单晶硅非线性光学性质的研究论文

2012届本科毕业论文

题目：单晶硅非线性光学性质的研究

学院：物理与电子工程学院

专业班级：物理08-7班

学生姓名：默默

指导教师：教授

答辩日期：2012年5月日

单晶硅非线性光学性质的研究

摘要：文章采用Z scan -技术、单光束扫描法, 从非线性折射率、非线性吸收系数、非线性极化率等角度,对单晶硅以及多孔硅非线性光学性质进行深入的研究，以便为新材料的深入研究提供一些有价值的参考。其各章主要内容如下：

首先，介绍非线性光学现象、研究的目的和意义，以及半导体及其纳米复合物的非线性光学效应和研究进展。

其次，阐述单晶硅的特性、Z scan -技术，并就Z scan -技术的角度对单晶硅非线性光学参数，即非线性折射率、非线性吸收系数、非线性极化率等进行测量。

最后，介绍多孔硅非线性光学，从实验的角度认识多孔硅结构与发光机理的非线性，应用单光束扫描法对三阶非线性光学性质进行实验分析。

关键词：单晶硅；非线性光学；多孔硅；Z-scan 技术；单光束扫描法

The study of nonlinear optical properties

of Monocrystalline silicon

ABSTRACT ：This paper adopts Z-scan technology , single beam scanning method, from the angle of nonlinear refractive index, nonlinear absorption coefficient, nonlinear polarizability,etc, further research have been studying for the nonlinear optical properties of Monocrystalline silicon and Porous silicon, so that it can provide some valuable reference for the further research of new materials. Its main content chapters are as follows:

First of all, introduce the nonlinear optical phenomena, the purpose of the research and meaning, and, the nonlinear optical effect and research development of the semiconductor and its nano complex.

Secondly, this paper expounds the characteristics of Monocrystalline silicon, Z-scan technology , and the measurement of the Nonlinear optical parameters of Monocrystalline silicon through the Z-scan technology, such as the measurement of nonlinear refractive index, nonlinear absorption coefficient, nonlinear polarizability , etc.

Finally, this paper introduces the nonlinear optical of porous silicon, from the point of view of experiment know the porous silicon structure and the nonlinear of emitting mechanism, and the paper analysises the Three order nonlinear optical properties of Porous silicon through the experiment of Single beam scanning method. Key words: monocrystalline silicon ；nonlinear optics ；porous silicon ；Z-scan technology ；single beam scanning method

目 录

第一章 非线性光学 ...................................................

1.1 非线性光学现象...............................................

1.2非线性光学性质研究的目的和意义...............................

1.3半导体及其纳米复合物的光学非线性.............................

1.3.1 半导体材料的光学非线性..................................

1.3.2 半导体纳米复合物的非线性光学效应........................ 第二章单晶硅非线性光学 .............................................

2.1单晶硅的特性.................................................

2.2Z扫描技术的原理..............................................

2.3Z扫描技术的理论计算..........................................

2.3.1 非线性折射率............................................

2.3.2 非线性吸收系数..........................................

2.3.3 三阶非线性极化率........................................

2.4测量单晶硅的非线性光学参数...................................

2.4.1 高斯光束Z扫描技术（典型透射Z scan

-技术）..............

2.4.2 双色光Z扫描技术()

-..............................

TZ scan

2.4.3 双光束时间分辨率Z扫描技术()

- ..................

TRZ scan

2.4.4 遮挡()

Z scan EZ scan

--..................................

2.4.5 反射()

--..................................

Z scan RZ scan

第三章多孔硅非线性光学 .............................................

3.1多孔硅.......................................................

3.2多孔硅结构与发光机理的非线性光学研究......................

3.3多孔硅1064nm波长处三阶非线性光学性质........................ 参考文献............................................................. 致谢................................................................