54F14FM中文资料

TL F 946154F 74F14Hex Inverter Schmitt TriggerDecember 199454F 74F14Hex Inverter Schmitt TriggerGeneral DescriptionThe ’F14contains six logic inverters which accept standard TTL input signals and provide standard TTL output levels They are capable of transforming slowly changing input sig-nals into sharply defined jitter-free output signals In addi-tion they have a greater noise margin than conventional invertersEach circuit contains a Schmitt trigger followed by a Darling-ton level shifter and a phase splitter driving a TTL totem-pole output The Schmitt trigger uses positive feed back toeffectively speed-up slow input transition and provide differ-ent input threshold voltages for positive and negative-going transitions This hysteresis between the positive-going and negative-going input thresholds (typically 800mV)is deter-mined internally by resistor ratios and is essentially insensi-tive to temperature and supply voltage variationsFeaturesY Guaranteed 4000V minimum ESD protection YStandard Military Drawing 5962-88752Commercial MilitaryPackage Package DescriptionNumber 74F14PCN14A14-Lead (0 300 Wide)Molded Dual-In-Line 54F14DM (Note 2)J14A 14-Lead Ceramic Dual-In-Line74F14SC (Note 1)M14A 14-Lead (0 150 Wide)Molded Small Outline JEDEC 74F14SJ (Note 1)M14D 14-Lead (0 300 Wide)Molded Small Outline EIAJ 54F14FM (Note 2)W14B 14-Lead Cerpack54F14LM (Note 2)E20A20-Lead Ceramic Leadless Chip Carrier Type CNote 1 Devices also available in 13 reel Use Suffix e SCX and SJXNote 2 Military grade device with environmental and burn-in processing Use suffix e DMQB FMQB and LMQBLogic SymbolIEEE IECTL F 9461–3Connection DiagramsPin Assignment DIP SOIC and FlatpakTL F 9461–1Pin Assignmentfor LCCTL F 9461–2TRI-STATE is a registered trademark of National Semiconductor Corporation C 1995National Semiconductor CorporationRRD-B30M75 Printed in U S AUnit Loading Fan Out54F 74F Pin Names Description U L Input IIH I ILHIGH LOW Output I OH I OLI n Input1 0 1 020m A b0 6mAO n Output50 33 3b1mA 20mA Function TableInput OutputA OL HH LH e HIGH Voltage LevelL e LOW Voltage Level2Absolute Maximum Ratings(Note1)If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications Storage Temperature b65 C to a150 C Ambient Temperature under Bias b55 C to a125 C Junction Temperature under Bias b55 C to a175 C V CC Pin Potential toGround Pin b0 5V to a7 0V Input Voltage(Note2)b0 5V to a7 0V Input Current(Note2)b30mA to a5 0mA Voltage Applied to Outputin HIGH State(with V CC e0V)Standard Output b0 5V to V CC TRI-STATE Output b0 5V to a5 5V Current Applied to Outputin LOW State(Max)twice the rated I OL(mA) ESD Last Passing Voltage(Min)4000V Note1 Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired Functional operation under these conditions is not impliedNote2 Either voltage limit or current limit is sufficient to protect inputs Recommended Operating ConditionsFree Air Ambient TemperatureMilitary b55 C to a125 C Commercial0 C to a70 C Supply VoltageMilitary a4 5V to a5 5V Commercial a4 5V to a5 5VDC Electrical CharacteristicsSymbol Parameter54F 74FUnits V CC Conditions Min Typ MaxV T a Positive-Going Threshold1 51 72 0V5 0VV T b Negative-Going Threshold0 70 91 1V5 0VD V T Hysteresis(V T a–V T b)0 40 8V5 0VV CD Input Clamp Diode Voltage b1 2V Min I IN e b18mAV OH Output HIGH54F10%V CC2 5I OH e b1mA Voltage74F10%V CC2 5V Min I OH e b1mA74F5%V CC2 7I OH e b1mAV OL Output LOW54F10%V CC0 5V Min I OL e20mAVoltage74F10%V CC0 5I OL e20mAI IH Input HIGH54F20 0m A Max V IN e2 7VCurrent74F5 0I BVI Input HIGH Current54F100m A Max V IN e7 0VBreakdown Test74F7 0I CEX Output HIGH54F250m A Max V OUT e V CCLeakage Current74F50V ID Input Leakage74F4 75V Max I ID e1 9m ATest All Other Pins GroundedI OD Output Leakage74F3 75m A0 0V IOD e150mVCircuit Current All Other Pins Grounded I IL Input LOW Current b0 6mA Max V IN e0 5VI OS Output Short-Circuit Current b60b150mA Max V OUT e0VI CCH Power Supply Current25mA Max V O e HIGHI CCL Power Supply Current25mA Max V O e LOW3AC Electrical Characteristics74F54F74FT A e a25 CT A V CC e Mil T A V CC e Com Symbol Parameter V CC e a5 0VC L e50pF C L e50pF UnitsC L e50pFMin Max Min Max Min Maxt PLH Propagation Delay4 010 54 013 04 011 5ns t PHL I n x O n3 58 53 510 03 59 0Ordering InformationThe device number is used to form part of a simplified purchasing code where the package type and temperature range are defined as follows74F14S C XTemperature Range Family Special Variations74F e Commercial QB e Military grade device with54F e Military environmental and burn-inprocessingDevice Type X e Devices shipped in13 reelsPackage Code Temperature RangeP e Plastic DIP C e Commercial(0 C to a70 C)D e Ceramic DIP M e Military(b55 C to a125 C)F e FlatpakL e Leadless Chip Carrier(LCC)S e Small Outline SOIC JEDECSJ e Small Outline SOIC EIAJ4Physical Dimensions inches(millimeters)20-Terminal Ceramic Leadless Chip Carrier(L)NS Package Number E20A5Physical Dimensions inches(millimeters)(Continued)14-Lead Ceramic Dual-In-Line Package(D)NS Package Number J14A14-Lead(0 150 Wide)Molded Small Outline Package JEDEC(S)NS Package Number M14A6Physical Dimensions inches(millimeters)(Continued)14-Lead(0 300 Wide)Molded Small Outline Package EIAJ(SJ)NS Package Number M14D14-Lead(0 300 Wide)Molded Dual-In-Line Package(P)NS Package Number N14A754F 74F 14H e x I n v e r t e r S c h m i t t T r i g g e rPhysical Dimensions inches (millimeters)(Continued)14-Lead Ceramic Flatpak (F)NS Package Number W14BLIFE SUPPORT POLICYNATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION As used herein 1 Life support devices or systems are devices or 2 A critical component is any component of a life systems which (a)are intended for surgical implant support device or system whose failure to perform can into the body or (b)support or sustain life and whose be reasonably expected to cause the failure of the life failure to perform when properly used in accordance support device or system or to affect its safety or with instructions for use provided in the labeling can effectivenessbe reasonably expected to result in a significant injury to the userNational Semiconductor National Semiconductor National Semiconductor National Semiconductor National Semiconductores National Semiconductor CorporationGmbHJapan LtdHong Kong LtdDo Brazil Ltda(Australia)Pty Ltd 2900Semiconductor DriveLivry-Gargan-Str 10Sumitomo Chemical13th Floor Straight Block Rue Deputado Lacorda Franco Building 16。