PARTICLE SIZE ANALYSIS UTILIZING POLARIZATION INT
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专利名称：PARTICLE SIZE ANALYSIS UTILIZING
POLARIZATION INTENSITY DIFFERENTIAL
SCATTERING
发明人：BOTT, Steven, E.,HART, W., Howard
申请号：US1990001139
申请日：19900301
公开号：WO90/010215P1
公开日：
19900907
专利内容由知识产权出版社提供
摘要：In a particle size measuring system, particles suspended in a sample cell (8') are illuminated by interrogating light beams (212) including a first interrogating component having a polarization parallel to a scattering plane, and a second interrogating component having a polarization perpendicular to the scattering plane. A photodetector (214) generates first and second intensity signals representative of the intensity, at various scattering angles, of scattered light corresponding to the first and second interrogating components. A processor (126) generates a difference signal representative of the difference between the first and second intensity signals, and calculates a resultant signal representative of particle size, based on a selected arithmetic transformation of the difference signal.
申请人：COULTER ELECTRONICS OF NEW ENGLAND, INC.
地址：29 Cottage Street Amherst, MA 01002 US
国籍：US
代理机构：LAPPIN, Mark, G.
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