Generating test data with enhanced context-free grammars

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Keysight MXG X-Series Signal Generator N5181B N518

Keysight MXG X-Series Signal Generator N5181B N518

MXG X-Series Signal Generators N5181B Analog and N5182B Vector This configuration guide will help you determine which performanceoptions, software applications, accessories, and services to include with your new MXG or to add as upgrades to an existing MXG.Configure Your MXG X-Series Signal GeneratorThis step-by-step process will help you configure your MXG signal generator. Tailor the performance to meet your requirements. For detailed specifications, refer to the MXG signal generator data sheet (5991-0038EN).N5181B MXG X-Series RF Analog Signal GeneratorConfigure your new MXG analog signal generatorDescription Option number Additional informationFrequency range from 9 kHz to 3 GHz N5181B-503 Not compatible with 506Frequency range from 9 kHz to 6 GHz N5181B-506 Not compatible with 503Description Option number Additional informationAM, FM, phase modulation N5181B-UNTLow phase noise N5181B-UNX Not compatible with UNY, not upgradableEnhanced low phase noise N5181B-UNY Not compatible with UNX, not upgradableFast switching N5181B-UNZNarrow pulse modulation N5181B-UNWMultifunction generator N5181B-303Instrument security and removablememory cardN5181B-006No internal non-volatile memory N5181B-SD0 Requires firmware B.01.80 or newerHigh output power N5181B-1EALow specified power (<–110 dBm) N5181B-1EQFlexible reference input (1 to 50 MHz) N5181B-1ERExpanded license key upgradability N5181B-099 Option 099 is recommended for anyone considering future upgrades. Option 099 simplifies the upgrade process by enabling upgrades via a license key for Options 1EA, 1EQ, and UNZ. Without Option 099, upgrades for these options require purchase and installation of hardware in a field retrofit kit. For more information, visit/find/SSupgrades.Description Option numberRack slide kit 1CR112AFront handle kit 1CN106ARack mount flange kit 1CM110ARack mount flange kit with front handles 1CP104AFront panel cover N5181B-CVRHard transit case N5181B-AXTCD-ROM containing English documentation set N5181B-CD1Note: The following software can be added at purchase or as an upgrade. For more information on licenses, go to /find/SS_licensingDescription Option number Hardware requirements Avionics (VOR/ILS) N5180302BPulse train generator N5180320B UNWDescription Option numberMXG analog ANSI Z540-1-1994 calibration N5181B-A6JMXG analog Keysight Cal + uncertainties +N5181B-AMGguardbanding (accredited cal)Commercial calibration certificate with test data N5181B-UK6Calibration Assurance Plan, Return-to-Keysight, 5 Years R-50C-011-5Calibration Assurance Plan, Return-to-Keysight, 7 Years R-50C-011-7Calibration Assurance Plan, Return-to-Keysight, 10 Years R-50C-011-10Description Option numberRemote scheduled assistance 1- 999 hours PS-S10Daily productivity assistance PS-S20Signal generator and source basics; half-day, maximumPS-T10-ASGof eight students on siteCustom services to be qualified by Keysight PS-X10Upgrade your Existing MXG Analog Signal GeneratorFast license-key upgrades for options that do not require additional hardware:1. Place an order for the upgrade with Keysight and request to receive thesoftware entitlement certificate through email2. Redeem the certificate through the Web by following the instructions onthe certificate3. Install the license file using Keysight License Manager4. Begin using the new capabilityInstallation, calibration, and verification information is available at:/find/mxg_upgradesDescription Upgrade number Requirements Additional informationInstrument security and removablememory cardN5181BU-006 None Hardware and license key upgradeNo internal non-volatile memory N5181BU-SD0 None Customer installable - software, license keyRequires firmware B.01.80 or newerExpanded license key upgradability N5181BU-099 None Hardware and license key upgradeHigh output power N5181BU-1EA 099 Customer installable - software, license keyLow specified power (<–110 dBm) N5181BU-1EQ 099Customer installable - software,license keyFlexible reference input (1 to 50 MHz) N5181BU-1ER NoneCustomer installable - software,license keyMultifunction generator N5181BU-303 None Customer installable - software, license keyAvionics (VOR/ILS) N5180302B None Customer installable - software, license keyPulse train generator N5180320B UNW Customer installable - software, license keyAM, FM, phase modulation N5181BU-UNT None Customer installable - software, license keyNarrow pulse modulation N5181BU-UNW None Customer installable - software, license keyFast switching N5181BU-UNZ 099 Customer installable - software, license keyRack slide kit 1CR112A None Hardware Front handle kit 1CN106A None Hardware Rack mount flange kit 1CM110A None Hardware Rack mount flange kit withfront handles1CP104A None Hardware Front panel cover N5180-40019 None Hardware You Can Upgrade! Options can be addedafter your initial purchase. Most X-Series options are license-key upgradeable.N5182B MXG X-Series RF Vector Signal GeneratorConfigure your new MXG vector signal generatorDescription Option number Additional informationFrequency range from 9 kHz to 3 GHz N5182B-503 Not compatible with 506Frequency range from 9 kHz to 6 GHz N5182B-506 Not compatible with 503Frequency range from 9 kHz to 7.2 GHz N5182B-FRQ Requires 506 and N5182BX07 Frequency Extender1 1. The N5182BX07 Frequency Extender is orderable separately. Refer to the N5182BX07 configuration guide formore information.Description Option number Additional informationMove all connectors to rear panel N5182B-1EM Not upgradableDifferential I/Q outputs N5182B-1ELDescription Option number Additional informationAM, FM, phase modulation N5182B-UNTEnhanced dynamic range N5182B-UNV Requires 656Narrow pulse modulation N5182B-UNWLow phase noise N5181B-UNX Not compatible with UNY, not upgradeable Enhanced low phase noise N5182B-UNY Not compatible with UNX, not upgradeableFast switching N5182B-UNZMultifunction generator N5182B-303Instrument security and removablememory cardN5182B-006Internal solid-state memory N5182B-009No internal non-volatile memory/solid state drive N5182B-SD0Not compatible with option 009 and 660Requires firmware B.01.80 or newerHigh output power N5182B-1EA Low specified power (<–110 dBm) N5182B-1EQ Flexible reference input (1 to 50 MHz) N5182B-1ER LO in/out for phase coherency N5182B-012Expanded license key upgradability N5182B-099 Option 099 is recommended for anyone considering future upgrades. Option 099 simplifies the upgrade process by enabling upgrades via a license key for Options 1EA, 1EQ, UNV, and UNZ. Without Option 099, upgrades for these options require purchase and installation of hardware in a field retrofit kit. For more information, visit/find/SSupgrades.Description Option number Additional informationARB baseband generator(80 MHz RF bandwidth, 32 MSa)N5182B-656Upgrade baseband generator from 80to 160 MHz RF bandwidthN5182B-657 Requires 656Upgrade baseband generator memoryfrom 32 to 512 MSaN5182B-022 Requires 656Upgrade baseband generator memoryfrom 32 to 1 GSaN5182B-023 Requires 656Upgrade baseband generator withreal-time capabilityN5182B-660 Requires 656Digital output connectivity with theN5102AN5182B-003 Requires 656, not upgradableDigital input connectivity with theN5102AN5182B-004 Requires 656, not upgradableNote: The following software can be added at purchase or as an upgrade. To configure Signal Studio applications, refer to the configuration assistant at: /find/signalstudio. For more information on Signal Studio configuration and licenses, go to /find/SS_licensing.Product number Description Hardware requirementsRecommended hardwareoptionsCellular communicationsN7600C Signal Studio for W-CDMA/HSPA+(ARB and real-time)656660 for real-time503, UNV, 403N7601C Signal Studio for cdma2000/1xEV-DO(ARB and real-time)656660 for real-time503, 403, UNVN7602C Signal Studio for GSM/EDGE/Evo(ARB and real-time)656660 for real-time503, 403, UNV, UNZN7612C Signal Studio for TD-SCDMA/HSDPA 656 503, 403, UNVN7624C Signal Studio for LTE/LTE-Advanced FDD(ARB and real-time)656660 for real-time657, 506, 403, UNVN7625C Signal Studio for LTE/LTE-Advanced TDD(ARB and real-time)656660 for real-time657, 506, 403, UNVN7626C Signal Studio for V2X 656, 506 403, 1EA, 1ER, 009, 655, UNV, UNZN7630C Signal Studio for Pre-5G 656 403, 506, 657, UNVN7606C Signal Studio for Bluetooth656 506, 403, UNVN7615C Signal Studio for Mobile WiMAX 656 506, 403, UNVN7617C Signal Studio for WLAN802.11a/b/g/j/p/n/ac656 657, 506, 403, UNVN7607C Signal Studio for DFS radar profiles 656, 506 657 N7610C Signal Studio for Internet of Things (IoT) 656Audio/video broadcastingN7611C Signal Studio for broadcast radio656 506, 403, UNVN7623C Signal Studio for digital video(ARB and real-time)656660 for real-time506, 403, 023, UNVN7609CSatellite Systems (GNSS) (real-time) 660 for real-time503, 023, 403N5180302B Avionics (VOR/ILS)N5180403B Calibrated AWGN 656N5180430B Multitone and two-tone 656N5180431B Custom digital modulation 656N5180432B Phase noise impairment 656N5180UN7B Internal bit error rate analyzerN7605C Signal Studio for real-time fading (real-time) 656, 403660 for real-time506, 657N7608C Signal Studio for custom modulation656, 506N7614C Signal Studio for power amplifier test 656660 for real-time657, 1EA N7621B Signal Studio for multitone distortion 656, UNV, 1EA 657N7622C Signal Studio toolkit – free utility 656 503, UNVN5182B 221-229 Waveform license 5-pack 1 to 9(purchase up to 9 packs for 45 SignalStudio waveforms)656 503, UNVN5182B 250-259 Waveform license 50-pack 1 to 10(purchase up to 10 packs for 500 SignalStudio waveforms)656 503, UNVN6171A MATLAB software 656, 503, UNVStep 6. Choose accessory and documentation optionsDescription Option numberRack slide kit 1CR112AFront handle kit 1CN106ARack mount flange kit 1CM110ARack mount flange kit with front handles 1CP104AFront panel cover N5182B-CVRHard transit case N5182B-AXTCD-ROM containing English documentation set N5182B-CD1Step 7. Choose calibration optionsDescription Option number Keysight Calibration + Uncertainties + GuardbandingN5182B-AMG (accredited cal)Commercial calibration certificate with test data N5182B-UK6ANSI Z540-1-1994 Calibration N5182B-A6J Calibration Assurance Plan, Return-to-Keysight, 5 years R-50C-011-5 Calibration Assurance Plan, Return-to-Keysight, 7 years R-50C-011-7 Calibration Assurance Plan, Return-to-Keysight, 10 years R-50C-011-10Keysight Calibration + Uncertainties + GuardbandingN5182B-AMG (accredited cal)Step 8. Choose startup assistance service optionsDescription Option number Remote scheduled assistance 1- 999 hours PS-S10Daily productivity assistance PS-S20Signal generator and source basics; half-day, maximumPS-T10-ASG of eight students on siteCustom services to be qualified by Keysight PS-X10Upgrade your Existing MXG Vector Signal GeneratorFast license-key upgrades for options that do not require additional hardware:5. Place an order for the upgrade with Keysight and request to receive thesoftware entitlement certificate through email6. Redeem the certificate through the Web by following the instructions onthe certificate7. Install the license file using Keysight License Manager8. Begin using the new capabilityInstallation, calibration, and verification information is available at:/find/mxg_upgradesDescription Upgrade number Requirements Additional informationInstrument security and removablememory cardN5182BU-006 None Hardware and license key upgradeInternal solid-state memory N5182BU-009 None Customer installable – software, license keyNo internal non-volatile memory/solid state drive N5182BU-SD0 NoneCustomer installable - software, licensekey and hardwareRequires firmware B.01.80 or newerNot compatible with option 009 and 660LO in/out for phase coherency N5182BU-012 None Hardware and license key upgradeUpgrade baseband generator memory from 32 to 512 MSa N5182BU-022 656Customer installable – software,license keyUpgrade baseband generator memory from 32 MSa to 1 GSa N5182BU-023 656Customer installable – software,license keyUpgrade baseband generator memory from 512 MSa to 1 GSa N5182BU-043 022 and 656Customer installable – software,license keyExpanded license key upgradability N5182BU-099 None Hardware and license key upgradeHigh output power N5182BU-1EA 099 Customer installable – software, license keyDifferential I/Q outputs N5182BU-1EL None Customer installable – software, license keyLow specified power (<–110 dBm) N5182BU-1EQ 099 Customer installable – software, license keyFlexible reference input (1 to 50 MHz) N5182BU-1ER NoneCustomer installable – software,license key5-pack waveform license N5182BU-221 656 Customer installable – software, license key50-pack waveform license N5182BU-250 656 Customer installable – software, license keyMultifunction generator N5182BU-303 None Customer installable – software, license keyAvionics (VOR/ILS) N5180302B None Customer installable – software, license keyPulse train generator N5180320B UNW Customer installable – software, license keyCalibrated AWGN N5180403B 656 Customer installable – software, license keyYou Can Upgrade!Options can be addedafter your initialpurchase. Most X-Series options arelicense-keyupgradeable.Multitone and two-tone N5180430B 656license keyCustom digital modulation N5180431B 656 Customer installable – software, license keyPhase noise impairment N5180432B 656 Customer installable – software, license keyInternal bit error rate analyzer N5180UN7B None Customer installable - software, license keyARB baseband generator (80 MHz RF bandwidth, 32 MSa) N5182BU-656 NoneCustomer installable – software,license keyUpgrade baseband generator from 80 to 160 MHz RF bandwidth N5182BU-657 656Customer installable – software,license keyUpgrade baseband generator withreal-time capabilityN5182BU-660 656 Hardware and license key upgradeAM, FM, phase modulation N5182BU-UNT None Customer installable – software, license keyEnhanced dynamic range N5182BU-UNV 099, 656 Customer installable – software, license keyNarrow pulse modulation N5182BU-UNW None Customer installable – software, license keyFast switching N5182BU-UNZ 099 Customer installable – software, license keyRack slide kit 1CR112A None Hardware Front handle kit 1CN106A None Hardware Rack mount flange kit 1CM110A None Hardware Rack mount flange kit with fronthandles1CP104A None Hardware Front panel cover N5180-40019 None HardwareFrequency extender connectivity N5182BU-FRQ 506 Customer installable - software, license keyRequires N5182BX07 Frequency ExtenderPFind us at Page 11Learn more at: For more information on Keysight Technologies’ products, applications or services,please contact your local Keysight office. The complete list is available at:/find/contactusThis information is subject to change without notice. © Keysight Technologies, 2020, Publishe d in USA, July 31, 2020, 5990-9959EN Related LiteratureDescriptionAdditional information X-Series Signal Generators N5181B/N5171B AnalogN5182B/N5172B Vector –Technical Overview5990-9957EN MXG X-Series Signal Generators N5181B Analog & N5182BVector – Data Sheet 5991-0038EN N5182BX07 Frequency Extender User Guide N5182-90001For more information, visit /find/MXG。

chatgpt对于工作产生的影响英语作文

chatgpt对于工作产生的影响英语作文

chatgpt对于工作产生的影响英语作文全文共3篇示例,供读者参考篇1The Impact of ChatGPT on WorkIntroductionChatGPT, also known as GPT-3, is a cutting-edge language model developed by OpenAI that has had a significant impact on various aspects of our lives, including the way we work. With its ability to generate human-like text and engage in conversations, ChatGPT has revolutionized the way we interact with technology and each other in a professional setting. In this essay, we will explore the ways in which ChatGPT has influenced and transformed the workplace.Improved CommunicationOne of the most noticeable impacts of ChatGPT on work is the improvement in communication among colleagues and clients. ChatGPT has the capability to generate coherent and contextually relevant responses, making it a valuable tool for facilitating conversations, brainstorming sessions, and decision-making processes. Employees can use ChatGPT toquickly draft emails, reports, and other written communications, saving time and increasing productivity. Additionally, ChatGPT can assist in translating messages into different languages, enabling seamless communication with international partners and customers.Enhanced Creativity and InnovationAnother significant impact of ChatGPT on work is its role in enhancing creativity and driving innovation. ChatGPT can provide valuable insights, generate new ideas, and assist in problem-solving by offering unique perspectives and suggestions. Employers can leverage ChatGPT to spark creativity in their teams, encourage out-of-the-box thinking, and foster a culture of innovation. Moreover, ChatGPT can help in automating repetitive tasks, allowing employees to focus on more creative and strategic initiatives that add value to the organization.Efficient Customer ServiceChatGPT has revolutionized customer service by enabling businesses to provide immediate and personalized assistance to their clients. Chatbots powered by ChatGPT can interact with customers in real-time, answer their queries, and assist them in finding solutions to their problems. This not only enhances thecustomer experience but also reduces the workload on human customer service representatives, allowing them to focus on more complex issues that require human intervention. Additionally, ChatGPT can analyze customer feedback and sentiment, enabling businesses to make data-driven decisions and improve their products and services.Streamlined WorkflowsChatGPT has played a key role in streamlining workflows and increasing operational efficiency in the workplace. By automating repetitive tasks such as data entry, scheduling, and document generation, ChatGPT helps employees save time and reduce errors. This allows organizations to optimize their processes, eliminate bottlenecks, and improve overall productivity. Furthermore, ChatGPT can assist in organizing and categorizing information, making it easier for employees to access relevant data and make informed decisions quickly.Challenges and ConsiderationsDespite its numerous benefits, ChatGPT also poses some challenges and considerations in the workplace. One of the primary concerns is the potential misuse of ChatGPT, such as spreading misinformation, generating biased content, or impersonating individuals. Organizations must establishguidelines and protocols for using ChatGPT ethically and responsibly to mitigate these risks. Additionally, there may be concerns about job displacement and the impact of automation on the workforce. While ChatGPT can automate certain tasks, it also creates new opportunities for employees to upskill, reskill, and engage in more meaningful and fulfilling work.ConclusionIn conclusion, ChatGPT has had a profound impact on work by improving communication, enhancing creativity and innovation, enabling efficient customer service, and streamlining workflows. As organizations continue to adopt and integrate ChatGPT into their operations, it is essential to consider the challenges and ethical implications associated with its use. By harnessing the power of ChatGPT responsibly and thoughtfully, we can leverage its capabilities to drive positive change and create a more productive and collaborative work environment.篇2The Impact of ChatGPT on WorkIn recent years, the rise of artificial intelligence has led to significant changes in the workplace. One such innovation that has been making waves in the business world is ChatGPT, alanguage model developed by OpenAI that is capable of engaging in natural language conversations. This technology has the potential to revolutionize the way we work, communicate, and collaborate with others. In this essay, we will explore the various ways in which ChatGPT is influencing the way we work and the impact it is having on different industries.One of the most immediate effects of ChatGPT on the workplace is its ability to streamline communication. With ChatGPT, employees can quickly and efficiently communicate with one another, saving time and reducing the need for long, drawn-out email threads or meetings. This has the potential to improve productivity and collaboration within teams, as information can be shared and decisions can be made more quickly.Furthermore, ChatGPT can also assist in customer service by providing instant responses to customer inquiries. This can help businesses provide better customer service and improve customer satisfaction. ChatGPT's ability to understand and respond to natural language queries in real-time can help businesses handle large volumes of customer inquiries more efficiently, leading to happier customers and increased sales.In addition to streamlining communication and improving customer service, ChatGPT can also assist with tasks that require a high level of attention to detail. For example, ChatGPT can help with tasks such as data entry, proofreading, and scheduling. By automating these tasks, employees can focus on morehigh-value work, such as problem-solving, decision-making, and creative tasks.However, while ChatGPT offers many benefits to the workplace, it also raises a number of ethical concerns. For example, as ChatGPT becomes more advanced and capable of engaging in more complex conversations, there is a risk that it may be used to deceive or manipulate others. Additionally, there are concerns about the impact of ChatGPT on the job market, as the technology has the potential to automate many tasks that are currently carried out by humans.Overall, ChatGPT has the potential to revolutionize the way we work by streamlining communication, improving customer service, and assisting with tasks that require attention to detail. However, it is important for businesses to be mindful of the ethical implications of using ChatGPT and to consider how the technology may impact the job market. By embracing ChatGPT responsibly, businesses can harness its potential to improveproductivity, collaboration, and customer satisfaction in the workplace.篇3The Impact of ChatGPT on WorkIntroductionArtificial intelligence has revolutionized various aspects of our lives, including communication. ChatGPT, an advanced language model developed by OpenAI, has been widely used in various industries to improve customer service, automate replies, and enhance communication between colleagues. In this essay, we will explore the impact of ChatGPT on work and the benefits and challenges it brings.Enhanced Customer ServiceOne of the main advantages of using ChatGPT in the workplace is the enhancement of customer service. Companies can use ChatGPT to automate responses to customer inquiries, providing quick and accurate information to customers. This not only improves customer satisfaction but also reduces the workload of customer service agents, allowing them to focus on more complex issues.Efficient CommunicationChatGPT also improves communication between colleagues by providing instant and accurate responses to queries. This can help streamline workflows, facilitate decision-making, and increase productivity. With ChatGPT, team members can quickly get the information they need without having to wait for a response from a colleague, leading to more efficient work processes.Personalized AssistanceAnother benefit of ChatGPT is its ability to provide personalized assistance to employees. By analyzing data and preferences, ChatGPT can offer tailored recommendations, advice, and support to individuals based on their needs. This can help employees improve their performance, develop new skills, and achieve their goals more effectively.Challenges of ChatGPTDespite its numerous benefits, ChatGPT also presents some challenges in the workplace. One of the main concerns is the potential for errors and inaccuracies in responses generated by the model. While ChatGPT is highly advanced, it is not infallibleand may sometimes provide incorrect information, leading to misunderstanding or confusion among users.Another challenge is the potential for overreliance on ChatGPT, which can lead to a decrease in critical thinking and problem-solving skills among employees. If individuals become too dependent on ChatGPT for information and decision-making, they may neglect to develop their own abilities, which can hinder their professional development in the long run.Furthermore, there are concerns about privacy and data security when using ChatGPT in the workplace. Since the model processes large amounts of data to generate responses, there is a risk of sensitive information being exposed or misused, raising questions about data protection and confidentiality.ConclusionIn conclusion, ChatGPT has had a significant impact on work, improving customer service, enhancing communication, and providing personalized assistance to employees. While the model offers many benefits, it also presents challenges that need to be addressed, such as errors in responses, overreliance on the model, and concerns about privacy and data security. Overall, ChatGPT has the potential to transform the way we work, but it isessential to use it responsibly and thoughtfully to maximize its benefits while mitigating its risks.。

graphic device

graphic device

graphic deviceGraphic DeviceIntroduction:In today's digital world, graphic devices play a crucial role in various industries, including gaming, entertainment, design, and advertising. Graphic devices are hardware components that enable the transformation of digital instructions into meaningful visual output. They are responsible for creating and rendering images, videos, animations, and various graphical elements. This document provides a comprehensive overview of graphic devices, discussing their types, functionalities, and importance in modern technology.Types of Graphic Devices:Graphic devices come in different forms and serve diverse purposes. The following are some commonly used types of graphic devices:1. Graphics Processing Unit (GPU):The Graphics Processing Unit, commonly known as GPU, is an essential component in computers, gaming consoles, and smartphones. Its primary function is to process and render graphical data. A GPU comprises several cores and is highly specialized in performing complex mathematical and geometric calculations. With the evolution of GPUs, real-time rendering and advanced visual effects have become possible in various applications.2. Video Card:Also known as a display adapter, a video card is an expansion card that generates and outputs visual data to a display device, such as a monitor or a projector. It connects to the computer's motherboard and processes the graphical instructions received from the CPU. The video card utilizes its built-in GPU to render the visual content, which is then transmitted to the display device for user interaction.3. Integrated Graphics:Integrated graphics refers to the graphical processing capabilities integrated into the computer's central processing unit (CPU). Unlike discrete graphic devices like GPUs or video cards, integrated graphics are a part of the overall CPU architecture. They are generally less powerful than dedicated graphic devices but can handle basic graphics tasks, such as web browsing, office applications, and light gaming.Functionalities of Graphic Devices:Graphic devices offer various functionalities that are vital for creating and presenting visually appealing content. Some of the key functionalities are as follows:1. Rendering:Rendering is the process of generating visual output from digital data. Graphic devices, especially GPUs, excel at rendering complex graphics, 3D models, and simulations. They perform calculations to determine the position, color, texture, and lighting effects of each pixel, resulting in realistic and immersive visuals.2. Image Processing:Graphic devices also have image processing capabilities. They can manipulate digital images by applying filters, adjusting brightness, contrast, and color levels. Image processing techniques are widely used in photography, video editing, and special effects creation.3. Video Playback and Encoding:Graphic devices are responsible for smooth video playback on various devices. They decode video files and display them on the screen in real-time. Additionally, graphic devices assist in video encoding, converting video files into different formats or compressing them for efficient storage and transmission.4. Gaming Support:One of the primary uses of graphic devices is in gaming. They handle complex calculations and render high-quality visuals, enabling immersive gaming experiences. With features like real-time ray tracing and advanced shading techniques, modern graphic devices greatly enhance the realism and detail in games.Importance of Graphic Devices:Graphic devices have revolutionized the way we interact with technology and consume visual content. Their significance can be highlighted through the following points:1. Enhanced Visual Experience:From high-definition videos to lifelike game graphics, graphic devices are instrumental in creating immersive visualexperiences. They bring digital content to life, making it more engaging and enjoyable for users.2. Productivity and Creativity:Graphic devices empower professionals in various industries by providing tools for advanced design, 3D modeling, and video editing. These devices enable efficient workflows and allow individuals to unleash their creative potential.3. Real-Time Performance:The computing power of graphic devices, particularly GPUs, allows for real-time rendering and quick response times. This is crucial in applications like virtual reality (VR), simulations, and live event graphics.4. Technological Advancements:Graphic devices continue to advance at a rapid pace, driving innovation in several areas. The development of high-performance GPUs has paved the way for breakthroughs in artificial intelligence, machine learning, and cryptocurrency mining.Conclusion:In conclusion, graphic devices are indispensable components of modern technology. Their ability to generate, process, and render visual content revolutionizes industries such as gaming, entertainment, design, and advertising. With their advanced functionalities and constantly improving performance, graphic devices continue to shape the way we perceive and interact with the digital world.。

大数据英文版简版

大数据英文版简版

大数据英文版Title: The Significance and Impact of Big DataIntroduction:In today's digital age, the term "Big Data" has gained significant attention and importance. Big Data refers to the vast amount of structured and unstructured data that is generated and collected from various sources. It has revolutionized industries across the globe, providing valuable insights and opportunities for businesses, governments, and individuals. This article will delve into the significance and impact of Big Data, exploring five major points and their respective sub-points.Body:1. Enhanced Decision Making:1.1 Improved Accuracy: Big Data enables organizations to make more accurate decisions by analyzing large volumes of data and identifying patterns and trends.1.2 Real-time Analysis: With Big Data, real-time analysis becomes possible, allowing businesses to respond swiftly to changing market dynamics and customer preferences.1.3 Predictive Analytics: Big Data empowers organizations to predict future trends and outcomes, enabling them to make proactive decisions and gain a competitive edge.2. Improved Customer Insights:2.1 Personalization: Big Data helps businesses gain a better understanding of their customers by analyzing their preferences, behavior, and demographics, enabling personalized marketing campaigns and product recommendations.2.2 Enhanced Customer Experience: By leveraging Big Data, organizations can provide a seamless and personalized customer experience, leading to increased customer satisfaction and loyalty.2.3 Targeted Marketing: Big Data enables businesses to target specific customer segments more effectively, resulting in higher conversion rates and improved marketing ROI.3. Cost Reduction and Efficiency:3.1 Operational Efficiency: Big Data analytics helps identify inefficiencies in business processes, enabling organizations to streamline operations and reduce costs.3.2 Resource Optimization: By analyzing data, businesses can optimize resource allocation, minimizing waste and improving overall efficiency.3.3 Fraud Detection: Big Data analytics plays a crucial role in detecting fraudulent activities, reducing financial losses, and enhancing security measures.4. Innovation and New Opportunities:4.1 Product Development: Big Data provides valuable insights into customer needs and preferences, facilitating the development of innovative products and services.4.2 Market Expansion: By analyzing Big Data, organizations can identify new market opportunities and expand their customer base.4.3 Competitive Advantage: Big Data enables businesses to gain a competitive advantage by uncovering market trends, consumer sentiments, and competitor strategies.5. Healthcare and Scientific Advancements:5.1 Disease Prevention and Treatment: Big Data analytics helps identify disease patterns, predict outbreaks, and develop effective prevention and treatment strategies.5.2 Drug Discovery: Big Data plays a vital role in accelerating drug discovery processes by analyzing vast amounts of genetic and clinical data.5.3 Precision Medicine: By analyzing individual patient data, Big Data facilitates personalized treatment plans, improving patient outcomes and reducing healthcare costs.Conclusion:In conclusion, Big Data has emerged as a game-changer in various industries, revolutionizing decision-making processes, customer insights, cost reduction, innovation, and advancements in healthcare and science. Its significance and impact are undeniable, providing organizations with valuable opportunities to gain a competitive edge, improve efficiency, and drive growth. As we continue to generate and collect massive amounts of data, harnessing the power of Big Data will remain crucial for success in the digital era.。

多云的英语作文

多云的英语作文

In the era of digital transformation, cloud computing has emerged as a game-changing technology that is reshaping the way we store, process, and access data. With its promise of scalability, flexibility, cost-effectiveness, and enhanced collaboration, it has become an indispensable tool for businesses and individuals alike. However, as with any transformative technology, cloud computing is not without its complexities and challenges. This essay aims to provide a comprehensive analysis of cloud computing, delving into its multifaceted implications from various angles, including technological, economic, environmental, security, and ethical perspectives.I. Technological ImplicationsA. Scalability and FlexibilityCloud computing offers unparalleled scalability, allowing users to dynamically allocate resources based on their changing needs. This eliminates the need for over-provisioning or under-provisioning hardware, ensuring that businesses can efficiently manage their IT infrastructure. Furthermore, the pay-as-you-go model enables organizations to scale up or down quickly in response to market fluctuations or seasonal demands, without the burden of upfront capital expenditures.B. Innovation and AgilityThe cloud fosters innovation by providing access to cutting-edge technologies such as artificial intelligence, machine learning, and big data analytics, which would otherwise be prohibitively expensive or technically challenging for many organizations to implement in-house. It accelerates the development and deployment of new applications, enabling businesses to adapt swiftly to market changes and stay ahead of competitors. Moreover, the cloud's agility empowers remote teams to collaborate seamlessly, breaking down geographical barriers and enhancing productivity.C. Interoperability and Integration ChallengesDespite its benefits, cloud computing also presents interoperability and integration challenges. As organizations increasingly adopt multi-cloudstrategies, ensuring seamless communication and data exchange among different cloud platforms becomes crucial. Varying APIs, data formats, and proprietary technologies can create compatibility issues, necessitating the development of robust integration strategies and tools. Overcoming these challenges is essential for harnessing the full potential of the cloud ecosystem.II. Economic ImplicationsA. Cost Savings and EfficiencyOne of the primary attractions of cloud computing is its potential for significant cost savings. By shifting from capital-intensive on-premises infrastructure to a subscription-based model, businesses can reduce upfront investments and operating expenses associated with hardware maintenance, energy consumption, and real estate. Additionally, the cloud's ability to automate resource provisioning and management further contributes to cost efficiency.B. New Business Models and Revenue StreamsCloud computing has facilitated the emergence of innovative business models, such as Software-as-a-Service (SaaS), Platform-as-a-Service (PaaS), and Infrastructure-as-a-Service (IaaS). These models enable companies to offer their products and services on a subscription basis, generating recurring revenue streams. Moreover, the cloud has given rise to the sharing economy, where underutilized resources can be monetized through platforms like Airbnb and Uber, transforming traditional industries and creating new opportunities for entrepreneurship.C. Dependency and Vendor Lock-inWhile the cloud promises cost savings and flexibility, it can also lead to dependency on cloud service providers (CSPs) and potential vendor lock-in. If a company heavily invests in a particular CSP's proprietary services, switching to another provider could be costly and time-consuming due to data migration challenges, differing service offerings, and potential loss of functionality. Thus, it is crucial for organizations to carefully evaluate their long-term cloud strategy, negotiate favorable terms with CSPs, and maintain a certain level oftechnological autonomy.III. Environmental ImplicationsA. Energy Efficiency and Carbon FootprintCloud computing can contribute to environmental sustainability by centralizing data processing and storage in energy-efficient, highly optimized data centers. These facilities often employ advanced cooling systems, renewable energy sources, and power usage effectiveness (PUE) measures to minimize energy waste. By consolidating resources and reducing the need for individual organizations to maintain their own energy-hungry servers, the cloud can potentially lower overall carbon emissions.B. E-waste and Resource ConsumptionHowever, the rapid growth of cloud infrastructure raises concerns about e-waste and resource consumption. The constant upgrading of hardware in data centers generates substantial amounts of electronic waste, which, if not disposed of responsibly, can pose environmental hazards. Moreover, the increasing demand for energy and water to cool and operate data centers could strain local ecosystems, especially in regions with limited resources. Therefore, it is essential for CSPs to adopt sustainable practices, such as equipment refurbishment, recycling, and the use of green energy, to mitigate these impacts.IV. Security and Privacy ImplicationsA. Centralized Risk ManagementCloud computing can enhance security by centralizing risk management and security updates within the CSP. CSPs typically have dedicated security teams, robust incident response mechanisms, and regular software patching schedules, which can be more efficient and effective than individual organizations attempting to secure their own disparate systems. Furthermore, the cloud's inherent redundancy and distributed architecture can improve resilience against cyberattacks and natural disasters.B. Data Privacy and Sovereignty ConcernsDespite these advantages, cloud computing also poses significant privacyand sovereignty challenges. Storing sensitive data in the cloud may expose it to unauthorized access, either through targeted attacks or accidental leaks. Moreover, data residency requirements and varying international privacy laws can complicate matters, as data stored in the cloud may cross national borders, potentially violating jurisdictional regulations. To address these concerns, organizations must carefully assess CSPs' security measures, implement strict access controls and encryption, and ensure compliance with relevant data protection laws.V. Ethical ImplicationsA. Algorithmic Bias and TransparencyCloud-based AI and machine learning algorithms, while powerful tools for decision-making and automation, can inadvertently perpetuate or amplify biases present in the data they are trained on. This can lead to discriminatory outcomes in areas such as hiring, lending, and criminal justice. Ensuring transparency in algorithmic decision-making processes and fostering ethical AI development practices is crucial to mitigating these risks.B. Workforce Disruption and Digital DivideCloud computing has the potential to disrupt traditional job roles and exacerbate the digital divide. On one hand, it can create new job opportunities in fields such as cloud engineering, cybersecurity, and data analytics. On the other hand, it may render some jobs obsolete, particularly those involving routine tasks that can be automated. Moreover, unequal access to cloud technologies can deepen existing socioeconomic disparities, as individuals and communities with limited connectivity or digital literacy may struggle to participate in the digital economy. Addressing these challenges requires proactive reskilling initiatives, equitable access policies, and inclusive digital education programs.In conclusion, cloud computing is a transformative technology with profound implications across multiple domains. While it offers undeniable benefits in terms of scalability, flexibility, innovation, and cost savings, it alsopresents challenges related to interoperability, vendor lock-in, environmental sustainability, security, privacy, and ethics. To fully harness the potential of the cloud while mitigating its risks, stakeholders must engage in open dialogue, develop comprehensive regulatory frameworks, promote responsible innovation, and foster a culture of continuous learning and adaptation in the face of rapid technological change.。

组织学习与企业创新产出外文文献翻译中英文2020

组织学习与企业创新产出外文文献翻译中英文2020

外文文献翻译原文及译文(节选重点翻译)组织学习与企业创新产出外文文献翻译中英文文献出处:International Journal of Innovation Studies,Volume 4, Issue 1, March 2020, Pages 16-26译文字数:6000 多字英文Influence of organization learning on innovation output in manufacturingfirms in KenyaIsaac Gachanja, Stephen Nga’nga’, Lucy Kiganane AbstractKnowledge entrepreneurship is increasingly becoming important in driving innovation for high levels of competitiveness. The purpose of this study was to investigate the relationship between Organization Learning (OL) and Innovation Output (IO) for improved performance in manufacturing firms in Kenya. The theoretical underpinnings on this study are the Schumpeter’s (1934) innovation theory of and the Gleick (1987) complexity theory. The methodology used was mixed method research because it provides a more holistic understanding of a thematic area. The research design that was used is cross-sectional design because it allows for making observations on different characteristics that exist within a group at a particular time. The target population was manufacturing firms across the country. Multi-stage sampling strategy was used to sample 303 respondents from 101 firms. Primary and secondary data were used to collect both qualitative and quantitative data. The questionnaire, interview schedule and a checklist of key informants were used to collect data. Content validity was used to ascertain the credibility of the research procedure and internal consistency techniquewas used to test for reliability. Correlation and linear regression were used to determine the relationship between OL and IO. Work disruptions were avoided by making prior arrangements and appointments. The findings indicate that OL has a significant influence on IO. It is recommended that lifelong learning, management support and risk tolerance should be encouraged to improve creativity. High creativity is important in raising the capacity to integrate internal and external knowledge for greater levels of IO. Further research should be carried out to find how customers and suppliers information can be utilized to enriched OL.Keywords: Organization learning, Innovation output, Competitiveness, Lifelong learning, Risk tolerance1. IntroductionInnovation utilizes knowledge which is important in raising creativity and capacity development for enterprise prosperity. Many countries have developed their National Innovation Systems (NIS) and have a comprehensive innovation policy framework, but most firms have not leveraged on these opportunities to raise their Innovation Output (IO). This has been contributed by the disjointed relationship between research institutions and industry. The situation has been brought about by multiplicity of new institutions that have become a barrier to knowledge sharing and thus firms are shying away from intense collaboration withresearch institutions and universities which has led to declining knowledge absorption, creation and diffusion which are key components of innovation performance (Cornell University, INSEAD & WIPO, 2015). The situation can be addressed by rallying firms to develop their knowledge capacities by focusing on Organization Learning (OL) for greater IO.Previous researchers have not managed to unravel the puzzle of how to transform knowledge into innovation output that improves competitiveness in the manufacturing sector. This has been partly attributed to by the failure of incorporating local knowledge in the innovation process (Sambuli & Whitt, 2017). The complexity of blending internal and external knowledge and reconfiguring new insight for greater innovation has also not been adequately addressed in Kenya. Furthermore, the linkages within the innovation system are weak and the manufacturing sector has the highest abandoned innovation activities at about 40% (Ongwae, Mukulu, & Odhiambo, 2013). The quagmire of striking a balance between sharing knowledge, guarding against knowledge leakages, diffusion of tension and mistrust that emanates from the competition while interacting with the NIS to improve IO has not been resolved. The study will attempt to address these gaps by investigating the influence of OL on IO.The objective of the study is therefore to examine the influence ofOL on IO in manufacturing firms in Kenya. The null hypothesis is that OL has no significant influence on IO in manufacturing firms in Kenya while the alternative hypothesis is that OL has a significant influence on IO. The hypothesis will be subjected for a test. The study will contribute to the value of OL on the firms’ competitiveness. It will provide insights on how firms can blend internal and external knowledge in the process of OL to improve IO which contributes to their competitive advantage.2. Literature reviewThis section begins with review of previous empirical work on OL and IO. Theoretical underpinnings are then discussed leading to a development of conceptual framework.2.1. Innovation outputInnovation output is the end product of an innovation activity. The end products of innovation are; new products, new process, new enterprise and new markets. Andreeva and Kianto (2011) believe that IO is the degree to which enterprises develop novelty in terms of processes, management and marketing. Innovation output can therefore be defined as the increase in novel products, creative processes, and development of new ventures and discovery of new markets.Innovation output depicts the result of an innovation effort. It can be measured as the summation of increased new products as a result of innovation, patents acquired, new innovation process and uniqueenterprises created to cater for innovation activities. Innovation output can be enhanced by improving the innovation capacity of a firm.Innovation capacity is paramount in realizing and identifying the need for change, thus leading to new ideas. It provides the capability of seizing up opportunities (Teece, 2009) leading into a new business configuration which helps in attaining and maintaining high competitive levels (Saenz & Perez-Bouvier, 2014). Innovation capacity can be optimized through OL which leads to continuous improvement in firm performance particularly in the manufacturing sector. Manufacturing firms are faced with myriad of challenges such as; the ever-changing taste and preferences of customers, rapid change in technology, increasing competitions, dynamic operating environment and changing global trends. This calls for OL for firms to adequately navigate in the turbulence.2.2. Organization LearningOrganization Learning is one of the key aspects of knowledge entrepreneurship which is crucial in determining innovation output. Desai (2010) defined OL as the process of acquiring, absorbing, sharing, modifying and transferring knowledge within an entity. The context in which OL is used in this study is a mechanism for discovering new ways of improving operations through knowledge acquisition, absorption, sharing and transfer for improved performance. The salient feature that distinguishes OL from learning organization is its diversity andextensiveness. This forms the bases of generating internal knowledge that is peculiar to an Organization.The capacities developed in OL provide an opportunity for the integration of internal and external knowledge. This requires collective input and knowledge sharing (Granerud & Rocha, 2011). Organization learning therefore involves development of internal knowledge capacities that integrates external knowledge from other organizations within and without the sector. This is beneficial to the firm because it allows continuous improvement, adaptability and value addition Granerud and Rocha (2011) argues that OL is the foundation from which the base of improved practices is laid.Organization Learning can be measured in different ways. Jain and Moreno (2015) posited that the factors attributing to OL are; collaboration, teamwork, performance management, autonomy and freedom, reward, recognition and achievement orientation. The Global Innovation Index utilizes Knowledge absorption, creation, impact and diffusion which can be measured by the level of royalties, patents, number of new firms, royalties and license fees receipts or web presence respectively in measuring OL (Cornell University, INSEAD & WIPO, 2016). Tohidi and Jabbari (2012) believe that the strategic elements of OL are experimentation, knowledge transfer, developing learning capacity, teamwork and problem-solving. Chiva and Alegre (2007) are ofthe opinion that development of learning capacity can be enhanced by empowerment to generate new ideas, managerial commitment to support creativity, continued learning, openness and interaction with external environment and risk tolerance.The study thus adopted and improved on the measures of OL used by Chiva and Alegre (2007) and Tohidi and Jabbari (2012) because the parameters are more comprehensive in measuring OL. This was done by incorporating openness and knowledge integration on OL. The measures that were used to measure OL in this study are therefore; liberty of experiment, empowerment to generate new ideas, managerial commitment to support creativity, knowledge transfer and integration, openness and interaction with external environment, continued learning and risk tolerance.Nevertheless, absorptive capacity is important in OL because it improves the ability of the human resource within the firm to acquire and assimilate new and external knowledge for improved performance. Supportive Learning Environment (SLE) increases the absorptive capacity of the firm thus enhancing OL while a turbulent learning environment lowers the OL (Cohen & Levinthal, 1990). The SLE therefore moderates the influence of OL on IO. The SLE provides a conducive atmosphere for employee to engage each other and with the management freely and constructively which may lead to review of firmsoperations and processes (Garvin, Edmondson, & Gino, 2008).The appropriate SLE promotes OL and enhances the innovative ability of a firm. The parameters for measuring SLE are availability of accelerators and incubators, trade organization support and business services (Majava, Leviakangas, Kinnumen, Kess, & Foit, 2016). These parameters facilitates dynamic networking within an economy and accelerates technological spill over which is important in boastering innovation.2.3. Relationship between organization leaning and innovation outputThere have been several attempts to highlight the relationship between OL and IO. To begin with, Hung, Lien, Yang, Wu, and Kuo (2011) found that an analysis of OL and IO model showed the goodness of fit and a significantly positive relationship, thus promoting a culture of sharing and trust which is necessary for enterprise success. However, there is a gap in linking learning process and IO in empirical studies (Lau & Lo, 2015). The study addressed this gap by demonstrating the aspects of OL that influences IO and which do not. Calisir, Gumussoy, and Guzelsov (2013) found that open-mindedness in OL has a positive association with innovation output. Open-mindedness is one of the measures of OL which is incorporated in this study as openness. Zhou, Hu, and Shi (2015) found that OL significantly influences innovationoutput. Furthermore, Ghasemzadeh, Nazari, Farzaneh, and Mehralian (2019) found a significant influence of OL on IO. This study replicated those studies in manufacturing firms in Kenya. The study was anchored on two theories.2.4. Theoretical underpinningsThe first theory that is relevant in this study is Schumpeter’s (1934) theory of innovation. The theory is of the view that the transformation of the economy comes through innovations which bring about creative destructions which lead to improved performance. The dimensions of this theory are the creation of novelties which includes new products, new process, new enterprises, new raw materials and new markets. However, the theory failed to address the required organizational capacity to innovate. This necessitated the adoption of a theory that has a more holistic approach and takes cognizant of the OL as an input in the innovation process. This can be addressed by interrogation of complexity theory.The second theory that is related to this study is Gleick (1987) complexity theory. The theory recognizes the intricacies involved in developing innovation capacity. It advocates for an emergent learning that transcends from the industrial era to the knowledge era that produces ideas that provide complex interplay of different interactions. The complex interactions of internal and external knowledge bring about OLwhich is crucial in enhancing IO. This led to the development of a conceptual framework.3. MethodologyCross-sectional design was used because it helps in making observations on characteristics that exist within a group. The target population was 828 manufacturing firms. The sampling frame was the listed companies in Kenya Association of Manufacturer as of 2018.The multi-stage sampling strategy was used. Purposive sampling was used select the major industrial counties in Kenya. Random sampling was then applied to sample 101 firms from the major industrial counties according to their proportionate representation in terms of location and sub-sector. Purposive sampling was later used to select 3 respondents who were from the sampled 101 firms. The respondents comprised of section heads from operations, marketing and innovation. The total sample size of the respondent was therefore 303. Primary and secondary data were used to collect both qualitative and quantitative data. The questionnaire with Likert scale items o OL and IO, interview schedule and a checklist of key informants were used to collect data.The items which could have had a VIF of more than 10 could be deleted since that is the recommended upper limit (Creswell, 2014), but in this case no item was deleted since the VIF were less than 10. This test was important in authenticating the findings.Validity of the data collected was tested through content validity method. This is where the criteria used to access quality regarding the procedure and results to enhance credibility, transferability, dependability and conformability was addressed by constructing the measuring scale in line with the literature and pre-testing the research instruments during piloting. The questionnaire was designed in line with the constructs and parameters of OL and IO as brought out in literature review.4. Results and discussionsThis implies more new products were manufactured as opposed to other forms of novelty. This means that the general form of innovation in manufacturing firms in Kenya is the creation of new products relative to other forms of innovations such as new processes and enterprises. However, the maximum number of new product was 13 while those that were patented were only 5. It means that majority of new products were not patented. Manufacturing firms should therefore strive to register their patent rights to avoid escalation of counterfeits.The notable new products brought about by innovation were; nitrocellulose paints, hydro-pool, computerized painting machines, nova legs, sodium hypo-chloride, Clorox bleach, adjustable pallet racking and castellated beam for constructing cranes. New products had also a higher standard deviation as compared to other forms of novelty. This implies that there was a widespread of new products created within themanufacturing firms hence a low level of uniformity in new products created and thus a low degree of homogeneity across the firms.This implies that there were innovation activities that generated innovation output. It means that the outcome of innovation activities was observable and can be quantified. The standard deviation of 6.2 implies that there was a widespread within the manufacturing firms. This means that there was a low level of uniformity in innovation output across manufacturing firms and thus a low degree of homogeneity in the sample.This implies that there were more novelties created in the plastics and rubber sub-sector than any other. It means that on average, there were more new products, patents, new process and new enterprises created in the textile and apparels sub-sector. The highest standard deviation of 7.250 was recorded in vehicle assemblers and accessories sub-sector. This implies that the spread of novelties was widest in vehicle assemblers and accessories than other sub-sectors. This means that there was a high variety of IO produced and thus a low level of uniformity in novelties in vehicle assemblers and accessories sub-sector and thus low degree of homogeneity.The highest innovation output in the plastics and rubber sub-sector implies that the sector has more innovation activities as compared to other sub-sector, but innovation efforts were concentrated more on new products. The highest innovation intensity in the food and beverages sub-sector means that there were concerted innovation efforts that were spread across the four novelties and thus diversified IO. This is important because diversified innovation mitigates the risk of over reliance on single or few innovations that may that can be rendered absolute with emergence of other superior innovations.The study has thus established that OL has a significant influence on IO in manufacturing firms in Kenya. Manufacturing firms should, therefore, inculcate a culture of OL for grater IO for improved competitiveness. The findings are consistent with those of Hung et al. (2011) who found that OL have a significant influence on IO. Manufacturing firms should, therefore, embrace OL for utilization of scarce resources to provide value and provide society solutions sustainably. The findings are also in tandem with those Of Calisir et al. (2013) who found that firms with an Organizational practice that promote OL have higher value and IO levels. Higher IO is an indicator that a firm is generating novelties according to the changing needs of the market and hence the likelihood of being competitive leading to improved performance. The findings also concur with those of Hofstetter and Harpez (2015) who found that OL has an immense influence on firm’s IO. Increased IO can lead to improved competitiveness of a firm within the industry, in the economy, the region and the global market. The findings are also in line with Cassiman and Veugelers (2006); Chen,Vanhaverbeke, and Du (2016); Radicic and Balavac (2019); Antonelli & Fassio, 2016 who found that internal and external learning has a positive influence on IO. It is therefore imperative that OL is promoted in the manufacturing sector in Kenya for greater outcomes in IO for enhanced competitiveness locally and internationally.5. Conclusions and recommendationsIt is concluded that the various aspects of OL which include; liberty of experimentation, empowerment to generate new ideas, managerial commitment to support creativity, risk tolerance, knowledge transfer and integration, openness and interaction with the external environment and continuous learning contributes to development of new products, patents acquired, new process and new enterprises. It is also observed that SLE has a significant moderating effect between OL and IO.Management in manufacturing sector should, therefore, nurture and encourage OL for greater IO. Leaders in manufacturing firms should provide freedom to their employees to come up with new ideas and support them to try them out while at the same time be patient to accommodate failures that come with trials. They should also be receptive to divergent viewpoints, encourage problem solving and knowledge transfer. Leaders in manufacturing firms should also set up a robust Research and Development (R&D) by developing the policies that will enhance assimilation of external with internal knowledge for highercapacity to innovate. Policy makers and other relevant stakeholders such as government agencies, research institutions and investor lobby groups and associations should work jointly to address the bottlenecks in SLE.The study enriches the theoretical understanding of how OL influences IO by contributing to new knowledge on how manufacturing firms can improve their competitiveness in Kenya and other parts of sub Saharan Africa.It is recommended that lifelong learning should be encouraged because it improves creativity and develops the capacity to integrate internal and external knowledge which increases the level of IO. Management should also create an enabling culture for promoting creativity and risk tolerance to enhance IO. Manufacturing firms in Kenya should also set clear policies on R&D to enhance OL for increased innovation activities and thus higher IO.Further research should be carried to determine ways in which customers and suppliers information can be utilized to enrich OL. Customers and suppliers are major stakeholders in manufacturing firms. Their input in OL is essential in improving the IO. Further study should also be carried out to examine how networking influences IO. The challenges of mitigating the risks that comes with experimentation and failure tolerance is also a futile ground for further study.组织学习对肯尼亚制造业公司创新产出的影响艾萨克·加尚嘉,史蒂芬·纳加,露西·基加纳摘要知识企业家精神对于推动创新以提高竞争力具有越来越重要的作用。

Teledyne Test Tools T3AFG200 T3AFG350 T3AFG500

Teledyne Test Tools T3AFG200   T3AFG350   T3AFG500

Debug with Confidence200 MHz – 500 MHzTeledyne Test Tools T3AFG200 / T3AFG350 / T3AFG500 range of function/arbitrary generators are a series of dual-channel waveform generators with specifications of up to 500 MHz maximum bandwidth, 2.4 GSa/s maximum sampling rate and 16-bit vertical resolution. The proprietary Arbitrary & Pulse techniques used in the T3AFG200 / T3AFG350 / T3AFG500 models helps to solve the weaknesses inherent in traditional DDS generators when generating arbitrary, square and pulse waveforms. With the above advantages the T3AFG200 / T3AFG350 / T3AFG500 generators can provide users with a variety of high fidelity and low jitter signals, which can meet the growing requirements of a wide range of complex applications.Tools for Improved Debugging●Deep Memory – 20 Mpts/Ch. G enerate complex arbitrary waveforms.●Wide Range of Modulation Types – AM, DSB-AM, FM, PM, FSK, ASK, PWM, Sweep, Burst, and PSK. Q uickly set up modulated waveforms.●High Resolution – 16 bit resolution. G enerate waveforms with low noise, low spurious signal content and high dynamic range. ●Bandwidth Models up to 500 MHz. W ide choice of bandwidths.●Built In Arbitrary Waveforms. L oad and replay built in Arbitrary Waveforms. ●PRBS, I/Q and user Defined Waveform capability. S upport for complex applications.●Single and dual channel models also available, starting from 5 MHz. I nquire about the T3AFG5, T3AFG10, T3AFG40, T3AFG80 and T3AFG120.Key Specifications2FunctionT3AFG200, T3AFG350, T3AFG500Excellent Performance●Bandwidths from 200 MHz to 500 MHz ●All Models have 2 Channels ●20 Mpts/Channel memoryGreat Connectivity●USB host port for mass storage ●USB device port (USBTMC) ●LAN port on 2 channel modelsThe rise/fall times can be set independently to a minimum of 1 ns (2 ns on T3AFG200) at any frequency and to a maximum of 75 s.The T3AFG range of Function/Arbitrary Waveform Generators support a wide range of modulation types including AM, FM, PM, FSK, ASK, PSK, PWM and DSB-AM.Burst mode supports ‘N Cycle’ and ‘Gated’ modes with the Burst source being configured as ‘Internal’, ‘External’ or ‘Manual’.Output amplitude into a high impedance load can be as high 20 Vpp depending on frequencyand waveform type.Ordering Information3Smart Capabilities●Sweep output carrier can be Sine, Square, Ramp and Arbitrary waveforms. Linear or Log sweep. ●Burst output under internal or external signal control ●Waveforms types include PRBS (PRBS3 – PRBS32) ●Frequency Resolution 1 µHz●DSB-AM: Double Sideband AM modulation Function ●10 Order Harmonic Function ●Optional IQ Modulation (T3AFG-IQ)●Multi-Language User InterfaceThe counter functionality, accessed via the rear panel BNC, gives a DC or AC coupled counter capability from 100 mHz to 400 MHz.The Teledyne Test Tools T3AFG200, T3AFG350 and T3AFG500, with its low jitter design, can generate waveforms with exceptional edge stability. With better jitter performance comes better edge stability, and higher confidence in your circuit design.Sweep mode supports ‘Linear’ and ‘Log’ sweep, with ‘Up’ and ‘Down’ direction, and Sweep sourcecan be configured as ‘Internal’, ‘External’ or ‘Manual’.High Fidelity output with 80 dB dynamic range. Sine wave non-harmonic spurious artifacts are-60 dBc ≤ 350 MHz and -55 dBc > 350 MHz.4Gaussian noise with adjustable bandwidth up to 500 MHz, depending on model. Wide bandwidth Gaussian noise can be added to other waveforms to simulate real-world scenarios in which the signal contains a large degree ofnoise.The T3AFG200, T3AFG350 and T3AFG500 optionally supports IQ signal generation with symbol rates between 250 Symbols/s to 37.5 MSymbols/s, providing ASK, PSK, QAM, FSK, MSK and multi-tone signals.The built-in quadrature modulator provides the possibility to generate IQ signals from baseband to 500 MHz intermediate frequency (depending on T3AFG model).The EasyIQ software is necessary to generate an IQ waveform when using the T3AFG-IQ option.The EasyIQ software is a PC program used to download IQ baseband waveform data to the T3AFG200, T3AFG350 or T3AFG500 through a USB or LAN device interface.T3AFG-IQ, Optional IQ Signal GenerationPhase Locked Operation ModeThe ‘Phase-Locked’ mode automatically aligns the phases of each output. While ‘Independent’ mode permits the two output channels to be used as twoindependent waveform generators.5The T3AFG200, T3AFG350 and T3AFG500 havewaveform combining capability whereby Channel 1 and Channel 2 can be combined to a user selected output. The combined waveform can be output on both Ch 1 and Ch 2 simultaneously, or just on a single output,Waveform CombiningCh 1 or Ch 2, whilst the other channel outputs the un-combined waveform for that channel. Easily combine basic waveforms (sine, square, ramp, pulse, etc), random noise, modulation signals, burst signals and Arb waveforms.The harmonics function gives the user the ability to add higher-order elements to the signal being generated.Harmonic FunctionThe PRBS capability gives the flexibility to generate PRBS waveforms from PRBS3 to PRBS32 at up to 300 Mbps with edge rates from 1 ns to 1 µs. An added differential mode provides an easy way to generatePRBSdifferential PRBS signals using both output channels. Easily set outputs to common logic levels such as TTL, ECL, LVCMOS, LVPECL and LVDS using built-inpresets.616 Bit Resolution●T3AFG200 / T3AFG350 / T3AFG500 are all16 bit resolution●4 x higher resolution than 14 bit systems ●Lower levels of Harmonic Distortion●Lower levels of non-harmonic spurious signals ●Improved dynamic range ●Enhanced signal fi delityI/O Connectivity●LAN and USB connection●10 MHz Reference Input and Output●The Aux Input/Output BNC Connector supports the Trigger Input, Trigger/Sync Output,external modulation input, external sweep/burst trigger input and external gate input ●External Counter input14 Bit Resolution 16 Bit Resolution14 Bit ResolutionLess accurate w aveform generation78910Ordering information11© 2020 Teledyne Test Tools is a brand and trademark of Teledyne LeCroy Inc. All rights reserved. Specifications, prices, availability and delivery subject to change without notice. Product brand or brand names are trademarks or requested trademarks of their respective holders.T3 stands for Teledyne Test Company ProfileTeledyne LeCroy is a leading provider of oscilloscopes, protocolanalyzers and related test and measurement solutions thatenable companies across a wide range of industries to designand test electronic devices of all types. Since our foundingin 1964, we have focused on creating products that improveproductivity by helping engineers resolve design issuesfaster and more effectively. Oscilloscopes are tools used bydesigners and engineers to measure and analyze complexelectronic signals in order to develop high-performancesystems and to validate electronic designs in order to improvetime to market.The Teledyne Test Tools brand extends the Teledyne LeCroyproduct portfolio with a comprehensive range of testequipment solutions. This new range of products deliversa broad range of quality test solutions that enable engineersto rapidly validate product and design and reduce time-to-market. Designers, engineers and educators rely on TeledyneTest Tools solutions to meet their most challenging needs fortesting, education and electronics validation.Location and Facilities Headquartered in Chestnut Ridge, New York, TeledyneTest Tools and Teledyne LeCroy has sales, service anddevelopment subsidiaries in the US and throughoutEurope and Asia. Teledyne Test Tools and Teledyne LeCroyproducts are employed across a wide variety of industries,including semiconductor, computer, consumer electronics,education, military/aerospace, automotive/industrial, andtelecommunications.Teledyne LeCroy (US Headquarters)700 Chestnut Ridge Road Chestnut Ridge, NY. USA 10977-6499 Phone: 800-553-2769 or 845-425-2000Fax Sales: 845-578-5985Phone Support: 1-800-553-2769Email Sales: *******************************Email Support: ************************** Web Site: /Teledyne LeCroy (European Headquarters)Teledyne LeCroy GmbH Im Breitspiel 11c D-69126 Heidelberg, Germany Phone: +49 6221 82700Fax: +49 6221 834655Phone Service: +49 6221 8270 85Phone Support: +49 6221 8270 28 Email Sales: *******************************Email Service: *******************************Email Support: t ********************************Web Site: /germanyWorld wide support contacts can be found at:https:///support/contact/#Distributed by:24july20。

大数据英文版

大数据英文版

大数据英文版Title: Big Data: Revolutionizing the World of InformationIntroduction:In today's digital age, the world is generating an enormous amount of data every second. This data, known as Big Data, has the potential to transform various industries and revolutionize the way we make decisions. This article will explore the concept of Big Data, its impact on different sectors, and the challenges and opportunities it presents.1. What is Big Data?Big Data refers to the massive volume of structured, semi-structured, and unstructured data that is generated from various sources such as social media, sensors, online transactions, and more. It is characterized by its volume, velocity, and variety.2. Applications of Big Data:2.1. Healthcare:Big Data analytics is transforming the healthcare industry by enabling predictive analysis, personalized medicine, and early disease detection. It helps healthcare providers to improve patient outcomes, reduce costs, and enhance operational efficiency.2.2. Retail:Big Data is revolutionizing the retail sector by providing insights into customer behavior, preferences, and trends. Retailers can leverage this information to optimize inventory management, create personalized marketing campaigns, and improve customer experience.2.3. Finance:Big Data analytics is reshaping the finance industry by facilitating fraud detection, risk assessment, and algorithmic trading. It enables financial institutions to make data-driven decisions, enhance customer satisfaction, and mitigate risks.2.4. Transportation:Big Data is playing a crucial role in the transportation sector by optimizing route planning, improving traffic management, and enhancing logistics operations. It helps reduce congestion, minimize fuel consumption, and enhance overall efficiency.3. Challenges in Big Data Analysis:3.1. Data Privacy and Security:As the volume of data grows, ensuring data privacy and security becomes a significant concern. Organizations must implement robust security measures to protect sensitive information and comply with data protection regulations.3.2. Data Quality and Integration:Big Data often comes from various sources and may be unstructured or incomplete. Ensuring data quality and integrating different datasets pose challenges that need to be addressed for accurate analysis and decision-making.3.3. Scalability and Infrastructure:Analyzing massive volumes of data requires powerful computational resources and scalable infrastructure. Organizations need to invest in appropriate technologies to handle Big Data efficiently.4. Opportunities in Big Data:4.1. Data-Driven Decision Making:Big Data analytics empowers organizations to make informed decisions based on real-time insights. It enables businesses to identify patterns, trends, and correlations that were previously hidden, leading to better strategies and outcomes.4.2. Enhanced Customer Experience:By analyzing customer data, organizations can personalize their offerings, improve customer satisfaction, and provide targeted marketing campaigns. This leads to increased customer loyalty and retention.4.3. Operational Efficiency:Big Data analytics helps organizations optimize their operations, reduce costs, and improve efficiency. It enables predictive maintenance, supply chain optimization, and real-time monitoring, resulting in streamlined processes.Conclusion:Big Data is transforming the way industries operate, making data-driven decision-making a reality. It offers immense opportunities for businesses to gain a competitive edge, improve customer experience, and enhance operational efficiency. However, challenges related to data privacy, quality, and infrastructure need to be addressed for organizations to harness the full potential of Big Data. Embracing Big Data analytics is crucial for organizations to thrive in the digital era and stay ahead of the competition.。

2024奥林匹克运动会英语作文

2024奥林匹克运动会英语作文

2024奥林匹克运动会英语作文1The 2024 Olympic Games, a global spectacle that ignites the spirit of unity and competition, is set to take place in Paris, a city renowned for its charm and elegance. Paris offers a plethora of remarkable sports venues that will host the various events. The Stade de France, a majestic stadium, is expected to witness thrilling moments in athletics and football. Another notable venue is the Paris La Défense Arena, which will host gymnastic and basketball competitions.The main sports events of the 2024 Olympics encompass a wide range of disciplines. Swimming, always a crowd-pleaser, attracts top athletes from around the world. Track and field events, such as sprinting and long-distance running, showcase human speed and endurance. Gymnastics, with its graceful movements and precise routines, is sure to captivate the audience.The event schedule has been meticulously planned. The opening ceremony is slated to be a grand affair, kicking off the games with a burst of color and excitement. The early days will feature swimming and gymnastics competitions, while the middle part of the schedule will focus on track and field events. The final days will bring the highly anticipated finales of team sports like basketball and football.The 2024 Olympic Games in Paris promise to be an unforgettable celebration of sportsmanship and human achievement, uniting people from different nations under the banner of peace and competition.2The 2024 Olympic Games is not merely a grand sports event but a powerful catalyst that brings profound changes to the host city. Economically, it attracts a massive influx of tourists and investment. For instance, hotels, restaurants, and local businesses thrive during this period, generating significant revenue and creating numerous job opportunities. The enhanced infrastructure, such as improved transportation and sports facilities, also boosts long-term economic development.Socially, the Olympics unite the citizens. It promotes a sense of community and pride among the local people. V olunteers come together to provide services, fostering a spirit of cooperation and mutual support. Moreover, it encourages people to engage in physical activities, leading to a healthier lifestyle.Culturally, the 2024 Olympics serves as a platform to showcase the host city's unique cultural heritage to the world. Cultural events and exhibitions accompanying the Games allow people from different countries to appreciate and understand the local culture. This exchange of cultures enriches the global community and promotes cultural diversity.In conclusion, the 2024 Olympic Games has a far-reaching impact onthe host city, positively influencing its economy, society, and culture, and leaving a lasting legacy for future generations.3I have always held a deep longing and anticipation for the 2024 Olympic Games. The mere thought of it sets my heart racing with excitement and determination.For months, I have been training rigorously, pushing my limits every day. Whether it's early morning runs or late-night strength training sessions, I pour all my energy into getting ready. I dream of not only being a spectator but also having the opportunity to contribute as a volunteer.The idea of being part of such a grand event, surrounded by athletes from all over the world, fills me with a sense of awe and wonder. I imagine the moment when I step into the stadium, the deafening cheers, the colorful flags, and the spirit of unity and competition. The excitement would be palpable, and I know I would be overcome with emotions.I constantly picture myself interacting with athletes, providing them with support and assistance. Sharing their joy and disappointment, I believe, would be an incredibly enriching experience. I am willing to put in countless hours of hard work, sacrificing my leisure time, because I know that the rewards of being involved in the Olympics would be immeasurable.In my heart, the 2024 Olympic Games represent more than just a sports event. It's a platform for dreams to come true, for friendships to beforged, and for the spirit of humanity to shine. I can't wait to be a part of it, to embrace the magic and make memories that will last a lifetime.4The 2024 Olympic Games is an event that captures the world's attention. The selection mechanism for the participating athletes is highly rigorous and competitive. Take the national team of a certain country for example. Their selection standards are extremely strict. Athletes need to demonstrate outstanding performance in multiple competitions and training sessions. Only those who consistently achieve excellent results and show remarkable physical and mental qualities can be selected.The training of these athletes is no easy task. They have to endure long hours of intense workouts every day. Early in the morning, they start with endurance training, running several kilometers to build up their stamina. Then, they move on to strength training, lifting heavy weights to enhance their muscle power. Afternoons are dedicated to skill practice, repeating the same movements countless times to achieve perfection. Even in the evenings, they might have theoretical studies and analysis of opponents' strategies.During the training process, athletes often face various challenges and setbacks. Injuries are common, but they have to overcome the pain and continue to train. The mental pressure is also huge, but they must maintain a positive attitude and strong willpower.All these efforts are for the moment on the Olympic stage, to represent their country and pursue the glory of victory. The 2024 Olympic Games will surely witness their hard work and dedication.5The 2024 Olympic Games, a grand spectacle of global sports, holds profound significance in driving the development of the worldwide sports industry. It is not merely a stage for athletes to showcase their prowess but a catalyst for revolutionary changes and advancements.The application of new technologies has been remarkable. Advanced tracking systems provide real-time data on athletes' performance, enabling precise analysis and improvement strategies. Virtual reality and augmented reality offer immersive experiences to viewers, bringing them closer to the action than ever before.Moreover, the 2024 Olympics spreads the spirit of sports far and wide. It inspires countless individuals to embrace an active and healthy lifestyle. The stories of athletes' perseverance, determination, and teamwork touch people's hearts, fostering a sense of unity and mutual encouragement.The Games also serve as a platform for cultural exchange. Athletes and spectators from different countries come together, sharing their unique sports cultures and values. This promotes mutual understanding and respect among nations.In conclusion, the 2024 Olympic Games is not just an event; it is aforce that propels the sports world forward, shaping a brighter future for all. It showcases human potential, technological innovation, and the power of unity, leaving a lasting impact on the global community.。

某总体设计仿真平台的设计与开发

某总体设计仿真平台的设计与开发

某总体设计仿真平台的设计与开发摘要:随着科技水平的不断提高,仿真技术越来越受到了广泛的关注和应用。

为了满足不同领域仿真需求,本文设计并开发了一种通用的总体设计仿真平台,可以结合不同仿真软件和工具,实现设计、分析和仿真等多种功能。

首先,本文介绍了仿真平台的背景和研究意义,分析了国内外研究现状和应用情况。

其次,本文概述了仿真平台的设计和架构,包括系统组成、数据结构、功能模块和接口设计等方面。

然后,本文具体介绍了仿真平台的实现过程和技术方案,包括软件选型、算法设计、接口开发和测试验证等方面。

最后,本文进行了仿真实验和性能评估,验证了仿真平台的可行性和优越性。

本文的研究成果对于加强总体设计仿真技术的研究和应用具有重要的参考价值。

关键词:总体设计仿真平台、多功能、技术方案、仿真实验、性能评估Abstract:With the continuous improvement of technology, simulation technology has received widespread attention and application. In order to meet the simulation needs in different fields,this paper designed and developed a universal overall design simulation platform, which can combine different simulation software and tools to achieve various functions such as design, analysis and simulation. Firstly, this paperintroduces the background and research significance of the simulation platform, and analyzes the research status and application of domestic and foreign research. Secondly, thispaper outlines the design and architecture of the simulation platform, including system composition, data structure, function modules and interface design. Then, this paper specifically introduces the implementation process and technical scheme of the simulation platform, includingsoftware selection, algorithm design, interface development and test verification. Finally, this paper carries out simulation experiments and performance evaluation, andverifies the feasibility and superiority of the simulation platform. The research results of this paper have important reference value for strengthening the research andapplication of overall design simulation technology.Keywords: overall design simulation platform, multifunctional, technical scheme, simulation experiment, performanceevaluationThe overall design simulation platform developed in thisstudy is a multifunctional platform with various technical schemes integrated into it. This platform enables users to carry out comprehensive design simulations including product design, interface development, and test verification. The technical schemes used in this platform cover various design and simulation aspects, such as system modeling, virtual prototyping, and simulation optimization.The simulation platform is designed to provide a user-friendly interface that allows easy navigation of different design tasks. Users can easily access the platform'sdifferent functions, tools and features, and choose from different technical schemes and models to carry out theirdesign simulations. The platform provides a streamlined workflow that ensures efficient and effective design simulations, helping users to save time and resources.The platform includes simulation experiments to validate the design models and identify areas for improvement. This feature enables users to optimize their designs by simulating different scenarios and testing different parameters. Through these simulations, users can identify the best design solutions based on the expected outcomes and criteria.Furthermore, the performance evaluation feature of the platform is essential in measuring the effectiveness and efficiency of the design models. This feature analyzes the system's performance through various metrics, such as accuracy, speed, and reliability. By evaluating the design's performance, users can identify and address design flaws and optimize the design for better performance.Overall, the developed simulation platform is a useful tool for designers, researchers, and engineers who want to improve their overall design process. The platform's multifunctional design and various technical schemes make it a versatile and flexible solution for different design needs. The simulation experiment and performance evaluation features enable users to optimize their designs to meet their intended purposes.Furthermore, the platform's user-friendly interface and visualization tools enable users to easily understand and analyze the simulation results, facilitating better decision-making processes. The platform also allows for easycustomization and adaptation to specific design needs, allowing users to tailor the simulation parameters to their specific design requirements.However, there are certain design flaws that can be improved upon to further enhance the platform's performance. For instance, the platform's simulation capabilities can be expanded to include more complex and advanced simulation models, such as multi-physics, multi-scale, and multi-task simulations. This would enable users to simulate more intricate designs and achieve more accurate results.Additionally, the platform's computational efficiency can be improved by optimizing the simulation algorithms and minimizing the computational time required for each simulation run. This would enable users to run simulations faster and thus reduce the overall design cycle time.Another potential improvement would be to incorporate artificial intelligence (AI) and machine learning (ML) techniques into the platform. This would enable the platform to learn and adapt to the user's design requirements, automatically generating optimized designs based on input parameters and past simulation results.In summary, while the developed simulation platform is already a useful tool for designers and engineers, there is still room for improvement. By addressing the aforementioned design flaws and incorporating advanced technologies such as AI and ML, the platform's performance could be furtherenhanced, enabling users to design and optimize their products more efficiently and effectively.Additionally, the simulation platform could benefit from incorporating more advanced visualization tools, enabling designers to better understand the behavior and performance of their designs. This could include the ability to view simulations in real-time, with the ability to adjust settings and parameters on-the-fly.Furthermore, by integrating with other software tools commonly used in the design process (such as CAD software and 3D printing tools), the simulation platform could enable designers to create more accurate and effective designs, while also streamlining the design process.Another potential improvement for the simulation platform would be to enable users to collaborate more effectively. This could include features such as real-time data sharing, simultaneous simulations, and the ability to easily compare and contrast different designs.Finally, the simulation platform could benefit from improved documentation and training resources, helping new users get started more quickly and effectively. This could include detailed tutorials, video resources, and access to a community of experienced users and experts.Overall, while the simulation platform described here is already a useful tool for designers and engineers, there are numerous opportunities for improvement. By addressing thesedesign flaws and incorporating the latest technologies and best practices, the platform could help users design and optimize their products more efficiently and effectively, driving innovation across a wide range of industries.Furthermore, one potential area for improvement is in the platform’s user interface (UI) and user experience (UX) design. While the current platform is functional and provides access to a wealth of simulation tools, it can be difficult for new users to navigate and find the features they need. By focusing on improving the UI and UX, the platform could become much more user-friendly and accessible to a wider range of users.Another opportunity for improvement is in the platform’s data visualization capabilities. While the current platform provides some basic visualizations, it could benefit from more advanced data visualization tools that enable users to more easily interpret and analyze simulation results. This could include features such as interactive 3D models or animated simulations that allow users to see how different design changes impact product performance.Finally, the platform could benefit from greater integration with other design and engineering tools. For example, by integrating with popular CAD software, the platform could enable users to easily import and export design files, and simulate the performance of their designs in real-time. Similarly, by integrating with tools for materials science, manufacturing, and supply chain management, the platform could enable users to make more informed decisions aboutmaterials selection, production processes, and supply chain optimization.In conclusion, the simulation platform described in this article has the potential to revolutionize the way that designers and engineers approach product design and optimization. By leveraging advanced simulation tools, data analytics, and machine learning, the platform enables users to create and test designs in a virtual environment, makingit possible to identify and address potential performance issues before a product is ever manufactured. While the platform is already a valuable and powerful tool for designers and engineers, there are numerous opportunities for improvement, including in the areas of UI and UX design, data visualization, and tool integration. By addressing these issues, the platform could become an even more effective tool for driving innovation across a wide range of industries.One area where the digital twin platform could be improved is in user interface (UI) and user experience (UX) design. Currently, the platform can be complex and difficult to navigate, particularly for users who are not engineers or designers. In order to make the platform more accessible, the UI/UX design should be simplified and streamlined. This could involve reorganizing the navigation, using more intuitive icons and labels, and offering more detailed instructional materials for users who are not familiar with the platform.Another area for improvement is in data visualization. As the digital twin platform collects and processes large amounts of data, it can be challenging for users to glean insights andunderstand the data in a meaningful way. By improving data visualization tools, such as graphs, charts, and heat maps, designers and engineers could more easily identify patterns and trends in the data, leading to more informed decision-making and improved product performance.Finally, tool integration could be improved in order to streamline workflows and improve collaboration between different departments and teams. For example, integrating the digital twin platform with manufacturing and supply chain management tools could help designers and engineers more easily identify potential bottlenecks and optimize product design for production. Similarly, integrating the platform with customer relationship management tools could help companies better understand customer needs and preferences, leading to more tailored and successful product offerings.As these improvements are made to the digital twin platform, it has the potential to become an even more powerful tool for driving innovation and improving product performance across a wide range of industries. By simplifying the UI/UX design, improving data visualization tools, and integrating with other critical tools and systems, the platform can help businesses take a more data-driven approach to product design and development, resulting in greater success and customer satisfaction.Additionally, improved digital twin platforms can also have significant impacts on the maintenance and predictive maintenance of products, particularly in industries such as manufacturing, aviation, and energy. By generating accuraterepresentations of products and their operating environments, digital twins can help identify potential issues and allowfor proactive maintenance, reducing downtime and increasing efficiency.Moreover, the integration of artificial intelligence (AI) and machine learning algorithms can further enhance the capabilities of digital twins. These technologies can be utilized to analyze data from a range of sources, including IoT sensors and historical data, to provide insights into product behavior and potential future performance. This information can then be used to optimize product design and identify potential areas for improvement.In conclusion, the development of digital twin platforms has the potential to revolutionize product design and development processes, enabling businesses to take a more data-driven approach to innovation. As these platforms continue to evolve and improve, we can expect to see even greater benefits in terms of product performance, maintenance, and customer satisfaction.总之,数字孪生平台的发展具有革命性的潜力,可以使企业采用更加数据驱动的创新方法,从而革新产品设计和开发过程。

英语作文选择性模板

英语作文选择性模板

英语作文选择性模板Selective Templates in English Composition。

In the ever-evolving landscape of English language teaching and learning, the concept of selective templates has emerged as a transformative approach to fostering students' writing abilities. Selective templates are pre-structured text models that provide learners with ascaffold of essential elements and organizational structures, empowering them to construct meaningful and coherent written compositions.Benefits of Selective Templates。

The incorporation of selective templates into English composition instruction offers a myriad of advantages:Reduced Cognitive Load: By providing a predetermined framework, templates reduce the cognitive burden associated with planning and organizing a written piece, allowinglearners to focus their attention on generating original content.Enhanced Fluency: The structured nature of templates streamlines the writing process, facilitating a smoother flow of ideas and reducing hesitations or interruptions.Improved Coherence and Organization: Templates ensure that compositions adhere to a logical flow of information, fostering coherence and enhancing the overall effectiveness of communication.Accelerated Language Acquisition: Through repeated exposure to target language patterns and vocabulary, templates accelerate learners' acquisition of grammatical structures and lexical resources.Increased Confidence: By providing a foundation for successful writing, templates boost students' confidence in their ability to produce high-quality compositions.Types of Selective Templates。

电子美国电动机测试仪与分析仪 iTIG II 说明书

电子美国电动机测试仪与分析仪 iTIG II 说明书

THE EASIEST TO USE TESTERS ON THE MARKETDELIVERING A COMPREHENSIVE TEST SETTHA T FINDS MORE FAUL TSiTIG IIThe iTIG II motor tester and winding analyzer combines multiple testing technologies from micro-ohm resistance to high frequency surge tests and partial discharge measurements into a single light weight portable instrument. From low voltage to high voltage, 20 different tests are available.Why Consider an Electrom Motor Tester?•Find more faults with state of the art high frequency surge test technology.-Customers find faults they do not find with other lower-frequency surge testers. •Get early warnings of insulation deterioration with Partial Discharge tests.-Fast, cost effective and no accessories needed.•The easiest tester to use according to our customers, manual to fully automatic models.•Powerful time saving trend analysis, reporting tools and data transfer options.•Modular construction, designed to be upgraded to higher level models withoutpurchasing a new tester.WHO USES ELECTROM MOTOR ANAL YZERS?The Electrom Instruments motor testers and winding analyzers are used worldwide throughout industries that use, service, repair, rewind and manufacture electrical rotating machinery, coils, transformers and sensors.Some Advantages for Industrial Users and Motor Repair CompaniesEasy to Use: According to our customers the iTIG II is the easiest tester to use. With automated models, each test can be done the same way every time regardless of operator. Preset test parameters and templates are available, and assembled motors can be surge tested without turning the rotor.Portable, Rugged & Light Weight: The iTIG II is the lightest fully automatic, 12kV and 15kV tester available. For even more portability see the iTIG II MINI with up to 6kV surge/hipot output.The PP-II is the only truly portable 45J 30kV POWER PACK at less than 50 lbs/23kg. It can be used with multiple iTIG II’s.Reports: Complete reports are automatically generated, named and stored by the tester with a click on the print button. They can also be generated on a rmation: Information is only entered once, and is organized well to meet both motor shop and industrial user needs.Motor Shops: Reports can be transferred to job number folders in Motor Shop Software directly from the tester via WiFi, VPN, or Ethernet.Reliability and Maintenance Programs: In addition to reports with multi-test graphs and tables, test results can be stored automatically in summary files that open in Excel or database software as a spreadsheet on a PC. Each row is a test set making trend analysis easy.VFD Issues: Diagnosis of operating problems in systems that use VFD power is greatly enhanced with offline Partial Discharge measurements done during a surge test.Training: DON’T USE THE TESTER OFTEN? Our training program will surprise you!Motor Manufactures and OEMsElectrom Instruments’ Production Line Test Automation Systems (PLTA) are based on advanced iTIG II technology. Test systems can include bar code scanning, external controls, automatic upload of test results to a server and more.Whether you manufacture motors, generators, alternators, reactors, various types of transformers, solenoids or anytype of coil, large or small, we may have a solution for your winding tests.iTIG II MINI & iTIG IIiTIG II & Power Pack IIiTIG IIiTIG II & Power Pack IIOUTPUTSThe iTIG II series of coil and motor testers come with max output voltages of 4kV, 6kV, 12kV, 12kV-H and 15kV-H. The H model has higher discharge capacitance, and can generate a higher voltage than the 12kV model when the 12kV is maxed out.Power Packs with maximum output voltages from 18kV to 30kV for testing large higher voltage motors and generators can be added at any time. Our Power Packs are the smallest most portable high voltage test sets available on the market. See Power Pack brochure.PORTABLE, MODULAR, BASIC TO AUTOMA TICThe iTIG II winding and motor analyzer is portable, light weight and rugged, designed for shop and field testing. It comes in basic to fully automatic versions.Not only high voltage tests can be part of an automated test sequence, but also high accuracy low voltage measurements such as:•µΩ resistance •Capacitance •Inductance •ImpedanceAll tests and measurements can be done through the high voltage lead set with the model D.All models can be upgraded to higher level models later, with more automation, more features and higher outputs. They can include production line automation software.REAL EASE OF USEApplication of advanced user interface design techniques and software algorithms creates an intuitive and easy to use Windows™ based tester - even with complex testing requirements. According to our customers it is the easiest to use tester they have seen.The many time saving features include:•Surge wave voltage range and sweep are automatically set, no need to hold buttons during any tests.•Time saving report generation done by the tester.•Automatically track test results over time for reliability and maintenance programs.•Assembled motor surge test without the need to turn the rotor.•Preset test templates with all test parameters and limits.•Single button multi-coil test capability and master coil comparisons.•Automated analysis features such as armature shorting bar pattern detection.•Push one button to have a series of tests done automatically, the same way every time.30kV Power Pack IISURGE AND HIPOT TESTSWith the iTIG II no manual lead switching is required. Once the operating voltage of the motor is entered, the high frequency surge tests, with IGBT generated fast rising pulses per IEEE 522, can be done automatically. There is no need to further adjust voltage range and sweep (or time base), it is all done by the tester.•Superior High Frequency Surge PulsesThe iTIG II is the only surge tester capable of generating fully automatic software-controlled surge voltage pulses at high pulse rates up to 50 Hz. This eliminates ionization dissipation present in low frequency surge testers such as those pulsing at 5Hz and lower. As a result, the iTIG II finds more cases of weak insulation and faults, and at lower voltages than low frequency testers.•Automatic Quick Surge™ and Surge Guard™Enables the user to push a button and let the iTIG II run the test with a controlled and limited number of pulses. Quick Surge™ and Surge Guard™ technology make the tests faster, and ensures the right number of surge pulses are applied for optimal performance.•Pulse to Pulse Surge TestThe PtoP surge test automatically raises the surge voltage in small steps at a pulse rate of about 20Hz. The voltage is raised to the design test voltage, and the % wave difference between steps is calculated at each step. The final L-L difference is also displayed. The picture has a graph of the results, one bar per voltage step. The tall bar shows a failure at about 1850V in phase 2.The test eliminates the need to turn rotors in assembled motors with rotor influence. It is also used in applications with normal differences in the phase-to-phase surge waves, such as with many concentric wound stators, and in applications where there are no other coils/phases to compare to.•Master Coil and Multi-Coil TestsThese modes make it easy to surge test a large number of any type of coil, DC armature or stator. Results can be displayed in multiple ways for easy analysis. The iTIG II D can be set up specifically as a single coil tester by the user, and can automatically surge test a single coil in both directions.•Manual or Automated IR, PI and DC Hipot TestsResults can be temperature corrected. Multi-point test graphs for PI, hipot step voltage and ramp tests, and comparisons to previous tests for trend analysis or pre/post repair results are available. An AC Hipot option up to 5kV is available with a separate unit that is controlled by the iTIG II. It uses the iTIG II output test leads. This integration allows AC Hipot to be included in automated test sequences.L-L Surge test failurePtoP surge test, tall bar = phase 2 failure3 Hipot step tests, breakdown in 3rd testDC Hipot test screenPARTIAL DISCHARGE CAPABILITYOffline PD measurements provide an early warning of insulation breakdown before a surge test, hipot test or online monitoring indicate an insulation breakdown or failure. It is a great tool to track the condition of equipment over time and can provide an opportunity to lengthen the life of a motor.In a motor shop or in the field, PD can be a tiebreaker in the determination of pass/fail, and can determine whether to schedule reconditioning /replacement or not.Partial Discharge tests can also be used to find problems in systems powered by inverter drives (VFD). In coil and rotating equipment manufacturing, partial discharge measurements are used for quality control to confirm that there is no PD or that the PD is below a certain level.HOW THE iTIG IIDOES PD MEASUREMENTSThe iTIG II does the partial discharge measurement during a surge test using capacitive coupling technology and advanced software algorithms. Repetitive PD Inception Voltage (RPDIV) and Extinction Voltage (RPDEV), and maximum Partial Discharge levels in mV are displayed and automatically stored.All the PD measurements can be part of a fully automatic sequence of tests that starts with winding resistance and impedance measurements, moves through IR and Hipot tests, and finishes with surge tests and PD measurements. The results can be compared to earlier results for trending or pre/post repair comparisons.Evaluation of PD results should take into account results from other tests. One can choose which PD measurements to include:Combining the surge test with a partial discharge measurement is a fast and cost-effective way to get PD measurements. No accessories, couplers or other gadgets are needed. All the required pieces are included inside the iTIG II motor tester.Only max PD is measured to quickly check if there is PD or not. In low voltage motors there should be no PD at normal surge test voltages.RPDIV, RPDEV and Max PD are included. A significant reduc-tion in the inception voltage (RPDIV) over time can indicate breakdown of the insulation before other signs of breakdown are detected.Learn more about PDWINDING RESIST ANCEWinding resistance is an important measurement because other testsand measurements will not find some of the problems a resistancemeasurement will. The measurement is used to find open windings,shorts to ground, wrong turn count, wrong wire gauge, resistiveconnections, round wire(s) in hand that are not connected in a coil,connection mistakes, resistance imbalance between phases, and insome cases shorted turns.4-wire measurementsAll iTIG II winding resistance measurements are done with a highlyaccurate 4-wire system using Kelvin clamp leads. The measurementscan be in milli-Ohms or micro-Ohms depending on the model.Temperature corrected resistance from a few μΩ to 2kΩ is available.DC Armature Equalization DetectionFor bar to bar resistance measurements on DC armatures, the iTIG IID will detect what percent equalization the armature has. If there aretwo levels of resistance it calculates an average for each level and themax delta between the high and low measurements for each level. Abar graph is created for the measurements, the averages are drawnand the faulty bars that exceed failure limits are colored differentlythan the rest of the bars. The ARP-02 4-wire resistance probes andμΩ measurement are required.IMPEDANCE MEASUREMENTS & ROTOR TESTSWhere more analysis is needed, for example for predictive maintenance, Electrom offers the CLZ option. It includes measurements of inductance, impedance and phase angle for windings and coils, and capacitance measured from the winding to ground. It also calculates Dissipation factor (D), also called Tan Delta, and Quality factor (Q).Rotors in assembled motors can be tested with the CLZ option using the “rotor influence check” or RIC test. This method checks squirrel cage rotors for broken rotor bars.2 resistance levels; out of spec results are redCheck for broken rotor barsµΩ measurement of 3-phase motorCapacitance, inductance & impedance resultsLearn moreWHA T TYPES OF TEST CAN BE DONEAND WHA T WEAKNESSES/FAILURES ARE FOUNDThe table shows some of the tests that can be done with the iTIG II winding analyzer. For some, test profiles can beprogrammed along with default settings and default test voltage formulas.Test Tips Surge:The only test that finds turn to turn faults that occur at high voltages, provides early warning if the fault is above peak operating voltage.PD: Partial Discharge test finds insulation weaknesses earlier than any other test, enables reconditioning before a failure occurs that requires rewinding.DC Hipot:Can find phase to phase weaknesses when the phases are disconnected.Step Voltage: Finds at what voltage the ground insulation starts to break down.IR (megohm): Mainly a contamination test; can include DAR and/or PI; PASS/FAIL informs whether ornot to perform high voltage tests.Low Resistance: The only test that will find resistive connections, round wire(s) in hand that are not connected in a coil, partial blowout of some coils, and more.RIC test: Inductance measurement can be used for rotor influence checks on assembled induction motors.•••••••DC MOTOR TEST ACCESSORIESATF-11: ARMATURE TEST FIXTUREThe ATF-11 is used to do SpanSurge Tests of DC motor armatures.A span test is done across multiplebars on the commutator. Requiresan FS-12 Foot Switch for easyoperation. Also very useful formulti-coil tests.ABT, ARMATURE BAR-TO-BAR SURGE TEST ACCESSORYUsed with the iTIG II B, C & D for:•Surge comparison tests bar-to-bar on armatures.Surge tests of single coils with very low inductancewhen the desired surge test voltage is below 1400V.•It is typically used with 12kV and 15kV iTIG II models.Max ABT Output: 1400VComes with the BBP bar to bar probe in the pictureand the FS-12 foot switch.FS-12: FOOT SWITCHFor starting tests and allowing hands off operation of theiTIG II surge tester. Works with all models.ASP SURGE PROBE-SETThe ASP is an optional and alter-native probe-set for the ABT. Itcan be used for bar to bar testsand span tests. The voltage me-asured is load dependent whenthe ASP is used. For accurate me-asurements of the test voltage inthe load itself, the BBP probe isused.This probe set also comes in a version that connects di-rectly to the iTIG II high voltage leads (ASP-22). This is analternative to the AFT-11 above.ARP: ARMATURE RESISTANCE PROBESThe ARP, 4-wire ResistanceProbes, are mainly used tomeasure the resistance bar-to-bar on armatures. Theycan also be used to measureresistance of other thingssuch as equalizers.The ARP is used with the C and D model iTIG II. MicroOhm (μΩ) measurements are required in most casessince bar-to-bar and equalizer measurements typicallyare below 1mΩ.The models come with the following resistancemeasurements:Model B: mΩ || C: mΩ, µΩ optional || D: µΩThe Model D has report software that automaticallygenerates reports with Pass/Fail results for each bar-to-bar measurement in a test-set. The results are presentedin a bar graph.If the armature equalization is uneven (for example33% or 66% equalized), the armature tester detects thepattern, adjusts accordingly, and calculates Pass/Failresults based on two resistance levels.•••DC MOTOR TESTINGDC motors are tested with the same instrument used for AC motor tests. The tests used are the same, but the test procedures are different. To make the tests easier, the iTIG II has dedicated user interface screens for DC motor tests. Multi-coil tests are available. Options for presentation of winding resistance and surge test data include bar graphs.TEST REPORTSReports can be generated automatically on the iTIG II with a click of the print button, stored, and be transferred to a PC/server at any time later.Reports can also be generated on a PC using the TRPro report software.Reports are easily customized to include a cover page, your logo and other info, both tabular and graphical views of all the different types of test data, for example:Pre and Post repair data can be included in one report.Pulse-to-Pulse surge data can include both bar charts and nested wave graphs (see picture below).Multi coil surge data can be presented in a summary bar chart and/or with detailed surge waveform graphs that can include other test results next to each surge graph.Hipot step test and PI graphs can include multiple tests to show trends and pre/post repair results.A rmature resistance values displayed in bar charts show data grouped by shorting-bar pattern.Your company logo is easily added to all report pages.Output formats include: printers, PDF, HTML and Microsoft Word TM format.Reports and screens on the testers are available in multiple languages.•••------••Failed L-L and PtoP surge test, one of multiple report pagesTREND ANAL YSIS CAPABILITIES• A full set of built in trend data tables and multi-test graphs for Megohm, PI and Hipot/Step Voltage tests is available.Results for each test set can be automatically stored in a line item test summary file. They can be transferred to aserver with one click of a button or automatically with the Export software.Transferred test summary files (test results over time) can be viewed in Excel or in a database program in a spreadsheet format. This makes trend analysis easy.DA TA TRANSFERMotor data, test data and complete reports can be exported from the iTIG II with one click transfers using flashdrives, Ethernet, Wi-Fi or VPN.•Transfers to a PC or server can be accessed by multiple people.Reports can go directly to job number folders in systems like MotorBase® and ACS.CUSTOMER OR MOTOR DA TABASE IMPORTWhen purchasing an ITIG II for the first time or for a new location, existing customer or plant data, motor or model data can be imported from databases or spreadsheets. This saves the operator time and eliminates entry mistakes and duplications.••••Some columns from the test summary CSV file. The file includes a total of 40 columns of data.Overview screen of test results, always available. Click tabs at the bottom to display results for each test. Repeat any individual testbefore the test set is closed.Customer and motor list screen, TRPro report program for PCs. Easily search for key data and sort the table by column heading, similar to the motor list screen in the iTIG II C & D.SPECIFICA TIONSHighest standards of instrumentation design.Providing superior measurement accuracy in all phases of testing.•High precision 4-wire μΩ winding resistance measurements through high voltage leads available.•High precision leakage current measurement.•Stable high precision high voltage generation.GET IN TOUCHIf you have any questions about our products or services, please do not hesitate to reach out to us or one of our trusted distributors around the world.For information on other Electrom products please visit our website. Or use the following links to find more information on the higher voltage Power Packs , and the even lighter and more portable iTIG II MINI .Toll free: 800.833.1881 (US, Canada, Caribbean)Tel: +1 720.491.3580Fax: +1 720.491.3533Email: *********************Address:1821 Lefthand Cir. Unit A Longmont, CO 80501USAAre you looking for a solution or are you interested in receiving more information? Click the button below and let us know.Contact usQuotes and informationiTIG II & 30kV Power Pack II iTIG II MINIGet info or a quote。

Synopsys Scan-based DFT技术介绍说明书

Synopsys Scan-based DFT技术介绍说明书

Cy Hay Product Manager,Synopsys IntroductionScan-based DFT is now the standard digital logic testing methodology used on almost all SoC designs. It enables a highly automated approach to implementing testable designs and generating test patterns, while providing predictable, high fault coverage and scalable test cost. More recently, products such as TetraMAX DSMTest and DFTMAX are widely used for testing for complex fault models, at-speed testing and scan compression, and these are all built on the foundation of scan-based DFT. Thus it is universally accepted that even the largest and most complex designs can be manufactured and tested with a high degree of confidence that defective devices will be rejected before they are packaged and shipped to system-level manufacturers.Scan-based DFT provides another equally significant benefit, though less broadly adopted. This same infrastructure enables a highly automated and accurate process for not only identification of defective devices, but also for identifying the specific location of the processing defects which caused it to fail. While the most basic goal of delivering fully functional parts only requires stop-on-first-failure testing, further testing of failing devices and diagnostics can provide useful, detailed information as to why the part failed. For individual devices, this information may seem random and might not be actionable. However, when this data is collected and analyzed over a significant volume of failing parts, systematic issues causing lower manufacturing yields can be statistically separated from the “noise” of random defects by the companion Yield Explorer product. Correlating the defect locations from a large number of devices, prioritizing those with the highest yield impact, and taking immediate corrective action has potentially enormous cost benefits by enabling faster time to market when new designs are being ramped up in manufacturing. This approach is known as volume diagnostics, and can also be used to help identify the root cause of spurious process excursions, and to make continuous yield improvements which increase long-term manufacturing efficiency.This white paper introduces recent advances in TetraMAX diagnostics which improve the accuracy of defect isolation by incorporating physical layout data, in addition to logic netlist information, in the diagnosis of individual failing parts.This paper also explains how physical diagnostics can improve the overall efficiency of volume diagnostics.White PaperUsing TetraMAX® Physical Diagnostics for Advanced Yield AnalysisImproving Defect Isolation with Layout DataJanuary 2010Understanding Scan Diagnostics and Stuck Fault SimulationA key concept for scan diagnostics is the defect signature. This is the set of all failing and passing test pattern responses for a given defect at a specific location in the circuit. Isolating the location of a defect requires calculating the signaturesof all defects and locations under consideration, and then comparing those signatures against the signature measured by the tester. If the signature from the tester matches a calculated defect signature, and if that defect signature is unique, scan diagnostics will successfully isolate the defect location.Similar to ATPG, scan diagnostics begin with the stuck fault model of defects. And the underlying technology to calculate signatures is the high-performance fault simulation engine in TetraMAX also used for scan ATPG. So how do scan diagnostics use stuck fault simulation? ATPG targets a stuck fault by controlling the node to the opposite value and simultaneously propagating and observing that node value in at least one scan cell. Once a pattern is generated, fault simulation will mark stuck faults as detected based on this criteria, and detected faults no longer need to be targeted by ATPG nor fault simulated for additional detections. During diagnostics, fault signatures are calculated by re-simulating the ATPG patterns that were applied on the tester, and by not dropping detected faults during fault simulation (which is only done for runtime efficiency during ATPG.) The essential function then is to identify those faults from the entire ATPG fault population with a signature that most closely matches the measured defect signature from the failing device on the tester. These identified faults are called fault candidates.Defect Mechanisms vs. Fault ModelsFor defect isolation, it is important to note that fault candidates do not have to be an exact model of the actual defect - they only need to match the responses measured by the tester better than all other possible faults. Consider that if a particular stuck fault is detected by a test pattern, then any defect at that same location will also cause a similar set of failures as long as the defect has been sensitized. Just as stuck fault ATPG patterns can detect many types of defects which have a more complex behavior than a single stuck fault, so too can diagnostics isolate man y “non-i deal” defects using just the stuck fault model.However, candidates taken only from the set of stuck faults may limit the accuracy and resolution of diagnostics in a number of cases:Stuck faults are modeled only on the pins of library cells. Defects within a complex cell or along a large net will be identified as fault candidates on the associated cell pins. This might not be precise enough for physical failure analysis, or to distinguish different defects that map to the same stuck fault candidates.Metal shorts usually behave like a bridging fault between two nets. If fault candidates are reported only as stuck faults, these candidates might appear as two independent defects, neither of which matches the failing signature from the tester.Complex defects that affect an entire cell or multiple nets in a routing channel might have significantly different signatures than any of the individual stuck faults associated with the defective cell or region.Improving Diagnostics Accuracy with Physical Layout DataSince defects occur in the physical environment, the greatest potential to improve diagnostics accuracy is to also consider the circuit layout (in addition to its logic behavior) when possible defects might have a different signature than the set of stuck faults. For diagnostics, the two most important defect types to consider here are metal shorts between two nets, and metal opens on large or high-fanout nets. The following figures show images of two common metal defects.Figure 1: High resistance short causing a bridging faultFigure 2: Broken line causing a net open faultFor metal shorts, it is important for diagnostics to recognize the signatures of bridging faults that could occur between two physically adjacent nets. At the same time, diagnostics should not consider several partially matching stuck fault signatures if those faults are physically separated. To achieve these objectives, several enhancements have been made to TetraMAX diagnostics. TetraMAX reads a list of adjacent net pairs in the design and uses those not only to target bridging faults during ATPG but also for diagnostics to distinguish between physically possible and impossible bridging fault candidates. Diagnostics also consider the signatures of the bridging faults associated with these net pairs, in addition to the signatures of the set of stuck faults, to identify the best fault candidates that match the tester response.Many nets may extend across a relatively large area of silicon, and for defects on those it becomes important to isolate not only the failing net but also where on the net a defect appears to be. Metal opens at or near a cell pin (basically at the end of a net) will behave very similar to a stuck fault on the respective pin, and diagnostics will identify that fault as a candidate. However, metal opens occurring in the middle of a large net often do not behave the same as any of the fault signatures at the net endpoints. Wherever the net branches to different fanouts, there will be a unique signature for each branch. Similar to metal shorts, TetraMAX has also been enhanced to read the physical topology of each net in the design, and diagnostics will also consider the signatures of faults associated with each branch, or segment, of the overall net.The following table shows the improvement in diagnostics accuracy when physical layout information is used. For this data, more than 20 circuits were characterized and hundreds of short and open defects were injected into the circuit model at random locations. The resulting simulation mismatches were diagnosed, and those results were compared with the actual location of the injected defect.Accuracy w/o physical data Accuracy w/ physical dataBridging faults 87.6% 99.1%Net open faults <80% 99.0%Table 1: Accuracy improvements with physical net pairs and net topologyUsing Physical Diagnostics to Improve Yield AnalysisWith the improvements just described, TetraMAX can provide both higher diagnostics accuracy and better diagnostics resolution by incorporating additional data from physical layout. Such improvements not only help during the physical failure analysis of an individual failing die, they can also significantly improve the effectiveness of volume diagnostics. For volume diagnostics, fault candidates from many failing die will be correlated and analyzed. To clearly distinguish the systematic yield issues from random defects, fault candida tes with “good” signatu re matches need to be strongly separated from other fault candidates with “poor” signature matches. I f critical yield issues are causing defects with signatures unique to metal shorts or metal opens, volume diagnostics will be less efficient if only stuck fault candidates are considered, as they might not correlate with the actual defect location and behavior.SummaryScan diagnostics and yield analysis are now required tools for achieving high manufacturing yields. As yield ramp and managing process yields become increasingly difficult with today’s most advanced processing geometries, both better automation and better predictability are required to address yield issues in a cost effective manner. TetraMAX physical diagnostics provide a significant improvement to the accuracy of defect isolation and to Yield Explorer volume diagnostics.Synopsys, Inc. · 700 · East Middlefield Road · Mountain View, CA 94043 · ©2010 Synopsys, Inc. All rights reserved. Synopsys is a trademark of Synopsys, Inc in the United States and other countries. A list of all Synopsys trademarks is available at https:///copyright.html. All other names mentioned herein are trademarks or registered trademarks of their respective owners. 01/10/chay/physdiag.。

安捷伦纳米压痕仪G200使用手册说明书

安捷伦纳米压痕仪G200使用手册说明书

Features and Benefits• Accurate, repeatable resultscompliant with ISO 14577 standard • Electromagnetic actuation allows unparalleled dynamic range in force and displacement• Flexible, upgradeable nanoindentation instrument can be configured for repeatable specific applications or a variety of new applications • Dynamic properties characterization via continuous measurement ofstiffness by indentation depth• Outstanding software with real-time experimental control, easy test protocol development, and precision drift compensation Applications• Semiconductor, thin films,MEMs (wafer applications)• Hard coatings, DLC films • Composite materials,fibers, polymers• Metals, ceramics • Biomaterials, biologyOverviewThe culmination of decades ofresearch and development, theAgilent Nano Indenter G200 is theworld’s most accurate, flexible, anduser-friendly instrument for nanoscale mechanical testing. Electromagneticactuation allows the Nano Indenter G200 to achieve unparalleled dynamic range in force and displacement.The Nano Indenter G200 enables users to measure Young’s modulus and hardness in compliance with ISO 14577. The G200 also enablesmeasurement of deformation over six orders of magnitude (from nanometers to millimeters). Furthermore, a variety of options can be added to accommodate applications testing needs. Thecapabilities of the G200 can be extended to facilitate frequency-specific testing, quantitativescratch and wear testing,integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10N, andcustomizable test protocols.With the Nano Indenter G200, users are able to quantify the relationshipbetween structure, properties,and performance of their materialsquickly and easily with minimalsample preparation. The user-friendly design of the G200 simplifies training requirements — standard testscan be run on the same day theinstrument is installed. Every G200 is backed by highly responsive Agilent Technologies customer service personnel. Knowledgeable and experienced regional applications engineers are available to guide users through more advanced testing, provide outstanding technical support, and offer unmatched applications expertise.Agilent Nano Indenter G200Data SheetPrecise mechanical testing in the micro to “sub-nano” range of loads and displacements.Figure 1. Schematic diagram of the actuating and sensing mechanisms ofthe Nano Indenter G200.2With the DCM II option, researchers can study not only the first fewnanometers of an indentation into the surface of a material, but even the pre-contact mechanics. At this scale, the noise level of the indentation system also must be optimized to enhance its actual displacement measurement capability. Usingstandard methods, the displacement resolution of the DCM II is determined to be 0.0002nm (0.2 picometers). Even more importantly, real-world testing shows that the noise levels are typically less than an angstrom, ensuring the best resolution of any indenter on the market today. The DCM II has the lowest noise floor of any instrument of its type.Continuous StiffnessMeasurement (CSM) OptionIn conventional quasi-staticindentation testing, the stiffness ofcontact is determined by analyzing the force vs. displacement curve duringunloading. This depth-sensing method provides a single measurement for the given indentation depth. The AgilentContinuous Stiffness Measurement(CSM) technique, which is compatible with both the XP and the DCM IIindentation heads, satisfiesapplication requirements that musttake into account dynamic effects,such as strain rate and frequency.The CSM option offers a means of separating the in-phase and out-of-phase components of the load-displacement history. This separation provides an accuratemeasurement of the location of initial surface contact and continuousmeasurement of contact stiffness as a function of depth or frequency, thus eliminating the need for unloading cycles. Since the contact stiffness is determined directly, no assumptions (such as mechanical equilibrium) are required to correct for elasticity.This makes CSM a powerful tool not only for stiff materials such as metals, alloys, and ceramics but also for time-dependent materials like polymers, structural composites, and biomedical materials.The state-of-the-art CSM option provides the only means available to both fully characterize dynamic properties in the nanometer range and accurately characterize viscoelastic materials providing values such as storage modulus. Indentation tests using CSM can be controlled with a constant strain rate, a critical test parameter for material systems such as pure metals or low-melting-point alloys, and polymer films and film / substrate systems. This level of control is not possible with the conventional method.Lateral Force Measurement (LFM) OptionThere are several additionalperformance-extending Nano Indenter G200 options available for use with the standard XP indentation head. TheAgilent Lateral Force Measurement (LFM) option provides three-dimensional quantitative analysisfor scratch testing, wear testing, and MEMS probing. This option enables force detection in the X andY directions to examine shear forces. Tribological studies benefit greatly from the LFM option for determination of the critical load and coefficient of friction over the scratch length. Advanced DesignAll nanoindentation experiments rely on the accuracy of the fundamental load and the displacement data, requiring the highest precision control of load applied to the sample. The Nano Indenter G200 is powered by electromagneticactuation-based force transducers to ensure precise measurements. The instrument’s unique design avoids lateral displacement artifacts, while software compensates fully for any drift in force.Among the many benefits of the Nano Indenter G200 design are convenient access to the entire sample tray, excellent sample positioningaccuracy, easy viewing of the sample position and the sample work area, and simplicity in sample heightadjustment to speed test throughput. A modular controller design is optimized for future upgrading. In addition, the G200 conforms to ISO 14577 to ensure data integrity, gives users the ability to program experiments with each forcetransducer and switch between them at any time, and has an optimized lateral footprint to conserve lab spaceNew Enhanced Dynamic Contact Module II OptionThe Nano Indenter G200 standard configuration utilizes the Agilent XP indentation head, which delivers <0.01nm displacement resolution and >500µm maximum indentation depth. To extend the range ofload-displacement experimentation to the surface contact level, the G200 can be equipped with the new Agilent Dynamic Contact Module II (DCM II) option. This option offers all of the impressive performance afforded by Agilent’s original DCM option as well as several new advantages, including 3x higher loading capability (30mN max load), easy tip exchange for quick removal and installation of application-specific tips, and a full 70µm range of indenter travel.Figure 2. This SEM image shows indents made at the base of a cantilever beam. The Nano Indenter G200 is uniquely suited for testing both MEMS and component materials for two reasons. First, theactuating and sensing mechanisms allow an unparalleled combination of range and resolution. Second, the controlling software is test-method based — there is no configuration or calibration of hardware.3High Load OptionThe capabilities of the Nano Indenter G200 can also be enhanced via the Agilent High Load option. Designed for use with the standard XPindentation head, this option expands the load capabilities of the Nano Indenter G200 up to 10N of force, allowing the complete mechanical characterization of ceramics, bulk metals, and composites. The High Load option has been engineered to avoid sacrificing the instrument’s load and displacement resolutions at low forces while seamlessly engaging at the point in the test protocol when extra force is required.Heating Stage OptionThis option, which is compatible withthe standard XP indentation head,facilitates the study of materials ofinterest as they are heated from roomtemperature to as high as 350ºC. Toensure reliable data, the system’ssoftware compensates for driftassociated with heating.New Enhanced NanoSuite 6.0 Professional SoftwareEvery Nano Indenter G200 comes with Agilent NanoSuite 6.0 Professionalsoftware, a premium-performancepackage that gives researchers in scientific and industrial settings an unprecedented combination of speed, flexibility, and ease of use. NanoSuite 6.0 offers a variety of brand new, prewritten test methods, including an exclusivenanoindentation technique for making substrate-independent measurements of thin film materials, several novel techniques for testing polymers, and improved scratch test methods. Agilent’s field-proven method for testing in compliance with ISO 14577, the international standard for indentation testing, is provided as well.Additional new capabilities allow a standard batch of tests comprising 25 or more samples to be set up in 5 minutes or less, 2D graphs to beplotted on-screen and exported directly to Microsoft Excel while preserving all labels and scales, and sample files to be organized by project and subproject. NanoSuite 6.0 also provides Microsoft Windows 7 (32-bit) compliance for current systems and a convenient PDF printer to replace hardware printers.As in the package’s previous iteration, an intuitive interface allows users to set up and run experiments quickly — changing test parameters as oftenas desired — with just a few clicks.NanoSuite 6.0 offers support of small force/displacement measurements, surface topology, stiffness mapping,scratch tests, and more. Versatileimaging capabilities, a survey scanning option, and streamlined test methoddevelopment help researchers get from testing to results in record time.NanoVision Software OptionThe Agilent NanoVision option for the Nano Indenter G200 is used to probe the surface of a sample, generating a 3D map of the surface. Backed by decades of nanomechanical testing experience, the NanoVision nanomechanical microscopy option delivers quantitative imaging by coupling a linear electromagnetic actuation-based indentation head with a closed-loop nanopositioningstage. NanoVision allows users tocreate quantitative high-resolutionimages using a Nano Indenter G200, target indentation test sites with nanometer-scale precision, and examine residual impressions in order to quantify material response phenomena such as pile-up, deformed volume, and fracture toughness. This option also lets users targetand characterize individual phases of complex materials.Nanoindentation instruments from Agilent Technologies conform to the ISO 14577 standard, delivering confidence in test accuracy and repeatability. These state-of-the-art solutions ensure reliable, high-precision measurement of nanomechanical properties for research and industry.Figure 3. Fracture toughness by Nanoindentation. Left image: A 24 x 24µm scan of a1200nm deep indent in silica. Crack features accentuated. Right image: An enlarged imageof the indent taken straight from the NanoSuite 6.0 review page.Agilent Nano Indenter G200 SpecificationsStandard XP Indentation Head Displacement resolution <0.01nm Total indenter travel1.5mm Maximum indentation depth >500µmLoad applicationCoil / magnet assembly Displacement measurement Capacitance gauge Loading capabilityMaximum load (standard)500mN Maximum load with DCM II option 30mN Maximum load with High Load option 10N Load resolution 50nN Contact force<1.0µNLoad frame stiffness ~5 x 106N/mIndentation placement Useable surface area 100mm x 100mmPosition control Automated remote with mouse Positioning accuracy 1µmMicroscope Video screen 25x (x objective mag.) Objective10x and 40xDCM II Indentation Head Option Displacement resolution 0.0002nm (0.2 picometers) Range of indenter travel 70µm Loading column mass <150mgLoad applicationCoil / magnet assembly Displacement measurement Capacitance gauge Typical leaf spring stiffness ~100N/m Typical damping coefficient 0.02Ns/m Typical resonant frequency 120HzLateral stiffness 80,000N/m Loading capability Maximum load 30mN (13gm) Load resolution 3nN (0.3µgm) LFM OptionMaximum lateral force >250mN Lateral resolution<2µN Maximum scratch distance >100mmScratch speed100nm/s up to 2mm/s High Load Option Maximum force 10N Load resolution≤1mN Maximum indentation depth ≥500µm Displacement resolution 0.01nmFrame stiffness ≥5 x 106N/mNanoVision Option X-Y scan range 100µm x 100µmZ scan rangeIndentation head dependent Positioning accuracy ≤2nmResonant frequency>120HzNano Mechanical Systems from Agilent TechnologiesAgilent Technologies, the premier measurement company, offers high-precision, modular nano-measurement solutions for research, industry, andeducation. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent’s leading-edge R&D laboratories ensure the continued, timely introduction and optimization of innovative, easy-to-use nanomechanical system technologies./find/nanoindenterAmericas Canada(877) 894 4414Latin America 305 269 7500United States (800) 829 4444Asia Pacific Australia 1 800 629 485China 800 810 0189Hong Kong 800 938 693India 1 800 112 929Japan 0120 (421) 345Korea 080 769 0800Malaysia 1 800 888 848Singapore 180****8100T aiwan 0800 047 866Thailand1 800 226 008Europe & Middle EastAustria 43(0)136****1571Belgium 32 (0) 2 404 93 40Denmark 45 70 13 15 15Finland 358 (0) 10 855 2100France 0825 010 700* *0.125 €/minute Germany 49 (0) 7031 464 6333Ireland 1890 924 204Israel 972-3-9288-504/544Italy 39 02 92 60 8484Netherlands 31 (0) 20 547 2111Spain 34 (91) 631 3300Sweden 0200-88 22 55Switzerland 0800 80 53 53United Kingdom 44 (0) 118 9276201Other European Countries:/find/contactusProduct specifications and descriptions in this document subject to change without notice.© Agilent Technologies, Inc. 2011Printed in USA, February 9, 20115990-4172EN RevC。

Materials Characterization

Materials Characterization

Materials Characterization As a seasoned writer with extensive experience in crafting complex and lengthy texts, I am well-equipped to deliver original and engaging content. My expertise lies in generating in-depth articles that captivate readers and provide valuable insights on a wide range of topics. With a keen eye for detail and a passion for storytelling, I strive to create compelling narratives that resonate with audiences and leave a lasting impression. When it comes to materials characterization, a multidisciplinary field that plays a crucial role in understanding the properties and behavior of various materials, I approach the subject with a blend of scientific rigor and creative flair. By delving into the intricate details of different characterization techniques, such as microscopy, spectroscopy, and thermal analysis, I aim to shed light on the underlyingprinciples that govern the structure and performance of materials. One of the key challenges in materials characterization is the need to balance precision and efficiency. With a myriad of techniques available for analyzing materials at the micro and nano scales, researchers must carefully select the most suitable approach based on the specific characteristics of the material under investigation. By exploring the strengths and limitations of different characterization methods,I seek to provide readers with a comprehensive overview of the tools andstrategies employed in this field. In addition to technical considerations, materials characterization also involves a creative element, as researchers often need to think outside the box to overcome obstacles and push the boundaries of knowledge. Whether it's devising innovative experimental setups or developingnovel algorithms for data analysis, the process of characterizing materials requires a blend of analytical thinking and imaginative problem-solving. By highlighting the ingenuity and resourcefulness of researchers in this field, I aim to inspire readers to explore new avenues of inquiry and push the boundaries of what is possible. Furthermore, materials characterization plays a vital role in advancing various industries, from electronics and aerospace to healthcare and renewable energy. By gaining a deeper understanding of the structure-property relationships in materials, scientists and engineers can develop new materialswith enhanced performance characteristics and novel applications. From lightweightcomposites for aircraft to biocompatible implants for medical devices, theinsights gained from materials characterization have the potential to drive innovation and shape the future of technology. In conclusion, materials characterization is a fascinating and dynamic field that offers a wealth of opportunities for exploration and discovery. By combining scientific expertise with creative thinking, researchers can unlock the hidden secrets of materials and pave the way for groundbreaking advancements in technology and industry. As we continue to push the boundaries of materials science, the role of characterization techniques will only grow in importance, shaping the way we design and engineer the materials of tomorrow.。

阿吉伦技术8110A 150MHz脉冲生成器技术规范说明书

阿吉伦技术8110A 150MHz脉冲生成器技术规范说明书

Agilent Technologies8110A 150 MHz Pulse GeneratorTechnical SpecificationsFlexible pulses or patterns for digital designsKey Features · 150 MHz Timing· 2 ns Variable Transitions · 10 Vpp (20 Vpp) into 50 Ω · 10 ps Resolution· 0.1% Frequency Accuracy · 4 kbit Pattern per Channel · 3 and 4 Level Signals · 1 or 2 Output Channels· SCPI Programming Commands · Small Size· Graphic DisplayAgilent Technologies8110A 150 MHz Pulse GeneratorThe Agilent 8110A 150 MHz Pulse Generator is a test instrumentthat provides sufficient speed and performance for testing designs to their limits; testing under real-world conditions to verify the proper function of the design.· pulses, digital patterns andmultilevel waveforms for testing current logic technologies (CMOS, TTL, LVDS, ECL, etc.)· credible measurements · easy set-up and operation · upgrade capabilityReal World PulsesWith the pattern feature and the the optional second channel of the Agilent 8110A, real world s ignals, like reflections, distorted pulses, or three or even four-level signals can be simulated.Pattern Based TimingThe Agilent 8110A simulates all the clock and data signals needed to test digital designs. Conditions such as extended delays can be generated using pattern based timing features.Clean PulsesThe Agilent 8110A generates clean pulses with 10 psresolution, low jitter and good pulse performance across all operating temperatures orsettings. Parameters and trigger modes can be changed without generating unwanted pulses, so that reliable measurements are guaranteed.19812High AccuracyExcellent accuracy over a wide temperature range guarantees repeatable measurement results.Frequency accuracy, jitter,resolution and range can be enhanced further when the Agilent 8110A is used with the internal phase locked loop (PLL) of the Agilent 81106A as pulse period source.Delay CalibrationSystematic delays caused by cables,connections and adapters can be compensated when the Agilent81107A is installed. It offers enough additional delay range to compensate for 5 m of BNC cable.External Clock or Reference Frequency 1An external synthesizer or system clock can be used as clock source at the clock input of the Agilent 8110A to achieve the frequency accuracy and required. Thisfeature is ideal for simulating digital control signalssynchronously to the clock of the microprocessor.Up to 10 channels in parallel 2Up to 4 Agilent 8110As can be slaved to a master, so that 10synchronous channels can beprogrammed independently. With the Agilent 81107A multichannel deskew installed, the propagation delay of the set-up can becompensated, and all other output channels zeroed to the reference channel.Smooth Integration into Automated Test SystemsThe Agilent 8110A can be smoothly integrated into automated test systems, ensuring:·low integration costs ·low costs of ownershipAll Digital WaveformsThe waveform and triggerflexibility of the Agilent 8110A make it a universal digitalstimulus for any automated test sys-tem.Reliable MeasurementsAccuracy is specified over the whole temperature range that exists in a test rack. Setting check and built-in diagnostics allow you to monitor the correct operation of the Agilent8110A in an automated test system.Easy Rack IntegrationThe small size of the Agilent 8110A saves valuable rack space. Rear panel connectors and rack mount kits are optional.Reduced Programming InvestmentThe local user interface eases the transition from manual toautomated measurements and from the R&D bench toautomated manufacturing test. All parameters of the Agilent 8110A are programmable via GPIB. SCPI (Standard Commands for Programmable Instruments)facilitates the standardization of test programs.Low Cost of OwnershipThe proven hardware reliability of Agilent test and measurement prod-ucts results in high uptime of test systems and low maintenance costs.The Agilent 8110A offers a 3 year standard warranty.Easy Set-up and OperationView all timing parameters for both channels at a glance. Timing and level parameters can be entered in any format, e.g. period as frequency.The alternative graphic display shows the timing relationship of all pulse parameters on both channels graphically, making setting up the pulse generator easy - no extra oscilloscope is required.Pulses and patterns can be set up quickly using the convenient cursor keys, knob and data entry keys. You can even use the Autoset Key to resolve all timing conflicts.Memory CardSettings can be storedpermanently either internally or on the memory card for duplication in another test set-up.4Pattern ModePattern length:4 kbit/channel and strobe output.Output format:RZ (return to zero), NRZ (non-return to zero), DNRZ (delayed non-return to zero). Random pattern:PRBS 2^(n-1) n = 7,8,...,12Trigger ModesContinuous:continuous pulses, double pulses, bursts (single or double pulses) or patterns. External triggered:each active input transition (rising, falling or both) generates a single or double pulse, burst or pattern.External gated:the active input level (high or low) enables pulses, double pulses, bursts or patterns. The last single/double pulse, burst or pattern is alwayscompleted.External width:the pulse shapecan be recovered. Period and width ofan external input signal is main-tained. Delay, levels and transitionscan be set.Manual:simulates an external inputsignal.Internal triggered (only with Agilent81106A):internal PLL replaces anexternal trigger source. Pulses, doublepulses, bursts or patterns can be set.Inputs and OutputsExternal inputused for trigger, gate or externalwidth.Input impedance:50 Ω /10 kΩ selec-table.Threshold:- 10 V to + 10 V.Max. input voltage:± 15 Vpp.Sensitivity:≤300 mVpp typical.Transitions:< 100 ns.Frequency:dc to 150 MHzMin. pulsewidth:3.3 ns.Strobe output and trigger outputLevel:TTL or ECL selectable.Output impedance:50 Ω typical.Strobe output: user-defined, 16 kbit pat-tern (NRZ) when in pattern mode.Max. external voltage:- 2 V/+7 V.Transition times:2 ns typical.Pattern:4096 bits NRZ in patternmode.Delay from external input to strobeoutput:in pattern mode same as fortrigger output.Trigger OutputLevel:TTL or ECL selectableOutput impedance:50 ΩtypicalTrigger pulse width:typically 50% ofperiodMaximum external voltage:-2 V/+7 VTransition times:2 ns typicalDelay from external input to triggeroutput:l8.5 ns typicalAgilent 81107A Multichannel Deskew for the Agilent 8110ACan be retrofitted without recalibration. Supports twooutput channels. Themultichannel deskew can be used for two applications:Up to 10 channels:compensates delay between external input and trigger outputs when using up to five8110As synchronously.Delay calibration:compensates for measurement system delays or pre-trigger delays of oscilloscopes. Variable range:0 ns to 28 ns Additional fixed delay:6.5 ns typical Resolution:10 ps User InterfaceOverprogramming:all parameters canbe overprogrammed(exceeding specifications) to fullyexploit the hardware limits.Setting check:warning messages indi-cate potentially conflicting parame-ters due to inaccuracy.Error messages indicateconflicting parameters.Help key:displays a context-sensitive message.Autoset key:resolves all timing con-flicts.Non-volatile memory:currentsetting is saved on power-down.Up to nine user settings and one fixeddefault setting can be stored in theinstrument.Clear memory:clears all nine user set-tings.Memory card:320 settings can bestored on a 1 MB PCMCIA card(MS-DOS ).Remote ControlOperates according to IEEEstandard 488.2, 1987 and SCPI1992.0.Function Code:SH1, AH1, T6, L4, SR1,RL1, PP0, DC1, DT1, C0.Programming times:all checks anddisplay off.GeneralOperating temperature:0°C to +55°C.Storage temperature:-40°C to +70°C.Humidity:95% r.h. up to 40°C ambi-ent temperature.EMC:conforms to EN50082-1,EN 55011, Class A.Noise emission:5.7 bel typical.Battery:Lithium CR2477-N.Safety:IEC1010, CSA1010.Power requirements:100-240 Vac, ± 10%, 50-60 Hz;100-120 Vac, ± 10%, 400 Hz.Power consumption:300 VA max.Max. dimensions (H * W * D):89 mm * 426 mm * 521 mm.Weight: 9.2 kg net, 13.8 kgshipping.Recalibration period:one year recommended.Warranty:three years standard.6Ordering Information - 8110AT he minimum order must include the 8110A mainframe and one 81103A output channel. A second output channel, the 81106A PLL/external clock or the 81107A multichannel deskew are optional. All configurations are available from the factory. Alternatively, additional modules can be ordered later and fitted by the user or an Agilent service facility.Qty per Mainframe Categorymin max Description NumberMainframe[1]1150 MHz Pulse Generator Mainframe Agilent 8110AModules1210 V/2 ns Output Channel Agilent 81103A01PLL/External Clock Agilent 81106A01Multichannel Deskew Agilent 81107AAll options are orderable with the mainframes.AccessoriesOpt UN2Rear Panel ConnectorsOpt 1CP Rack Mount and Handle Kit (5062-3975)Opt 1CN Handle Kit (5062-3988)Opt 1CM Rack Mount Kit (5062-3974)Opt 1CR Rack Slide Kit (1494-0060)Opt UFJ 1 MB SRAM Memory CardAgilent 15104A Pulse Adder/SplitterLanguage optionsOpt ABD German Localization (08110-91112)Opt ABF French Localization (08110-91212)Opt ABZ Italian Localization (08110-91312)Opt ABE Spanish Localization (08110-91412)Opt ABJ Japanese Localization (08110-91512)Opt AB0Chinese Localization (08110-91612)Additional documentation optionsOpt 0B2 Additional English Operating Manual(08110-91012)Opt 0BW Service Manual (08110-91021)08110-91031Service Documentation (Component Level)Support OptionsOpt 1BP MIL Std. 45662A Calibration with Test DataOpt W32 3 Year Customer Return Calibration CoverageOpt W34 3 Year MIL Calibration ServiceOpt W50 5 Year Customer Return Repair CoverageOpt W52 5 Year Customer Return Calibration CoverageOpt W54 5 Year MIL Calibration Service7Related Agilent Literature·Agilent Family of Pulse/PatternGenerators, brochure, p/n 5980-0489EAgilent Technologies'Test and Measurement Support, Services, and AssistanceAgilent Technologies aims to maximize the value you receive, while minimizing your risk and problems. We strive to ensure that you get the test and measurement capabilities you paid for and obtain the support you need. Our extensive support resources and services can help you choose the right Agilent products for your applications and apply them successfully. Every instrument and system we sell has a global warranty. Support is available for at least five years beyond the production life of the product.Two concepts underlay Agilent's overall support policy: "Our Promise" and "Your Advantage."Our PromiseOur Promise means your Agilent test andmeasurement equipment will meet its advertised performance and functionality. When you are choosing new equipment, we will help you with product information, including realistic performance specifications and practical recommendations from experienced testengineers. When you use Agilent equipment, we can verify that it works properly, help with product operation, and provide basic measure-ment assistance for the use of specifiedcapabilities, at no extra cost upon request. Many self-help tools are available.Your AdvantageYour Advantage means that Agilent offers a wide range of additional expert test and measurement services, which you can purchase according to your unique technical and business needs. Solve problems efficiently and gain a competitive edge by contracting with us for calibration, extra-cost upgrades, out-of-warranty repairs, and on-site education and training, as well as design, system integration, project management, and other professional services. Experienced Agilent engineers and technicians worldwide can help you maximize your productivity, optimize the return on investment of your Agilent instruments and systems, and obtain dependablemeasurement accuracy for the life of those products.By internet, phone, or fax, get assistance with all your test & measurement needs Online assistance:/find/assist Phone or Fax United States:(tel)180****4844Canada:(tel)187****4414(fax) (905) 206 4120Europe:(tel) (31 20) 547 2000Japan:(tel) (81) 426 56 7832(fax) (81) 426 56 7840Latin America:(tel) (305) 267 4245(fax) (305) 267 4286Australia:(tel) 1 800 629 485 (fax) (61 3) 9272 0749New Zealand:(tel) 0 800 738 378 (fax) 64 4 495 8950Asia Pacific:(tel) (852) 3197 7777(fax) (852) 2506 9284Product specifications and descriptions in this document subject to change without notice.Copyright © 2000 Agilent Technologies Printed in Germany 10/20005980-1212EFor more information, please visit us :/find/pulse_generator。

分享在未来世界你使用ai的经历作文英语

分享在未来世界你使用ai的经历作文英语

分享在未来世界你使用ai的经历作文英语Here is an essay on the topic of "Sharing My Experience Using AI in the Future World" with more than 1000 words, written in English without any additional title or punctuation marks.In the ever-evolving landscape of technology, the integration of artificial intelligence (AI) has become a ubiquitous part of our daily lives. As I step into the future, I find myself embracing the transformative power of AI with open arms. The seamless integration of this advanced technology has not only enhanced my productivity but has also opened up a world of endless possibilities.One of the most remarkable ways in which AI has impacted my life is in the realm of personal assistance. My AI-powered virtual assistant has become an indispensable companion, anticipating my needs and promptly addressing them with remarkable efficiency. From scheduling appointments and managing my calendar to providing personalized recommendations and insights, this intelligent system has streamlined my daily tasks, freeing up valuable time for me to focus on more meaningful pursuits.Moreover, the integration of AI in my work has revolutionized theway I approach problem-solving and decision-making. With access to vast troves of data and the ability to process information at lightning speeds, my AI-powered tools have become invaluable assets in navigating complex challenges. Whether it's analyzing market trends, optimizing workflows, or generating innovative ideas, the AI-driven solutions at my disposal have consistently delivered remarkable results, empowering me to stay ahead of the curve in my respective field.Interestingly, the influence of AI extends far beyond the professional realm, permeating into the very fabric of my personal life as well. From personalized fitness regimens and meal planning recommendations to customized entertainment suggestions and lifestyle optimization, the AI-powered systems that I have integrated into my daily routine have transformed the way I approach self-care and leisure activities.One particularly remarkable aspect of my AI-centric future is the seamless integration of these technologies into my living environment. My smart home, equipped with a network of interconnected devices and sensors, has become a sanctuary of convenience and efficiency. With a simple voice command or a tap on my smartphone, I can control the temperature, lighting, and security of my living space, as well as automate various household tasks, freeing up valuable time and mental energy.Furthermore, the advancements in AI-powered healthcare have had a profound impact on my well-being. From personalized medical diagnoses and treatment plans to real-time monitoring of my vital signs, the AI-driven healthcare solutions I have access to have not only improved the quality of my care but have also empowered me to take a more proactive approach to my health and wellness.Perhaps one of the most captivating aspects of my AI-infused future is the way it has transformed the way I engage with the world around me. The integration of AI-powered translation and language processing capabilities has broken down language barriers, allowing me to seamlessly communicate and collaborate with individuals from diverse cultural backgrounds. This has not only enriched my personal and professional relationships but has also opened up new avenues for cultural exchange and global connectivity.Additionally, the AI-driven advancements in transportation and logistics have revolutionized the way I navigate my surroundings. Autonomous vehicles and smart city infrastructure have optimized my commutes, reducing traffic congestion and carbon emissions, while also providing me with a more comfortable and secure travel experience.Undoubtedly, the integration of AI into my life has not been withoutits challenges. As with any transformative technology, there have been concerns about privacy, security, and the potential displacement of human labor. However, through proactive engagement with policymakers, ethical AI practitioners, and the broader community, I have been able to navigate these complexities and ensure that the benefits of AI are equitably distributed and the risks are effectively mitigated.In conclusion, my experience with AI in the future world has been nothing short of transformative. From personalized assistance and enhanced productivity to improved healthcare and global connectivity, the integration of this advanced technology has profoundly shaped my daily life. As I continue to embrace the ever-evolving landscape of AI, I remain excited and optimistic about the boundless potential it holds for shaping a better future for all.。

Elabscience总氧化状态(TOS)比色法测试盒说明书

Elabscience总氧化状态(TOS)比色法测试盒说明书

(本试剂盒仅供体外研究使用,不用于临床诊断!)Elabscience®总氧化状态(TOS)比色法测试盒Total Oxidant Status (TOS) Colorimetric Assay Kit产品货号:E-BC-K802-M产品规格:48T(32 samples)/96T(80 samples)检测仪器:酶标仪(580-590 nm)使用前请仔细阅读说明书。

如果有任何问题,请通过以下方式联系我们:销售部电话************,************技术部电话131****6790具体保质期请见试剂盒外包装标签。

请在保质期内使用试剂盒。

联系时请提供产品批号(见试剂盒标签),以便我们更高效地为您服务。

用途本试剂盒适用于检测细胞、组织样本及血清等液体样本中的总氧化状态。

检测原理在酸性条件下,样本中的氧化性物质可将Fe2+氧化为Fe3+,后者与二甲酚橙高度结合产生一种蓝紫色的复合物。

在溶液pH为2-3的范围内时,其最大吸收波长在590 nm附近,且颜色深浅程度在一定浓度、一定时间内与氧化性物质的含量成正比,从而间接测定样本的总氧化状态。

本试剂盒检测组织或细胞样本时,需测定总蛋白浓度,推荐使用本公司BCA试剂盒(货号E-BC-K318-M)进行测定。

提供试剂和物品说明:试剂严格按上表中的保存条件保存,不同测试盒中的试剂不能混用。

对于体积较少的试剂,使用前请先离心,以免量取不到足够量的试剂。

所需自备物品仪器:酶标仪(580-590 nm,最佳检测波长590 nm) 试剂准备①检测前,试剂平衡至室温。

②不同浓度标准品的稀释:样本准备①样本处理血清样本:可直接测定。

组织或细胞样本:组织样本处理的匀浆介质为PBS(0.01 mol/L,pH 7.4)或生理盐水(0.9% NaCl)。

②样本的稀释在正式检测前,需选择2-3个预期差异大的样本稀释成不同浓度进行预实验,根据预实验的结果,结合本试剂盒的线性范围:2.5-100 μmol H2O2 Equiv./L,可参考下表进行稀释(仅供参考):注:稀释液为PBS(0.01 mol/L,pH 7.4)或生理盐水(0.9% NaCl)。

创新的结果名词解释英文

创新的结果名词解释英文

创新的结果名词解释英文Innovation: Exploring the Essence and Impacts of a Crucial ConceptIntroductionIn today's rapidly evolving world, innovation has become a buzzword used in various contexts, but a clear understanding of its meaning is often elusive. This article aims to demystify the term and shed light on its implications, without delving into the realm of politics. Exploring the depths and breadth of innovation, we aim to provide a comprehensive understanding of this multifaceted concept.1. Defining InnovationInnovation can be defined as the process of creating and implementing new ideas, products, services, or strategies that bring about significant improvements or create unique value. It encompasses a wide range of activities that challenge the status quo, driving progress and change across various domains.2. The Pillars of InnovationWhile innovation is multifaceted, three key pillars lie at its foundation:2.1 Technological InnovationTechnological innovation involves the development and application of new technologies or the improvement of existing ones. It drives advancements in industries, ranging from healthcare to communication, by introducing groundbreaking tools, systems, or processes that enhance efficiency, productivity, and quality.2.2 Product InnovationProduct innovation entails the creation of new or improved goods, services, or processes with enhanced functionalities, features, or design. It allows businesses to stay ahead of competitors and meet the evolving needs and desires of customers. Examples include the introduction of electric cars, smartphones, or streaming services.2.3 Business Model InnovationBusiness model innovation refers to the discovery of new approaches to conduct business, often resulting in enhanced value creation or the disruption of existing markets. It involves reimagining how products or services are produced, delivered, or monetized. Airbnb's peer-to-peer accommodation model or Netflix's shift from DVD rentals to streaming are prime examples of business model innovation.3. The Impact of InnovationInnovation has far-reaching effects across diverse sectors and society as a whole. Let's explore some of its significant impacts:3.1 Economic Growth and CompetitivenessInnovation drives economic growth by fostering the creation of new industries, generating employment opportunities, and increasing productivity. By continuously introducing novel solutions, businesses can maintain a competitive edge in the global market, attracting investments and fueling economic development.3.2 Social Progress and Well-beingInnovation plays a pivotal role in addressing societal challenges and improving people's lives. It enables advancements in healthcare, education, renewable energy, and infrastructure, enhancing overall well-being and quality of life. For instance, medical breakthroughs like vaccinations, advanced surgical techniques, and personalized medicines have revolutionized healthcare and increased life expectancy.3.3 Environmental SustainabilityAs the quest for sustainability gains momentum, innovation offers solutions to mitigate environmental challenges. From renewable energy technologies to eco-friendly materials and waste management systems, innovative approaches help reduce pollution, conserve resources, and curb carbon emissions. The impact extends from individuals adopting environmentally friendly habits to industries revolutionizing production processes to minimize ecological footprints.4. Fostering InnovationNurturing a culture of innovation is crucial to drive progress and thrive in an ever-changing world. Some key elements that foster innovation include:4.1 Creativity and CuriosityEncouraging creativity and providing space for exploration stimulates innovative thinking. By promoting a curious mindset and an environment that values diverse perspectives, organizations can unlock untapped potential and tap into new ideas.4.2 Collaboration and Knowledge SharingCollaboration among individuals, teams, and organizations from different backgrounds and expertise fosters innovation. Encouraging the exchange of knowledge, ideas, and experiences enhances problem-solving capabilities and helps generate innovative solutions.4.3 Risk-Taking and Failure AcceptanceInnovation often involves taking risks and embracing the possibility of failure. Cultivating a culture that encourages calculated risks, learns from failures, and rewards experimentation can fuel innovation by empowering individuals to think outside the box and challenge existing norms.ConclusionInnovation is a dynamic and multifaceted concept that permeates various aspects of our lives. Its impact is far-reaching, driving economic growth, social progress, and environmental sustainability. By understanding the pillars of innovation and fostering a conducive environment, we can harness its power and shape a better future. Let our collective pursuit of innovation ignite positive change and pave the way for continuous progress.。

各种软件的功能介绍

各种软件的功能介绍

1Mega的功能:▲数据输入▲排序功能数据处理▲密码子分析▲序列综合编辑▲序列阅读▲Substitution Pattern Homogeneity Test 单因子模式替换分析▲遗传距离▲选择测试▲分子钟▲进化树构建▲距离矩阵▲系统树分析2Bioedit的功能:序列处理和编辑功能▲用于序列处理和编辑的简单的图形界面▲使用编辑选项包括残基的select and drag 选择和拖动和grab and drag 抓取和拖动变量选择选项鼠标点击插入和删除缺口全框选择全屏编辑中剪切复制和粘贴编辑窗口的自动刷新。

▲固定序列框保护排列中的固定残基▲自动的和手动的注解序列使用一个模板序列自动注解同一排列中的其他序列。

▲序列分组分为各个颜色编码家族为同步手动排列锁定组成员。

▲根本的多基因树图阅读器支持节点翻转和打印。

▲链接多基因树图到排列并保存到BioEdit格式排列文件。

▲在ABI自动序列模型377 373 3700中显示打印和编辑ABI痕迹文件在版本2和3中有SCF文件就象用Licor序列输出文件。

RNA比较分析功能▲ RNA比较分析工具包括共变,可能配对和互交信息分析。

▲使用鼠标指示的动态数据视图的互交信息输出2 D矩阵图表,关于互交信息矩阵行和框的互交式的1 D图表。

▲用BioEdit或GanBank格式保存序列注解信息。

▲通过氨基酸翻译排列蛋白质编码核酸序列在排列中搜索保存的残基寻找好的PCR目标或帮助定义基序。

▲在核酸或蛋白质序列中搜索用户定义的基序或用通配符搜索精确的文本并选择包括或忽略缺口。

▲使用自动更新的排列蛋白质全标题和GenBank区域信息进行ClustalW多序列排列。

▲基本序列处理在文档之间复制粘贴序列翻译和还原编码RNA DNA RNA 反转/互补,大写字母/小写字母。

▲多文档界面最多同时打开20个文档但是在其他打开的窗口不能设置限制六框翻译核酸序列为Fasta格式ORF表用矢量图进行半自动质粒矢量绘图和注解自动酶切位点和位置标记自动多接头视图和用户控制绘图工具将质粒文件保存为可编辑的矢量图形文件如位图复制到其他图形程序并可以打印氨基酸和核苷酸成分摘要和图表Revert to Saved 恢复保存和undo 撤销功能编辑氨基酸和核酸序列简单的指定色彩表编辑蛋白质和核酸序列使用不同的色彩表排列易感的描影法以信息为根据其中包括排列位置BioEdit 能够读写GenBank, Fasta, NBRF/PIR, Phylip 3.2 和Phylip 4格式能够读ClustalW 和GCG格式.10个附加格式的导入输出过滤器使用Don Gilbert的ReadSeq导入/添加一个文件到最后的另一个文件上(不考虑文件格式)基本的多文本编辑器限制性内切酶图谱用于任何或所有形式的翻译复酶和输出选项包括酶的提供者和环状DNA选项游览限制性内切酶创造商自动连接到你喜欢的网页游览器如Netscape 或Internet ExplorerPaup的功能:PAUP(简约法和其他方法的亲缘分析)是由简约法、最大似然法和距离法用于亲缘分析的程序,为系统发育分析提供一个简单的,带有菜单界面的,与平台无关的,拥有多种功能(包括进化树图)的程序。

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Peter M. MaurerDepartment of Computer Science and EngineeringUniversity of South FloridaTampa, FL 33620ABSTRACTEnhanced context free grammars are an effective means of generating test data, even for simple programs. Grammars can be used to create intelligent random samples of tests as well as to create exhaustive tests. Action routines and variables may be used to compute expected results and perform other actions that are difficult or impossible to perform with ordinary context free grammars. Grammars may be used to create subroutine test data that contains pointers and other binary data. Test grammars not only provide a method for improving software quality, but should prove to be the foundation of much future research.Peter M. MaurerDepartment of Computer Science and EngineeringUniversity of South FloridaTampa, FL 336201. IntroductionWhen asked to name their ten most useful programming tools, most programmers would probably not place context free grammars at the top of the list. In fact for most of us, the term brings to mind a collection of obscure proofs from some barely remembered theory of computation class. Even if context free grammars were a magic balm that could somehow make the most bug-ridden program run correctly, many programmers would be too intimidated by the underlying theory to use them. Nevertheless, my experience using context free grammars to generate tests for VLSI circuit simulators has convinced me that they are remarkably effective tools that can be used by virtually anyone to debug virtually any program.Although it is not obvious, VLSI testing and software testing have much in common. VLSI circuits have become so complex that more time is spent testing their functionality than is spent testing their electronics, in most cases a great deal more. Because functionality testing is usually done on a software simulation rather than on the circuit itself, the distinction between software testing and VLSI testing has all but disappeared.I discovered the usefulness of context free grammars while I was looking for a way to improve the quality of functional tests for VLSI circuits. This was not a trivial task, because our methodology was already very good. We monitored our simulators to guarantee that every line of code was executed. We included code to monitor assertions and report violations. We analyzed control paths to guarantee that each one had been executed. We identified boundary conditions and tested them exhaustively. And we conducted many code inspections. In spite of this, the bugs would just not go away, and irritatingly enough, our users seemed to be able to find them quite readily. (I have had many similar experiences with many other kinds of software.)* This work was supported by the University of South Florida Center for Microelectronics Design and TestBecause we had exhausted all of the systematic methods known to me, I decided to experiment with random samples of tests taken from the problem domain. Now, random testing is not a new idea (For an overview of automatic test generation see [1] and its many references. For an approach similar to the one described here, see [2].) Random tests have been used to test both software and hardware with similar results. Random tests can be used to find the easy bugs (or hardware faults) but finding the difficult bugs requires more systematically generated tests. What I wanted was a method for generating tests that was substantially more clever than a simple random number generator. I wanted a system that would take a template describing the format of a test and generate a collection of random tests according to the template. I wanted to begin with a test that was designed to test for a difficult bug (for example) and generate many different tests to detect the same bug and hopefully many others. After spending a lot of time thinking about the underlying principles of such a system it occurred to me that what I had in mind was an interpreter for context free grammars. Development of the tools proceeded rapidly once I had this concept firmly in mind.My first test generator was dedicated to testing a single VLSI chip (or more correctly a software simulation of the chip), and proved to be surprisingly effective[3]. Since that time I have developed several "data-generator generators" that translate context free grammars into test generators. The most useful of these is "dgl" (for data generation language) developed at the University of South Florida. Dgl and its underlying language (which for lack of imagination I also call "dgl") are vastly different from that first data generator, but the underlying principle is the same. The data generator contains a grammar that describes the tests, and when it is executed it generates one or more tests according to the grammar. Although originally intended as a method for generating random tests, dgl has evolved into a tool that can also be of assistance in generating some kinds of systematic tests. At present dgl is still evolving. Every new application of the tool uncovers new ways the tool could be used "if only it had this new feature." Nevertheless, the underlying principle of using grammars to generate tests remains firm, and this is the subject of the rest of this article.2. Before You Begin to TestAlthough the methods described in this paper will enable you to generate a thousand tests as easily as one, you must develop a careful plan both for generating the tests and for using them. You must start with a methodology that you know is sound. (For example you should have some method of guaranteeing that every line of code is executed at leastonce.) The methods described here are designed to enhance the effectiveness of a sound methodology, not to replace it.Your most immediate problem will be determining whether a test has passed or failed. If it takes you an hour to analyze the results of one test, it will take you a thousand hours to analyze the results of a thousand tests. You must establish some method of quickly deciding whether a test has passed. This can be done in several ways. You may wish to construct tests that are easy to diagnose. If you can see at a glance whether a test has passed, you can run and analyze a thousand tests with very little effort. Of course in such a case, a simple analysis program could analyze the results of a test in microseconds, enabling you to run not thousands but millions of tests.My personal preference is to generate self-diagnosing tests, that is tests that contain an expected result, and use an analysis program to determine whether the test has passed. To do this, you must either have tests whose outcome is easy to predict, or you must have more than one version of the program you are testing. In the first case, it is easy to adapt the test-generation grammar to predict the result of the test. The second case is more complicated. In some applications it is the usual practice to have more than one version of a program available. For example in VLSI testing there is usually more than one software simulator available, and these are usually quite different from one another. In life support systems, and other systems designed for high reliability, it is common to have two or more different versions of a program. In other cases, there may be a fast prototype or a previous release available. At times it might be worthwhile to write a simplified version of the program for the sole purpose of predicting test outcomes. In any case, you should test both programs independently and verify the results manually to guarantee that you're not just comparing one bug against another. I have not found the problem of generating expected results to be especially restricting. I believe it is a good policy to provide all tests with expected results and check the results automatically, regardless of where one obtains them. Even if it is necessary to verify the results of each test manually, context free grammars can be used to simplify the construction of the required tests.One aspect of testing for which I have found grammars to be ideal is performance measurement. Since one typically does not care about the outcome of such tests, one can ignore the problem of generating expected results. Furthermore, because one is concerned with the average case rather than testing all special cases, the problem of detecting the hard bugs is not of primary importance.3. Your First TestsThe best way to create a test grammar is to start with a set of existing tests and turn it into a grammar. Suppose you have written a calculator program to do simple arithmetic, for which you have created the tests pictured in Figure 1.2+12+-13-23*73*84*77/34/2Figure 1. Tests for a Calculator Program.You have two add statements because your parser handles negative numbers differently from positive numbers. You have several divides and multiplies because your arithmetic routine handles powers of two by doing shifts instead of multiplies and divides. Figure 2 shows how your first grammar might look.test:%{number}+%{number},%{number}+-%{number},%{number}-%{number},%{number}*%{number},%{number}*8,4*%{number},%{number}/%{number},%{number}/2;number:0,1,2,3,4,5,6,7,8,9;Figure 2. A First Test Grammar.(In this and all other examples I follow the dgl convention of specifying productions in the form "<name>: <choice-1>, <choice-2>, ... , <choice-n>;" and nonterminals in the form %{name}.) Notice that this grammar preserves the properties that made the original test good. There are examples of multiplying and dividing by powers of two and there are examples containing negative numbers. We could make this grammar even better by changing the "number" production to generate positive and negative multi-digit numbers and by adding a production to generate powers of two. If we have several sets of tests, we can combine the grammars in many different ways. The most obvious is to simply add more alternatives to the "test" production of the above grammar. We could also use a"parent" production of the form "test: testset_1, testset_2, ..., testset_n;" and make "testset_i" the start symbol of the ith set of tests.At this point it is appropriate to say something about how the above grammar can be used to generate a test. The start symbol is "test" so first select one of the alternatives from the "test" production. Let's assume we choose the alternative "%{number}+%{number}." We will scan this alternative from left to right and replace the nonterminals with data. When we find the first nonterminal "%{number}" we will choose an alternative from the production "number" and use that to replace the nonterminal. Eventually we will end up with a string such as "7+4." If we want to generate a second test, we begin again by making another choice from the production "test." Since we may choose the alternative "%{number}+%{number}" many times, we must do our replacements on a copy of the alternative rather than on the alternative itself.The key question is how to make a choice from a set of alternatives. In the above example, dgl will choose alternatives at random with an equal probability of choosing any particular alternative. For many applications, this may not be the best way of choosing alternatives. At the very least you may want certain choices to be made more often than others, for example in the above you may want to concentrate on multiplication and division and limit the number of tests for addition and subtraction. In more complicated examples you might want to avoid choosing the same alternative twice, or you might want alternatives to be chosen in a particular order. To handle these problems, dgl provides selection rules that specify the way alternatives are to be chosen and allows weights to be assigned to alternatives to force some to be chosen more often than others. Indeed, much of the research that has gone into dgl has been concerned with identifying and implementing useful selection rules. An exhaustive discussion of these rules would be, to say the least exhausting, so I will limit my discussion to those that I believe are the most useful and natural.Probably the most natural selection rule is specifying the probability of selecting a particular alternative. There is already a probability associated with each alternative, why not let the user change it? One place where I find this particularly useful is in generating tests for VLSI arithmetic circuits. Some arithmetic algorithms are sensitive to the number of ones and zeros in their arguments, so using arguments with only a few ones or only a few zeros tends to find bugs. The following example generates binary numbers with only a few zeros and lots of ones.bnumber: %32{bit};bit: 31:1, 1:0;On the average, only one out of 32 selections from "bit" will be a zero. (I've snuck a bit of dgl shorthand into this example. The nonterminal %32{bit} means to make 32 consecutive selections from "bit.") The idea of weighting the alternatives of a production is not new. See [4] for a complete discussion of probabilistic context free grammars. The most obvious use of weights is to guide the test generator to favor those tests that you feel will detect the most bugs. In performance measurement weights can be used to construct a random sample of tests with a given mix of test types. An intriguing opportunity for future research might be to keep track of the number of bugs detected when a particular alternative is chosen and automatically adjust the weights to favor those alternatives that detect the most bugs.To summarize this section, I believe that the best place to start constructing a test grammar is from tests that are known to be good, and work in a bottom-up fashion. It is also possible to work in a top-down fashion by constructing a grammar that describes every possible test. Unless this method is used carefully you may end up with a grammar that has a very low probability of generating tests for the "hard" bugs. On the other hand, I have found that a sprinkling of purely random tests is sometimes useful for finding categories of tests that are important but somehow got overlooked. For example, in the calculator program will "divide by shifting" work if the dividend is negative?4. Action RoutinesAnother natural extension to context free grammars is to add action routines to certain alternatives. There are many ways to do this, but in dgl I have chosen to define an action routine as an arbitrary subroutine written in the C language. Action routines provide a handy method for computing the expected results of a test, provided the tests are not too complicated, and they can be used to implement esoteric functions not available in the dgl language. To see how action routines can be used to generate expected results, let us return to the calculator example. Suppose we want to generate test data and expected results in the following format.<value><operator><value> = <expected result>For simplicity I will show only the addition alternative "%{number}+%{number}." Figure 3 shows a grammar that will do the job.test: %{number_x}+%{number_y}=%{add_result};number_x: %{number.x}%{x};number_y: %{number.y}%{y};x: variable;y: variable;number: 0,1,2,3,4,5,6,7,8,9;add_result: action (output(x_value+y_value););Figure 3. An Example of an Action Routine.The contents of the action routine is implementation dependent, but most reasonable implementations would provide similar features. The two productions "number_x" and "number_y" are used to make the two most recent choices from the "number" production accessible to the action routine. The nonterminal %{number.x} makes a choice from "number" and assigns the choice to the variable "x." Because the nonterminal %{number.x} produces no value, the nonterminal %{x} is needed to insert the value of the choice into the test. The action routine adds the two most recently selected values and uses the "output" function to insert the result into the test.I leave the more esoteric uses of these routines to your imagination, but let me say a bit more about variables. There are many kinds of tests that require you to use the same value many places. When constructing a grammar for such tests, it may be necessary to generate such a value at random. Variables allow you to do this, as the following example illustrates.double: %{number.x}%{x}+%{x}x: variable;number: 0,1,2,3,4,5,6,7,8,9;In this example, a number is chosen at random, assigned to the variable "x," and then the contents of "x" is inserted into the test twice. You might use such a test to verify that an optimization of the calculator program for doubling a number works correctly.The main point of variables is that they enable you to do things that cannot be done without them. In a theoretical sense, context free grammars with variables are more powerful than ordinary context free grammars (they are, in fact, universal in a theoretical sense). It is my belief that any grammar-based system to generate test data must rely on some extension of context free grammars that enhances their theoretical power. Many such extensions have been developed, but of all those with which I am familiar, I find variables to be the easiest to implement and to use. (There is always room for debate on such issues.)Variables may contain both data and nonterminals. This is useful when the size of the test depends on data contained in the test. Such examples are rare, but they do occur in practice. It is sometimes easier to use action routines to generate this kind of data, but the The grammar of Figure 4 shows how variables may be used to do the job.test: %{number.x}"The following number contains " %{x} "digits: "%{val};number: 0,1,2,3,4,5,6,7,8,9;x: variable;val: %{gen.y}%{y};gen: "%%" %{x} "{number}";y: variable;Figure 4. Storing a Nonterminal in a Variable.In this example, the production "val" first assigns the value "%n{number} to the variable "y," and then inserts the value of "y" into the test. Since "y" contains a nonterminal, its contents are replaced by n selections from the production "number." (The double "%%" is dgl syntax that keeps the replacement from being done until after the value is placed in the variable.)5. Generating Systematic TestsAlthough I first began using grammars to generate random tests, it rapidly became clear that they could also be used to simplify the generation of systematic tests. In my work it is often necessary to test many different special cases sometimes alone, and sometimes in combination with other special cases. Furthermore, I have come to rely almost exclusively on self-diagnosing tests and automatic methods for reporting test failures. Under these circumstances, writing a large number of tests is far more time consuming than running them or analyzing the results. One alternative would have been to design a second data generator that would generate all tests described by a grammar, instead of making choices at random. (This approach has been used by Duncan and Hutchison[2].) However, many of my special cases were of the form "a 32-bit number beginning with 011" and that sort of thing. I didn't want to choose specific values for fields that did not require them, and I didn't want to generate a huge number of tests just to test one special case. I eventually discovered a method for generating all possibilities for some productions while allowing other choices to be made at random.The implementation is quite complicated and beyond the scope of this paper, but the use of this feature is quite simple, as the example of Figure 5 shows. This examplegenerates tests for the "multiply-by-shifting" optimization of our calculator program. All specified powers of two are tested exhaustively with randomly selected numbers.test:chain%{number} * %{power_of_two},%{power_of_two} * %{number},%{power_of_two} * %{power_of_two};number:0,1,2,3,4,5,6,7,8,9;power_of_two:chain1,2,4,8,16,32,64,128,256;Figure 5. Generating Exhaustive Tests.The only difference between this and a purely random example is the "chain" keyword on the productions named "test" and "power_of_two." Since the production named "number" does not have this keyword, its choices are made randomly rather than systematically.I believe that a similar feature would be useful in any grammar based system for generating tests, but one word of warning. Such features generate huge numbers of tests. Make sure you have some efficient method for determining whether they pass or fail.I have found other systematic selection methods to be useful in generating both random and exhaustive tests. Two of these are generation of sequence numbers, and selecting alternatives from a production sequentially rather than randomly. These both work pretty much as you would expect them to, so I won't burden you with examples.6. Generating Tests for SubroutinesAlthough it has always been my ambition to test complicated subroutines independently, I have usually been put off by the difficulty of creating data for them. The most complicated subroutines always seem to process complex structures that contain pointers and binary data. Even generating simple input of this nature usually requires a complex program. Recently I was attempting to debug a complicated macro processor (for generating VLSI structures) and I decided to try to apply my work in test grammars to the problem of debugging one particular routine that was giving me a lot of trouble. This routine was designed to evaluate arithmetic and logical expressions that had been parsed into a tree-like data structure whose nodes are pictured in Figure 6.Type Left RightFigure 6. An Expression Node.The field "type" contains an integer that specifies the operation to be performed, while the fields "left" and "right" point to the operands. To simplify things, assume that a "type" of 1 means addition, 2 means an integer operand, and 3 means a variable operand. For addition "left" and "right" point to the data structure elements defining the operands. For integer operands, "left" contains the value of the operand and "right" is null (zero). For variable operands "left" contains a pointer to the variable name, which must be a single letter a-g and "right" is null (zero). The grammar of Figure 7 may be used to generate these structures.expr: %{add_type}%{expr_pointer}%{expr_pointer},%{number}%{value}%{null},%{variable}%{var_name}%{null};add_type: binary 1;number: binary 2;variable: binary 3;expr_pointer: pointer %{expr};value: binary 0,1,2,3,4,5,6,7,8,9;var_name: pointer a,b,c,d,e,f,g;null: binary 0;Figure 7. Generating Complex Data Structures.Notice that this grammar is not too different from the grammars used to generate other kinds of tests. The only difference is that some productions return binary values and pointers instead of character strings. I incorporated data generator produced by this grammar into a simple driver routine (about 10 lines) that called the data generator and passed the data structures to my subroutine. To be truthful, this is not the grammar I used to debug my subroutine. I actually used a grammar that generated several specific tests rather than one that generated tests randomly. Using this approach I found I was able to "get into the guts" of the subroutine far more quickly than I could testing the program as a whole. Furthermore, since preparing the test grammar took only a few minutes (for each set of tests) I was able to debug my subroutine in a very short time.Although I believe that this work is on the right track, I am not yet satisfied with the results. At present it is easy to generate C-language structures, but I'm not sure about other languages. Furthermore, the style seems a little too dependent on the underlying implementation of the data structure. More work is needed in this area. One possible approach would be to couple a grammar-based test system with an interactive symbolic debugger that understands the peculiarities of the various languages, and is capable of transforming a more generic specification into structures suitable to a particular language.7. A Word of WarningThe example of the preceding section contains something that I have been careful to avoid in all other examples: a recursive grammar. There is a hidden danger in using recursive grammars to generate data. This danger is of a theoretical nature, not an implementation problem (dgl likes recursive grammars just fine). To illustrate, consider the recursive grammar of Figure 8.exp:%{exp}+%{exp},%{exp}*%{exp},(%{exp}),%{variable};variable: a;Figure 8. A Recursive Grammar.The four alternatives of the production "exp" are chosen with equal probability. When a nonterminal of the form %{exp} is replaced, the replacement has a 50% chance of having two copies of %{exp}, both of which must eventually be replaced. It has a 25% chance of containing one copy and a 25% chance of containing no copies of %{exp}. Now, think about the string that the data generator is currently expanding, and count only the occurrences of %{exp}. The string has a 50% chance of getting bigger, a 25% chance of staying the same size and only a 25% chance of getting smaller. The data-generator will not stop until the size is zero. In short, your test might be infinitely long. To get this grammar to work, you must weight the fourth alternative so that the probability of getting smaller is greater than the probability of getting larger. If you use this rule of thumb with all of your recursive grammars you should stay out of trouble.For a complete theoretical analysis of this phenomenon, see reference [4].8. ConclusionI have found the enhanced context free grammars described in this paper to be very effective tools for generating test data of many different kinds. I have used these grammars to debug many different programs with great success. Due to the large volume of tests that can be generated from a test grammar, it is usually necessary to devise some automatic method for predicting the outcome of a test and diagnosing the results once it has been run. For some tests, action routines can be used to compute the expected outcome, but a separate program is usually needed to compare the actual result with the predicted result and report discrepancies.I have used grammars to debug many different programs, and I am continually surprised by their effectiveness. For example, I was recently explaining the principles of test grammars to a student using a simulator for a binary division circuit as an example. I showed him how to construct the grammar, how to generate expected results, and how to automatically check for test failures. Before I ran the tests I said, "Of course I'm just using this circuit as an example. It's much too simple to benefit from such a powerful testing technique." In the next instant over 70% of the tests failed. The circuit did not work for unsigned numbers with a high order digit of one.Nevertheless, the tests are no better than the grammar used to generate them. I believe that there is much room for additional research in this area. One avenue might be to investigate methods for generating test grammars automatically from program specifications, or from the code itself. Regardless of future developments, the ability to create a large number of tests with a minimum of effort makes test grammars an effective tool for improving software quality.。

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