第10讲——-码敏化和电子存储器测试 超大规模集成电路测试技术课件

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VLSI Test: Lecture 16
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2.2 Type 2 Active NPSF 类型2积极NPSF
Used when diagonal couplings are significant, and do not necessarily cause horizontal/vertical coupling
/ 0 ( /1) -- Base cell fault effect indicating that base cannot change
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2.4 Static NPSF 静态NPSF
Static: Base cell forced into a particular state when deleted neighborhood contains particular pattern.
pattern makes base cell fail NPSF -- Neighborhood Pattern Sensitive Fault PNPSF -- Passive Neighborhood PSF SNPSF -- Static Neighborhood Pattern Sensitive Fault
➢Patterns: n×2k => (n×2k) / k ➢Only for SNPSF
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3.3 Two Group Method 两组法
Use checkerboard pattern, cell is simultaneously a base cell in group 1, and a deleted neighborhood cell in 2
➢traverses each graph arc exactly once ➢There is an arc between two nodes, if
and only if they differ by exactly one bit.
➢ANPSF & PNPSF (k×2k)
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Only for Type-1neighborhoods (duality)
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Lecture 10 Pattern Sensitive and Electrical Memory Test
第十讲：码敏化和电子存储器测试
2020/10/3
VLSI Test: Lecture 16
1
Contents 内容目录
1. Notation 符号说明
2. Neighborhood pattern sensitive fault (NPSF) 邻居码敏化故障
Both used for writing shorter patterns
Hamiltonian
➢traverses each graph node once ➢Differ by only 1 bit from their preceding
pattern
➢SNPSF (2k)
Eulerian
3. NPSF testing algorithms NPSF测试算法
4. Cache DRAM testing Cache DRAM测试
5. Functional ROM testing ROM测试
6. Memory Electrical Parametric Tests 存储器电子参数测试
7. Summary 小结
例子：Ci,j < 0, 1, 0, 1; - / 0> and Ci,j < 0, 1, 0, 1; - / 1>
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VLSI Test: Lecture 16
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3 NPSF Testing Algorithm
--3.1Eulerian / Hamiltonian Graph Tour Sequences NPSF测试算法—欧拉/汉密尔顿图
Differs from active -- need not have a transition to sensitive SNPSF
Condition for detection and location: Apply all 0 and 1 combinations to k-cell neighborhood, and verify that each base cell was written.
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2.3 Passive NPSF 消极NPSF
Passive: A certain neighborhood pattern prevents the base cell from changing
Condition for detection and location: Each base cell must be written and read in state 0 and in state 1, for all deleted neighborhood pattern changes.
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VLSI Test: Lecture 16
2Leabharlann 1 Notation 符号说明
ANPSF -- Active Neighborhood Pattern Sensitive Fault APNPSF – Active and Passive Neighborhood PSF Neighborhood -- Immediate cluster of cells whose
VLSI Test: Lecture 16
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3.2 Type 1 Tiling Neighborhoods 类型1瓷砖邻居
Write changes k different neighborhoods
Tiling Method: Cover all memory with nonoverlapping neighborhoods