SPEC-USB2.0规范及测试标准

PRODUCT SPECIFICATION SPEC.NO. SPEC-USB 2.0

Approved Date 02-26-2001 Name PRODUCT SPECIFICATION Amended Date 05-29-2003

TYPE

PLUG&RECEPTACLE Page 1 Sum To 8 Pages

A&B

Title USB2.0

１．SCOPE

This specification covers performance, methods and quality requirements for

Universal Serial Bus (USB) plug and receptacle connectors. These connectors

are cable mounted plug and printed circuit board mounted receptacle connectors.

2. REQUIREMENTS

2.1 Design and Construction

Product shall be of the design , construction and physical dimensions specified

The in applicable product drawing.

2.2 Materials and Plating

They are specified on applicable product drawing.

2.3 Ratings

A.Voltage: 30 VAC (rms)

B.Current: 1.5A per contact, not to exceed 30℃ temperature rise

C.Operating temperature: -20℃ to +85℃

D.Storage temperature: -25℃ to +85℃

E.Nominal Temperature Rating: +20℃

2.4 Test Requirements and Procedures Summary

D Amended 05-29-2003Check Director Tab C Amended 10-17-2001

A Approved 02-26-2001

陈永飞

Description Date

Item Change

PRODUCT SPECIFICATION

SPEC.NO. SPEC-USB 2.0Approved Date 02-26-2001 Name

PRODUCT SPECIFICATION

Amended Date

05-29-2003

Title USB2.0 A&B TYPE PLUG&RECEPTACLE Page 2 Sum To 8 Pages

Note:

Shall meet visual requirements ,show no physical damage ,and shall meet requirem

Figure 1 (conn.)

Test Description

Requirement Procedure

Low level contact resistance for Lower and Middle stack 30mΩ maximum initial EIA 364-23 Subject mated contacts assembled in housing to 20 mV maximum open circuit at 100 mA maximum. See figure A

Low level contact resistance for Upper stack 50mΩ maximum initial EIA 364-23 Subject mated contacts assembled in housing to 20 mV maximum open circuit at 100 mA maximum. See figure A

Insulation resistance 1000 MΩ minimum EIA 364 – 21 Test voltage 500±50V/DC between adjacent contacts of mated and unmated connector assemblies.

Dielectric withstanding Voltage No flashover&sparkover&excess leakage&breakdown

EIA 364 – 20 Test voltage 500V/AC between adjacent contacts of mated and unmated connector assemblies.

Vibration , random No discontinuities of 1u s or

Longer duration.

See Note.

EIA 364 – 28A-83 Condition V Test Letter A. Subject mated connectors to 5.35 G's rms. 15 minutes in each of three mutually perpendicular planes ,See Figure B.

Physical shock No discontinuities of 1u s or Longer duration.

See Note. EIA 364 – 27 Condition H. Subject mated connectors to 30 Gs half-sine shock' pulses of 11 ms duration. three shocks in each direction applied along three mutually perpendicular planes ,18 total shocks ,See Figure C first test setup.

Durability Contact Resistance:10 mΩ maximum change from initial value. EIA 364 – 09. 1500cycles insertion/extraction at a maximum rate of 200cycles per hour, then see note. Solderability USB contact solder tails shall pass

95% coverage after one hour steam aging as specified in category 2.

EIA364--52

Cable pull-out Applied a load of 40 Newtons for one minute.

EIA364-38 Test condition A