Curve Tracer SOP
N-端脑钠肽测定SOP_PBNP临床意义_检验科生化项目SOP
N-端脑钠肽测定
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3.1试剂
采用西门子医学诊断产品(上海)有限公司提供的试剂盒。
3.1.1试剂组成
试剂船1~2孔为FADP 0.056 mg/mL,D-脯氨酸68.8mg/mL,片剂;3~4孔为Apo-D-氨基酸氧化酶0.23 mg/mL,辣根过氧化物酶0.19 mg/mL,DCHBS 3.9 mg/mL,4-AAP 0.94mg/mL,片剂;6孔为抗体-CrO2 1.3mg/mL,片剂;7孔为缓冲液,稳定剂,液体;8孔为抗体-碱性磷酸酶,缓冲液,稳定剂,液体。
10参考文献
[1]西门子医学诊断产品(上海)有限公司N-端脑钠肽(PBNP)测定试剂说明书。
编写:审核:批准:
8生物参考区间
<75岁的患者:125pg/mL
≥75岁的患者:450pg/mL
9临床意义
NT-proBNP可以用于疾病的诊断和预测。血浆中NT-proBNP的浓度指示着左心室功能障碍患者的
N-端脑钠肽测定
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预后情况。它还可以用于确定症状为心源性或者非心源性。对于怀疑患有充血性心力衰竭(CHF)的患者,NT-proBNP的测定可以作为诊断和评估严重程度的辅助方法,还可以指示急性冠状动脉症状和心力衰竭患者的风险等级。NT-proBNP是急性冠状动脉症状患者一年死亡率的最强独立预测值。NT-proBNP水平在不稳定心绞痛和随后的心肌梗死的患者中有所升高。虽然对这些疾病没有诊断意义,一系列研究显示NT-proBNP检测可以为不稳定心绞痛和心肌梗死患者的短期与长期的风险等级提供预测信息。
2标本采集与处理
2.1采血方法
空腹肝素锂、肝素钠与乙二胺四乙酸抗凝静脉血2~3ml。
IV curve test
When performing curve tracing on an integrated circuit, one of the probes is usually attached to a reference pin as the other probe is rotated among the other pins, i.e., it is connected to each of the other pins one at a time. The voltage-current (V-I) curve of each pin of the device under test (DUT) with respect to the reference pin is then compared to that exhibited by a known good device (KGD). The analog ground (AGND), +Vs, and -Vs pins are usually chosen as reference pins since they are nodes thatare, more often than not, common to all the other pins.Interpreting a V-I curve is not difficult. For example, an electrical path that projects a horizontal line at I=0 on the CRT display is an open circuit, since the current level remains at zero even if the voltage is varied from a negative to a positive value. On the other hand, a vertical line along V=0 indicates a short, since the voltage stays at zero regardless of the current level. A purely resistive path would show a straight, diagonal line, with the reciprocal of the slope of the line equal to the resistance value (R=V/I). Curve tracing is likewise a convenient tool for locating the breakdown voltages of a p-n junction, or even show the betacurves of a transistor.Curve tracing can also be done on an electrical path inside the die circuitry itself, where the nodes defining the electrical path are not connected to any external pins. Microprobing is then employed to achieve electrical contact with the selected nodes,with the probe needles also attached to the curve tracer.lxrryliuxx at 2008-12-02 13:42:02bardon:diode in series W/R 和diode in parallel W/R是什么意思?EFA (Electrical Failure Analysis)是以电学测试为主的失效分析,主要的工作方向是找到芯片里发生故障的位置,需要很了解电路以及电测试结果等。
Curve Trace
8
Abnormal Characteristics (Reverse-bias)
Fig.7. Apparent breakdown voltage reduction due to ESD stress
The breakdown in it is not avalanche breakdown. (As the electric field is not high enough to support multiplication.) This may be due to aluminum from the contact spiking into the silicon producing high current when the voltage level is high enough for the depletion region to incorporate the aluminum.
© 2006 Amkor Technology, Inc.
Amkor Confidential /mation
10
Abnormal Characteristics (Reverse-bias)
Positive charge in the oxide Ionic contamination or following long periods of forward-bias stress
Fig.9. Walkout of reverse-bias breakdown curve
Dependent upon the current limiting resistance on the curve tracer, and on the adjustments made to the collector supply as the voltage is increasing. Often a sawtooth appearance results. As a thermal effect since breakdown voltage increases with junction temperature.
CURVE TRACER
专利名称:CURVE TRACER发明人:JACQUES A. PONTIGNY 申请号:US3700992D申请日:19710726公开号:US3700992A公开日:19721024专利内容由知识产权出版社提供摘要:A curve tracer of two variables respectively represented on axes of variables Y and X on a recording rack, capable of being removed at a speed depending upon the first of the said variables, said tracer comprising a first regulation loop having a first movable organ, the removal of which is regulated by the variations of the second of the said variables, a second regulation loop having a second movable organ, allowing to trace a curve on the said recording rack, a scale transformation device, mechanically coupled with the first said movable organ and having a second recording rack on which is traced a scale transformation curve representing for each value to be transformed of the second variable, represented on the axis of X, a transformed value represented on the axis of Y, and detector means mounted in the second said regulation loop and adapted so as to be able to move along the axis of Y of the curve of the said second recording rack, the movement of the second movable organ being regulated by the movement of the detector means.申请人:COULTER ELECTRONICS INC.更多信息请下载全文后查看。
兽药稳定性研究指导原则-VICH GL3-中英文-2020.9.22
European Medicines Agency Veterinary Medicines and Inspections7 Westferry Circus, Canary Wharf, London, E14 4HB, UKTel. (44-20) 74 18 84 00 Fax (44-20) 74 18 84 47E-mail: mail@emea.europa.eu www.emea.europa.eu London, 19 February 2007Doc.Ref.EMEA/CVMP/VICH/899/99-Rev.1VICH Topic GL3Step 7 (after revision at step 9)GUIDELINE ON STABILITY: STABILITY TESTING OF NEW VETERINARY DRUGSUBSTANCES AND MEDICINAL PRODUCTSADOPTION BY CVMP FOR RELEASE FOR CONSULTATION 5 October 2005TRANSMISSION TO INTERESTED PARTIES October 2005END OF CONSULTATION 5 January 2006ADOPTION BY CVMP 14 February 2007DATE FOR COMING INTO EFFECT January 2008VICH GL3(R) (Q UALITY)January 2007Revision at Step 9For Implementation at Step 7稳定性:兽药新品种和药品的稳定性试验(修订版)S TABILITY: S TABILITY T ESTING OFN EW V ETERINARY D RUG S UBSTANCES AND M EDICINALP RODUCTS (R EVISION)Recommended for Adoptionat Step 7 of the VICH Processin January 2007 by the VICH SCfor implementation in January 2008This Guideline has been developed by the appropriate VICH Expert Working Group and is subject to consultation by the parties, in accordance with the VICH Process. At Step 7 of the Process the final draft is recommended for adoption to the regulatory bodies of the European Union, Japan and USA.Secretariat : C/O IFAH, rue Defacqz, 1 - B - 1000 Bruxelles (Belgium) - Tel. +32-2-543.75.72, Fax +32-2-543.75.85TABLE OF CONTENTS1. INTRODUCTION (4)1.1. Objectives of the Guideline (4)1.2. Scope of the Guideline (4)1.3. General Principles (4)2. GUIDELINES (5)2.1. Drug Substance (5)2.1.1 General (5)2.1.2. Stress Testing (5)2.1.3. Selection of Batches (5)2.1.4. Container Closure System (6)2.1.5. Specification (6)2.1.6. Testing Frequency (6)2.1.7. Storage Conditions (6)2.1.8. Stability Commitment (8)2.1.9. Evaluation (9)2.1.10. Statements/Labeling (7)2.2. Medicinal product (10)2.2.1. General (10)2.2.2. Photostability Testing (10)2.2.3. Selection of Batches (10)2.2.4. Container Closure System (10)2.2.5. Specification (11)2.2.6. Testing Frequency (11)2.2.7. Storage Conditions (12)2.2.8. Stability Commitment (16)2.2.9. Evaluation (17)2.2.10. Statements/Labeling (18)3. GLOSSARY (18)4. REFERENCES (22)1. INTRODUCTION1.1. Objectives of the Guideline The following guideline is a revised version of the VICH GL3 guideline and defines the stability data package for a new drug substance or medicinal product that is sufficient for a registration application within the three regions of the EC, Japan, and the United States. It does not seek to address the testing for registration in or export to other areas of the world. The guideline seeks to exemplify the core stability data package for new drug substances andproducts, but leaves sufficient flexibility to encompass the variety of different practicalsituations that may be encountered due to specific scientific considerations and characteristics of the materials being evaluated. Alternative approaches can be used when there are scientifically justifiable reasons.1.2. Scope of the GuidanceThe guideline addresses the information to be submitted in registration applications for newmolecular entities and associated medicinal products. This guideline does not currently seekto cover the information to be submitted for abbreviated or abridged applications, variations,or clinical trial applications, etc.Specific details of the sampling and testing for particular dosage forms in their proposedcontainer closures are not covered in this guideline.Further guidance on new dosage forms, medicated premixes, and onbiotechnological/biological products can be found in VICH guidelines GL4, GL8, and GL17,respectively. Stability testing following first use of the product (e.g., first broaching of a vial)is not covered within this guideline.1.3. General PrinciplesThe purpose of stability testing is to provide evidence on how the quality of a drug substanceor medicinal product varies with time under the influence of a variety of environmentalfactors, such as temperature, humidity, and light, and to establish a re-test period for the drugsubstance or a shelf life for the medicinal product and recommended storage conditions.The choice of test conditions defined in this guideline is based on an analysis of the effects ofclimatic conditions in the three regions of the EC, Japan, and the United States. The meankinetic temperature in any part of the world can be derived from climatic data, and the worldcan be divided into four climatic zones, I-IV. This guideline addresses climatic zones I andII. The principle has been established that stability information generated in any one of thethree regions of the EC, Japan, and the United States would be mutually acceptable to theother two regions, provided the information is consistent with this guidance and the labelingis in accord with national/regional requirements.简介指导原则的目标以下指南是VICH GL3指南的修订版,定义了一种新的药物或药品的稳定性数据包,该数据包足以在EC 、日本和美国三个地区内进行注册申请。
curve tracer工作原理
curve tracer工作原理
curvetracer是一种用于测试和诊断半导体器件的仪器。
它的工作原理基本上是利用电流-电压特性曲线来分析半导体器件的电性能。
通过在二极管或晶体管上施加一定的电压和电流,可以绘制出它们的特性曲线,从而验证其性能,例如截止电压、饱和电流等。
使用curve tracer还可以检测器件的击穿点,以及故障的位置和原因。
同时,curve tracer还可以进行不同种类器件之间的比较和对比,从而更
好地了解它们的特性和性能。
总之,curve tracer是一种非常重要
的半导体器件测试仪器,对于保证半导体器件质量和性能具有重要意义。
- 1 -。
曲线跟踪仪使用
How to Measure IEBO and BVEBO??
Notice that there is no EBO configuration key in the diagram above!
Collector Wires (from Probe Station) to Emitter Adapter and Emitter Wires (from Probe Station) to Collector Adapter Figure 14: This figure Emitter Wires Connected to shows the Emitter Wire from Probe Station Collector Adapter connection of wires
Configuration Keys
Step Generator Collector Emitter with Base Open Collector Emitter with Base Shorted to Emitter Collector Base with Emitter Open
Current Step Generator IC
>>> To Measure EBO current/breakdown its is necessary to change the
Collector Wires Connected to Emitter Adapter
Collector Wire from Probe Station
Polarity Function Key
5. Switch ON the VACUUM. 6. Press START (at ALIGN) followed by STOP button immediately.
c vp的测量流程
c vp的测量流程下载温馨提示:该文档是我店铺精心编制而成,希望大家下载以后,能够帮助大家解决实际的问题。
文档下载后可定制随意修改,请根据实际需要进行相应的调整和使用,谢谢!并且,本店铺为大家提供各种各样类型的实用资料,如教育随笔、日记赏析、句子摘抄、古诗大全、经典美文、话题作文、工作总结、词语解析、文案摘录、其他资料等等,如想了解不同资料格式和写法,敬请关注!Download tips: This document is carefully compiled by theeditor. I hope that after you download them,they can help yousolve practical problems. The document can be customized andmodified after downloading,please adjust and use it according toactual needs, thank you!In addition, our shop provides you with various types ofpractical materials,such as educational essays, diaryappreciation,sentence excerpts,ancient poems,classic articles,topic composition,work summary,word parsing,copy excerpts,other materials and so on,want to know different data formats andwriting methods,please pay attention!CVP(中心静脉压)的测量流程如下:1. 物品准备:中心静脉压测量装置,包括压力传感器、连接管、冲洗液等。
稳定性试验标准操作规程(SOP)
稳定性试验标准操作规程1. 稳定性试验的内容:1.1 加速破坏试验,预测样品的有效期;1。
2 样品在规定的保存条件下观察若干年限的检测结果。
2.稳定性试验的基本要求:2。
1 稳定性试验包括影响因素试验、加速试验和长期试验。
2.1.1 影响因素试验适用于原料药的考察,用1 批原料药进行;2.1。
2 加速试验和长期试验适用于原料药与药物制剂,要求用3 批供试品进行.2.2 原料药供试品是一定规模生产的,供试品量相当于制剂稳定性实验所要求的批量,原料药合成工艺路线、方法、步骤应与大生产一致. 药物制剂的供试品应是放大试验的产品,其处方与生产工艺应与大生产一致。
备注:原料药的初步有效期或复检期可基于中试规模的批号,如果①中试批号采用的生产方法和工艺路线是模拟用于商业生产规模的最终工艺;②原料药的质量代表了商业生产规模的物料.2。
3 供试品的质量标准应与各项基础研究及临床验证所使用的供试品质量标准一致。
2。
4 加速试验与长期试验所用供试品的容器和包装材料及包装方式应与上市产品一致。
2.5 研究药物稳定性,要采用专属性强、准确、精密、灵活的药物分析方法和有关物质的检查方法,并对方法进行验证以保证药物稳定性试验结果的可靠性。
在稳定性试验中,应重视有关物质的检查。
注:有关物质的检查,Namely:杂质的检测,包括异构体,确定的or未知的其他杂质,单杂,总杂等;及包括降解,络合,破坏产生的一系列物质。
稳定性重点考察项目(附件1)原料药:性状、熔点、含量、有关物质、吸湿性以及根据药品性质选定的考察项目题外话:除了主峰以及辅料或溶剂峰外都是杂质峰,有的是主成分的降解产物,有的是合成中未除尽的中间体或溶剂等,还有的就是制剂过程中带进来的,都要严格控制,尤其是注射剂等品种。
3.原料药的稳定性试验:影响因素试验目的:在药品研发过程中如处方组成合理性评价、质量研究中分析方法的可行性判断、上市药品包装材料的选择和贮藏条件的确定等方面起着重要作用。
370 Cvrve Tracer副标准具检测方法
370 Curve Tracer副标准具检测方法
1.目的:检测Curve Tracer的精确度,保证制品检测的准确性 2. Curve Tracer副标准具检测用TR为K1336M/K1518M 2个品种各6个,每周1次各选一个进 行检测,管理周期为3个月,3个月后有技术担当进行TR确认后重新制定(如图1) ※如3个月未到,检测时有问题,联系技术确认
WUXI KEC CO.,LTD
3
MOG
①
②
3.将选定TR插入如图2所示的连接口内※ 注意3个极(B E C)连接的正确性 4.根据所选品种的给定各个条件,逐个进行 检测 (如图3) ④
③
⑤
⑥
WUXI KEC CO.,LTD
1
MOG
First & Best
1).sinter
得到一个0.2UA的差异值,则IB的精确值为12+0.2=12.2UA 2)检测VCBO(根据图3中给定的IC条件100UA选择量程为20UA,这样的目的是使读数点在显 示屏中间左右,使读数更精确,慢慢调节图4中的VARIABLE COLLECTOR SUPPIY键使图8 中的IC值达到100UA,读出所示VCBO值
⑧Байду номын сангаас
所选的量程 IC条件显示 VCBO值
3)VCEO VEBO检测方法同VCBO检测方法相同
WUXI KEC CO.,LTD
2
MOG
First & Best
4 注意事项: ⑨
1)图9中MAX PEAK VOLTS和MAX PEAK POWER WATTS必须调节适当,基准MAX PEAK VOLTS调的大MAX PEAK POWER WATTS就调的小,两者反比关系 2) VARIABLE COLLECTOR SUPPIY调节时必须慢慢进行,不然容易把TR击穿,对设备也 有影响 3)每1个项目检测完后VARIABLE COLLECTOR SUPPIY必须调节到0 4)检测后数据如超出SPEC范围,联系技术确认
稳定性考察SOP
●稳定性考察SOP stability study SOP1. 目的Objective/Purpose (3)2. 适用范围Scope (3)3. 责任部门(人)及权限Responsible department (person) (3)3.1 处于临床和注册阶段的研发产品development products in clinical and registration phase (3)3. 2 对于商业化产品commercial products (4)4. 定义、符号和缩略语Definition,signal and abbreviation (4)4.1 定义 (4)4.1.1 加速试验Accelerated testing (4)4.1.2 强力破坏试验Stress testing (Drug Substance) (4)4.1.3 强力破坏试验(制剂) Stress testing (Drug Product) (5)4.2 简写abbreviations (5)5. 物料和设备Materials and equipment (5)6. 规程Procedure (5)6.1 稳定性方案stability protocol (5)6.2 成品稳定性研究Drug Product stability (6)6.2.1 批次和数量Number and Size of Batches (6)6.2.2 加速稳定性accelerated stability (7)6.2.3贮存条件Storage Conditions (7)6.2.4检测方法和标准Test methods and specifications (7)6.2.5 容器密封系统Container-Closure System (8)6.2.6 防腐剂Preservatives (8)6.2.7 变更引起的稳定性研究Stability study for change control (8)6.3原液和中间体Bulk Drug Substances and Intermediates (9)6.3.1 考察批次和样品量Number and Size of Batches (9)6.3.2 加速稳定性研究Accelerated Studies (9)6.3.3 贮存条件Storage Conditions (9)6.3.4 检测方法和标准Test methods and specifications (10)6.3.5 容器密封系统Container-Closure System (10)6.3.6 防腐剂检测Preservatives (11)6.3.7 变更引起的稳定性研究Stability study for change control (11)6.4 实际贮存条件下长期稳定性稳定性试验计划real storage conditions long term stability plan (12)6.5 加速和强力稳定性试验研究Accelerated and stress study (12)6.6取样检测时间点和检测窗Timepoints for sampling and testing window (13)6.7 可接收标准Acceptance criteria (13)6.8 偏差管理和它们在稳定性报告中的追朔Deviations Management and their traceability in the stabilityreport (13)6.9稳定性数据趋势分析和统计分析Stability Data trending and Statistical Analysis (14)6.10 上市产品的稳定性研究后续产品的稳定性研究Time point frequency for Follow-up Stability Studies 156.11 和药政部门沟通Communication with Health Authorities (15)6.12 稳定性试验箱/稳定性试验房间管理stability chamber or stability room (16)6.13 稳定性样品留样stability samples retention (16)6.14 稳定性样品送检stability samples delivery (16)6.15 稳定性结果汇总 (16)6.16 稳定性报告stability report (17)6.17 稳定性中期报告Interim Study Report (17)6.18 稳定性方案和报告的编号stability protocol and report number (17)7.记录报告Reporting (17)8.参考文献Reference documents (17)9.附件attachment (18)10.注意事项Notes (18)1. 目的Objective/Purpose本文的主要目的是按照WHO,ICH,《中国药典》和GMP要求,管理研发和上市疫苗产品稳定性研究,确定产品的复验期/有效期,贮存和运输条件。
方法学操作规范SOP
方法学SOP操作规范英文文章对方法学的要求一、标准曲线(Standard curve)目的:为消除和校正在测定不同浓度的样品时间产生的误差。
方法:配置一份对照品溶液(单一或者混合对照品),进样分析时取不同的进样体积建立标准曲线。
取最低浓度稀释数倍,当所测指标S/N=10时即为定量限(LOD);当所测指标S/N=3时即为检测限(LOQ)。
结论:建立标准曲线时,至少取5个点建立标准曲线且使得样品浓度在标准曲线范围内,得到相应的线性方程,计算出相关系数R,用R来衡量拟合程度,一般要求R需大于0.999才算合格。
检测限表示检测被测物质所需要的最低浓度或者量,定量限表示准确测定被测物质含量所需要的最低浓度或者量。
注意事项:药材多指标定量时,一般用的是混合对照品。
标准曲线至少需要5个点才能建立。
二、精密度(Precision)目的:精密度是为了检测仪器测定样品时所产生的误差。
方法:英文文章中,精密度项需要做日内和日间精密度。
同一个浓度的样品一天内连续进液相分析6针,根据峰面积算RSD,得到的是日内精密度;连续做3天,三天内的平均峰面积算出RSD,得到的是日间精密度。
结论:日内精密度RSD小于5%时,说明仪器连续测定时精密度良好;日间精密度RSD小于5%时,说明仪器稳定,也包含了药材供试品稳定。
注意事项:做精密度时可以选用药材样品也可以选择对照品,我们在做精密度一般选用药材来做。
三、稳定性(stability)目的:考察样品的稳定性方法:取一个样品供试液,在室温下放置适当的时间(具体时间可以根据具体情况来选择),每隔一定的时间对样品进行测试,计算RSD。
结论:在所取时间范围内RSD小于5%,说明样品在所取时间内稳定。
注意事项:取的时间点需要具体事情具体分析。
四、重复性(Repeatability)目的:考察了取样的准确性,为加样回收做准备。
方法:按相同的方法重复制备同一批次样品6次,计算药材含量,算出RSD。
端子弯折测试方法
端子弯折测试方法Port bending test is a crucial process in ensuring the reliability and durability of electronic components. It is essential to determine the mechanical strength of the connectors and evaluate their ability to withstand repeated bending stress. This test helps identify potential weaknesses in the design or manufacturing of the connectors, enabling manufacturers to improve their products and meet industry standards.端子弯曲测试是确保电子元件可靠性和耐久性的重要过程。
确定连接器的机械强度并评估其耐受重复弯曲应力的能力非常重要。
该测试有助于识别连接器设计或制造中的潜在弱点,使制造商能够改进其产品并符合行业标准。
One of the common methods used in port bending tests is the repetitive bending test, where the connector is bent back and forth multiple times to simulate the wear and tear it may experience during normal use. By subjecting the connectors to these repetitive bending motions, manufacturers can assess their performance under different conditions and determine their reliability over time.在端子弯折测试中常用的方法之一是重复弯曲测试,其中连接器来回弯曲多次以模拟其在正常使用过程中可能经历的磨损。
曲线测试实验流程
IC50曲线的测定IC50即半抑制率, 标准曲线是一个S型曲线;IC50为50%抑制浓度即细胞存活量为对照样本一半时所对应的浓度,半数抑制越低,说明药物对细胞的毒性越高;实验操作步骤如下:1.细胞准备:A.细胞状态检测:从培养箱中取出细胞,显微镜下观察;状态描述:观察结果,细胞汇合度:B.细胞处理:将细胞培养基吸出后,加入2ml PBS缓冲液洗一次,加入1ml % Trypsin-EDTA,放入培养箱中静置数分钟,直至细胞完全离壁悬浮,加入5ml 含10%FBS的培养基无抗生素终止酶活,混匀后液体转移至15ml离心管,1000rpm 离心3min,弃去液体;C.细胞计数:于15ml离心管中加入1ml 含10%FBS的培养基无抗生素,充分混匀;取40ul计数,公式如下:细胞浓度数/ml=4大方格细胞数之和/4×104×稀释倍数最终得到的细胞密度填入下表,根据最终需要细胞浓度及体积进行稀释;D.稀释细胞2.将稀释好的细胞用排枪加至96 / 384孔板:置于培养箱37℃ 5%CO2条件下培养24小时,待细胞贴壁后加药;3.药物稀释:将药物进行3倍倍比稀释;4.将稀释好的药物加入前一天铺好细胞的细胞板上,37℃ 5%CO2培养箱培养72h;5.荧光素酶检测:将Celltiter-Glo与ddH20 以1:1混合,加入细胞板96板:20ul/well; 384板:10ul/well,静置10min 后,TECAN infinite F200酶标仪读值;6.分析数据,绘制IC50曲线,寻找IC30,IC50等值;7.验证IC50:根据IC50曲线找出IC50理论值,分别取1/2 倍、1倍及2倍的理论值进行药物浓度验证;附录:Materials for ExperimentName Corporation96-well plate Corning384-well plate GreinerCentrifugeTube 15ml BD FalconPipets10ml GreinerT-25 Flask CorningTips,EP Tube Axygen, MatrixReagents for ExperimentName CorporationFBS ExcellDPBS Hyclone%Trypsin-EDTA GIBCOMedium HycloneCell-Titer GloPromegaInstruments for ExperimentName Model CorporationInverted Microscope TS100NikonCOIncubator BB16UV Heraeus2Bechtop ZHJH-1109ZHCHENGCentrifuge5200KUBOTAMicroplate Reader infinite F200TECANDispenserμFill Bio-Tek。
解密PCR那些奇奇怪怡的曲线图代表什么
解密PCR那些奇奇怪怡的曲线图代表什么我们知道PCR的本质其实就是一变二、二变四、四变十六······产物呈指数增长的数字游戏。
PCR原理因此,在引物、模板、缓冲液、酶等都充足的理想状态下,荧光定量PCR的扩增曲线应该是这样的:理想状态下的扩增曲线然而,理想很疯狂,现实却很“性感”,看下面的“S型”曲线就知道,相对于理想状态下的扩增曲线,在dNTP和酶都有限的情况下,扩增曲线如下图所示,有一个平台期,酶逐渐失活,dNTP消耗殆尽,产物增加量逐渐减少;直至没有任何产物生成,数目保持恒定。
实际情况的扩增曲线熔解曲线(Dissociation curve),就是随温度升高DNA的双螺旋结构降解程度的曲线。
扩增反应完成后,通过逐渐增加温度同时监测每一步的荧光信号来产生熔解曲线。
熔解温度上有一特征峰(Tm,DNA双链解链50%的温度),用这个特征峰就可以将特异产物与其它产物如引物二聚体区分开,因为它们在不同的温度熔解度不一样。
用荧光信号改变的负的一次导数(dR/dT)与温度作图,得出熔解曲线。
dR/dT 越大,表明荧光值变化最快。
随着温度上升,达到Tm点时,大部分产物双链DNA解开,荧光值下降非常快。
如果qPCR产物非常特异,熔解曲线在80-90之间会形成一个单峰(温度和qPCR产物长度以及GC含量相关)。
正常情况下,荧光定量PCR的产物是特异的,这时的熔解曲线应该是这样的:正常情况下的熔解曲线当然,也会有不正常的时候,熔解曲线前置杂峰,在主峰前有一个前锋,敢在主峰面前“撒野”的是比目的片段短些的非特异性片段,在温度低一些的时候就能解开双链,也可能是引物二聚体。
熔解曲线前置杂峰不正常的情况下,还可能出现熔解曲线后置杂峰,躲在主峰后面的是比目的片段长些的非特异性片段,在温度高一些的时候才能解开双链。
熔解曲线后置杂峰再来欣赏一下那些形状特异的扩增曲线:没有对数增长期,可能是模板浓度高,这样所看见的扩增曲线,就不是在一个对数期。
【实用文档】SOP-QA-LIN-039
1.0目的正确测量Fo值,监控高温杀菌釜(RETORT)的杀菌效能。
2.0范围咖啡、奶类、乌龙茶、茉莉茶、椰子汁等须经RETORT灭菌产品的Fo值测量3.0职责品控员按本文件执行。
4.0定义Fo值-热处理的灭菌参考值,相当于产品在121.1℃所处时间(分钟)的总和。
5.0程序5.1设定好TRACER的记录时间。
Data Tracer的使用方法详见(SOP-QA-LIN-037)5.2将TRACER放入空罐中,倒入该日生产的饮料至没过TRACER探头,封好盖,标上明显记号以便取出。
5.3于装框平台上,将上述罐放入所需的位置。
记录放入的位置(RETORT次,框次,层次等)。
5.4经RETORT后,从卸框台上取回相应的罐。
5.5开启罐,取出TRACER,读取记录。
5.6选取记录中大于100℃的数据。
5.7按公式ti/60*10^((T-121.1)/Z) 依次计算出各点温度在一定的时间间隔(ti)内产生的Fo(1~n)值,上式中ti-Data Tracer设定记录温度的时间间隔T-在Data Tracer设定时间间隔上记录的温度Z-常数:灭细菌芽孢产品=105.8将以上各温度的Fo(1~n)值相加,总和即为Fo值。
5.9将以上数据的处理结果存盘于理化室的电脑:C:Dt的文件夹中。
5.10标准:热饮咖啡123.4℃20分钟Fo≥30椰子汁121.1℃15分钟Fo≥15乌龙茶/茉莉茶118℃20分钟5.11若测到的杀菌时间小于规定时间,但Fo值达要求判为合格。
5.12若杀Fo值小于要求应通知工程人员调校设备。
6.0参考文献6.1本文件支持纲要文件:生产过程品质控制纲要(R-QA-008)6.2相关SOP文件:罐线生产过程品质控制(SOP-QA-LIN-004)Datatracer的使用方法(SOP-QA-LIN-037)7.0附件/记录7.1附件:无7.2记录:Fo值记录保存于QA至少两年。
修订记录。
标准曲线绘制方法
ELISA的标准曲线一般使用专门的曲线拟合工具,如:Curve Exert1.3 下面以Curve Exert1.3为例说明怎么样制作:1 启动“Curve Expert1.3”2 X轴输入标准品的OD值,Y轴输入所对应的浓度值,如图:2 X轴输入标准品的OD值,Y轴输入所对应的浓度值,如图:3.单击[运行] 按钮,出现如下对话框4.单击[ok]按钮,出现如下两个对话框,关闭下面一个对话框关闭下面一个对话框5. 在对话框的右上角出现一些曲线的名称,从“1”开始依次点击曲线名称,在右下角会出现相应拟合的曲线,。
根据拟合的曲线选取ELISA拟合度最佳的曲线双击,出现如下对话框:注意:选择系数(即“r”值)最好的曲线方程来进行运算。
在下面的对话框右上角有“r”值,当“r”值越接近1拟合度越好7.按[Ctrl]键[L]键,出现如下对话框:8.输入标准的OD值,单击[Calculate]按忸,即可得到待测蛋白的实际含量。
(标本稀释了N倍,运算出的数值应在成以N)。
9. 如想得到ELISA拟合曲线的方程,可在步骤6的对话框空白处右击,选择”Information”10. 得到如下对话框:点击“Copy”在你需要的位置粘贴即可得到如下数据:Rational Function: y=(a bx)/(1 cx dx^2)Coefficient Data:a =b =c =d =当抗原或抗体浓度过高时,对应的ELISA读数不会再显著升高,这时会达到一个平台期,同样在低浓度时也有一个平台期。
只有在适当的浓度时才会出现类似直线的曲线,所以一般数据都要进行多参数拟和,才能得到能更准确反映实验结果的曲线,常用的有sigmoid、logistic曲线等,一半的软件如sigmaplot 或origin 都有这个功能。
变频器traces曲线的使用
变频器traces曲线的使用变频器(traces)曲线的使用一、引言在现代工业生产中,变频器(traces)作为一种常见的电气设备,被广泛应用于各种领域。
变频器(traces)的主要功能是通过改变输入电压和频率来控制电机的转速,从而实现对电机运行的灵活调节。
为了更好地了解和掌握变频器(traces)的工作状态,理解其性能和参数变化,在实际应用过程中,人们常常需要使用变频器(traces)曲线进行分析和监控。
本文将深入探讨变频器(traces)曲线的使用。
二、变频器(traces)曲线的基本概念1. 变频器(traces)曲线变频器(traces)曲线是指在特定工况下,输出频率与输出电压之间的关系曲线。
通过绘制变频器(traces)曲线,可以直观地观察到输出频率与输出电压之间的变化规律,从而根据实际需求进行调整。
2. 手动设置曲线在一些变频器(traces)中,用户可以手动设置变频器(traces)曲线的形状,以满足不同需求。
通过设置曲线的形状,可以实现对电机转速的精确控制。
三、变频器(traces)曲线的使用方法1. 数据采集在使用变频器(traces)曲线之前,首先需要进行数据采集。
通过检测变频器(traces)的输出频率和输出电压,并记录下相应的数值,可以得到一系列的数据点。
2. 绘制曲线将采集到的数据点作为横纵坐标,根据实际情况绘制出变频器(traces)曲线。
为了更好地观察曲线的变化趋势,可以选择合适的比例尺和标度。
3. 分析曲线通过对绘制的曲线进行分析,可以得到一些有用的信息。
例如,可以通过观察曲线的斜率来了解电机的加速度和减速度,进而判断变频器(traces)在不同工况下的响应速度。
四、使用变频器(traces)曲线的注意事项1. 数据准确性在进行数据采集时,需要确保数据的准确性。
可以通过使用专业的检测设备和仪器来进行数据采集,减少误差。
2. 确定工况在绘制曲线之前,需要明确所处的具体工况。
psn曲线
PSN曲线编辑考虑到疲劳寿命的分散性而绘制的对应于不同存活率P的SN曲线。
中文名PSN曲线外文名PSN Curve基本介绍疲劳损伤发生在受交变应力(或应变)作用的零件和构件,零件和构件在低于材料屈服极限的交变应力(或应变)的反复作用下,经过一定的循环次数以后,在应力集中部位萌生裂纹,裂纹在一定条件下扩展,最终突然断裂,这一失效过程称为疲劳破坏。
材料在疲劳破坏前所经历的应力循环数称为疲劳寿命。
当施加于结构的交变载荷经过一定的循环次数N以后,构件发生疲劳断裂。
循环次数N称为疲劳寿命。
对件用不同载荷进行多次反复加载实验,可测得在不同载荷下试件的疲劳寿命,得到应力与寿命的一系列关系,将这种应力—寿命关系的曲线描绘出来,就是构建的疲劳寿命曲线,通常称之为S—N曲线。
零件的疲劳寿命与零件的应力、应变水平有关,它们之间的关系可以用应力一寿命曲线(σ-N 曲线)和应变一寿命曲线(δ-Ν曲线)表示。
应力一寿命曲线和应变一寿命曲线,统称为S-N曲线。
S-N曲线是对构件进行疲劳寿命预测的前提和基础。
由于疲劳试验数据的离散性,使得疲劳应力-寿命间的曲线,并不是一一对应的单值关系,而是与存活率P紧密相连。
前面提到的S-N曲线是中值疲劳寿命曲线,也就是存活率P为50%的S-N曲线。
在许多情况下,尤其是构件的可靠性设计中,根据实际要求,需要不同存活率的S-N曲线。
要表达这些不同存活率的疲劳寿命曲线,就必须使用P-S-N曲线。
实践表明,疲劳寿命分散性较大,因此必须进行统计分析,考虑存活率(即可靠度)的问题。
具有存活率p(如95%、99%、99.9%)的疲劳寿命Np的含义是:母体(总体)中有p的个体的疲劳寿命大于Np。
而破坏概率等于(1-p )。
常规疲劳试验得到的S-N曲线是p=50%的曲线。
对应于各存活率的p的S-N曲线称为p-S-N曲线。
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苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
Measuring BIPOLAR TRANSISTOR Characteristics
BIPOLAR TRANSISTORS
Required Type 576 Control Settings
Control HORIZENTAL POLARITY PEAK POWER WATTS AMPLITUDE STEPS PULSED STEPS COLLECTOR +(NPN) or –(PNP) depending on the transistor type Less than maximum power rating of device Current steps Pressed when using low base current Pressed when using high base current Required Setting
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
Measuring BIPOLAR TRANSISTOR Characteristics
Common-Emitter Family
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
Some Common Measurements
DISPLAY INVERT Button
ZERO Button CAL Button
电压(水平)控制旋钮
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
Step Generator
STEP/OFFSET AMPLITUDE Switch
NUMBER OF STEP Switch CURRENT LIMIT Switch
4、Turn the VARIABLE COLLECTOR SUPPLY control clockwise
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
Measuring DIODE Characteristics
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
3、Set the Type 576 and standard Test Fixture front panel controls as follows:
VERTICAL 1mA DISPLAY OFFSET Selector ZERO MAX PEAK VOLTS POLARIT Y CURREN T LIMIT STEPS RATE Terminal Selector NORM(OFF) CENTERLINE VALUE CAL PEAK POWER WATTS MODE 0
β (Static) β (Small Signal) The static forward current transfer ratio (emitter grounded), hFE , is IC/IB. The small-signal short-circuit forward current transfer ratio (emitter grounded), hfe, is ΔIC/ΔIB . To determine hfe at various points in a family of curves, multiply the vertical separation of two adjacent curves by the β OR gm PER DIV readout . To make a more accurate measurement, see step s 69 through 74 of the First Time Operation instructions Saturation current and voltage is measured by expanding the display of the saturation region of the device by decreasing the horizontal deflection factor with the HORIZONTAL switch or the DISPLAY OFFSET MAGNIFIER . Saturation current ca n be adjusted to the desired operating point wit h t h e AMPLITUDE switch . Base-emitter voltage can be measure d by setting the HORIZONTAL switch to t he BASE range . Collector-emitter leakage current and collector-emitter break down voltage (base open) are measured by setting the Terminal Selector switch to BASE TERM OPEN (OR EXT) . For small leakage currents set the MODE switch to LEAKAGE (EMITTER CURRENT) . To measure breakdown voltage, increase both the horizontal deflection factor and the collector supply voltage . Collector-emitter leakage current and collector-emitter breakdown voltage (base shorted to emitter) are measured the same as ICEO and BVCEO except that the Terminal Selector switch is set to BASE TERM SHORT. Collector-emitter leakage current and collector-emitter breakdown voltage (with a specified resistance between the base terminal and the emitter terminal) are measured t h e same as ICEO and BVCEO except that a specified resistance is connected between the base terminal and the emitter terminal .
OFFSET MULT Control
STEP MULT .1X Button STEP/OFFSET POLARITY INVERT Button RATE Buttons
OFFSET Buttons PULSED STEPS Buttons STEP FAMILY Buttons
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
Terminal Selector
EMITTER GROUN DED BASE TERM STEP GEN for common -emitter family
BASE GROUNDED EMITTER TERM STEP GEN for common-base family
OFFSET
AID pressed if more t h an 10 steps are desired
HORIZONTAL DISPLAY INVERT VARIABLE COLLECTOR SUPPLY NUMBER OF STEPS OFFSET STEP FAMILY STEP MULT .1X
1V COLLECTOR Released
Released 15
Released 0.1
Fully Counterclockwise 1 ZERO REP ON Released
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
Measuring DIODE Characteristics
Some Common Measurements
IF and VF To measure forward current and voltage, put the cathode of the diode in the emitter terminal of the test socket and the anode of the diode in the collector terminal. Apply voltage to the device with the VARIABLE COLLECTOR SUPPLY control.
Measuring DIODE Characteristics
1、Align the diode so that its cathode is connected to the emitter terminal.
2、Set the LEFT-OFF-RIGHT switch to RIGHT.
3、Set the COLLECTOR SUPPLY Switch to +(NPN).
AC
NORM
20mA Pressed NORM BASE TERM STEP GEN
AMPLITUDE PULSED STEPS POLARITY INVERT LEFT-OFFRIGHT
0.5μA Released Released OFF
苏州矩阵光电有限公司 Matrix Opto. Co., Ltd
CRT and Readout
亮度控制旋钮
焦点控制旋钮
CAMERA POWER CONNECTOR