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霍尼韦尔常用楼控设备型号及产地

HONEYWELL楼控部分产品型号、参数及产地产品型号说明产地监控中心基本软件EBI 基本软件 12个读卡器/250点澳大利亚EBI 基本软件 12个读卡器/500点澳大利亚EBI 扩展软件 250澳大利亚EBI 扩展软件 500澳大利亚EBI 扩展软件 750澳大利亚EBI 扩展软件 1000澳大利亚EBI 扩展软件 1250澳大利亚EBI 扩展软件 1500澳大利亚EBI 扩展软件 1750澳大利亚EBI 扩展软件 2000澳大利亚EBI 扩展软件 2750澳大利亚EBI 扩展软件 3000澳大利亚EBI 扩展软件 3250澳大利亚EBI 扩展软件 3500澳大利亚EBI 扩展软件 3750澳大利亚EBI 扩展软件 4000澳大利亚EBI 扩展软件 4250澳大利亚EBI 扩展软件 4500澳大利亚EBI 扩展软件 5000澳大利亚BA服务器附件功能软件EBI-OPDASPTS数据点分布式数据库构架软件许可澳大利亚EBI-OPALMPAG报警传护软件许可澳大利亚EBI-OPWEBTL Web Toolkit澳大利亚EBI-OPWEBPCTL Web Point Control澳大利亚工作站附件软件EBI-XXCAL附件的一个浏览器工作站软件许可澳大利亚开放式软件许可EBI-IFXLDIR Excel 5000 interface license (scantask)澳大利亚EBI-IFBACDIRCL Bacnet 客户端软件许可澳大利亚EBI-SVBACNET Bacnet 服务器软件许可澳大利亚EBI-IFOPCCL OPC 客户端软件许可澳大利亚EBI-SVOPCDAS OPC 服务器软件许可澳大利亚SWEBI-IFMODIC MODBUS 接口软件许可澳大利亚XL5000 C-BUS通讯接口Q7055A1007BNA-1C，C-Bus-网络通讯卡 (1条C-Bus)德国Q7055A1015BNA-2CS，C-Bus-网络通讯卡 (2条C-Bus)德国直接数字控制器XL800控制器。

AUX-0025用户手册

Audio analyzers are generally designed to have broad measurement bandwidths, broader than a typical audio circuit or system and much wider than the audio passband. Such designs enable accurate analysis of fast, high-performance audio circuits and also allow measurement of any low-level high-frequency spurious signals that may accompany the audio signal.
This design philosophy is based on the assumption that the audio signal and its overtones are the dominant signal components applied to the analyzer; this is the case for the output of conventional audio power amplifiers of Class A or Class AB design. In such a case the analyzer can range its circuits to the amplitude of the audio signal for optimum measurement conditions.
A Switching Amplifier by any name... . . . . . . . . . . . . . . . . 2 Features of the AUX-0025 . . . . . . . . . . . . . . . . . . . . . . . 3

圆二色谱仪chirscan参数

圆二色谱仪chirscan参数全文共四篇示例，供读者参考第一篇示例：圆二色谱仪（Circular Dichroism Spectrometer，简称CD）是一种用于研究物质的圆二色性质的仪器。

圆二色性是指物质在吸收圆偏振光时所表现出的不对称吸收现象，可以提供关于分子结构、构象和手性等信息。

Chirascan是一款由Applied Photophysics公司（APC）推出的CD仪器，具有高灵敏度、高分辨率和广泛的应用范围。

Chirascan是一款便携式的圆二色谱仪，它可以实现快速、准确地测量生物分子、生物大分子和其他有机小分子的圆二色谱谱图。

Chirascan具有以下主要参数：1.波长范围：Chirascan能够在175nm至900nm的波长范围内进行测量，覆盖了紫外到可见光区域，可以满足不同光学活性化合物的测量需求。

2.分辨率：Chirascan具有高分辨率的优点，使得用户可以在光学活性化合物的吸收光谱中清晰地观察到特征峰和特征谷，从而准确分析样品的立体结构和手性信息。

3.灵敏度：Chirascan在测量过程中具有高灵敏度，可以探测到微量的光学活性物质，即使在低浓度下也可以获得可靠的数据。

4.自动化功能：Chirascan具有智能化的数据采集和分析软件，可以实现自动测量、自动校准和自动计算参数等功能，为用户提供便捷、快速的操作体验。

5.温控功能：Chirascan具有温控功能，可以在不同温度下进行测量，研究物质的热力学性质和温度对其圆二色性质的影响。

6.多种测量模式：Chirascan支持多种测量模式，包括扫描模式、定点模式、动力学扫描模式等，可以满足不同用户的测量需求。

Chirascan是一款功能强大、性能稳定的圆二色谱仪，广泛应用于生物医药、生物化学、药物研发、食品安全等领域。

它不仅可以帮助科研人员深入理解生物大分子的结构和功能，还可以为药物设计和合成提供重要信息。

随着科技的不断发展，Chirascan将在更多领域展现其应用潜力，为科学研究和产业发展做出更大贡献。

Scancode Map的妙用,按键随意变换

Scancode Map的妙用,按键随意变换！2009-09-29 21:41为了正确设置，我们有必要先了解一下“Scancode Map”(扫描码映射)。

“Scancode Map”是注册表中[HKEY_LOCAL_MacHINE\SYSTEM\CurrentControlSet\Control\Keyboard Layout]中的一个二进制键值(默认没有，需新建)，并且有固定的格式。

Scancode Map 代码的一般格式是：“hex:00,00,00,00,00,00,00,00,|02|,00,00,00,|映射之后的扫描码（XX XX）,原扫描码(XXXX)|00,00,00,00”。

其含义为：前8个00(DWord两个0)是版本号和头部字节，接下来的“02”表示映射数，其最小为值为“02”，表示只映射一组（这里的数值是映射数目加上末尾用作结尾的“00，00，00，00”，因此总是比实际的映射数目大一），若要映射多组，只需增加相应的值即可，如映射2组其值应为“03”,3组为“04”。

后边代码每4个是一组：前两个是映射后键位的扫描码，后两个是键位原扫描码。

如果要交换两个键，则一个有两组映射，四个值的排列形式是：键A，键B，键B，键A——它表示：键A成为键B，键B成为键A。

最后以“00,00,00,00” 结尾。

了解了“Scancode Map”之后，我们就可以来利用添加功能键了。

比如WIN键扫描码为：“E0 5B”，Esc为“00 01”，左边的Ctrl为“00 1D”，更详细的扫描码请见键盘扫描码。

5、重启你的电脑后，你的改变就生效了。

6、也可以用将下面的文本存成“scancode.reg”，双击导入注册表。

键值可通过查上面提到的键位表查询，找到你要替换的 Scan Code码，把##,##替换掉就可以了。

Windows Registry Editor Version 5.00[HKEY_LOCAL_MACHINE\SYSTEM\CurrentControlSet\Control\Keyboard Layout]"Scancode Map"=hex:00,00,00,00,00,00,00,00,02,00,00,00,##,##,##,##,00,00,00,007、举例：比如说我们想把F9，F10键修改成为音量调整键，通过查表，可以得知：F9、F10扫描码分别为(00，43)、(00,44),Volume Up、Volume Down的扫描码分别为(E0，30)、(E0,2E)，这样只要将Scancode 设置为如下就可以了："ScancodeMap"=hex:00,00,00,00,00,00,00,00,03,00,00,00,30,E0,43,00,2E,E0,44,00,00,00,00,00 含义为： | 版本号和头部字节 | 两组映射 | 第一组 | 第二组 | 结尾终止 |注意：在注册表中输入时，需要将扫描码的高低字节交换一下。

柯尼卡美能达C250故障代码讲解

柯尼卡美能达C250/252/300/352彩色复印机常见代码C3451,定影加热辊预热故障C3452,定影压力辊加热故障C3851,加热辊异常低温C3852,压力辊异常低温C3751,加热辊异常高温C3752,压力辊异常高温C2551,青色TCR感应器检测到异常低的碳粉浓度C2552,青色TCR感应器检测到异常高的碳粉浓度C2553,红色TCR感应器检测到异常低的碳粉浓度C2554,红色TCR感应器检测到异常高的碳粉浓度C2555,黄色TCR感应器检测到异常低的碳粉浓度C2556,黄色TCR感应器检测到异常高的碳粉浓度C2557,黑色TCR感应器检测到异常低的碳粉浓度C2558,黑色TCR感应器检测到异常高的碳粉浓度C2559,青色TCR感应器调整故障C255A红色TCR感应器调整故障C255B黄色TCR感应器调整故障C255C黑色TCR感应器调整故障C2451,新转印清洁器复位故障C3461新定影部件复位故障C2651.青色成像部件EEPROM访问故障--建议更换硒鼓或EEPROM C2652,红色成像部件EEPROM访问故障--建议更换硒鼓或EEPROM C2653,黄色成像部件EEPROM访问故障--建议更换硒鼓或EEPROMC2654,黑色成像部件EEPROM访问故障--建议更换硒鼓或EEPROMC2A01.青色碳粉盒EEPROM访问故障--建议更换碳粉盒或EEPROMC2A02,红色碳粉盒EEPROM访问故障--建议更换碳粉盒或EEPROMC2A03,黄色碳粉盒EEPROM访问故障--建议更换碳粉盒或EEPROMC2A04,黑色碳粉盒EEPROM访问故障--建议更换碳粉盒或EEPROM二：柯尼卡美能达C350/450彩色复印机的一些常见故障代码以下我将这些机器的常见故障代码列出来供大家参考C0200，青色PC感光鼓充电电晕故障--充电座需要维修更换C0202，红色PC感光鼓充电电晕故障--充电座需要维修更换C0204，黄色PC感光鼓充电电晕故障--充电座需要维修更换C0206，黑色PC感光鼓充电电晕故障--充电座需要维修更换C0208，PC感光鼓充电电晕故障--充电座需要维修更换C0500, 定影加热辊预热故障C0501, 定影压力辊加热故障C0510, 加热辊异常低温C0511, 压力辊异常低温C0520, 加热辊异常高温C0521, 压力辊异常高温C0F30, 青色ATDC感应器检测到异常低的碳粉浓度C0F31, 青色ATDC感应器检测到异常高的碳粉浓度C0F32, 红色ATDC感应器检测到异常低的碳粉浓度C0F33, 红色ATDC感应器检测到异常高的碳粉浓度C0F34, 黄色ATDC感应器检测到异常低的碳粉浓度C0F35, 黄色ATDC感应器检测到异常高的碳粉浓度C0F36, 黑色ATDC感应器检测到异常低的碳粉浓度C0F37, 黑色ATDC 感应器检测到异常高的碳粉浓度C0F3A, 青色ATDC 感应器调整故障C0F3B ，红色ATDC 感应器调整故障C0F3C ，黄色ATDC 感应器调整故障C0F3D ，黑色ATDC 感应器调整故障C13C8, 新转印清洁器复位故障C13CA ，新定影部件复位故障C13D1. 青色成像部件EEPROM 访问故障--建议更换硒鼓或EEPROM C13D2, 红色成像部件EEPROM 访问故障--建议更换硒鼓或EEPROM C13D3, 黄色成像部件EEPROM 访问故障--建议更换硒鼓或EEPROM 柯尼卡美能达bizhub 250/350故障代码列表有关选购件故障休码的详细信息，请参阅相关选购件的维修手册代码项目说明等级C001 LCT 通讯失败 B C0202 纸盒1升降故障即使纸盒的纸张提升操作开始后已经过了指定时间提升感应器仍未导通。

虹光扫描仪错误类型及诊断

错误代码错误报告791扫描仪固定装置失败251error:251注册注册码错误153error:153Err1=Can not find scanner.（找不到扫描仪）Err2=Scanner R/W test failed.（扫描仪读写错误）Err3=Scanner connection failed.（扫描仪连接失败）Err4=Scanner RAM test failed.（扫描仪随机存储器测试失败）Err5=Scanner RAM test failed.（扫描仪随机存储器测试失败）Err6=Scanner DMA test/power cable failed.（扫描仪直接存储器测试/电缆线失败）Err7=Calibration failed.（校准失败）Err8=Scanner internel error.Err9=Paper feed error.（进纸失败）Err10=Sensor error. Unlock the scanner by turning the scanner lock to the Use position.（ Err11=Transparency calibration error.（透明校准错误）101 Power off or Cable failure.（电源光闪或电缆故障）102 Please remove shipping retainer.（请运行固定器）103 Paper Jam.（卡纸）104 ADF Cover Open.（ADF盖打开）105 No paper in Auto Document Feeder.（没放纸）106 Job separation sheet detected.107 Can't find transparency kit.（找不到透明工具箱？）108 Transparency it switch is off.109 Internal Target Failure.110 Fuse blown.（保险丝断）111 Fuse blown.（保险丝断）112 Fuse blown.（保险丝断）113 Fuse blown.（保险丝断）114 Mechanial system failure.115 Optical system failure.（光学系统错误）116 Illegal Scanner parameter.（扫描仪参数错误）117 Illegal Scanner parameter.（扫描仪参数错误）118 Illegal Scanner parameter.（扫描仪参数错误）119 Illegal Scanner parameter.（扫描仪参数错误）120 Illegal Scanner parameter.（扫描仪参数错误）121 Message Error.（信息错误）122 Image transfer error.（图像传输失败）123 Unknow error reason.（不明错误）124 No ASPI managers were found.（找不到ASPI）125 Can't find SCSI ASPI.（找不到SCSI ASPI）126 An ASPI manager which does not support windows is resident.127 Memory is not enough.（内存不足）128 Can't find winaspi.dll or wnaspi32.dll.（找不到winaspi.dll or wnaspi32.dll.文件）129 Can't find scanner.（找不到扫描仪）130 Can't initialize SCSI mamager.（SCSI卡初始化失败）131 Time out（时间到）132 Scan head positioning error.Err150=Driver Busy.（驱动忙碌）Err151=Parameter Check Error.（参数检查失败）Err152=Allocate Memory Failed.（内存分配失败）Err153=Driver Initial Failed.（驱动初始化失败）Err154=Scanner internel error.Err155=Scanner Connect Failed.（扫描仪连接失败）Err156=Start Read Image Error.（开始读取图像失败）Err157=Read Image Error.（读取图像失败）Err158=End Image Error.Err159=Read Abort. For push stop button. AP/TWAIN driver don't care this driver Caller don't care this errcodeErr160=Driver Initial Failed.（驱动初始化失败）Err161=Send Scanner Parameter Failed.（发送扫描仪参数失败）Err162=Scanner Busy.（系统忙碌）Err163=Send Command Error.（发送命令错误）Err164=Scanner Warm up.（扫描仪预热）Err165=PowerOff.（电源关闭）Err166=Firmware is disappear.（F/W失败）Err167=IO port is busy.（IO端口忙碌）Err170=Parallel Not Found.Err171=Scanner Connect Failed.（扫描仪连接失败）Err172=Scanner Connect Failed.（扫描仪连接失败）Err173=Scanner Connect Failed.（扫描仪连接失败）Err174=Scanner Initial Failed.（扫描仪初始化失败）Err175=Scanner Initial Failed.（扫描仪初始化失败）Err176=Back to Home Position Failed.Err177=Search Start Position Error（寻找起始位置出错）Err178=Can't lamp on.（找不到灯源）Err179=Scanner lock error.（扫描仪锁失败）Err250=System Error.（系统错误）Err251=Driver Internal Error. error unknow（驱动内部错误，未知错误）原因解决方案备注没有打开保护锁或扫描头卡死解锁、送维修站系统受防火墙限制关闭防火墙。

jstd035声学扫描

JOINT INDUSTRY STANDARDAcoustic Microscopy for Non-HermeticEncapsulatedElectronicComponents IPC/JEDEC J-STD-035APRIL1999Supersedes IPC-SM-786 Supersedes IPC-TM-650,2.6.22Notice EIA/JEDEC and IPC Standards and Publications are designed to serve thepublic interest through eliminating misunderstandings between manufacturersand purchasers,facilitating interchangeability and improvement of products,and assisting the purchaser in selecting and obtaining with minimum delaythe proper product for his particular need.Existence of such Standards andPublications shall not in any respect preclude any member or nonmember ofEIA/JEDEC or IPC from manufacturing or selling products not conformingto such Standards and Publications,nor shall the existence of such Standardsand Publications preclude their voluntary use by those other than EIA/JEDECand IPC members,whether the standard is to be used either domestically orinternationally.Recommended Standards and Publications are adopted by EIA/JEDEC andIPC without regard to whether their adoption may involve patents on articles,materials,or processes.By such action,EIA/JEDEC and IPC do not assumeany liability to any patent owner,nor do they assume any obligation whateverto parties adopting the Recommended Standard or ers are alsowholly responsible for protecting themselves against all claims of liabilities forpatent infringement.The material in this joint standard was developed by the EIA/JEDEC JC-14.1Committee on Reliability Test Methods for Packaged Devices and the IPCPlastic Chip Carrier Cracking Task Group(B-10a)The J-STD-035supersedes IPC-TM-650,Test Method2.6.22.For Technical Information Contact:Electronic Industries Alliance/ JEDEC(Joint Electron Device Engineering Council)2500Wilson Boulevard Arlington,V A22201Phone(703)907-7560Fax(703)907-7501IPC2215Sanders Road Northbrook,IL60062-6135 Phone(847)509-9700Fax(847)509-9798Please use the Standard Improvement Form shown at the end of thisdocument.©Copyright1999.The Electronic Industries Alliance,Arlington,Virginia,and IPC,Northbrook,Illinois.All rights reserved under both international and Pan-American copyright conventions.Any copying,scanning or other reproduction of these materials without the prior written consent of the copyright holder is strictly prohibited and constitutes infringement under the Copyright Law of the United States.IPC/JEDEC J-STD-035Acoustic Microscopyfor Non-Hermetic EncapsulatedElectronicComponentsA joint standard developed by the EIA/JEDEC JC-14.1Committee on Reliability Test Methods for Packaged Devices and the B-10a Plastic Chip Carrier Cracking Task Group of IPCUsers of this standard are encouraged to participate in the development of future revisions.Contact:EIA/JEDEC Engineering Department 2500Wilson Boulevard Arlington,V A22201 Phone(703)907-7500 Fax(703)907-7501IPC2215Sanders Road Northbrook,IL60062-6135 Phone(847)509-9700Fax(847)509-9798ASSOCIATION CONNECTINGELECTRONICS INDUSTRIESAcknowledgmentMembers of the Joint IPC-EIA/JEDEC Moisture Classiﬁcation Task Group have worked to develop this document.We would like to thank them for their dedication to this effort.Any Standard involving a complex technology draws material from a vast number of sources.While the principal members of the Joint Moisture Classiﬁcation Working Group are shown below,it is not possible to include all of those who assisted in the evolution of this Standard.To each of them,the mem-bers of the EIA/JEDEC and IPC extend their gratitude.IPC Packaged Electronic Components Committee ChairmanMartin FreedmanAMP,Inc.IPC Plastic Chip Carrier Cracking Task Group,B-10a ChairmanSteven MartellSonoscan,Inc.EIA/JEDEC JC14.1CommitteeChairmanJack McCullenIntel Corp.EIA/JEDEC JC14ChairmanNick LycoudesMotorolaJoint Working Group MembersCharlie Baker,TIChristopher Brigham,Hi/FnRalph Carbone,Hewlett Packard Co. Don Denton,TIMatt Dotty,AmkorMichele J.DiFranza,The Mitre Corp. Leo Feinstein,Allegro Microsystems Inc.Barry Fernelius,Hewlett Packard Co. Chris Fortunko,National Institute of StandardsRobert J.Gregory,CAE Electronics, Inc.Curtis Grosskopf,IBM Corp.Bill Guthrie,IBM Corp.Phil Johnson,Philips Semiconductors Nick Lycoudes,MotorolaSteven R.Martell,Sonoscan Inc. Jack McCullen,Intel Corp.Tom Moore,TIDavid Nicol,Lucent Technologies Inc.Pramod Patel,Advanced Micro Devices Inc.Ramon R.Reglos,XilinxCorazon Reglos,AdaptecGerald Servais,Delphi Delco Electronics SystemsRichard Shook,Lucent Technologies Inc.E.Lon Smith,Lucent Technologies Inc.Randy Walberg,NationalSemiconductor Corp.Charlie Wu,AdaptecEdward Masami Aoki,HewlettPackard LaboratoriesFonda B.Wu,Raytheon Systems Co.Richard W.Boerdner,EJE ResearchVictor J.Brzozowski,NorthropGrumman ES&SDMacushla Chen,Wus Printed CircuitCo.Ltd.Jeffrey C.Colish,Northrop GrummanCorp.Samuel J.Croce,Litton AeroProducts DivisionDerek D-Andrade,Surface MountTechnology CentreRao B.Dayaneni,Hewlett PackardLaboratoriesRodney Dehne,OEM WorldwideJames F.Maguire,Boeing Defense&Space GroupKim Finch,Boeing Defense&SpaceGroupAlelie Funcell,Xilinx Inc.Constantino J.Gonzalez,ACMEMunir Haq,Advanced Micro DevicesInc.Larry A.Hargreaves,DC.ScientiﬁcInc.John T.Hoback,Amoco ChemicalCo.Terence Kern,Axiom Electronics Inc.Connie M.Korth,K-Byte/HibbingManufacturingGabriele Marcantonio,NORTELCharles Martin,Hewlett PackardLaboratoriesRichard W.Max,Alcatel NetworkSystems Inc.Patrick McCluskey,University ofMarylandJames H.Moffitt,Moffitt ConsultingServicesRobert Mulligan,Motorola Inc.James E.Mumby,CibaJohn Northrup,Lockheed MartinCorp.Dominique K.Numakura,LitchﬁeldPrecision ComponentsNitin B.Parekh,Unisys Corp.Bella Poborets,Lucent TechnologiesInc.D.Elaine Pope,Intel Corp.Ray Prasad,Ray Prasad ConsultancyGroupAlbert Puah,Adaptec Inc.William Sepp,Technic Inc.Ralph W.Taylor,Lockheed MartinCorp.Ed R.Tidwell,DSC CommunicationsCorp.Nick Virmani,Naval Research LabKen Warren,Corlund ElectronicsCorp.Yulia B.Zaks,Lucent TechnologiesInc.IPC/JEDEC J-STD-035April1999 iiTable of Contents1SCOPE (1)2DEFINITIONS (1)2.1A-mode (1)2.2B-mode (1)2.3Back-Side Substrate View Area (1)2.4C-mode (1)2.5Through Transmission Mode (2)2.6Die Attach View Area (2)2.7Die Surface View Area (2)2.8Focal Length(FL) (2)2.9Focus Plane (2)2.10Leadframe(L/F)View Area (2)2.11Reﬂective Acoustic Microscope (2)2.12Through Transmission Acoustic Microscope (2)2.13Time-of-Flight(TOF) (3)2.14Top-Side Die Attach Substrate View Area (3)3APPARATUS (3)3.1Reﬂective Acoustic Microscope System (3)3.2Through Transmission AcousticMicroscope System (4)4PROCEDURE (4)4.1Equipment Setup (4)4.2Perform Acoustic Scans..........................................4Appendix A Acoustic Microscopy Defect CheckSheet (6)Appendix B Potential Image Pitfalls (9)Appendix C Some Limitations of AcousticMicroscopy (10)Appendix D Reference Procedure for PresentingApplicable Scanned Data (11)FiguresFigure1Example of A-mode Display (1)Figure2Example of B-mode Display (1)Figure3Example of C-mode Display (2)Figure4Example of Through Transmission Display (2)Figure5Diagram of a Reﬂective Acoustic MicroscopeSystem (3)Figure6Diagram of a Through Transmission AcousticMicroscope System (3)April1999IPC/JEDEC J-STD-035iiiIPC/JEDEC J-STD-035April1999This Page Intentionally Left BlankivApril1999IPC/JEDEC J-STD-035 Acoustic Microscopy for Non-Hermetic EncapsulatedElectronic Components1SCOPEThis test method deﬁnes the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic com-ponents.This method provides users with an acoustic microscopy processﬂow for detecting defects non-destructively in plastic packages while achieving reproducibility.2DEFINITIONS2.1A-mode Acoustic data collected at the smallest X-Y-Z region deﬁned by the limitations of the given acoustic micro-scope.An A-mode display contains amplitude and phase/polarity information as a function of time ofﬂight at a single point in the X-Y plane.See Figure1-Example of A-mode Display.IPC-035-1 Figure1Example of A-mode Display2.2B-mode Acoustic data collected along an X-Z or Y-Z plane versus depth using a reﬂective acoustic microscope.A B-mode scan contains amplitude and phase/polarity information as a function of time ofﬂight at each point along the scan line.A B-mode scan furnishes a two-dimensional(cross-sectional)description along a scan line(X or Y).See Figure2-Example of B-mode Display.IPC-035-2 Figure2Example of B-mode Display(bottom half of picture on left)2.3Back-Side Substrate View Area(Refer to Appendix A,Type IV)The interface between the encapsulant and the back of the substrate within the outer edges of the substrate surface.2.4C-mode Acoustic data collected in an X-Y plane at depth(Z)using a reﬂective acoustic microscope.A C-mode scan contains amplitude and phase/polarity information at each point in the scan plane.A C-mode scan furnishes a two-dimensional(area)image of echoes arising from reﬂections at a particular depth(Z).See Figure3-Example of C-mode Display.1IPC/JEDEC J-STD-035April1999IPC-035-3 Figure3Example of C-mode Display2.5Through Transmission Mode Acoustic data collected in an X-Y plane throughout the depth(Z)using a through trans-mission acoustic microscope.A Through Transmission mode scan contains only amplitude information at each point in the scan plane.A Through Transmission scan furnishes a two-dimensional(area)image of transmitted ultrasound through the complete thickness/depth(Z)of the sample/component.See Figure4-Example of Through Transmission Display.IPC-035-4 Figure4Example of Through Transmission Display2.6Die Attach View Area(Refer to Appendix A,Type II)The interface between the die and the die attach adhesive and/or the die attach adhesive and the die attach substrate.2.7Die Surface View Area(Refer to Appendix A,Type I)The interface between the encapsulant and the active side of the die.2.8Focal Length(FL)The distance in water at which a transducer’s spot size is at a minimum.2.9Focus Plane The X-Y plane at a depth(Z),which the amplitude of the acoustic signal is maximized.2.10Leadframe(L/F)View Area(Refer to Appendix A,Type V)The imaged area which extends from the outer L/F edges of the package to the L/F‘‘tips’’(wedge bond/stitch bond region of the innermost portion of the L/F.)2.11Reflective Acoustic Microscope An acoustic microscope that uses one transducer as both the pulser and receiver. (This is also known as a pulse/echo system.)See Figure5-Diagram of a Reﬂective Acoustic Microscope System.2.12Through Transmission Acoustic Microscope An acoustic microscope that transmits ultrasound completely through the sample from a sending transducer to a receiver on the opposite side.See Figure6-Diagram of a Through Transmis-sion Acoustic Microscope System.2April1999IPC/JEDEC J-STD-0353IPC/JEDEC J-STD-035April1999 3.1.6A broad band acoustic transducer with a center frequency in the range of10to200MHz for subsurface imaging.3.2Through Transmission Acoustic Microscope System(see Figure6)comprised of:3.2.1Items3.1.1to3.1.6above3.2.2Ultrasonic pulser(can be a pulser/receiver as in3.1.1)3.2.3Separate receiving transducer or ultrasonic detection system3.3Reference packages or standards,including packages with delamination and packages without delamination,for use during equipment setup.3.4Sample holder for pre-positioning samples.The holder should keep the samples from moving during the scan and maintain planarity.4PROCEDUREThis procedure is generic to all acoustic microscopes.For operational details related to this procedure that apply to a spe-ciﬁc model of acoustic microscope,consult the manufacturer’s operational manual.4.1Equipment Setup4.1.1Select the transducer with the highest useable ultrasonic frequency,subject to the limitations imposed by the media thickness and acoustic characteristics,package conﬁguration,and transducer availability,to analyze the interfaces of inter-est.The transducer selected should have a low enough frequency to provide a clear signal from the interface of interest.The transducer should have a high enough frequency to delineate the interface of interest.Note:Through transmission mode may require a lower frequency and/or longer focal length than reﬂective mode.Through transmission is effective for the initial inspection of components to determine if defects are present.4.1.2Verify setup with the reference packages or standards(see3.3above)and settings that are appropriate for the trans-ducer chosen in4.1.1to ensure that the critical parameters at the interface of interest correlate to the reference standard uti-lized.4.1.3Place units in the sample holder in the coupling medium such that the upper surface of each unit is parallel with the scanning plane of the acoustic transducer.Sweep air bubbles away from the unit surface and from the bottom of the trans-ducer head.4.1.4At aﬁxed distance(Z),align the transducer and/or stage for the maximum reﬂected amplitude from the top surface of the sample.The transducer must be perpendicular to the sample surface.4.1.5Focus by maximizing the amplitude,in the A-mode display,of the reﬂection from the interface designated for imag-ing.This is done by adjusting the Z-axis distance between the transducer and the sample.4.2Perform Acoustic Scans4.2.1Inspect the acoustic image(s)for any anomalies,verify that the anomaly is a package defect or an artifact of the imaging process,and record the results.(See Appendix A for an example of a check sheet that may be used.)To determine if an anomaly is a package defect or an artifact of the imaging process it is recommended to analyze the A-mode display at the location of the anomaly.4.2.2Consider potential pitfalls in image interpretation listed in,but not limited to,Appendix B and some of the limita-tions of acoustic microscopy listed in,but not limited to,Appendix C.If necessary,make adjustments to the equipment setup to optimize the results and rescan.4April1999IPC/JEDEC J-STD-035 4.2.3Evaluate the acoustic images using the failure criteria speciﬁed in other appropriate documents,such as J-STD-020.4.2.4Record the images and theﬁnal instrument setup parameters for documentation purposes.An example checklist is shown in Appendix D.5IPC/JEDEC J-STD-035April19996April1999IPC/JEDEC J-STD-035Appendix AAcoustic Microscopy Defect Check Sheet(continued)CIRCUIT SIDE SCANImage File Name/PathDelamination(Type I)Die Circuit Surface/Encapsulant Number Affected:Average%Location:Corner Edge Center (Type II)Die/Die Attach Number Affected:Average%Location:Corner Edge Center (Type III)Encapsulant/Substrate Number Affected:Average%Location:Corner Edge Center (Type V)Interconnect tip Number Affected:Average%Interconnect Number Affected:Max.%Length(Type VI)Intra-Laminate Number Affected:Average%Location:Corner Edge Center Comments:CracksAre cracks present:Yes NoIf yes:Do any cracks intersect:bond wire ball bond wedge bond tab bump tab leadDoes crack extend from leadﬁnger to any other internal feature:Yes NoDoes crack extend more than two-thirds the distance from any internal feature to the external surfaceof the package:Yes NoAdditional veriﬁcation required:Yes NoComments:Mold Compound VoidsAre voids present:Yes NoIf yes:Approx.size Location(if multiple voids,use comment section)Do any voids intersect:bond wire ball bond wedge bond tab bump tab lead Additional veriﬁcation required:Yes NoComments:7IPC/JEDEC J-STD-035April1999Appendix AAcoustic Microscopy Defect Check Sheet(continued)NON-CIRCUIT SIDE SCANImage File Name/PathDelamination(Type IV)Encapsulant/Substrate Number Affected:Average%Location:Corner Edge Center (Type II)Substrate/Die Attach Number Affected:Average%Location:Corner Edge Center (Type V)Interconnect Number Affected:Max.%LengthLocation:Corner Edge Center (Type VI)Intra-Laminate Number Affected:Average%Location:Corner Edge Center (Type VII)Heat Spreader Number Affected:Average%Location:Corner Edge Center Additional veriﬁcation required:Yes NoComments:CracksAre cracks present:Yes NoIf yes:Does crack extend more than two-thirds the distance from any internal feature to the external surfaceof the package:Yes NoAdditional veriﬁcation required:Yes NoComments:Mold Compound VoidsAre voids present:Yes NoIf yes:Approx.size Location(if multiple voids,use comment section)Additional veriﬁcation required:Yes NoComments:8Appendix BPotential Image PitfallsOBSERV ATIONS CAUSES/COMMENTSUnexplained loss of front surface signal Gain setting too lowSymbolization on package surfaceEjector pin knockoutsPin1and other mold marksDust,air bubbles,ﬁngerprints,residueScratches,scribe marks,pencil marksCambered package edgeUnexplained loss of subsurface signal Gain setting too lowTransducer frequency too highAcoustically absorbent(rubbery)ﬁllerLarge mold compound voidsPorosity/high concentration of small voidsAngled cracks in package‘‘Dark line boundary’’(phase cancellation)Burned molding compound(ESD/EOS damage)False or spotty indication of delamination Low acoustic impedance coating(polyimide,gel)Focus errorIncorrect delamination gate setupMultilayer interference effectsFalse indication of adhesion Gain set too high(saturation)Incorrect delamination gate setupFocus errorOverlap of front surface and subsurface echoes(transducerfrequency too low)Fluidﬁlling delamination areasApparent voiding around die edge Reﬂection from wire loopsIncorrect setting of void gateGraded intensity Die tilt or lead frame deformation Sample tiltApril1999IPC/JEDEC J-STD-0359Appendix CSome Limitations of Acoustic MicroscopyAcoustic microscopy is an analytical technique that provides a non-destructive method for examining plastic encapsulated components for the existence of delaminations,cracks,and voids.This technique has limitations that include the following: LIMITATION REASONAcoustic microscopy has difficulty inﬁnding small defects if the package is too thick.The ultrasonic signal becomes more attenuated as a function of two factors:the depth into the package and the transducer fre-quency.The greater the depth,the greater the attenuation.Simi-larly,the higher the transducer frequency,the greater the attenu-ation as a function of depth.There are limitations on the Z-axis(axial)resolu-tion.This is a function of the transducer frequency.The higher the transducer frequency,the better the resolution.However,the higher frequency signal becomes attenuated more quickly as a function of depth.There are limitations on the X-Y(lateral)resolu-tion.The X-Y(lateral)resolution is a function of a number of differ-ent variables including:•Transducer characteristics,including frequency,element diam-eter,and focal length•Absorption and scattering of acoustic waves as a function of the sample material•Electromechanical properties of the X-Y stageIrregularly shaped packages are difficult to analyze.The technique requires some kind ofﬂat reference surface.Typically,the upper surface of the package or the die surfacecan be used as references.In some packages,cambered packageedges can cause difficulty in analyzing defects near the edgesand below their surfaces.Edge Effect The edges cause difficulty in analyzing defects near the edge ofany internal features.IPC/JEDEC J-STD-035April1999 10April1999IPC/JEDEC J-STD-035Appendix DReference Procedure for Presenting Applicable Scanned DataMost of the settings described may be captured as a default for the particular supplier/product with speciﬁc changes recorded on a sample or lot basis.Setup Conﬁguration(Digital Setup File Name and Contents)Calibration Procedure and Calibration/Reference Standards usedTransducerManufacturerModelCenter frequencySerial numberElement diameterFocal length in waterScan SetupScan area(X-Y dimensions)Scan step sizeHorizontalVerticalDisplayed resolutionHorizontalVerticalScan speedPulser/Receiver SettingsGainBandwidthPulseEnergyRepetition rateReceiver attenuationDampingFilterEcho amplitudePulse Analyzer SettingsFront surface gate delay relative to trigger pulseSubsurface gate(if used)High passﬁlterDetection threshold for positive oscillation,negative oscillationA/D settingsSampling rateOffset settingPer Sample SettingsSample orientation(top or bottom(ﬂipped)view and location of pin1or some other distinguishing characteristic) Focus(point,depth,interface)Reference planeNon-default parametersSample identiﬁcation information to uniquely distinguish it from others in the same group11IPC/JEDEC J-STD-035April1999Appendix DReference Procedure for Presenting Applicable Scanned Data(continued) Reference Procedure for Presenting Scanned DataImageﬁle types and namesGray scale and color image legend deﬁnitionsSigniﬁcance of colorsIndications or deﬁnition of delaminationImage dimensionsDepth scale of TOFDeviation from true aspect ratioImage type:A-mode,B-mode,C-mode,TOF,Through TransmissionA-mode waveforms should be provided for points of interest,such as delaminated areas.In addition,an A-mode image should be provided for a bonded area as a control.12Standard Improvement FormIPC/JEDEC J-STD-035The purpose of this form is to provide the Technical Committee of IPC with input from the industry regarding usage of the subject standard.Individuals or companies are invited to submit comments to IPC.All comments will be collected and dispersed to the appropriate committee(s).If you can provide input,please complete this form and return to:IPC2215Sanders RoadNorthbrook,IL 60062-6135Fax 847509.97981.I recommend changes to the following:Requirement,paragraph number Test Method number,paragraph numberThe referenced paragraph number has proven to be:Unclear Too RigidInErrorOther2.Recommendations forcorrection:3.Other suggestions for document improvement:Submitted by:Name Telephone Company E-mailAddress City/State/ZipDate ASSOCIATION CONNECTING ELECTRONICS INDUSTRIESASSOCIATION CONNECTINGELECTRONICS INDUSTRIESISBN#1-580982-28-X2215 Sanders Road, Northbrook, IL 60062-6135Tel. 847.509.9700 Fax 847.509.9798。

部分SCI期刊的全称,缩写及ISNN

"部分SCI期刊的全称,缩写及ISNN""Rec","Abbreviated Journal Title","ISNN","Full Journal Title"1,"AAPG BULL","0149-1423","aapg bulletin"2,"AAPS PHARMSCI","1522-1059","aaps pharmsci"3,"AA TCC REV","1532-8813","aatcc review"4,"ABDOM IMAGING","0942-8925","abdominal imaging"5,"ABH MATH SEM HAMBURG","0025-5858","abhandlungen aus dem mathematischen seminar der universitat hamburg"6,"ACAD EMERG MED","1069-6563","academic emergency medicine"7,"ACAD MED","1040-2446","academic medicine"8,"ACAD RADIOL","1076-6332","academic radiology"9,"ACCOUNTS CHEM RES","0001-4842","accounts of chemical research" 10,"ACCREDIT QUAL ASSUR","0949-1775","accreditation and quality assurance"11,"ACI MATER J","0889-325X","aci materials journal"12,"ACI STRUCT J","0889-3241","aci structural journal"13,"ACM COMPUT SURV","0360-0300","acm computing surveys"14,"ACM SIGPLAN NOTICES","0362-1340","acm sigplan notices"15,"ACM T COMPUT SYST","0734-2071","acm transactions on computer systems" 16,"ACM T DATABASE SYST","0362-5915","acm transactions on database systems" 17,"ACM T DES AUTOMAT EL","1084-4309","acm transactions on design automation of electronic systems"18,"ACM T GRAPHIC","0730-0301","acm transactions on graphics"19,"ACM T INFORM SYST","1046-8188","acm transactions on information systems" 20,"ACM T MA TH SOFTWARE","0098-3500","acm transactions on mathematical software" 21,"ACM T PROGR LANG SYS","0164-0925","acm transactions on programming languages and systems"22,"ACM T SOFTW ENG METH","1049-331X","acm transactions on software engineering and methodology"23,"ACOUST PHYS+","1063-7710","acoustical physics"24,"ACSMS HEALTH FIT J","1091-5397","acsms health & fitness journal"25,"ACTA ACUST UNITED AC","1610-1928"26,"ACTA AGR SCAND A-AN","0906-4702","acta agriculturae scandinavica section a-animal science"27,"ACTA AGR SCAND B-S P","0906-4710","acta agriculturae scandinavica section b-soil and plant science"28,"ACTA ALIMENT HUNG","0139-3006","acta alimentaria"29,"ACTA ANAESTH SCAND","0001-5172","acta anaesthesiologica scandinavica" 30,"ACTA APPL MATH","0167-8019","acta applicandae mathematicae"31,"ACTA ARITH","0065-1036","acta arithmetica"32,"ACTA ASTRONAUT","0094-5765","acta astronautica"33,"ACTA ASTRONOM","0001-5237","acta astronomica"34,"ACTA BIOCH BIOPH SIN","1672-9145"35,"ACTA BIOCHIM POL","0001-527X","acta biochimica polonica"36,"ACTA BIOL CRACOV BOT","0001-5296","acta biologica cracoviensia series botanica"37,"ACTA BIOL HUNG","0236-5383","acta biologica hungarica"38,"ACTA BIOQUIM CLIN L","0325-2957","acta bioquimica clinica latinoamericana" 39,"ACTA BIOTECHNOL","0138-4988","acta biotechnologica"40,"ACTA BIOTHEOR","0001-5342","acta biotheoretica"41,"ACTA BOT GALLICA","1253-8078","acta botanica gallica"42,"ACTA BOT SIN","1672-6650"43,"ACTA CARDIOL","0001-5385","acta cardiologica"44,"ACTA CHIM SINICA","0567-7351","acta chimica sinica"45,"ACTA CHIM SLOV","1318-0207","acta chimica slovenica"46,"ACTA CHIR BELG","0001-5458","acta chirurgica belgica"47,"ACTA CHIROPTEROL","1508-1109","acta chiropterologica"48,"ACTA CHROMATOGR","1233-2356"49,"ACTA CLIN BELG","0001-5512","acta clinica belgica"50,"ACTA CRYSTALLOGR A","0108-7673","acta crystallographica section a"51,"ACTA CRYSTALLOGR B","0108-7681","acta crystallographica section b-structural science" 52,"ACTA CRYSTALLOGR C","0108-2701","acta crystallographica section c-crystal structure communications"53,"ACTA CRYSTALLOGR D","0907-4449","acta crystallographica section d-biological crystallography"54,"ACTA CRYSTALLOGR E","1600-5368"55,"ACTA CYTOL","0001-5547","acta cytologica"56,"ACTA DERM-VENEREOL","0001-5555","acta dermato-venereologica"57,"ACTA DIABETOL","0940-5429","acta diabetologica"58,"ACTA GASTRO-ENT BELG","0001-5644","acta gastro-enterologica belgica" 59,"ACTA GEOL SIN-ENGL","1000-9515","acta geologica sinica-english edition" 60,"ACTA HAEMATOL-BASEL","0001-5792","acta haematologica"61,"ACTA HISTOCHEM","0065-1281","acta histochemica"62,"ACTA HISTOCHEM CYTOC","0044-5991","acta histochemica et cytochemica" 63,"ACTA HYDROCH HYDROB","0323-4320","acta hydrochimica et hydrobiologica" 64,"ACTA INFORM","0001-5903","acta informatica"65,"ACTA MA TER","1359-6454","acta materialia"66,"ACTA MA TH HUNG","0236-5294","acta mathematica hungarica"67,"ACTA MA TH SCI","0252-9602","acta mathematica scientia"68,"ACTA MA TH SIN","1439-8516","acta mathematica sinica-english series"69,"ACTA MA TH-DJURSHOLM","0001-5962","acta mathematica"70,"ACTA MECH","0001-5970","acta mechanica"71,"ACTA MECH SINICA","0567-7718","acta mechanica sinica"72,"ACTA MECH SOLIDA SIN","0894-9166","acta mechanica solida sinica"73,"ACTA MED AUST","0303-8173","acta medica austriaca"74,"ACTA MED OKAY AMA","0386-300X","acta medica okayama"75,"ACTA METALL SIN","0412-1961"76,"ACTA NEUROBIOL EXP","0065-1400","acta neurobiologiae experimentalis" 77,"ACTA NEUROCHIR","0001-6268","acta neurochirurgica"78,"ACTA NEUROL BELG","0300-9009","acta neurologica belgica"79,"ACTA NEUROL SCAND","0001-6314","acta neurologica scandinavica"80,"ACTA NEUROPA THOL","0001-6322","acta neuropathologica"81,"ACTA NEUROPSYCHIATR","0924-2708"82,"ACTA OBSTET GYN SCAN","0001-6349","acta obstetricia et gynecologica scandinavica" 83,"ACTA ODONTOL SCAND","0001-6357","acta odontologica scandinavica"84,"ACTA OECOL","1146-609X","acta oecologica-international journal of ecology" 85,"ACTA ONCOL","0284-186X","acta oncologica"86,"ACTA OPHTHALMOL SCAN","1395-3907","acta ophthalmologica scandinavica" 87,"ACTA ORTHOP SCAND","0001-6470","acta orthopaedica scandinavica"88,"ACTA OTO-LARYNGOL","0001-6489","acta oto-laryngologica"89,"ACTA PAEDIATR","0803-5253","acta paediatrica"90,"ACTA PALAEONTOL POL","0567-7920","acta palaeontologica polonica"91,"ACTA PARASITOL","1230-2821","acta parasitologica"92,"ACTA PETROL SIN","1000-0569","acta petrologica sinica"93,"ACTA PHARMACOL SIN","1671-4083","acta pharmacologica sinica"94,"ACTA PHYS HUNG NS-H","****-****","annual review of immunology"95,"ACTA PHYS POL A","0587-4246","acta physica polonica a"96,"ACTA PHYS POL B","0587-4254","acta physica polonica b"97,"ACTA PHYS SIN-CH ED","1000-3290","acta physica sinica"98,"ACTA PHYS SLOV ACA","0323-0465","acta physica slovaca"99,"ACTA PHYS-CHIM SIN","1000-6818","acta physico-chimica sinica"100,"ACTA PHYSIOL PLANT","0137-5881","acta physiologiae plantarum"101,"ACTA PHYSIOL SCAND","0001-6772","acta physiologica scandinavica"102,"ACTA POL YM SIN","1000-3304","acta polymerica sinica"103,"ACTA PROTOZOOL","0065-1583","acta protozoologica"104,"ACTA PSYCHIAT SCAND","0001-690X","acta psychiatrica scandinavica" 105,"ACTA RADIOL","0284-1851","acta radiologica"106,"ACTA SOC BOT POL","0001-6977","acta societatis botanicorum poloniae" 107,"ACTA THERIOL","0001-7051","acta theriologica"108,"ACTA TROP","0001-706X","acta tropica"109,"ACTA VET BRNO","0001-7213","acta veterinaria brno"110,"ACTA VET HUNG","0236-6290","acta veterinaria hungarica"111,"ACTA VET SCAND","0044-605X","acta veterinaria scandinavica"112,"ACTA VET-BEOGRAD","0567-8315","acta veterinaria-beograd"113,"ACTA VIROL","0001-723X","acta virologica"114,"ACTA ZOOL ACAD SCI H","1217-8837","acta zoologica academiae scientiarum hungaricae"115,"ACTA ZOOL-STOCKHOLM","0001-7272","acta zoologica"116,"ACTAS ESP PSIQUIA TRI","1139-9287","actas espanolas de psiquiatria" 117,"ACTUAL CHIMIQUE","0151-9093","actualite chimique"118,"ACUPUNCTURE ELECTRO","0360-1293","acupuncture & electro-therapeutics research" 119,"ADAPT PHYS ACT Q","0736-5829","adapted physical activity quarterly" 120,"ADDICT BIOL","1355-6215","addiction biology"121,"ADDICTION","0965-2140","addiction"122,"ADHES AGE","0001-821X","adhesives age"123,"ADSORPT SCI TECHNOL","0263-6174","adsorption science & technology" 124,"ADSORPTION","0929-5607","adsorption-journal of the international adsorption society" 125,"ADV AGRON","0065-2113","advances in agronomy"126,"ADV ANAT EMBRYOL CEL","0301-5556","advances in anatomy embryology and cell biology"127,"ADV ANAT PA THOL","1072-4109","advances in anatomic pathology"128,"ADV APPL MA TH","0196-8858","advances in applied mathematics"129,"ADV APPL MECH","0065-2156","advances in applied mechanics"130,"ADV APPL MICROBIOL","0065-2164","advances in applied microbiology" 131,"ADV APPL PROBAB","0001-8678","advances in applied probability"132,"ADV ATMOS SCI","0256-1530","advances in atmospheric sciences"133,"ADV ATOM MOL OPT PHY","0065-2199","advances in atomic molecular and optical physics"134,"ADV BIOPHYS","0065-227X"135,"ADV BOT RES","0065-2296","advances in botanical research incorporating advances in plant pathology"136,"ADV CANCER RES","0065-230X","advances in cancer research"137,"ADV CARBOHYD CHEM BI","0065-2318","advances in carbohydrate chemistry and biochemistry"138,"ADV CATAL","0360-0564","advances in catalysis"139,"ADV CEM RES","0951-7197","advances in cement research"140,"ADV CHROMATOGR","0065-2415","advances in chromatography"141,"ADV CHRONIC KIDNEY D","1548-5595"142,"ADV CLIN CHEM","0065-2423","advances in clinical chemistry"143,"ADV COLLOID INTERFAC","0001-8686","advances in colloid and interface science" 144,"ADV COMPOS LETT","0963-6935","advanced composites letters"145,"ADV COMPOS MA TER","0924-3046","advanced composite materials"146,"ADV COMPUT","0065-2458","advances in computers"147,"ADV COMPUT MA TH","1019-7168","advances in computational mathematics" 148,"ADV DRUG DELIVER REV","0169-409X","advanced drug delivery reviews" 149,"ADV ECOL RES","0065-2504","advances in ecological research"150,"ADV ENG INFORM","1474-0346"151,"ADV ENG MA TER","0935-9648","advanced materials"152,"ADV ENG SOFTW","0965-9978","advances in engineering software"153,"ADV ENVIRON RES","1093-0191","advances in environmental research"154,"ADV ENZYME REGUL","0065-2571","advances in enzyme regulation"155,"ADV EXP MED BIOL","0065-2598"156,"ADV FUNCT MATER","1616-301X","advanced functional materials"157,"ADV GENET","0065-2660","advances in genetics incorporating molecular genetic medicine"158,"ADV GEOM","1615-715X"159,"ADV GEOPHYS","0065-2687","advances in geophysics"160,"ADV HEALTH SCI EDUC","1382-4996"161,"ADV HETEROCYCL CHEM","0065-2725","advances in heterocyclic chemistry" 162,"ADV IMAG ELECT PHYS","1076-5670","advances in imaging and electron physics" 163,"ADV IMMUNOL","0065-2776","advances in immunology"164,"ADV INORG CHEM","0898-8838","#N/A"165,"ADV INSECT PHYSIOL","0065-2806","advances in insect physiology"166,"ADV MAR BIOL","0065-2881","advances in marine biology"167,"ADV MATER","0935-9648","advanced materials"168,"ADV MATER PROCESS","0882-7958","advanced materials & processes"169,"ADV MATH","0001-8708","advances in mathematics"170,"ADV MICROB PHYSIOL","0065-2911","advances in microbial physiology" 171,"ADV NEUROL","0091-3952","advances in neurology"172,"ADV NONLINEAR STUD","1536-1365"173,"ADV NUCL PHYS","0065-2970","advances in nuclear physics"174,"ADV NURS SCI","0161-9268","advances in nursing science"175,"ADV ORGANOMET CHEM","0065-3055","advances in organometallic chemistry" 176,"ADV PARASIT","0065-308X","advances in parasitology"177,"ADV PHYS","0001-8732","advances in physics"178,"ADV PHYS ORG CHEM","0065-3160","advances in physical organic chemistry" 179,"ADV PHYSIOL EDUC","1043-4046","advances in physiology education"180,"ADV POL YM SCI","0065-3195","advances in polymer science"181,"ADV POL YM TECH","0730-6679","advances in polymer technology"182,"ADV POWDER TECHNOL","0921-8831","advanced powder technology"183,"ADV PROTEIN CHEM","0065-3233","advances in protein chemistry"184,"ADV QUANTUM CHEM","0065-3276","advances in quantum chemistry"185,"ADV RENAL REPLACE TH","1073-4449","advances in renal replacement therapy" 186,"ADV ROBOTICS","0169-1864","advanced robotics"187,"ADV SPACE RES","0273-1177","advances in space research"188,"ADV STUD BEHA V","0065-3454","advances in the study of behavior"189,"ADV SYNTH CATAL","1615-4150","advanced synthesis & catalysis"190,"ADV THER","0741-238X","advances in therapy"191,"ADV VIRUS RES","0065-3527","advances in virus research"192,"ADV WATER RESOUR","0309-1708","advances in water resources" 193,"AERONAUT J","0001-9240","aeronautical journal"194,"AEROSOL SCI TECH","0278-6826","aerosol science and technology" 195,"AEROSP SCI TECHNOL","1270-9638","aerospace science and technology" 196,"AEROSPACE AM","0740-722X","aerospace america"197,"AESTHET PLAST SURG","0364-216X","aesthetic plastic surgery"198,"AEU-INT J ELECTRON C","1434-8411","aeu-international journal of electronics and communications"199,"AFINIDAD","0001-9704","afinidad"200,"AFR ENTOMOL","1021-3589","african entomology"201,"AFR J ECOL","0141-6707","african journal of ecology"202,"AFR J MAR SCI","1814-232X"203,"AFR ZOOL","1562-7020","african zoology"204,"AGE AGEING","0002-0729","age and ageing"205,"AGEING RES REV","1568-1637","ageing research reviews"206,"AGGRESSIVE BEHA V","0096-140X","aggressive behavior"207,"AGING CELL","1474-9718","#N/A"208,"AGING CLIN EXP RES","1594-0667","aging clinical and experimental research" 209,"AGR ECON","0169-5150","agricultural economics"210,"AGR ECOSYST ENVIRON","0167-8809","agriculture ecosystems & environment" 211,"AGR FOOD SCI","1459-6067"212,"AGR FOREST METEOROL","0168-1923","agricultural and forest meteorology" 213,"AGR HIST","0002-1482","agricultural history"214,"AGR SYST","0308-521X","agricultural systems"215,"AGR W ATER MANAGE","0378-3774","agricultural water management" 216,"AGRO FOOD IND HI TEC","1722-6996"217,"AGROCHIMICA","0002-1857","agrochimica"218,"AGROFOREST SYST","0167-4366","agroforestry systems"219,"AGRON J","0002-1962","agronomy journal"220,"AGRONOMIE","0249-5627","agronomie"221,"AI COMMUN","0921-7126","ai communications"222,"AI EDAM","0890-0604","ai edam-artificial intelligence for engineering design analysis and manufacturing"223,"AI MAG","0738-4602","ai magazine"224,"AIAA J","0001-1452","aiaa journal"225,"AICHE J","0001-1541","aiche journal"226,"AIDS","0269-9370","aids"227,"AIDS PATIENT CARE ST","1087-2914","aids patient care and stds"228,"AIDS RES HUM RETROV","0889-2229","aids research and human retroviruses" 229,"AIHA J-J SCI OCCUP E","1529-8663","aiha journal"230,"AIRCR ENG AEROSP TEC","0002-2667","aircraft engineering and aerospace technology" 231,"AKTUEL NEUROL","0302-4350","aktuelle neurologie"232,"AKTUEL RHEUMATOL","0341-051X","aktuelle rheumatologie"233,"AKTUEL UROL","0001-7868","aktuelle urologie"234,"ALCATEL TELECOMMUN R","1267-7167","alcatel telecommunications review" 235,"ALCHERINGA","0311-5518","alcheringa"236,"ALCOHOL","0741-8329","alcohol"237,"ALCOHOL ALCOHOLISM","0735-0414","alcohol and alcoholism" 238,"ALCOHOL CLIN EXP RES","0145-6008","alcoholism-clinical and experimental research" 239,"ALDRICHIM ACTA","0002-5100","aldrichimica acta"240,"ALGEBR COLLOQ","1005-3867","algebra colloquium"241,"ALGEBR REPRESENT TH","1386-923X"242,"ALGEBRA UNIV","0002-5240","algebra universalis" 243,"ALGORITHMICA","0178-4617","algorithmica"244,"ALIMENT PHARM THERAP","0269-2813","alimentary pharmacology & therapeutics" 245,"ALLELOPATHY J","0971-4693","allelopathy journal" 246,"ALLERGOLOGIE","0344-5062","allergologie"247,"ALLERGY","0105-4538","allergy"248,"ALLERGY ASTHMA PROC","1088-5412","allergy and asthma proceedings" 249,"ALLG FORST JAGDZTG","0002-5852","allgemeine forst und jagdzeitung" 250,"ALTERN THER HEALTH M","1078-6791","alternative therapies in health and medicine" 251,"ALTEX-ALTERN TIEREXP","0946-7785","altex-alternativen zu tierexperimenten" 252,"ALZ DIS ASSOC DIS","0893-0341","alzheimer disease & associated disorders" 253,"AM BEE J","0002-7626","american bee journal"254,"AM BIOL TEACH","0002-7685","american biology teacher"255,"AM CERAM SOC BULL","0002-7812","american ceramic society bulletin"256,"AM FAM PHYSICIAN","0002-838X","american family physician"257,"AM FERN J","0002-8444","american fern journal"258,"AM HEART J","0002-8703","american heart journal"259,"AM J AGR ECON","0002-9092","american journal of agricultural economics" 260,"AM J ALTERNATIVE AGR","0889-1893"261,"AM J BOT","0002-9122","american journal of botany"262,"AM J CARDIOL","0002-9149","american journal of cardiology"263,"AM J CHINESE MED","0192-415X","american journal of chinese medicine"264,"AM J CLIN NUTR","0002-9165","american journal of clinical nutrition"265,"AM J CLIN ONCOL-CANC","0277-3732","american journal of clinical oncology-cancer clinical trials"266,"AM J CLIN PA THOL","0002-9173","american journal of clinical pathology"267,"AM J CRIT CARE","1062-3264"268,"AM J DENT","0894-8275","american journal of dentistry"269,"AM J DERMATOPATH","0193-1091","american journal of dermatopathology" 270,"AM J EMERG MED","0735-6757","american journal of emergency medicine" 271,"AM J ENOL VITICULT","0002-9254","american journal of enology and viticulture" 272,"AM J EPIDEMIOL","0002-9262","american journal of epidemiology"273,"AM J FOREN MED PATH","0195-7910","american journal of forensic medicine and pathology"274,"AM J GASTROENTEROL","0002-9270","american journal of gastroenterology" 275,"AM J GERIAT PSYCHIAT","1064-7481","american journal of geriatric psychiatry" 276,"AM J HEALTH-SYST PH","1079-2082","american journal of health-system pharmacy" 277,"AM J HEMATOL","0361-8609","american journal of hematology"278,"AM J HUM BIOL","1042-0533","american journal of human biology"279,"AM J HUM GENET","0002-9297","american journal of human genetics"280,"AM J HYPERTENS","0895-7061","american journal of hypertension"281,"AM J IND MED","0271-3586","american journal of industrial medicine"282,"AM J INFECT CONTROL","0196-6553","american journal of infection control" 283,"AM J KIDNEY DIS","0272-6386","american journal of kidney diseases"284,"AM J MANAG CARE","1088-0224","american journal of managed care"285,"AM J MA TH","0002-9327","american journal of mathematics"286,"AM J MED","0002-9343","american journal of medicine"287,"AM J MED GENET","****-****","annual review of immunology"288,"AM J MED GENET A","1552-4825"289,"AM J MED GENET B","1552-4841"290,"AM J MED GENET C","1552-4868"291,"AM J MED QUAL","1062-8606","american journal of medical quality"292,"AM J MED SCI","0002-9629","american journal of the medical sciences"293,"AM J NEPHROL","0250-8095","american journal of nephrology"294,"AM J NEURORADIOL","0195-6108","american journal of neuroradiology"295,"AM J NURS","0002-936X","american journal of nursing"296,"AM J OBSTET GYNECOL","0002-9378","american journal of obstetrics and gynecology" 297,"AM J OPHTHALMOL","0002-9394","american journal of ophthalmology"298,"AM J ORTHOD DENTOFAC","0889-5406","american journal of orthodontics and dentofacial orthopedics"299,"AM J ORTHOPSYCHIAT","0002-9432","american journal of orthopsychiatry" 300,"AM J OTOLARYNG","0196-0709","american journal of otolaryngology"301,"AM J PATHOL","0002-9440","american journal of pathology"302,"AM J PERINA T","0735-1631","american journal of perinatology"303,"AM J PHARM EDUC","0002-9459","american journal of pharmaceutical education" 304,"AM J PHYS","0002-9505","american journal of physics"305,"AM J PHYS ANTHROPOL","0002-9483","american journal of physical anthropology" 306,"AM J PHYS MED REHAB","0894-9115","american journal of physical medicine & rehabilitation"307,"AM J PHYSIOL-CELL PH","0363-6143","american journal of physiology-cell physiology" 308,"AM J PHYSIOL-ENDOC M","0193-1849","american journal of physiology-endocrinology and metabolism"309,"AM J PHYSIOL-GASTR L","0193-1857","american journal of physiology-gastrointestinal and liver physiology"310,"AM J PHYSIOL-HEART C","0363-6135","american journal of physiology-heart and circulatory physiology"311,"AM J PHYSIOL-LUNG C","1040-0605","american journal of physiology-lung cellular and molecular physiology"312,"AM J PHYSIOL-REG I","0363-6119","american journal of physiology-regulatory integrative and comparative physiology"313,"AM J PHYSIOL-RENAL","0363-6127","american journal of physiology-renal physiology" 314,"AM J POTATO RES","1099-209X","american journal of potato research"315,"AM J PREV MED","0749-3797","american journal of preventive medicine"316,"AM J PRIMATOL","0275-2565","american journal of primatology"317,"AM J PSYCHIAT","0002-953X","american journal of psychiatry"318,"AM J PUBLIC HEALTH","0090-0036","american journal of public health"319,"AM J REPROD IMMUNOL","1046-7408"320,"AM J RESP CELL MOL","1044-1549","american journal of respiratory cell and molecular biology"321,"AM J RESP CRIT CARE","1073-449X","american journal of respiratory and critical care medicine"322,"AM J RHINOL","1050-6586","american journal of rhinology"323,"AM J ROENTGENOL","0361-803X","american journal of roentgenology"。

MOTOROLA SYMBOL LS2208扫描器快速说明书

700912345重要事項：拆箱即用、鍵盤並聯和 USB 等介面不需要進行條碼掃描設定。

條碼僅供複雜程式設計或變更介面時使用。

若要在掃描資料後新增一個 ENTER 鍵，請依數字順序分別掃描下方的三個條碼。

掃描選項<資料> <後置字元>ENTER註：纜線隨配置不同而有所差異。

工作區公告請參閱《產品參考指南》以獲得詳細資訊。

若要在掃描資料後新增一個 Tab 鍵，請依數字順序分別掃描上方的三個 Enter 鍵條碼，然後再依數字順序分別掃描下方的五個條碼。

掃描後置字元CLASS 1 CLASS 1 LASER PRODUCTCLASS 2 LASER LIGHTDO NOT STARE INTO BEAMCLASS 2 LASER PRODUCTDANISH / DANSK ITALIAN / ITALIANOKLASSE 1 KLASSE 1 LASERPRODUKT CLASSE 1 PRODOTTO AL LASER DI CLASSE 1KLASSE 2 LASERLYF CLASSE 2 LUCE LASERSE IKKE IND I STRÅLEN NON FISSARE IL RAGGIOPRODOTTOKLASSE 2 LASERPRODUKT AL LASER DI CLASSE 2DUTCH / NEDERLANDS NORWEGIAN / NORSKKLASSE 1 KLASSE-1 LASERPRODUKT KLASSE 1 LASERPRODUKT, KLASSE 1KLASSE 2 LASERLICHT KLASSE 2 LASERLYS IKKE STIRR INN ILYSSTRÅLENNIET IN STRAAL STAREN LASERPRODUKT, KLASSE 2KLASSE-2 LASERPRODUKTFINNISH / SUOMI PORTUGUESE / PORTUGUÊSLUOKKA 1 LUOKKA 1 LASERTUOTE CLASSE 1 PRODUTO LASER DA CLASSE 1LUOKKA 2 LASERVALO CLASSE 2 LUZ DE LASER NÃO FIXAR O RAIO LUMINOSOÄLÄ TUIJOTA SÄDETTÄ PRODUTO LASER DA CLASSE 2LUOKKA 2 LASERTUOTEFRENCH / FRANÇAIS SPANISH / ESPAÑOLCLASSE 1 PRODUIT LASER DE CLASSE 1 CLASE 1 PRODUCTO LASER DE LA CLASE 1CLASSE 2 LUMIERE LASER CLASE 2 LUZ LASERNE P AS REGARDER LE RA YON FIXEMENT NO MIRE FIJAMENTE EL HAZ012345本設備業已通過測試，完全符合 FCC 規章第 15 部分關於 B 級數位設備的標準。

岩心元素扫描仪的设计

专题报导岩心元素扫描仪的设计口张增旺中国电波传播研究所河南新乡453003摘要：岩屑元素录井仪主要用于石油钻井领域，其设计可靠性和科学性在很大程度上影响地质分析结果的准确性。

设计了一种新型岩屑元素录井仪，称为岩心元素扫描仪。

介绍了这一岩心元素扫描仪的工作原理与系统组成，进行了安全性计算，并分析了仪器中的控制单元、检测单元、装样单元和气路单元。

关键词：岩石元素扫描仪设计中图分类号：TH122文献标志码：A文章编号：1000-4998(2021)05-0025-04Abstract:The rock fragment element loaging unit is mainly used in the field of petroleum drilling$and its design reliability and scienhficity greatly1X1the accuracy of geoloaicyl analysis.A new type of rock fragment element loaging unit was designed$called the core element scannv.The working principle and system composition of this core element scanner were introduced,safety calculations were cacied out,and the control unit,detection unit,sample loading unit and ag path unit in the instoment were analyzed.Keywords:Rock Element Scanner Design1设计背景岩屑元素录井技术的发展与应用为地质录井对复杂岩性和地层的识别提供了可靠的数据，满足了地质录井定量化的需求，近年来日益受到油田用户的重视。

档案数字化加工流程及

档案数字化加工流程及档案数字化加工流程及规范一、操作流程在进行档案数字化加工之前，需要先确定操作流程。

一般情况下，操作流程包括档案调卷、整理及著录、拆卷、档案扫描和影像处理等几个步骤。

二、档案调卷档案调卷是指根据档案的分类和存放位置，将需要数字化加工的档案调出。

这个过程需要仔细核对档案的名称、编号和存放位置等信息，以确保调出的档案是准确的。

三、整理及著录在进行数字化加工之前，需要对档案进行整理和著录。

整理包括对档案的状况进行检查和清理，以确保档案的完整性和可读性；著录则是对档案的基本信息进行记录，包括档案名称、编号、日期、存放位置等。

四、拆卷拆卷是指将档案的卷宗逐一拆开，以便进行扫描和影像处理。

在进行拆卷之前，需要先确定档案的拆卷顺序，并对卷宗进行编号和记录。

五、档案扫描档案扫描是将档案的纸质文件转化为电子文件的过程。

在进行扫描之前，需要确定扫描的分辨率和格式，并对扫描设备进行调试和测试，以确保扫描效果的质量。

六、影像处理影像处理是指对扫描得到的电子文件进行处理和优化，以确保文件的清晰度和可读性。

影像处理包括图像增强、去噪、裁剪和旋转等操作，以及对文件进行压缩和存储等处理。

1.操作流程档案数字化加工业务的总体流程包括：档案调卷、整理及著录、拆卷、档案扫描、影像处理、数据质检、档案装卷、完整归还、数据备份和数据挂接。

流程的先后顺序为：调卷>著录>拆卷>扫描>处理>质检>装卷>归还>备份>挂接。

在没有特殊要求的情况下，必须按照这个流程进行操作，以提高工作效率。

2.档案调卷在这个过程中，我方需要指定一个专门的负责人与客户（档案馆库房管理员）共同完成。

这个负责人需要将待加工的档案从库房搬运到加工现场，对档案要逐份清点，并办理档案交接登记。

与客户做好交接记录并确定无误后方可进行拆卷环节的工作。

要求我方指定专人负责。

3.整理及著录在整理及著录过程中，需要对档案进行分类整理，确定每份档案的名称、编号、日期和页数等信息，同时将这些信息记录在档案清单上。

NI cRIO-9035 商品说明书

SPECIFICA TIONSNI cRIO-9035Embedded CompactRIO Controller with Real-Time Processor and Reconfigurable FPGAThis document lists the specifications for the NI cRIO-9035 and NI cRIO-9035 Sync. The following specifications are typical for the -20 °C to 55 °C operating temperature range unless otherwise noted.In this document, the NI cRIO-9035 and NI cRIO-9035 Sync are inclusively referred to as the cRIO-9035.For more information about timing and synchronization capabilities of NI cRIO-9035 Sync, visit /info and enter the Info Code cRIO9035sync.Caution Do not operate the cRIO-9035 in a manner not specified in this document.Product misuse can result in a hazard. You can compromise the safety protectionbuilt into the product if the product is damaged in any way. If the product isdamaged, return it to NI for repair.ProcessorCPU Intel Atom E3825Number of cores2CPU frequency 1.33 GHzOn-die L2 cache 1 MB (shared)Operating SystemNote For minimum software support information, visit /info and enter theInfo Code swsupport.Note LabVIEW FPGA Module is not required when using Scan Interface mode.To program the user-accessible FPGA on the cRIO-9035, LabVIEW FPGA Moduleis required.Note C/C++ Development Tools for NI Linux Real-Time is an optional interfacefor C/C++ programming of the cRIO-9035 processor. Visit /info and enterInfo Code RIOCdev for more information about the C/C++ Development Tools forNI Linux Real-Time.cRIO-9035Supported operating system NI Linux Real-Time (64-bit)Software requirementsApplication softwareLabVIEW LabVIEW 2014 SP1 or later,LabVIEW Real-Time Module 2014 SP1 or later,LabVIEW FPGA Module 2014 SP1 or later, C/C++ Development Tools forEclipse Edition 2014 or laterNI Linux Real-TimeDriver software NI CompactRIO Device Drivers February2015 or latercRIO-9035 SyncSupported operating system NI Linux Real-Time (64-bit)Software requirementsApplication softwareLabVIEW LabVIEW 2016 or later,LabVIEW Real-Time Module 2016 or later,LabVIEW FPGA Module 2016 or later,Eclipse Edition 2016 or laterC/C++ Development Tools forNI Linux Real-TimeDriver software NI CompactRIO Device Drivers August 2016or laterNetwork/Ethernet PortNumber of ports2Network interface10Base-T, 100Base-TX, and1000Base-T EthernetCompatibility IEEE 802.3Communication rates10 Mbps, 100 Mbps, 1000 Mbpsauto-negotiatedMaximum cabling distance100 m/segment2| | NI cRIO-9035 SpecificationsRS-232 Serial PortMaximum baud rate115,200 bpsData bits5, 6, 7, 8Stop bits1, 2Parity Odd, Even, Mark, SpaceFlow control RTS/CTS, XON/XOFF, DTR/DSRRI wake maximum low level0.8 VRI wake minimum high level 2.4 VRI overvoltage tolerance±24 VRS-485/422 (DTE) Serial PortMaximum baud rate115,200 bpsData bits5, 6, 7, 8Stop bits1, 2Parity Odd, Even, Mark, SpaceFlow control XON/XOFFWire mode4-wire, 2-wire, 2-wire autoIsolation voltage60 VDC continuous, port to earth ground Note The RS-485 serial port ground and shield are not connected to chassisground. This isolation is intended to prevent ground loops and does not meet ULratings for safety isolation.Cable requirement Unshielded, 30 m maximum length (limited byEMC/surge)Note RS-485 is capable of 1.2 km (4,000 ft) length without surge limitation.NI cRIO-9035 Specifications| © National Instruments| 3USB PortsNumber of portsDevice ports 1 standard B connectorHost ports 2 standard A connectorsNote The USB device port is intended for use in device configuration, applicationdeployment, debugging, and maintenance.USB interface USB 2.0, Hi-SpeedMaximum data rate480 Mb/s per portMaximum current (USB host ports) 1 A (aggregate)Mini DisplayPortMaximum resolution2560 × 1600 at 60 HzSD Card SlotSD card support SD and SDHC standardsMemoryNonvolatile1SD removable (user supplied)Up to 32 GBSolid-state drive 4 GBNote Visit /info and enter the Info Code ssdbp for information about thelife span of the nonvolatile memory and about best practices for using nonvolatilememory.V olatileProcessor memoryDensity 1 GBType DDR3LMaximum theoretical data rate8.533 GB/s1 1 MB is equal to 1 million bytes. 1 GB is equal to 1 billion bytes. The actual formatted capacitymight be less.4| | NI cRIO-9035 SpecificationsData throughputSystem memory to SD removable10 MB/sstorage2Module slots to system memory20 MB/s, application- and system-dependent Reconfigurable FPGAFPGA type Xilinx Kintex-7 7K70TNumber of flip-flops82,000Number of 6-input LUTs41,000240Number of DSP slices(18 × 25 multipliers)Available block RAM4,860 kbitsNumber of DMA channels16Number of logical interrupts32Internal Real-Time ClockAccuracy200 ppm; 40 ppm at 25 °CCMOS Battery10 yearsTypical battery life with power applied topower connector7.8 yearsTypical battery life when stored attemperatures up to 25 °CTypical battery life when stored at5.4 yearstemperatures up to 85 °C2Consult the manufacturer specifications of your SD removable storage.NI cRIO-9035 Specifications| © National Instruments| 5Power RequirementsNote Some C Series modules have additional power requirements. For moreinformation about C Series module power requirements, refer to the C Seriesmodule(s) documentation.V oltage input range (measured at the cRIO-9035 power connector)V19 V to 30 VV29 V to 30 VMaximum power consumption46 WNote The maximum power consumption specification is based on a fully populatedsystem running a high-stress application at elevated ambient temperature and withall C Series modules and USB devices consuming the maximum allowed power. Typical standby power consumption 3.4 W at 24 VDC inputRecommended power supply100 W, 24 VDCTypical leakage current from secondary power input (V2) while system is powered from primary power input (V1)At 9 V0.4 mAAt 30 V 1.93 mACaution Do not connect V2 to a DC mains supply or to any supply that requires aconnecting cable longer than 3 m (10 ft). A DC mains supply is a local DCelectricity supply network in the infrastructure of a site or building.EMC ratings for inputs as described in IEC 61000V1Short lines, long lines, and DC distributednetworksV2Short lines onlyPower input connector4-position, 3.5 mm pitch, pluggable screwterminal with screw locks,Sauro CTF04BV8-AN000A6| | NI cRIO-9035 SpecificationsPhysical CharacteristicsIf you need to clean the cRIO-9035, wipe it with a dry towel.Tip For two-dimensional drawings and three-dimensional models of thecRIO-9035, visit /dimensions and search by module number.Weight (unloaded)2,250 g (4 lbs, 15 oz)Dimensions (unloaded)328.8 mm × 88.1 mm × 109.2 mm (12.94 in. ×3.47 in. ×4.30 in. )Screw-terminal wiringGauge0.5 mm 2 to 2.1 mm2 (20 AWG to 14 AWG)copper conductor wireWire strip length 6 mm (0.24 in.) of insulation stripped from theendTemperature rating85 °CTorque for screw terminals0.20 N · m to 0.25 N · m (1.8 lb · in. to2.2 lb · in.)Wires per screw terminal One wire per screw terminalConnector securementSecurement type Screw flanges providedTorque for screw flanges0.20 N · m to 0.25 N · m (1.8 lb · in. to2.2 lb · in.)Safety VoltagesConnect only voltages that are below these limits.V1 terminal to C terminal30 VDC maximum, Measurement Category I V2 terminal to C terminal30 VDC maximum, Measurement Category I Chassis ground to C terminal30 VDC maximum, Measurement Category I Measurement Category I is for measurements performed on circuits not directly connected to the electrical distribution system referred to as MAINS voltage. MAINS is a hazardous live electrical supply system that powers equipment. This category is for measurements of voltages from specially protected secondary circuits. Such voltage measurements include signal levels, special equipment, limited-energy parts of equipment, circuits powered by regulated low-voltage sources, and electronics.Caution Do not connect the cRIO-9035 to signals or use for measurements withinMeasurement Categories II, III, or IV.NI cRIO-9035 Specifications| © National Instruments| 7Note Measurement Categories CAT I and CAT O are equivalent. These test andmeasurement circuits are not intended for direct connection to the MAINS buildinginstallations of Measurement Categories CAT II, CAT III, or CAT IV.EnvironmentalTemperature (IEC-60068-2-1 and IEC-60068-2-2)Operating-20 °C to 55 °CStorage-40 °C to 85 °CCaution Failure to follow the mounting instructions in the user manual can causetemperature derating. Visit /info and enter Info Code criomounting formore information about mounting configurations and temperature derating. Ingress protection IP20Operating humidity (IEC 60068-2-56)10% RH to 90% RH, noncondensing Storage humidity (IEC 60068-2-56)5% RH to 95% RH, noncondensing Pollution Degree (IEC 60664)2Maximum altitude5,000 mIndoor use only.Hazardous LocationsU.S. (UL)Class I, Division 2, Groups A, B, C, D, T4;Class I, Zone 2, AEx nA IIC T4Canada (C-UL)Class I, Division 2, Groups A, B, C, D, T4;Class I, Zone 2, Ex nA IIC T4Europe (ATEX) and International (IECEx)Ex nA IIC T4 GcShock and VibrationTo meet these specifications, you must mount the cRIO-9035 system directly on a flat, rigid surface as described in the user manual, affix ferrules to the ends of the terminal wires, install an SD card cover (SD Door Kit, 783660-01), and use retention accessories for the USB host ports (NI Industrial USB Extender Cable, 152166-xx), USB device port (NI Locking USB Cable, 157788-01), and mini DisplayPort connector (NI Retention Accessory for Mini DisplayPort, 156866-01). All cabling should be strain-relieved near input connectors. Take 8| | NI cRIO-9035 Specificationscare to not directionally bias cable connectors within input connectors when applying strain relief.Operating vibrationRandom (IEC 60068-2-64) 5 g rms, 10 Hz to 500 HzSinusoidal (IEC 60068-2-6) 5 g, 10 Hz to 500 HzOperating shock (IEC 60068-2-27)30 g, 11 ms half sine; 50 g, 3 ms half sine;18 shocks at 6 orientationsSafety and Hazardous Locations StandardsThis product is designed to meet the requirements of the following electrical equipment safety standards for measurement, control, and laboratory use:•IEC 61010-1, EN 61010-1•UL 61010-1, CSA 61010-1•EN 60079-0:2012, EN 60079-15:2010•IEC 60079-0: Ed 6, IEC 60079-15; Ed 4•UL 60079-0; Ed 5, UL 60079-15; Ed 3•CSA 60079-0:2011, CSA 60079-15:2012Note For UL and other safety certifications, refer to the product label or the OnlineProduct Certification section.Electromagnetic CompatibilityThis product meets the requirements of the following EMC standards for electrical equipment for measurement, control, and laboratory use:•EN 61326-1 (IEC 61326-1): Class A emissions; Industrial immunity•EN 61000-6-2: Immunity•EN 55011 (CISPR 11): Group 1, Class A emissions•EN 55022 (CISPR 22): Class A emissions•EN 55024 (CISPR 24): Immunity•AS/NZS CISPR 11: Group 1, Class A emissions•AS/NZS CISPR 22: Class A emissions•FCC 47 CFR Part 15B: Class A emissions•ICES-001: Class A emissionsNote In the United States (per FCC 47 CFR), Class A equipment is intended foruse in commercial, light-industrial, and heavy-industrial locations. In Europe,Canada, Australia and New Zealand (per CISPR 11) Class A equipment is intendedfor use only in heavy-industrial locations.NI cRIO-9035 Specifications| © National Instruments| 9Note Group 1 equipment (per CISPR 11) is any industrial, scientific, or medicalequipment that does not intentionally generate radio frequency energy for thetreatment of material or inspection/analysis purposes.Note For EMC declarations and certifications, and additional information, refer tothe Online Product Certification section.CE ComplianceThis product meets the essential requirements of applicable European Directives, as follows:•2014/35/EU; Low-V oltage Directive (safety)•2014/30/EU; Electromagnetic Compatibility Directive (EMC)•94/9/EC; Potentially Explosive Atmospheres (ATEX)Online Product CertificationRefer to the product Declaration of Conformity (DoC) for additional regulatory compliance information. To obtain product certifications and the DoC for this product, visit / certification, search by model number or product line, and click the appropriate link in the Certification column.Environmental ManagementNI is committed to designing and manufacturing products in an environmentally responsible manner. NI recognizes that eliminating certain hazardous substances from our products is beneficial to the environment and to NI customers.For additional environmental information, refer to the Minimize Our Environmental Impact web page at /environment. This page contains the environmental regulations and directives with which NI complies, as well as other environmental information not included in this document.Waste Electrical and Electronic Equipment (WEEE)EU Customers At the end of the product life cycle, all NI products must bedisposed of according to local laws and regulations. For more information abouthow to recycle NI products in your region, visit /environment/weee.10| | NI cRIO-9035 SpecificationsBattery Replacement and DisposalBattery Directive This device contains a long-life coin cell battery. If you need toreplace it, use the Return Material Authorization (RMA) process or contact anauthorized National Instruments service representative. For more information aboutcompliance with the EU Battery Directive 2006/66/EC about Batteries andAccumulators and Waste Batteries and Accumulators, visit /environment/batterydirective.电子信息产品污染控制管理办法（中国RoHS）中国客户National Instruments符合中国电子信息产品中限制使用某些有害物质指令(RoHS)。

Spectrum Master MS2712E和MS2713E产品说明书

1981Spectrum Master™ MS2712E and MS2713E SpecificationsSpectral PuritySSB Phase Noise @ 1 GHz-100 dBc/Hz, -110 dBc/Hz typical @ 10 kHz offset-105 dBc/Hz, -112 dBc/Hz typical @ 100 kHz offset-115 dBc/Hz, -121 dBc/Hz typical @ 1 MHz offsetAmplitude RangesDynamic Range>95 dB (2.4 GHz), 2/3 (TOI-DANL) in 10 Hz RBWMeasurement Range DANL to +26 dBmDisplay Range 1 to 15 dB/div in 1 dB steps, ten divisions displayedReference Level Range-130 dBm to +30 dBmAttenuator Range0 to 55 dB in 5 dB stepsAmplitude Units Log Scale Modes: dBm, dBV, dBmv, dB VLinear Scale Modes: nV, V, mV, V, kV, nW, W, mW, W, kW Amplitude Accuracy100 kHz to 4.0 GHz±1.25 dB, ±0.5 dB typical>4.0 GHz to 6 GHz±1.50 dB, ±0.5 dB typicalDisplayed Average Noise Level (DANL)Preamp Off Preamp On(Reference level -20 dBm)(Reference level -50 dBm) (RBW Normalized to 1 Hz, 0 dB attenuation)Maximum Typical Maximum Typical10 MHz to 2.4 GHz -141 dBm-146 dBm-157 dBm-162 dBm>2.4 GHz to 4 GHz-137 dBm-141 dBm-154 dBm-159 dBm>4 GHz to 5 GHz-134 dBm-138 dBm-150 dBm-155 dBm> 5 GHz to 6 GHz-126 dBm-131 dBm-143 dBm-150 dBm (RBW = 10 Hz, 0 dB attenuation)10 MHz to 2.4 GHz -131 dBm-136 dBm-147 dBm-152 dBm>2.4 GHz to 4 GHz-127 dBm-131 dBm-144 dBm-149 dBm>4 GHz to 5 GHz-124 dBm-128 dBm-140 dBm-145 dBm> 5 GHz to 6 GHz-116 dBm-121 dBm-133 dBm-140 dBm SpursResidual Spurious<-90 dBm (RF input terminated, 0 dB input attenuation, > 10 MHz)Input-Related Spurious<-75 dBc (0 dB attenuation, -30 dBm input, span <1.7 GHz, carrier offset >4.5 MHz) Exceptions, typical<-70 dBc @ <2.5 GHz, with 2072.5 MHz Input<-68 dBc @ F1-280 MHz with F1 Input<-70 dBc @ F1 + 190 MHz with F1 Input<-52 dBc @ 7349-2F2 MHz, with F2 Input, where F2 < 2424.5 MHz Third-Order Intercept (TOI)Preamp Off (-20 dBm tones 100 kHz apart, 10 dB attenuation)800 MHz+16 dBm2400 MHz+20 dBm200-2200 MHz+25 dBm, typical>2.2 GHz to 5.0 GHz+28 dBm, typical>5.0 GHz to 6.0 GHz+33 dBm, typicalSecond Harmonic DistortionPreamp Off, 0 dB input attenuation, -30 dBm input50 MHz-56 dBc>50 MHz to 200 MHz-60 dBc, typical>200 MHz to 3000 MHz-70 dBc, typicalVSWR2:1, typicalPage 3 of 12Page 4 of 12Spectrum Master™ MS2712E and MS2713E Specifications2-Port Transmission Measurement (Option 0021)FrequencyFrequency Range 2 MHz to 4 GHz (MS2712E), 2 MHz to 6 GHz (MS2713E)Frequency Resolution10 HzOutput PowerHigh 0 dBm, typical Low-30 dBm, typicalDynamic Range2 MHz to 4 GHz 80 dB >4 GHz to 6 GHz 70 dBApplication OptionsBias-Tee (On/Off), Impedance (50 , 75 , Other)Bias-Tee (Option 0010)SetupOn/Off, Voltage, Current (Low/High)Voltage Range +12 to +32 VCurrent (Low/High)250 mA/450 mA, 1 A surge for 100 ms Resolution0.1 VGPS Receiver Option (Option 0031) (Antenna sold separately, P/N 2000-1528-R)SetupOn/Off, Antenna Voltage 3.3/5.0 V , GPS Info GPS Time/Location IndicatorTime, Latitude, Longitude and Altitude on displayTime, Latitude, Longitude and Altitude with trace storage High Frequency AccuracySpectrum Analyzer , Interference Analyzer , CW Signal Generator when GPS Antenna is connected<±50 ppb with GPS On, 3 minutes after satellite lock in selected mode ConnectorSMA, femalePage 5 of 12Spectrum Master™ MS2712E and MS2713E SpecificationsPower Meter (Option 0029)Frequency Center/Start/Stop, Span, Frequency Step, Signal Standard, Channel #, Full Band Amplitude Maximum, Minimum, Offset, Relative On/Off, Units, Auto Scale Average Acquisition Fast/Med/Slow, # of Running Averages LimitsLimit On/Off, Limit Upper/LowerFrequency Range10 MHz to 4 GHz (MS2712E), 10 MHz to 6 GHz (MS2713E)Span1 kHz to 100 MHzDisplay Range-140 dBm to +30 dBm, ≤40 dB span Measurement Range-120 dBm to +26 dBm Offset Range0 to +100 dB VSWR2:1 typicalMaximum Power+26 dBm without attenuator AccuracySame as Spectrum Analyzer Application OptionsImpedance (50 , 75 , Other)High Accuracy Power Meter (Option 0019) (Requires external USB Power Sensor(s))Amplitude Maximum, Minimum, Offset, Relative On/Off, Units, Auto Scale Average # of Running Averages, Max HoldZero/Cal Zero On/Off, Cal Factor (Center Frequency, Signal Standard)LimitsLimit On/Off, Limit Upper/LowerPower Sensor ModelPSN50MA24104A MA24106A MA24108A MA24118A DescriptionHigh Accuracy RF Power Sensor Inline High Power Sensor High Accuracy RF Power Sensor Microwave USB Power Sensor Microwave USB Power Sensor Frequency Range50 MHz to 6 GHz 600 MHz to 4 GHz 50 MHz to 6 GHz 10 MHz to 8 GHz 10 MHz to 18 GHz Connector T ype N(m), 50 T ype N(m), 50 T ype N(m), 50 T ype N(m), 50 T ype N(m), 50 Dynamic Range-30 to +20 dBm (.001 to 100 mW)+3 to +51.76 dBm (2 mW to 150 W)-40 t o +23 dBm (0.1 µW to 200 mW)-40 t o +20 dBm (0.1 µW to 100 mW)-40 t o +20 dBm (0.1 µW t o 100 mW)VBW100 Hz 100 Hz 100 Hz 50 kHz 50 kHz MeasurandTrue-RMSTrue-RMSTrue-RMSTrue-RMS, Slot Power , Burst AveragePowerTrue-RMS, Slot Power , Burst AveragePower Measurement Uncertainty ±0.16 dB 1±0.17 dB 2±0.16 dB 1±0.18 dB 3±0.18 dB 3Datasheet(for complete speciications)11410-0041411410-0048311410-0042411410-0050411410-00504Notes:1) T otal RSS measurement uncertainty (0 ºC to 50 ºC) for power measurements of a CW signal greater than -20 dBm with zero mismatch errors.2) E xpanded uncertainty with K=2 for power measurements of a CW signal greater than +20 dBm with a matched load. Measurement results referenced to the input side of the sensor.3) Expanded uncertainty with K=2 for power measurements of a CW signal greater than-20 dBm with zero mismatch errors.Page 6 of 12Spectrum Master™ MS2712E and MS2713E SpecificationsInterference Analyzer (Option 0025)MeasurementsSpectrum Field Strength Occupied Bandwidth Channel PowerAdjacent Channel Power (ACPR)AM/FM/SSB Demodulation (Wide/Narrow FM, Upper/Lower SSB), (audio out only)Carrier-to-Interference ratio (C/I)Spectrogram (Collect data up to one week)Signal Strength (Gives visual and aural indication of signal strength)Received Signal Strength Indicator (RSSI) (collect data up to one week)Gives visual and aural indication of signal strength Signal ID (up to 12 signals)Center Frequency BandwidthSignal Type (FM, GSM, W-CDMA, CDMA, Wi-Fi)Closest Channel Number Number of CarriersApplication OptionsSignal-to-Nose Ratio (SNR) >10 dBBias-Tee (On/Off), Impedance (50 , 75 , Other)Channel Scanner (Option 0027)Number of Channels1 to 20 Channels (Power Levels)MeasurementsGraph/T able, Max Hold (On/5 sec/Off), Freq/Channel, Current/Max, Single/Dual Color Scanner Scan Channels, Scan Frequencies, Scan Customer List, Scan Script Master™Amplitude Reference Level, ScaleCustom Scan Signal Standard, Channel, # of Channels, Channel Step Size, Custom Scan Frequency Range 100 kHz to 4 GHz (MS2712E), 100 kHz to 6 GHz (MS2713E)Frequency Accuracy ±10 Hz + Time base error Measurement Range -110 dBm to +26 dBmApplication OptionsBias-Tee (On/Off), Impedance (50 , 75 , Other)CW Signal Generator Option (Option 0028) (Requires CW Signal Generator Kit, P/N 69793)Setup ParametersFrequency Frequency, Signal Standard, Channel Number , Display Setup Help AmplitudePower Level (Low/High), Offset (dB)Frequency Range25 MHz to 2 GHz typicalOutput PowerHigh 0 dBm typical, Low -30 dBm typicalAttenuator (included in kit 69793): 0 to 90 dB in 1 dB stepsGated Sweep (Option 0090)Mode Spectrum Analyzer , Sweep Trigger External TTLSetupGated Sweep (On/Off)Gate Polarity (Rising, Falling)Gate Delay (0 to 65 ms typical)Gate Length (1 µs to 65 ms typical)Zero Span TimeSpectrum Master™ MS2712E and MS2713E SpecificationsGeneral Specifications All speciications and characteristics apply under the following conditions, unless otherwise stated: 1) After 5 minutes of warm-up time, wherethe instrument is left in the ON state; 2) All speciications apply when using internal reference; 3) All speciications subject to change withoutnotice; 4) T ypical performance is the measured performance of an average unit; 5) Recommended calibration cycle is 12 months.Setup ParametersSystem Status (Temperature, Battery Info, Serial Number, Firmware Version, Options Installed)Self Test, Application Self TestGPS (see Option 0031)System Options Name, Date and Time, Brightness, VolumeLanguage (English, French, German, Spanish, Chinese, Japanese, Korean, Italian, User deined)Reset (Factory Defaults, Master Reset, Update Firmware)File Save, Recall, Delete, Directory ManagementSave/Recall Setups, Measurements, Screen Shots Jpeg (save only)Delete Selected File, All Measurements, All Mode Files, All ContentDirectory Management Sort Method (Name/Type/Date), Ascend/Descend, Internal/USB, Copy, Format USB Internal Trace/Setup Memory2,000 traces, 2,000 SetupsExternal Trace/Setup Memory Limited by size of USB Flash driveMode Switching Auto-Stores/Recalls most recently used Setup Parameters in the Mode ConnectorsRF Out Type N, female, 50 (Relection In)RF Out Damage Level23 dBm, ±50 VDCRF In Type N, female, 50RF In Damage Level+35 dBm peak, ±50 VDC, Maximum Continuous Input (≥10 dB attenuation)GPS SMA(f)External Power 5.5 mm barrel connector, 12.5 to 15 VDC, < 4.0 AmpsUSB Interface (2)Type A, Connect USB Flash Drive and Power SensorUSB Interface5-pin mini-B, Connect to PC for data transferHeadset Jack 2.5 mm mini-phone plugExternal Reference In BNC, female, 50 , Maximum Input +10 dBm1 MHz, 5 MHz, 10 MHz, 13 MHzExternal Trigger/Clock Recovery BNC, female, 50 , Maximum Input ±50 VDCDisplayType Resistive TouchscreenSize8.4” daylight viewable color LCDResolution800 x 600BatteryType Li-IonBattery Operation 3.0 hours, typicalElectromagnetic CompatibilityEuropean Union CE Mark, EMC Directive 89/336/EEC, 92/31/EEC, 93/68/EEC andLow Voltage Directive 73/23/EEC, 93/68/EECAustralia and New Zealand C-tick N274Interference EN 61326-1Emissions EN 55011Immunity EN 61000-4-2/-4-3/-4-4/-4-5/-4-6/-4-11SafetySafety Class EN 61010-1 Class 1Product Safety IEC 60950-1 when used with Company supplied Power Supply EnvironmentalOperating Temperature-10 ºC to 55 ºCMaximum Humidity85%Shock MIL-PRF-28800F Class 2Storage-40 ºC to 71 ºCAltitude4600 meters, operating and non-operatingSize and WeightSize273 x 199 x 91 mm, (10.7 x 7.8 x 3.6 in)Weight 3.45 kg, (7.6 lbs)Page 7 of 12Spectrum Master™ MS2712E and MS2713E SpecificationsMaster Software Tools (for your PC)Database ManagementFull Trace Retrieval Retrieve all traces from instrument into one PC directoryTrace Catalog Index all traces into one catalogTrace Rename Utility Rename measurement tracesGroup Edit Titles, subtitles, plot scaling, markers and limit lines, simultaneously on similar iles DAT File Converter Converts HHST iles to MST ile format and vice-versaData AnalysisTrace Math and Smoothing Compare multiple tracesData Converter Convert from/to Return Loss, VSWR, Cable Loss, DTF and also into Smith Charts Measurement Calculator Translates into other unitsReport GenerationReport Generator Includes GPS, power level, and calibration status along with measurementsEdit Graph Change scale, limit lines, and markersReport Format Create reports in HTML for PDF formatExport Measurements Export measurements to *.s2p, *.jpg or *.csv formatNotes Annotate measurementsMapping (GPS Required)Spectrum Analyzer Mode MapInfo, MapPointFolder Spectrogram (Spectrum Monitoring for Interference Analysis and Spectrum Clearing)Folder Spectrogram – 2D View Creates a composite ile of multiple tracesPeak Power, Total Power, Peak Frequency, Histogram, Average Power (Max/Min)File Filter (Violations over limit lines or deviations from averages)PlaybackVideo Folder Spectrogram – 2D View Create AVI ile to export for management review/reportsFolder Spectrogram – 3D View Views (Set Threshold, Markers)- 3D (Rotate X, Y, Z Axis, Level Scale, Signal ID)- 2D View (Frequency or Time Domain, Signal ID)- Top DownPlayback (Frequency and/or Time Domain)List/Parameter EditorsTraces Add, delete, and modify limit lines and markersAntennas, Cables, Signal Standards Modify instrument’s Antenna, Cable, and Signal Standard ListProduct Updates Auto-checks Anritsu website for latest revision irmwareFirmware Upload Upload new irmware into the instrumentLanguages Add up to two languages and modify non-English language menusDisplay Modify display settingsScript Master™Channel Scanner Mode Automate scan up to 1200 channels, repeat for sets of 20 channels, repeat all channels ConnectivityConnections Connect to PC using USBDownload Download measurements and live traces to PC for storage and analysisUpload Upload measurements from PC to instrumentFirmware Updates Create USB Flash Drive for irmware updatePage 8 of 12Page 9 of 12Spectrum Master™ MS2712E and MS2713E SpecificationsOrdering Information – OptionsMS2712EMS2713EDescription 100 kHz to 4 GHz100 kHz to 6 GHzSpectrum AnalyzerOptionsOptionsMS2712E-0021MS2713E-00212-Port Transmission Measurement MS2712E-0010MS2713E-0010Bias-TeeMS2712E-0031MS2713E-0031GPS Receiver (Requires Antenna P/N 2000-1528-R) MS2712E-0019MS2713E-0019High-Accuracy Power Meter MS2712E-0029MS2713E-0029Power MeterMS2712E-0025MS2713E-0025Interference Analyzer MS2712E-0027MS2713E-0027Channel Scanner MS2712E-0090MS2713E-0090Gated SweepMS2712E-0028MS2713E-0028C/W Signal Generator (Requires Option 0021) (Requires CW Signal Generator Kit, P/N 69793)MS2712E-0098MS2713E-0098Standard Calibration (ANSI 2540-1-1994)MS2712E-0099MS2713E-0099Premium Calibration (ANSI 2540-1-1994 plus test data)Power Sensors (For complete ordering information see the respective datasheets of each sensor)Model NumberDescriptionPSN50 High Accuracy RF Power Sensor , 50 MHz to 6 GHz, +20 dBm MA24104A Inline High Power Sensor , 600 MHz to 4 GHz, +51.76 dBm MA24106A High Accuracy RF Power Sensor , 50 MHz to 6 GHz, +23 dBm MA24108A Microwave USB Power Sensor , 10 MHz to 8 GHz, +20 dBm MA24118AMicrowave USB Power Sensor , 10 MHz to 18 GHz, +20 dBmStandard Accessories (included with instrument)Part Number Description10580-00251Spectrum Master User Guide (includes Bias-Tee, GPS Receiver)3-68736Soft Carrying Case2300-498MST CD: Master Software Tools, User/Measurement Guides, Programming Manual, Troubleshooting Guides, Application Notes 633-44Rechargeable Li-Ion Battery 40-168-R AC-DC Adapter806-141-R Automotive Cigarette Lighter 12 VDC Adapter 3-2000-1498USB A/5-pin mini-B Cable, 10 feet/305 cm11410-00511Spectrum Master™ MS2712E, MS2713E Technical Data Sheet One Year Warranty (Including battery, irmware, and software)Certiicate of Calibration and ConformancePage 10 of 12Spectrum Master™ MS2712E and MS2713E SpecificationsOptional AccessoriesDirectional AntennasPart Number Description2000-1411-R 822-900 MHz, N(f), 10 dBd, Yagi 2000-1412-R 885-975 MHz, N(f), 10 dBd, Yagi 2000-1413-R 1710-1880 MHz, N(f), 10 dBd. Yagi 2000-1414-R 1850-1990 MHz, N(f), 9.3 dBd, Yagi 2000-1415-R 2400-2500 MHz, N(f), 10 dBd, Yagi 2000-1416-R 1920-2170 MHz, N(f), 10 dBd, Yagi 2000-1519500 MHz to 3 GHz, log periodicPortable Antennas2000-1200806-866 MHz, SMA (m), 50 2000-1473870-960 MHz, SMA(m), 502000-1035896-941 MHz, SMA (m), 50 (1/4 wave)2000-10301710 to 1880 MHz, SMA (m), 50 (1/2 wave)2000-14741750 to 1850 MHz with knuckle elbow (1/2 wave)2000-10311850 to 1990 MHz, SMA (m), 50 (1/2 wave)2000-14751920 to 1980 MHz and 2110 to 2170 MHz, SMA (m), 50 2000-1032-R 2400 to 2500 MHz, SMA (m), 50 (1/2 wave)2000-13612400 to 2500, 5000 to 6000 MHz, SMA (m), 5061532Antenna Kit (Consists of: 2000-1030, 2000-1031, 2000-1032-R, 2000-1200, 2000-1035, 2000-1361, and carrying pouch)Bandpass Filters1030-114-R 806-869 MHz, N(m) - SMA(f), 50 1030-109-R 824 - 849 MHz, N(m) - SMA (f), 50 1030-110-R 880 - 915 MHz, N(m) - SMA (f), 501030-105-R 890-915 MHz Band, 0.41 dB loss, N(m) - SMA (f), 50 1030-111-R 1850 - 1910 MHz, N(m) - SMA (f), 501030-106-R 1710-1790 MHz Band, 0.34 dB loss, N(m) - SMA (f), 50 1030-107-R 1910-1990 MHz Band, 0.41 dB loss, N(m) - SMA (f), 50 1030-112-R 2400 - 2484 MHz, N(m) - SMA (f), 50 1030-155-R2500-2700 MHz, N(m) – N(f), 50 Attenuators3-1010-12220 dB, 5 W , DC to 12.4 GHz, N(m)-N(f)42N50-2020 dB, 5 W , DC to 18 GHz, N(m) - N(f)42N50A-3030 dB, 5 W , DC to 18 GHz, N(m) - N(f)3-1010-12330 dB, 50 W , DC to 8.5 GHz, N(m)-N(f)1010-127-R 30 dB, 150 W , DC to 3 GHz, N(m) - N(f)3-1010-12440 dB, 100 W , DC to 8.5 GHz, N(m)-N(f), Uni-directional 1010-12140 dB, 100 W , DC to 18 GHz, N(m)-N(f), Uni-directional 1010-128-R40 dB, 150 W, DC to 3 GHz, N(m) - N(f)Page 11 of 12Spectrum Master™ MS2712E and MS2713E SpecificationsOptional Accessories (continued)Adapters1091-26-R SMA(m) - N(m), DC to 18 GHz, 50 1091-27-R SMA(f) - N(m), DC to 18 GHz, 50 1091-80-R SMA(m) - N(f), DC to 18 GHz, 50 1091-81-R SMA(f) - N(f), DC to 18 GHz, 50 1091-172BNC(f) - N(m), DC to 1.3 GHz, 50510-102-RN(m) - N(m), DC to 11 GHz, 50 , 90 degrees right anglePrecision Adapters34NN50A Precision Adapter , N(m) - N(m), DC to 18 GHz, 50 34NFNF50Precision Adapter , N(f) - N(f), DC to 18 GHz, 50Backpack and Transit Case67135Anritsu Backpack (For Handheld Instrument and PC)760-243-RLarge Transit Case with Wheels and HandleMiscellaneous Accessories2000-1528-RGPS Antenna, SMA(m)69793CW Signal Generator Kit 2000-1520-R USB Flash Drive2000-1374External Charger for Li-lon Batteries5-1-1 Onna, Atsugi-shi, Kanagawa, 243-8555 Japan Phone: +81-46-223-1111Fax: +81-46-296-1264• U.S.A.Anritsu Company1155 East Collins Boulevard, Suite 100,Richardson, Texas 75081 U.S.A.Toll Free: 1-800-ANRITSU (267-4878)Phone: +1-972-644-1777Fax: +1-972-671-1877• CanadaAnritsu Electronics Ltd.700 Silver Seven Road, Suite 120, Kanata,Ontario K2V 1C3, CanadaPhone: +1-613-591-2003Fax: +1-613-591-1006• BrazilAnritsu Electrônica Ltda.Praca Amadeu Amaral, 27-1 Andar01327-010 - Paraiso, São Paulo, BrazilPhone: +55-11-3283-2511Fax: +55-11-3886940• MexicoAnritsu Company, S.A. de C.V.Av. Ejército Nacional No. 579 Piso 9, Col. Granada 11520 México, D.F., MéxicoPhone: +52-55-1101-2370Fax: +52-55-5254-3147• U.K.Anritsu EMEA Ltd.200 Capability Green, Luton, Bedfordshire LU1 3LU, U.K. Phone: +44-1582-433200Fax: +44-1582-731303• FranceAnritsu S.A.16/18 Avenue du Québec-SILIC 72091961 COURTABOEUF CEDEX, FrancePhone: +33-1-60-92-15-50Fax: +33-1-64-46-10-65• GermanyAnritsu GmbHNemetschek Haus, Konrad-Zuse-Platz 181829 München, GermanyPhone: +49 (0) 89 442308-0Fax: +49 (0) 89 442308-55Anritsu S.p.A.Via Elio Vittorini, 129, 00144 Roma, ItalyPhone: +39-06-509-9711Fax: +39-06-502-2425• SwedenAnritsu ABBorgafjordsgatan 13, 164 40 Kista, SwedenPhone: +46-8-534-707-00Fax: +46-8-534-707-30• FinlandAnritsu ABTeknobulevardi 3-5, FI-01530 Vantaa, FinlandPhone: +358-20-741-8100Fax: +358-20-741-8111• DenmarkAnritsu A/SKirkebjerg Allé 90 DK-2605 Brøndby, DenmarkPhone: +45-72112200Fax: +45-72112210• SpainAnritsu EMEA Ltd.Oficina de Representación en EspañaEdificio VeganovaAvda de la Vega, n 1 (edf 8, pl1, of 8)28108 ALCOBENDAS - Madrid, SpainPhone: +34-914905761Fax: +34-914905762• RussiaAnritsu EMEA Ltd.Representation Office in RussiaTverskaya str. 16/2, bld. 1, 7th floor.Russia, 125009, MoscowPhone: +7-495-363-1694Fax: +7-495-935-8962• United Arab EmiratesAnritsu EMEA Ltd.Dubai Liaison OfficeP O Box 500413 - Dubai Internet CityAl Thuraya Building, Tower 1, Suite 701, 7th FloorDubai, United Arab EmiratesPhone: +971-4-3670352Fax: +971-4-3688460Anritsu Pte. Ltd.60 Alexandra Terrace, #02-08, The Comtech (Lobby A)Singapore 118502Phone: +65-6282-2400Fax: +65-6282-2533• IndiaAnritsu Pte. Ltd.India Branch Office3rd Floor, Shri Lakshminarayan Niwas,#2726, 80 ft Road, HAL 3rd Stage, Bangalore - 560 075, IndiaPhone: +91-80-4058-1300Fax: +91-80-4058-1301• P. R. China (Hong Kong)Anritsu Company Ltd.Units 4 & 5, 28th Floor, Greenfield Tower, Concordia Plaza,No. 1 Science Museum Road, Tsim Sha Tsui East,Kowloon, Hong Kong, P.R. ChinaPhone: +852-2301-4980Fax: +852-2301-3545• P. R. China (Beijing)Anritsu Company Ltd.Beijing Representative OfficeRoom 2008, Beijing Fortune Building,No. 5 , Dong-San-Huan Bei Road,Chao-Yang District, Beijing 100004, P.R. ChinaPhone: +86-10-6590-9230Fax: +86-10-6590-9235• KoreaAnritsu Corporation, Ltd.8F Hyunjuk Bldg. 832-41, Yeoksam-Dong,Kangnam-ku, Seoul, 135-080, KoreaPhone: +82-2-553-6603Fax: +82-2-553-6604• AustraliaAnritsu Pty Ltd.Unit 21/270 Ferntree Gully Road, Notting HillVictoria, 3168, AustraliaPhone: +61-3-9558-8177Fax: +61-3-9558-8255• TaiwanAnritsu Company Inc.7F, No. 316, Sec. 1, Neihu Rd., Taipei 114, TaiwanPhone: +886-2-8751-1816Fax: +886-2-8751-1817The Master Users Group is an organization dedicated to providing training, technical support, networking opportunities and links to Master product development teams. As a member you will receive the Insite Quarterly Newsletter with user stories, measurement tips, new product news and more.Visit us to register today: /smiusignupTo receive a quote to purchase a product or order accessories visit our online ordering site: Training at AnritsuAnritsu has designed courses to help you stay up to date with technologies important to your job.For available training courses visit: /training。

贩贩

CPC (0,01- 1 µm)
0.01
0.001
0.0001
0.01
0.1
1
D (µm)
最易穿透粒径法(MPPS) EN 1822
ULPA
> 0.1 µm > 0.1 µm > 0.1 µm > 0.1 µm
多通道激光粒子计数器
采样流量1cfm
1:10000 稀释器 1:100000 稀释器
控制操作台
0.9
12.0
4.0
13-14
0.5
17.5
优越的抗水性
> 250mm水柱（> 2500Pa)
防水剂特殊处理
“0” 渗水！
比较 - 滤芯制造工艺
市场上常见的传统的连续分隔线
Camfil的脉冲间断分隔专利技术严格的“V”形通道，阻力低，使用寿命长
Camfil独有的“V”形滤褶通道
✓过滤面积100%利用； ✓容尘分布非常均匀； ✓阻力低，节省能耗； ✓使用寿命长。
选品质，要可靠 – 找康斐尔
1. 全自动逐台MPPS激光扫描检漏及效率测试 – 国际最新权威标准EN1822
2. 风速均匀性测试 3. HEPA/ULPA原材料的挥发性测试 4. 优越的抗水性 5. 专利脉冲非连续分隔技术 – 保证严格的“V”形滤褶通道 6. 无接缝注塑一体密封垫
Camfil采用最严格的MPPS激光扫描逐台测试 -- EN1822 最新国际标准
如果不按照EN1822标准进行测试，根本不是也不能标注
H10 – H14, U15-U17！！
优异的送风均匀度- 减少工作区涡流污染
0,7-0,8
0,6-0,7
0,8

奔图技术通报PT0025(MFP系列打印机报“扫描仪内部错误11、13”的解决方案)

20140519发布对象所有奔图授权服务中心维修类型硬件调试换件适用机型奔图mfp系列故障现象刚开机或者使用过程中报
文件编号：发布部门：
PT0025 客户服务部 2014-05-19 吴帅张德勇
奔图技术通报
主题：MFP 系列打印机报“扫描仪内部错误 11、13”的解决方案发布对象维修类型适用机型所有奔图授权服务中心硬件调试、换件奔图 MFP 系列
发布时间：编审制：核：
刚开机或者使用过程中报： “扫描仪内部错误 11、13” ，同时多次开关机使扫描头复位； 2. 如多次开关机操作无效，检查扫描稿台内零部件有无脱落、错位的情况，如果有将其归位（零部件包括：扫描头滑动条、左侧皮带轮、扫描头底座、左侧位置传感器等）； 3. 如扫描稿台内零部件无脱落、错位，请将扫描稿台拆开确认扫描头是否有卡死的情况； 4. 如扫描稿台内正常，请检查扫描头排线、控制面板排线是否有断裂； 5. 若以上 4 点操作后故障依旧，请更换数据基板或扫描马达。解决方法
数据基板
扫描马达组件
扫描头排线
备注
如没有数据基板和扫描马达替换测试，请同时申请这 2 个部件。

安川机器人培训讲课文档

每个定时器只有一个输入，它与常规定时器一样，线圈通电时，开始计时；断电时，自动复位，不保存中间数值。定时器有两个数据寄存器，一个为设定值寄存器，另一个是现时值寄存器。
现在十二页，总共三十七页。
第三章编程器件介绍
3.7 计数器（CNT）控制器中的计数器，是减法计数器，它是在计数信号的上升沿进行计数，它有两个输入，
IN#12 0023
IN#20 0033
IN#05 0014
IN#13
0024 IN#21 0034
IN#06
0015
IN#14
0025
IN#22 0035
IN#07
0016
IN#15 0026
IN#23 0036
IN#08
0017
IN#16
0027
IN#24 0037
输出
编码
输出编码
输出编码
OUT#01 OUT#02 OUT#03 OUT#04 OUT#05 OUT#06 OUT#07 OUT#08
#2040 #3040
#2041
#3040
现在十五页，总共三十七页。
第四章梯形图
4.2 梯形图与助记符的对应关系：助记符指令与梯形图指令有严格的对应关系，而梯形图的连线
又可把指令的顺序予以体现。一般讲，其顺序为：先输入，后输出（含其他处理）；先上，后
下；先左，后右。有了梯形图就可将其翻译成助记符程序。上图的助记符程序为：
#XXXX #XXXX
当复位输入7011接通（ON）时，执行RST指令，计数器的当前值为3，输出接点也复位。
现在十三页，总共三十七页。
第三章编程器件介绍
3.8 数据寄存器数据寄存器是计算机必不可少的元件，用于存放各种数据。每一个数据寄存器都是

碎纸机拼接复原问题

标准化的条状纸带的采集模板(1)、用于将采集模板(1) 上的条状纸带转换为数字图像并保存原始的图像文件的扫描仪(2) 和对所述的图像文件进行处理使已被破碎的文本信息恢复原样的计算机(3) 构成。

2. 如权利要求1 所述的恢复系统，其特征在于：所述采集模板(1) 是长方形，其上沿径向均匀设置有用于镶嵌条状碎纸的矩形槽(4)。

3. 如权利要求2 所述的恢复系统，其特征在于：所述采集模板(1) 的宽和高分别是200mm 和5mm，其长是300mm、100mm 或50mm。

4. 如权利要求2 所述的恢复系统，其特征在于：所述矩形槽(4) 的长和高分别是200mm 和0.5mm，其宽是2.2mm、3.2mm 或4.2mm。

5. 如权利要求2 或3 或4 所述的恢复系统，其特征在于：所述矩形槽(4) 是采用红色或绿色的PMMA 有机玻璃制成，且其角度误差小于0.001 度。

6. 如权利要求5 所述的恢复系统，其特征在于：所述扫描仪(2) 是CanonScan 3200 型扫描仪。

7. 一种应用权利要求1 所述恢复系统进行纸质条状碎片恢复的方法，其特征在于，该方法包括以下步骤：1) 碎片整理，根据条状碎纸的长度和宽度对其进行分类，选择与其尺寸适配的采集模板(1) 和矩形槽(4)，将其展平固定在适配的矩形槽(4) 中，得到固定有条状碎纸的采集模板(1) ；2) 信息扫描，使用扫描仪(2) 扫描固定有条状碎纸的采集模板(1)，并将扫描所得数字图像以BMP 格式进行保存；3) 信息恢复，通过计算机(3) 上安装的碎纸拼接软件，对上步所得的数字图像进行处理，使得已经被破坏的文本信息得以恢复，最后以BMP 格式进行保存；所述采集模板(1) 是长方形的，其上均匀设置有用于镶嵌条状碎纸的矩形槽(4)。

8. 如权利要求7 所述的恢复方法，其特征在于：步骤2) 中扫描固定有条状碎纸的采集模板(1) 时，该采集模板(1) 的直角边与扫描仪(2) 面板的直角边要完全契合，防止出现倾斜，且一次性可以扫描多个该采集模板(1)。

RockwellScanddevicenet故障代码

Rockwell device net scanner--1769 故障代码Code(decimal)Name Description Recommended Action70Duplicate Node Controller has Failed DuplicateNode Address Check. The nodeaddress selected is already in use扫描器检查到重号,另外一格节点有相同站号Change the module’s or conflictingdevice’s network address (nodenumber) to an available one.71Illegal Scan List Data Illegal data in Scan List.Reconfigure the scan list table andremove any illegal data.72Slave Timeout One of the module’s slave deviceshas stopped communicating.某个从设备长时间没有响应,代码后面给出站号Inspect the module’s slave devicesandverify the DeviceNet connections.73Electronic KeyMismatch The slave device Vendor ID keyparameter does not match theslave’s configuration in themodule’s scan list扫描器的扫描列表中设定的电子识别不匹配,代码后面给出站号Make sure that the device at theflashing node address matches thedesired electronic key (vendor,productcode, product type)75No MessagesReceived No network traffic received by thescanner. 10 seconds have elapsedand no network traffic for themodule or for any other device havebeen received by the module扫描器扫描未激活Verify the scan list is correctlyconfigured to scan slave devices.VerifyDeviceNet network connections76No MessageFor Scanner No direct network traffic for thescanner detected. 10 secondselapsed and no DeviceNet inputbeing screened by the module hasbeen received.扫描器扫描未激活None. There are other active devicesonthe network, initiating messages, butnone of the messages are for themodule77Slave Data SizeMismatchThe data being received from theslave device does not match theconfiguration in the scan list.扫描器扫描列表中传送和接受的数据尺寸与设备中的不匹配,代码后面给出站号Either reconfigure the slave device, orchange the module’s scan list tomatchthe slave device78No SuchDevice No SuchDevice从设备不扫描从扫描器得到响应,代码后面给出站号Either add the device to the DeviceNetnetwork, or delete the device’s entry inthe scan list79TransmitFailure The module has failed to transmit amessage.扫描器重号传送没应答,网络不线有Make sure that the module isconnected to a valid network. Checkfordisconnected cables问题,或没有其它设备.在网上.80In Idle Mode Module is in Idle mode.控制器没有运行状态或命令没有使能RUN Put the controller into Run mode and enable the scanner Run bit (bit 0 of theModule Command Array = 1). See page81ScannerFaulted The Scanner has stopped producingand consuming I/O data. Thiscondition does not affect thescanner’s system or messagingmodes控制器没有运行状态或扫描器故障Check the FAULT value in the modulecommand array.82FragmentationError Error detected in sequence offragmented I/O messages fromdeviceCheck scan list table entry for slavedevice to make sure that input andoutput data lengths are correct. Checkslave device configuration.83Slave Init Error Slave device is returning errorresponses when the moduleattempts to communicate with it.从设备返回错误响应,如从设备不支持扫描器的请求的连接类型或设备有另一格主设备拥有.Check slave device’s configuration. Reboot slave device.84Not YetInitialized Module has not completed its initialattempt to establishcommunications with its slaves.扫描器正在初始化通讯,发生在上电和扫描器与设备通信自动清除后None. This code clears itself once themodule properly initializes all slavedevices on the network.85Receive BufferOverflow Data size returned is larger thanExpected扫描器列表中传送和接受的数据尺寸与从设备中的不匹配,扫描器与从设备的通信正常,但从设备的I/O尺寸改变,代码后面给出站号Configure the slave device for asmallerdata size86Device WentIdle Device is producing Idle state.扫描器在运行方式产生了Idle数据,扫描器曾经接受过数据,但现在得到的是0B.Check the device configuration andslave node status89Auto DeviceReplacement(ADR) Error Slave device responded with anerror to the initialization data sentto it by the scanner; or theconfiguration table in the scanner’sflash memory is not valid for a slavenode.当执行ADR命令时扫描器发生错误,或许是存储在扫描器中的ADR文Try the ADR download again. If it stillfails, try clearing the ADR flash bydownloading an empty ADRconfiguration to the scanner and thentry the ADR configuration again件与设备不匹配,从装哟一效的ADR,以解决问题90DisabledNetwork DeviceNet Port is Disabled扫描器在 DISABLE 方式Check for the disable being set in themodule command array.91Bus Off Bus off condition detected onintegral DeviceNet port扫描器在BUS-OFF,重上电以解决问题.亦可直接显示BUS-OFF Check the DeviceNet connections and physical media integrity. Check systemfor failed slave devices or other possible sources of network interference. Check the Baud Rate92No DeviceNetPower No network power detected onDeviceNet port没有24的连到扫描器Provide network power. Make sure themodule drop cable is providing theproper power to the DeviceNet port.95FLASH Update Flash Update In Progress扫描器版本刷新,扫描器列表或组态下载None. DO NOT disconnect themodulefrom the network while a flash updateis in progress.97扫描器在 HALT 方式98FirmwareCorruptedFirmware is corrupted.Reflash module firmware. DO NOTpower cycle the module. Doing somaycause the module to becomeinoperable If the problem persistscontact Rockwell AutomationTechnicalSupport.99Hard Fault Cycle Power. Reflash modulefirmware.Contact Rockwell AutomationTechnicalSupport.。