IDT74FCT2543TLB资料

MILITARY AND COMMERCIAL TEMPERATURE RANGES
JANUARY 1995
©1995 Integrated Device Technology, Inc.
6.17
DSC-4203/5
The FCT543T/FCT2543T is a non-inverting octal trans-ceiver built using an advanced dual metal CMOS technology.This device contains two sets of eight D-type latches with separate input and output controls for each set. For data flow from A to B, for example, the A-to-B Enable (CEAB ) input must be LOW in order to enter data from A 0–A 7 or to take data from B 0–B 7, as indicated in the Function Table. With CEAB LOW,a LOW signal on the A-to-B Latch Enable (LEAB ) input makes the A-to-B latches transparent; a subsequent LOW-to-HIGH transition of the LEAB signal puts the A latches in the storage mode and their outputs no longer change with the A inputs.With CEAB and OEAB both LOW, the 3-state B output buffers are active and reflect the data present at the output of the A latches. Control of data from B to A is similar, but uses the CEBA , LEBA and OEBA inputs.
The FCT2543T has balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot and controlled output fall times-reducing the need for external series terminating resistors. FCT2xxxT parts are plug-in replacements for FCTxxxT parts.
1
•Common features:
–Low input and output leakage ≤1µA (max.)–CMOS power levels
–True TTL input and output compatibility – V OH = 3.3V (typ.)– V OL = 0.3V (typ.)
–Meets or exceeds JEDEC standard 18 specifications –Product available in Radiation Tolerant and Radiation Enhanced versions
–Military product compliant to MIL-STD-883, Class B and DESC listed (dual marked)
–Available in DIP, SOIC, SSOP, QSOP, CERPACK and LCC packages •Features for FCT543T:
–Std., A, C and D speed grades
–High drive outputs (-15mA I OH , 64mA I OL )
–Power off disable outputs permit “live insertion”•Features for FCT2543T:
–Std., A, and C speed grades
–Resistor outputs (-15mA I OH , 12mA I OL Com.)
(-12mA I OH , 12mA I OL Mil.)
–Reduced system switching noise
FAST CMOS OCTAL LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.172
PIN CONFIGURATIONS
DIP/SOIC/SSOP/QSOP/CERPACK
TOP VIEW
GND
A 0A 1A 2Vcc
B 0A 3A 4A 5A 6A 7B 1B 2B 3B 4B 5B 6B 7OEAB
CEBA LCC TOP VIEW
G N N C
NC B 1B 2B 3B 4B 5B 6
A C E A
B B L E A B O E A B 2613 drw 02
2613 drw 03
FUNCTION TABLE (1, 2)
For A-to-B (Symmetric with B-to-A)
2613 tbl 021.* Before LEAB LOW-to-HIGH Transition
H = HIGH Voltage Level L = LOW Voltage Level
— = Don’t Care or Irrelevant
2.A-to-B data flow shown; B-to-A flow control is the same, except using
CEBA , LEBA and OEBA .
(1)
NOTES:
1.Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed V CC by +0.5V unless otherwise noted.
2.Input and V CC terminals only.
3.Outputs and I/O terminals only.
1. This parameter is measured at characterization but not tested.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
NOTES:
1.For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2.Typical values are at Vcc = 5.0V, +25°C ambient.
3.Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4.The test limit for this parameter is ±5µA at T A = –55°C.
5.This parameter is guaranteed but not tested.
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NOTES:
2613 tbl 08
1.For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2.Typical values are at V CC = 5.0V, +25°C ambient.
3.Per TTL driven input (V IN = 3.4V). All other inputs at V CC or GND.
4.This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5.Values for these conditions are examples of the I CC formula. These limits are guaranteed but not tested.
6.I C = I QUIESCENT + I INPUTS + I DYNAMIC
I C = I CC + ∆I CC D H N T + I CCD (f CP/2 + f i N i)
I CC = Quiescent Current
∆I CC = Power Supply Current for a TTL High Input (V IN = 3.4V)
D H = Duty Cycle for TTL Inputs High
N T = Number of TTL Inputs at D H
I CCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f i = Input Frequency
N i = Number of Inputs at f i
All currents are in milliamps and all frequencies are in megahertz.
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2513 tbl 09
2513 tbl 10
1.See test circuits and waveforms.
2.Minimum limits are guaranteed but not tested on Propagation Delays.
3.This limit is guaranteed but not tested.
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TEST CIRCUITS AND WAVEFORMS TEST CIRCUITS FOR ALL OUTPUTS
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
ENABLE AND DISABLE TIMES
PROPAGATION DELAY 7.0V
3V 1.5V 0V
3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V DATA INPUT
PRESET CLEAR ETC.
1.5V
1.5V
SAME PHASE INPUT TRANSITION
3V 1.5V 0V 1.5V V OH OUTPUT
INPUT TRANSITION
3V 1.5V 0V
V OL 3V
1.5V 0V 3.5V 0V
V OL
ENABLE
DISABLE
V OH PRESET CLEAR
CLOCK ENABLE
ETC.
C L =Load capacitance: includes jig and probe capacitance.
R T =Termination resistance: should be equal to Z OUT of the Pulse
Generator.
NOTES:
1.Diagram shown for input Control Enable-LOW and input Control Disable-HIGH
2.Pulse Generator for All Pulses: Rate ≤ 1.0MHz; t F ≤ 2.5ns; t R ≤ 2.5ns
2513 drw 05
2513 drw 06
2513 drw 07
2513 drw 08
2513 drw 09
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ORDERING INFORMATION
X
XXXX X X Blank Commercial
B MIL-STD-883, Class B
P D SO L E PY Q Plastic DIP CERDIP
Small Outline IC
Leadless Chip Carrier CERPACK
Shrink Small Outline Package
Quarter-size Small Outline Package 543T 543AT 543CT 543DT Octal Latched Transceiver
-55°C to +125°C 0° to +70°C
5474
IDT
FCT
X
High Drive
Balanced Drive Blank 22613 drw 10。