7D7D7TX [2]GPIO6D6D6RX [2]GPIO5D5D5GPIO4D4D4GPIO3D3D3GPIO2D2D2GPIO1D1D1GPIO0D0D0Table 4-2. Interface Options for External Memory Bus Pins MEM Pins HPIIDEPWMHSS SPIUARTI2COTGD15CTS [2]D14RTS [2]D13RXD [2]D12TXD [2]D11MOSI [2]D10SCK [2]D9nSSI [2]D8MISO [2]D[7:0]A[18:0]CONTROL4.1USB InterfaceEZ-Host has two built-in Host/Peripheral SIEs and four USB transceivers that meet the USB 2.0 specification requirements for full and low speed (high speed is not supported). In Host mode, EZ-Host supports four downstream ports, each support control, interrupt, bulk, and isochronous transfers. In Peripheral mode, EZ-Host supports one peripheral port with eight endpoints for each of the two SIEs. Endpoint 0 is dedicated as the control endpoint and only supports control transfers. Endpoints 1 though 7 support Interrupt, Bulk (up to 64 Bytes/packet), or Isochronous transfers (up to 1023 Bytes/packet size). EZ-Host also supports a combi-nation of Host and Peripheral ports simultaneously as shown in Table4-3.Table 4-3. USB Port Configuration OptionsPort Configurations Port 1A Port 1B Port 2A Port 2BOTG OTG–––OTG + 2 Hosts OTG–Host HostOTG + 1 Host OTG–Host–OTG + 1 Host OTG––HostOTG + 1 Peripheral OTG–Peripheral–OTG + 1 Peripheral OTG––Peripheral4 Hosts Host Host Host Host3 Hosts Any Combination of Ports2 Hosts Any Combination of Ports1 Host Any Port2 Hosts + 1 Peripheral Host Host Peripheral–2 Hosts + 1 Peripheral Host Host–Peripheral2 Hosts + 1 Peripheral Peripheral–Host Host2 Hosts + 1 Peripheral–Peripheral Host Host1 Host + 1 Peripheral Host–Peripheral–1 Host + 1 Peripheral Host––Peripheral1 Host + 1 Peripheral–Host–Peripheral1 Host + 1 Peripheral–Host Peripheral–1 Host + 1 Peripheral Peripheral–Host–1 Host + 1 Peripheral Peripheral––Host1 Host + 1 Peripheral–Peripheral–Host1 Host + 1 Peripheral–Peripheral Host–2 Peripherals Peripheral–Peripheral–2 Peripherals Peripheral––Peripheral2 Peripherals–Peripheral–Peripheral2 Peripherals–Peripheral Peripheral–1 Peripheral Any Port4.1.1USB Features•USB 2.0-compliant for full and low speed•Up to four downstream USB host ports•Up to two upstream USB peripheral ports•Configurable endpoint buffers (pointer and length), must reside in internal RAM•Up to eight available peripheral endpoints (one control endpoint)•Supports Control, Interrupt, Bulk, and Isochronous transfers•Internal DMA channels for each endpoint•Internal pull-up and pull-down resistors•Internal Series termination resistors on USB data lines4.1.2USB Pins.Table 4-4. USB Interface PinsPin Name Pin NumberDM1A22DP1A23DM1B18DP1B19DM2A9DP2A10DM2B4DP2B54.2OTG InterfaceEZ-Host has one USB port that is compatible with the USB On-The-Go supplement to the USB 2.0 specification. The USB OTG port has a various hardware features to support Session Request Protocol (SRP) and Host Negotiation Protocol (HNP). OTG is only supported on USB PORT 1A.4.2.1OTG Features•Internal Charge Pump to supply and control VBUS•VBUS Valid Status (above 4.4V)•VBUS Status for 2.4V< VBUS <0.8V•ID Pin Status•Switchable 2KΩ internal discharge resistor on VBUS•Switchable 500Ω internal Pull-up resistor on VBUS•Individually switchable internal Pull-up and Pull-down resistors on the USB Data Lines4.2.2OTG Pins.Table 4-5. OTG Interface PinsPin Name Pin NumberDM1A22DP1A23OTGVBUS11OTGID41CSwitchA13CSwitchB124.3External Memory InterfaceEZ-Host provides a robust interface to a wide variety of external memory arrays. All available external memory array locations can contain either code or data. The CY16 RISC processor directly addresses a flat memory space from 0x0000 to 0xFFFF. 4.3.1External Memory Interface Features•Supports 8-bit or 16-bit SRAM or ROM•SRAM or ROM can be used for code or data space•Direct addressing of SRAM or ROM•Two external memory mapped page registers4.3.2External Memory Access StrobesAccess to external memory is sampled asynchronously on the rising edge of strobes with a minimum of one wait state cycle. Up to seven wait state cycles may be inserted for external memory access. Each additional wait state cycle stretches the external memory access time by 21 nsec. An external memory device with 12-nsec access time is necessary to support 48-MHz code execution.4.3.3Page RegistersEZ-Host allows extended data or program code to be stored in external SRAM, or ROM. The total size of extended memory can be up to 512K bytes. The CY16 processor can access extended memory via two address regions of 0x8000-0x9FFF and 0xA000-0xBFFF. The page register 0xC018 can be used to control the address region 0x8000-0x9FFF and the page register 0xC01A controls the address region of 0xA000-0xBFFF.Figure4-1 illustrates that when the nXMEMSEL pin is asserted the upper CPU address pins are driven by the contents of the Page x Registers.Figure 4-1. Page n Registers External Address Pins Logic4.3.4Merge ModeMerge modes enabled through the External Memory Control Register [0xC03] allow combining of external memory regions in accordance with the following:•nXMEMSEL is active from 0x8000 to 0xBFFF•nXRAMSEL is active from 0x4000 to 0x7FFF when RAM Merge is disabled; nXRAMSEL is active from 0x4000 to 0xBFFF when RAM Merge is enabled•nXROMSEL is active from 0xC100 to 0xDFFF when ROM Merge is disabled; nXROMSEL is active from 0x8000 to 0xDFFF (excluding the 0xC000 to 0xC0FF area) when ROM Merge is enabled4.3.5Program Memory Hole DescriptionCode residing in the 0xC000-0xC0FF address space is not accessible by the cpu.4.3.6DMA to External Memory ProhibitedEZ-Host supports an internal DMA engine to rapidly move data between different functional blocks within the chip. This DMA engine is used for SIE1, SIE2, HPI, SPI, HSS, and IDE but it can only transfer data between the specified block and internal RAM or ROM. Setting up the DMA engine to transfer to or from an external memory space might result in internal RAM data corruption because the hardware (i.e HSS/HPI/SIE1/SIE2/IDE) does not explicitly check the address range. For example, setting up a DMA transfer to external address 0x8000 might result in a DMA transfer into address 0x0000.External Memory Related Resource Considerations:•By default A[18:15] are not available for general addressing and are driven high on power up. The Upper Address Enable Register must be written appropriately to enable A[18:15] for general addressing purposes.•47k ohm external pull-up on A15-pin for 12-MHz crystal operation.•During the 3-msec BIOS boot procedure the CPU external memory bus is active.•ROM boot load value 0xC3B6 located at 0xC100.•HPI, HSS, SPI, SIE1, SIE2, and IDE can't DMA to external memory arrays.•Page 1 banking is always enabled and is in effect from 0x8000 to 0x9FFF.•Page 2 banking is always enabled and is in effect from 0xA000 to 0xBFFF.•CPU memory bus strobes may wiggle when chip selects are inactive.4.3.7External Memory Interface PinsTable 4-6. External Memory Interface PinsPin Name Pin Number nWR64nRD62 nXMEMSEL (optional nCS)34nXROMSEL (ROM nCS)35nXRAMSEL (RAM nCS)36A1896A1795A1697A1538A1433A1332A1231A1130A1027A925A824A720A617A58A47A33A22A11nBEL/A099nBEH98D1567D1468D1369D1270D1171D1072D973D874D776D677D578D479D380D281D182D0834.3.8External Memory Interface Block DiagramsFigure4-2 illustrates how to connect a 64k × 8 memory array (SRAM/ROM) to the EZ-Host external memory interface.Figure 4-2. Interfacing to 64k × 8 Memory ArrayFigure4-3 illustrates the interface for connecting a 16-bit ROM or 16-bit RAM to the EZ-Host external memory interface. In 16-bit mode, up to 256K words of external ROM or RAM are supported. Note that the Address lines do not map directly.Figure 4-3. Interfacing up to 256k × 16 for External Code/DataFigure4-4 illustrates the interface for connecting an 8-bit ROM or 8-bit RAM to the EZ-Host external memory interface. In 8-bit mode, up to 512K bytes of external ROM or RAM are supported.Figure 4-4. Interfacing up to 512k × 8 for External Code/Data4.4General Purpose I/O Interface (GPIO)EZ-Host has up to 32 GPIO signals available. Several other optional interfaces use GPIO pins as well and may reduce the overall number of available GPIOs.4.4.1GPIO DescriptionAll Inputs are sampled asynchronously with state changes occurring at a rate of up to two 48-MHZ clock cycles. GPIO pins are latched directly into registers, a single flip-flop.4.4.2Unused Pin DescriptionsUnused USB pins should be three-stated with the D+ line pulled high through the internal pull-up resistor and the D- line pulled low through the internal pull-down resistor.Unused GPIO pins should be configured as outputs and driven low.4.5UART InterfaceEZ-Host has a built-in UART interface. The UART interface supports data rates from 900 to 115.2K baud. It can be used as a development port or for other interface requirements. The UART interface is exposed through GPIO pins.4.5.1UART Features•Supports baud rates of 900 to 115.2K•8-N-14.5.2UART Pins.Table 4-7. UART Interface PinsPin Name Pin NumberTX42RX434.6I2C EEPROM InterfaceEZ-Host provides a master only I2C interface for external serial EEPROMs. The serial EEPROM can be used to store application specific code and data. This I2C interface is only to be used for loading code out of EEPROM, it is not a general I2C interface. The I2C EEPROM interface is a BIOS implementation and is exposed through GPIO pins. Please refer to the BIOS documentation for additional details on this interface.4.6.1I2C EEPROM Features•Supports EEPROMs up to 64KB (512K bit)•Auto-detection of EEPROM size4.6.2I2C EEPROM Pins.Table 4-8. I2C EEPROM Interface PinsPin Name Pin NumberSMALL EEPROMSCK39SDA40LARGE EEPROMSCK40SDA394.7Serial Peripheral InterfaceEZ-Host provides a SPI interface for added connectivity. EZ-Host may be configured as either an SPI master or SPI slave. The SPI interface can be exposed through GPIO pins or the External Memory port.。

CY7C1061AV33-10ZXI中文资料

CY7C1061AV33-10ZXI中文资料
package and non Pb-free 60-ball fine pitch ball grid array (FBGA) package
Logic Block Diagram
Functional Description
The CY7C1061AV33 is a high performance CMOS Static RAM organized as 1,048,576 words by 16 bits.
Commercial/Industrial
50
Pin Configurations [1, 2]
60-ball FBGA Top View
1
2
3
4
5
NC NC
NC
6
NC NC NC
BLE OE A0 A1 A2 CE2
A
IO 8 BHE A3 A4 CE1 IO 0
B
IO 9 IO 10 A5
A6 IO 1 IO 2
To write to the device, enable the chip (CE1 LOW and CE2 HIGH) while forcing the Write Enable (WE) input LOW. If Byte Low Enable (BLE) is LOW, then data from IO pins (IO0 through IO7), is written into the location specified on the address pins (A0 through A19). If Byte High Enable (BHE) is LOW, then data from IO pins (IO8 through IO15) is written into the location specified on the address pins (A0 through A19).

CY7C1417AV18资料

CY7C1417AV18资料

Errata Revision: *CMay 02, 2007RAM9 QDR-I/DDR-I/QDR-II/DDR- II ErrataCY7C129*DV18/CY7C130*DV25CY7C130*BV18/CY7C130*BV25/CY7C132*BV25CY7C131*BV18 / CY7C132*BV18/CY7C139*BV18CY7C191*BV18/CY7C141*AV18 / CY7C142*AV18/CY7C151*V18 /CY7C152*V18This document describes the DOFF issue for QDRII/DDRII and the Output Buffer and JTAG issues for QDRI/DDRI/QDRII/DDRII. Details include trigger conditions, possible workarounds and silicon revision applicability.This document should be used to compare to the respective datasheet for the devices to fully describe the device functionality.Please contact your local Cypress Sales Representative for availability of the fixed devices and any other questions.Devices AffectedTable 1. List of Affected devicesProduct StatusAll of the above densities and revisions are available in sample as well as production quantities.QDR/DDR DOFF Pin, Output Buffer and JTAG Issues Errata SummaryThe following table defines the issues and the fix status for the different devices which are affected.Density & Revision Part Numbers Architecture 9Mb - Ram9(90 nm)CY7C130*DV25QDRI/DDRI 9Mb - Ram9(90 nm)CY7C129*DV18QDRII 18Mb - Ram9(90nm)CY7C130*BV18CY7C130*BV25CY7C132*BV25QDRI/DDRI18Mb - Ram9(90nm)CY7C131*BV18CY7C132*BV18CY7C139*BV18CY7C191*BV18QDRII/DDRII36Mb - Ram9(90nm)CY7C141*AV18CY7C142*AV18QDRII/DDRII 72Mb -Ram9(90nm)CY7C151*V18CY7C152*V18QDRII/DDRIIItemIssueDeviceFix Status1.DOFF pin is used for enabling/dis-abling the DLL circuitry within the SRAM. To enable the DLL circuitry, DOFF pin must be externally tied HIGH. The QDR-II/DDR-II devices have an internal pull down resistor of ~5K . The value of the external pull-up resistor should be 500 or less in order to ensure DLL is enabled.9Mb - “D” Rev - Ram918Mb - “B” Rev - Ram936Mb - “A” Rev - Ram972Mb - Ram9QDR-II/DDR-II DevicesThe fix involved removing the in-ternal pull-down resistor on the DOFF pin. The fix has been im-plemented on the new revision and is now available.ΩΩTable 2.Issue Definition and fix status for different devices1. DOFF Pin Issue•ISSUE DEFINITIONThis issue involves the DLL not turning ON properly if a large resistor is used (eg:-10K ) as an external pullup resistor to enable the DLL. If a 10K or higher pullup resistor is used externally, the voltage on DOFF is not high enough to enable the DLL.•PARAMETERS AFFECTEDThe functionality of the device will be affected because of the DLL is not turning ON properly. When the DLL is enabled, all AC and DC parameters on the datasheet are met. •TRIGGER CONDITION(S)Having a 10K or higher external pullup resistor for disabling the DOFF pin.•SCOPE OF IMPACTThis issue will alter the normal functionality of the QDRII/DDRII devices when the DLL is disabled.•EXPLANATION OF ISSUEFigure 1 shows the DOFF pin circuit with an internal 5K internal resistor. The fix planned is to disable the internal 5K leaker.•WORKAROUND2.O/P Buffer enters a locked up unde-fined state after controls or clocks are left floating. No proper read/write access can be done on the device until a dummy read is performed.9Mb - “D” Rev - Ram918Mb - “B” Rev - Ram936Mb - “A” Rev - Ram972Mb - Ram9QDR-I/DDR-I/QDR-II/DDR-II Devices The fix has been implemented onthe new revision and is now avail-able.3.The EXTEST function in the JTAG test fails when input K clock is floating in the JTAG mode.9Mb - “D” Rev - Ram918Mb - “B” Rev - Ram936Mb - “A” Rev - Ram972Mb - Ram9QDR-I/DDR-I/QDR-II/DDR-II DevicesThe fix involved bypassing the ZQ circuitry in JTAG mode. This was done by overriding the ZQ circuit-ry by the JTAG signal. The fix has been implemented on the new re-vision and is now available.Figure 1.DOFF pin with the 5K internal resistorItemIssueDeviceFix StatusΩΩΩΩΩΩThe workaround is to have a low value of external pullup resistor for the DOFF pin (recommended value is <500). When DOFF pins from multiple QDR devices are connected through the same pull-up resistors on the board, it is recommended that this DOFF pin be directly connected to Vdd due to the lower effective resistance since the "leakers" are in parallel.Figure 2 shows the proposed workaround and the fix planned.•FIXSTATUSFix involved removing the internal pull-down resistor on the DOFF pin. The fix has been implemented on the new revision and is now available. The new revision is an increment of the existing revision. The following table lists the devices affected, current revision and the new revision after the fix.Table 3.List of Affected Devices and the new revison2.Output Buffer IssueFigure 2.Proposed workaround with the 500 external pullupCurrent Revision New Revision after the FixCY7C129*DV18CY7C129*EV18CY7C131*BV18CY7C131*CV18CY7C132*BV18CY7C132*CV18CY7C139*BV18CY7C139*CV18CY7C191*BV18CY7C191*CV18CY7C141*AV18CY7C141*BV18CY7C142*AV18CY7C142*BV18CY7C151*V18CY7C151*AV18CY7C152*V18CY7C152*AV18ΩΩ•ISSUE DEFINITIONThis issue involves the output buffer entering an unidentified state when the input signals (only Control signals or Clocks) are floating during reset or initialization of the memory controller after power up. •PARAMETERS AFFECTEDNo timing parameters are affected. The device may drive the outputs even though the read operation is not enabled. A dummy read is performed to clear this condition.•TRIGGER CONDITION(S)Input signals(namely RPS# for QDR-I/QDRII , WE# and LD# for DDR-I/DDRII) or Clocks (K/K# and/or C/C#) are floating during reset or initialization of the memory controller after power up.•SCOPE OF IMPACTThis issue will jeopardize any number of writes or reads which take place after the controls or clock are left floating. This can occur anywhere in the SRAM access ( all the way from power up of the memory device to transitions taking place for read/write accesses to the memory device) if the above trigger conditions are met.•EXPLANATION OF ISSUEFigure 3 shows the output register Reset circuit with an SR Latch circled. This latch has two inputs with one of them coming from some logic affected by the clock and RPS#(QDR) or WE# and LD#(DDR).The issue happens when clocks are glitching/toggling with controls floating. This will cause the SR latch to be taken into an unidentified state. The SR Latch will need to be reset by a dummy read operation if this happens. Array•WORKAROUNDThis is viable only if the customer has the trigger conditions met during reset or initialization of the memory controller after power up. In order for the workaround to perform properly, Cypress recommends the insertion of a minimum of 16 “dummy” READ operations to every SRAM device on the board prior to writing any meaningful data into the SRAM. After this one “dummy” READ operation, the device will perform properly.“Dummy” READ is defined as a read operation to the device that is not meant to retrieve required data. The “dummy” READ can be to any address location in the SRAM. Refer to Figure 4 for the dummy read implemen-tation.In systems where multiple SRAMs with multiple RPS# lines are used, a dummy read operation will have to be performed on every SRAM on the board. Below is an example sequence of events that can be performed before valid access can be performed on the SRAM.1) Initialize the Memory Controller2) Assert RPS# Low for each of the memory devicesNote:For all devices with x9 bus configuration, the following sequence needs to be performed:1) For the 72M / 36M / 18M x9 devices drive address pin A2 / A10 / A3 low respectively and perform dummyread.2) For the 72M / 36M / 18M x9 devices drive address pin A2 / A10 / A3 high respectively and perform dummyread.If the customer has the trigger conditions met during normal access to the memory then there is no workaround at this point.•FIX STATUSThe fix has been implemented on the new revision and is now available. The new revision is an increment of the existing revision. Please refer to Table 4 for the list of devices affected, current revision and the new revision after the fix.3. JTAG Mode Issue•ISSUE DEFINITIONIf the input clock (K Clock) is left floating when the device is in JTAG mode, spurious high frequency noise on this input can be interpreted by the device as valid clocks. This could cause the impedance matching circuitry (ZQ) on the QDR/DDR devices to periodically load itself with incorrect values. These incorrect values in the ZQ register could force the outputs into a High-Impedance state. The ZQ circuitry requires at least 1000 valid K clock cycles to drive the outputs from high impedance to low impedance levels.•PARAMETERS AFFECTEDThis issue only affects the EXTEST command when the device is in the JTAG mode. The normal functionality of the device will not be affected.•TRIGGER CONDITION(S)EXTEST command executed immediately after power-up without providing any K clock cycles.•SCOPE OF IMPACTThis issue only impacts the EXTEST command when device is tested in the JTAG mode. Normal functionality of the device is not affected. •EXPLANATION OF ISSUEImpedance matching circuitry (ZQ) is present on the QDR/DDR devices to set the desired impedance on the outputs. This ZQ circuitry is updated every 1000 clock cycles of K clock to ensure that the impedance of the O/P is set to valid state. However, when the device is operated in the JTAG mode immediately after power-up, high frequency noise on the input K clock can be treated by the ZQ circuitry as valid clocks thereby setting the outputs in to a high-impedance mode. If a minimum of 1000 valid K clocks are applied before performing the JTAG test, this should clear the ZQ circuitry and ensure that the outputs are driven to valid impedance levels.•WORKAROUNDElimination of the issue: After power-up, before any valid operations are performed on the device, insert a minimum of 1000 valid clocks on K input.•FIX STATUSThe fix involved bypassing the ZQ circuitry in JTAG mode. This was done by overriding the ZQ circuitry by the JTAG signal. The fix has been implemented on the new revision and is now available. The new revision is an increment of the existing revision. Please refer to Table 4 for the list of devices affected, current revision and the new revision after the fix..Table 4.List of Affected devices and the new revisionCurrent Revision New Revision after the FixCY7C129*DV18CY7C129*EV18CY7C130*DV25CY7C130*EV25CY7C130*BV18CY7C130*CV18CY7C130*BV25CY7C130*CV25CY7C132*BV25CY7C132*CV25CY7C131*BV18CY7C131*CV18CY7C132*BV18CY7C132*CV18CY7C139*BV18CY7C139*CV18CY7C191*BV18CY7C191*CV18CY7C141*AV18CY7C141*BV18CY7C142*AV18CY7C142*BV18CY7C151*V18CY7C151*AV18CY7C152*V18CY7C152*AV18ReferencesAll 90nm QDRI/DDRI/QDRII/DDRII datasheets:-Table 5.List of Datasheet spec# for the Affected devicesSpec#Part#DensityArchitecture38-05628CY7C1304DV259-MBIT QDR(TM) SRAM 4-WORD BURST 38-05632CY7C1308DV259-MBIT DDR-I SRAM 4-WORD BURST 001-00350CY7C1292DV18/1294DV189-MBIT QDR- II(TM) SRAM 2-WORD BURST 38-05621CY7C1316BV18/1916BV18/1318BV18/1320BV1818-MBIT DDR-II SRAM 2-WORD BURST 38-05622CY7C1317BV18/1917BV18/1319BV18/1321BV1818-MBIT DDR-II SRAM 4-WORD BURST 38-05623CY7C1392BV18/1393BV18/1394BV1818-MBIT DDR-II SIO SRAM 2-WORD BURST 38-05631CY7C1323BV2518-MBIT DDR-I SRAM 4-WORD BURST 38-05630CY7C1305BV25/1307BV2518-MBIT QDR(TM) SRAM 4-WORD BURST 38-05627CY7C1303BV25/1306BV2518-MBIT QDR(TM) SRAM 2-WORD BURST 38-05629CY7C1305BV18/1307BV1818-MBIT QDR(TM) SRAM 4-WORD BURST 38-05626CY7C1303BV18/1306BV1818-MBIT QDR(TM) SRAM 2-WORD BURST 38-05619CY7C1310BV18/1910BV18/1312BV18/1314BV1818-MBIT QDR - II (TM) SRAM 2-WORD BURST 38-05620CY7C1311BV18/1911BV18/1313BV18/1315BV1818-MBIT QDR - II SRAM 4-WORD BURST 38-05615CY7C1410AV18/1425AV18/1412AV18/1414AV1836-MBIT QDR-II(TM) SRAM 2-WORD BURST 38-05614CY7C1411AV18/1426AV18/1413AV18/1415AV1836-MBIT QDR(TM)-II SRAM 4-WORD BURST 38-05616CY7C1416AV18/1427AV18/1418AV18/1420AV1836-MBIT DDR-II SRAM 2-WORD BURST 38-05618CY7C1417AV18/1428AV18/1419AV18/1421AV1836-MBIT DDR-II SRAM 4-WORD BURST 38-05617CY7C1422AV18/1429AV18/1423AV18/1424AV1836-MBIT DDR-II SIO SRAM 2-WORD BURST 38-05489CY7C1510V18/1525V18/1512V18/1514V1872-MBIT QDR-II SRAM 2-WORD BURST 38-05363CY7C1511V18/1526V18/1513V18/1515V1872-MBIT QDR(TM)-II SRAM 4-WORD BURST 38-05563CY7C1516V18/1527V18/1518V18/1520V1872-MBIT DDR-II SRAM 2-WORD BURST 38-05565CY7C1517V18/1528V18/1519V18/1521V1872-MBIT DDR-II SRAM 4-WORD BURST 38-05564CY7C1522V18/1529V18/1523V18/1524V1872-MBITDDR-II SIO SRAM 2-WORD BURSTDocument History PageDocument Title: RAM9 QDR-I/DDR-I/QDR-II/DDR- II Errata Document #: 001-06217 Rev. *CREV.ECN NO.IssueDateOrig. ofChange Description of Change**419849See ECN REF New errata for Ram9 QDR2/DDR2 SRAMs.*A493936See ECN QKS Added Output buffer and JTAG mode issues, Item#2 and #3Added 9Mb QDR-II Burst of 2 and QDR-1/DDR-I part numbers.*B733176See ECN NJY Added missing part numbers in the title for Spec#’s 38-05615,38-05614,38-05363,38-05563 on Table 5 on page 7.*C1030020 See ECN TBE Updated the fix status of the three issues, and modified the description forthe Output Buffer workaround for x9 devices on page 5.。

CY7C1411AV18-278BZXC资料

CY7C1411AV18-278BZXC资料

36-Mbit QDR™-II SRAM 4-Word BurstArchitectureCY7C1426AV18CY7C1413AV18CY7C1415AV18Features•Separate Independent Read and Write data ports —Supports concurrent transactions •300-MHz clock for high bandwidth•4-Word Burst for reducing address bus frequency •Double Data Rate (DDR) interfaces on both Read and Write ports (data transferred at 600 MHz) at 300 MHz •Two input clocks (K and K) for precise DDR timing —SRAM uses rising edges only•Two input clocks for output data (C and C) to minimize clock-skew and flight-time mismatches•Echo clocks (CQ and CQ) simplify data capture in high-speed systems•Single multiplexed address input bus latches address inputs for both Read and Write ports•Separate Port Selects for depth expansion •Synchronous internally self-timed writes•Available in x8, x9, x18, and x36 configurations •Full data coherency providing most current data •CoreV DD = 1.8 (±0.1V); I/O V DDQ = 1.4V to V DD•Available in 165-ball FBGA package (15 x 17 x 1.4 mm)•Offered in both lead-free and non lead-free packages •Variable drive HSTL output buffers•JTAG 1149.1 compatible test access port•Delay Lock Loop (DLL) for accurate data placementConfigurationsCY7C1411AV18 – 4M x 8CY7C1426AV18 – 4M x 9CY7C1413AV18 – 2M x 18CY7C1415AV18 – 1M x 36Functional DescriptionThe CY7C1411AV18, CY7C1426AV18, CY7C1413AV18, and CY7C1415AV18 are 1.8V Synchronous Pipelined SRAMs,equipped with QDR™-II architecture. QDR-II architecture consists of two separate ports to access the memory array.The Read port has dedicated Data Outputs to support Read operations and the Write port has dedicated Data Inputs to support Write operations. QDR-II architecture has separate data inputs and data outputs to completely eliminate the need to “turn-around” the data bus required with common I/O devices. Access to each port is accomplished through a common address bus. Addresses for Read and Write addresses are latched on alternate rising edges of the input (K) clock. Accesses to the QDR-II Read and Write ports are completely independent of one another. In order to maximize data throughput, both Read and Write ports are equipped with Double Data Rate (DDR) interfaces. Each address location is associated with four 8-bit words (CY7C1411AV18) or 9-bit words (CY7C1426AV18) or 18-bit words (CY7C1413AV18) or 36-bit words (CY7C1415AV18) that burst sequentially into or out of the device. Since data can be transferred into and out of the device on every rising edge of both input clocks (K and K and C and C), memory bandwidth is maximized while simpli-fying system design by eliminating bus “turn-arounds”.Depth expansion is accomplished with Port Selects for each port. Port selects allow each port to operate independently.All synchronous inputs pass through input registers controlled by the K or K input clocks. All data outputs pass through output registers controlled by the C or C (or K or K in a single clock domain) input clocks. Writes are conducted with on-chip synchronous self-timed write circuitry.Selection Guide300 MHz278 MHz 250 MHz 200 MHz 167 MHz Unit Maximum Operating Frequency 300278250200167MHz Maximum Operating Current925875800700600mACY7C1413AV18CY7C1415AV18Logic Block Diagram (CY7C1411AV18)1M x 8 ArrayCLK A (19:0)Gen.KK Control LogicAddress RegisterD [7:0]R e a d A d d . D e c o d eRead Data Reg.RPS WPS Q [7:0]Control LogicAddress RegisterReg.Reg.Reg.16208328NWS [1:0]V REF W r i t e A d d . D e c o d eWrite Reg16A (19:0)20CC 1M x 8 Array1M x 8 Array1M x 8 ArrayWrite RegWrite RegWrite Reg8CQCQ DOFFLogic Block Diagram (CY7C1426AV18)1M x 9 ArrayCLK A (19:0)Gen.KK Control LogicAddress RegisterD [8:0]R e a d A d d . D e c o d eRead Data Reg.RPS WPS Q [8:0]Control LogicAddress RegisterReg.Reg.Reg.18209369BWS [0]V REF W r i t e A d d . D e c o d eWrite Reg18A (19:0)20CC 1M x 9 Array1M x 9 Array1M x 9 ArrayWrite RegWrite RegWrite Reg9CQCQ DOFFCY7C1413AV18CY7C1415AV18Logic Block Diagram (CY7C1413AV18)512K x 18 ArrayCLK A (18:0)Gen.KK Control LogicAddress RegisterD [17:0]R e a d A d d . D e c o d eRead Data Reg.RPS WPS Q [17:0]Control LogicAddress RegisterReg.Reg.Reg.3619187218BWS [1:0]V REF W r i t e A d d . D e c o d eWrite Reg36A (18:0)19CC 512K x 18 Array512K x 18 Array512K x 18 ArrayWrite RegWrite RegWrite Reg18CQCQ DOFFLogic Block Diagram (CY7C1415AV18)256K x 36 ArrayCLK A (17:0)Gen.KK Control LogicAddress RegisterD [35:0]R e a d A d d . D e c o d eRead Data Reg.RPS WPS Q[35:0]Control LogicAddress RegisterReg.Reg.Reg.72183614436BWS [3:0]V REF W r i t e A d d . D e c o d eWrite Reg72A (17:0)18CC 256K x 36 Array256K x 36 Array256K x 36 ArrayWrite RegWrite RegWrite Reg36CQCQ DOFFCY7C1413AV18CY7C1415AV18 Pin ConfigurationsCY7C1411AV18 (4M x 8)2345671ABCDEFGHJKLMNP RACQNCNCNCNCDOFFNCNC/72M A NWS1 KWPSNC NCNCNCNCTDONCNCD5NCNCNCTCKNCNCA NC/288M K NWS0V SS A NC ANC V SSV SS V SSV SSV DDAV SSV SSV SSV DDQ4NCV DDQNCNCNCNCQ7AV DDQ V SSV DDQ V DD V DDQ5V DDQV DDV DDQV DDV DDQ V DD V SSV DDV DDQV DDQ V SSV SS V SS V SSAACV SSA AAD4V SSNC V SSNCNCV REFV SSV DDV SSV SSAV SSCNCQ6NCD7D6V DDA891011NCA ARPS CQA NC NC Q3V SS NC NC D3NCV SS NCQ2NCNCNCV REFNCNCV DDQ NCV DDQ NC NCV DDQV DDQV DDQD1V DDQ NC Q1NCV DDQV DDQ NCV SS NC D0NCTDITMSV SSA NCANCD2NCZQNCQ0NCNCNCNCANC/144M165-ball FBGA (15 x 17 x 1.4 mm) PinoutCY7C1426AV18 (4M x 9)2345671A B C D E F G H J K L M NP RACQNCNCNCNCDOFFNCNC/72M A NC KWPS NC/144MNC NCNCNCNCTDONCNCD6NCNCNCTCKNCNCA NC/288M K BWS0V SS A NC ANC V SSV SS V SSV SSV DDAV SSV SSV SSV DDQ5NCV DDQNCNCNCNCQ8AV DDQ V SSV DDQ V DD V DDQ6V DDQV DDV DDQV DDV DDQ V DD V SSV DDV DDQV DDQ V SSV SS V SS V SSAACV SSA AAD5V SSNC V SSNCNCV REFV SSV DDV SSV SSAV SSCNCQ7NCD8D7V DDA891011Q0A ARPS CQA NC NC Q4V SS NC NC D4NCV SS NCQ3NCNCNCV REFNCNCV DDQ NCV DDQ NC NCV DDQV DDQV DDQD2V DDQ NC Q2NCV DDQV DDQ NCV SS NC D1NCTDITMSV SSA NCANCD3NCZQNCQ1NCNCD0NCACY7C1413AV18CY7C1415AV18 Pin Configurations (continued)CY7C1413AV18 (2M x 18)2345671ABCDEFGHJKLMNP RACQNCNCNCNCDOFFNCNC/144M A BWS1KWPS NC/288MQ9D9NCNCNCTDONCNCD13NCNCNCTCKNCD10A NC K BWS0V SS A NC AQ10V SSV SS V SSV SSV DDAV SSV SSV SSV DDQ11D12V DDQD14Q14D16Q16Q17AV DDQ V SSV DDQ V DD V DDQ13V DDQV DDV DDQV DDV DDQ V DD V SSV DDV DDQV DDQ V SSV SS V SS V SSAAV SSA AAD11V SSNC V SSQ12NCV REFV SSV DDV SSV SSAV SSCNCQ15NCD17D15V DDA891011Q0A NC/72MRPS CQA NC NC Q8V SS NC Q7D8NCV SS NCQ6D5NCNCV REFNCQ3V DDQ NCV DDQ NC Q5V DDQV DDQV DDQD4V DDQ NC Q4NCV DDQV DDQ NCV SS NC D2NCTDITMSV SSA NCAD7D6NCZQD3Q2D1Q1D0NCAC165-ball FBGA (15 x 17 x 1.4 mm) Pinout2345671A B C D E F G H J K L M NP RACQQ27D27D28D34DOFFQ33NC/288M NC/72M BWS2KWPS BWS1Q18D18Q30D31D33TDOQ28D29D22D32Q34Q31TCKD35D19A BWS3K BWSV SS A NC AQ19V SSV SS V SSV SSV DDAV SSV SSV SSV DDQ20D21V DDQD23Q23D25Q25Q26AV DDQ V SSV DDQ V DD V DDQ22V DDQV DDV DDQV DDV DDQ V DD V SSV DDV DDQV DDQ V SSV SS V SS V SSAACV SSA AAD20V SSQ29V SSQ21D30V REFV SSV DDV SSV SSAV SSCQ32Q24Q35D26D24V DDA891011Q0A NC/144MRPS CQA D17Q17Q8V SS D16Q7D8Q16V SS D15Q6D5D9Q14V REFQ11Q3V DDQ Q15V DDQ D14Q5V DDQV DDQV DDQD4V DDQ D12Q4Q12V DDQV DDQ D11V SS D10D2Q10TDITMSV SSA Q9AD7D6D13ZQD3Q2D1Q1D0Q13ACY7C1415AV18 (1M x 36)CY7C1413AV18CY7C1415AV18Pin DefinitionsPin Name I/O Pin DescriptionD[x:0]Input-Synchronous Data input signals, sampled on the rising edge of K and K clocks during valid write operations.CY7C1411AV18 − D[7:0]CY7C1426AV18 − D[8:0]CY7C1413AV18 − D[17:0]CY7C1415AV18 − D[35:0]WPS Input-Synchronous Write Port Select, active LOW. Sampled on the rising edge of the K clock. When asserted active, a Write operation is initiated. Deasserting will deselect the Write port. Deselecting the Write port will cause D[x:0] to be ignored.NWS0, NWS1,Input-SynchronousNibble Write Select 0, 1 − active LOW.(CY7C1411AV18 Only) Sampled on the rising edge ofthe K and K clocks during Write operations. Used to select which nibble is written into the deviceNWS0 controls D[3:0] and NWS1 controls D[7:4].All the Nibble Write Selects are sampled on the same edge as the data. Deselecting a NibbleWrite Select will cause the corresponding nibble of data to be ignored and not written into thedevice.BWS0, BWS1, BWS2, BWS3Input-SynchronousByte Write Select 0, 1, 2, and 3 − active LOW. Sampled on the rising edge of the K and K clocksduring Write operations. Used to select which byte is written into the device during the currentportion of the Write operations. Bytes not written remain unaltered.CY7C1426AV18 − BWS0 controls D[8:0]CY7C1413AV18 − BWS0 controls D[8:0] and BWS1 controls D[17:9].CY7C1415AV18 − BWS0 controls D[8:0], BWS1 controls D[17:9], BWS2 controls D[26:18] and BWS3controls D[35:27].All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte WriteSelect will cause the corresponding byte of data to be ignored and not written into the device.A Input-Synchronous Address Inputs. Sampled on the rising edge of the K clock during active Read and Write opera-tions. These address inputs are multiplexed for both Read and Write operations. Internally, the device is organized as 4M x 8 (4 arrays each of 1M x 8) for CY7C1411AV18, 4M x 9 (4 arrays each of 1M x 9) for CY7C1426AV18,2M x 18 (4 arrays each of 512K x 18) for CY7C1413AV18 and 1M x 36 (4 arrays each of 256K x 36) for CY7C1415AV18. Therefore, only 20 address inputs are needed to access the entire memory array of CY7C1411AV18 and CY7C1426AV18, 19 address inputs for CY7C1413AV18 and 18 address inputs for CY7C1415AV18. These inputs are ignored when the appropriate port is deselected.Q[x:0]Outputs-Synchronous Data Output signals. These pins drive out the requested data during a Read operation. Valid data is driven out on the rising edge of both the C and C clocks during Read operations or K and K. when in single clock mode. When the Read port is deselected, Q[x:0] are automaticallytri-stated.CY7C1411AV18 − Q[7:0]CY7C1426AV18 − Q[8:0]CY7C1413AV18 − Q[17:0]CY7C1415AV18 − Q[35:0]RPS Input-Synchronous Read Port Select, active LOW. Sampled on the rising edge of Positive Input Clock (K). When active, a Read operation is initiated. Deasserting will cause the Read port to be deselected. When deselected, the pending access is allowed to complete and the output drivers are automatically tri-stated following the next rising edge of the C clock. Each Read access consists of a burst of four sequential transfers.C Input-Clock Positive Input Clock for Output Data. C is used in conjunction with C to clock out the Read data from the device. C and C can be used together to deskew the flight times of various devices on the board back to the controller. See application example for further details.C Input-Clock Negative Input Clock for Output Data. C is used in conjunction with C to clock out the Read data from the device. C and C can be used together to deskew the flight times of various devices on the board back to the controller. See application example for further details.K Input-Clock Positive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device and to drive out data through Q[x:0] when in single clock mode. All accesses are initiated on the rising edge of K.K Input-Clock Negative Input Clock Input. K is used to capture synchronous inputs being presented to the device and to drive out data through Q[x:0] when in single clock mode.CY7C1413AV18CY7C1415AV18Functional OverviewThe CY7C1411AV18, CY7C1426AV18, CY7C1413AV18,CY7C1415AV18 are synchronous pipelined Burst SRAMs equipped with both a Read port and a Write port. The Read port is dedicated to Read operations and the Write port is dedicated to Write operations. Data flows into the SRAM through the Write port and out through the Read port. These devices multiplex the address inputs in order to minimize the number of address pins required. By having separate Read and Write ports, the QDR-II completely eliminates the need to “turn-around” the data bus and avoids any possible data contention, thereby simplifying system design. Each access consists of four 8-bit data transfers in the case of CY7C1411AV18, four 9-bit data transfers in the case of CY7C1426AV18, four 18-bit data transfers in the case of CY7C1413AV18, and four 36-bit data in the case of CY7C1415AV18 transfers in two clock cycles.Accesses for both ports are initiated on the Positive Input Clock (K). All synchronous input timing is referenced from the rising edge of the input clocks (K and K) and all output timing is referenced to the output clocks (C and C or K and K when in single clock mode).All synchronous data inputs (D [x:0]) inputs pass through input registers controlled by the input clocks (K and K). All synchronous data outputs (Q [x:0]) outputs pass through output registers controlled by the rising edge of the output clocks (C and C or K and K when in single-clock mode).All synchronous control (RPS, WPS, BWS [x:0]) inputs pass through input registers controlled by the rising edge of the input clocks (K and K).CY7C1413AV18 is described in the following sections. The same basic descriptions apply to CY7C1411AV18,CY7C1426AV18, and CY7C1415AV18. Read OperationsThe CY7C1413AV18 is organized internally as 4 arrays of 512K x 18. Accesses are completed in a burst of four sequential 18-bit data words. Read operations are initiated by asserting RPS active at the rising edge of the Positive Input Clock (K). The address presented to Address inputs are stored in the Read address register. Following the next K clock rise,the corresponding lowest order 18-bit word of data is driven onto the Q [17:0] using C as the output timing reference. On the subsequent rising edge of C the next 18-bit data word is driven onto the Q [17:0]. This process continues until all four 18-bit data words have been driven out onto Q [17:0]. The requested data will be valid 0.45 ns from the rising edge of the output clock (C or C or (K or K when in single-clock mode)). In order to maintain the internal logic, each read access must be allowed to complete. Each Read access consists of four 18-bit dataCQEcho ClockCQ is referenced with respect to C . This is a free running clock and is synchronized to the Input clock for output data (C) of the QDR-II. In the single clock mode, CQ is generated with respect to K. The timings for the echo clocks are shown in the AC Timing table.CQ Echo ClockCQ is referenced with respect to C . This is a free running clock and is synchronized to the Input clock for output data (C) of the QDR-II. In the single clock mode, CQ is generated with respect to K. The timings for the echo clocks are shown in the AC Timing table.ZQ InputOutput Impedance Matching Input . This input is used to tune the device outputs to the system data bus impedance. CQ, CQ, and Q [x:0] output impedance are set to 0.2 x RQ, where RQ is a resistor connected between ZQ and ground. Alternately, this pin can be connected directly to V DDQ , which enables the minimum impedance mode. This pin cannot be connected directly to GND or left unconnected.DOFF Input DLL Turn Off - active LOW . Connecting this pin to ground will turn off the DLL inside the device. The timings in the DLL turned off operation will be different from those listed in this data sheet. TDO Output TDO for JTAG .TCK Input TCK pin for JTAG .TDI Input TDI pin for JTAG .TMS Input TMS pin for JTAG .NC N/A Not connected to the die . Can be tied to any voltage level.NC/72MN/A Not connected to the die . Can be tied to any voltage level.NC /144M N/A Not connected to the die . Can be tied to any voltage level.NC /288M N/A Not connected to the die . Can be tied to any voltage level.V REF Input-Reference Reference Voltage Input . Static input used to set the reference level for HSTL inputs and outputs as well as AC measurement points.V DD Power Supply Power supply inputs to the core of the device . V SS GroundGround for the device .V DDQPower Supply Power supply inputs for the outputs of the device .Pin Definitions (continued)Pin Name I/O Pin DescriptionCY7C1413AV18 CY7C1415AV18words and takes 2 clock cycles to complete. Therefore, Read accesses to the device can not be initiated on two consecutive K clock rises. The internal logic of the device will ignore the second Read request. Read accesses can be initiated on every other K clock rise. Doing so will pipeline the data flow such that data is transferred out of the device on every rising edge of the output clocks (C and C or K and K when in single-clock mode).When the read port is deselected, the CY7C1413AV18 will first complete the pending Read transactions. Synchronous internal circuitry will automatically tri-state the outputs following the next rising edge of the Positive Output Clock (C). This will allow for a seamless transition between devices without the insertion of wait states in a depth expanded memory.Write OperationsWrite operations are initiated by asserting WPS active at the rising edge of the Positive Input Clock (K). On the following K clock rise the data presented to D[17:0] is latched and stored into the lower 18-bit Write Data register, provided BWS[1:0] are both asserted active. On the subsequent rising edge of the Negative Input Clock (K) the information presented to D[17:0] is also stored into the Write Data register, provided BWS[1:0] are both asserted active. This process continues for one more cycle until four 18-bit words (a total of 72 bits) of data are stored in the SRAM. The 72 bits of data are then written into the memory array at the specified location. Therefore, Write accesses to the device can not be initiated on two consecutive K clock rises. The internal logic of the device will ignore the second Write request. Write accesses can be initiated on every other rising edge of the Positive Input Clock (K). Doing so will pipeline the data flow such that 18 bits of data can be transferred into the device on every rising edge of the input clocks (K and K).When deselected, the Write port will ignore all inputs after the pending Write operations have been completed.Byte Write OperationsByte Write operations are supported by the CY7C1413AV18.A Write operation is initiated as described in the Write Opera-tions section above. The bytes that are written are determined by BWS0 and BWS1, which are sampled with each set of 18-bit data words. Asserting the appropriate Byte Write Select input during the data portion of a Write will allow the data being presented to be latched and written into the device. Deasserting the Byte Write Select input during the data portion of a write will allow the data stored in the device for that byte to remain unaltered. This feature can be used to simplify Read/Modify/Write operations to a Byte Write operation. Single Clock ModeThe CY7C1413AV18 can be used with a single clock that controls both the input and output registers. In this mode the device will recognize only a single pair of input clocks (K and K) that control both the input and output registers. This operation is identical to the operation if the device had zero skew between the K/K and C/C clocks. All timing parameters remain the same in this mode. To use this mode of operation, the user must tie C and C HIGH at power on. This function is a strap option and not alterable during device operation.Concurrent TransactionsThe Read and Write ports on the CY7C1413AV18 operate completely independently of one another. Since each port latches the address inputs on different clock edges, the user can Read or Write to any location, regardless of the trans-action on the other port. If the ports access the same location when a Read follows a Write in successive clock cycles, the SRAM will deliver the most recent information associated with the specified address location. This includes forwarding data from a Write cycle that was initiated on the previous K clock rise.Read accesses and Write access must be scheduled such that one transaction is initiated on any clock cycle. If both ports are selected on the same K clock rise, the arbitration depends on the previous state of the SRAM. If both ports were deselected, the Read port will take priority. If a Read was initiated on the previous cycle, the Write port will assume priority (since Read operations can not be initiated on consecutive cycles). If a Write was initiated on the previous cycle, the Read port will assume priority (since Write operations can not be initiated on consecutive cycles). Therefore, asserting both port selects active from a deselected state will result in alternating Read/Write operations being initiated, with the first access being a Read.Depth ExpansionThe CY7C1413AV18 has a Port Select input for each port. This allows for easy depth expansion. Both Port Selects are sampled on the rising edge of the Positive Input Clock only (K). Each port select input can deselect the specified port. Deselecting a port will not affect the other port. All pending transactions (Read and Write) will be completed prior to the device being deselected.Programmable ImpedanceAn external resistor, RQ, must be connected between the ZQ pin on the SRAM and V SS to allow the SRAM to adjust its output driver impedance. The value of RQ must be 5X the value of the intended line impedance driven by the SRAM. The allowable range of RQ to guarantee impedance matching with a tolerance of ±15% is between 175Ω and 350Ω, with V DDQ=1.5V. The output impedance is adjusted every 1024 cycles upon power-up to account for drifts in supply voltage and temperature.Echo ClocksEcho clocks are provided on the QDR-II to simplify data capture on high-speed systems. Two echo clocks are generated by the QDR-II. CQ is referenced with respect to C and CQ is referenced with respect to C. These are free running clocks and are synchronized to the output clock of the QDR-II. In the single clock mode, CQ is generated with respect to K and CQ is generated with respect to K. The timings for the echo clocks are shown in the AC Timing table.CY7C1413AV18 CY7C1415AV18DLLThese chips utilize a Delay Lock Loop (DLL) that is designed to function between 80 MHz and the specified maximum clock frequency. During power-up, when the DOFF is tied HIGH, the DLL gets locked after 1024 cycles of stable clock. The DLL can also be reset by slowing or stopping the input clock K and K for a minimum of 30 ns. However, it is not necessary for the DLL to be specifically reset in order to lock the DLL to the desired frequency. The DLL will automatically lock 1024 clock cycles after a stable clock is presented.the DLL may be disabled by applying ground to the DOFF pin. For information refer to the application note “DLL Considerations in QDRII/DDRII/QDRII+/DDRII+”.Application Example[1]Truth Table[2, 3, 4, 5, 6, 7]Operation K RPS WPS DQ DQ DQ DQWrite Cycle:Load address on therising edge of K;input write data ontwo consecutive Kand K rising edges.L-H H[8]L[9]D(A) at K(t + 1) ↑ D(A + 1) at K(t +1) ↑D(A + 2) at K(t + 2) ↑D(A + 3) at K(t + 2) ↑Read Cycle:Load address on therising edge of K; waitone and a half cycle;read data on twoconsecutive C and Crising edges.L-H L[9]X Q(A) at C(t + 1) ↑ Q(A + 1) at C(t + 2) ↑Q(A + 2) at C(t + 2) ↑Q(A + 3) at C(t + 3) ↑NOP: No Operation L-H H H D = XQ = High-Z D = XQ = High-ZD = XQ = High-ZD = XQ = High-ZStandby: ClockStoppedStopped X X Previous State Previous State Previous State Previous StateNotes:1.The above application shows four QDR-II being used.2.X = “Don't Care,” H = Logic HIGH, L = Logic LOW, ↑ represents rising edge.3.Device will power-up deselected and the outputs in a tri-state condition.4.“A” represents address location latched by the devices when transaction was initiated. A + 1, A + 2, and A +3 represents the address sequence in the burst.5.“t” represents the cycle at which a Read/write operation is started. t + 1, t + 2, and t + 3 are the first, second and third clock cycles respectively succeeding the“t” clock cycle.6.Data inputs are registered at K and K rising edges. Data outputs are delivered on C and C rising edges, except when in single clock mode.7.It is recommended that K = K and C = C = HIGH when clock is stopped. This is not essential, but permits most rapid restart by overcoming transmission linecharging symmetrically.8.If this signal was LOW to initiate the previous cycle, this signal becomes a “Don’t Care” for this operation.9.This signal was HIGH on previous K clock rise. Initiating consecutive Read or Write operations on consecutive K clock rises is not permitted. The device willignore the second Read or Write request.CY7C1413AV18CY7C1415AV18 Write Cycle Descriptions(CY7C1411AV18 and CY7C1413AV18) [2, 10]BWS0/NWS0BWS1/NWS1K K CommentsL L L–H–During the Data portion of a Write sequence:CY7C1411AV18 − both nibbles (D[7:0]) are written into the device,CY7C1413AV18 − both bytes (D[17:0]) are written into the device.L L–L-H During the Data portion of a Write sequence:CY7C1411AV18 − both nibbles (D[7:0]) are written into the device,CY7C1413AV18 − both bytes (D[17:0]) are written into the device.L H L–H–During the Data portion of a Write sequence :CY7C1411AV18 − only the lower nibble (D[3:0]) is written into the device. D[7:4] will remainunaltered,CY7C1413AV18 − only the lower byte (D[8:0]) is written into the device. D[17:9] will remainunaltered.L H–L–H During the Data portion of a Write sequence :CY7C1411AV18 − only the lower nibble (D[3:0]) is written into the device. D[7:4] will remainunaltered,CY7C1413AV18 − only the lower byte (D[8:0]) is written into the device. D[17:9] will remainunaltered.H L L–H–During the Data portion of a Write sequence :CY7C1411AV18 − only the upper nibble (D[7:4]) is written into the device. D[3:0] willremain unaltered,CY7C1413AV18 − only the upper byte (D[17:9]) is written into the device. D[8:0] will remainunaltered.H L–L–H During the Data portion of a Write sequence :CY7C1411AV18 − only the upper nibble (D[7:4]) is written into the device. D[3:0] willremain unaltered,CY7C1413AV18 − only the upper byte (D[17:9]) is written into the device. D[8:0] will remainunaltered.H H L–H–No data is written into the devices during this portion of a write operation.H H–L–H No data is written into the devices during this portion of a write operation.Note:10.01012,3 can be altered on differentportions of a Write cycle, as long as the set-up and hold requirements are achieved.。

CY7C344资料

CY7C344资料

Multiple Array Matrix High-Density EPLDSfax id: 6100CY7C340 EPLD FamilyFeatures•Erasable, user-configurable CMOS EPLDs capable of implementing high-density custom logic functions •0.8-micron double-metal CMOS EPROM technology (CY7C34X)•Advanced 0.65-micron CMOS technology to increase performance (CY7C34XB)•Multiple Array MatriX architecture optimized for speed, density, and straightforward design implementation —Programmable Interconnect Array (PIA) simplifies routing —Flexible macrocells increase utilization —Programmable clock control—Expander product terms implement complex logic functions •Warp2®—Low-cost VHDL compiler for CPLDs and PLDs —IEEE 1164-compliant VHDL —Available on PC and Sun platforms •Warp3®—VHDL synthesis —ViewLogic graphical user interface —Schematic capture (ViewDraw™)—VHDL simulation (ViewSim™)—Available on PC and Sun platformsGeneral DescriptionThe Cypress Multiple Array Matrix (MAX®) family of EPLDs provides a user-configurable, high-density solution to gener-al-purpose logic integration requirements. With the combina-tion of innovative architecture and state-of-the-art process, the MAX EPLDs offer LSI density without sacrificing speed.The MAX architecture makes it ideal for replacing large amounts of TTL SSI and MSI logic. For example, a 74161counter utilizes only 3% of the 128 macrocells available in the CY7C342B. Similarly, a 74151 8-to-1 multiplexer consumes less than 1% of the over 1,000 product terms in the CY7C342B. This allows the designer to replace 50 or more TTL packages with just one MAX EPLD. The family comes in a range of densities, shown below. By standardizing on a few MAX building blocks, the designer can replace hundreds of different 7400 series part numbers currently used in most dig-ital systems.The family is based on an architecture of flexible macrocells grouped together into Logic Array Blocks (LABs). Within the LAB is a group of additional product terms called expander product terms. These expanders are used and shared by the macrocells, allowing complex functions of up to 35 product terms to be easily implemented in a single macrocell. A Pro-grammable Interconnect Array (PIA) globally routes all signals within devices containing more than one LAB. This architec-ture is fabricated on the Cypress 0.8-micron, double-lay-er-metal CMOS EPROM process, yielding devices with signif-icantly higher integration, density and system clock speed than the largest of previous generation EPLDs. The CY7C34XB de-vices are 0.65-micron shrinks of the original 0.8-micron family.The CY7C34XBs offer faster speed bins for each device in the Cypress MAX family.The density and performance of the CY7C340 family is ac-cessed using Cypress’s Warp2 and Warp3 design software.Warp2 provides state-of-the-art VHDL synthesis for MAX and F LASH 370™ at a very low cost. Warp3 is a sophisticated CAE tool that includes schematic capture (ViewDraw) and timing simulation (ViewSim) in addition to VHDL synthesis.Consult the Warp2 and Warp3 datasheets for more informa-tion about the development tools.Max Family MembersFeature CY7C344(B)CY7C343(B)CY7C342BCY7C346(B)CY7C341BMacrocells 3264128128192MAX Flip-Flops 3264128128192MAX Latches [1]64128256256384MAX Inputs [2]2335598471MAX Outputs 1628526464Packages28H,J,W,P44H,J68H,J,R84H,J 100R,N84H,J,RKey:P—Plastic DIP; H—Windowed Ceramic Leaded Chip Carrier; J—Plastic J-Lead Chip Carrier; R—Windowed Pin Grid Array;W—Windowed Ceramic DIP; N—Plastic Quad Flat PackNotes:1.When all expander product terms are used to implement latches.2.With one output.PAL is a registered trademark of Advanced Micro Devices.MAX is a registered trademark of Altera Corporation.F LASH 370 is a trademark of Cypress Semiconductor Corporation.Warp2 and Warp3 are registered trademarks of Cypress Semiconductor Corporation.ViewDraw and ViewSim are trademarks of ViewLogic Corp.DEDICATED INPUTSLOGICBLOCKARRAY(LAB)EXPANDER PRODUCT TERMSDUALI/OFEEDBACKMULTIPLEARRAYS(LABS) MACROCELLSPROGRAMMABLEINTERCONNECTARRAY (PIA)C340–1Figure 1.Key MAX FeaturesFunctional DescriptionThe Logic Array BlockThe logic array block, shown in Figure 2, is the heart of the MAX architecture. It consists of a macrocell array, expand-er product term array, and an I/O block. The number of macrocells, expanders, and I/O vary, depending upon the device used. Global feedback of all signals is provided within a LAB, giving each functional block complete access to the LAB resources. The LAB itself is fed by the program-mable interconnect array and dedicated input bus. The feedbacks of the macrocells and I/O pins feed the PIA, pro-viding access to them through other LABs in the device.The members of the CY7C340 family of EPLDs that have a single LAB use a global bus, so a PIA is not needed (see Figure 3).The MAX MacrocellTraditionally, PLDs have been divided into either PLA (pro-grammable AND, programmable OR), or PAL® (programma-ble AND, fixed OR) architectures. PLDs of the latter type provide faster input-to-output delays, but can be inefficient due to fixed allocation of product terms. Statistical analysis of PLD logic designs has shown that 70% of all logic func-tions (per macrocell) require three product terms or less.The macrocell structure of MAX has been optimized to handle variable product term requirements. As shown in Figure 4,each macrocell consists of a product term array and a con-figurable register. In the macrocell, combinatorial logic is implemented with three product terms ORed together,which then feeds an XOR gate. The second input to the XOR gate is also controlled by a product term, providing the ability to control active HIGH or active LOW logic and to implement T- and JK-type flip-flops.If more product terms are required to implement a given func-tion, they may be added to the macrocell from the expander product term array. These additional product terms may be added to any macrocell, allowing the designer to build gate-in-tensive logic, such as address decoders, adders, compara-tors, and complex state machines, without using extra macro-cells.The register within the macrocell may be programmed for ei-ther D, T , JK, or RS operation. It may alternately be configured as a flow-through latch for minimum input-to-output delays, or bypassed entirely for purely combinatorial logic. In addition,each register supports both asynchronous preset and clear,allowing asynchronous loading of counters of shift registers,as found in many standard TTL functions. These registers may be clocked with a synchronous system clock, or clocked inde-pendently from the logic array.Expander Product TermsThe expander product terms, as shown in Figure 5, are fed by the dedicated input bus, the programmable interconnect array, the macrocell feedback, the expanders themselves,and the I/O pin feedbacks. The outputs of the expanders then go to each and every product term in the macrocell array. This allows expanders to be “shared” by the product terms in the logic array block. One expander may feed all macrocells in the LAB, or even multiple product terms in the same macrocell. Since these expanders feed the second-ary product terms (preset, clear, clock, and output enable)of each macrocell, complex logic functions may be imple-mented without utilizing another macrocell. Likewise, ex-panders may feed and be shared by other expanders, to implement complex multilevel logic and input latches.Figure 2.Typical LAB Block Diagram Figure 3.7C344 LAB Block DiagramI N P U T SP I AMACROCELLARRAYEXPANDER PRODUCT TERM ARRAYI/O BLOCKI/O PINSPROGRAMMABLE INTERCONNECTARRAYC340–2I N P U T SMACROCELL ARRAYEXPANDER PRODUCT TERM ARRAYI/O BLOCKI/O PINSC340–3Figure 4.Macrocell Block DiagramFigure 5.Expander Product Terms Figure 6.I/O Block DiagramDEDICATED INPUTSPROGRAMMABLE INTERCONNECTEXPANDER PRODUCT TERMS 16MACROCELL FEEDBACKS I/O OUTPUT ENABLEARRAY CLOCKCLEARPRESETTOI/O CONTROLNOTE: ONE SYSTEM CL OCK PER LABPQ CD PROGRAMMABLEFLIP–FLOP(D,T,JK,SR)D REGISTEREDORFLOW–THROUGH–LA TCH OPERATION DPROGRAMMABLECLOCKD ASYNCCLEARANDPRESETMACROCELL FEEDBACK8(32 FOR 7C344)32(64 FOR 7C344)SIGNALSTO PIAC340–4EXPANDER P-TERMSMACROCELL P-TERMSC340–5TO PIA (LAB FOR 7C344)I/O OUTPUT ENABLEFROM MACROCELL IN LABI/O PADTHREE–STATE BUFFERC340–6I/O BlockSeparate from the macrocell array is the I/O control block of the LAB. Figure 6 shows the I/O block diagram. The three-state buffer is controlled by a macrocell product term and the drives the I/O pad. The input of this buffer comes from a macrocell within the associated LAB. The feedback path from the I/O pin may feed other blocks within the LAB, as well as the PIA. By decoupling the I/O pins from the flip-flops, all the registers in the LAB are “buried,” allowing the I/O pins to be used as dedicated outputs, bidirectional outputs, or as additional dedicated inputs. Therefore, applications requiring many buried flip-flops, such as counters, shift registers, and state machines, no longer consume both the macrocell regis-ter and the associated I/O pin, as in earlier devices.The Programmable Interconnect ArrayPLD density and speed has traditionally been limited by signal routing; i.e., getting signals from one macrocell to another. For smaller devices, a single array is used and all signals are avail-able to all macrocells. But as the devices increase in density, the number of signals being routed becomes very large, in-creasing the amount of silicon used for interconnections. Also, because the signal must be global, the added loading on the internal connection path reducesthe overall speed performance of the device. The MAX archi-tecture solves these problems. It is based on the concept of small, flexible logic array blocks that, in the larger devices, are interconnected by a PIA.The PIA solves interconnect limitations by routing only the sig-nals needed by each LAB. The architecture is designed so that every signal on the chip is within the PIA. The PIA is then programmed to give each LAB access to the signals that it requires. Consequently, each LAB receives only the signals needed. This effectively solves any routing problems that may arise in a design without degrading the performance of the device. Unlike masked or programmable gate arrays, which induce variable delays dependent on routing, the PIA has a fixed delay from point to point. This eliminates undesired skews among logic signals, which may cause glitches in inter-nal or external logic.Development Software SupportWarp2Warp2 is a state-of-the-art VHDL compiler for designing with Cypress PLDs and CPLDs. Warp2 utilizes a proper subset of IEEE 1164 VHDL as its Hardware Description Language (HDL) for design entry. VHDL provides a number of significant benefits for the design entry process. Warp2 accepts VHDL input, synthesizes and optimizes the entered design, and out-puts a JEDEC map for the desired device. For functional sim-ulation, Warp2/ provides a graphical waveform simulator (NOVA).VHDL (VHSIC Hardware Description Language) is an open, powerful, non-proprietary language that is a standard for be-havioral design entry and simulation. It is already mandated for use by the Department of Defense, and supported by every major vendor of CAE tools. VHDL allows designers to learn a single language that is useful for all facets of the design pro-cess.Warp3Warp3 is a sophisticated design tool that is based on the latest version of ViewLogic’s CAE design environment. Warp3 fea-tures schematic capture (ViewDraw), VHDL waveform simula-tion (ViewSim), a VHDL debugger, and VHDL synthesis, all integrated in a graphical design environment. Warp3 is avail-able on PCs using Windows 3.1 or subsequent versions, and on Sun and HP workstations.For further information on Warp software, see the Warp2and Warp3 datasheets contained in this data book.Third-Party SoftwareCypress maintains a very strong commitment to third-party de-sign software vendors. All major third-party software vendors provide support for the MAX family of devices. T o expedite this support, Cypress supplies vendors with all pertinent architec-tural information as well as design fitters for our products. ProgrammingThe Impulse3™device programmers from Cypress will pro-gram all Cypress PLDs, CPLDs, FPGAs, and PROMs. The unit is a standalone programmer that connects to any IBM-compatible PC via the printer port.Third-Party ProgrammersAs with development software, Cypress strongly supports third-party programmers. All major third-party programmers support the MAX family.Cross ReferenceALTERA CYPRESSPREFIX EPM PREFIX: CYPREFIX: EP PREFIX: PALC22V10–10C PALC22V10D–7C22V10–10C PALC22V10D–10C22V10–10C PAL22V10C–7C+22V10–10C PAL22V10C–10C+22V10–15C PALC22V10B–15C22V10–15C PALC22V10D–15C5032DC7C344–25WC5032DC–27C344–20WC5032DC–157C344–15WC5032DC–17Call Factory5032DC–207C344–20WC5032DC–257C344–25WC5032DM7C344–25WMB5032DM–257C344–25WMB5032JC7C344–25HC5032JC–27C344–20HC5032JC–157C344–15HC5032JC–17Call Factory5032JC–207C344–20HC5032JC–257C344–25HC© Cypress Semiconductor Corporation, 1995. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Document #: 38-00087-D5032JM 7C344–25HMB 5032JM–257C344–25HMB 5032LC 7C344–25JC 5032LC–27C344–20JC 5032LC–157C344–15JC 5032LC–17Call Factory 5032LC–207C344–20JC 5032LC–257C344–25JC 5032PC 7C344–25PC 5032PC–27C344–20PC 5032PC–157C344–15PC 5032PC–17Call Factory 5032PC–207C344–20PC 5032PC–257C344–25PC 5064JC 7C343–35HC 5064JC–17C343–25HC 5064JC–27C343–30HC 5064JI 7C343–35HI 5064JM 7C343–35HMB 5064LC 7C343–35JC 5064LC–17C343–25JC 5064LC–27C343–30JC 5128AGC–127C342B–12RC 5128AGC–157C342B–15RC 5128AGC–207C342B–20RC 5128AJC–127C342B–12HC 5128AJC–157C342B–15HC 5128AJC–207C342B–20HC 5128ALC–127C342B–12JC 5128ALC–157C342B–15JC 5128ALC–207C342B–20JC 5128GC 7C342–35RC 5128GC–17C342–25RC 5128GC–27C342–30RC 5128GM 7C342–35RMB 5128JC 7C342–35HC 5128JC–17C342–25HC 5128JC–27C342–30HC 5128JI 7C342–35HI 5128JI–27C342–30HI 5128JM 7C342–35HMB 5128LC 7C342–35JC 5128LC–17C342–25JC 5128LC–27C342–30JCCross Reference (continued)ALTERA CYPRESS 5128LI 7C342–35JI 5128LI–27C342–30HI 5130GC 7C346–35RC 5130GC–17C346–25RC 5130GC–27C346–30RC 5130GM 7C346–35RM 5130JC 7C346–35HC 5130JC–17C346–25HC 5130JC–27C346–30HC 5130JM 7C346–35HM 5130LC 7C346–35JC 5130LC–17C346–25JC 5130LC–27C346–30JC 5130LI 7C346–35JI 5130LI–27C346–30JI 5130QC 7C346–35NC 5130QC–17C346–25NC 5130QC–27C346–30NC 5130QI 7C346–35NI 5192AGC–157C341B–15RC 5192AGC–207C341B–20RC 5192AJC–157C341B–15HC 5192AJC–207C341B–20HC 5192ALC–17C341B–15JC 5192ALC–27C341B–20JC 5192GC 7C341–35RC 5192GC–17C341–25RC 5192GC–27C341–30RC 5192JM 7C341–35HM 5192JC 7C341–35HC 5192JC–17C341–25HC 5192JC–27C341–30HC 5192GM 7C341–35RM 5192JI 7C341–35HI 5192LC 7C341–35JC 5192LC–17C341–25JC 5192LC–27C341–30JCCross Reference (continued)ALTERA CYPRESS。

CYPRESS CY7C277 说明书

CYPRESS CY7C277 说明书

32K x 8 Reprogrammable Registered PROMCY7C277Features•Windowed for reprogrammability •CMOS for optimum speed/power •High speed—30-ns address set-up —15-ns clock to output •Low power—60 mW (commercial)—715 mW (military)•Programmable address latch enable input•Programmable synchronous or asynchronous output enable•On-chip edge-triggered output registers •EPROM technology, 100% programmable •Slim 300-mil, 28-pin plastic or hermetic DIP •5V ±10% V CC , commercial and military •TTL-compatible I/O•Direct replacement for bipolar PROMs•Capable of withstanding greater than 2001V static dis-chargePROGRAMMABLE MULTIPLEXERPROGRAMMABLE CP/ALE OPTIONSLogic Block DiagramPin Configurations123456789101112161718192024232221131425282726A 9A 8A 7A 6A 5A 4A 3A 2A 1A 0O 0O 1O 2GNDV CC A 10A 11A 12A 13A 14ALE CP E/E S O 7O 6O 4O 5O 312O 0314567891032130131415161726252423222111A 7V C C A 6A 5A 4A 3A 2A 1A 0A 13A 14NC CP O 7O 6O 5G N D LCC/PLCC (Opaque Only)A 12ALE A 8O 4O 2O 11819202728293215O 3A 9A 10A 11E/E S N C N C A 14A 13A 12A 11A 10A 9A 88-BIT 1OF 128MUXA 7A 6A 5A 4A 3A 2A 1A 0E/E SCP15-BIT ADDRESS TRANSPARENT/LATCH256x 1024PROGRAMMABLEARRAY8-BIT EDGE-TRIGGERED REGISTERROW DECODER 1OF 256ALE COLUMN DECODER 1OF 32ALECPD CQNC Top ViewDIP/Flatpack Top ViewYADDRESSXADDRESSO 7O 6O 5O 4O 3O 2O 1O 0Selection Guide7C277-307C277-407C277-50Minimum Address Set-Up Time (ns)304050Maximum Clock to Output (ns)152025Maximum Operating Current (mA)Com ’l 120120120Mil130130查询CY7C277-30JC供应商Functional DescriptionThe CY7C277 is a high-performance 32K word by 8-bit CMOS PROMs. It is packaged in the slim 28-pin 300-mil package. The ceramic package may be equipped with an erasure win-dow; when exposed to UV light, the PROM is erased and can then be reprogrammed. The memory cells utilize proven EPROM floating-gate technology and byte-wide algorithms. The CY7C277 offers the advantages of low power, superior performance, and high programming yield. The EPROM cell requires only 12.5V for the supervoltage and low current re-quirements allow for gang programming. The EPROM cells allow for each memory location to be 100% tested, as each location is written into, erased, and repeatedly exercised prior to encapsulation. Each PROM is also tested for AC perfor-mance to guarantee that the product will meet DC and AC specification limits after customer programming.On the 7C277, the outputs are pipelined through a mas-ter-slave register. On the rising edge of CP, data is loaded into the 8-bit edge triggered output register. The E/E S input pro-vides a programmable bit to select between asynchronous and synchronous operation. The default condition is asynchro-nous. When the asynchronous mode is selected, the E/E S pin operates as an asynchronous output enable. If the synchro-nous mode is selected, the E/E S pin is sampled on the rising edge of CP to enable and disable the outputs. The 7C277 also provides a programmable bit to enable the Address Latch in-put. If this bit is not programmed, the device will ignore the ALE pin and the address will enter the device asynchronously. If the ALE function is selected, the address enters the PROM while the ALE pin is active, and is captured when ALE is deasserted.The user may define the polarity of the ALE signal, with the default being active HIGH.Maximum Ratings(Above which the useful life may be impaired. For user guide-lines, not tested.)Storage Temperature ....................................−65°C to +150°C Ambient Temperature withPower Applied.................................................−55°C to +125°C Supply Voltage to Ground Potential.................−0.5V to +7.0V (Pin 24 to Pin 12)DC Voltage Applied to Outputsin High Z State.....................................................−0.5V to +7.0V DC Input Voltage.................................................−3.0V to +7.0V DC Program Voltage (Pins 7, 18, 20)...........................13.0V UV Erasure...................................................7258 Wsec/cm2 Static Discharge Voltage...........................................>2001V (per MIL-STD-883, Method 3015)Latch-Up Current.....................................................>200 mA Operating RangeRange Ambient Temperature V CC Commercial0°C to +70°C 5V ±10% Industrial[1]−40°C to +85°C 5V ±10% Military[2]−55°C to +125°C 5V ±10%Electrical Characteristics Over the Operating Range[3, 4]Parameter7C277-307C277-40, 50 Description Test Conditions Min.Max.Min.Max.UnitV OH Output HIGH Voltage V CC = Min., I OH = − 2.0 mA 2.4 2.4V V OL Output LOW Voltage V CC = Min., I OL = 8.0 mA0.40.4V V IH Input HIGH Level Guaranteed Input Logical HIGHVoltage for All Inputs2.0V CC 2.0V CC VV IL Input LOW Level Guaranteed Input Logical LOWVoltage for All Inputs0.80.8VI IX Input Leakage Current GND < V IN < V CC−10+10−10+10µA V CD Input Clamp Diode Voltage Note 4I OZ Output Leakage Current0 < V OUT < V CC, Output Disabled[5]−40+40−40+40µA I OS Output Short Circuit Current V CC = Max., V OUT = 0.0V[6]−20−90−20−90mAI CC Power Supply Current V CC = Max., CS > V IHI OUT = 0 mA Commercial120120mA Military130V PP Programming Supply Voltage12131213V I PP Programming Supply Current5050mA V IHP Input HIGH Programming Voltage 3.0 3.0V V ILP Input LOW Programming Voltage0.40.4V Notes:1.Contact a Cypress representative for industrial temperature range specifications.2.T A is the “instant on” case temperature.3.See the last page of this specification for Group A subgroup testing information.4.See “Introduction to CMOS PROMs” in this Book for general information on testing.5.For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this measurement.6.For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.Capacitance [4]ParameterDescriptionTest ConditionsMax.Unit C IN Input Capacitance T A = 25°C, f = 1 MHz,V CC = 5.0V10pF C OUTOutput Capacitance10pFAC Test Loads and Waveforms [4]3.0V 5V OUTPUTR1 500ΩR2333Ω30pFINCLUDINGJIG AND SCOPEGND90%10%90%10%<5ns<5ns5V OUTPUTR1 500ΩR2333Ω5pF INCLUDINGJIG AND SCOPE(a)NormalLoad(b)HighZ LoadOUTPUT2.0V Equivalent to:TH É VENIN EQUIVALENT ALL INPUT PULSES(658Ω MIL)(403Ω MIL)(403Ω MIL)OUTPUT1.9VCommercial Military(658Ω MIL)200Ω250ΩCY7C277 Switching Characteristics Over the Operating Range [3, 4]7C277-307C277-407C277-50Parameter DescriptionMin.Max.Min.Max.Min.Max.Unit t AL Address Set-Up to ALE Inactive 51010ns t LA Address Hold from ALE Inactive 101015ns t LL ALE Pulse Width101015ns t SA Address Set-Up to Clock HIGH 304050ns t HA Address Hold from Clock HIGH 000ns t SES E S Set-Up to Clock HIGH 121515ns t HES E S Hold from Clock HIGH 51010ns t CO Clock HIGH to Output Valid 152025ns t PWC Clock Pulse Width152020ns t LZC [7]Output Valid from Clock HIGH 152030ns t HZC Output High Z from Clock HIGH 152030ns t LZE [8]Output Valid from E LOW 152030ns t HZE [8]Output High Z from E HIGH152030nsNotes:7.Applies only when the synchronous (E S ) function is used.8.Applies only when the asynchronous (E) function is used.Architecture Byte (8000)D7D0C 7C 6C 5C 4 C 3 C 2 C 1 C 0Architecture Configuration BitsArchitecture Bit Architecture Verify D 7 - D 0FunctionALE D 10 = DEFAULT Input Transparent 1 = PGMED Input Latched ALEP D 20 = DEFAULT ALE = Active HIGH 1 = PGMED ALE = Active LOWE/E SD 00 = DEFAULT Asynchronous Output Enable (E)1 = PGMEDSynchronous Output Enable (E S )Bit MapProgrammer Address(Hex.)RAM Data 0000...7FFF 8000Data ...Data Control ByteNote:9.ALE is shown with positive polarity.t HZEt LZEt SES t SES t LZCt HZCt COt HES t HES HIGH ZHIGHZt ALt LAt LLt SAt HAA 0-A 14ALEE S(SYNCH)CPO 0-O 7E S(ASYNCH)t PWCt PWC Timing Diagram (Input Latched)[9]t LZEt HZEt SES t HZCTiming Diagram (Input Transparent)t SES t LZCt COt HES t HES HIGH ZHIGHZt SAt HAA 0-A 14E S(SYNCH)CPO 0-O 7E S(ASYNCH)t PWCt PWCProgramming InformationProgramming support is available from Cypress as well as from a number of third-party software vendors. For detailed programming information, including a listing of software pack-ages, please see the PROM Programming Information located at the end of this section. Programming algorithms can be ob-tained from any Cypress representative.Table 1.Mode SelectionPin Function [10]Read or Output DisableA 14–A 0E, E S CP ALE O 7–O 0Mode OtherA 14–A 0VFY PGM V PP D 7–D 0ReadA 14–A 0V IL V IH V IL O 7–O 0Output Disable A 14–A 0V IH X X High Z Program A 14–A 0V IHP V ILP V PP D 7–D 0Program Verify A 14–A 0V ILP V IHP /V ILP V PP O 7–O 0Program Inhibit A 14–A 0V IHP V IHP V PP High Z Blank CheckA 14–A 0V ILPV IHP /V ILPV PPO 7–O 0Note:10.X = “don ’t care ” but not to exceed V CC ±5%.Figure 1.Programming Pinouts123456789101112161718192024232221131425282726A 9A 8A 7A 6A 5A 4A 3A 2A 1A 0D 0D 1D 2GNDV CC A 10A 11A 12A 13A 14V PP PGM VFY D 7D 6D 4D 5D 312D 0314567891032130131415161726252423222111A 7V C C A 6A 5A 4A 3A 2A 1A 0PGM NC D 7D 6D 4VFY D 3D 2D 118192027282932N C N C D 5NC 15V PP DIP LCC/PLCC (Opaque Only)Top ViewTop ViewG N D A 12A 13A 14A 8A 9A 10A 11Typical DC and AC Characteristics1.41.61.00.84.0 4.55.05.56.0−55251251.21.1SUPPLYVOLTAGE (V)NORMALIZED SUPPLY CURRENT vs. SUPPLY VOLTAGENORMALIZED SUPPLY CURRENT vs. AMBIENT TEMPERATUREAMBIENTTEMPERATURE (°C)0.61.2N O R M A L I Z E D A C C E S S T I M E1501751257550250.01.02.03.0O U T P U T S I N K C U R R E N T (m A )0100OUTPUT VOLTAGE (V)OUTPUT SINK CURRENT vs. OUTPUT VOLTAGE1.00.90.8N O R M A L I Z E D I C CN O R M A L I Z E D I C CV CC =5.0V T A =25°C60504030201001.02.03.0O U T P U T S O U R C E C U R R E N T (m A )OUTPUT VOLTAGE (V)30.025.020.015.010.05.00200400600800D E L T A t (n s )A ACAPACITANCE (pF)TYPICAL ACCESS TIME CHANGEvs. OUTPUT LOADING4.00.01000T A =25°C V CC =4.5VT A =25°Cf =f MAX0OUTPUT SOURCE CURRENT vs. VOLTAGE 4.01.61.41.21.00.8−55125N O R M A L I Z E D S E T -U P T I M E0.625AMBIENT TEMPERATURE (°C)NORMALIZED SET-UP TIME vs. TEMPERATURE1.24.04.55.05.56.00.4SUPPLYVOLTAGE (V)NORMALIZED ACCESS TIME vs. SUPPLY VOLTAGET A =25°C1.00.80.6C277-12MILITARY SPECIFICATIONS Group A Subgroup Testing Ordering Information [11]Speed (ns)Ordering Code Package Name Package TypeOperating Range 30CY7C277-30JC J6532-Lead Plastic Leaded Chip Carrier CommercialCY7C277-30PC P2128-Lead (300-Mil) Molded DIP CY7C277-30WCW2228-Lead (300-Mil) Windowed CerDIP 40CY7C277-40JC J6532-Lead Plastic Leaded Chip Carrier Commercial CY7C277-40PC P2128-Lead (300-Mil) Molded DIP CY7C277-40WC W2228-Lead (300-Mil) Windowed CerDIP CY7C277-40DMB D2228-Lead (300-Mil) CerDIP Military CY7C277-40KMB K7428-Lead Rectangular CerpackCY7C277-40LMB L5532-Pin Rectangular Leadless Chip CarrierCY7C277-40QMB Q5532-Pin Windowed Rectangular Leadless Chip Carrier CY7C277-40TMB T7428-Lead Windowed Cerpack CY7C277-40WMBW2228-Lead (300-Mil) Windowed CerDIP 50CY7C277-50JC J6532-Lead Plastic Leaded Chip Carrier Commercial CY7C277-50PC P2128-Lead (300-Mil) Molded DIP CY7C277-50WC W2228-Lead (300-Mil) Windowed CerDIP CY7C277-50DMB D2228-Lead (300-Mil) CerDIP Military CY7C277-50KMB K7428-Lead Rectangular CerpackCY7C277-50LMB L5532-Pin Rectangular Leadless Chip CarrierCY7C277-50QMB Q5532-Pin Windowed Rectangular Leadless Chip Carrier CY7C277-50TMB T7428-Lead Windowed Cerpack CY7C277-50WMBW2228-Lead (300-Mil) Windowed CerDIPNote:11.Most of the above products are available in industrial temperature range. Contact a Cypress representative for specifications and productavailability.DC CharacteristicsParameterSubgroups V OH 1, 2, 3V OL 1, 2, 3V IH 1, 2, 3V IL 1, 2, 3I IX 1, 2, 3I OZ 1, 2, 3I CC1, 2, 3Switching CharacteristicsParameterSubgroups t SA 7, 8, 9, 10, 11t HA 7, 8, 9, 10, 11t CO7, 8, 9, 10, 11Package Diagrams28-Lead(300-Mil)CerDIP D22MIL-STD-1835D-15Config. A51-8003232-Lead Plastic Leaded Chip Carrier J6551-85002-B28-Lead Rectangular Cerpack K74MIL-STD-1835F-11 Config. A51-80061Package Diagrams (continued)32-Pin Rectangular Leadless Chip Carrier L55MIL-STD-1835 C-1251-8006851-85014-B28-Lead (300-Mil)Molded DIP P21Document #: 38-04006 Rev. **Page 11 of 13Package Diagrams (continued)MIL-STD-1835 C-1251-80103-*A 32-Pin Windowed Rectangular Leadless Chip Carrier Q55Document #: 38-04006 Rev. **Page 12 of 13© Cypress Semiconductor Corporation, 2002. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.Package Diagrams (continued)Document #: 38-04006 Rev. **Page 13 of 13Document Title: CY7C277 32K x 8 Programmable Registered PROM Document Number: 38-04006REV.ECN NO.Issue Date Orig. of Change Description of Change **1138623/8/02DSG Change from Spec number: 38-00085 to 38-04006。

CY7C131 手册

CY7C131 手册

A 9R A 0R
CEL OEL R/WL INTL
ARBITRATION LOGIC (7C130/7C131 ONLY) AND INTERRUPT LOGIC
CER OER R/WR INTR
[3]
[3]
Notes 1. CY7C130 and CY7C130A are functionally identical; CY7C131 and CY7C131A are functionally identical. 2. CY7C130/130A/CY7C131/131A (Master): BUSY is open drain output and requires pull-up resistor. CY7C140/CY7C141 (Slave): BUSY is input. 3. Open drain outputs: pull-up resistor required.
Logic Block Diagram
R/WL CEL OEL R/WR CER OER
I/O7L I/O0L BUSYL
I/O CONTROL
I/O CONTROL
I/O7R I/O0R BUSYR
[2]
A 9L A 0L
ADDRESS DECODER
MEMORY ARRAY
ADDRESS DECODER
Cypress Semiconductor Corporation Document Number: 38-06002 Rev. *G

198 Champion Court

San Jose, CA 95134-1709 • 408-943-2600 Revised October 11, 2010

CY7C1362B-166AI资料

CY7C1362B-166AI资料

Selection Guide
225 MHz Maximum Access Time Maximum Operating Current Maximum CMOS Standby Current 2.8 250 30 200 MHz 3.0 220 30 166 MHz 3.5 180 30 Unit ns mA mA
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
CY7C1360B (256K X 36)
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
DQPC DQC DQc VDDQ VSSQ DQC DQC DQC DQC VSSQ VDDQ DQC DQC NC VDD NC VSS DQD DQD VDDQ VSSQ DQD DQD DQD DQD VSSQ VDDQ DQD DQD DQPD
Shaded areas contain advance information. Please contact your local Cypress sales representative for availability of these parts. Notes: 1. For best-practices recommendations, please refer to the Cypress application note System Design Guidelines on . 2. CE3 is for A version of TQFP (3 Chip Enable option) and 165 fBGA package only. 119 BGA is offered only in 2 Chip Enable.

川崎CX系列机器人手册

川崎CX系列机器人手册

Kawasaki Robotics (USA), Inc.28140 Lakeview Drive, Wixom, MI 48393, U.S.A.Phone: +1-248-446-4100 Fax: +1-248-446-4200Kawasaki Robotics (UK) Ltd./Unit 4 Easter Court, Europa Boulevard, Westbrook Warrington Cheshire, WA5 7ZB, United KingdomPhone: +44-1925-71-3000 Fax: +44-1925-71-3001Kawasaki Robotics GmbHwww.kawasakirobot.de29 Sperberweg, 41468 Neuss, Germany Phone: +49-2131-34260 Fax: +49-2131-3426-22Kawasaki Robotics Korea, Ltd.www.kawasakirobot.co.kr43, Namdong-daero 215beon-gil, Namdong-gu, Incheon, 405-817, KoreaPhone: +82-32-821-6941 Fax: +82-32-821-6947Kawasaki Robotics (Tianjin) Co., Ltd.Bldg 3, No.16, Xiang'an Road, TEDA, Tianjin 300457 China Phone: +86-22-5983-1888 Fax: +86-22-5983-1889Kawasaki Motors Enterprise (Thailand) Co., Ltd.(Rayong Robot Center)www.khi.co.jp/robot/th/119/10 Moo 4 T.Pluak Daeng, A.Pluak Daeng, Rayong 21140 ThailandPhone: +66-38-955-040-58 Fax: +66-38-955-145Tokyo Head Of ce/Robot Division1-14-5, Kaigan, Minato-ku, Tokyo 105-8315, Japan Phone: +81-3-3435-6852 Fax: +81-3-3437-9880Akashi Works/Robot Division1-1, Kawasaki-cho, Akashi, Hyogo 673-8666, Japan Phone: +81-78-921-2946 Fax: +81-78-923-6548ROBOT DIVISIONhttp://www.khi.co.jp/robot/✽ Materials and speci cations are subject to change without notice.Global NetworkFeaturesHigh-speed motionIts high-speed motion operation, accomplished bylight-weight arm, the latest vibration control system, and a maximum-speed-focused setting, reduces cycle time drastically, especially in long stroke motions such as in handling of materials.Better cable harness storingThe robot’s hollow structural arm base and upper arm have made it possible to store the cable harness within. Its large hollow structure diameter makes it easier to retro t the cable harnesses or service the robot. Higher installation exibilityIts small installation area and long-reach arm make it possible to satisfy any robot layout requirements.。

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PRELIMINARY 16-Mbit (2M x 8) Static RAMCY7C1069DV33Features•High speed —t AA = 10 ns •Low active power—I CC = 125 mA @ 10 ns •Low CMOS standby power —I SB2 = 25 mA•Operating voltages of 3.3 ± 0.3V •2.0V data retention•Automatic power-down when deselected •TTL-compatible inputs and outputs•Easy memory expansion with CE 1 and CE 2 features •Available in Pb-free 54-pin TSOP II package and 48-ball VFBGA packagesFunctional DescriptionThe CY7C1069DV33 is a high-performance CMOS Static RAM organized as 2,097,152 words by 8 bits. Writing to the device is accomplished by enabling the chip (by taking CE 1LOW and CE 2 HIGH) and Write Enable (WE) inputs LOW.Reading from the device is accomplished by enabling the chip (CE 1 LOW and CE 2 HIGH) as well as forcing the Output Enable (OE) LOW while forcing the Write Enable (WE) HIGH.See the truth table at the back of this data sheet for a complete description of Read and Write modes.The input/output pins (I/O 0 through I/O 7) are placed in a high-impedance state when the device is deselected (CE 1HIGH or CE 2 LOW), the outputs are disabled (OE HIGH), or during a Write operation (CE 1 LOW, CE 2 HIGH, and WE LOW).The CY7C1069DV33 is available in a 54-pin TSOP II package with center power and ground (revolutionary) pinout, and a 48-ball very fine-pitch ball grid array (VFBGA) package.Selection Guide–10Unit Maximum Access Time 10ns Maximum Operating Current 125mA Maximum CMOS Standby Current25mALogic Block DiagramPin ConfigurationTop ViewTSOP IIWE 12345678910111431323635343337403938121341434216152930A 5A 6A 7A 8A 0A 1OE V SS A 17I/O 7A 2CE 1I/O 0I/O 1A 3A 4181720192728252622212324I/O 2I/O 3A 16A 15V CC I/O 6NC I/O 5I/O 4A 14A 13A 12A 11A 9A 10CE 24446454750494851535254V SS V CC A 19A 18V CC V CCV SS NC V SS NC V CC V SS NC NC NC NCNCNCNC NC A 201516A 1A 2A 3A 4A 5A 6A 7A 8COLUMN DECODERR O W D E C O D E RS E N S E A M P SINPUT BUFFER2M x 8ARRAYA 0A 12A 14A 13A A A 17A 18A 10A 11I/O 0–I/O 7OE CE 2WE CE 1A 9A 19A 20PRELIMINARYCY7C1069DV33Pin Configurations [1]48-ball VFBGAWE VCCA 11A 10A 6A 0A 3CE1I/O 0A 4A 5I/O 1I/O 2I/O 3NC V SS A 9A 8OE V SS A 7NC CE2A17A 2A 1V CC I/O 4I/O 5I/O 6I/O 7NC A 15A 14A 13A 12NC 326541D E B A C F G H(Top View)A 16A 19A 20NC NC NC NCA 18NC NC NCNote:1.NC pins are not connected on the diePRELIMINARYCY7C1069DV33Maximum Ratings(Above which the useful life may be impaired. For user guide-lines, not tested.)Storage Temperature .................................–65°C to +150°C Ambient Temperature withPower Applied.............................................–55°C to +125°C Supply Voltage on V CC to Relative GND [2]....–0.5V to +4.6V DC Voltage Applied to Outputsin High-Z State [2]....................................–0.5V to V CC + 0.5V DC Input Voltage [2].................................–0.5V to V CC + 0.5VCurrent into Outputs (LOW).........................................20 mA Static Discharge Voltage............................................>2001V (per MIL-STD-883, Method 3015)Latch-up Current......................................................>200 mAOperating RangeRange Ambient Temperature V CC Industrial–40°C to +85°C3.3V ± 0.3VDC Electrical Characteristics Over the Operating RangeParameter DescriptionTest Conditions–10Unit Min.Max.V OH Output HIGH Voltage V CC = Min., I OH = –4.0 mA 2.4V V OL Output LOW Voltage V CC = Min., I OL = 8.0 mA0.4V V IH Input HIGH Voltage 2.0V CC + 0.3V V IL Input LOW Voltage [2]–0.30.8V I IX Input Leakage Current GND < V I < V CC–1+1µA I OZ Output Leakage CurrentGND < V OUT < V CC , Output Disabled–1+1µA I CC V CC Operating Supply Current V CC = Max., f = f MAX = 1/t RC, I OUT = 0 mA CMOS levels 125mA I SB1Automatic CE Power-down Current —TTL Inputs CE 2 < V IL , Max. V CC , CE > V IHV IN > V IH or V IN < V IL , f = f MAX 30mA I SB2Automatic CE Power-downCurrent —CMOS InputsCE 2 < 0.3V, Max. V CC , CE > V CC – 0.3V, V IN > V CC – 0.3V, or V IN < 0.3V, f = 025mACapacitance [3]Parameter Description Test ConditionsTSOP II VFBGA Unit C IN Input Capacitance T A = 25°C, f = 1 MHz, V CC = 3.3V68pF C OUTI/O Capacitance810pFThermal Resistance [3]Parameter DescriptionTest ConditionsAll-PackagesUnit ΘJA Thermal Resistance (Junction to Ambient)Still Air, soldered on a 3 × 4.5 inch, four-layer printed circuit boardTBD °C/W ΘJCThermal Resistance (Junction to Case)TBD°C/WAC Test Loads and Waveforms [4]Notes:2.V IL (min.) = –2.0V and V IH (max) = V CC + 2V for pulse durations of less than 20 ns.3.Tested initially and after any design or process changes that may affect these parameters.4.Valid SRAM operation does not occur until the power supplies have reached the minimum operating V DD (3.0V). 100µs (t power ) after reaching the minimum operating V DD , normal SRAM operation can begin including reduction in V DD to the data retention (V CCDR , 2.0V) voltage.90%10%3.0V GND 90%10%All input pulses 3.3V OUTPUT5 pF**Including jig and scope(a)(b)R1 317ΩR2351ΩRise time > 1V/nsFall time:> 1V/ns(c)OUTPUT50ΩZ 0= 50ΩV TH = 1.5V30 pF**Capacitive Load consists of allcomponents of the test environmentPRELIMINARY CY7C1069DV33 AC Switching Characteristics Over the Operating Range [5]Parameter Description–10Unit Min.Max.Read Cyclet power V CC(typical) to the First Access[6]100µst RC Read Cycle Time10nst AA Address to Data Valid10nst OHA Data Hold from Address Change3nst ACE CE1 LOW/CE2 HIGH to Data Valid10nst DOE OE LOW to Data Valid5nst LZOE OE LOW to Low-Z[7]1nst HZOE OE HIGH to High-Z[7]5nst LZCE CE1 LOW/CE2 HIGH to Low-Z[7]3nst HZCE CE1 HIGH/CE2 LOW to High-Z[7]5nst PU CE1 LOW/CE2 HIGH to Power-up[8]0nst PD CE1 HIGH/CE2 LOW to Power-down[8]10ns Write Cycle[9, 10]t WC Write Cycle Time10nst SCE CE1 LOW/CE2 HIGH to Write End7nst AW Address Set-up to Write End7nst HA Address Hold from Write End0nst SA Address Set-up to Write Start0nst PWE WE Pulse Width7nst SD Data Set-up to Write End 5.5nst HD Data Hold from Write End0nst LZWE WE HIGH to Low-Z[7]3nst HZWE WE LOW to High-Z[7]5ns Notes:5.Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V. T est conditions for the Read cycle useoutput loading shown in part a) of the AC test loads, unless specified otherwise.6.t POWER gives the minimum amount of time that the power supply should be at typical V CC values until the first memory access can be performed.7.t HZOE, t HZSCE, t HZWE and t LZOE, t LZCE, and t LZWE are specified with a load capacitance of 5 pF as in (b) of AC Test Loads. Transition is measured ±200 mV fromsteady-state voltage.8.These parameters are guaranteed by design and are not tested.9.The internal Write time of the memory is defined by the overlap of CE1 LOW/CE2 HIGH, and WE LOW. CE1 and WE must be LOW along with CE2 HIGH to initiate aWrite, and the transition of any of these signals can terminate the Write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the Write.10.The minimum Write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of t HZWE and t SD.PRELIMINARYCY7C1069DV33Data Retention Characteristics (Over the Operating Range)Parameter DescriptionConditionsMin.Typ.Max.Unit V DR V CC for Data Retention 2V I CCDR Data Retention CurrentV CC = 2V , CE 1 > V CC – 0.2V ,CE 2 < 0.2V, V IN > V CC – 0.2V or V IN < 0.2V25mA t CDR [3]Chip Deselect to Data Retention Time 0ns t R [11]Operation Recovery Timet RCnsData Retention WaveformSwitching WaveformsRead Cycle No. 1[12,13]Read Cycle No. 2(OE Controlled)[13,14]Notes:11.Full device operation requires linear V CC ramp from V DR to V CC(min.) > 50 µs or stable at V CC(min.) > 50 µs 12.Device is continuously selected. CE 1 = V IL , CE 2 = V IH .13.WE is HIGH for Read cycle.14.Address valid prior to or coincident with CE 1 transition LOW and CE 2 transition HIGH.3V 3V t CDRV DR >2VDATA RETENTION MODEt RCEV CC PREVIOUS DATA VALIDDATA VALIDt RCt AAt OHAADDRESSDATA OUT50%50%DATA VALIDt RCt ASCEt DOE t LZOEt LZSCE t PUHIGH IMPEDANCEt HZOEt PDHIGH OECE 1IMPEDANCEADDRESSDATA OUT V CC SUPPLY t HZSCECURRENTI CC I SBCE 2PRELIMINARYCY7C1069DV33Write Cycle No. 1(CE 1 Controlled)[15,16,17]Write Cycle No.2(WE Controlled, OE LOW)[15,16,17]Truth TableCE 1CE 2OE WE I/O 0–I/O 7ModePowerH X X X High-Z Power-down Standby (I SB )X L X X High-Z Power-down Standby (I SB )L H L H Data Out Read All Bits Active (I CC )L H X L Data In Write All BitsActive (I CC )LHHHHigh-ZSelected, Outputs DisabledActive (I CC )Notes:15.Data I/O is high-impedance if OE = V IH .16.If CE 1 goes HIGH/CE 2 LOW simultaneously with WE going HIGH, the output remains in a high–impedance state.17.1 and CE 2. It is active low.Switching Waveforms (continued)t HDt SDt SCEt SA t HAt AWt PWEt WCBWDATAI/OADDRESSCEWEt OE LOW)t HDt SDt SCEt HAt AWt PWEt WCDATA I/OADDRESSCEWEt SAt LZWEt HZWEPRELIMINARY CY7C1069DV33 Ordering InformationSpeed(ns)Ordering Code PackageDiagram Package TypeOperatingRange10CY7C1069DV33-10ZXI51-8516054-pin TSOP II (Pb-Free)Industrial CY7C1069DV33-10BVXI51-8517848-ball Very Fine Pitch Ball Grid Array (8 × 9.5 × 1 mm) (Pb-Free)Package Diagrams51-85160-**54-pin TSOP Type II (51-85160)PRELIMINARYCY7C1069DV33Document #: 38-05478 Rev. *C Page 8 of 9Package DiagramsPRELIMINARY CY7C1069DV33 Document History PageDocument Title: CY7C1069DV33 16-Mbit (2M x 8) Static RAMDocument Number: 38-05478REV.ECN NO.Issue Date Orig. ofChange Description of Change**201560See ECN SWI Advance Data sheet for C9 IPP*A233748See ECN RKF 1.AC, DC parameters are modified as per EROS (Spec # 01-2165)2.Pb-free Offering in the ‘Ordering Information*B469420See ECN NXR Converted from Advance Information to PreliminaryRemoved –8 and –12 speed bins from product offeringRemoved Commercial Operating RangeChanged 2G ball of FBGA and pin #40 of TSOPII from DNU to NCIncluded the Maximum ratings for Static Discharge Voltage and Latch UpCurrent on page #3Changed I CC(Max) from 220 mA to 100 mAChanged I SB1(Max) from 70 mA to 30 mAChanged I SB2(Max) from 40 mA to 25 mASpecified the Overshoot spec in footnote # 1Added Data Retention Characteristics table on page #5Updated the 48-pin FBGA packageUpdated the ordering Information table.*C499604See ECN NXR Added note# 1 for NC pinsUpdated Test Condition for I CC in DC Electrical Characteristics tableUpdated the 48-ball FBGA Package。

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