三轴加速度传感器
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Three-axis acceleration sensor variable in capacitance under application of acceleration
United States Patent 5383364
Abstract:
An acceleration sensor comprises an upper semiconductor substrate having a rigid frame, four deformable beams connected with the rigid frame, and a weight portion supported by the plurality of deformable beams, a lower semiconductor substrate bonded to the rigid frame, a plurality of movable electrodes attached to the weight portion, and electrically isolated from one another, and a plurality of stationary electrodes attached to the second semiconductor substrate, and opposite to the plurality of movable electrodes for forming a plurality of variable capacitors, and the center of gravity of the weight portion is spaced from a common neutral surface of the four beams for allowing acceleration to produce bending moment exerted on the four beams, thereby causing the variable capacitors to independently change the capacitance.
Inventors:
Takahashi, Masaji (Tokyo, JP)
Kondo, Yuji (Tokyo, JP)
Application Number:
07/972537
Publication Date:
01/24/1995
Filing Date:
11/06/1992
Export Citation:
Click for automatic bibliography generation
Assignee:
NEC Corporation (Tokyo, JP)
Primary Class:
73/514.32
Other Classes:
73/514.34, 73/514.36, 361/280
International Classes:
G01P15/125; G01P15/18; (IPC1-7): G01P15/125
Field of Search:
73/517R, 73/517AV, 73/517B, 361/280
View Patent Images:
Download PDF 5383364 PDF help
US Patent References:
5243861 Capacitive type semiconductor accelerometer 1993-09-14 Kloeck et al. 735/17R 5134881 Micro-machined accelerometer with composite material springs 1992-08-04
Henrionet al. 735/17R
5095752 Capacitance type accelerometer 1992-03-17 Suzuki et al. 735/17B
4736629 Micro-miniature accelerometer 1988-04-12 Cole 735/17R
4483194 Accelerometer 1984-11-20 Rudolf 735/17R
4345474 Electrostatic accelerometer 1982-08-24 Deval 735/17B
Primary Examiner:
Noland, Tom
Assistant Examiner:
Kwok, Helen C.
Attorney, Agent or Firm:
Sughrue, Mion, Zinn, Macpeak& Seas
Claims:
What is claimed is:
1. An acceleration sensor comprising:
a) a first semiconductor substrate having a rigid frame, a plurality of deformable beams connected with said rigid frame, and a weight portion supported by said plurality of deformable beams and having the center of gravity spaced from neutral planes of said plurality of deformable beams, the neutral plane being free from an extension and a shrinkage under a bending moment exerted on the deformable beam, wherein the bending moment is created by an acceleration being exerted on said weight portion resulting in the selective deformation of said plurality of deformable beams;
b) a second semiconductor substrate bonded to said rigid frame, and substantially more rigid than said plurality of deformable beams;
c) a plurality of movable electrodes attached to said weight portion; and
d) a plurality of first stationary electrodes attached to said second semiconductor substrate, and opposite to said plurality of movable electrodes for forming a plurality of variable capacitors, the capacitances of said plurality of variable capacitors being independently measurable for determining the magnitudes of components of said acceleration.
2. An acceleration sensor as set forth in claim 1, in which said acceleration sensor is associated with an orthogonal coordinate system having first and second axes on each of said neutral planes and a third axis passing through said center of gravity, said plurality of movable electrodes being located in the first to fourth quadrants defined by said first and second axes.
3. An acceleration sensor as set forth in claim 1, in which further comprising: e) a plurality of second stationary electrodes attached to said second semiconductor substrate; and f) a plurality