连接器测试简介
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Dust [ 砂塵試驗 ]
Test Methods
EIA 364-32, Test Condition I, (or MIL-202F, Method 107G Condition A.) Subject mated connectors to five cycles between –55℃ to +85℃.
(or 0.492”) per minute.
環境性能
(Environmental Performance )
Test Description Thermal Shock [ 冷熱沖擊 ] Cyclic Temp and Humidity [ 恆溫恆濕 ]
Temperature Life [ 溫度壽命 ] Solderability [ 沾錫性能 ] DIP 型 Resistance to Reflow Soldering Heat [ 回流焊貼裝性 ] SMT 型 Mixed Flowing Gas [ 混合氣體 ]
PROCEDURE
● EIA 是美國電子工業協會的簡稱,對電子產品訂定各種標准,做為制造商及采購者
對產品交換性及引進提供一有效橋梁,如此,可協助采購者在產品特定要求下,做出 一正確選擇,而EIA-364-D系列為一電子連接器及插座測試程序/測試方法總覽.
● EIA-364系列已成為電子連接器國際間最普遍接受之規范,期望會員對此皆有一概 括了解,作為提升連接器水准之基本依據.
the contacts, the ΔT shall not exceed + applied to the contacts, the 30℃ at any point in the USB connector under test
機械性能
(Mechanical Performance )
Test Description
of 200 cycles per hour.
EIA 364-13 Shall be measured with TENSION GAUGE or TENSION TESTER. Measure force necessary to mate assemblies at maximum rate of 12.5mm
Three shocks in each direction applied along three mutually perpendicular planes, 18 total shock.
EIA 364-09 Mate and unmate Connector assemblies for 5000 cycles at maximum rated
測試設備
(Test Equipment )
插拔力試驗機 耐久試驗機
LCR 表
電氣安規分析儀 毫歐姆計
測試設備
(Test Equipment )
高頻振動試驗機
冷熱沖擊試驗箱
恆溫恆濕試驗箱
高溫試驗箱
沖擊試驗機
跌落試驗機
接觸電阻測試程序
ห้องสมุดไป่ตู้
絕緣電阻測試原理
测试原理：将被测试样品Rx与直流放大器的输入电阻R0串联后跨接于直流测试电 压V上（由直流测试电源供给），根据直流放大器所获得其输入电阻R0上的分压V0， 从而导出被测试样品的绝缘电阻值，如图二，测试时，因Rx>R0,则:
EIA 364-52 After one hour steam aging.
Pre Heat：100~150℃, 60 sec Max. Heat：210℃ Min., 30 sec Max. Peak Temp.：240℃ Max., 10±0.5sec.
EIA 364-65 Condition IIA Chlorine 10ppb; Hydrogen Sulfide 10ppb; Nitrogen Dioxide 200ppb; Sulfur Dioxide 100ppb; Temperature 30 degree C; Relative Humidity 70%
EIA 364-31, Test Condition A Method III, (or MIL-202F, Method 103B Test Condition B.) Subject mated connectors to 168 Hours (seven complete cycles)
EIA 364-17 Test Condition 3 Method A, Subject mated connectors to temperature life at 85℃ for 250hours
Dielectric Withstanding Voltage [ DWV ] 耐電壓
Contact Capacitance 電容
Contact Current Rating 溫升
[Temperature Rising ]
Test Methods
EIA 364-23 (or MIL-STD-1344A, Method 3002.1, Test Condition B) Subject mated contacts assembled in housing to 20mV maximum open circuit at 100 mA maximum
(or 0.492”) per minute.
EIA 364-13 Shall be measured with TENSION GAUGE or TENSION TESTER. Measure force necessary to mate assemblies at maximum rate of 12.5mm
產品資格測試
按測試性質可分為三類:
電氣性能 機械性能 環境性能
電氣性能
(Electrical Performance )
Test Description
Low Level Contact Resistance [ LLCR ] 接觸電阻
Insulation Resistance [ IR ] 絕緣電阻
EIA 364-30 Test between adjacent circuits of unmated connector at 1 KHz.
EIA 364-70 Method B When measured at an ambient temperature of 25℃. With Power applied to
產品資格測試
( Product Qualification Test )
主講人: 實驗室 張劍波
產品資格測試
參考標准 EIA 美國電子工業協會標准 MIL-STD 美軍標准 JIS 日本工業標准
產品資格測試
EIA-364-D
ELECTRONICS INDUSTRIES
ASSOCIATION ---ELECTRICAL CONNECTOR TEST
Duration 10 days total: *First 5 days 1/2 samples mated and 1/2 unmated *Second 5 days all samples are mated
EIA-364-91 The test specimens shall be unmated during the test.
EIA 364-21 (or MIL-STD-202F, Method 302, Test Condition B) Test between adjacent contacts of mated and unmated connector assemblies.
EIA 364-20 (or MIL-STD-202F, Method 301, Test Condition B) Test between adjacent contacts of mated and unmated connector assemblies.
Test Methods
Vibration [ 振動 ]
Physical Shock [ 物理沖擊 ]
Durability [ 耐久性能 ]
Connector Mating Force [ 插入力 ]
Connector Unmating Force [ 拔出力 ]
EIA 364-28 Test Condition V Test Letter A, (or MIL-STD-202F, Method 214, Test Condition 1, Test Letter A)
式中,电压单位为V,电阻单位为Ω。
耐電壓測試原理
基本工作原理是：将被测件在仪器的输出的试验高电压下产生的漏电流与预置的判定 电流比较，当检出的漏电电流大于判定电流时，试验电压瞬时切断并发出声光报警， 从而确定被测件的耐压值或击穿电压值。
產品規范范例
( Product Spec. Example)
Subject mated connectors to 5.35 G’s rms. Fifteen minutes in each of three mutually perpendicular planes.
EIA 364-27 Test Condition H (or MIL-STD-202F, Method 214B) Subject mated connectors to 30G’s half-sine shock pulses of 11ms duration.
Test Methods
EIA 364-32, Test Condition I, (or MIL-202F, Method 107G Condition A.) Subject mated connectors to five cycles between –55℃ to +85℃.
(or 0.492”) per minute.
環境性能
(Environmental Performance )
Test Description Thermal Shock [ 冷熱沖擊 ] Cyclic Temp and Humidity [ 恆溫恆濕 ]
Temperature Life [ 溫度壽命 ] Solderability [ 沾錫性能 ] DIP 型 Resistance to Reflow Soldering Heat [ 回流焊貼裝性 ] SMT 型 Mixed Flowing Gas [ 混合氣體 ]
PROCEDURE
● EIA 是美國電子工業協會的簡稱,對電子產品訂定各種標准,做為制造商及采購者
對產品交換性及引進提供一有效橋梁,如此,可協助采購者在產品特定要求下,做出 一正確選擇,而EIA-364-D系列為一電子連接器及插座測試程序/測試方法總覽.
● EIA-364系列已成為電子連接器國際間最普遍接受之規范,期望會員對此皆有一概 括了解,作為提升連接器水准之基本依據.
the contacts, the ΔT shall not exceed + applied to the contacts, the 30℃ at any point in the USB connector under test
機械性能
(Mechanical Performance )
Test Description
of 200 cycles per hour.
EIA 364-13 Shall be measured with TENSION GAUGE or TENSION TESTER. Measure force necessary to mate assemblies at maximum rate of 12.5mm
Three shocks in each direction applied along three mutually perpendicular planes, 18 total shock.
EIA 364-09 Mate and unmate Connector assemblies for 5000 cycles at maximum rated
測試設備
(Test Equipment )
插拔力試驗機 耐久試驗機
LCR 表
電氣安規分析儀 毫歐姆計
測試設備
(Test Equipment )
高頻振動試驗機
冷熱沖擊試驗箱
恆溫恆濕試驗箱
高溫試驗箱
沖擊試驗機
跌落試驗機
接觸電阻測試程序
ห้องสมุดไป่ตู้
絕緣電阻測試原理
测试原理：将被测试样品Rx与直流放大器的输入电阻R0串联后跨接于直流测试电 压V上（由直流测试电源供给），根据直流放大器所获得其输入电阻R0上的分压V0， 从而导出被测试样品的绝缘电阻值，如图二，测试时，因Rx>R0,则:
EIA 364-52 After one hour steam aging.
Pre Heat：100~150℃, 60 sec Max. Heat：210℃ Min., 30 sec Max. Peak Temp.：240℃ Max., 10±0.5sec.
EIA 364-65 Condition IIA Chlorine 10ppb; Hydrogen Sulfide 10ppb; Nitrogen Dioxide 200ppb; Sulfur Dioxide 100ppb; Temperature 30 degree C; Relative Humidity 70%
EIA 364-31, Test Condition A Method III, (or MIL-202F, Method 103B Test Condition B.) Subject mated connectors to 168 Hours (seven complete cycles)
EIA 364-17 Test Condition 3 Method A, Subject mated connectors to temperature life at 85℃ for 250hours
Dielectric Withstanding Voltage [ DWV ] 耐電壓
Contact Capacitance 電容
Contact Current Rating 溫升
[Temperature Rising ]
Test Methods
EIA 364-23 (or MIL-STD-1344A, Method 3002.1, Test Condition B) Subject mated contacts assembled in housing to 20mV maximum open circuit at 100 mA maximum
(or 0.492”) per minute.
EIA 364-13 Shall be measured with TENSION GAUGE or TENSION TESTER. Measure force necessary to mate assemblies at maximum rate of 12.5mm
產品資格測試
按測試性質可分為三類:
電氣性能 機械性能 環境性能
電氣性能
(Electrical Performance )
Test Description
Low Level Contact Resistance [ LLCR ] 接觸電阻
Insulation Resistance [ IR ] 絕緣電阻
EIA 364-30 Test between adjacent circuits of unmated connector at 1 KHz.
EIA 364-70 Method B When measured at an ambient temperature of 25℃. With Power applied to
產品資格測試
( Product Qualification Test )
主講人: 實驗室 張劍波
產品資格測試
參考標准 EIA 美國電子工業協會標准 MIL-STD 美軍標准 JIS 日本工業標准
產品資格測試
EIA-364-D
ELECTRONICS INDUSTRIES
ASSOCIATION ---ELECTRICAL CONNECTOR TEST
Duration 10 days total: *First 5 days 1/2 samples mated and 1/2 unmated *Second 5 days all samples are mated
EIA-364-91 The test specimens shall be unmated during the test.
EIA 364-21 (or MIL-STD-202F, Method 302, Test Condition B) Test between adjacent contacts of mated and unmated connector assemblies.
EIA 364-20 (or MIL-STD-202F, Method 301, Test Condition B) Test between adjacent contacts of mated and unmated connector assemblies.
Test Methods
Vibration [ 振動 ]
Physical Shock [ 物理沖擊 ]
Durability [ 耐久性能 ]
Connector Mating Force [ 插入力 ]
Connector Unmating Force [ 拔出力 ]
EIA 364-28 Test Condition V Test Letter A, (or MIL-STD-202F, Method 214, Test Condition 1, Test Letter A)
式中,电压单位为V,电阻单位为Ω。
耐電壓測試原理
基本工作原理是：将被测件在仪器的输出的试验高电压下产生的漏电流与预置的判定 电流比较，当检出的漏电电流大于判定电流时，试验电压瞬时切断并发出声光报警， 从而确定被测件的耐压值或击穿电压值。
產品規范范例
( Product Spec. Example)
Subject mated connectors to 5.35 G’s rms. Fifteen minutes in each of three mutually perpendicular planes.
EIA 364-27 Test Condition H (or MIL-STD-202F, Method 214B) Subject mated connectors to 30G’s half-sine shock pulses of 11ms duration.