EIA-364-28E 电子连接器振动测试方法-中英

合集下载

EIA 364-27、28 机械冲击讲义

EIA 364-27、28 机械冲击讲义

锯齿冲击脉冲终点峰值公差
速度的变化量:Vi= 0.5AD X10-3 (P 为加速度的峰值,D 为脉冲持续时间)的±10%以内。 最大峰值脉冲振幅±15%以内,峰值加速度±15%以内。
中文名称: 后峰锯齿冲击脉冲 英文名称: final peak sawtooth shock pulse 定义: 时间历程曲线为三角形的,即运动量 由零线性地增加到最大值然后在一瞬间降落 到零的理想冲击脉冲。
8、瞬断,及连接方法:
EIA-364-46:电子连接器的微秒间断试验程 序,连接器和插座。 1、监控设备电压电流 DC5V 100MA 电源调节响应时间应0.1微 秒或更好。 2、连接每个监控串联电路不超过50个连接 点,且初始电阻小于3 Ω.
❖EIA-364-87:电子连接器的纳秒事件检测, 连接器和插座。
1、测试的目的:
❖1、范围:描述一种电连接器机械冲击试验 的标准方法,以便评估电连接器及其组件 耐机械冲击的性能。
❖ 2、目的:进行本试验是为了确定连接器及 其组件当遭到诸如粗鲁搬运、运输或军用 时可能出现的冲击的适应性。
2、机械冲击的概念
定义:能激起系统瞬态扰动的力、位置、速 度和加速度的突然变化。
1.2 目的: 进行本试验是为了确定连接器及其组件在 寿命期间可能遭遇在主要频段或随机振动 频段范围内及其幅度上受振动的影响情况。
5、振动的概念
机械振动是物体在一定位置附近所作的周
期性往复的运动。
机械振动系统,就是指围绕其静平衡位置 作来回往复运动的机械系统,单摆就是一 种简单的机械振动系统。
振动测试的基本参数
测试方向: ±(X、Y、Z)
冲击波形: 半正弦 锯齿波
冲击次数: 每轴向的次数
机械 冲击

00-EIA-364系列标准

00-EIA-364系列标准

EIA-364系列标准EIA-CB18 固體的鉭式電容器儲存期限EIA-364-E 電子連接器/ 插座測試過程包括環境類別EIA-364-01B 加速度電子連接的測試過程EIA-364-02C 空氣滲漏電子連接的測試過程EIA-364-03B 高度浸入電子連接的測試過程EIA-364-05B 接觸插入,釋放,移動迫使電子連接的測試過程EIA-364-06C 接觸電阻電子連接的測試過程EIA-364-07C 與軸向的Concentricity電子連接的測試過程聯繫EIA-364-08B 捲曲抗拉的力量電子連接的測試過程EIA-364-09C 耐久性電子連接和接觸的測試過程EIA-364-10E 流動的浸入電子連接和插座的測試過程EIA-364-11B 電阻到溶劑電子連接和插座的測試過程EIA-364-13D Mating和Unmating 力量電子連接的測試過程EIA-364-14B 臭氧暴露電子連接的測試過程EIA-364-17B 有或沒有電負荷電子連接和插座的測試過程的溫度生命EIA-364-18B 接线盒和插座的外观与尺寸检查的测试流程EIA-364-20D 禁得住電壓電子連接,插座和同軸的接觸的測試過程EIA-364-21D 絕緣電阻電子連接,插座和同軸的接觸的測試過程EIA-364-22B 類比生命電子連接的測試過程EIA-364-23C 低的水準接觸電阻電子連接和插座的測試過程EIA-364-24B 維修使電子連接的測試過程變老EIA-364-25C 探查損壞電子連接的測試過程EIA-364-26B 鹽水霧電子連接器,接觸和插座的測試過程EIA-364-27B 機械震動(指定的脈搏)電子連接的測試過程EIA-364-28D 振動電子連接和插座的測試過程EIA-364-29C 接觸保留電子連接的測試過程EIA-364-31B 濕度電子連接和插座的測試過程EIA-364-32D 熱震(溫度週期變化)電子連接和插座的測試過程EIA-364-35B 插入保留電子連接的測試過程EIA-364-36B DETERMINATION OF GAS-TIGHT CHARACTERISTICS TEST PROCEDURE FOR ELECTRICAL CONNECTORS, AND OR CONTACT SYSTEMSEIA-364-37B 接觸約會和分離力量電子連接的測試過程EIA-364-38B 電報拔電子連接的測試過程EIA-364-39B 電子連接器,接觸和插座的液壓靜力測試過程EIA-364-40B 壓壞電子連接的測試過程EIA-364-41C 電報在電子連接的測試過程屈曲EIA-364-42B 影響電子連接的測試過程EIA-364-45A 防火牆火焰電子連接的測試過程EIA-364-46BEIA-364-48AEIA-364-50AEIA-364-53B 氮的Adic 蒸汽測試,金完成電子連接和插座的測試過程EIA-364-54A 有磁性的滲透性電子連接器,接觸和插座的測試過程EIA-364-56D 為了焊接熱電子連接和插座的測試過程的電阻EIA-364-66A EMI 保護效力電子連接的測試過程EIA-364-70BEIA-364-71B 焊接燈芯(波焊接技術)測試過程適合電子連接器和插座EIA-364-75EIA-364-81A 燃燒特性電子連接器住房,連接器會議和插座的測試過程EIA-364-82A 塑膠電子連接和插座住房的測試過程的Corrosivity EIA-364-83 殼牌公司轟炸和轟炸在艙壁測試過程抵抗適合電動汽車連接器EIA-364-89AEIA-364-90 串音比率電子連接,插座,電纜組件的測試過程或者相互連接系統EIA-364 91A 灰塵電子連接和插座的測試過程EIA-364-95 充分的鋪席子和鋪席子穩定電子連接的測試過程EIA-364-99 規格位置和保留電子連接的測試過程EIA-364-100 標明永久為電子連接和插座的測試過程EIA-364-101 Attentuation電子連接器,插座,電報會議或者相互聯繫系統的測試過程EIA 364-102 上升時間墮落電子連接器,插座,電報會議或者相互聯繫系統的測試過程EIA-364-103 傳播延遲電子連接器,插座,電報會議或者相互聯繫系統的測試過程EIA-364 104A 可燃性電子連接的測試過程EIA-364-105A 高度低溫電子連接的測試過程EIA-364-106 駐波比率(SWR)電子連接的測試過程EIA-364-107 眼睛圖案和在電子連接器,插座,電報會議或者相互聯繫系統的測試過程感到緊張EIA-364-108 阻抗,反射系數,返回損失,並且VSWR在時間和頻率領土電子連接器,電報會議或者相互聯繫系統的測試過程測量EIA-364 1000.01 評價電子連接器的性能的環境考試方法學和插座在生意辦公室應用方面使用EIA-364-109 環電感測量電子連接(1 nH 10 nH)的測試過程EIA-364-110。

EIA-364(连接器产品常用测试规范之目录)

EIA-364(连接器产品常用测试规范之目录)

EIA-364(连接器产品常用测试规范之目录)Item Standard NO.Rev.Description1EIA-CB18Solid Tantalum Capacitor Shelf-Life固体的钽式电容器储存期限2EIA-364E ELECTRICAL CONNECTOR/SOCKET TEST PROCEDURES INCLUDING ENVIRONMENTAL CLASSIFICATIONS 电子连接器/插座(包括环境类)的测试程序3EIA-364-01B Acceleration Test Procedure for Electrical Connectors电子连接器的加速测试程序4EIA-364-02C Air Leakage Test Procedure for Electrical Connectors空气渗漏电子连接器的测试程序5EIA-364-03B Altitude Immersion Test Procedure for Electrical Connectors高度浸入电子连接器的测试程序6EIA-364-05B Contact Insertion, Release and Removal Force Test Procedure for Electrical Connectors电子连接器的端子插入、释放及取出测试程序7EIA-364-06C Contact Resistance Test Procedure for Electrical Connectors电子连接器的接触电阻测试程序8EIA-364-07B Contact Axial Concentricity Test Procedure for Electrical Connectors电子连接器的端子同心度测试程序9EIA-364-08B Crimp Tensile Strength Test Procedure for Electrical Connectors电子连接器的卷曲抗拉强度测试程序10EIA-364-09C Durability Test Procedure for ElectricalConnectors and Contacts端子连接器与端子的耐久性测试程序11EIA-364-10D Fluid Immersion Test Procedure for Electrical Connectors电子连接器的液体浸没测试程序12EIA-364-11B Resistance to Solvents Test Procedure for Electrical Connectors and Sockets电子连接器和插座的电阻测试程序13EIA-364-13D Mating and Unmating Forces T est Procedure for Electrical Connectors电子连接器的插入力和拔出力测试程序14EIA-364-14B Ozone Exposure Test Procedure for Electrical Connectors电子连接器的臭氧暴露测试程序15EIA-364-17B Temperature Life with or without Electrical Load Test Procedure for Electrical Connectors andSockets. 电子连接器和插座的温度寿命测试或没有电负载测试程序16EIA-364-18B Visual and Dimensional Inspection Test Procedure for Electrical Connectors and Sockets电子连接器和插座的外观与尺寸检验程序17EIA-364-20C Withstanding Voltage Test Procedure for Electrical Connectors, Sockets and Coaxial Contacts电子连接品、插座和同轴端子的耐电压测试程序18EIA-364-21C Insulation Resistance Test Procedure for Electrical Connectors, Sockets, and Coaxial Contacts电子连接品、插座和同轴端子的绝缘电阻测试程序19EIA-364-22B Simulated Life Test Procedure for Electrical Connectors电子连接器的模拟寿命测试程序20EIA-364-23C Low Level Contact Resistance T est Procedure for Electrical Connectors and Sockets电子连接器与插座的接触电阻测试程序21EIA-364-24B Maintenance Aging Test Procedure for Electrical Connectors电子连接器的维持能力测试程序22EIA-364-25C Probe Damage Test Procedure for Electrical Connectors电子连接器的探伤测试程序23EIA-364-26B Salt Spray Test Procedure for Electrical Connectors, Contacts and Sockets电子连接器、端子和插座的盐雾测试程序24EIA-364-27B Mechanical Shock (Specified Pulse) Test Procedure for Electrical Connectors电子连接器的机械震动(指定的脉搏)测试程序25EIA-364-28E Vibration Test Procedure for Electrical Connectors and Sockets电子连接器与插座的振动测试程序26EIA-364-29C Contact Retention Test Procedure for Electrical Connectors电子连接器的端子保持力测试程序27EIA-364-30A Capacitance Test Procedure for Electrical Connectors and Sockets电子连接器与插座的电容测试程序28EIA-364-31B Humidity Test Procedure for Electrical Connectors and Sockets电子连接器与插座的湿度测试程序29EIA-364-32D Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets电子连接器与插座的热冲击(温度周期变化)测试程序30EIA-364-35B Insert Retention Test Procedure for Electrical Connectors电子连接器的保持力测试程序31EIA-364-36B Determination of Gas-tight Characteristics test procedure for Electrical connectors and or contact systems. 电子连接器和(或)端子系统的气密特性测试程序32EIA-364-37B Contact Engagement and Separation Force Test Procedure for Electrical Connectors电子连接器端子结合力和分离力测试程序33EIA-364-38B Cable Pull-Out Test Procedure for Electrical Connectors电子连接器的电材拉拔力测试程序34EIA-364-39B Hydrostatic Test Procedure for Electrical Connectors, Contacts and Sockets电子连接器、接触和插座的液压静力测试程序35EIA-364-40B Crush Test Procedure for Electrical Connectors电子连接器v压坏测试程序36EIA-364-41C Cable Flexing Test Procedure for Electrical Connectors电报在电子连接的测试程序屈曲37EIA-364-42B Impact Test Procedure for Electrical Connectors电子连接器的机械冲压测试程序38EIA-364-45A Firewall Flame Test Procedure for Electrical Connectors电子连接器的阻燃火焰测试程序39EIA-364-46B MICROSECOND DISCONTINUITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS,CONTACTS AND SOCKETS电子连接器、端子和插座的瞬断(微秒不间断)测试程序40EIA-364-48A Metallic Coating Thickness Measurement of Contacts Test Procedure for Electrical Connectors电子连接器端子喷涂层厚底测试程序41EIA-364-50A Dust (Fine Sand)Test Procedure for Electrical Connectors电子连接器的粉尘(细沙)测试程序42EIA-364-53B Nitric Acid Vapor Test, Gold Finish Test Procedure for Electrical Connectors and Sockets电子连接器与插座的硝酸蒸汽测试、黄金制品测试程序43EIA-364-54A Magnetic Permeability Test Procedure for Electrical Connectors, Contacts, and Sockets电子连接器、端子和插座的导电率测试程序44EIA-364-56C Resistance to Soldering Heat Test Procedure for Electrical Connectors and Sockets电子连接器和插座的焊接热电阻测试程序45EIA-364-59A LOW TEMPERATURE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS电子连接器和插座的低温测试程序46EIA-364-66A EMI Shielding Effectiveness Test Procedure for Electrical Connectors电子连接器的电磁干扰屏蔽效应测试程序47EIA-364-70B TEMPERATURE RISE VERSUS CURRENT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS 电子连接器与插座的温升与电流测试程序48EIA-364-71B Solder Wicking (Wave Solder Technique) Test Procedure for Electrical Connectors and Sockets电子连接器与插座的溢锡(波峰焊接技术)测试程序49EIA-364-75LIGHTNING STRIKE TEST PROCEDURE FOR ELECTRICAL CONNECTORS电子连接器的雷击测试程序50EIA-364-81A Combustion Characteristics Test Procedure for Electrical Connector Housings, Connector Assemblies and Sockets. 电子连接器塑料、组装成品与插座的燃烧特性测试程序51EIA-364-82A Corrosivity of Plastics Test Procedure for Electrical Connector and Socket Housings电子连接器与插座塑胶的塑胶腐蚀性测试程序52EIA-364-83Shell-to-Shell and Shell-to-Bulkhead Resistance Test Procedure for Electrical Connectors电子连接器的接地壳与接地壳及接地壳与主板之电阻测试程序53EIA-364-89A Space Application Test Procedure for Electrical Connectors and Sockets电子连接器与插座的空间应用测试程序54EIA-364-90Crosstalk Ratio Test Procedures for Electrical Connectors, Sockets, Cable Assemblies orInterconnect Systems电子连接器、插座、线束或互联系统的串扰率测试程序55EIA-364-91A Dust Test Procedure for Electrical Connector and Sockets电子连接器与插座的粉尘测试程序56EIA-364-95Full Mating and Mating Stability Test Procedures for Electrical Connectors电子连接器的完整互配与互配稳定测试程序57EIA-364-99Gage Location and Retention Test Procedure for Electrical Connectors电子连接器的计量位置与保留测试程序58EIA-364-100Marking Permanence Test Procedure for Electrical Connectors and Sockets电子连接器与插座的永久性标识测试程序59EIA-364-101Attenuation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems 电子连接器、插座、线束或互联系统的衰减测试程序60EIA-364-102Rise Time Degradation Test Procedure for Electrical Connectors, Sockets,Cable Assemblies orInterconnection Systems。

EIA-364-D中文

EIA-364-D中文
資格認可後製造商不得作任何的設計變更、替 換、材料改變或製程改變,其足以影響產品的 形狀與功能(Form & Function) ,而不作全部或 部分的重新認可。
重新認可時,可僅針對受改變影響之特定部份 測試。
要成功取得認可或再認可,每一測試件必須符 合測試組中所有的測試要求,任何的不符合 (Defects)皆不允許。特採允收僅能由驗證單位 來決定。
相似性應認可所有尺寸大到測試件水準的產品。 當與認可的端子在接合(Termination area)區域設計不同,
但在接觸區域具相同的尺寸外觀、基材、電鍍種類與 厚度時,只需針對接合技術相對應的適當測試來認證 (e.g. crimp, solder, IDC, etc.)。
Qualification(Cont.)
Unless otherwise specified, all measurements shall be made within the following ambient conditions:一般測試環 境要求
Temperature: 15 °to 35 °C, 溫度 Atmospheric pressure: 650 millimeters of mercury to 800
EIA-364-D
Greg Lin Aug. 11, 2004
EIA-364-D
EIA – Electronic Industries Association 美國電子工業 協會
對電子工業產品訂定各種標準, 作為製造商及採購者 對產品交換性及引進提供一有效的橋樑
EIA-364系列是針對電子連接器及插座(Connectors/ Sockets) 的測試程序, 其下包括許多TP (Test Procedure)

EIA-364-28F_(2011-01-14)_Vibration

EIA-364-28F_(2011-01-14)_Vibration

EIASTANDARDTP-28FVIBRATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETSEIA-364-28FJANUARY 2011EIA StandardsElectronic Components AssociationANSI/EIA-364-28F-2011Approved: January 14, 2011E I A -364-28FNOTICEThis standard is based upon the major technical content of International Electrotechnical Commission standard 60512-2-1 2005-Febuary (was IEC 512-2, test 2a), contact resistance - millivolt level method. It conforms in all essential respects this IEC standard.EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECA members, whether the standard is to be used either domestically or internationally.Standards and Publications are adopted by ECA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication.This major portion of this Standard is based upon the technical content of International Electrotechnical Commission standard IEC 60512-6-4, (was IEC 512-4, test 6d) Dynamic Stress, Vibration (Sinusoidal), 2002 and also IEC 60512-6-5, Dynamic Stress, Random Vibration, 1997. It differs from IEC Publication 60068-2-6 (was IEC 68-2-6, test Fc), Vibration (Sinusoidal), 2007; by specifying a single test with closely controlled conditions and methods for random vibration. These differences have been called to the attention of the U.S. Committee of Experts for IEC (or ISO) Technical Committee TC48 and resolution of these differences will be sought in future meetings of SC48. Test condition VII is based on International Electrotechnical Commission standard IEC 60068-2-34, (was IEC 68-2-34, Test Fd), Random Vibration Wide Band, 1993.This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use.(From Standards Proposal No. SP-5212 formulated under the cognizance of the CE-2.0 National Connector Standards Committee).Published by©ELECTRONIC COMPONENTS ASSOCIATION 2011Engineering Department2500 Wilson Boulevard, Suite 310Arlington, VA 22201PRICE: Please call: IHSUSA and Canada (1-800-854-7179)All rights reservedPrinted in U.S.A.PLEASE!DON'T VIOLATETHELAW!This document is copyrighted by the ECA and may not be reproduced without permission.Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact:IHS15 Inverness Way EastEnglewood, CO 80112-5704 or callUSA and Canada (1-800-854-7179), International (303-397-7956)CONTENTSClause Page 1 Introduction (1)1.1 Scope (1)1.2 Object (1)1.3 Applicable documents (1)1.4 Definitions (1)2 Test resources (2)2.1 Equipment (2)3 Test specimen (3)4 Test procedure (4)4.1 Test conditions I, II, III and IV (4)4.2 Test conditions V, VI and VII (10)5 Details to be specified (16)6 Test documentation (17)Table1 Vibration conditions (4)2 Values for test condition V (13)3 Values for test condition VI (14)4 Values for test condition VII (15)Figure1 Mounting axis definitions (2)2 Vibration test curves - high frequency (displacement in mm) (6)3 Vibration test curves - high frequency (displacement in inches) (7)4 Test condition V, random vibration test curve envelope (13)5 Test condition VI, random vibration test curve envelope (14)6 Test condition VII, random vibration test curve envelope (15)(This page left blank)TEST PROCEDURE No. 28FVIBRATION TEST PROCEDUREFORELECTRICAL CONNECTORS AND SOCKETS(From EIA Standards Proposal No. 5212, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-364-28E.)1 Introduction1.1 ScopeThe standard test procedure details a method to assess the ability of electrical connector components to withstand specified severities of vibration.1.2 ObjectThe object of this test is to determine the effects of vibration within the predominant or random vibration frequency ranges and magnitudes that may be encountered during the life of the connector.1.3 Applicable documentsThe following documents form a part of this standard to the extent indicated herein. In the event of conflict between the requirements of this standard and the referenced documents, this standard takes precedence.1.3.1 EIA standardsEIA-364-46: Microsecond Discontinuity Test Procedure for Electrical Connectors, Contacts and SocketsEIA-364-87: Nanosecond Event Detection for Electrical Connectors, Contacts and Sockets1.4 Definitions1.4.1 AxisThe following mounting axis definitions shall be employed during the performance of this test. Figure 1 indicates a pictorial view of the axis definitions. The referencing document shall indicate the fixturing required or the axis definitions if different than as stated in figure 1. Axis definitions for symmetrical, square and “free” connectors shall be defined in the Detail Specification.1.4.1.1 X-axisAlong the longitudinal length of the test sample1.4.1.2 Y-axisThe axis perpendicular to the longitudinal length of the sample (transverse direction).1.4.1.3 Z-axisThe axis perpendicular to the fixture seating plane attached to the test table.Figure 1 - Mounting axis definitions1.4.2 The term gnThis term is the SI unit for the standard acceleration due to the earth’s gravity, which itself varies with altitude and geographic latitude. NOTE — In this standard the value of g n is 9.81 m/s 2.2. Test resources2.1 Equipment2.1.1 The monitoring transducer shall be calibrated against a standard transducer having an accuracy of ±2%. The vibration system consisting of the vibration machine, together with its auxiliary test equipment, shall be capable of generating either a sinusoidal or random excitation.2.1.2 Test equipment for random vibration shall produce random excitation that possesses a gaussian (normal) amplitude distribution, except that the acceleration magnitudes of the peak values may be limited to a minimum of three times the rms [three-sigma (3σ) limits].3 Test specimen3.1 A vibration test sample shall be a fully wired connector consisting of one of the following, as applicable;3.1.1 A connector plug and its mating connector receptacle.3.1.2 A printed circuit connector receptacle and its mating connector board(s).3.1.3 An integral, functional connector assembly.3.2 Each test sample shall be prepared with wire and other materials or processes, simulating application assembly of the sample. If normal connector mating is dependent upon forces external to the connector, then such forces and mounting arrangement shall be as closely duplicated as possible (example: printed circuit connectors). If mating is achieved with normal locking means, then only normal locking means shall be used.3.3 Method of mounting3.3.1 Test conditions I, II, III and IV (sinusoidal evaluation conditions)The specimen shall be attached to a fixture capable of transmitting the vibration conditions specified. The test fixture shall be designed so that resonant vibration inherent in the fixture within the frequency range specified for the test shall be minor. The magnitude of the applied vibration shall be monitored on the test fixture near the specimen mounting points. The test specimen shall be mounted rigidly to the test fixture as specified and shall simulate as closely as possible the normal mounting of the specimen. A minimum of 200 mm (approx 8 in) of wire or cable shall be unsupported on both ends of the connector. For specimens with attached brackets, one of the vibration-test directions shall be parallel to the mounting surface of the bracket. Vibration input shall be monitored on the mounting fixture in the proximity of the support points of the specimen.3.3.2 Test conditions V, VI and VII (random excitation conditions)The specimen shall be mounted as specified. The orientation of the specimen or direction of application of the applied vibration motion shall be specified in one or more directions. If the order of application of the different directions is critical, it also shall be specified. Any special test fixtures or jigs required to run the test shall be specified in sufficient detail to assure reproducibility of the input motion applied to the specimen. These details shall include the dimensions, the materials, temper, etc., as applicable.4 Test procedureTests and measurements before, during and after vibration shall be as specified in the referencing document.4.1 Test conditions I, II, III and IV4.1.1 Electrical load and discontinuity4.1.1.1 Unless otherwise specified in the referencing document, an electrical load of 100 milliamperes maximum with a detector capable of detecting a discontinuity of 1.0 microsecond or longer. Said monitoring shall be performed in accordance with EIA-.364-46.4.1.1.2 Unless otherwise specified in the referencing document, low nanosecond event detection shall be performed in accordance with EIA-364-87. A 100 milliamperes test current shall be applied to the areas being monitored. A detector capable of measuring an event resulting in a 10 ohm change lasting longer than 10 nanoseconds, unless otherwise specified in the referencing document.4.1.1.2.1 Low nanosecond event detection shall not be used as a substitute for the standard 1.0 microsecond requirement. This monitoring test was developed to detect different failure mechanisms than that described in 4.1.1.1. It is designed to detect large resistance fluctuations or voltage variations that may result in improper triggering of high speed digital circuits.4.1.2 Vibration conditionsVibration conditions shall be in accordance with table 1, as applicable.Table 1 - Vibration conditionsTest conditions Frequency range, Hz Peak levelg n m/s2I Low - 10 to 55II High - 10 to 500 10 98.1III High - 10 to 2,000 15 147.1IV High - 10 to 2,000 20 196.14.1.3 ResonanceA critical resonant frequency is that frequency at which any point on the specimen is observed to have a maximum amplitude more than twice that of the support points. When specified, resonant frequencies shall be determined either by monitoring parameters such as contact opening, or by use of resonance-detecting instrumentation.4.1.4 Test condition IThe specimens shall be subjected to a simple harmonic motion having an amplitude 1.52 mm (0.06 in) double amplitude (maximum total excursion), the frequency being varied uniformly between the approximate limits of 10 Hz and 55 Hz. The entire frequency range, from 10 Hz to 55 Hz and return to 10 Hz, shall be traversed in approximately 1 minute. Unless otherwise specified, this motion shall be applied for 2 hours in each of three mutually perpendicular directions (total of 6 hours). If applicable, this test shall be made under electrical load conditions.4.1.5 Test condition II [98.1 m/s2 (10 g n) peak]The specimens, while deenergized or operating under the load conditions specified, shall be subjected to the vibration amplitude, frequency range, and duration specified 4.1.5.1, 4.1.5.2 and 4.1.5.3, respectively; see figures 2 and 3.4.1.5.1 AmplitudeThe specimens shall be subjected to a simple harmonic motion having an amplitude of either 1.52 mm (0.06 in) double amplitude (maximum total excursion) or 98.1 m/s2(10 g n) peak, whichever is less. The tolerance on vibration amplitude shall be ±10%.4.1.5.2 FrequencyThe vibration frequency shall be varied logarithmically between the approximate limits of 10 Hz and 500 Hz (see 4.1.8) except that the procedure (see 4.1.4) of this standard may be applied during the 10 Hz to 55 Hz band of the vibration frequency range.4.1.5.3 Sweep time and durationThe entire frequency range of 10 Hz to 500 Hz and return to 10 Hz shall be traversed in 15 minutes. This cycle shall be performed 12 times in each of three mutually perpendicular directions (total of 36 times), so that the motion shall be applied for a total period of approximately 9 hours. Interruptions are permitted provided the requirements for rate of change and test duration are met. Completion of cycling within any separate band is permissible before going to the next band. When the procedure (see 4.1.4) is used for the 10 Hz to 55 Hz band, the duration of this portion shall be same as the duration for this band using logarithmic cycling (approximately 1-1/3 hours in each of three mutually perpendicular directions).4.1.6 Test condition III 147.1 m/s2 (15 g n) peak]The specimens, while deenergized or operating under the load conditions specified, shall be subjected to the vibration amplitude, frequency range, and duration specified in 4.1.6.1, 4.1.6.2 and 4.1.6.3, respectively; see figures 2 and 3.NOTE: g = 0.00201f 2 DA (f = frequency in hertz, DA = double amplitude in mm)Figure 2 - Vibration test curves - high frequency (displacement in mm)NOTE: g = 0.0512f 2 DA (f = frequency in hertz, DA = double amplitude in inches) Figure 3 - Vibration test curves - high frequency (displacement in inches)4.1.6.1 AmplitudeThe specimens shall be subjected to a simple harmonic motion having an amplitude of either 1.52 mm (0.06 in) double amplitude (maximum total excursion) or 147.1 m/s2(15 g n) peak, whichever is less. The tolerance on vibration amplitude shall be ±10%.4.1.6.2 Frequency rangeThe vibration frequency shall be varied logarithmically between the approximate limits of 10 Hz to 2,000 Hz (see 4.1.8) except that the procedure (see 4.1.4) of this standard may be applied during the 10 Hz to 55 Hz band of the vibration frequency range.4.1.6.3 Sweep time and durationThe entire frequency range of 10 Hz to 2,000 Hz and return to 10 Hz shall be traversed in 20 minutes. This cycle shall be performed 12 times in each of three mutually perpendicular directions (total of 36 times), so that the motion shall be applied for a total period of approximately 12 hours. Interruptions are permitted provided the requirements for rate of change and test duration are met. Completion of cycling within any separate band is permissible before going to the next band. When the procedure (see 4.1.4) of this standard is used for the 10 Hz to 55 Hz band, the duration of this portion shall be the same as the duration for this band using logarithmic cycling (approximately 1-1/3 hours in each of three mutually perpendicular directions).4.1.7 Test condition IV [196.1 m/s2 (20 g n) peak]The specimens, while deenergized or operating under the load conditions specified, shall be subjected to the vibration amplitude, frequency range, and duration specified in 4.1.7.1, 4.1.7.2 and 4.1.7.3, respectively; see figures 2 and 3.4.1.7.1 AmplitudeThe specimens shall be subjected to a simple harmonic motion having an amplitude of either 1.52 mm (0.06 in) double amplitude (maximum total excursion) or 196.1 m/s2(20 g n) peak, whichever is less. The tolerance on vibration amplitude shall be ±10%.4.1.7.2 Frequency rangeThe vibration frequency shall be varied logarithmically between the approximate limits of 10 Hz to 2,000 Hz (see 4.1.8).4.1.7.3 Sweep time and durationThe entire frequency range of 10 Hz to 2,000 Hz and return to 10 Hz shall be traversed in 20 minutes. This cycle shall be performed 12 times in each of three mutually perpendicular directions (total of 36 times), so that the motion shall be applied for a total period of approximately 12 hours. Interruptions are permitted provided the requirements for rate of change and test duration are met.Completion of cycling within any separate band is permissible before going to the next band. When the procedure (see 4.1.4.) of this standard is used for the 10 Hz to 55 Hz band, the duration of this portion shall be the same as the duration for this band using logarithmic cycling (approximately 1-1/3 hours in each of three mutually perpendicular directions).4.1.8 Alternative procedure for use of linear in place of logarithmic change of frequency Linear rate of change of frequency is permissible under the following conditions:4.1.8.1 The frequency range above 55 Hz shall be subdivided into no fewer than three bands. The ratio of the maximum frequency to the minimum frequency in each band shall be not less than two (2).4.1.8.2 The rate of change of frequency in Hz per minute shall be constant within any one band.4.1.8.3 The ratios of the rate of change of frequency of each band to the maximum frequency of that band shall be approximately equal.4.1.8.3.1 Example of alternative procedureAs an example of the computation of rates of change, assume that the frequency spectrum has been divided into three bands, 55 Hz to 125 Hz, 125 Hz to 500 Hz and 500 Hz to 2,000 Hz, in accordance with 4.1.8.1. For each band, let the constant, κ, represent the frequency change (in Hz/minute), divided by the maximum frequency (in Hz). Then the rates of change for the three bands will be 125κ, 500κ and 2,000κ, respectively. The times (in minutes) to traverse the three frequency bands are1255512550012550020005002000−−−κκκ,,,andSince the minimum total sweep time is 30 minutes,701253755001500200030κκκ++=,,whence κ = 0.0687/minute.The required maximum constant rates of frequency change for the three bands are therefore 8.55 Hz per minute, 34.2 Hz per minute and 137 Hz per minute, respectively. The minimum times of traverse of the bands are 8.2 min, 10.9 min and 10.9 min, respectively.4.2 Test conditions V, VI and VII4.2.1 Control and analysis of random vibration4.2.1.1 Spectral density curvesThe output of the vibration machine shall be presented graphically as power-spectral density versus frequency; see 4.2.1.1.1. The spectral-density values shall be within +40% and -30% (±1.5 dB) of the specified values between a lower-specified frequency and 1,000 Hz, and within +100% and -50% (±3 dB) of the specified values between 1,000 and an upper-specified frequency (2,000 Hz). A filter bandwidth will be a maximum of 1/3-octave or a frequency of 25 Hz, whichever is greater.4.2.1.1.1 Power-spectral densityPower-spectral density is the mean-square value of an oscillation passed by a narrow-band filter per unit-filter bandwidth. For this application it is expressed as g 2 / f, where g 2 / f is the mean-square value of acceleration expressed in gravitational units per number of cycles of filter bandwidth. The spectral density curves are usually plotted either on a logarithmic scale, or in units of decibels (dB). The number of decibels is defined by the equation:The rms value of acceleration within a frequency band between f 1 and f 2 is:g = f df rms 2f f 12g ∫//12where g r 2 / f is a given reference value of power-spectral density, usually the maximum specified value.4.2.1.2 Distribution curvesA probability density-distribution curve may be obtained and compared with a gaussian-distribution curve. The experimentally-obtained curve shall not differ from the gaussian curve by more than ± 10% of the maximum value.4.2.1.3 MonitoringMonitoring involves measurements of the vibration excitation and of the test item performance. When required in the referencing document, the specimen may be monitored during the test. The details of the monitoring circuit, including the method and points of connection to the specimen, shall be specified.dB = 10 g /f g /f = 20 g /fg /f2r r log log 24.2.1.4 Vibration inputThe vibration magnitude shall be monitored on a vibration machine, on mounting fixtures, at locations that are as near as practicable to the test item mounting points. When the vibration input is measured at more than one point, the minimum input vibration shall normally be made to correspond to the specified test curve; see figures 4 and 5. For massive test items and fixtures, and for large force exciters or multiple vibration exciters, the input control value may be an average of the average magnitudes of three or more inputs. Accelerations in the transverse direction, measured at the test item attachment points, shall be limited to 100% of the applied vibration. The number and location of the test points shall be specified.4.2.2 ProcedureThe specimen, or substitute equivalent mass, shall be mounted in accordance with 3.3.2 and the monitoring equipment attached, if applicable, in accordance with 4.2.1.3. The vibration machine shall then be operated and equalized or compensated to deliver the required frequencies and intensities conforming to the curves specified in test condition V, figure 4, or test condition VI, figure 5, or test condition VII, figure 6 (see 2.1). The specimen shall then be subjected to the vibration specified by the test condition letter (see tables 2, 3 and 4) for the duration as specified:3 minutes; 15 minutes; 1-1/2 hours; or 8 hours;in each of three mutually perpendicular directions, and in the order specified (see 3.3.2), as applicable.The measurements made before, during, and after the test shall be specified and if the specimen is to be monitored during the test, the details shall be in accordance with 4.2.1.3.4.2.3 Electrical load and discontinuities4.2.3.1 Unless otherwise specified in the referencing document, an electrical load of 100 milliamperes maximum with a detector capable of detecting a discontinuity of 1.0 microsecond or longer. Said monitoring shall be performed in accordance with EIA-.364-46.4.2.3.2 Unless otherwise specified in the referencing document, low nanosecond event detection shall be performed in accordance with EIA-364-87. A 100 milliamperes test current shall be applied to the areas being monitored. A detector capable of measuring an event resulting in a 10 ohm change lasting longer than 10 nanoseconds, unless otherwise specified in the referencing document.4.2.3.2.1 Low nanosecond event detection shall not be used as a substitute for the standard 1.0 microsecond requirement. This monitoring test was developed to detect different failure mechanisms than that described in 4.2.3.1. It is designed to detect large resistance fluctuations or voltage variations that may result in improper triggering of high speed digital circuits.Figure 4 - Test condition V, random vibration test-curve envelope (see table 2).Table 2 - Values for test condition V 1)Test condition letter Power spectral density, g 2/Hz Overall rms gA 0.02 5.35B 0.04 7.56C 0.06 9.26D 0.1 11.95E 0.2 16.91F 0.3 20.71G 0.4 23.91H 0.6 29.28I Superseded by Test condition letterJ J 1.0 37.80K 1.5 46.301) For duration of test; see 4.2.2.Figure 5 - Test condition VI, random vibration test-curve envelope (see table 3).Table 3 - Values for test-condition VI 1)Test condition letter Power spectral density, g 2/Hz Overall rms gA 0.02 6.21B 0.04 8.78C 0.06 10.76D 0.1 13.89E 0.2 19.64F 0.3 24.06G 0.4 27.78H 0.6 34.02I Superseded by Test condition letterJ J 1.0 43.92K 1.5 53.791) For duration of test; see 4.2.2.Figure 6 - Test condition VII, random vibration test-curve envelope (see table 4)Table 4 - Values for test condition VII 1)Test condition letter Power spectraldensity, g 2/Hz Overall rms gA 0.002 0.98B 0.005 1.55C 0.01 2.19D 0.02 3.10E 0.05 4.90F 0.1 6.93G 0.29.801) For duration of test; see 4.2.2.5 Details to be specifiedThe following details shall be specified in the referencing document:5.1 Type of sample; see 3.15.2 Number of samples to be tested5.3 Method of mounting; see 3.35.4 Test condition number; see tables 1, 2, 3 or 45.5 Electrical load conditions, all contacts, if other than 100 milliamperes maximum; see 4.1.1 or 4.2.35.6 Discontinuity requirement if other than 1 microsecond5.7 Measurement of discontinuities during vibration; see 4.1.1 or 4.2.35.8 Method of determining resonance, if applicable; see 4.1.35.9 Direction of motion and order, if critical; see 3.35.10 Tests or measurements before, during and after vibration; see clause 45.11 Duration of vibration; see 4.1.4 or 4.2.25.12 Monitoring instrumentation, if applicable; see 4.2.1.35.13 Number and location of test points, if applicable; see 4.2.1.35.14 Mounting axes definitions if other than indicated in figure 1; see 1.46 Test documentationDocumentation shall contain the details specified in clause 5, with any exceptions, and the following:6.1 Title of test6.2 Sample description include fixture, if applicable6.3 Test equipment used, and date of last and next calibration6.4 Photographs, plots, values and observations necessary for proof of conformance6.5 Name of operator and start/finish date(s) of testRevision HistoryRevision letter ProjectnumberAdditions, changes and deletionsE SP-5125 Changed test condition letter I to J. Superseded testcondition letter I by J in table 2 and 3.F SP-5212 Add paragraph 1.3.Revise paragraph 4.1.1 and 4.2.3.EIA Document Improvement ProposalIf in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to:Electronic Components AssociationEngineering Department2500 Wilson Blvd, Suite 310.Arlington, VA 22201FAX: (703-875-8908)Document No.: Document Title:Submitter’s Name: Telephone No.:FAX No.:e-mail:Address:Urgency of Change:Immediate: At next revision:Problem Area:a. Clause Number and /or Drawing:b. Recommended Changes:c. Reason/Rationale for Recommendation:Additional Remarks:Signature: Date:2FOR ECA USE ONLYResponsible Committee:Chairman:Date comments forwarded to Committee Chairman:Electronic Components Association2500 Wilson Boulevard, Suite 310 * Arlington, VA 22201 * tel 703-907-8021 * fax 703-875-8908。

EIA-364-28E 电子连接器振动测试方法-中英

EIA-364-28E 电子连接器振动测试方法-中英

1.3.2.The term g n术语g nThis term is the SI unit for the standard acceleration due to the earth’s gravity, which its elf varies with altitude and geographic latitude.g n是国际单位,表示标准的重力加速度,其本身随着高度和地理位置而变化。

4.1.3Resonance 共振A critical resonant frequency is that frequency at which any point on the specimen is observed to haveAmplitude 振幅The specimens shall be subjected to a simple harmonic motion having an amplitude of either1.52 mm (0.06 in) double amplitude (maximum total excursion) or 147.1 m/s2 (15 g n) peak, whichever is less. The tolerance on vibration amplitude shall be ±10%.样品承受振幅为1.52mm(P-P)或峰值为15g的简谐振动,在两者之间选择振幅较小的一个.振幅的容许误差为±10%.。

Frequency range 频率The vibration frequency shall be varied logarithmically between the approximate limits of 10 Hz tothree frequency bands areThe required maximum constant rates of frequency change for the three bands are therefore 8.55 Hz per minute, 34.2 Hz per minute and 137 Hz per minute, respectively. The minimum times of traverse of the bands are 8.2 min, 10.9 min and 10.9 min, respectively.按照4.1.8.1的规定,假设将整个频段分为频段,令频率的变化率与该段频段的最高频率之比值为of decibels (dB). The number of decibels is defined by the equation:The rms value of acceleration within a frequency band between fwhere g r2/ f is a given reference value of power-spectral density, usually the maximum specified value.Figure 4 - Test condition V, random vibration test-curve envelope (see table 2).Table 2 - Values for test condition V 1)Figure 5 - Test condition VI, random vibration test-curve envelope (see table 3).Table 3 - Values for test-condition VI 1)Figure 6 - Test condition VII, random vibration test-curve envelope (see table 4)。

EIA-364-D中文

EIA-364-D中文

Qualification Procedure-Sequence
• 此建議測試順序是最低限度要求,適 用所有的等級。 • 依照不同應用,特定測試項目可自 測試順序、補充測試、及/或接合測 試項中增加或刪除。
Qualification Procedure-Sample Size

測試件應含對應端。每一特性量測的數據數量應為 測試件25%的端子量,但不應低於25筆數據。若低於 25筆數據,則所有端子必頇量測; 若還不足25筆,就 必頇提供額外的測試件。
EIA-364-D目的/範圍



針對電子連接器及插座建議基本的 (recommended minimum) 測試次序(Sequence) 及方法(Procedures) 依照預定的應用環境分級, 以便對每一分級能 作合適的評估 定義各環境分級的儀器操作狀況, 包含溫度與 溼度的最大範圍, 以及海洋氣候與嚴苛環境之 可能性

Contact resistance at rated current shall be used in those applications where the current levels are in excess of 100 milliamperes and the voltage levels are in excess of 3.0 volts. 選定電流的電阻測試(CRRC)用於 I>100mA & V>3V.
Qualification Procedure-Sequence


Visual examination shall be performed on the test specimens initially and after each environmental and stress test. Unless otherwise specified, unmating of the test specimens shall not be permitted until completion of the test sequence. The referencing document shall specify if the test specimens are to be unmated after vibration, physical shock and salt spray for visual examination. If not specified, the test samples shall remain mated.測試前後的外觀檢驗之必要性與解除互配狀態之許可. Unless otherwise specified, IR and/or DWV shall be tested between the closest spaced contacts (adjacent and/or between rows). Six contact pairs or 25% of the positions whichever is greater shall be tested per specimen. In the event that hardware and/or metal shells are used, the test shall also be performed between the metal accessories and the contacts closest to them in accordance with EIA-364-20 and/or EIA-364-21. IR與DWV之 測試點數量要求6對或25%的端子, 及端子與鐵殼/其他鐵件之測試 必要.

EIA-364-28E 电子连接器振动测试方法-中英

EIA-364-28E 电子连接器振动测试方法-中英

T E N T53standspecifiedseveritiesofvibration.件承受特定强度振动的能力。

quencyrangesandmagnitudesthatmaybeencounteredduringthelifeoftheconnector.振动幅度的环境,以此验证对产品性能的影响情况.icatesapictorialviewoftheaxisdefinitions.Thereferencingdocumentshal lindicatethefixturingrequiredortheaxisdefinitionsifdiffe 的轴向与图1不同,则在相关参考文件中需对试验装置要求及轴向进行定义。

对于具有对称性,方形及不规则的连接eandgeographiclatitude.hevibrationsystemconsistingofthevibrationmachine,togetherwithitsauxiliarytestequipment,shallbecapableofgeneratingeitheras 试设备,整个系统应能产生正弦或随机振动。

amplitudedistribution,exceptthattheaccelerationmagnitudesofthepeakvaluesmaybelimitedtoaminimumofthreetimestherms[thre 可限emblyofthesample.Ifnormalconnectormatingisdependentuponforcesexternaltotheconnector,thensuchforcesandmountingarrang 接器的连接方式需要依靠外力,那么这些外力与连接方式应尽可能模拟实际的状况(例如:印刷电路连接器)。

若是hetestfixtureshallbedesignedsothatresonantvibrationinherentinthefixturewithinthefrequencyrangespecifiedforthetestshallbemi elyaspossiblethenormalmountingofthespecimen.Aminimumof200mm(approx8in)ofwireorcableshallbeunsupportedonbothend donthemountingfixtureintheproximityofthesupportpointsofthespecimen.有共振频率在试验所规定的频率范围内达到最小。

EIA-364连接器专项测试标准简介

EIA-364连接器专项测试标准简介
EIA-364-45A
Firewall Flame Test Procedure for Electrical Connectors
EIA-364-46B
MICROSECOND DISCONTINUITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS,CONTACTS AND SOCKETS
Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets
EIA-364-35B
Insert Retention Test Procedure for Electrical Connectors
EIA-364-90
Crosstalk Ratio Test Procedures for Electrical Connectors, Sockets, Cable Assemblies or Interconnect Systems
EIA-364-91A
Dust Test Procedure for Electrical Connector and Sockets
EIA-364-56C
Resistance to Soldering Heat Test Procedure for Electrical Connectors and Sockets
EIA-364-59A
LOW TEMPERATURE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS
EIA-364-95
Full Mating and Mating Stability Test Procedures for Electrical Connectors

EIA标准大全

EIA标准大全

EIA-CB18 Solid Tantalum Capacitor Shelf-LifeEIA-364-D Errata Sheet Electrical Connector/Socket Test Procedures Including Environmental ClassificationsEIA-364-01B Acceleration Test Procedure for Electrical ConnectorsEIA-364-02C Air Leakage Test Procedure for Electrical ConnectorsEIA-364-03B Altitude Immersion Test Procedure for Electrical ConnectorsEIA-364-05B Contact Insertion, Release and Removal Force Test Procedure for Electrical ConnectorsEIA-364-06C Contact Resistance Test Procedure for Electrical ConnectorsEIA-364-07b Contact Axial Concentricity Test Procedure for Electrical ConnectorsEIA-364-08B Crimp Tensile Strength Test Procedure for Electrical ConnectorsEIA-364-09C Durability Test Procedure for Electrical Connectors and ContactsEIA-364-10D Fluid Immersion Test Procedure for Electrical ConnectorsEIA-364-11B Resistance to Solvents Test Procedure for Electrical Connectors and SocketsEIA-364-13D Mating and Unmating Forces Test Procedure for Electrical ConnectorsEIA-364-14B Ozone Exposure Test Procedure for Electrical ConnectorsEIA-364-17B Temperature Life with or without Electrical Load Test Procedure for Electrical Connectors and SocketsEIA-364-18B Visual and Dimensional Inspection Test Procedure for Electrical Connectors, and SocketsEIA-364-20C Withstanding V oltage Test Procedure for Electrical Connectors, Sockets and Coaxial ContactsEIA-364-21C Insulation Resistance Test Procedure for Electrical Connectors, Sockets, and Coaxial ContactsEIA-364-22B Simulated Life Test Procedure for Electrical ConnectorsEIA-364-23C Low Level Contact Resistance Test Procedure for Electrical Connectors and SocketsEIA-364-24B Maintenance Aging Test Procedure for Electrical ConnectorsEIA-364-25C Probe Damage Test Procedure for Electrical ConnectorsEIA-364-26B Salt Spray Test Procedure for Electrical Connectors, Contacts and SocketsEIA-364-27B Mechanical Shock (Specified Pulse) Test Procedure for Electrical ConnectorsEIA-364-28E Vibration Test Procedure for Electrical Connectors and SocketsEIA-364-29C Contact Retention Test Procedure for Electrical ConnectorsEIA-364-31B Errata Sheet Humidity Test Procedure for Electrical Connectors and SocketsEIA-364-32D Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and SocketsEIA-364-35B Insert Retention Test Procedure for Electrical ConnectorsEIA-364-36B DETERMINA TION OF GAS-TIGHT CHARACTERISTICS TEST PROCEDURE FOR ELECTRICAL CONNECTORS, AND OR CONTACT SYSTEMSEIA-364-37B Contact Engagement and Separation Force Test Procedure for Electrical ConnectorsEIA-364-38B Cable Pull-Out Test Procedure for Electrical ConnectorsEIA-364-39B Hydrostatic Test Procedure for Electrical Connectors, Contacts and SocketsEIA-364-40B Crush Test Procedure for Electrical ConnectorsEIA-364-41C Cable Flexing Test Procedure for Electrical ConnectorsEIA-364-42B Impact Test Procedure for Electrical ConnectorsEIA-364-45A Firewall Flame Test Procedure for Electrical ConnectorsEIA-364-46B MICROSECOND DISCONTINUITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS,CONTACTS AND SOCKETSEIA-364-48A Metallic Coating Thickness Measurement of Contacts Test Procedure for Electrical ConnectorsEIA-364-50A Dust (Fine Sand)Test Procedure for Electrical ConnectorsEIA-364-53B Nitric Adic Vapor Test, Gold Finish Test Procedure for Electrical Connectors and SocketsEIA-364-54A Magnetic Permeability Test Procedure for Electrical Connectors, Contacts, and SocketsEIA-364-56C Resistance to Soldering Heat Test Procedure for Electrical Connectors and Sockets EIA-364-59A LOW TEMPERA TURE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETSEIA-364-66A EMI Shielding Effectiveness Test Procedure for Electrical ConnectorsEIA-364-70B TEMPERA TURE RISE VERSUS CURRENT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETSEIA-364-71B Solder Wicking (Wave Solder Technique) Test Procedure for Electrical Connectors and SocketsEIA-364-75 LIGHTNING STRIKE TEST PROCEDURE FOR ELECTRICAL CONNECTORSEIA-364-81A Combustion Characteristics Test Procedure for Electrical Connector Housings, Connector Assemblies and SocketsEIA-364-82A Corrosivity of Plastics Test Procedure for Electrical Connector and Socket HousingsEIA-364-83 Shell-to-Shell and Shell-to-Bulkhead Resistance Test Procedure for Electrical ConnectorsEIA-364-89A Space Application Test Procedure for Electrical Connectors and SocketsEIA-364-90 Crosstalk Ratio Test Procedures for Electrical Connectors, Sockets, Cable Assemblies or Interconnect SystemsEIA-364-91A Dust Test Procedure for Electrical Connector and SocketsEIA-364-95 Full Mating and Mating Stability Test Procedures for Electrical ConnectorsEIA-364-99 Gage Location and Retention Test Procedure for Electrical ConnectorsEIA-364-100 Marking Permanence Test Procedure for Electrical Connectors and SocketsEIA-364-101 Attentuation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection SystemsEIA-364-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection SystemsEIA-364-103 Propagation Delay Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection SystemsEIA-364-104A Flammability Test Procedure for Electrical ConnectorsEIA-364-105 Altitude-Low Temperature Test Procedure for Electrical ConnectorsEIA-364-106 Standing Wave Ratio (SWR) Test Procedure for Electrical ConnectorsEIA-364-107 Eye Pattern and Jitter Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection SystemsEIA-364-108 Impedance, Reflection Coefficient, Return Loss, and VSWR Measured in the Time and Frequency Domain Test Procedure for Electrical Connectors, Cable Assemblies or Interconnection SystemsEIA-364-1000.01A Environmental Test Methodology for Assessing the Performance of Elecrical Connectors and Sockets Used in Controlled Environment ApplicationsEIA-364-109 Loop Inductance Measurement Test Procedure for Electrical Connectors(1 nH – 10 nH)EIA-364-110 THERMAL CYCLING TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS。

常规工程连接器Q test测试说明

常规工程连接器Q test测试说明

CONNECTOR DIVISIONAPPLE連接器產品常规Q-test测试说明EIA-364 (美国电子工业学会)EIA-364(CONNECTOR DIVISION1. Low Level Contact Resistance (LLCR) 低阶接触阻抗2. Insulation Resistance 绝缘阻抗3. Dielectric Withstanding Voltage 耐电压4Temperature rise电气性能 4. Temperature rise温升5. 其它电气特性:电磁干扰泄露衰减;特性阻抗;插入损耗;反射系数,电压驻波比;串扰,传输延迟;时滞。

1. Mating/ unmating Force 插拔力2. Durability 寿命测试3. Contact retention force 端子保持力4. Contact normal force常规三机械性能端子正向力5. Vibration振动测试6.Physical shock振动冲击测试大测试1. Heat Soak 热储存测试2. Thermal Cycling 热循环测试3. Thermal Shock 冷热冲击测试环境性能冷热冲击测4. Humidity Cycling 温湿度组合循环测试5. Temperature Life 高温测试6.Salt Spray 盐雾测试7. Resistance to Soldering Heat 耐焊接热CONNECTOR DIVISION1.Low Level Contact Resistance (LLCR) 低阶接触阻抗测试1定义:1.任何金屬表面可能有a.灰塵b.氧化物c.油污等雜質, 當兩金屬表面接觸後該介質會影響電流之流通, 一般稱之為接觸阻抗. 高品质的连接器应当具有低而稳定的接触阻抗,连接器的接触阻抗从几毫欧到数十毫欧不等。

2.目的:在不破坏端子表面的氧化膜的情况下,测试结合的两个端子之间的接触阻值,以作为连接器端子的总体性评估.3. 方法:a)以四线量测法量测结合端子之电阻值b)测试电流:100mA max b)测试电流100mA max c)测试电压:DC 20mV max备注:常规CR测试电流和电压: DC 5V ;1A .4.参考标准:EIA-364-235测试仪器微欧姆机5.测试仪器:微欧姆机(设备自身就应具备四线法测试功能,它应有四个外接插孔。

EIA-364系列标准

EIA-364系列标准

EIA-364系列标准EIA-364系列标准,带目录,总共53个标准,6个压缩包EIA-CB18 固体的钽式电容器储存期限EIA-364 D 电子连接器/ 插座测试过程包括环境类别EIA-364 01B 加速度电子连接的测试过程EIA-364 02C 空气渗漏电子连接的测试过程EIA-364 03B 高度浸入电子连接的测试过程EIA-364 05B 接触插入,释放,移动迫使电子连接的测试过程EIA-364 06B 接触电阻电子连接的测试过程EIA-364 07b 与轴向的Concentricity电子连接的测试过程联系EIA-364 08B 卷曲抗拉的力量电子连接的测试过程EIA-364 09C 耐久性电子连接和接触的测试过程EIA-364 10C 流动的浸入电子连接和插座的测试过程EIA-364 11A 电阻到溶剂电子连接和插座的测试过程EIA-364 13B Mating和Unmating 力量电子连接的测试过程EIA-364 14B 臭氧暴露电子连接的测试过程EIA-364 17B 有或没有电负荷电子连接和插座的测试过程的温度生命EIA-364 20C 禁得住电压电子连接,插座和同轴的接触的测试过程EIA-364 21C 绝缘电阻电子连接,插座和同轴的接触的测试过程EIA-364 22B 类比生命电子连接的测试过程EIA-364 23B 低的水准接触电阻电子连接和插座的测试过程EIA-364 24B 维修使电子连接的测试过程变老EIA-364 25C 探查损坏电子连接的测试过程EIA-364 26B 盐水雾电子连接器,接触和插座的测试过程EIA-364 27B 机械震动(指定的脉搏)电子连接的测试过程EIA-364 28D 振动电子连接和插座的测试过程EIA-364 29B 接触保留电子连接的测试过程EIA-364 31B 湿度电子连接和插座的测试过程EIA-364 32C 热震(温度周期变化)电子连接和插座的测试过程EIA-364 35B 插入保留电子连接的测试过程EIA-364 37B 接触约会和分离力量电子连接的测试过程EIA-364 38B 电报拔电子连接的测试过程EIA-364 39B 电子连接器,接触和插座的液压静力测试过程EIA-364 40B 压坏电子连接的测试过程EIA-364 41C 电报在电子连接的测试过程屈曲EIA-364 42B 影响电子连接的测试过程EIA-364 45A 防火墙火焰电子连接的测试过程EIA-364 53B 氮的Adic 蒸汽测试,金完成电子连接和插座的测试过程EIA-364 54A 有磁性的渗透性电子连接器,接触和插座的测试过程EIA-364 56B 为了焊接热电子连接和插座的测试过程的电阻EIA-364 66A EMI 保护效力电子连接的测试过程EIA-364 71B 焊接灯芯(波焊接技术)测试过程适合电子连接器和插座EIA-364 81A 燃烧特性电子连接器住房,连接器会议和插座的测试过程EIA-364 82A 塑胶电子连接和插座住房的测试过程的Corrosivity EIA 364-83 壳牌公司轰炸和轰炸在舱壁测试过程抵抗适合电动汽车连接器EIA 364-90 串音比率电子连接,插座,电缆组件的测试过程或者相互连接系统EIA-364 91A 灰尘电子连接和插座的测试过程EIA 364-95 充分的铺席子和铺席子稳定电子连接的测试过程EIA 364-99 规格位置和保留电子连接的测试过程EIA 364-100 标明永久为电子连接和插座的测试过程EIA 364-101 Attentuation电子连接器,插座,电报会议或者相互联系系统的测试过程EIA 364-102 上升时间堕落电子连接器,插座,电报会议或者相互联系系统的测试过程EIA 364-103 传播延迟电子连接器,插座,电报会议或者相互联系系统的测试过程EIA-364 104A 可燃性电子连接的测试过程EIA 364-105 高度低温电子连接的测试过程EIA 364-106 驻波比率(SWR)电子连接的测试过程EIA 364-107 眼睛图案和在电子连接器,插座,电报会议或者相互联系系统的测试过程感到紧张EIA 364-108 阻抗,反射系数,返回损失,并且VSWR在时间和频率领土电子连接器,电报会议或者相互联系系统的测试过程测量EIA 364 1000.01 评价电子连接器的性能的环境考试方法学和插座在生意办公室应用方面使用EIA 364-109 环电感测量电子连接(1 nH 10 nH)的测试过程。

EIA-364-C 规范中文介绍

EIA-364-C 规范中文介绍

29
Ten Contacts/Style (10
)
Inductance
33 or 69 Ten Contacts/Style (10
)
Impedance
67
Ten Contacts/Style (10
)
Corrosivity
82
Five Samples (Unmated) 2
(
)
Maintenance Aging(1)
)
Altitude Immersion (
)
Normal Force (
)
Contact Insertion and Removal Force (
)
Contact Resistance (
)
Crimp Contact Deformation (
)
Crimp Tensile Strength (
)
Durability (
CONTACT RESISTANCE
(14)
TEMPERATURE (3) LIFE
LLCR OR
CONTACT RESISTANCE
UNMATING FORCE
SUPPLEMENTAL TESTS
(See Table A thru D)
CYCLIC HUMIDITY (4) OR
STEADY STATE
04
Five Contacts (5
)
Porosity
53
Ten Contacts/Style (10
)
Solvent Resistance
11
Two Samples (Unmated) 2
(
)
Capacitance

EIA-364-28E 振动测试

EIA-364-28E 振动测试

2 Test resources ........................................................................................................... 3
3 Test specimen ............................................................................................................ 3
6 Details to be specified ............................................................................................... 17
7 Test documentation ................................................................................................... 18
4 Test procedure ........................................................................................................... 4
4.1 Test conditions I, II, III and IV ................................................................................. 4 4.2 Test conditions V, VI and VII .................................................................................. 11

EIA-364-28B振动测试 实验规范

EIA-364-28B振动测试 实验规范

電子連接器振動測試方法公告E IA工程標准和出版物是為公共利益設計的,它是為了消除生產者和購買者之間的誤解,促進產品的交流和提高,並幫助購買者在最短時間內挑選到他所需要的滿意的產品﹒該標準的提出會促使EIA的成員在生產和銷售產品時遵循該標準﹐而它也可以由國內外非EIA成員自愿使用﹒對于推荐標准和出版物中采用的文章﹑材料﹑方法﹐EIA在選取時未考慮其專利內容,故在此過程中EIA對任何專利所有者不承擔責任﹐對任何采用該標準的機構也不承擔責任﹒EIA標準根据國際標準制定﹐但是國際電工協會還沒有提出EIA標準與IEC 標準的有效的對照﹒該標準的提出不是意在安全問題或适用性做硬性規定﹒標準使用者的職責是在使用前建立起一個安全健康的實踐体系和确定某些標準的适用性﹒出版商﹕EIA工程部1996价格﹕時价EIA﹐JEDEC﹐TIA標準的目錄和工程出版社合稱為全球工程文檔﹐USA和加拿大為C1-800-854-7179﹐國際為303-397-7956版權所有U﹒S﹒A印製請不要侵權﹗EIA版權所有﹐不得翻錄任何機構均可與EIA達成協議得到翻錄許可本標准是以國際電工協會的技術內容為基礎,推荐-512-4,測試6d,1976﹒它不同于ZEC出版物68-2-6在說明隨机振動的具有近控條件和方式的單一測試﹒這些不同是由美國專家協會IEC(或ISO)和技術協會TC48而提出的,消除這些的方發不同則是會在SC48會議中解決﹒目錄條目頁碼1.目的--------------------------------------------------------------------------------------12.綜述--------------------------------------------------------------------------------------13.定義--------------------------------------------------------------------------------------14.準備樣品--------------------------------------------------------------------------------25.測試方法--------------------------------------------------------------------------------3 5.1測試設備-------------------------------------------------------------------------------35.2測試程序-------------------------------------------------------------------------------46.詳細說明------------------------------------------------------------------------------157.文件------------------------------------------------------------------------------------15 表1:振動條件------------------------------------------------------------------------------4 表2:測試條件V值----------------------------------------------------------------------13 表3: 測試條件VI值-------------------------------------------------------------------14 圖1:固定軸線定義------------------------------------------------------------------------2 圖2:振動測試曲線---高頻(位移mm)--------------------------------------------------6 圖3:振動測試曲線---高頻(位移inch)--------------------------------------------------7 圖4:測試條件V,隨机振動測試曲線(包羅線)--------------------------------------13 圖5: 測試條件VI,隨机振動測試曲線(包羅線)-----------------------------------14電子工業協會測試方法#28B電子連接器振動測試方法(摘自EIA建議標准NO.3410,是在EIA CE-2.0國家連接件標准協會的組織下提出的﹒本測試程序曾印于EIA建議標准RS-364中TP-28A)1.目的本程序是說明一种標准方法,該方法是用來評估電子連接件經受強烈振動的能力﹒2.綜述本測試程序應用于電子連接件元件,包含振動的條件.連接件在振動期間是能夠運行還是盡能保持,都會清楚的詳細說明.另外,相關說明應描述外觀在執行中可接受公差﹒測試目的是判斷外觀是缺陷或劣質或兩者都有,並用此情況聯系詳細說明中的\情況以決定該樣本是否可以接受﹒重點強調的是振動測試總要求有一定的話工程判斷能力﹐并且供應商和采購都應完全了解此事﹒3.定義﹕下述固定軸線定義是在測試完成中應用﹐除非特別說明﹒3.1 軸線圖1所示此軸線定義的圖片﹐詳細說明應顯示固定裝置之要求或軸線定義﹒如果与圖1所示相依易的話﹐軸線定義對于對稱的﹐平面的和可動的連接件將在詳細說明中定義﹒3..1.1 X軸沿樣本長度方向3.2.2Y軸垂直于樣本長度方向3.3.3 Z軸垂直于測試台上座墊平面.4. 樣本准備4.1 振動測試樣本應是裝線完備的連接件包含下述情況之一﹒4.1.1 連接件插頭和他的配合連接件插座﹒4.1.2 印刷電路板連接件插座和它的配合連接件板﹒4.1.3 一條完整的可用的連接件組裝線的組裝線﹒4.2 每個測試樣本都應準備好電線和其它材料和工序﹐模擬樣本應運裝配﹐如果正常連接件配合依賴于外力﹐這外力和固定方式將盡可能的一致﹒例如連接件的印刷層﹒如果配合完成靠正常鎖定方式﹐則僅正常鎖定方式被使用﹒4.3 固定方式4.3.1 測試ⅠⅡⅢⅣ(正旋曲線條件)配合樣本應被附著在能夠傳導特別條件的振動夾具上﹒測試夾具要設計成這樣因為夾具內在的共振在說明的頻率范圍中是很微笑小的﹒可用振動的大小主要在測試夾具上靠近樣本固定電點的地方﹒測試樣本應牢固的固定在測試夾具上象說明中的一樣﹒並應盡可能近的模擬樣本正常固定﹒最小200mm 的電線或電纜應不裝在連接件的兩端上﹒對于帶附加托架的樣本﹐振動測試方向之一應平行于托架固定表面﹒振動的輸入是監測接近在固定夾具接近樣本的支撐點﹒4.3.2 測試條件ⅤⅥ樣本如說明的那樣固定﹐樣本的方位或振動運動的方嚮應在一個或多個方嚮說明﹐如果不同方嚮是相對的﹐它也應說明﹐任何樣本測試家具需要運行測試應被足夠詳細的說明以确保作用于樣本的輸入運動的再生﹒這些細節包括尺寸﹐材料﹐性能等﹒5. 測試方法5.1 測試設備主要轉換器應調換為相對標準轉換器具有±2%的精度﹐振動系統包括振動机以及它的輔助測試設備﹐應能夠產生正懸曲線振動或隨机自激振動﹒為隨机振動的測試設備應能產生隨机自激振動﹒振動擁有正常的振幅分布﹐除了加速度峰值的大小應限制到最小3σ﹒5.2 測試程序測試和測量(在振動前﹐中﹐后)應在詳細說明中敘述﹒5.2.1測試條件ⅠⅡⅢⅣ5.2.1.1電學加載和不連續性5.2.1.1.1除非特性說明﹐電學特性加載條件應為最大100mΑ﹒5.2.1.1.2除非特性說明﹐1ms連續或更長周期連續是允許的﹐使用能夠檢測不連續性的探測器﹒5.2.1.2振動條件振動條件應于表1相一致﹒表1—振動條件:5.2.1.3共振臨界共振頻率是樣本上一些點上的頻率被發現有一個最多二倍于支持點的最大振幅﹐當說明時﹐共振頻率應由監測參量例如連接開路時或使用共振探測器﹒5.2.1.4測試條件Ⅰ樣本應作簡諧運動有一個0.76mm(0.03)振幅﹐頻率應介于10~55H z之間﹐完整的頻率范圍從10~55H z﹐然后又回到10H z﹐在大約1分鐘時間轉換﹐除非特別說明﹐此運動在相互垂直的三個方嚮的每一個上進行2h(共6h)﹐如果可行﹐此測試應在電學加載條件下進行﹒測試條件Ⅱ《9.81m/s²(10g)峰值》5.2.1.5當在加載條件下消除加強或操作時﹐樣本因服從于振動振幅﹐頻率范圍和周期如5.2.1.5.1﹐5.2.1.5.2﹐5.2.1.5.3中的說明﹐分別見圖2.3﹒5.2.1.5.1振幅樣本應作簡諧振動﹐有一個1.52MM(0.06)雙振幅或98.1 m/s²的振幅﹐振動振幅的公差應為±10%﹒5.2.1.5.2頻率振動頻率應對數分類介于約10~500H z之間(見5.1.8)除了標準程序(見5.2.14)可能應用在振動頻率范圍10~500H z之間﹒5.2.1.5.3消除時間和周期整個頻率范圍(10~500H z)和(500~10H z)應在15分內轉換﹐這個循環應在三個相垂直的方嚮中的每一個方嚮進行12次﹐故用共約9h的時間進行此過程﹒允許間斷提供所遇到的變化率和測試周期的要求完整的循環在任何獨立波段是允許的﹒到下一個波段中﹐當程序使用是時在10~55H z波段中﹐此部分的周期于此波段用對數循環的周期相同﹒5.2.1.6測試條件Ⅲ[147.1 m/s²(15g)峰值]在加載條件下當消除加強或操作﹐樣本應服從于振動振幅﹐頻率范圍和周期﹐說明分別在5.2.1.6.1﹐ 5.2.1.6.2和5.2.1.6.3﹐見圖2和圖3﹒5.2.1.6.1振幅樣本應作簡諧運動有1.52(0.06)雙振幅或147.1 m/s²峰值﹒無論哪一個小﹐振動振幅的公差應為±10%﹒5.2.1.6.2頻率范圍振動頻率按對數分應約為10~2000H z(見5.2.1.8)除了標準的程序在振動頻率范圍的波段中使用(10~55H z)﹒5.2.1.6.3消除時間和周期整個頻率范圍(10~2000H z)和(2000~10H z)應在20分內轉換﹐這個循環應在三個相垂直的方嚮中的每一個方嚮進行12次﹐故用共約12h的時間進行此過程﹒允許間斷提供所遇到的變化率和測試周期的要求﹐完整的循環在任何獨立波段是允許的﹒到下一個波段中﹐當程序使用是時在10~55H z波段中﹐此部分的周期与此波段用對數循環的周期相同﹒5.2.1.7測試條件Ⅳ[196.1 m/s²(20g)峰值]在加載條件下當消除加強或操作﹐樣本應服從于振動振幅﹐頻率范圍和周期﹐說明分別在5.2.1.7.1﹐ 5.2.1.7.2﹐ 5.2.1.7.3見圖2和圖3﹒5.2.1.7.1振幅樣本應作簡諧運動有1.52mm雙振幅或147.1 m/s²峰值﹒無論哪一個比較小﹐振動振幅的公差應為±10%﹒5.2.1.7.2頻率范圍振動頻率按對數分應約為10~2000H z(見5.2.1.8)5.2.1.7.3消除時間和周期整個頻率范圍(10~2000H z)和(2000~10H z)應在20分內轉換﹐這個循環應在三個相垂直的方嚮中的每一個方嚮進行12次﹐故用共約12h的時間進行此過程﹒允許間斷提供所遇到的變化率和測試周期的要求﹐完整的循環在任何獨立波段是允許的﹒到下一個波段中﹐當程序使用是時在10~55H z波段中﹐此部分的周期与此波段用對數循環的周期相同﹒5.2.1.8 線性使用替代程序代替頻率變化的對數﹐頻率變化的線率在以下條件下許可﹒5.2.1.8.1頻率范圍在55H z以上將被再分成不少于3波段﹐最大頻率和最小頻率的比在每波段不少于2﹒5.2.1.8.2 頻率的變化率(H z/min)在每波段上都是恆定的﹒5.2.1.8.3 每波段的頻率變化與此波段最大頻率的比應大致相同﹒5.2.1.8.3.1替代程序的示例﹕變化率的計算﹕例如﹕假設頻率光譜分了波段﹐55〜125Ηz,125〜500Ηz, 500〜2000Ηz與5.2.1.8.1一致.對于每段波﹐用“K”表示頻率變化率(Ηz/min)與最大頻率值的比值﹐然后三個波段的變化率分別為125K﹐500K﹐2000K﹐時間用分鐘表示﹐轉化三個頻率分別表示﹕(125-55)/125k﹐(500-125)/500k and (2000-500)/2000k由于最小總消除時間為30min.30=70/125k+375/500k+1500/2000kk=0.0687頻率變化的最大率值(常值)對于三個波段分別為8.55Ηz﹐34.2Ηz﹐137Ηz每秒,波段轉換的最小時間為8.2min﹐10.9min﹐10.9min﹒5.2.2 測試條件ⅤⅥ5.2.2.1控制和分析(隨机振動)5.2.2.1.1光譜密度曲線振動机輸出統計表明其光譜密度強于頻率光譜密度.見5.2.2.1.1.1光譜密度值應在+40%〜-30%(±1.5dB)之間(說明值)在低頻和1000Ηz﹐并且在+100%和-50%(±3.0dB)之內介于1000和高頻2000Ηz間﹒濾波寬度應為1/8彎度的1/3或25Ηz﹐的最大值﹐無論那哪一個大﹒5.2.2.1.1.1光譜密度的乘方分析光譜密度的乘方是一种振蕩的平方值通過窄頻濾波單位波寬﹐它表示為G²/f﹐其中G²/f是重力加速度的值處以濾波寬度循環的數目﹐光譜密度曲線通常是對數計算或單位分貝﹒公式為﹕dB=10log[(G²/f)/ (Gr²/f)]=20log[(G /√f)/(Gr/√f)]F1和f2之間的頻段的加速度值為﹕G rms=[∫G²/f df]½其中Gr²/f是給的光譜密度乘方的參考值﹐通常說得是最大值﹒5.2.2.1.2分布曲線概率密度──分布曲線將得到並于交期一分布曲線相對比實驗得到的曲線應不同于高斯曲線最多超過最大值的±10%﹒5.2.2.1.3監視器監視器包括自激振動的測量和測試項目的完成﹒當在獨立說明中需要時﹐樣本在測試期間被監視﹐監視回路的細節包括聯接到樣本的方式和點應說明﹒5.2.2.1.4振動輸入振動數值是一振動机上固定夾具上和位置上主要的它在可行的前提下盡可能接近測試項目固定點﹒當振動輸入在至多一個上測量﹐則最小輸入振動一個于說明的測試曲線相一致﹐見圖4和圖5﹒大量測試項目﹐夾具和大力自激物﹐輸入的控制值是三個或更多的輸入的平均值﹒加速在轉換方嚮﹐測試項目粘貼點上測量﹐應限制在應用振動的100%﹐測試點的數目和位置應作說明﹒5.2.2.2 程序樣本或等效的替代物應于4.3.2一致的固定﹐并且主要設備﹐如果可用的話﹐一個與5.2.2.1.3一致﹒振動机應被操作和平等補償以傳遞所要求的順序和密度用來說明測試條件Ⅴ﹐圖4或測試條件Ⅵ圖5中曲線﹒樣本應服從于被說明的振動﹐通過測試條件字母(見表2.3)在所說明的周期﹕3min﹔15min﹔1-1/2h﹔8h﹒在三個相互垂直的方向中的一個﹐依所說明的順序進行﹒(見4.3.2)測量在測試前﹐中﹐后應說明﹐并且如果樣本在測試中作為主要的﹐則細節應于與5.2.2.1.3一致﹒5.2.2.3 電學加載和不連續性5.2.2.3.1 除非在細節說明書中另作說明﹐否則電學加載條件對所有連接件應為100Ma﹒5.2.2.3.2 除非在細節說明書中另作說明﹐否則應允許1ms或更長周期的連續﹐應採用一個功能為檢測指定的不連續現象的探測器﹒6. 細節說明以下細節將在細節說明中說明﹕6.1樣本類型(見4.1)6.2被測樣本數目6.3固定方式(4.3)6.4測試條件數目(見表1﹐2﹐3)6.5電學加載個件所有連接﹐如果除了100mA最大(見5.2.1.1或5.2.2.3)6.6若除31ms不連續設備6.7振動期間不連續性的測量(見5.2.1.1或5.2.2.3)6.8如可行﹐決定共振的方式(見5.2.1.3)6.9如可行﹐運動的方嚮和順序(見4.3)6.10在振動前﹐中﹐后測量6.11振動周期(見5.2.1.4或5.2.2.2)6.12如可行﹐配備監測設備(5.2.2.1.2)6.13如可行﹐測試點的數目和位置(見5.2.2.1.3)6.14固定軸線(見欄3)7. 參考文件數据表單應包括﹕7.1 測試題目﹔7.2 如果可行﹐進行樣品描述-包括固定裝置﹔7.3 使用的測試設備﹐最近調校日期和調校間隔﹔7.4 測試條件數目和周期﹔7.5 測試圖表數值和觀察﹔7.6 固定軸線(見欄3)﹔7.7 測試日期和操作者姓名﹒。

00-EIA-364系列标准

00-EIA-364系列标准

EIA-364系列标准EIA-CB18 固體的鉭式電容器儲存期限EIA-364-E 電子連接器/ 插座測試過程包括環境類別EIA-364-01B 加速度電子連接的測試過程EIA-364-02C 空氣滲漏電子連接的測試過程EIA-364-03B 高度浸入電子連接的測試過程EIA-364-05B 接觸插入,釋放,移動迫使電子連接的測試過程EIA-364-06C 接觸電阻電子連接的測試過程EIA-364-07C 與軸向的Concentricity電子連接的測試過程聯繫EIA-364-08B 捲曲抗拉的力量電子連接的測試過程EIA-364-09C 耐久性電子連接和接觸的測試過程EIA-364-10E 流動的浸入電子連接和插座的測試過程EIA-364-11B 電阻到溶劑電子連接和插座的測試過程EIA-364-13D Mating和Unmating 力量電子連接的測試過程EIA-364-14B 臭氧暴露電子連接的測試過程EIA-364-17B 有或沒有電負荷電子連接和插座的測試過程的溫度生命EIA-364-18B 接线盒和插座的外观与尺寸检查的测试流程EIA-364-20D 禁得住電壓電子連接,插座和同軸的接觸的測試過程EIA-364-21D 絕緣電阻電子連接,插座和同軸的接觸的測試過程EIA-364-22B 類比生命電子連接的測試過程EIA-364-23C 低的水準接觸電阻電子連接和插座的測試過程EIA-364-24B 維修使電子連接的測試過程變老EIA-364-25C 探查損壞電子連接的測試過程EIA-364-26B 鹽水霧電子連接器,接觸和插座的測試過程EIA-364-27B 機械震動(指定的脈搏)電子連接的測試過程EIA-364-28D 振動電子連接和插座的測試過程EIA-364-29C 接觸保留電子連接的測試過程EIA-364-31B 濕度電子連接和插座的測試過程EIA-364-32D 熱震(溫度週期變化)電子連接和插座的測試過程EIA-364-35B 插入保留電子連接的測試過程EIA-364-36B DETERMINATION OF GAS-TIGHT CHARACTERISTICS TEST PROCEDURE FOR ELECTRICAL CONNECTORS, AND OR CONTACT SYSTEMSEIA-364-37B 接觸約會和分離力量電子連接的測試過程EIA-364-38B 電報拔電子連接的測試過程EIA-364-39B 電子連接器,接觸和插座的液壓靜力測試過程EIA-364-40B 壓壞電子連接的測試過程EIA-364-41C 電報在電子連接的測試過程屈曲EIA-364-42B 影響電子連接的測試過程EIA-364-45A 防火牆火焰電子連接的測試過程EIA-364-46BEIA-364-48AEIA-364-50AEIA-364-53B 氮的Adic 蒸汽測試,金完成電子連接和插座的測試過程EIA-364-54A 有磁性的滲透性電子連接器,接觸和插座的測試過程EIA-364-56D 為了焊接熱電子連接和插座的測試過程的電阻EIA-364-66A EMI 保護效力電子連接的測試過程EIA-364-70BEIA-364-71B 焊接燈芯(波焊接技術)測試過程適合電子連接器和插座EIA-364-75EIA-364-81A 燃燒特性電子連接器住房,連接器會議和插座的測試過程EIA-364-82A 塑膠電子連接和插座住房的測試過程的Corrosivity EIA-364-83 殼牌公司轟炸和轟炸在艙壁測試過程抵抗適合電動汽車連接器EIA-364-89AEIA-364-90 串音比率電子連接,插座,電纜組件的測試過程或者相互連接系統EIA-364 91A 灰塵電子連接和插座的測試過程EIA-364-95 充分的鋪席子和鋪席子穩定電子連接的測試過程EIA-364-99 規格位置和保留電子連接的測試過程EIA-364-100 標明永久為電子連接和插座的測試過程EIA-364-101 Attentuation電子連接器,插座,電報會議或者相互聯繫系統的測試過程EIA 364-102 上升時間墮落電子連接器,插座,電報會議或者相互聯繫系統的測試過程EIA-364-103 傳播延遲電子連接器,插座,電報會議或者相互聯繫系統的測試過程EIA-364 104A 可燃性電子連接的測試過程EIA-364-105A 高度低溫電子連接的測試過程EIA-364-106 駐波比率(SWR)電子連接的測試過程EIA-364-107 眼睛圖案和在電子連接器,插座,電報會議或者相互聯繫系統的測試過程感到緊張EIA-364-108 阻抗,反射系數,返回損失,並且VSWR在時間和頻率領土電子連接器,電報會議或者相互聯繫系統的測試過程測量EIA-364 1000.01 評價電子連接器的性能的環境考試方法學和插座在生意辦公室應用方面使用EIA-364-109 環電感測量電子連接(1 nH 10 nH)的測試過程EIA-364-110。

EIA ECA-364-28E中文版

EIA ECA-364-28E中文版

EIA STANDARD EIA/ECA-364-28E 第1 页共7 页电子工业协会标准电子零组件、组合体和材料协会(ECA)TP-28E电连接器及插座振动试验程序EIA/ECA-364-28E(依据EIA-364-28D修订)2006年8月28日颁布1 导言1.1 概述本试验标准阐述了一种用于电连接器振动试验的标准方法,以便评估电连接器及其组件承受特定强度振动的能力。

1.2 目的进行本试验是为了确定连接器及其组件在寿命期间可能遭遇在主要频段或随机振动频段范围内及其幅度上受振动的影响情况。

1.3 定义1.3.1 轴图1给出了轴的图示定义,如果使用不同于图1所示的轴,则在相关参考文件中应在试验装置进行要求或对轴进行定义。

3.1.1.1 X轴与样品纵向一致的方向3.1.1.2 Y轴与样品纵向相垂直的方向(横向)3.1.1.3 Z轴与测试装置的固定面(与试验桌的桌面接触的面)垂直的方向图1---安装轴向定义1.3.2 术语gngn是SI单位,表示标准的重力加速度,它本身随着高度和地理位置而变化。

备注:gn标准值为9.81m/s22 测试设备应传感器进行校准,其精度应达到±2%。

振动系统由振动试验机及辅助设备组成,整个系统应能产生正弦或随机的振动。

用于随机振动的测试设备所产生的随机振动的振动幅度应符合高斯分布,但加速度的峰值可限止到最小为3倍的均方根值(区间为3σ)。

3 测试样品3.1 振动试验的样品应是完全连接好连接器,包括一个连接器插头及匹配的插座,或者是一种印刷电路板及匹配的连接器,或者是一种具有完整功能的组合件。

3.2 每一试验样品都应准备好导线及其它材料,或作好模拟连接器的现场组装等工作。

如果规定的连接器插合是靠外力插合到连接器上,那么这些外力和安装方法应尽可能模拟实际使用方法。

如果是采用规定锁紧方法达到插合的目的,则只采用规定的锁紧方法。

3.3 安装方法3.3.1 试验条件I,II,III和试验条件IV连接器试验样品应固定到能传递规定振动条件的夹具上,夹具的设计应能保证它的固有共振频率在试验所规定的频率范围内达到最小。

EIA-364-90 串音测试中文版

EIA-364-90 串音测试中文版

EIA-364-90 串音 (Crosstalk) 测试1.简介1.1范围这个测试程序应用于连接系统,比如像电子连接器,插座,和缆线组件整合.1.2目的这个标准描述了如何量测在连接系统整合中驱动线路和承受线路电磁耦合的量.时域(方法A)和频域(方法B)的量测方法,单动和差动的传输,还有插入式和参考治具测量法都将会叙述.1.3定义1.3.1 驱动讯号对于时域的测量来说,驱动讯号为一步阶波形;对于频域的测量,驱动讯号为一弦波波形.1.3.2 串音比串音比的定义为耦合到承受线路导体或导体对的讯号量比上在驱动线路导体或导体对上的讯号量.不管是耦合或驱动的讯号必须用相同的单位,比如说电压或电流,而串音比必须用百分比或 dB来表示.1.3.3 近端串音比(Near End Crosstalk Ratio – NEXT)串音比是由承受线路在接近驱动线路的发送端而量得,这个串音比是由近端的承受线路讯号量比上近端的驱动线路讯号量.1.3.4 远程串音比(Far End Crosstalk Ratio – FEXT)串音比是由承受线路在接近驱动线路的接收端而量得,这个串音比是由远程的承受线路讯号量比上近端的驱动线路讯号量.1.3.5 量测系统爬升时间量测系统爬升时间为包含治具,经过滤波效应(filtering),但不包含待测物,所测得的爬升时间.爬升时间通常是量测从 10%到90%的位准所需花费的时间.1.3.6 待测环境阻抗阻抗是由治具上的传导讯号导体所呈现.阻抗是由传输线,终端电阻,接收端,讯号来源和治具寄生效应的结果.1.3.7 步阶振幅如图一所示,步阶振幅是从 0% 到 100% ,忽略 overshoot 和 undershoot, 的电压差值.1.3.8 隔离标准板(Isolation Standard)隔离标准板为一没有待测物,但与测试治具有相同的串音特性的参考治具,这个治具可以为或可以不为测试板的一部份.1.3.9 终端连接在传输线末端的阻抗,通常是为了减小在传输在线的反射能量.2.测试资源2.1设备2.1.1 方法 A,时域2.1.1.1步阶讯号产生器连接于驱动线路,而承受线路则连接于示波器.如果是差动讯号的应用,则步阶讯号产生器和示波器都必须要有处理差动讯号的能力,这表示输出端要能调整振幅和 skew的差异,而输入端要能显示两个输入讯号的差跟和,为了能更改不同的爬升时间,仪器要提供滤波(filtering)或归一化(normalization)的功能.在这种情况下,时域反射仪(TDR)通常会被采用.2.1.1.2 探针当探针被采用的时候,必须要有合适的爬升时间表现和负载电路特性.2.1.2 方法B,频域网络分析仪(Network Analyzer)是较为偏好的,当需要较大的动态范围(dynamic range)时,讯号产生器和频谱分析仪的组合也可为替代的方案.一个八端口的网络分析仪或baluns可用来做差动讯号的测量.2.2治具除非在参考文件中有其他特别规定,否则待测物环境阻抗必须要匹配测试设备的阻抗.通常单动 (single-ended) 量测要求 50奥姆的阻抗而差动(differential) 量测要求 100奥姆.2.2.1 待测物导体配置对于每一个测量,驱动线路和承受线路必须如参考文件所示而摆置,如果可能的话,邻近于待测线路的线路必须做终端(terminated)的动作.除非有其他特别的规定,否则采用 1:1的讯号对接地的比例(如果是做差动讯号的测量,则采用一对差动讯号线路对应一个接地线路),所有的线路都对应到相同的接地面,如图二所示.治具必须设计成所有的线路有相同的时间延迟.注意–当驱动讯号为差动的模式且非均衡时,则共模(common mode)讯号的能量必须被终端(terminated)图二2.2.2 终端驱动线路的远程和承受线路的两边末端都必须用待测环境阻抗做终端,所采用的方法可以参考图三或图四,如果待测环境阻抗和测量设备的阻抗不匹配的话,可使用匹配电路(matching network),在整个的频率量测范围内必须注意到尽量减小电阻性终端的电抗效应.注意–治具的几何形状和材质会影响到测量肇因于治具的寄生效应,所以通常以产品的用途来规划最有意义的治具形态.图三单动模式测量的阻抗终端图四差动模式测量的阻抗终端2.2.3 串音从待测物所量得的串音中分离出治具的串音是困难的,所以参考文件必须规范治具以使治具所产生的串音量减到最小.注意–因为测试板的脚位布局或缆线组件整合的终端技术会严重地影响到串音量,所以建议治具应包含隔离标准板(Isolation Standard)2.2.4 插入式技术治具(Insertion Technique Fixture)这种治具必须设计成不管有没有加入待测物都可以做串音的测量,如图五所示,如果为了双动测量(balanced measurement)而使用baluns,或为了阻抗匹配而使用最小损耗垫(minimum loss pads),如图三和图四所示,这些都包含在治具2.2.5 参考治具技术(Reference Fixture Technique)使用这种技术一个个别包含有近端和远程的治具将会被用来做治具串音的测量,这个治具,除了没有待测物外,将是待测物治具的复制品;如果有电路线路的话,必须包含治具的连接器,贯孔,弯折(bends),和转角(corners);如果为了双动测量(balanced measurement)而使用baluns,或为了阻抗匹配而使用最小损耗垫(minimum loss pads),如图三和图四所示,这些都包含在治具之中.之中.3.待测物3.1叙述这项测试的待测物必须有一条以上的讯号线,而且必须为下列对象之一:一.1.1可分离的连接器接合一起的连接器配对.一.1.2缆线整合组件附有连接器或接合在一起的连接器配对的缆线.一.1.3插座插座和测试组件,或插座和可插入的转接头.一. 4.测试步骤一.驱动线路的远程和承受线路的两端都必须用待测环境阻抗做终端,终端的方法可用图三和图四的其中一种.一.4.1方法A,时域一.4.1.1一般性原则一.4.1.1.1待测物必须放置距离会影响测量结果之对象至少 5cm 远之处.一.4.1.1.2 参考测量和治具串音一.4.1.1.2.1量测并纪录从10%到90%位准的量测系统爬升时间,除非参考文件有其他任何的规范.一.4.1.1.2.2治具的串音会添加在待测物的串音中,如果有使用最小损耗垫,那么最小损耗垫也包含在治具之中;如果参考文件明确地描述治具,那么治具所贡献的串音量即为已知值,则治具串音的测量就是非必须的;这些结果是量测量对时间的关系图,用以下的其中一种技术来量测量测系统爬升时间,驱动线路振幅,和治具串音量.一.4.1.2插入式测量法一.4.1.2.1在不加入待测物的情况下,把治具的近端和远程连接起来,将示波器和脉冲讯号产生器连接在驱动线路治具的适当位置;对多个同步驱动讯号线路,匹配它们的振幅,并且减小它们之间的 skew;对双动讯号的测量,减小这对线路的skew,量测并报告 skew的值.一.4.1.2.2如果同步要被驱动的线路数目超过了设备的容许值,或者频道间 skew的排除是一件令人担心的事,那么一次驱动一条线路且串音量以迭加(superposition)的方式纪录下来.一.4.1.2.3量测驱动讯号在通过治具时的步阶爬升时间和振幅(如果有要求,这个动作可以使用加上待测物的治具来完成),调整滤波功能使得量测爬升时间符合要求的值,或如表一的值.表一4.1.2.4依照参考文件将示波器连接于承受线路,测量将待测物移除的治具串音量,将治具串音振幅除以步阶讯号振幅以求得治具串音比并将其表示成百分比的形式,除非有其他的规范,否则将峰值和符号给纪录下来.4.1.3 参考治具测量法4.1.3.1将示波器和脉冲产生器连接在驱动线路的适当位置;对于双动讯号的测量,讯号源必须使正向和负向的步阶讯号振幅一致,且将其 skew移除;对于多个同步驱动讯号线路,使其振幅一致且移除 skew.4.1.3.2如果同步要被驱动的线路数目超过了设备的容许值,或者频道间 skew的排除是一件令人担心的事,那么一次驱动一条线路且串音量以迭加(superposition)的方式纪录下来.4.1.3.3量测驱动讯号在通过参考治具时的步阶爬升时间和振幅(如果对远程串音有要求,这个动作可以使用加上待测物的治具来完成),调整滤波功能使得量测爬升时间符合要求的值,或如表一的值.4.1.3.4如参考文件所示,将示波器连接在参考治具的承受线路上,量测承受线路接收到的最大振幅,把这个值减去在驱动讯号产生前承受线路上的讯号振幅以便获得承受线路的串音量(包含符号),将承受线路的串音量除以步阶讯号的振幅以计算治具串音比,并将其表示成百分比的形式.4.1.4 待测物串音测量4.1.4.1在治具上加入待测物.4.1.4.2将示波器连接在承受线路被要求的位置,而同样的,把步阶讯号产生器连接在驱动讯号线路被要求的位置;对于双动讯号的测量,讯号源必须使正向和负向的步阶讯号振幅一致,且将其 skew移除;对于多个同步驱动讯号线路,使其振幅一致且移除 skew.4.1.4.3如果同步要被驱动的线路数目超过了设备的容许值,或者频道间 skew的排除是一件令人担心的事,那么一次驱动一条线路且串音量以迭加(superposition)的方式纪录下来.4.1.4.4量测承受线路接收到的最大振幅,把这个值减去在驱动讯号产生前承受线路上的讯号振幅以便获得承受线路的串音量(包含符号),将待测物-与-治具的承受线路的串音量除以步阶讯号的振幅以计算待测物-与-治具的串音比,并将其表示成百分比的形式.注意-当治具的串音量接近于待测物-与-治具的串音量时,对于结果的解释就要小心了,从这项测试减去治具串音并不是正确的做法.。

连接器测试内容可证书附件 中英文- -03-26之欧阳育创编

连接器测试内容可证书附件 中英文- -03-26之欧阳育创编

机构名称:富加宜连接器(东莞)有限公司产品检测中心注册号:L6610地址:A:广东省东莞市沙田镇齐沙南围获准认可能力索引Name:AP Product Testing Laboratory of FCI Connectors (Dongguan) Co., Ltd.Registration No.:L6610ADDRESS:A:Nanwei, Qisha, Shatian, Dongguan, Guangdong, ChinaINDEX OF ACCREDITED SIGNATORIES中国合格评定国家认可委员会认可证书附件(注册号:CNAS L6610)名称: 富加宜连接器(东莞)有限公司产品检测中心地址:广东省东莞市沙田镇齐沙南围签发日期:2013年12月25日有效期至:2016年12月24日更新日期:2013年12月25日序号姓名授权签字领域备注CHINA NATIONAL ACCREDITATION SERVICE FORCONFORMITY ASSESSMENTAPPENDIXOF ACCREDITATION CERTIFICATE(Registration No. CNAS L6610)NAME:AP Product Testing Laboratory of FCI Connectors (Dongguan) Co., Ltd.ADDRESS:Nanwei, Qisha, Shatian, Dongguan, Guangdong, ChinaDate of Issue:2013-12-25Date of Expiry:2016-12-24Date of Update:2013-12-25APPENDIX 1ACCREDITED SIGNATORIES AND SCOPE№Name Authorized Scope of Signature Note 1 Zeng Zhengdao Metallic materials, Electrical connector.2 Li YuanyaMetallic materials, Electrical connector (except for parameters of solderability of contact terminations and mixed flowinggas).中国合格评定国家认可委员会认可证书附件(注册号:CNAS L6610)名称: 富加宜连接器(东莞)有限公司产品检测中心地址:广东省东莞市沙田镇齐沙南围认可依据:ISO/IEC 17025:2005以及CNAS特定认可要求签发日期:2013年12月25日有效期至:2016年12月24日更新日期:2013年12月25日附件2 认可的检测能力范围CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITYASSESSMENTAPPENDIX OF ACCREDITATION CERTIFICATE(Registration No. CNAS L6610)NAME:AP Product Testing Laboratory of FCI Connectors (Dongguan) Co., Ltd.ADDRESS:Nanwei, Qisha, Shatian, Dongguan, Guangdong, China Accreditation Criteria:ISO/IEC 17025:2005 and relevantrequirements of CNASDate of Issue:2013-12-25Date of Expiry:2016-12-24Date of Update:2013-12-25№Test ObjectItem/ParameterCode ofFieldTitle, Code ofStandard or MethodLimitation Note №Item/ParameterI Metallic materials1 Metallic materials 1 Vickershardness0301《Metallic materials- Vickers hardnesstest - Part 1: Testmethod》ISO 6507-1-2005Accreditedonly for HV(0.01~1).II Electrical connector1 Electricalconnector1Normalforce0418《Normal ForceTest Procedure forElectricalConnectors》ANSI/EIA-364-04A-2001(R2009)Accreditedonly formethod A.№Test ObjectCode ofFieldTitle, Code ofStandard or MethodLimitation Note №Item/Parameter5Electricalconnectors,contacts andsockets1 Salt spray 0431《Connectors forelectronic equipment-Tests andmeasurements - Part11-6: Climatic tests -Test 11f: Corrosion,salt mist》CEI/IEC60512-11-6:20022Microseconddiscontinuity test0418《MicrosecondDiscontinuity TestProcedure forElectricalConnectors,Contactsand Sockets》ANSI/EIA-364-46C-2012Accreditedonly for(0.1~99.9)μs.3Mixedflowing gas0431《MIXEDFLOWING TESTPROCEDURE FORELECTRICALCONNECTORSCONTACTS ANDSOCKETS》ANSI/EIA-364-65B-2009Accreditedonly forvolume ofless than0.015m3,class IIA andclass IIIA.中国合格评定国家认可委员会认可证书附件(注册号:CNAS L6610)名称:富加宜连接器(东莞)有限公司产品检测中心地址:广东省东莞市沙田镇齐沙南围签发日期:2013年12月25日有效期至:2016年12月24日更新日期:2015年02月04日序号姓名授权签字领域备注1 曾正道金属材料、电子连接器的检测项目2 李远亚金属材料、电子连接器(可焊性测试和混合流动气体测试除外)的检测项目CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITYASSESSMENTAPPENDIXOF ACCREDITATION CERTIFICATE(Registration No. CNAS L6610)NAME:AP Product Testing Laboratory of FCI Connectors (Dongguan) Co., Ltd.ADDRESS:Nanwei, Qisha, Shatian, Dongguan, Guangdong, ChinaDate of Issue:2013-12-25Date of Expiry:2016-12-24Date of Update:2015-02-04№Name Authorized Scope of Signature Note1 Zeng,ZhengDaoTest items of Metallic materials, Electricalconnector2 Li,YuanYaTest Items of Metallic materials, Electricalconnector (Except for Solderability test andMixed flowing gas test)中国合格评定国家认可委员会认可证书附件(注册号:CNAS L6610)名称:富加宜连接器(东莞)有限公司产品检测中心地址:广东省东莞市沙田镇齐沙南围认可依据:ISO/IEC 17025以及CNAS特定认可要求签发日期:2013年12月25日有效期至:2016年12月24日更新日期:2015年02月04日附件2 认可的检测能力范围序号检测对象项目/参数检测标准(方法)名称及编号(含年号)限制范围说明序号名称1 金属材料 1 维氏硬度《金属材料维氏硬度第1部分:测试方法》ISO 6507-1-2005只测:HV(0.01~1)2 电子连接器 1 正向力《电子连接器正向力测试程序》ANSI/EIA-364-04A-2001(R2009)只用:方法A2 电子连接器 2 接触电阻《电子连接器接触电阻测试程序》ANSI/EIA 364-06C-2006(R2012)CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITYASSESSMENTAPPENDIX OF ACCREDITATION CERTIFICATE(Registration No. CNAS L6610)NAME:AP Product Testing Laboratory of FCI Connectors (Dongguan) Co., Ltd.ADDRESS:Nanwei, Qisha, Shatian, Dongguan, Guangdong, China Accreditation Criteria:ISO/IEC 17025 and relevantrequirements of CNASDate of Issue:2013-12-25Date of Expiry:2016-12-24Date of Update:2015-02-04№Test ObjectItem/ParameterTitle, Code ofStandard or MethodLimitation Note №Item/Parameter1 Metallic materials 1 Vickershardness《Metallic materials- Vickers hardnesstest - Part 1: Testmethod》ISO 6507-1-2005Accreditedonly for HV(0.01~1).2 Electricalconnector1Normalforce《Normal ForceTest Procedure forElectricalConnectors》ANSI/EIA-364-04A-2001(R2009)Accreditedonly formethod A.。

  1. 1、下载文档前请自行甄别文档内容的完整性,平台不提供额外的编辑、内容补充、找答案等附加服务。
  2. 2、"仅部分预览"的文档,不可在线预览部分如存在完整性等问题,可反馈申请退款(可完整预览的文档不适用该条件!)。
  3. 3、如文档侵犯您的权益,请联系客服反馈,我们会尽快为您处理(人工客服工作时间:9:00-18:30)。

1.3.
2.The term g
n 术语g
n
This term is the SI unit for the standard acceleration due to the earth’s gravity, which itself varies with altitude and geographic latitude.
g是国际单位,表示标准的重力加速度,其本身随着高度和地理位置而变化。

4.1.3Resonance 共振
A critical resonant frequency is that frequency at which any point on the
4.1.6.1Amplitude 振幅
The specimens shall be subjected to a simple harmonic motion having an amplitude of either
1.52 mm (0.06 in) double amplitude (maximum total excursion) or 147.1 m/s2 (15
g n) peak,
whichever is less. The tolerance on vibration amplitude shall be ±10%.
样品承受振幅为1.52mm(P-P)或峰值为15g的简谐振动,在两者之间选择振幅较小的一个.振幅
The required maximum constant rates of frequency change for the three bands are therefore 8.55 Hz per minute, 34.2 Hz per minute and 137 Hz per minute, respectively. The minimum times of traverse of the bands are 8.2 min, 10.9 min and 10.9 min, respectively.
The rms value of acceleration within a frequency band between f
Figure 4 - Test condition V, random vibration test-curve envelope (see table 2).
Table 2 - Values for test condition V 1)
Figure 5 - Test condition VI, random vibration test-curve envelope (see table 3).
Table 3 - Values for test-condition VI 1)
Figure 6 - Test condition VII, random vibration test-curve envelope (see table 4)。

相关文档
最新文档