Bounding Loop Iterations for Timing Analysis

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莱埃尔电子有限公司产品说明:拉瓦雷特时间间隔计数器说明书

莱埃尔电子有限公司产品说明:拉瓦雷特时间间隔计数器说明书

LAUREL ELECTRONICS, INC.Laureate™ Time Interval Meter Resolution to 0.2 µs for time of periodic events. Displays highly accurate rate based on 1 / time.Features•Times periodic events with width from 1 µs to 199.999 s•Display resolution to 0.2 µs•Rep rates to 250 kHz•Inputs from NPN or PNP proximity switches, contact closures, digital logic,magnetic pickups down to 12 mV, or AC inputs up to 250 Vac•Triggers on positive or negative pulse edges•Universal AC power, 85-264 Vac•Isolated 5, 10 or 24 Vdc excitation supply to power sensors•NEMA 4X, 1/8 DIN case•Optional serial I/O: Ethernet, USB, RS232, RS485, Ethernet-to-RS485 converter•Optional relay outputs: dual or quad relays, contact or solid state•Optional isolated analog output: 4-20 mA, 0-20 mA, 0-10V, -10 to +10V•Optional low voltage power: 10-48 Vdc or 12-32 Vac•Optional Extended Timer: features of standard timer plus rate based on 1/time DescriptionThe Laureate A-to-B Time Interval Meter can display pulsewidth or time delay between individual pulses to a resolution of0.2 µs. It can also display average pulse width or average timedelay between multiple pulses.Time interval is measured between inputs on channels A andB. Timing starts when a pulse is applied to Channel A (selectablepositive or negative edge), and ends when a pulse is applied toChannel B (selectable positive or negative edge). In case of asingle pulsed signal, the A and B inputs can be tied together. Apositive or negative slope may be selected to start timing, andthe opposite slope must be selected to stop timing. Timing isachieved by counting 5.5 MHz clock pulses. Multiple integral timeintervals are averaged over a gate time which is selectable from10 ms to 199.99 s and also controls the display update time.Time interval can be displayed in seconds, milliseconds, ormicroseconds with 6-digit resolution. In the typical application,time is displayed in milliseconds with 1 µs resolution. For timesless than 100 ms, display resolution down to 0.2 µs can beachieved by applying a multiplier of 10, moving the decimal pointby one position, and averaging many time intervals.Highly accurate rate can be displayed by taking the inverse oftime. Extensive arithmetic capabilities allow display inengineering units, such as meters/sec. Rate based on timerequires use of the Extended counter main board.The FR dual-channel signal conditioner board accepts inputsfrom proximity switches with PNP or NPN output, TTL or CMOSlogic, magnetic pickups, contact closures, and other signals from12 mV to 250 Vac. Jumper selections provide optimum operationfor different sensor types and noise conditions. A built-in isolated5, 10, or 24 Vdc excitation supply can power proximity switchesand other sensors, and eliminate the need for an external powersupply.Designed for system use. Optional plug-in boards includeEthernet and other serial communication boards, dual or quadrelay boards, and an isolated analog output board. Laureatesmay be powered from 85-264 Vac or optionally from 12-32 Vacor 10-48 Vdc. The display is available with red or green LEDs.The 1/8 DIN case meets NEMA 4X (IP65) specifications from thefront when panel mounted. Any setup functions and front panelkeys can be locked out for simplified usage and security. A built-in isolated 5, 10, or 24 Vdc excitation supply can power trans-ducers and eliminate the need for an external power supply.All power and signal connections are via UL / VDE / CSA ratedscrew clamp plugs.SpecificationsDisplayReadoutRangeIndicators6 LED digits, 7-segment, 14.2 mm (.56"), red or green-999999 to +999999Four LED lampsInputsTypes Grounding Minimum Signal Maximum Signal Noise Filter Contact Debounce AC, pulses from NPN, PNP transistors, contact closures, magnetic pickups. Common ground for channels A & BNine ranges from (-12 to +12 mV) to (+1.25 to +2.1V).250 Vac1 MHz, 30 kHz, 250 Hz (selectable)0, 3, 50 ms (selectable)Time Interval ModeTiming StartTiming StopPeriodic Timing Interval Gate TimeTime Before Zero Output Channel A pulse, + or - edges Channel B pulse, + or - edgesGate time + 30 ms + 0-2 time intervals Selectable 10 ms to 199.99 s Selectable 10 ms to 199.99 sResolution0 - 199.999 s 0 - 99.9999 s 0 - 9.99999 s 0 - .999999 s 0 - .099999 s 1 ms 100µs 10 µs 1 µs 0.2 µsAccuracyTime Base Span Tempco Long-term Drift Crystal calibrated to ±2 ppm ±1 ppm/°C (typ)±5 ppm/yearPowerVoltage, standard Voltage, optional Power frequency Power consumption (typical, base meter) Power isolation 85-264 Vac or 90-300 Vdc12-32 Vac or 10-48 VdcDC or 47-63 Hz1.2W @ 120 Vac, 1.5W @ 240 Vac, 1.3W @ 10 Vdc, 1.4W @ 20 Vdc, 1.55W @ 30 Vdc, 1.8W @ 40 Vdc,2.15W @ 48 Vdc250V rms working, 2.3 kV rms per 1 min testExcitation Output (standard)5 Vdc10 Vdc24 VdcOutput Isolation 5 Vdc ± 5%, 100 mA 10 Vdc ± 5%, 120 mA 24 Vdc ± 5%, 50 mA 50 Vdc to meter groundAnalog Output (optional)Output Levels Current compliance Voltage compliance Scaling Resolution Isolation 4-20 mA, 0-20 mA, 0-10V, -10 to +10V (single-output option) 4-20 mA, 0-20 mA, 0-10V (dual-output option)2 mA at 10V ( > 5 kΩ load)12V at 20 mA ( < 600Ω load)Zero and full scale adjustable from -99999 to +9999916 bits (0.0015% of full scale)250V rms working, 2.3 kV rms per 1 min test(dual analog outputs share the same ground)Relay Outputs (optional)Relay Types Current Ratings Output common Isolation 2 Form C contact relays or 4 Form A contact relays (NO)2 or 4 Form A, AC/DC solid state relays (NO)8A at 250 Vac or 24 Vdc for contact relays120 mA at 140 Vac or 180 Vdc for solid state relays Isolated commons for dual relays or each pair of quad relays 250V rms working, 2.3 kV rms per 1 min testSerial Data I/O (optional)Board SelectionsProtocols Data RatesDigital Addresses Isolation Ethernet, Ethernet-to-RS485 server, USB, USB-to-RS485 server, RS485 (dual RJ11), RS485 Modbus (dual RJ45), RS232 Modbus RTU, Modbus ASCII, Laurel ASCII protocol 300 to 19200 baud247 (Modbus), 31 (Laurel ASCII),250V rms working, 2.3 kV rms per 1 min testEnvironmental Operating Temperature Storage Temperature Relative Humidity Protection0°C to 55°C -40°C to 85°C95% at 40°C, non-condensingNEMA-4X (IP-65) when panel mountedElectrical ConnectionsMechanicalApplication ExamplesTime Interval Mode for Time DelayFor periodic pulses applied to A and B channels, time delays can be measured down to 0.2 µs resolution from the rising or falling edge of A to the rising or falling edge of B (selectable). Time Interval Mode for Pulse WidthThe width of periodic pulses (t1 or t2) can be measured by tying the A and B channels together. As for time delay, readings are averaged over a user-selectable gate time. Timing Process DynamicsThe start and stop pulses used for timing can be generated by the dual relay board in a Laureate panel meter or digital counter. For instance, the start and stop pulse edges can be created as temperature passes two alarm setpoints, or temperature cycles in a hysteresis control mode. Rate Based on 1 / TimeThe start and stop pulses used for timing can be generated by the dual relay board in a Laureate panel meter or digital counter. For instance, the start and stop pulse edges can be created as temperature passes two alarm setpoints, or temperature cycles in a hysteresis control mode.Replacing an Oscilloscope with a Laureate Time Interval MeterAn oscilloscope is great for viewing and timing pulses in a lab. However, in fixed installations where digital timing accuracy and control outputs are required, a low-cost Laureate time interval meter will be the instrument of choice. Resolution to 0.2 µs is feasible.Instrumenting a Pulsed Laser SystemSome of the many possibilities in instrumenting a pulsed laser system with Laureate dual-channelcounters: elapsed time, number of pulses, pulse width, pulse separation, duty cycle, and pulse rep rate.Ordering GuideCreate a model number in this format: L50000FR, IPCMain Board L5 Standard Main Board, Green LEDsL6 Standard Main Board, Red LEDsL7 Extended Main Board, Green LEDsL8 Extended Main Board, Red LEDsNote: Use of the Extended Main Board makes this counter also suitable for A-B time interval,frequency, rate, period, square root of rate, up or down total, arithmetic functions, simultaneousrate and total, phase, duty cycle, batching, and custom curve linearization.Power0 Isolated 85-264 Vac1 Isolated 12-32 Vac or 10-48 VdcRelay Output (isolated) 0 None1 Two 8A Contact Relays2 Two 120 mA Solid State Relays3 Four 8A Contact Relays4 Four 120 mA Solid State RelaysAnalog Output (isolated) 0 None1 Single isolated 4-20 mA, 0-20 mA, 0-10V, -10 to +10V2 Dual isolated 4-20 mA, 0-20 mA, 0-10VDigital Interface (isolated) 0 None1 RS2322 RS485 (dual RJ11 connectors)4 RS485 Modbus (dual RJ45 connectors)5 USB6 USB-to-RS485 converter7 Ethernet8 Ethernet-to-RS485 converterInput Type FR Dual-Channel Pulse Input Signal ConditionerAdd-on Options CBL01RJ11-to-DB9 cable. RJ11 to DB9. Connects RS232 ports of meter and PC.CBL02USB-to-DB9 adapter cable. Combination of CBL02 and CBL01 connects meter RS232port to PC USB port.CBL03-16-wire data cable, RJ11 to RJ11, 1 ft. Used to daisy chain meters via RS485.CBL03-76-wire data cable, RJ11 to RJ11, 7 ft. Used to daisy chain meters via RS485.CBL05USB cable, A-B. Connects USB ports of meter and PC.CBL06USB to RS485 adapter cable, half duplex, RJ11 to USB. Connects meter RS485 portto PC USB port.CASE1Benchtop laboratory case for one 1/8 DIN meterCASE2Benchtop laboratory case for two 1/8 DIN metersIPC Splash-proof coverBOX1NEMA-4 EnclosureBOX2NEMA-4 enclosure plus IPCBL Blank Lens without button padsNL Meter lens without button pads or Laurel logo。

锁相环外文翻译

锁相环外文翻译

外文资料Phase-locked loop Technology :A phase-locked loop or phase lock loop (PLL) is a control system that generates a signal that has a fixed relation to the phase of a "reference" signal. A phase-locked loop circuit responds to both the frequency and the phase of the input signals, automatically raising or lowering the frequency of a controlled oscillator until it is matched to the reference in both frequency and phase. A phase-locked loop is an example of a control system using negative feedback. In the order of the PLL is the way of made the frequency stability in the send up wireless,include VCO and PLL integrated circuits,VCO send up a signal,some of the signal is output,and the other through the frequency division with PLL integrated circuits generate the local signal making compared.In the order to remain the same,it’s must be remain the phase displacement same.If the phase displacement have some changes,the output of the PLL integrated circuits have some changes too,to controlle VCO until phase diffe rence to restore,make both cotrolled oscillator’s frequency and phase with input signal which is close-loop electronic circuit keep firm relationship.Phase-locked loops are widely used in radio, telecommunications, computers and other electronic applications. They may generate stable frequencies, recover a signal from a noisy communication channel, or distribute clock timing pulses in digital logic designs such as microprocessors. Since a single integrated circuit can provide a complete phase-locked-loop building block, the technique is widely used in modern electronic devices, with output frequencies from a fraction of a cycle per second up to many gigahertz.Earliest research towards what became known as the phase-locked loop goes back to 1932, when British researchers developed an alternative to Edwin Armstrong's superheterodyne receiver, the Homodyne. In the homodyne or synchrodyne system, a local oscillator was tuned to the desired input frequency and multiplied with the input signal. The resulting output signal included the original audio modulation information.The intent was to develop an alternative receiver circuit that required fewer tuned circuits than the superheterodyne receiver. Since the local oscillator would rapidly drift in frequency, an automatic correction signal was applied to the oscillator, maintaining it in the same phase and frequency as the desired signal. The technique was described in 1932, in a paper by H.de Bellescise, in the French journal Onde Electrique.In analog television receivers since at least the late 1930s, phase-locked-loop horizontal and vertical sweep circuits are locked to synchronization pulses in the broadcast signal. When Signetics introduced a line of monolithic integrated circuits that were complete phase-locked loop systems on a chip in 1969, applications for the technique multiplied. A few years later RCA introduced the "CD4046" CMOS Micropower Phase-Locked Loop, which became a popular integrated circuit. Applications:Phase-locked loops are widely used for synchronization purposes; in space communications for coherent carrier tracking and threshold extension, bit synchronization, and symbol synchronization. Phase-locked loops can also be used to demodulate frequency-modulated signals. In radio transmitters, a PLL is used to synthesize new frequencies which are a multiple of a reference frequency, with the same stability as the reference frequency.Clock recovery :Some data streams, especially high-speed serial data streams (such as the raw stream of data from the magnetic head of a disk drive), are sent without an accompanying clock. The receiver generates a clock from an approximate frequency reference, and then phase-aligns to the transitions in the data stream with a PLL. This process is referred to as clock recovery. In order for this scheme to work, the data stream must have a transition frequently enough to correct any drift in the PLL's oscillator. Typically, some sort of redundant encoding is used; 8B10B is very common.Deskewing :If a clock is sent in parallel with data, that clock can be used to sample the data.Because the clock must be received and amplified before it can drive the flip-flops which sample the data, there will be a finite, and process-, temperature-, and voltage-dependent delay between the detected clock edge and the received data window. This delay limits the frequency at which data can be sent. One way of eliminating this delay is to include a deskew PLL on the receive side, so that the clock at each data flip-flop is phase-matched to the received clock. In that type of application, a special form of a PLL called a Delay-Locked Loop (DLL) is frequently used.Clock generation:Many electronic systems include processors of various sorts that operate at hundreds of megahertz. Typically, the clocks supplied to these processors come from clock generator PLLs, which multiply a lower-frequency reference clock (usually 50 or 100 MHz) up to the operating frequency of the processor. The multiplication factor can be quite large in cases where the operating frequency is multiple gigahertz and the reference crystal is just tens or hundreds of megahertz.Spread spectrum:All electronic systems emit some unwanted radio frequency energy. Various regulatory agencies (such as the FCC in the United States) put limits on the emitted energy and any interference caused by it. The emitted noise generally appears at sharp spectral peaks (usually at the operating frequency of the device, and a few harmonics).A system designer can use a spread-spectrum PLL to reduce interference with high-Q receivers by spreading the energy over a larger portion of the spectrum. For example, by changing the operating frequency up and down by a small amount (about 1%), a device running at hundreds of megahertz can spread its interference evenly over a few megahertz of spectrum, which drastically reduces the amount of noise seen by FM receivers which have a bandwidth of tens of kilohertz.中文翻译锁相环技术:锁相环或锁相回路(PLL)是一个信号控制系统,即用来锁定一系列的“参考”信号。

信号与系统常用词汇中英文对照表

信号与系统常用词汇中英文对照表

信号与系统常用词汇中英文对照表序号英文词汇中文翻译1 Absolutely summable impulse response 绝对可和的冲激响应2 Absolutely integrable impulse response 绝对积的冲激响应3 Accumulation property 累加性质4 Adder 加法器5 Additivity 可加性6 Aliasing 混叠7 Allpass system 全通系统8 Amplitude Modulation(AM) 幅度调制9 Amplifier 放大器10 Analog-to-Digital Conversion 模数转换11 Analysis equation 分析方程12 Aperiodic signal 非周期性信号13 Associative property 结合性质14 Audio system 音频系统15 Autocorrelation function 自相关函数16 Band-limited signal 带限信号17 Band-limited interpolation 带限内插18 Bandpass filter 带通滤波器19 Bandpass-sampling technique 带通抽样方法20 Bandpass signal 带通信号21 Bandwidth of an LTI system 线性时不变系统的带宽22 Bilinear transformation 双线性变换23 Block diagram 方框图24 Bode plot 波特图25 Butterworth filter 巴特沃斯滤波器26 Carrier frequency 载波频率27 Carrier signal 载波信号28 Cartesian (rectangular) form for complex number 复数的笛卡尔(直角坐标)形式29 Cascade-form block diagram 级联型方框图30 Cascade (series) interconnection 级联连接31 Causal LTI system 因果的线性时不变系统32 Channel equalization 信道均衡33 """Chirp"" transform algorithm" 线性调频变换算法34 Closed-loop system 闭环系统35 Coefficient multiplier 系数乘法器36 Communication system 通信系统37 Commutative property 交换性质38 Complex conjugate 复共轭39 Complex exponential 复指数40 Complex number 复数41 Continuous-time signal 连续时间信号42 Conjugate symmetry 共轭对称性43 Conjugation property 共轭性质44 Continuous-time Fourier series 连续时间傅里叶级数45 Continuous-time Fourier transform 连续时间傅里叶变换46 Continuous-time system 连续时间系统47 Convolution integral 卷积积分48 Convolution sum 卷积和49 Correlation function 相关函数50 Cross-correlation function 互相关函数51 Cutoff frequency 截止频率52 Digital signal 数字信号53 Demodulation 解调54 Discrete-time 离散时间55 Discrete-time Fourier series 离散傅里叶级数56 Distributive property 分配性质57 Damped sinusoid 阻尼正弦波58 Damping ratio 阻尼比59 DC offset 直流偏置60 Decibel (dB) 分贝61 Delay 延迟62 Delay time 延时63 Difference 差分64 Discrete-time Fourier series 离散时间傅里叶级数65 Discrete-time Fourier transform 离散时间傅里叶变换66 Differential equation 微分方程67 Differentiation 微分68 Digital-to-Analog converter 数模转换器69 Direct FormⅠrealization 直接Ⅰ型实现70 Direct FormⅡrealization 直接Ⅱ型实现71 Dirichlet conditions 狄里赫利条件72 Discontinuity 不连续73 Discrete-time Modulation 离散时间调制74 Discrete-time signal 离散时间信号75 Decimation 抽取76 Discrete-time system 离散时间系统77 Distortion 失真78 Distributive property 分配性质79 Double-sideband modulation 双边带调制80 Downsampling 降率抽样81 Duality 对偶性82 Eigenfunction 特征函数83 Eigenvalue 特征值84 Elliptic filter 椭圆滤波器85 Energy-density spectrum 能量密度谱86 Envelope 包络线87 Equalization 均衡88 Euler's relation 欧拉关系89 Exponential 指数函数90 Fast Fourier Transform (FFT) 快速傅里叶变换91 Feedback 反馈92 Feedback interconnection 反馈互联93 Filter 滤波器94 Finite Impulse Response (FIR) 有限冲激响应95 Forward path 前向通路96 Frequency-selective 频率选择97 Frequency-shaping 频率整形98 Final-value theorem 终值定理99 Finite-duration signal 有限持续时间信号,100 First harmonic component 一次谐波分量101 First-order continuous-time system 一阶连续时间系统102 First-order discrete-time system 一阶离散时间系统103 Forced response 强迫响应104 Frequency-Division Multiplexing (FDM) 频分复用105 Frequency response 频率响应106 Frequency scaling 频率尺度变换107 Frequency shifting property 频移性质108 Fundamental frequency 基本频率109 Fundamental period 基本周期110 Gain 增益111 General complex exponential 普通的复指数函数112 Generalized function 广义函数113 Gibbs phenomenon 吉布斯现象114 Group delay 群延时115 Hanning window 汉宁窗116 Harmonic analyzer 谐波分析器117 Harmonic component 谐波分量118 Highpass filter 高通滤波器119 Hilbert transform 希尔伯特变换120 Ideal frequency-selective filter 理想频率选择滤波器121 Image processing 图像处理122 Imaginary part 虚部123 Impulse response 冲激响应124 Impulse train 冲激串125 Impulse-train sampling 冲激串抽样126 Incrementally linear system 增量线性系统127 Independent variable 独立变量,自变量128 Infinite Impulse Response (IIR) 无限冲激响应129 Initial-value theorem 初值定理130 Instantaneous frequency 瞬时频率131 Integral 积分132 Integration property 积分性质133 Integrator 积分器134 Interconnection 互联135 Linear Time Invariant (LTI) system 线性时不变系统136 Interpolation 内插137 Inverse Fourier transform 逆傅里叶变换138 Inverse Laplace transform 逆拉普拉斯变换139 Inverse system 逆系统140 Inverse z-transform 逆z变换141 Laplace transform 拉普拉斯变换142 Left-half plane 左半平面143 Left-sided signal 左边信号144 Linear constant-coefficient differential equation 线性常系数微分方程145 Linear constant-coefficient difference equation 线性常系数差分方程146 Finite Impulse Response (FIR) 有限冲激响应147 Linear feedback system 线性反馈系统148 Linear interpolation 线性内插149 Linearity 线性150 Lowpass filter 低通滤波器151 Lowpass-to-highpass transformation 低通到高通的转换152 Magnitude of complex number 复数的幅值153 Matched filter 匹配滤波器154 Memoryless system 无记忆系统155 Modulating signal 调制信号156 Modulation 调制157 Modulation index 调制指数158 Modulation property 调制性质159 Multiplexing 多路复用160 Multiplication 乘法161 Natural frequency 自然频率162 Natural response 自然响应163 Negative feedback 负反馈164 Network 网络165 Noncausal system 非因果系统166 Nonideal filter 非理想滤波器167 Nonrecursive filter 非递归滤波器168 Normalized function 归一化函数169 Nyquist frequency 奈奎斯特频率170 Nyquist rate 奈奎斯特速率171 Operational amplifier 运算放大器172 Orthogonal function 正交函数173 Orthogonal signal 正交信号174 Oversampling 过抽样175 Parallel interconnection 并联连接176 Parseval's relation 帕塞瓦尔关系177 Partial-fraction expansion 部分分式展开178 Passband frequency 通带频率179 Passband ripple 通带纹波180 Periodic complex exponential 周期性复指数181 Periodic convolution 周期卷积182 Periodic signal 周期信号183 Power 功率184 Periodic square wave 周期性方波185 Periodic train of impulses 周期性冲激串186 Phase lag 相位滞后187 Phase lead 相位超前188 Phase modulation 相位调制189 Phase shift 相移190 Polar form for complex number 复数的极坐标形式191 Pole 极点192 Pole-zero plot 零极点图193 Power of signal 信号的功率194 Power-series expansion method 幂级数展开法195 Principal-phase function 主值相位函数196 Proportional feedback system 比例反馈系统197 Real part 实部198 Rectangular pulse 矩形脉冲199 Rectangular window 矩形窗200 Recursive filter 递归滤波器201 Region of Convergence (ROC) 收敛域202 Rational function 有理函数203 Right-sided signal 右边信号204 Right-sided sequence 右边序列205 Right-half plane 右半平面206 Rise time 上升时间207 Root-locus analysis 根轨迹分析法208 Running sum 流动和209 Sampled-data feedback system 抽样数据反馈系统210 Sampling frequency 抽样频率211 Sampling function 抽样函数212 Sampling period 抽样周期213 Sampling theorem 抽样定理214 Scaling (homogeneity) property 比例(齐次)性215 Scaling in the z-domain Z域尺度变换216 Second harmonic component 二次谐波分量217 Second-order system 二阶连续时间系统218 Series (cascade) interconnection 串联(级联)连接219 Sifting property 筛选性质220 shifting property in the s-domain s域移位性质221 Single-sideband sinusoidal amplitude modulation 单边带正弦幅度调制222 Singularity function 奇异函数223 Synchronous 同步的224 Sinusoidal frequency modulation 正弦频率调制225 Sinusoidal signal 正弦信号226 Sliding 滑动227 Square wave 方波228 Step-invariant transformation阶跃响应不变变换法229 Step response 阶跃响应230 Stopband edge 阻带边缘231 Stopband frequency 阻带频率232 Stopband ripple 阻带纹波233 Sufficiency 充分性234 Summer 加法器235 Superposition property 叠加性质236 Symmetry 对称性237 Synthesis equation 综合方程238 System function 系统函数239 Stability 稳定性240 Taylor series 泰勒级数241 Time constant 时间常数242 Time delay 时延243 Time-Division Multiplexing (TDM) 时分复用244 Time-domain 时域的245 Time reversal property 时间翻转性质246 Time scaling 时间尺度变换247 Time shifting property 时移性质248 Time window 时间窗249 Transition band 过渡带250 Triangular window 三角窗251 Trigonometric series 三角级数252 Undamped natural frequency 无阻尼自然频率253 Undamped system 无阻尼系统254 Underdamped system 欠阻尼系统255 Unilateral Laplace transform 单边拉普拉斯变换256 Unilateral z transform 单边Z变换257 Unit circle 单位圆258 Unit delay 单位延时259 Unit doublet 单位冲激偶260 Unit impulse 单位冲激261 Unit impulse response 单位冲激响应262 Upsampling 升率抽样263 Variable 变量264 Vestigial sideband modulation 残留边带调制265 Voltage 电压266 Wideband 宽带267 Window function 窗函数268 Windowing 加窗269 Wireless 无线的270 Weighted average 加权平均271 Wavelength 波长272 Zero-input response 零输入响应273 Zero-state response 零状态响应274 Zero location 零点位置275 Zero-order hold 零阶保持器。

IEEE Std 1159-1995,IEEE Recommended Practice for Monitoring Electric Power Quality

IEEE Std 1159-1995,IEEE Recommended Practice for Monitoring Electric Power Quality

IEEE Std 1159-1995 IEEE Recommended Practice for Monitoring Electric Power QualitySponsorIEEE Standards Coordinating Committee 22 onPower QualityApproved June 14, 1995IEEE Standards BoardAbstract: The monitoring of electric power quality of ac power systems, definitions of power quality terminology, impact of poor power quality on utility and customer equipment, and the measurement of electromagnetic phenomena are covered.Keywords: data interpretation, electric power quality, electromagnetic phenomena, monitoring, power quality definitionsIEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily members of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that have expressed an interest in partici-pating in the development of the standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, mar-ket, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and com-ments received from users of the standard. Every IEEE Standard is subjected to review at least every Þve years for revision or reafÞrmation. When a document is more than Þve years old and has not been reafÞrmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reßect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership afÞliation with IEEE. Suggestions for changes in docu-ments should be in the form of a proposed change of text, together with appropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to speciÞc applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appro-priate responses. Since IEEE Standards represent a consensus of all concerned inter-ests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason IEEE and the members of its technical com-mittees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAIntroduction(This introduction is not part of IEEE Std 1159-1995, IEEE Recommended Practice for Monitoring Electric Power Quality.)This recommended practice was developed out of an increasing awareness of the difÞculty in comparing results obtained by researchers using different instruments when seeking to characterize the quality of low-voltage power systems. One of the initial goals was to promote more uniformity in the basic algorithms and data reduction methods applied by different instrument manufacturers. This proved difÞcult and was not achieved, given the free market principles under which manufacturers design and market their products. However, consensus was achieved on the contents of this recommended practice, which provides guidance to users of monitoring instruments so that some degree of comparisons might be possible.An important Þrst step was to compile a list of power quality related deÞnitions to ensure that contributing parties would at least speak the same language, and to provide instrument manufacturers with a common base for identifying power quality phenomena. From that starting point, a review of the objectives of moni-toring provides the necessary perspective, leading to a better understanding of the means of monitoringÑthe instruments. The operating principles and the application techniques of the monitoring instruments are described, together with the concerns about interpretation of the monitoring results. Supporting information is provided in a bibliography, and informative annexes address calibration issues.The Working Group on Monitoring Electric Power Quality, which undertook the development of this recom-mended practice, had the following membership:J. Charles Smith, Chair Gil Hensley, SecretaryLarry Ray, Technical EditorMark Andresen Thomas Key John RobertsVladi Basch Jack King Anthony St. JohnRoger Bergeron David Kreiss Marek SamotyjJohn Burnett Fran•ois Martzloff Ron SmithJohn Dalton Alex McEachern Bill StuntzAndrew Dettloff Bill Moncrief John SullivanDave GrifÞth Allen Morinec David VannoyThomas Gruzs Ram Mukherji Marek WaclawlakErich Gunther Richard Nailen Daniel WardMark Kempker David Pileggi Steve WhisenantHarry RauworthIn addition to the working group members, the following people contributed their knowledge and experience to this document:Ed Cantwell Christy Herig Tejindar SinghJohn Curlett Allan Ludbrook Maurice TetreaultHarshad MehtaiiiThe following persons were on the balloting committee:James J. Burke David Kreiss Jacob A. RoizDavid A. Dini Michael Z. Lowenstein Marek SamotyjW. Mack Grady Fran•ois D. Martzloff Ralph M. ShowersDavid P. Hartmann Stephen McCluer J. C. SmithMichael Higgins A. McEachern Robert L. SmithThomas S. Key W. A. Moncrief Daniel J. WardJoseph L. KoepÞnger P. Richman Charles H. WilliamsJohn M. RobertsWhen the IEEE Standards Board approved this standard on June 14, 1995, it had the following membership:E. G. ÒAlÓ Kiener, Chair Donald C. Loughry,Vice ChairAndrew G. Salem,SecretaryGilles A. Baril Richard J. Holleman Marco W. MigliaroClyde R. Camp Jim Isaak Mary Lou PadgettJoseph A. Cannatelli Ben C. Johnson John W. PopeStephen L. Diamond Sonny Kasturi Arthur K. ReillyHarold E. Epstein Lorraine C. Kevra Gary S. RobinsonDonald C. Fleckenstein Ivor N. Knight Ingo RuschJay Forster*Joseph L. KoepÞnger*Chee Kiow TanDonald N. Heirman D. N. ÒJimÓ Logothetis Leonard L. TrippL. Bruce McClung*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. AggarwalRichard B. EngelmanRobert E. HebnerChester C. TaylorRochelle L. SternIEEE Standards Project EditorivContentsCLAUSE PAGE 1.Overview (1)1.1Scope (1)1.2Purpose (2)2.References (2)3.Definitions (2)3.1Terms used in this recommended practice (2)3.2Avoided terms (7)3.3Abbreviations and acronyms (8)4.Power quality phenomena (9)4.1Introduction (9)4.2Electromagnetic compatibility (9)4.3General classification of phenomena (9)4.4Detailed descriptions of phenomena (11)5.Monitoring objectives (24)5.1Introduction (24)5.2Need for monitoring power quality (25)5.3Equipment tolerances and effects of disturbances on equipment (25)5.4Equipment types (25)5.5Effect on equipment by phenomena type (26)6.Measurement instruments (29)6.1Introduction (29)6.2AC voltage measurements (29)6.3AC current measurements (30)6.4Voltage and current considerations (30)6.5Monitoring instruments (31)6.6Instrument power (34)7.Application techniques (35)7.1Safety (35)7.2Monitoring location (38)7.3Equipment connection (41)7.4Monitoring thresholds (43)7.5Monitoring period (46)8.Interpreting power monitoring results (47)8.1Introduction (47)8.2Interpreting data summaries (48)8.3Critical data extraction (49)8.4Interpreting critical events (51)8.5Verifying data interpretation (59)vANNEXES PAGE Annex A Calibration and self testing (informative) (60)A.1Introduction (60)A.2Calibration issues (61)Annex B Bibliography (informative) (63)B.1Definitions and general (63)B.2Susceptibility and symptomsÑvoltage disturbances and harmonics (65)B.3Solutions (65)B.4Existing power quality standards (67)viIEEE Recommended Practice for Monitoring Electric Power Quality1. Overview1.1 ScopeThis recommended practice encompasses the monitoring of electric power quality of single-phase and polyphase ac power systems. As such, it includes consistent descriptions of electromagnetic phenomena occurring on power systems. The document also presents deÞnitions of nominal conditions and of deviations from these nominal conditions, which may originate within the source of supply or load equipment, or from interactions between the source and the load.Brief, generic descriptions of load susceptibility to deviations from nominal conditions are presented to identify which deviations may be of interest. Also, this document presents recommendations for measure-ment techniques, application techniques, and interpretation of monitoring results so that comparable results from monitoring surveys performed with different instruments can be correlated.While there is no implied limitation on the voltage rating of the power system being monitored, signal inputs to the instruments are limited to 1000 Vac rms or less. The frequency ratings of the ac power systems being monitored are in the range of 45Ð450 Hz.Although it is recognized that the instruments may also be used for monitoring dc supply systems or data transmission systems, details of application to these special cases are under consideration and are not included in the scope. It is also recognized that the instruments may perform monitoring functions for envi-ronmental conditions (temperature, humidity, high frequency electromagnetic radiation); however, the scope of this document is limited to conducted electrical parameters derived from voltage or current measure-ments, or both.Finally, the deÞnitions are solely intended to characterize common electromagnetic phenomena to facilitate communication between various sectors of the power quality community. The deÞnitions of electromagnetic phenomena summarized in table 2 are not intended to represent performance standards or equipment toler-ances. Suppliers of electricity may utilize different thresholds for voltage supply, for example, than the ±10% that deÞnes conditions of overvoltage or undervoltage in table 2. Further, sensitive equipment may mal-function due to electromagnetic phenomena not outside the thresholds of the table 2 criteria.1IEEEStd 1159-1995IEEE RECOMMENDED PRACTICE FOR 1.2 PurposeThe purpose of this recommended practice is to direct users in the proper monitoring and data interpretation of electromagnetic phenomena that cause power quality problems. It deÞnes power quality phenomena in order to facilitate communication within the power quality community. This document also forms the con-sensus opinion about safe and acceptable methods for monitoring electric power systems and interpreting the results. It further offers a tutorial on power system disturbances and their common causes.2. ReferencesThis recommended practice shall be used in conjunction with the following publications. When the follow-ing standards are superseded by an approved revision, the revision shall apply.IEC 1000-2-1 (1990), Electromagnetic Compatibility (EMC)ÑPart 2 Environment. Section 1: Description of the environmentÑelectromagnetic environment for low-frequency conducted disturbances and signaling in public power supply systems.1IEC 50(161)(1990), International Electrotechnical V ocabularyÑChapter 161: Electromagnetic Compatibility. IEEE Std 100-1992, IEEE Standard Dictionary of Electrical and Electronic Terms (ANSI).2IEEE Std 1100-1992, IEEE Recommended Practice for Powering and Grounding Sensitive Electronic Equipment (Emerald Book) (ANSI).3. DeÞnitionsThe purpose of this clause is to present concise deÞnitions of words that convey the basic concepts of power quality monitoring. These terms are listed below and are expanded in clause 4. The power quality commu-nity is also pervaded by terms that have no scientiÞc deÞnition. A partial listing of these words is included in 3.2; use of these terms in the power quality community is discouraged. Abbreviations and acronyms that are employed throughout this recommended practice are listed in 3.3.3.1 Terms used in this recommended practiceThe primary sources for terms used are IEEE Std 100-19923 indicated by (a), and IEC 50 (161)(1990) indi-cated by (b). Secondary sources are IEEE Std 1100-1992 indicated by (c), IEC-1000-2-1 (1990) indicated by (d) and UIE -DWG-3-92-G [B16]4. Some referenced deÞnitions have been adapted and modiÞed in order to apply to the context of this recommended practice.3.1.1 accuracy: The freedom from error of a measurement. Generally expressed (perhaps erroneously) as percent inaccuracy. Instrument accuracy is expressed in terms of its uncertaintyÑthe degree of deviation from a known value. An instrument with an uncertainty of 0.1% is 99.9% accurate. At higher accuracy lev-els, uncertainty is typically expressed in parts per million (ppm) rather than as a percentage.1IEC publications are available from IEC Sales Department, Case Postale 131, 3, rue de VarembŽ, CH-1211, Gen•ve 20, Switzerland/ Suisse. IEC publications are also available in the United States from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA.2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA.3Information on references can be found in clause 2.4The numbers in brackets correspond to those bibliographical items listed in annex B.2IEEE MONITORING ELECTRIC POWER QUALITY Std 1159-1995 3.1.2 accuracy ratio: The ratio of an instrumentÕs tolerable error to the uncertainty of the standard used to calibrate it.3.1.3 calibration: Any process used to verify the integrity of a measurement. The process involves compar-ing a measuring instrument to a well defined standard of greater accuracy (a calibrator) to detect any varia-tions from specified performance parameters, and making any needed compensations. The results are then recorded and filed to establish the integrity of the calibrated instrument.3.1.4 common mode voltage: A voltage that appears between current-carrying conductors and ground.b The noise voltage that appears equally and in phase from each current-carrying conductor to ground.c3.1.5 commercial power: Electrical power furnished by the electric power utility company.c3.1.6 coupling: Circuit element or elements, or network, that may be considered common to the input mesh and the output mesh and through which energy may be transferred from one to the other.a3.1.7 current transformer (CT): An instrument transformer intended to have its primary winding con-nected in series with the conductor carrying the current to be measured or controlled.a3.1.8 dip: See: sag.3.1.9 dropout: A loss of equipment operation (discrete data signals) due to noise, sag, or interruption.c3.1.10 dropout voltage: The voltage at which a device fails to operate.c3.1.11 electromagnetic compatibility: The ability of a device, equipment, or system to function satisfacto-rily in its electromagnetic environment without introducing intolerable electromagnetic disturbances to any-thing in that environment.b3.1.12 electromagnetic disturbance: Any electromagnetic phenomena that may degrade the performance of a device, equipment, or system, or adversely affect living or inert matter.b3.1.13 electromagnetic environment: The totality of electromagnetic phenomena existing at a given location.b3.1.14 electromagnetic susceptibility: The inability of a device, equipment, or system to perform without degradation in the presence of an electromagnetic disturbance.NOTEÑSusceptibility is a lack of immunity.b3.1.15 equipment grounding conductor: The conductor used to connect the noncurrent-carrying parts of conduits, raceways, and equipment enclosures to the grounded conductor (neutral) and the grounding elec-trode at the service equipment (main panel) or secondary of a separately derived system (e.g., isolation transformer). See Section 100 in ANSI/NFPA 70-1993 [B2].3.1.16 failure mode: The effect by which failure is observed.a3.1.17 ßicker: Impression of unsteadiness of visual sensation induced by a light stimulus whose luminance or spectral distribution fluctuates with time.b3.1.18 frequency deviation: An increase or decrease in the power frequency. The duration of a frequency deviation can be from several cycles to several hours.c Syn.: power frequency variation.3.1.19 fundamental (component): The component of an order 1 (50 or 60 Hz) of the Fourier series of a periodic quantity.b3IEEEStd 1159-1995IEEE RECOMMENDED PRACTICE FOR 3.1.20 ground: A conducting connection, whether intentional or accidental, by which an electric circuit or piece of equipment is connected to the earth, or to some conducting body of relatively large extent that serves in place of the earth.NOTEÑ It is used for establishing and maintaining the potential of the earth (or of the conducting body) or approxi-mately that potential, on conductors connected to it, and for conducting ground currents to and from earth (or the con-ducting body).a3.1.21 ground loop: In a radial grounding system, an undesired conducting path between two conductive bodies that are already connected to a common (single-point) ground.3.1.22 harmonic (component): A component of order greater than one of the Fourier series of a periodic quantity.b3.1.23 harmonic content: The quantity obtained by subtracting the fundamental component from an alter-nating quantity.a3.1.24 immunity (to a disturbance): The ability of a device, equipment, or system to perform without deg-radation in the presence of an electromagnetic disturbance.b3.1.25 impulse: A pulse that, for a given application, approximates a unit pulse.b When used in relation to the monitoring of power quality, it is preferred to use the term impulsive transient in place of impulse.3.1.26 impulsive transient: A sudden nonpower frequency change in the steady-state condition of voltage or current that is unidirectional in polarity (primarily either positive or negative).3.1.27 instantaneous: A time range from 0.5Ð30 cycles of the power frequency when used to quantify the duration of a short duration variation as a modifier.3.1.28 interharmonic (component): A frequency component of a periodic quantity that is not an integer multiple of the frequency at which the supply system is designed to operate operating (e.g., 50 Hz or 60 Hz).3.1.29 interruption, momentary (power quality monitoring): A type of short duration variation. The complete loss of voltage (< 0.1 pu) on one or more phase conductors for a time period between 0.5 cycles and 3 s.3.1.30 interruption, sustained (electric power systems): Any interruption not classified as a momentary interruption.3.1.31 interruption, temporary (power quality monitoring):A type of short duration variation. The com-plete loss of voltage (< 0.1 pu) on one or more phase conductors for a time period between 3 s and 1 min.3.1.32 isolated ground: An insulated equipment grounding conductor run in the same conduit or raceway as the supply conductors. This conductor may be insulated from the metallic raceway and all ground points throughout its length. It originates at an isolated ground-type receptacle or equipment input terminal block and terminates at the point where neutral and ground are bonded at the power source. See Section 250-74, Exception #4 and Exception in Section 250-75 in ANSI/NFPA 70-1993 [B2].3.1.33 isolation: Separation of one section of a system from undesired influences of other sections.c3.1.34 long duration voltage variation:See: voltage variation, long duration.3.1.35 momentary (power quality monitoring): A time range at the power frequency from 30 cycles to 3 s when used to quantify the duration of a short duration variation as a modifier.4IEEE MONITORING ELECTRIC POWER QUALITY Std 1159-1995 3.1.36 momentary interruption:See: interruption, momentary.3.1.37 noise: Unwanted electrical signals which produce undesirable effects in the circuits of the control systems in which they occur.a (For this document, control systems is intended to include sensitive electronic equipment in total or in part.)3.1.38 nominal voltage (Vn): A nominal value assigned to a circuit or system for the purpose of conve-niently designating its voltage class (as 120/208208/120, 480/277, 600).d3.1.39 nonlinear load: Steady-state electrical load that draws current discontinuously or whose impedance varies throughout the cycle of the input ac voltage waveform.c3.1.40 normal mode voltage: A voltage that appears between or among active circuit conductors, but not between the grounding conductor and the active circuit conductors.3.1.41 notch: A switching (or other) disturbance of the normal power voltage waveform, lasting less than 0.5 cycles, which is initially of opposite polarity than the waveform and is thus subtracted from the normal waveform in terms of the peak value of the disturbance voltage. This includes complete loss of voltage for up to 0.5 cycles [B13].3.1.42 oscillatory transient: A sudden, nonpower frequency change in the steady-state condition of voltage or current that includes both positive or negative polarity value.3.1.43 overvoltage: When used to describe a specific type of long duration variation, refers to a measured voltage having a value greater than the nominal voltage for a period of time greater than 1 min. Typical val-ues are 1.1Ð1.2 pu.3.1.44 phase shift: The displacement in time of one waveform relative to another of the same frequency and harmonic content.c3.1.45 potential transformer (PT): An instrument transformer intended to have its primary winding con-nected in shunt with a power-supply circuit, the voltage of which is to be measured or controlled. Syn.: volt-age transformer.a3.1.46 power disturbance: Any deviation from the nominal value (or from some selected thresholds based on load tolerance) of the input ac power characteristics.c3.1.47 power quality: The concept of powering and grounding sensitive equipment in a manner that is suit-able to the operation of that equipment.cNOTEÑWithin the industry, alternate definitions or interpretations of power quality have been used, reflecting different points of view. Therefore, this definition might not be exclusive, pending development of a broader consensus.3.1.48 precision: Freedom from random error.3.1.49 pulse: An abrupt variation of short duration of a physical an electrical quantity followed by a rapid return to the initial value.3.1.50 random error: Error that is not repeatable, i.e., noise or sensitivity to changing environmental factors. NOTEÑFor most measurements, the random error is small compared to the instrument tolerance.3.1.51 sag: A decrease to between 0.1 and 0.9 pu in rms voltage or current at the power frequency for dura-tions of 0.5 cycle to 1 min. Typical values are 0.1 to 0.9 pu.b See: dip.IEEEStd 1159-1995IEEE RECOMMENDED PRACTICE FOR NOTEÑTo give a numerical value to a sag, the recommended usage is Òa sag to 20%,Ó which means that the line volt-age is reduced down to 20% of the normal value, not reduced by 20%. Using the preposition ÒofÓ (as in Òa sag of 20%,Óor implied by Òa 20% sagÓ) is deprecated.3.1.52 shield: A conductive sheath (usually metallic) normally applied to instrumentation cables, over the insulation of a conductor or conductors, for the purpose of providing means to reduce coupling between the conductors so shielded and other conductors that may be susceptible to, or that may be generating unwanted electrostatic or electromagnetic fields (noise).c3.1.53 shielding: The use of a conducting and/or ferromagnetic barrier between a potentially disturbing noise source and sensitive circuitry. Shields are used to protect cables (data and power) and electronic cir-cuits. They may be in the form of metal barriers, enclosures, or wrappings around source circuits and receiv-ing circuits.c3.1.54 short duration voltage variation:See: voltage variation, short duration.3.1.55 slew rate: Rate of change of ac voltage, expressed in volts per second a quantity such as volts, fre-quency, or temperature.a3.1.56 sustained: When used to quantify the duration of a voltage interruption, refers to the time frame asso-ciated with a long duration variation (i.e., greater than 1 min).3.1.57 swell: An increase in rms voltage or current at the power frequency for durations from 0.5 cycles to 1 min. Typical values are 1.1Ð1.8 pu.3.1.58 systematic error: The portion of error that is repeatable, i.e., zero error, gain or scale error, and lin-earity error.3.1.59 temporary interruption:See: interruption, temporary.3.1.60 tolerance: The allowable variation from a nominal value.3.1.61 total harmonic distortion disturbance level: The level of a given electromagnetic disturbance caused by the superposition of the emission of all pieces of equipment in a given system.b The ratio of the rms of the harmonic content to the rms value of the fundamental quantity, expressed as a percent of the fun-damental [B13].a Syn.: distortion factor.3.1.62 traceability: Ability to compare a calibration device to a standard of even higher accuracy. That stan-dard is compared to another, until eventually a comparison is made to a national standards laboratory. This process is referred to as a chain of traceability.3.1.63 transient: Pertaining to or designating a phenomenon or a quantity that varies between two consecu-tive steady states during a time interval that is short compared to the time scale of interest. A transient can be a unidirectional impulse of either polarity or a damped oscillatory wave with the first peak occurring in either polarity.b3.1.64 undervoltage: A measured voltage having a value less than the nominal voltage for a period of time greater than 1 min when used to describe a specific type of long duration variation, refers to. Typical values are 0.8Ð0.9 pu.3.1.65 voltage change: A variation of the rms or peak value of a voltage between two consecutive levels sustained for definite but unspecified durations.d3.1.66 voltage dip:See: sag.IEEE MONITORING ELECTRIC POWER QUALITY Std 1159-1995 3.1.67 voltage distortion: Any deviation from the nominal sine wave form of the ac line voltage.3.1.68 voltage ßuctuation: A series of voltage changes or a cyclical variation of the voltage envelope.d3.1.69 voltage imbalance (unbalance), polyphase systems: The maximum deviation among the three phases from the average three-phase voltage divided by the average three-phase voltage. The ratio of the neg-ative or zero sequence component to the positive sequence component, usually expressed as a percentage.a3.1.70 voltage interruption: Disappearance of the supply voltage on one or more phases. Usually qualified by an additional term indicating the duration of the interruption (e.g., momentary, temporary, or sustained).3.1.71 voltage regulation: The degree of control or stability of the rms voltage at the load. Often specified in relation to other parameters, such as input-voltage changes, load changes, or temperature changes.c3.1.72 voltage variation, long duration: A variation of the rms value of the voltage from nominal voltage for a time greater than 1 min. Usually further described using a modifier indicating the magnitude of a volt-age variation (e.g., undervoltage, overvoltage, or voltage interruption).3.1.73 voltage variation, short duration: A variation of the rms value of the voltage from nominal voltage for a time greater than 0.5 cycles of the power frequency but less than or equal to 1 minute. Usually further described using a modifier indicating the magnitude of a voltage variation (e.g. sag, swell, or interruption) and possibly a modifier indicating the duration of the variation (e.g., instantaneous, momentary, or temporary).3.1.74 waveform distortion: A steady-state deviation from an ideal sine wave of power frequency princi-pally characterized by the spectral content of the deviation [B13].3.2 Avoided termsThe following terms have a varied history of usage, and some may have speciÞc deÞnitions for other appli-cations. It is an objective of this recommended practice that the following ambiguous words not be used in relation to the measurement of power quality phenomena:blackout frequency shiftblink glitchbrownout (see 4.4.3.2)interruption (when not further qualiÞed)bump outage (see 4.4.3.3)clean ground power surgeclean power raw powercomputer grade ground raw utility powercounterpoise ground shared grounddedicated ground spikedirty ground subcycle outagesdirty power surge (see 4.4.1)wink。

airpak中文翻译

airpak中文翻译

新风防雨百叶 0.5双百叶 0.72-0.82单百叶 0.9散流器 0.85 左右View 视图Orient 方向Model 模型Tree 树状图Macros 处理语言(宏)Solve 求解Post 提交数据Report 报告WindowsFlat 平面Fileunpack project打开项目pack project 包装工程(重命名)command prompt 命令提示Editundo 撤销redo 重做preferences 偏好annotations 注释current object 当前对象modify 修改reset 复位copy from 复制remove 删除activate all 激活所有deactivate all 停用所有create assembly创建程序集copy params 复制参数save as project 保存为项目viewsummary 概要总结location 位置distance 距离angle 角bounding box 边界框markers 标记rubber bands 橡皮筋button 按钮select a point on the first object with the left button 用左按钮在第一个对象里选择一个点set background 设置背景edit toolbars 编辑工具拦shading 背影wireframe 线框solid 固体selected solid 选择固体hidden line 隐藏线display 显示object names 对象名称current assembly 目前组装coord axes xx轴visible grid 可见网格origin marker 原始标记rulers 标尺project title 项目标题current date 当前日期construction lines 设置线construction points 设置点mesh 网mouse position 鼠标位置tcl console tcl控制台blocks 块vents 通风口排风口openings 开口送风口partitions 分区sources 来源resistances 电阻heat exchangers热交换器hoods 抽油烟机assemblies 程序集wires 电线reset 重置defaults 默认预设值ambient 环境intensity 强度materials 材料diffuse reflectance 漫反射率ambient reflectance 环境反射shininess 亮度specular reflectance 镜面反射orienthome position 原始位置zoom in 放大region 范围scale to fit 适应规模isometric view 等距视图reverse orientation 相反的方向nearest axis 最近的轴save user view 保存用户视图clear user views 清除用户视图modelgenerate mesh 生成网格cad data cad数据radiation 辐射check model 检查模型edit priorities 编辑优先级create material library 创建物料库treesort 排序creation order 创建次序alphabetical 字母顺序排列meshing priority 网格优先级organize objects 组织对象flat 平面types 类型subtypes 子类型shapes形状Macros 处理语言(宏)Boundary conditions 边界条件solar flux calculator 太阳流计算horizontal surface 水平面vertical surface 垂直面tilt 斜度倾斜 degree 度face direction specified指明方向compass 罗盘relative to south 相对于南方local latitude当地纬度local longitude 当地经度atmospheric boundary layer 大气边界层specify by 指定anemometer height 风速计的高度exponent 指数boundary layer thickness 边界层厚度local terrain type 局部地形类型large city centers 城市中心urban ,suburban, wooded areas城市,郊区,树木繁茂的地区flat, unobstructed areas 平坦、通畅的区域profile density 剖面密度profile direction 剖面方向create assembly创建程序集diffuser扩散器diffuser type 扩散器类型geometry 几何properties 性能grille 格栅rectangular 矩形circular 圆形inclined 倾斜的,偏向dimensions尺寸assembly装配ceiling 天花板square 方形perforated panel穿孔板,多孔板displacement 位移,移置,偏移,偏移量cylinder 圆柱prism稜鏡,棱鏡,棱polygon多邊形,正多边形命令,折线图slot缝隙,槽位linear 线性vertical 垂直式,直立的nozzle 喷嘴valve阀门;电磁阀;气阀vortex漩涡力场;低涡;漩涡quick geometry/approximations 快速几何近似polygonal ducts 多边形管道closed box 封闭箱box dimensions 箱尺寸internal 内部external 外部thick walls 墙厚、厚壁thickness 厚度box material 箱体材料view definition 视图定义edit definition 编辑定义create material 创建材料default 默认insulators 绝缘子asbestos-fiber 石棉纤维asbestos-insulations 石棉绝缘brick building 砖砌建筑solid 固体surface 表面fluid 流体density 密度specific heat 比热conductivity 电导率conductivity type 导电类型isotropic 各向同性orthotropic 正交各向异性anisotropic各向异性biaxial 双轴、双光轴constant 常数linear 线性curve 曲线graph editor 图形编辑器text editor 文本编辑器polygonal cylinder多边柱体radius 半径length 长度polyblock 组合式quadrants to be created象限被创建facets 面block 块resistance 电阻cylinder plates 汽缸板enclosure 外壳facets per even 每一个面cylindrical enclosure圆柱形外壳polygonal circle多边形圆partition 分区rotate objects 旋转物体individual platesrotate prism plates 旋转棱镜板centroid 质心vertex 顶点rotate prism blocks旋转棱镜块individual polygonal blocks单个多边形块rotate groups of prism blocks旋转棱镜块组solvesetting 设置parallel setting 平行设置number of iterations 迭代次数convergence criteria 收敛准则discretization scheme离散格式standard 标准body force weighted质量力加权momentum 动量viscosity 粘度body force 质量力frequency 频率linear solver线性求解termination criterion终点判据residual reduction tolerance剩余减少公差serial 连续的parallel平行的processors 处理器use metis for partitioning使用Metis分区network parallel 网络并行node file 节点文件browse 浏览edit network parameters编辑网络参数shared path共享路径run solution运行解决方案solution type 解式restart重新启动interpolated data 插值数据full data 全数据start monitor开始监测;启动监视器edit parameters 编辑参数solution monitor parameters解决方案的监测参数variable 变量continuity 连续性energy 热能output units输出单位angular deviation 角偏差concentration 浓度fraction 分数heat flow rate热流量heat flux 热通量heat tr coeff热蒸腾系数mass flow质量流量radiative heat flow辐射热流turbulent湍流volume flow rate容积流量volume 体积disable radiation calculations禁用辐射计算perform multiple trials进行多次试验dismiss解雇、开除、遣散run optimization 运行优化parameters and optimization参数与优化single trial单次试验parametric trial参数化试验all combinations 所有组合by columns按列selected values选定值convergence tolerance for objective目标的收敛性convergence tolerance for variables变量的收敛性constraint tolerance约束公差maximum number of iterations迭代的最大次数show diagnostic output显示诊断输出save only best iteration保存最好的迭代save best and last iteration保存最佳和最后一次迭代solution monitor解决方案监控define trials确定试验postobject face物体面、对象面show mesh显示网格show contours显示轮廓show vectors显示向量show particle traces显示粒子的痕迹plane cut 平面切割plane location 平面位置set positon 设定位置x plane through center X平面通过中心y plane through center y平面通过中心z plane through center z平面通过中心point and normal 点和法向计算coeffs非零系数;多项式系数horizontal-screen select水平屏幕选择vertical-screen select 垂直屏幕选择3 point-screen select 3点屏幕选择clip to box 夹框enable clipping 使剪裁animation 动画delay 延迟write to file 写入文件loop mode 循环模式isosurface 等值面TKE 湍流动能Epsilon 希腊语的第五个字母艾普斯龙Viscosity ratio粘度比mass flow 质量流量mean age of air 平均空气龄radiation temp 辐射relative humidity 相对湿度angular deviation 角偏差visibility 能见度pixels 像素leave trail 留下痕迹show particles 显示粒子contours are visible 轮廓是可见的no objects with contours are visible so there si nothing to probe 轮廓没有对象是可见的所以没有什么探讨surface probe 表面温度感测、表面电极min locations 最小位置convergence plot 收敛图variation plot 变化图history plot 历史图trials plot 试验图transient setting 动态设置load solution ID 加载解决方案ID time average 时间平均值download rsf project RSF项目下载postprocessing units 后处理单元load post objects from fils 从文件加载后的对象save post objects to fils 保存后的对象文件rescale vectors 缩放向量create zoom in model 模型的缩放modify 修改reporthtml report HTML报告problem specification 规范的问题solution overview 解决方案概述heat source information 热源信息fan information 风机信息vent information 通风信息item 项目summary report 总结报告solution overview 解决方案概述available 可用show optimization results 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Journal Special Issue on Spiking Neural Systems. over Delayed Lines

Journal Special Issue on Spiking Neural Systems. over Delayed Lines

Using Temporal Bindingfor Robust Connectionist Recruitment Learningover Delayed Lines ∗Cengiz GünayAnthony S.MaidaTechnical Report,TR-2003-2-1Abstract–abstract_alt.lyx,v 1.22003/04/0306:32:25cxg9789Exp–The temporal correlation hypothesis proposes using dis-tributed synchrony for the binding of different stimulus features.However,synchronized spikes must travel over cortical circuits that have varying-length pathways,lead-ing to mismatched arrival times.This raises the ques-tion of how initial stimulus-dependent synchrony might be preserved at a destination binding site.Earlier,we pro-posed constraints on tolerance and segregation parameters for a phase-coding approach,within cortical circuits,toaddress this question [22].The purpose of the present pa-per is twofold.First,we conduct simulation experiments to test the proposed constraints.Second,we explore the practicality of temporal binding to drive a process of long-∗Asimilar version of this report has been submitted to the Neuro-computing Journal Special Issue on Spiking Neural Systems.term memory formation based on a recruitment learning method [15].A network based on Valiant’s neuroidal architecture [61]is used to demonstrate the coalition between tempo-ral binding and plementing similar ap-proaches,we implement a continuous-time learning pro-cedure allowing computation with spiking neurons.The viability of the proposed binding scheme is investigated by conducting simulation studies which examine binding errors.In the simulation,binding errors cause the per-ception of illusory conjunctions among features belong-ing to separate objects.Our results indicate that when tolerance and segregation parameters obey our proposed constraints,the assemblies of correct bindings are dom-inant over assemblies of spurious bindings in reasonable operating conditions.We also improve the stability of the 11INTRODUCTIONrecruitment method in deep hierarchies for use in limited size structures suitable for computer simulations.Keywords:synchrony;temporal correlation;binding;recruitment learning;tolerance window;phase segrega-tion1Introduction–intro_opening.lyx,v 1.92003/04/0306:32:26cxg9789Exp–In the brain,functionally and physically separate areas of the sensory cortex (e.g.,visual,auditory,somatosen-sory)analyze different stimulus features in the environ-ment.This raises the question of how these physically distributed feature representations are combined to form coherent unitary percepts.This question is first iden-tified as the binding problem in neural representations by Rosenblatt [39].One approach to solving this prob-lem uses the temporal correlation hypothesis which posits that binding of disparate feature representations is ac-complished by synchronized firing across cortical areas [65,66,21,52,51,28,38,13,57].The viability of this temporal binding model depends on maintaining the syn-chrony of spikes coding features from the same stimulus and desynchrony of spikes coding features from separate stimuli.In the temporal binding model,von der Malsburg [65]suggested that in a highly connected brain-like struc-ture,synchronously active units may employ a fast synap-tic modification mechanism to form dynamic ensembles.These ensembles represent combinations of features for a unitary percept.This approach eliminates the problem of combinatorial explosion associated with static binding mechanisms where a new unit is needed to represent each possible binding.Temporal binding,by using time as cod-ing space,requires only elementary feature units to bepresent and allows combinations to be formed dynami-cally via transient potentials at interconnecting synapses.In terms of the number of units needed to represent enti-ties that a cognitive system is exposed to,the magnitude is thus lowered from being exponential to quadratic with respect to the number of features.The temporal binding proposal opened the way to many theoretical and simula-tion studies [64,24,46,41,30,56,55].We noted in previous work that some cortical connec-tion topologies appear to pose obstacles for maintaining synchrony [22].These topologies consist of variable-length pathways that converge onto some destination area.If the sources are synchronized,one would expect that the destination have a means to detect the synchrony.We pro-posed constraints on the timing and integration properties of these circuits in order to address these problems.The purposes of the present work are:1)to conduct simulationstudies that explore the effectiveness of the proposed con-straints;and,2)to place the studies in a larger framework that incorporates a form of long-term memory acquisition method,known as recruitment learning that complements TB over delayed lines Neurocomp.2Draft v1.9on 2003/04/0306:32:261INTRODUCTIONtemporal binding.We hope ultimately our models willhelp establish a biological grounding for structured con-nectionist models capable of cognitive functions like rea-soning (such as 14,47,46,61,16,63,48).1.1Why Recruitment Learning?–intro_recruitment.lyx,v 1.72003/03/3121:27:48cxg9789Exp–Since temporal binding proposes that only temporary rep-resentations are formed,it is sometimes criticized for cog-nitive incompleteness in regard to the formation of per-manent representations [37].To complement the tran-sient nature of temporal binding,recruitment learning can be used to allocate long-term,or permanent,memories [61,49].Thus,recruitment may serve as the readout pro-cess for the results of temporal binding processes (i.e.forming binding-detectors).This idea is consistent with the storage and retrieval criterion in the requirements of von der Malsburg [66]for a binding mechanism.Recent results from behavioral and fMRI studies of visual atten-tion also support this view [58].These studies suggest that new mechanisms are recruited when feature bindings must be explicitly remembered.Recruitment learning was originally proposed by Feld-man [15](also motivated the vicinal algorithms of Valiant [60,61]).Recruitment provides a feasible way to allocate representations of concepts in randomly connected static structures like the brain.Even though connections in the brain are not completely random,the recruitmentmodelFigure 1:Connection topology showing possible di-rect and indirect pathways from an initially synchronizedsource of activity converging at a destination.Dashedboxes indicate the hypothesized stages of processing,inwhich each individual solid box indicates the localizedprocessing for a single feature.captures its statistical properties.In particular,the model was motivated by the ratio of connections of cortical pyra-midal cells in the brain,where the number of projections from a single neuron is roughly proportional to the square root of the total number of neurons [68].1.2Spike Timing:Tolerance and Segrega-tion–intro_tolerance_segregation.lyx,v 1.112003/04/0306:32:26cxg9789Exp–The viability of recruitment learning,since it is induced by temporal binding,depends on the accuracy of neuron spike timing.It turns out that spike timing is difficult to maintain in network topologies such as those seen in Fig-ure 1.Initially synchronous activity may be disrupted af-TB over delayed lines Neurocomp.3Draft v1.11on 2003/04/0306:32:261INTRODUCTIONter passing through separate direct and indirect converg-ing paths.This work addresses two related aspects of spike tim-ing in direct/indirect connection topologies:tolerating de-lays and preventing crosstalk.In thefigure,a hypotheti-cal circuit formed by recruitment learning for recogniz-ing a“yellow V olkswagen”object is illustrated.In the leftmost part of thefigure,the neuralfirings represent-ing the primitive object properties occur synchronously as the subject focuses attention.This is consistent with stimulus-dependent synchrony behavior[51].It is rea-sonable to require an additional level of processing for the potentially more complex shape properties than the color property of the object.This allows the circuit to use fea-tures such as“small car”and“curved roof”as elements to form the concept of a V olkswagen independent of color.If temporal binding is employed,the signals at the destina-tion need to be synchronous to represent the same object. However,when signal transmission times are considered, the degree of synchrony at the destination is degraded due to signals crossing varying length pathways with varying delays.1A window of tolerance as seen in Figure2can be de-fined for integrating signals with variable delays into the same response.This window corresponds to the maxi-1Similar examples can be formed with multi-modal sensory stimuli. Regarding formation of object representations,since reaction time for auditory stimuli is faster than for visual stimuli,the signals that account for the sound of an object are processed faster than the signals represent-ing the image of the object.ΓFigure2:The tolerance windowΓrequired to integrate in-puts such as shown in Figure1.Initially on the left,spikes corresponding to primitive object properties are synchro-nized.After traveling over separate pathways with dif-ferent delays,their synchrony is degraded,as seen on the right side.By defining this tolerance window the spikes can still be treated assynchronous.Timings are chosen arbitrarily for illustration.lowersquaretriangleupperFigure3:Activity in separate phase windows for each object in a scene.The scene contains a triangle in the upper part of the visualfield and a square in the lower part.mum time allowed between two incoming spikes that can both contribute to cause an action potential[27,43,45, 49].However,signals corresponding to different objects need to remain separate,or desynchronized,in order to avoid crosstalk of features between objects.In this frame-work,the notion of desynchrony is defined to assign each object to a different tolerance window.This yields the notion of segregation of object representations into phase windows[41,30,46,44,56,25,4].TB over delayed lines Neurocomp.4Draft v1.11on2003/04/0306:32:261INTRODUCTIONThis phase coding approach is one possible method for desynchronizing responses.This method puts neural ac-tivity pertaining to each object in a separate phase win-dow(of a large oscillatory period).This prevents interfer-ence as the activity propagates to deeper structures,pre-serving its integrity with respect to temporal binding.An example with two objects is shown in Figure3.In the-oretical and simulation studies,segregation between ob-ject representations can be obtained by inhibitory projec-tions.Some propose using global inhibitory projections [30,56],while others propose using lateral recurrent in-hibitory connections[41,25].This work extends the study of phase segregation by in-vestigating how to maintain synchrony and desynchrony when delays are taken into account.Here,the relevance of recurrent inhibitory circuits is secondary,since we are in-terested in the effect of delays on the synchronous activity coming from upstream areas,converging to a single desti-nation site.Instead,our goal is to study the constraints on tolerance and segregation measures required to maintain the phase-coding at the destination read-out site.We have chosen the connection topology in Figure1 as an exemplar for observing the effects of delays.The significance of this exemplar is that,in theory,more com-plex connection topologies can be transformed to this case by hierarchical reduction.For each of the tolerance and segregation measures,we were able to calculate a lower bound,that is a minimal value that satisfies the conditions for temporal binding,in the exemplar topology.The need to define measures of tolerance and segre-gation has been addressed before.In forming hierarchi-cal learning structures,Valiant[61]suggested that higher levels of processing need to operate in slower time scales than lower levels.In slower operation,the higher level units may integrate information from the faster lower lev-els of processing.For instance,high-level units represent-ing a scene may need to integrate all information about the contents of the scene presented sequentially before giving a response.This implies that the scene unit has a tol-erance duration many times longer than the lower level. Consistent with this view,Newell[34]has recognized a time scale hierarchy,ranging from milliseconds to years, in modeling cognitive behavior.Another line of study that discusses phase windows is the problem of multiple instantiation in connectionist models[33,53,54].These studies offer a biologically plausible way to represent multiple instances of objects by placing them further apart in time.This approach,in contrast to symbolic systems,models more closely the de-fects in performance observed in psychological studies. In symbolic systems,it is possible to instantiate an arbi-trary number of representations of the same object.On the other hand,in neural models an object representation is usually associated with the same units.Therefore,thereTB over delayed lines Neurocomp.5Draft v1.11on2003/04/0306:32:261INTRODUCTION2∆+δFigure 4:Simple example of direct/indirect connectionsin visual cortex possibly leading to mismatched arrivaltimes of spikes.∆stands for axonal propagation delay and δstands for synaptic transmission delay and integra-tion time.is a problem if the object needs to appear more than once in a ing the time dimension is a possible solu-tion to this problem.1.3Psychological and Neuroscientific The-ory and Evidence–intro_bio_theory_evidence.lyx,v 1.52003/03/2622:29:14cxg9789Exp–We previously discussed evidence for the type of scenario depicted in Figure 1[22].Here,we give a brief overview of the theory and evidence.Such direct-indirect connec-tion topologies are found frequently when neocortical in-terareal connections are considered (see Figure 4).Psychology and neuroscience studies support the view that temporal binding may be employed in cortical cir-cuits.Primarily,psychological studies identify several classes of visual search tasks where attentional mech-anisms serially scan multiple objects in a visual scene[50,57].There is evidence that attending to objects at separate times initiates stimulus-dependent synchronous activity in the primary visual cortex (V1)[51].If temporal binding is employed,it is reasonable toassume that synchronous activity representing an objectshould be sustained as it propagates through various func-tional areas until the computation terminates.In sup-port of this hypothesis,synchrony has been experimen-tally observed in different cortical areas [1,51].Com-plementing these observations,analytical and simulation studies of Diesmann et al.[10]show that spike volleys propagating across neuronal pools can become more syn-chronized.The neurons favor synchrony allowing syn-chronous volleys to propagate protected,filtering out un-correlated noise.This observation holds only if a certaindegree of connectivity is employed between neurons.1.3.1Phase Segregation–intro_phase_seg.lyx,v 1.82003/04/0306:32:26cxg9789Exp–The issue of desynchronization,or segregation of signals pertaining to different objects into phase-windows,has also been explored [41,30,56,25].In fairness,the phase-coding approach for temporal binding has also been crit-icized.Knoblauch and Palm [26]suggested that results of some electromagnetic recording experiments are in-consistent with phase coding.In particular,recordings ofactivity pertaining to multiple separate stimuli (e.g.,bars moving in opposite directions)cause a flat correlogram,whereas phase-coding would predict a non-zero time lag of the central peak.TB over delayed lines Neurocomp.6Draft v1.8on 2003/04/0306:32:261INTRODUCTIONArea Earliest MeanV13572V25484V35077MT3976Table1:Response latencies in msec in visual areas taken from Lamme and Roelfsema[29].The early response in MT is due to the connection received from superior col-liculus(SC)which we disregard in this study.1.3.2Direct/Indirect Connection Topologies Assuming a phase-coding approach,timing is crucial in preserving the integrity of signals with respect to temporal binding,especially when synchronized spike volleys must meet after taking alternate cortical paths.This is similar to the hypothetical example discussed above in Figure1. There are potentially many candidates for cortical connec-tion topologies that exhibit these types of asymmetrical connections.To illustrate,Figure4shows the M-pathway of the interareal connection between visual areas V1,V2 and V3[32,2].The propagation pathways in thefigure can be alternatively verified by observing visual response latencies seen in Table1[36,29].Take a synchronous response that originates in area V1 and which then propagatesfirst to area V2and next to V3.Area V1has direct connections to V3,therefore V3 will receive two synchronized spike volleys caused by the same stimulus;one directly from V1,and one through V2. Even though we are not aware of direct evidence support-ing that meeting pathways actually converge at the cellu-lar level,it is reasonable to believe that the arriving signals interact since local cortical circuits are highly intercon-nected.1.4Computational Basis for the SimulationEnvironment–neuroid_valiant_intro.lyx,v1.42003/03/3005:57:13cxg9789Exp–The simulation environment introduced here has many in-teresting characteristics.The motivation for this simulator goes back to the neuroidal architecture of Valiant[60,61] which unified the independent work on recruitment learn-ing[68,15],and temporal binding[65].We are interested in the neuroidal model becauseit proposes solutions to problems fundamental to AI [62].Among these problems are brittleness,the variable-binding problem of predicate calculus,non-monotonic reasoning and learning mechanisms close to human cog-nitive functioning.The latter is due to the recruitment learning capability of the neuroidal network.Valiant[61] illustrates the phenomenon by giving the following exam-ple.When a person isfirst exposed to the juxtaposition oftwo familiar words that constitutes the title of a new book, some adjustments take place in his cognitive machinery.In the future,if this title is encountered again,the per-son can recognize it effortlessly.This kind of learning never runs out of allocation space,either.The recruitment learning paradigm attempts to explain possible cognitive mechanisms involved to represent the production of suchTB over delayed lines Neurocomp.7Draft v1.8on2003/04/0306:32:261INTRODUCTIONa novel concept.The knowledge representations that are used in the model exhibit two significant features.One is that knowledge is represented redundantly by a num-ber of units.The other is use of temporal binding implied by definition of recruitment learning.These together sug-gest a solution to the variable-binding problem of predi-cate calculus.Valiant suggests that in order to prevent brittleness,the way to imitate human behavior should be using learning mechanisms to acquire skills,as opposed to the approach of the traditional AI systems that use preprogrammed knowledge.2Valiant proposes,within the model,tractable learning procedures that operate on the network.For this purpose,learning in the probably approximately correct (PAC)sense is employed where only positive examples of concepts are selected from a random distribution to train the system.The PAC theorem guarantees that even though there is a small probability of error in which case the sys-tem might not recognize a positive instance,the system will not fail on any of the positive inputs recognized ear-lier [59].1.5Instability in Hierarchical Recruitment –intro_instability.lyx,v 1.52003/03/3121:27:48cxg9789Exp–There is an instability issue in recruitment,because the expected number of neuroids recruited to represent a concept depends on statistical properties of the network.2Thefields of machine learning and computational learning theoryare concerned with this subject [40,pp.552–560].When a chain of concepts is recruited in a cascade,such as in deep hierarchies like Figure 9,the variance in the num-ber of recruited neuroids needs to be vanishingly small.Otherwise,progressing deeper into the hierarchy,either the set of recruited neuroids may grow uncontrollably,or disappear completely.Even though Valiant’s theoretical calculations suggest that the expected number of recruited units can be pre-dicted,the variance of this parameter is close to its ex-pectation.Our initial simulations using a low number of total neuroids per area (102as compared to Valiant’s 108)showed that no units can be recruited after crossing two levels in a hierarchy such as in Figure 9.However,Valiant [61]claims that if 108neuroids were employed with a replication factor of 50,stable recruitment up to 4levels can be achieved.He fortified this result with additional work of Gerbessiotis [17]under asymptotic conditions,where the number of units were taken as infinite.The issue of instability becomes graver in smaller sizes networks.In this work,we propose and implement a sta-bilizing mechanism to use recruitment with a low num-ber of neuroids.The mechanism is applicable to largernetworks,such as studied by Valiant,for optimizing their performance.Such a mechanism may be appropriate for being employed in small networks of localized patches of cortical circuits.However,its biological plausibility needs further investigation.TB over delayed lines Neurocomp.8Draft v1.8on 2003/04/0306:32:262RECRUITMENT LEARNING1.6Overview–intro_overview.lyx,v 1.32003/03/3005:57:14cxg9789Exp–Our main objective can be summarized as follows.We investigate the tolerance and segregation parameter con-straints for performing temporal binding across varying-delay pathways,in such topologies shown in Figure 1.This work describes a simulation study in order to verify timing hypotheses proposed earlier [22].We hope ulti-mately our models will help establish a biological ground-ing for structured connectionist models capable of cogni-tive functions like reasoning (such as [14,47,46,61,16,63,48]).Our work is consistent with previous work on recruit-ment learning [47,49,14,9,16].We augment the neu-roidal model to continuous-time by using the spike re-sponse model (SRM)of Gerstner [18].Complementing other studies on recruitment which mainly provided ana-lytical calculations and statistical simulations [61,17,49,16],our work extends by implementing an actual simu-lator that employs recruitment learning and investigates its practical applicability.We have uncovered many is-sues during this experiment such as the instability of the recruitment method.Our result verifies that the tolerance window for keep-ing coherent representations and the amount of phase seg-regation to prevent crosstalk for such a given topology can be calculated.We also improve the stability of the recruit-ment method in deep hierarchies which allows using re-cruitment in limited size structures suitable for computer simulations.The organization of the rest of this paper is as follows.First,in §2,recruitment learning is described.Then,in §3,timing issues in using recruitment in certain problematic conditions are explored.Then,measures of tolerance and segregation for maintaining coherence of temporal bind-ing in direct/indirect connection topologies are defined in §4.The problem of instability in recruitment is discussed and solutions are proposed in §2.8.The methods for test-ing the proposed hypotheses,followed by the simulation results are given in §5.Finally conclusions and future work is given.2Recruitment Learning–recruitment.lyx,v 1.62003/04/0306:32:26cxg9789Exp –This section describes the recruitment learning procedure.The following subsections progressively build the context of the recruitment learning simulation for later sections.§2.1starts by giving a brief summary of the key points of recruitment.2.1What is Recruitment Learning?–recruitment__what.lyx,v 1.42003/03/3121:27:48cxg9789Exp–Briefly,recruitment learning is a scheme for allocating on demand representations for new concepts [15].The key feature of recruitment learning is that it operates within a static random graph.Vertices in the graph correspondto neural units that participate in representing concepts.TB over delayed lines Neurocomp.9Draft v1.4on 2003/03/3121:27:482RECRUITMENT LEARNINGThe recruitment learning method addresses the question of how localist concepts might be allocated in a graph structure like the brain.The method allows for novel con-cepts to be allocated by synchronous stimulation of exist-ing concepts.These existing concepts,upon stimulation, coincidentally activate units where signals converge due to random interconnections.The two points to empha-size in recruitment learning are random connections and synchronous activity,both of which have some biological support[68,15,61].Recruitment is an unsupervised learning method.How-ever,once concepts are acquired through recruitment,su-pervised learning methods can be used to associate related concepts[61].Recruitment can be accomplished with a single example,therefore allowing one-shot learning. Novel concepts are added to the system only if necessary, similar to the ART model[6].The latter is an important feature that distinguishes recruitment from the monolithic nature of standard artificial neural networks.This summary is intended to stand as a starting point and we illustrate the procedure in the following subsec-tions.§2.2introduces Valiant’s neuroidal architecture em-ploying recruitment learning.§2.3describes how we or-ganize our network differently from Valiant’s simple ran-dom network to test toleration and segregation.§2.4de-scribes the type of neural representation that is employed.§2.5makes the relation to temporal binding explicit.§2.6gives a simple example to illustrate recruitment.This ex-ample is revisited in§2.7to analyze the inner workings of the network during recruitment.2.2A Neuroidal ArchitectureValiant[61]describes recruitment learning in the frame-work of his neuroidal architecture.In its simplest form, the neuroidal network is formed by a simple random in-terconnection network as seen in Figure5(a).Nodes represent the simplest building block,the neu-roid.Apart from being a linear threshold unit(LTU),the neuroid is also afinite state machine(FSM)that controls the parameters of its LTU(See Figure5(b)–(c)).In the neuroidal network the FSM detects coincidences among the neuroid’s inputs.It starts at the initial available(A) state and later changes into the memorized(M)state,ac-cording to its membrane potential(p).2.3Structural OrganizationIn order to construct models of varying-length pathways, we organized the network into subparts rather than group-ing all neuroids in a single random interconnection net-work.Consistent with Valiant[61],we group neuroids in abstract sets influenced by cortical areas to form a multi-partite graph structure.The random interconnections that enable recruitment are located between areas rather than intraareally as seen in Figure6(a).TB over delayed lines Neurocomp.10Draft v1.5on2003/03/3005:57:142RECRUITMENTLEARNINGNTR(a)Random interconnection network of neuroids which does not yet store any information.Also known as the neuroidal tabula rasa (NTR).00011InputsWeights OutputAvailableNo firingsState:(b)The LTU of the neuroid.Memorized StateInitial Statep :potential (net input)p <2(c)State machine of the neu-roid.Figure 5:Valiant’s neuroidalnetwork.(a)Interareal random connec-tions.(b)Projection set of neu-roids representing a con-cept.(c)Temporal binding activates the intersec-tion set.Figure 6:Network structure.TB over delayed lines Neurocomp.11Draft v1.5on 2003/03/3005:57:14。

网络优化专业业务知识试题

网络优化专业业务知识试题

网络优化专业考试复习大纲一、单项选择题部分1、在MSC中及周期性位置更新时间T3212相对应的参数是。

A、GTDMB、BTDMC、BDTMD、GDTM答案:(B)2、通过指令可以看到指定小区当前ICMBAND值,从而判断小区可能受到上行干扰。

A、RLIMPB、RLBDPC、RLCRPD、RLSBP答案:(C)3、在缺省情况下,及训练序列码(TSC)相等的代码是。

A、NDCB、BCCC、NCCD、TAC答案:(B)4、使用LAPD信令压缩,好处是减少了和间的物理链路,从而优化传输方案,节约传输资金投入。

A、MSC MSCB、MSC BSCC、BSC BSCD、BSC BTS答案:(D)5、在手机通话过程中,用来传递切换命令消息的逻辑信道是。

A、SACCHB、SDCCHC、SCHD、FACCH答案:(D)6、全速率业务信道和半速率业务信道传送数据最快速度为和。

A、13kbit/s、6.5 kbit/sB、9.6kbit/s、4.8 kbit/sC、4.8kbit/s、2.4 kbit/sD、11.2kbit/s、5.6 kbit/s答案:(B)7、使用GPS配合TEMS测试,GPS选项设置为时,才能正常记录经纬度信息。

A、SH888B、CF688D、NMEA答案:(D)8、在BSC终端上用指令,可以看到指定硬件是否有告警(Fault Code Class xx)以及可能更换的部件(Replace Unit)。

A、RXMSPB、RXMFPC、RXELPD、ALLIP答案:(B)9、同一小区中,每个Channel Group中最多可以容纳个频率。

A、8B、10C、12D、16答案:(D)10、发生Intra-cell切换的可能原因为。

A、服务小区信号强度突然降低B、服务小区信号质量急剧恶化C、服务小区信号质量差而信号强度较强D、服务小区信号质量和强度同时恶化答案:(C)11、当一个小区参数BCCHTYPE=NCOMB,SDCCH=2时,该小区SDCCH的定义数为:A、2B、16C、19D、20答案:(B)12、下面哪个参数对小区重选不产生影响:A、PTB、MFRMSC、ACCMIND、TO答案:(B)13、在BSC终端上提取即时统计文件的指令是::rptid=xxx,int=1;。

一种应用于超宽带系统的宽带LNA的设计

一种应用于超宽带系统的宽带LNA的设计

收稿日期:2005206206; 定稿日期:2005208219基金项目:国家重点基础研究发展(973)计划资助项目(G2000036508);国家自然科学基金资助项目(60236020);国家高技术研究发展(863)计划资助项目一种应用于超宽带系统的宽带L NA 的设计桑泽华,李永明(清华大学微电子学研究所,北京 100084)摘 要: 结合切比雪夫滤波器,可以实现宽带输入匹配的特性和片上集成窄带低噪声放大器(L NA )的噪声优化方法。

提出一套完整的基于CMOS 工艺的宽带L NA 的设计流程,并设计了一个应用于超宽带(U WB )系统的3~5GHz 宽带LNA 电路。

模拟结果验证了设计流程的正确性。

该电路采用SM IC 0.18μm CMOS 工艺进行模拟仿真。

结果表明,该L NA 带宽为3~5GHz ,功率增益为5.6dB ,带内增益波动1.2dB ,带内噪声系数为3.3~4.3dB ,IIP3为-0.5dBm ;在1.8V 电源电压下,主体电路电流消耗只有9mA ,跟随器电流消耗2mA ,可以驱动1.2p F 容性负载。

关键词: 低噪声放大器;切比雪夫滤波器;超宽带;无线局域网中图分类号: TN722.3 文献标识码: A 文章编号:100423365(2006)0120114204A Wideband Low Noise Amplif ier for U ltra WideB and SystemSAN G Ze 2hua ,L I Y ong 2ming(I nstit ute of Microelect ronics ,Tsinghua Uni versit y ,B ei j ing 100084,P.R.China )Abstract : A new design flow is presented by combining the wideband match network theory with the low noise design technique for integrated narrowband low noise amplifier (L NA ).As a demonstration ,a wideband L NA is de 2signed based on this design flow ,which is validated by simulation using SMIC ’s 0.18μm technology.Results from the simulation show that the L NA circuit has achieved an operating f requency ranging f rom 3GHz to 5GHz ,a pow 2er gain between 4.4dB and 5.6dB ,a noise figure f rom 3.3dB to 4.3dB and an IIP3of -0.5dBm.The circuit dis 2sipates 11mA current f rom a single 1.8V power supply ,and it is capable of driving 1.2p F capacitive load.K ey w ords : Low noise amplifier ;Chebyshev filter ;Ultra wide band ;WL AN EEACC : 1220 1 引 言IEEE 802.15.3是一种无线个人域网(WPAN ,Wireless Personal Area Network )标准,包含MAC和P H Y 两部分。

Agilent 6010A系列DC电源说明书

Agilent 6010A系列DC电源说明书

Basic DC Power Supplies essential features for a tight budgetMore detailed specifications at /find/601023Single-Output, Autoranging Programming resolution Voltage 50 mV 5 mV 15 mV 125 mV Current4.25 mA 30 mA 12.5 mA 1.25 mA DC floating voltage±550 V±240 V±240 V±550 Veither terminal can be grounded or floated from chassis ground AC input current100 Vac 24 A 24 A 24 A 24 A 120 Vac 24 A 24 A 24 A 24 A 220 Vac 15 A 15 A 15 A 15 A 240 Vac14 A 14 A 14 A 14 A WeightNet 16.3 kg (36 lb) 17.2 kg (38 lb) 16.3 kg (36 lb) 16.3 kg (36 lb)Shipping21.8 kg (48 lb)22.7 kg (50 lb)21.8 kg (48 lb)21.8 kg (48 lb)Autoranging Output:1981Remote Sensing:greater drops.Modulation:Input signal:Size:Warranty:0.5"More detailed specifications at /find/601024More detailed specifications at /find/603025Single-Output, Autoranging 200 W and 1000 W GPIB0.5"26Supplemental Characteristics for all model numbersRemote Sensing:Up to 2 V drop in each lead. Voltage regulation specification met with up to 0.5 V drop, but degrades for greater drops.Modulation: (analog programming of output voltage and current)Input signal:0 to 5 V or 0 to 4 k Ohms Software Driver:VXI Plug&Play Warranty: One yearSize:6030A–32A, 6035A:425.5 mm W x 132.6 mm H x 503.7 mm D (16.75 in x 5.25 in x 19.83 in).6033A, 6038A:212.3 mm W x 177.0 mm H x 516.4 mm D (8.36 in x 6.97 in x 17.87 in).More detailed specifications at /find/6030Supplemental Characteristics(Non-warranted characteristics determined by design and useful in applying the product)Programming resolution Voltage50 mV 5 mV 15 mV 5 mV 125 mV 1 5 mV Current4.25 mA 30 mA 12.5 mA 7.5 mA 1.25 mA 2.5 mA DC floating voltage±550 V±240 V±240 V±240 V±550 V±240 Veither terminal can be grounded or floated from chassis ground AC input current100 Vac 24 A 24 A 24 A 6 A 24 A 6 A 120 Vac 24 A 24 A 24 A 6.5 A 24 A 6.5 A 220 Vac 15 A 15 A 15 A 3.8 A 15 A 3.8 A 240 Vac14 A 14 A 14 A 3.6 A 14 A 3.6 A WeightNet 16.3 kg 17.2 kg 16.3 kg 9.6 kg 16.3 kg 9.6 kg (36 lb) (38 lb) (36 lb) (21 lb) (36 lb) (21 lb)Shipping21.8 kg 22.7 kg 21.8 kg 11.4 kg 21.8 kg 11.4 kg (48 lb)(50 lb)(48 lb)(25 lb)(48 lb)(25 lb)Agilent Models: 6030A, 6031A, 6032A, 6035A27Ordering InformationOpt 001 Front panel has only line switch, line indicator, and OVP adjust (6030A–33A and 6038A only)Opt 10087 to 106 Vac, 48 to 63 Hz(power supply output is derated to 75%)Opt 120 104 to 127 Vac, 47 to 63 Hz Opt 220191 to 233 Vac, 48 to 63 Hz Opt 240209 to 250 Vac, 48 to 63 Hz Opt 800Rack-mount Kit for Two Half-rack Units Side by Side. Lock link Kit p/n 5061-9694 and 7 in Rack adapter Kit 5063-9215*Opt 908Rack-mount Kit for a Single Half-rack Unit 6033A and 6038A(with blank filler panel); p/n 5062-3960, 6030A–32A and 6035A; p/n 5062-3977*Opt 909 Rack-mount Kit with Handles.For 6030A–32A, 6035A; p/n 5062-3983More detailed specifications at /find/6030Opt 0L1Full documentation on CD-ROM, and printed standard documentation packageOpt 0L2Extra copy of standard printed documentation package Opt 0B3 Service ManualOpt 0B0 Full documentation on CD-ROM onlyOpt J01 Stabilization for loads up to 10 Henries (not available on 6033A)A line cord option must be specified,see the AC line voltage and cord section.*Support rails requiredTerminal Strip DetailScrew Size M3.5 x 0.6VM IM VP IP B6B1Agilent Models: 6033A, 6038AAccessories5080-2148Serial Link Cable,2 m (6.6 ft)1494-0060Rack Slide Kit E3663AC Support rails for Agilent rack cabinetsYour Requested Excerpt from theAgilent System and Bench Instruments Catalog 2006The preceding page(s) are an excerpt from the 2006 Systemand Bench Instruments Catalog. We hope that these pages supply the information that you currently need. If you would like to have further information about the extensive selection of Agilent DC power supplies, please visit /find/power to print a copy of the complete catalog, or to request that a copy be sent to you. You will also find a lot of other useful information on this Web site.In the full System and Bench Instruments Catalog, you willfind that Agilent offers much more than DC power supplies. This catalog contains detailed technical and application information on digital multimeters, DC power supplies, arbitrary waveform generators, and many more instruments. If you need basic, clean, power for your lab bench, it’s there. In each power product category we have also integrated the capabilities you need fora complete power solution, including extensive measurement and analysis capabilities.Please give us a call at your local Agilent Technologies sales office, or call a regional office listed, for assistance in choosing or using Agilent power products.Keep up to date with Agilent’s Test and Measurement Email UpdatesAs an Email Update subscriber, you will receive periodic customized email updates that match the areas of interestthat you have specified. Your update will include productsand services, applications and support information, events and promotions. Sign up today at /find/emailupdates. Check off DC power supplies, AC power sources or electronic loads on your registration form, and we will promptly let you know what’s new in power products. Our Privacy Statement at /go/privacy describes our commitment to you regarding your For more information on Agilent Technologies’ products, applicationsor services, please contact your local Agilent office. The complete list is available at:/find/contactusPhone or FaxUnited States:(tel) 800 829 4444(fax) 800 829 4433Canada:(tel) 877 894 4414(fax) 800 746 4866China:(tel) 800 810 0189(fax) 800 820 2816Europe:(tel) 31 20 547 2111Japan:(tel) (81) 426 56 7832(fax) (81) 426 56 7840Korea:(tel) (080) 769 0800(fax) (080) 769 0900Latin America:(tel) (305) 269 7500Taiwan:(tel) 0800 047 866(fax) 0800 286 331Other Asia Pacific Countries:(tel) (65) 6375 8100(fax) (65) 6755 0042Email:*****************Contacts revised: 09/26/05Product specifications and descriptions in this document subject to change without notice.© Agilent Technologies, Inc. 2006 Printed in the USA, February 8, 2006Agilent Technologies。

裴攀-翻译中文

裴攀-翻译中文

第6章光源和放大器在光纤系统,光纤光源产生的光束携带的信息。

激光二极管和发光二极管是两种最常见的来源。

他们的微小尺寸与小直径的光纤兼容,其坚固的结构和低功耗要求与现代的固态电子兼容。

在以下几个GHz的工作系统,大部分(或数Gb /秒),信息贴到光束通过调节输入电流源。

外部调制(在第4、10章讨论)被认为是当这些率超标。

我们二极管LED和激光研究,包括操作方法,转移特性和调制。

我们计划以获得其他好的或理念的差异的两个来源,什么情况下调用。

当纤维损失导致信号功率低于要求的水平,光放大器都需要增强信号到有效的水平。

通过他们的使用,光纤链路可以延长。

因为光源和光放大器,如此多的共同点,他们都是在这一章处理。

1.发光二极管一个发光二极管[1,2]是一个PN结的半导体发光时正向偏置。

图6.1显示的连接器件、电路符号,能量块和二极管关联。

能带理论提供了对一个)简单的解释半导体发射器(和探测器)。

允许能带通过的是工作组,其显示的宽度能在图中,相隔一禁止区域(带隙)。

在上层能带称为导带,电子不一定要到移动单个原子都是免费的。

洞中有一个正电荷。

它们存在于原子电子的地点已经从一个中立带走,留下的电荷原子与净正。

自由电子与空穴重新结合可以,返回的中性原子状态。

能量被释放时,发生这种情况。

一个n -型半导体拥有自由电子数,如图图英寸6.1。

p型半导体有孔数自由。

当一种P型和一种N型材料费米能级(WF)的P和N的材料一致,并外加电压上作用时,产生的能垒如显示的数字所示。

重参杂材料,这种情况提供许多电子传到和过程中需要排放的孔。

在图中,电子能量增加垂直向上,能增加洞垂直向下。

因此,在N地区的自由电子没有足够的能量去穿越阻碍而移动到P区。

同样,空穴缺乏足够的能量克服障碍而移动进入n区。

当没有外加电压时,由于两种材料不同的费米能级产生的的能量阻碍,就不能自由移动。

外加电压通过升高的N端势能,降低一侧的P端势能,从而是阻碍减小。

如果供电电压(电子伏特)与能级(工作组)相同,自由电子和自由空穴就有足够的能量移动到交界区,如底部的数字显示,当一个自由电子在交界区遇到了一个空穴,电子可以下降到价带,并与空穴重组。

微芯片公司SyncServer S650高精确、安全和灵活的时间与频率标准说明书

微芯片公司SyncServer S650高精确、安全和灵活的时间与频率标准说明书

SyncServer® S650Accurate, Secure and Flexible Time and Frequency StandardFeatures•<15 ns RMS to UTC (USNO) through GPS •<1x10–12 frequency accuracy •Modular timing architecture with unique and innovative FlexPort™ technology •Popular timing signal inputs/outputs standard in the base timing I/O module(IRIG B, 10 MHz, 1PPS)•Four standard GbE ports with NTP hardware time stamping, two additional10 GbE ports optional•Web-based management with high-security cipher suite•–20°C to 65°C operating temperature, shock and vibration qualified •Rubidium Atomic Clock or OCXO oscilla-tor upgrades•Dual power supply option •Additional timecode I/O including IRIG A/B/C37/E/G/NASA/2137/XR3/HaveQuick/PTTI available•T1/E1 Telecom I/O available •Superior 10 MHz low phase noise options•Galileo/GLONASS/BeiDou/SBAS/QZSS option•PTP multi-port/profile output option •PTP input option•S650i model with no GNSS •DISA/DoDIN approved product Applications•FlexPort timing technology efficiently and cost-effectively adds innovative“any signal, any connector” technology,eliminating the wasted space inherentwith legacy style fixed-signal modules/BNCs•Best-in-class low phase noise 10 MHz outputs for satellite ground stations and radar systems•Multiple GbE network ports for easy network configuration and adaptation •Reliable and rugged design for long product life and wide application scope •Many security-hardened, network basedfeatures for stringent IA requirementsS650 with Timing I/O Modules(Optional Configuration)Unparalleled FlexibilityThe modular SyncServer® S650 combinesthe best of time and frequency instrumen-tation with unique flexibility and powerfulnetwork/security-based features.The base Timing I/O module with eightBNC connectors comes standard with themost popular Timing I/O signals (IRIG B, 10MHz and 1 PPS). When more flexibility isrequired, the unique FlexPort technologyoption enables six of the BNCs to outputmany supported signals (time codes, sinewaves, programmable periods), all configu-rable in real time through the secure webinterface. This incredibly flexible BNC-by-BNC configuration makes efficient andcost-effective use of the 1U space available.Similar functionality is applied to the twoinput BNCs, as well. Unlike legacy moduleswith fixed count BNCs outputting fixedsignal types per module, FlexPort technol-ogy can allow up to 12 BNCs to output anycombination of supported signal types.The Timing I/O module is also available withT1/E1 Telecom I/O, HaveQuick/PTTI I/O andfiber input/output connectors.Superior Low Phase Noise (LPN)PerformanceFor applications requiring superior LPN 10MHz signals, two different LPN modules areavailable. Each module has eight extremelyisolated 10 MHz LPN outputs, with eachmodule offering excellent levels of LPN orultra LPN performance.Robust Timing and DesignThe 72-channel GNSS receiver coupledwith Microchip's patented active thermalcompensation technology provides excellentaccuracy of <15 ns RMS to UTC (USNO). Thisin addition to a durable hardware designsubjected to MIL-STD-810H testing, high-reli-ability components extending the operatingtemperature range to –20°C to 65°C, anddual power supply options. Further, upgrad-ing to a high-performance oscillator, such asa Rubidium atomic clock, keeps SyncServerS650 accurate for long periods in the eventof a GNSS service disruption.Secure NetworkingSecurity is an inherent part of SyncServerS650. In addition to many security featuresand protocols, services can be selectivelydisabled. The four standard GbE ports, andtwo optional 10 GbE ports, can accommo-date 10,000 NTP requests per second usinghardware time stamping and compensa-tion. NTP monitoring, charting and MRUlogging assist in managing the NTP clientactivity. For more secure NTP operations,enable the optional security-hardened NTPReflector™ with line speed, 100% hardware-based NTP packet processing.Leverage Built-In HardwareSyncServer S650 includes many built-inhardware features enabled throughsoftware license keys, such as the security-hardened NTP Reflector, Galileo/GLONASS/BeiDou/QZSS support, and multi-port/pro-file IEEE 1588 PTP output/input operations.SyncServer S650, the future of time andfrequency, today. Four GbE Ports for Performance, Flexibility and SecurityThe S650 has four dedicated and isolated GbE Ethernet ports, each equipped with NTP hardware time stamping. These are connected to a high-speed microprocessor with microsecond-accurate timestamps to assure high-bandwidth NTP performance. This exceeds the need of servicing 10,000 NTP requests per second with no degrada-tion in time stamp accuracy.Multiple ports provide the flexibility to adapt to different network topologies as networks grow and change. An S650 can be the single time source to synchronize clients on different subnets and physi -cal networks. There is only one time reference, but it can appear as though there are four clocks available because each port is independent.NTP can be served on all four ports (six if 10 GbE ports are added). The highly secure web-based management interface is only available on port 1, so that administrators may choose to keep that IP address private and secure. Unique access control lists per port can govern server response to client requests for time.Intuitive, Secure and Easy-to-Use Web InterfaceThe modern web interface is the primary control interface of the S650. Once the keypad and display bring the unit online, complete status and control functions are easily found on the left navigation menu. A REST API also included.Standard Management Access SecurityAll of the expected network management protocols are standard in the S650. These include mandatory password access, HTTPS/SSL only (using the high-encryption cipher suite), SSH, access control lists, ser-vice termination, SNMPv2/v3, and NTP MD5 authentication. All traffic to the S650 CPU is bandwidth-limited for protection against DoSattacks. The local keypad on the server can be password-protected to prevent tampering.Security-Hardening OptionThe SyncServer S650 can be further hardened from both an NTP perspective and an authentication perspective through the Security Protocol License option that includes the security-hardened NTP Reflector.Operational hardening through the 360,000 NTP packet per second NTP Reflector with 100% hardware-based NTP packet processing also works with a CPU-protecting firewall by bandwidth limiting all non-NTP traffic. The Reflector also monitors packet flow for DoS detection and reporting, yet remains impervious to the level of network traffic as it operates at line speed.Authentication hardening is available for NTP client/server authenti-cation through the NTP Autokey function or user access authentica-tion through TACACS+, RADIUS and LDAP. Third party CA-signed X.509 certificates are installable for further hardening of manage -ment access and secure syslog operations. For more information about the Security Protocol License option, see the SyncServerOptions datasheet.The four GbE ports provide network configura -tion flexibility and enhanced security. Multiple isolated and synchronized time servers can also be configured. Two 10 GbE SFP+ ports can be added for NTP/PTP operations as well.At-a-glance dashboard presentation combined with logical organization andintuitive controls that make configuring the S650 easy.An entire drop-down menu in the S650 dedicated to security-related protocols.Unprecedented NTP AccuracyThe Stratum 1 level S650 derives nanosecond-accurate time directly from the atomic clocks aboard the GPS satellites. By using an integrated, 72-channel GNSS receiver, every visible satellite can be tracked and used to maintain accurate and reliable time. Even in urban canyon environments where direct satellite visibility can be limited, manually inputting the position can be sufficient to acquire accurate time from as few as one intermittent satellite.Ultra-High Performance NTPThe S650 can effortlessly support hundreds of thousands of network clients while maintaining microsecond-caliber NTP time stamp accuracy. NTP request throughput rates can exceed 10,000 requests/ second while maintaining NTP time stamp accuracy. NTP monitoring, charting and MRU logging assist in managing the NTP client activity. If the Security Protocol License option is enabled, the NTP Reflector can process over 360,000 NTP requests per second with 15-nanosecond caliber time stamp accuracy with the added benefit of security-hardening the network port.Superior Low Phase Noise PerformanceThe S650 can be optimized to provide the best possible low phase noise 10 MHz signals. Two LPN modules are available to choose from depending on the phase noise sensitivity of the user application. Each module has eight extremely isolated 10 MHz LPN outputs with each module offering excellent levels of LPN and Ultra LPN perfor-mance from the close in 1 Hz out to 100 kHz.Multi-Port/Profile IEEE 1588 PTP Grandmaster Applications demanding very precise time accuracy can require the IEEE 1588 precise time protocol (PTP). The S650 PTP Output License enables multi-port/profile PTP grandmaster operations leveraging the built-in hardware time stamping on each LAN port of the S650. IEEE 1588 PTP Input LicensePTP input is useful for tunneling time to the S650 over the network. PTP input can be the primary time reference or used as a backup reference in the event of GPS signal loss. With GPS, the S650 can automatically calibrate and store observed network path delay asym-metries for PTP input use if the GPS signal is lost.Multi-GNSS Constellation Support for Enhanced ReliabilityTiming integrity, continuity and reliability can be improved withthe GNSS option that adds support for Galileo, GLONASS, BeiDou, QZSS and SBAS constellations in addition to the standard GPS constellation. With more satellites in view, timing performance can be improved in challenging environments, such as urban canyons. SyncServer S650s ship with GNSS hardware ready to be enabled with a software license. The S650 is also available without GNSS in theS650i model.More Timing I/O StandardThe base S650 can host two modules. The Timing I/O modules are equipped with eight connectors for timing signal input and output. The standard configuration offers a broad yet fixed selection of signal I/Os that include IRIG B, 10 MHz and 1PPS.FlexPort—The Ultimate in Timing FlexibilityOur unique FlexPort technology efficiently and cost-effectively adds innovative “any signal, any connector” capabilities, eliminating the wasted space inherent with legacy style fixed signal modules.The FlexPort option enables the six output connectors (J3-J8) to output many supported signals (time codes, sine waves, program-mable periods) all configurable in real time through the secure web interface. User-entered, nanosecond caliber phase offsets for each connector output accommodates variable cable lengths. The two input connectors (J1-J2) can support a wide variety of input signal types.This level of timing signal flexibility is unprecedented and can even eliminate the need for additional signal distribution chassis as there is no degradation in the precise quality of the coherent signals.Oscillator Upgrades Improve Holdover Accuracy and Save Valuable TimeThe standard S650 is equipped with a crystal oscillator that keeps the S650 accurate to nanoseconds when tracking GPS. However, if GPS connectivity is lost and the server is placed in holdover, the oscillator begins to drift, impacting timing accuracy. Upgrading the oscillator improves the holdover accuracy significantly. For example, consider the following drift rates for the standard oscillator compared to theOCXO and Rubidium upgrades.The value of the upgraded oscillator is that if the GPS signal is lost, the S650 can continue to provide accurate time and frequency. This provides personnel time to correct the problem with only gradualdegradation or disruption in time synchronization accuracy.SpecificationsGNSS Receiver/Antenna• 72 parallel channel GNSS receiver• GPS time traceable to UTC (USNO)• Static and dynamic operational modes• Acquisition time of 30 seconds (cold start)• Cable length up to 900 feet (275 m).• GNSS option adds Galileo/GLONASS/BeiDou/SBAS/QZSS support in addition to GPSTime Accuracy at 1 PPS Output• Standard: <15 ns RMS to UTC (USNO), typical• OCXO: <15 ns RMS to UTC (USNO)• Rubidium: <15 ns RMS to UTC (USNO)After one day locked to GPS; evaluated over normal environment (test range <±5 °F) defined in GR-2830.Oscillator Aging (Monthly)• Standard: ±1×10–7• OCXO: ±5×10–9• Rubidium: ±1×10–10After one month of continuous operation.Holdover Accuracy (One Day)• Standard: 400 µs• OCXO: 25 µs• Rubidium: <1 µsEvaluated over normal environment (test range <±5 °F) defined in GR-2830 after five days locked to GPS.Frequency Output Accuracy and Stability• <1x10–12 at 1 day, after locked to GPS for 1 dayStandard Network Protocols• NTP v3,4 (RFC 1305/5905/8633), SNTP(RFC4330)• NTP v3,4 Symmetric keys: SHA1/256/512 and MD5• SNMP v2c, v3• SNMP MIB II, Custom MIB, system status via SNMP• DHCP/DHCPv6• HTTPS/SSL* (TLS 1.2/1.3)• SMTP forwarding• SSHv2• Telnet• IPv4/IPv6• Syslog: 1 to 8 servers (RFC 3164/5424)• Key management protocols can be individually disabled• Port 1: Management and Time protocols• Port 2, 3 and 4 (optional 5 and 6): Time protocols only Optional Network Protocols NTP Server Performance• 10,000 NTP requests per second while maintaining accuracy associated with reference time source.**• Stratum 1 through GNSS: overall server time stamp accuracy of5 μs to UTC with 1-sigma variation of 20 μs (typical). All NTP timestamps are hardware-based or have real-time hardware compen-sation for internal asymmetric delays. The accuracy is inclusive of all NTP packet delays in and out of the server, as measured at the network interface. NTP serves the UTC timescale by definition,but the user can choose to serve GPS timescale instead. The user can also select the UTC leap second smearing/slewing behavior.The SyncServer easily supports millions of NTP clients.• NTP Activity Charting and MRU Logging: A rolling 24 hour chart displays overall NTPd requests/minute activity. An NTPd MostRecently Used (MRU) list provides details on the most recent 1024 NTP client IP addresses. Data is sortable and exportable. Selec-tion of an individual IP address charts the NTP request totals in 30 minute increments over the past 24 hours. These tools are useful to verify an NTP client is reaching the SyncServer and to identify NTP clients that may be requesting the time more frequently than desired.• NTP Reflector option: 360,000 NTP client mode three requests per second. NTP packets are timestamped 100% in hardware with prevailing clock accuracy. All non-NTP packets are provided to the CPU on a bandwidth-limited basis. The NTP Reflector is included as part of the Security Protocol License option.NTP Activity Chart• Autokey (RFC5906)• PTP• TACACS+• LDAPv3• RADIUS• X.509 certificates for HTTPSand secure syslogRolling 24-hour NTPd activity chart to accompany Most Recently Used (MRU) listwith individual NTPd client activity details and chart.*SSL_High_Encryption Cypher suite or the SSL_High_And_Medium_Encryption Cypher suite.**<5% NTPd packet drop at 10,000 NTPd requests per second. See SyncServer BlueSkyoption data sheet for performance specifications if BlueSky validator is enabled (optional)Mechanical/EnvironmentalShock and VibrationFront PanelRear PanelProduct IncludesS650SyncServer S650 (no option modules installed in base unit), locking power cord, rack mount ears and a two-year hardware warranty. Current manual and MIB are available online at . MIB and REST API can also be downloaded from the SyncServer.S650iSyncServer S650i (no GNSS receiver), one Timing I/O module, locking power cord, rack mount ears and a two-year hardware warranty. Current manual and MIB are available online at . MIB and REST API can also be downloaded from the SyncServer.S650 With Two Standard Timing I/O Modules (Optional Configuration)Ordering InformationCustom configure your build-to-order SyncServer S650 using theonline SyncServer Configurator tool at . Configura -tions can be submitted as requests for quotes.Note: The SyncServer S650 is TAA CompliantNote: The SyncServer S650 is on the DISA/DoDIN Approved Products ListThe Microchip name and logo, the Microchip logo and SyncServer are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. All other trademarks mentioned herein are property of their respective companies. © 2022, Microchip Technology Incorporated and its subsidiaries. All Rights Reserved. 4/22 900-00716-00 Rev N DS00002901FHardware OptionsTiming I/O Module(s)Equipped with eight connectors for timing signal input and output, the standard configuration offers a broad yet fixed selection of signal I/O, including IRIG B, 10 MHz and 1PPS. Five variations of the Timing I/O Module are available as listed below. See the SyncServer Options Datasheet (DS00002920) for more signal types.• Timing I/O Module• Timing I/O Module + Telecom I/O • Timing I/O Module + HaveQuick/PTTI • Timing I/O Module + Fiber Outputs • Timing I/O Module + Fiber Input10 MHz Standard Low Phase Noise ModuleEight isolated, phase-coherent 10 MHz LPN outputs, with excellent levels of LPN and exhibiting low spurious noise characteristics.10 MHz Ultra-Low Phase Noise ModuleSuperior levels of LPN provided on eight extremely isolated, phase-coherent 10 MHz LPN outputs with low spurious noise characteristics.10 GbE LAN PortsTwo additional 10 GbE SFP+ ports equipped with hardware time stamping that supports NTP, PTP and NTP Reflector operations.Rubidium Atomic Oscillator UpgradeImproves stability, accuracy, and holdover accuracy. Holdoveraccuracy is <1 μs for the first 24 hours and <3 μs after the first three days.OCXO Oscillator UpgradeImproves holdover accuracy to 25 μs for the first day.Dual AC Power SuppliesThe dual-corded, dual-AC power supply option provides load sharing and active power management system with hitless failover.Dual DC Power SuppliesThe dual-corded, dual-DC power supply option provides load sharing and active power management system with hitless failover.Antenna AccessoriesAntenna cables and accessories enable versatile solutions to meet most installation requirements.Note: For complete information, see the SyncServer Options Datasheet (DS00002920).Software OptionsSecurity Protocol License with Security-Hardened NTP ReflectorSecurity-hardened NTP Reflector and authentication hardening with NTP Autokey, TACACS+, RADIUS, LDAP and CA-signed X.509 certificates.PTP Output/Grandmaster(Simultaneous Multi-Port/Profile)Single license enables multi-port, multi-profile IEEE 1588 PTP Grand -master operations leveraging the built-in hardware time stamping in all SyncServers.PTP InputPTP as a timing input for tunneling time through PTP or as a backup time reference in the event of the loss of the GNSS signal.FlexPort Technology for Timing I/O ModulesEnables the output connectors to output many supported signals (time codes, sine waves, programmable rates) all configurable in real time. Input connectors can support a wide variety of input signal types.Multi-GNSS ConstellationTrack GPS/SBAS, Galileo, QZSS, GLONASS and/or BeiDou constel-lations for improved integrity and satellite visibility in an urban canyons.1PPS Time Interval/Event Time MeasurementsUse the S650 Timing I/O module to measure, store and statistically display in real time the difference of an external 1PPS relative to the S650. The Event Time capture feature time tags and stores external events.Time-Triggered Programmable PulseProvides a user defined, repetitive and precise time-of-day pulse(s) at specific times or provides periodic, time-based pulse outputs.BlueSky GPS Jamming and Spoofing Detection, Protection, AnalysisDetect GPS jamming and spoofing related anomalies in real-time to protect essential time and frequency outputs.Synchronization SoftwareComprehensive MS Windows-based network time synchronization software with monitoring and auditing functions.Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights unless otherwise stated.。

量子限域效应英文

量子限域效应英文

量子限域效应英文Quantum Confinement EffectIntroduction:The quantum confinement effect is a phenomenon that occurs when the size of a material becomes comparable to or smaller than the characteristic length scale of quantum mechanical phenomena. This effect leads to unique physical properties and has significant implications in various scientific and technological fields. In this article, we will explore the concept of quantum confinement and its impact on nanoscale materials.Overview of Quantum Confinement:Quantum confinement refers to the restriction of electron or hole motion in a material due to the spatial confinement of their wave functions. When the dimensions of a material are reduced to a scale comparable to the de Broglie wavelength of the charge carriers, their behavior becomes subject to quantum mechanical laws. As a result, the energy levels and properties of the material change, giving rise to quantum confinement effects.Quantum Dots:One manifestation of quantum confinement is seen in quantum dots. Quantum dots are nanoscale semiconductor particles with a diameter ranging from a few nanometers to tens of nanometers. At this size scale, electrons and holes are confined within the dot, leading to discrete energy levels, often referred to as energy "bands." These energy bands are determined by the sizeand shape of the quantum dot, offering control over the electronic properties of the material.The discrete energy levels of quantum dots impart them with unique optical and electrical characteristics. Due to quantum confinement, they exhibit a phenomenon called size-dependent light emission. This property arises from the direct relationship between the bandgap energy and the size of the quantum dot. As the size decreases, the bandgap increases, resulting in a shift towards higher energy emission wavelengths. This tunability has led to significant advancements in optoelectronics and photonics.Nanowires and Nanotubes:Another example of quantum confinement can be observed in nanowires and nanotubes. These one-dimensional nanostructures exhibit quantum confinement effects along their longitudinal axis. The confinement of electrons and holes within the nanowire or nanotube results in discrete energy levels, providing possibilities for tailoring their electrical conductivity and optical properties.Nanowires and nanotubes are widely investigated for their potential applications in nanoelectronics and nanophotonics. Their size-dependent electrical conductivity and enhanced charge transport properties make them promising candidates for future electronic devices. Moreover, their large aspect ratios and unique optical properties enable them to be utilized in sensors, solar cells, and other optoelectronic devices.Quantum Well Structures:Quantum confinement effects are also observed in quantum well structures. These are thin semiconductor layers sandwiched between materials with larger bandgaps. The confinement of charge carriers in the quantum well layer leads to quantization of energy levels perpendicular to the layers, resulting in discrete energy bands.Quantum well structures find applications in various optoelectronic devices, such as lasers and light-emitting diodes (LEDs). By tailoring the width of the quantum well layer, the emitted wavelength of the device can be precisely controlled. This ability to engineer the properties of devices based on the quantum confinement effect has revolutionized the field of semiconductor optoelectronics.Conclusion:In conclusion, the quantum confinement effect plays a crucial role in determining the physical properties of nanoscale materials. Understanding and utilizing this phenomenon has opened up new opportunities for the design and development of innovative technologies. From quantum dots to nanowires and quantum well structures, the ability to manipulate the behavior of charge carriers at the nanoscale has revolutionized various fields of science and engineering. As researchers continue to explore and harness the advantages of quantum confinement, it is expected that further advancements and breakthroughs will emerge, leading to exciting applications in the future.。

平板电容器问题边界元法奇异性处理及正则化

平板电容器问题边界元法奇异性处理及正则化

论对 病态线性代数方程组进行处 理 , 克服 了其不适定 性.使用平板 电容器检测木材含水率 问题 的数值计 算结果 表明 , 奇
异积 分和病态矩阵 的处理是正确有效 的 , 该结果可 应用于解决工程实 际问题.文中所提 出的方法 可 以方便地 推广到类 似的复杂边界问题 的数值求解 中去. 关键 词 : 边界元积分方 程 ; 奇异性 ; 解析积分法 ; 正则化
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量子纠缠 双缝干涉 英语 范例

量子纠缠 双缝干涉 英语 范例

量子纠缠双缝干涉英语范例Engaging with the perplexing world of quantum entanglement and the double-slit interference phenomenon in the realm of English provides a fascinating journey into the depths of physics and language. Let's embark on this exploration, delving into these intricate concepts without the crutchesof conventional transition words.Quantum entanglement, a phenomenon Albert Einstein famously referred to as "spooky action at a distance," challengesour conventional understanding of reality. At its core, it entails the entwining of particles in such a way that the state of one particle instantaneously influences the stateof another, regardless of the distance separating them.This peculiar connection, seemingly defying the constraints of space and time, forms the bedrock of quantum mechanics.Moving onto the enigmatic realm of double-slit interference, we encounter another perplexing aspect of quantum physics. Imagine a scenario where particles, such as photons or electrons, are fired one by one towards a barrier with twonarrow slits. Classical intuition would suggest that each particle would pass through one of the slits and create a pattern on the screen behind the barrier corresponding tothe two slits. However, the reality is far more bewildering.When observed, particles behave as discrete entities, creating a pattern on the screen that aligns with the positions of the slits. However, when left unobserved, they exhibit wave-like behavior, producing an interferencepattern consistent with waves passing through both slits simultaneously. This duality of particle and wave behavior perplexed physicists for decades and remains a cornerstoneof quantum mechanics.Now, let's intertwine these concepts with the intricate fabric of the English language. Just as particles become entangled in the quantum realm, words and phrases entwineto convey meaning and evoke understanding. The delicate dance of syntax and semantics mirrors the interconnectedness observed in quantum systems.Consider the act of communication itself. When wearticulate thoughts and ideas, we send linguistic particles into the ether, where they interact with the minds of others, shaping perceptions and influencing understanding. In this linguistic entanglement, the state of one mind can indeed influence the state of another, echoing the eerie connectivity of entangled particles.Furthermore, language, like quantum particles, exhibits a duality of behavior. It can serve as a discrete tool for conveying specific information, much like particles behaving as individual entities when observed. Yet, it also possesses a wave-like quality, capable of conveying nuanced emotions, cultural nuances, and abstract concepts that transcend mere words on a page.Consider the phrase "I love you." In its discrete form, it conveys a specific sentiment, a declaration of affection towards another individual. However, its wave-like nature allows it to resonate with profound emotional depth, evoking a myriad of feelings and memories unique to each recipient.In a similar vein, the act of reading mirrors the double-slit experiment in its ability to collapse linguistic wave functions into discrete meanings. When we read a text, we observe its words and phrases, collapsing the wave of potential interpretations into a singular understanding based on our individual perceptions and experiences.Yet, just as the act of observation alters the behavior of quantum particles, our interpretation of language is inherently subjective, influenced by our cultural background, personal biases, and cognitive predispositions. Thus, the same text can elicit vastly different interpretations from different readers, much like the varied outcomes observed in the double-slit experiment.In conclusion, the parallels between quantum entanglement, double-slit interference, and the intricacies of the English language highlight the profound interconnectedness of the physical and linguistic worlds. Just as physicists grapple with the mysteries of the quantum realm, linguists navigate the complexities of communication, both realmsoffering endless opportunities for exploration and discovery.。

安捷伦示波器使用方法

安捷伦示波器使用方法

安捷伦⽰波器使⽤⽅法Jitter Analysis Techniques Using an Agilent Infiniium OscilloscopeProduct NoteIntroductionWith higher-speed clocking and data transmission schemes in the computer and communications industries, timing margins are becoming increasingly tight.Sophisticated techniques are required to ensure that timing margins are being met and to find the source of problems if they are not.This product note discussesvarious techniques for measuring jitter and points out theiradvantages and disadvantages. It describes how to set up an Agilent Infiniium oscilloscope to make effective jitter measure-ments and the accuracy of these measurements. Some of themeasurement techniques are only available on Agilent 54845A/B and 54846A/B oscilloscopes with version A.04.00 or later software.These measurement techniques are indicated as such in the text.Jitter FundamentalsJitter is defined as the deviation of a transition from its ideal time.Jitter can be measured relative to an ideal time or to another transition. Several factors can affect jitter. Since jitter sources are independent of each other,a system will rarely encounter a worst-case jitter scenario. Only when each independent jitter source is at its worst and is aligned with the other sources will this occur. As a result, jitter is statistical in nature. Predicting the worst-case jitter in a system can take time.Jitter can be broken down into two categories:Random jitter is uncorrelated jitter caused by thermal or other physical, randomprocesses. The shape of the jitter distribution is Gaussian.For example, a well-behaved phase lock loop (PLL) wanders randomly around its nominal clock frequency.?Deterministic or systematic jitter can be caused by inter-symbol interference,crosstalk, sub-harmonicdistortion and other spurious events such as power-supply switching. It is important to understand the nature of the jitter to help diagnose its cause and, if possible, correct it. Deterministic jitter is more easily reduced or eliminated once the source has been identified.Jitter Measurement TechniquesThis product note will discuss four methods that can be used to characterize jitter in a system:Infinite persistenceHistogramsMeasurement statisticsMeasurement functionsInfinite PersistenceAgilent’s Infiniium oscilloscopes present several different views of jitter. One way to measure jitter is to trigger on one waveform edge and look at another edge while infinite persistence is turned on. To use this technique, set up the scope to trigger on a rising or falling edge and set the horizontal scale to examine the next rising or falling edge. In the Display dialog box, set persistence to infinite.This technique measurespeak-to-peak jitter and does not provide information about jitter distribution. Infinite persistence is easy to set up and will acquire data quickly, giving you the best chance to see worst-case jitter. However, since the tails of the jitter distribution theoretically go on forever, it will take a long time to measure the worst-case, peak-to-peak jitter.It is important to understandtheerror sources of this measurement. This technique is subject to oscilloscope trigger jitter–the largest contributor to timingerror in an oscilloscope. Trigger jitter results from the failure to place the waveform correctly relative to when a trigger event occurs. Since the infinite persistence technique overlaps multiple waveform acquisitions onto the scope display, and each acquisition is subject to trigger jitter, the accuracy of this technique can be limited. If your jitter margins are being met using this technique, then more advanced measurement techniques are not necessary. This product note will discuss Infiniium’s timebase and trigger specifications in detail in alater section.HistogramsThis technique not only shows worst-case jitter, but also gives a perspective on jitter distribution. Histograms do not acquire infor-mation as quickly as infinite persistence since each acquisition must be counted in the histogram measurement.To set up a histogram, trigger on an edge and set the horizontalscale and position so that you canview the next rising or fallingedge. In the Histogram dialog box,turn on a horizontal histogramand set both Y window markersto the same voltage. For example,if a clock threshold is at 800 mV,set both Y markers to this voltage.Set the X markers to the left andright of the edge (figure 1). Figure 1. Histogram of edge showing bi-modal distribution23It is often possible to determine if the jitter is random or deter-ministic by the shape of the histogram. Random jitter will have a Gaussian distribution.Infiniium displays the percentage of points within mean +/- 1, 2,and 3 standard deviations to help in determining how Gaussian the distribution is. For a Gaussian distribution these values should be 68%, 95%, and 99.7%, respec-tively. Non-Gaussian distributions usually indicate that the jitter has deterministic components.This technique has the same limitation on accuracy as the infinite persistence technique.Multiple acquisitions contribute to the histogram and they all contain the oscilloscope trigger jitter mentioned above. Measurement StatisticsThe next method involvescomputing statistics on waveform measurement results. For example,the scope can measure the period of a waveform on successive acquisitions. Simply drag the period measurement icon to the waveform that is to be measured.The statistics will indicate the mean, standard deviation, and min and max of the period measurements. You can let the scope run for a while to determine the amount of clock jitter present. This measurement is not subject to trigger jitter because it is a delta-time or relative measure-ment. Even if the waveform is not placed correctly relative to the trigger, the edges are measuredaccurately relative to each other.Figure 2. Setting up a jitter measurementThis measurement is subject to the timebase stability of the instrument, which is typically very good. This is a valid measurement technique but is slow to gather statistical information. Since the scope acquires a waveform, makes a measurement, and then acquires a waveform at a later time, most clock periods are not measured.With this technique, it is impossible to see how the period jitter varies over short periods of time. For example, if you have spread-spectrum clocking, this measurement will lump the slowest and fastest periods together.The Agilent 54845A/B and54846A/B Infiniium oscilloscopes can compute statistics on every instance of a measurement in asingle acquisition. To enable this capability, select the Jitter tab,then check “Measure all edges” in the Measurement Definitions dia-log box (figure 2).For example, instead of only measuring the first period on every acquisition or trigger event,every period can be measured and statistics gathered. This greatly increases the speed at which statistics are gathered and reduces the overall time to make jitter measurements. Statistics are accumulated across allmeasurements in the acquisition and across acquisitions.Pressing “Clear Display” will reset the measurement statistics.This feature is useful if you are probing the clock at different locations and want to reset the measurements.It is important to set up the scope correctly to make effective jitter measurements. Set the vertical scale of the channel being measured to offer the largest waveform that will fit on screen vertically. This will make the most effective use of the scope’s A/D converter.The scope should be set toreal-time acquisition mode inthe Acquisition dialog box. Since equivalent-time sampling can combine samples from different acquisitions, the scope’s trigger jitter would adversely affect jitter measurements. The averaging function should be turned off since, again, this combines multiple acquisition data.You may want to set the scopeto its maximum memory depth. This will make the scope less responsive to operate, but the scope can make many measure-ments on a single acquisition. Since jitter measurements are statistical, many measurements are desirable. Taking many acquisitions of small records will give a more random selection but will take longer than fewer large acquisitions. Having extremely deep memory is not necessary to getting good jitter measurements. Normally, measurements aremade at 10%, 50%, and 90% of thewaveform amplitude. This isconvenient for quickly makingmeasurements; however, whenmaking measurements acrossacquisitions and combiningtheir statistics this is not thebest solution.In the Measurement Definitiondialog box, Thresholds tab, themeasurement thresholds shouldbe set to absolute voltages. Forexample, if you are makingcycle-cycle jitter or periodmeasurements, set the middlevoltage threshold to your clockthreshold. Set the upper andlower voltage thresholds toroughly +/- 10% of the signalamplitude in voltage. This willestablish a band around thethreshold that the edge must gothrough to be measured and willeliminate false edge detection.In addition to the period jitter measurement, the cycle-cycle jitter measurement uses the same technique. The cycle-cycle jitter measurement, available on Agilent 54845A/B and 54846A/B oscilloscopes, is the differenceof two consecutive period measurements.Pi – P(i-1), 2 ≤i ≤nWhereP is a period measurement and n is the number of periods inthe waveform.Cycle-cycle jitter is a measure of the short-term stability of a clock. It may be acceptable for the clock frequency to change slowly over time but not vary from cycle to cycle. For this measurement, every period in the acquisition is measured regardless of how the “Measure all edges” selection is set. In this case, the statistics represent all of the cycle-cycle jitter measurements in one acquisition, or all acquisitionsif the scope is running.If absolute clock stability is required, then a period measurement should be made. If your system can track with small changes in the clock frequency, then cycle-cycle jitter should be measured.Again, if your timing marginsare being met with thistechnique, more advancedtechniques are not necessary. Itis only fairly recently that tightertiming margins have causedengineers to need other jittermeasurement techniques.45Measurement FunctionAgilent 54845A/B and 54846A/B Infiniium oscilloscopes can plot measurement results correlated to the signal being measured. For example, if every period is meas-ured, as in the case above, the measurement function will plot period measurement results on the vertical axis, time-correlated to the waveform that the period measurement is measuring (figure 3).In this example, the secondperiod is slightly longer than the first. The third period is shorter than the second. Also notice that the lengths of the measurement function lines correspond to the period and their placement corresponds to channel 1 because we are measuring period on channel 1.Using this technique, the shape of the jitter is apparent. For example, with spread-spectrum clocking you can see the modulation frequency as the period gets progressively slower and faster. This allows you to see sinusoidal shapes or other patterns in the measurement function plot (figure 4). It is also possible to correlate poor jitter results with the source waveform that caused them. This can aid not only in your design but can also ensure that the scope is measuring appropriate voltage levels when gatheringjitter statistics.Figure 3. Measurement function on a few cyclesFigure 4. Measurement function on many cyclesTo turn on the measurement function, first turn on the desired measurement to track. Measurements that can be tracked with the measurement function are rise time, fall time, period, frequency, cycle-cycle jitter, + width, - width and duty cycle. The measurement function is enabled in the Waveform Math dialog box (figure 5). Select a function that is a different color than the channel you are measuring to make it easier to see. Set the function operator to “measurement.” Select the measurement you wish to track and turn on the measurement function. The math function now plots the measurement results on the vertical axis, time-correlated to the channel being measured. Only one measurement function can be enabled at a time; however, the function can beset to track any of the currently active measurements listed above.Set up the acquisition by selectingthe maximum memory depth inthe Acquisition dialog box. Turnoff averaging and Sin(X)/Xinterpolation in the Acquisitiondialog box. Set the sample rateso that you are getting at leastseveral sample points on theedges that you are measuring.Measurements are made on thedata that is windowed by thescreen. To see something slowerthat may be coupling into yourclock, for example, you will needto compress the channel data onthe screen.Now that the memory depth andsample rate are fixed, you canadjust the horizontal scale sothat all of the acquired data ison screen. In order to make fulluse of the A/D converter andseparate the waveforms on thedisplay, you may want to split thegrid into two parts. If you havea very dense waveform that isbeing measured, it will be nearlyimpossible to see the measurementfunction on top of it. Turn on thesplit grid in the Display dialog box. Figure 5. Setting up a measurement function6Sources of Measurement ErrorIn this section we will examine some of the principal sources of jitter measurement error. For best accuracy, the scope should be making measurements at the same temperature as when the scope was last calibrated. If the temperature has varied by more than 5 degrees, the softwareself-calibration should be performed again. The Calibration dialog box shows the change from the calibration temperature. Trigger JitterThe most common source of error across multiple acquisitions is trigger jitter. This is the error associated with placing the first point and all subsequent points of the waveform relative towhen the trigger occurs.For Infiniium models 54830B, 54831B, and 54832B, trigger jitter is 8 ps RMS. For the 54845A/B and 54846A/B, trigger jitter is8ps RMS. Figure 6 shows a 54845B measuring its trigger jitter using its own aux out signal. If the jitter is Gaussian, youcan convert RMS jitter topeak-to-peak jitter by multiplyingthe RMS jitter by 6. Trigger jitteris only relevant if you aremeasuring absolute times asopposed to relative times. Forexample, the histogram techniquedescribed above has this errorsource, but a period measurementdoes not since it is a delta-time orrelative measurement.Figure 6. Histogram of trigger jitterThis source of error can also bepresent in period measurementsif the scope is in equivalent time.In equivalent time, the scope maycombine data points from multipleacquisitions. The scope alsocombines points from multipleacquisitions in real-time averagingmode. If it is possible, jittermeasurements should be maderelative to other edges inreal-time, non-averaged mode.78Sources of Measurement Error (continued)Timebase StabilityInfiniium uses a highly stable crystal oscillator as a source for the sample clock. Errors resulting from instability of the timebase are the least significant. Timebase stability is not a specified quantity but is typically 5 ps RMS for the 54845 and 54846. For the 54830,54831, and 54832, it is typically 2ps RMS. These measurements were made at the sametemperature as the calibration.Vertical NoiseErrors in the vertical portion of the signal path including the A/D converter and preamplifier also contribute to the scope’s jitter.Any misplacement of thewaveform vertically will translate through the slew rate of the signal into time error (figure 7). If the slew rate of the signal atthe point of measurement issteep, then the vertical error will translate into a small time jitter.If the slew rate is slow, however,this can be the most significantsource of error.Figure 7. How vertical errors contribute to time errorsAliasing and InterpolationFrom the previous section, it is clear that the signal should have a high slew rate to alleviate vertical errors. However, this can lead to signal aliasing. If the signal is not sampled sufficiently, significant time errors will be present up to the sample interval. When the scope makes measurements, it interpolates the samples above and below the measurement threshold to get the time of the level crossing. If the interpolation filter is enabled, up to 16interpolated points may be placed between two adjacent acquisition samples. Beyond this, linearinterpolation is used to determine the threshold crossing times.However, samples will only be added if the record length is less than 16K samples.A Case StudyTo illustrate how to use the jitter analysis capability of an Agilent Infiniium oscilloscope, let’s examine a typical problem. You suspect that your power supply or another slower speed clock is coupling into the main clock on the board that you are designing. In order to understand how to eliminate the problem, you would like to know the frequency and wave shape of the signal that is coupling into your clock. Traditionally, you would use an FFT magnitude spectrum and look at the side bands from the fundamental. For example, in figure 8 we have acquired a long record of a number of clock pulses and computed the FFT magnitude with a waveform math function. After we zoom in on the fundamental frequency of the clock, you can see side bands.If we take the difference in frequency from the fundamental to the nearest side band, we can determine the frequency of the coupling signal. In this example, it is measured at 198 kHz. We can also notice the odd harmonics and guess that the coupling signal would not be a sine wave. The resolution of the FFT will not give us a great deal of accuracy in determining the frequency, and we can not really see the shape of the coupling signal.To solve this problem using thejitter analysis capability, we needto think about the problem in adifferent way. If a slower signalwere modulating a higherfrequency signal, then we wouldexpect the period of the higherfrequency signal to get slightlylonger, then slightly shorter, etc.,according to the slower signal(figure 8). The measurementfunction method described earlierin this product note could beused to plot how the periodchanges across the waveform.To set up the scope, acquirethe channel data with a longacquisition record in real-timeacquisition mode. Put all of thewaveform on screen by settingthe sample rate to manual andadjusting the time per division.This will allow you to see how theperiod varies across the entireacquisition. In the MeasurementDefinitions dialog box, Jitter tab,set the control to Measure AllEdges (figure 2). Now, turn ona period measurement. In theMath dialog box, turn on theMeasurement function and setto the period measurement. Figure 8. FFT of clock910A Case Study (continued)You can now see how the period measurement varies across the signal (figure 9). Adjust the time per division until you can see several periods of the slower speed signal in the measurement function. To measure the frequency, use the markers or simply drag the frequencymeasurement to the measurement function. Using this technique, we measure 197 kHz and we can see that the signal is a square wave.This confirms that another signal on the board is coupling into the clock. Armed with this knowledge,we are better equipped to find a solution.SummaryThis product note presents several methods for measuring jitter with Agilent’s Infiniium oscilloscopes. The following quick reference will help you choose the best method for a number of circumstances. Infinite PersistenceShows absolute time or edge jitter Works best when the jitter to be measured is greater than the scope’s jitter Sets up easily ?Acquires data quickly ?Measures only worst-case,peak-to-peak jitterFigure 9. Measurement function showing coupling signalHistogramsShows absolute time or edge jitter Works best when the jitter to be measured is greater than the scope’s jitter Shows a distribution of the jitterHelps determine if the jitter is random or deterministic Measures worst-case, peak-to-peak jitter Measures RMS jitterMeasurement StatisticsShows worst-case, peak-to-peak delta time or measurement jitter Sets up easily Measurement FunctionsShows how measurements vary as a function of timeShows the shape and frequency of a jitter source Helps determine if the jitter is random or deterministic/doc/e26170104431b90d6c85c778.htmlAgilent Technologies’ Test and Measurement Support, Services, and AssistanceAgilent Technologies aims to maximize the value you receive, while minimizing your risk and problems. We strive to ensure that you get the test and measurement capabilities you paid for and obtain the support you need. Our extensive support resources and services can help you choose the right Agilent products for your applications and apply them successfully. Every instrument and system we sell has a global warranty. Support is available for at least five years beyond the production life of the product. Two concepts underlie Agilent's overall support policy: "Our Promise" and "Your Advantage."Our PromiseOur Promise means your Agilent test and measurement equipment will meet its advertised performance and functionality. When you are choosing new equipment, we will help you with product information, including realistic performance specifications and practical rec-ommendations from experienced test engineers. When you use Agilent equipment, we can verify that it works properly, help with product operation, and provide basic measurement assistance for the use of specified capabilities, at no extra cost upon request. Many self-help tools are available.Your AdvantageYour Advantage means that Agilent offers a wide range of additional expert test and meas-urement services, which you can purchase according to your unique technical and business needs. Solve problems efficiently and gain a competitive edge by contracting with us for cal-ibration, extra-cost upgrades, out-of-warranty repairs, and on-site education and training, as well as design, system integration, project management, and other professional engineering services. Experienced Agilent engineers and technicians worldwide can help you maximize your productivity, optimize the return on investment of your Agilent instruments and sys-tems, and obtain dependable measurement accuracy for the life of those products./doc/e26170104431b90d6c85c778.html /find/emailupdatesGet the latest information on the productsand applications you select.By internet, phone, or fax, get assistance with all your test & measurement needsOnline assistance:/doc/e26170104431b90d6c85c778.html /find/assistPhone or FaxUnited States:(tel) 800 452 4844Canada:(tel) 877 894 4414(fax) 905 282 6495China:(tel) 800 810 0189(fax) 800 820 2816Europe:(tel) (31 20) 547 2323(fax) (31 20) 547 2390Japan:(tel) (81) 426 56 7832(fax) (81) 426 56 7840Korea:(tel) (82 2) 2004 5004(fax) (82 2) 2004 5115Latin America:(tel) (305) 269 7500(fax) (305) 269 7599Taiwan:(tel) 0800 047 866(fax) 0800 286 331Other Asia Pacific Countries:(tel) (65) 6375 8100(fax) (65) 6836 0252Email: tm_asia@/doc/e26170104431b90d6c85c778.htmlProduct specifications and descriptions in this document subject to change without notice. Agilent Technologies, Inc. 2002 Printed in USA October 15, 20025988-6109EN。

simulink常用模块中英文对照

simulink常用模块中英文对照

Sources 库Band-Limited White Noise 把一个白噪声引入到连续系统中Chirp Signal 产生频率增加的正弦信号Clock 显示或者提供仿真时间Constant 产生一个常数值Digital Clock 按指定的间隔产生采样时间Digital Pulse Generator 产生具有固定间隔的脉冲From File 从一个文件读取数据From Work space 从在工作空间定义的矩阵读入数据Pulse Generator 产生固定间隔的脉冲Ramp 产生一个以常数斜率增加或者减小的信号Random Number 产生正态分布的随机数Repeating Sequence 产生一个可重复的任意信号Signal Generator 产生多种多样的信号Sine Wave 产生正弦波Step 产生一个单步函数Uniform Random Number 产生均匀分布的随机数Sinks库Display 显示其输入信号的值Scope 显示在仿真过程产生的信号的波形Stop Simulation 当它的输入信号非零时,就结束仿真To File 写数据到文件To Workspace 把数据写进工作空间里定义的矩阵变量XY Graph 用一个MATLAB图形窗口来显示信号的X-Y坐标的图形Discrete Filter 实现IIR和FIR滤波器Discrete State-Space 实现一个离散状态空间系统Discrete-Time Integrator 离散时间积分器Discrete Transfer Fcn 实现一个离散传递函数Discrete Zero-Pol 实现一个用零极点来说明的离散传递函数First-Order Hold 实现一个一阶保持采样-保持系统Unit Delay 将信号延时一个单位采样时间Zero-Order Hold 实现具有一个采样周期的零阶保持Continuous库Derivative 输出输入信号的微分Integrator 积分一个信号Memory 输出来自前一个时间步的模块输入State-Space 实现现行状态空间系统Transfer Fcn 实现现行传递系统Transport Delay 将输入延迟一给定的时间Variable Transport Delay 将输入延迟一可变的时间Zero-Pole 实现一个用零极点标明的传递函数Nonlinear库Abs 输出输入信号的绝对值Algebraic Constraint 将输入信号约束为零Combinatorial Logic 实现一个真值表Complex to Magnitude-Angle 输出一个复数输入信号的相角和模长Complex to Real-Imag 输出一个复数输入信号的实部和虚部Derivative 输出输入信号的时间微分Dot Product 进行点积Gain 将模块的输入信号乘上一个增益Logical Operator 在输入信号实施一个逻辑操作Magnitude-Angle to Complex 从模长和角度的输入输出一个复数信号Math Function 实现一个数学函数Matrix Gain 将输入乘上一个矩阵MinMax 输出输入信号的最小和最大值Product 输出模块的乘积或者是商Real-Imag to Complex 将输入信号作为是实部和虚部来乘复数信号输出Relational Operator 在输入上进行指定的关系运算Rounding Function 实现一个舍入函数Sign 显示输入信号的符号Slider Gain 按一条斜线来改变标量增益Sum 产生输入信号的和Trigonometric Function 实现一个三角函数Math库Fcn 将一个指定的表达式到输入信号Look-Up Table 实现输入的线性峰值匹配Look-Up Table (2-D) 实现两个信号的线性峰值匹配MATLAB Fcn 应用一个MATLAB函数或表达式到输入S-Function 访问S函数Function &Table库Backlash 对一个具有演示特性的系统进行建模Coulomb & Viscous Friction 刻画在零点的不连续性Dead Zone 提供一个零输出的区域Manual Switch 在两个信号间切换Quantizer 按指定的间隔离散化输入信号Rate Limiter 限制信号的改变速率Relay 在两个常数间切换输出Saturation 限制信号的持续时间Switch 在两个信号间切换Signal &Systems库Bus Selector 有选择的输出输入信号Configurable Subsystem 代表任何一个从指定的库中选择的模块Data Store Memory 定义一个共享的数据存储空间Data Store Read 从共享数据存储空间读数据Data Store Write 写数据到共享数据存储空间Data Type Conversion 将一个信号转换为另外一个数据类型Demux 将一个向量信号分解输出Enable 增加一个使能端到子系统中From 从一个Goto模块接收输入信号Goto 传递模块输入到From模块Goto Tag Visibility 定义一个Goto模块标记的可视视域Ground 将一个未连接的输入端接地Hit Crossing 检测过零点IC 设置一个信号的初始值Inport 为一个子系统建立一个输入端口或者建立一个外部输入端口Merge 将几个输入线合并为一个标量线Model Info 显示、修订控制模型信息Mux 将几个输入信号联合为一个向量信号Outport 为子系统建立一个输出端口,或者是建立一个外部输出端口Probe 输出输入信号的宽度、采样时间并且/或者信号类型Subsystem 表示在另一个系统之内的子系统Terminator 结束一个未连接的输出端口Trigger 增加一个出发端口到子系统Width 输出输入向量的宽度。

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Bounding Loop Iterations for Tiห้องสมุดไป่ตู้ing Analysis
Christopher Healy∗ Mikael Sjödin† Viresh Rustagi‡ David Whalley∗ Abstract
Static timing analyzers need to know the minimum and maximum number of iterations associated with each loop in a real-time program so accurate timing predictions can be obtained. This paper describes three complementary methods to support timing analysis by bounding the number of loop iterations. First, an algorithm is presented that determines the minimum and maximum number of iterations of loops with multiple exits. Second, the loopinvariant variables on which the number of loop iterations depends are identified for which the user can provide minimum and maximum values. Finally, a method is given to tightly predict the execution time of loops whose number of iterations is dependent on counter variables of outer level loops. These methods have been successfully integrated in an existing timing analyzer that predicts the performance for optimized code on a machine that exploits caching and pipelining. The result is tighter timing analysis predictions and less work for the user. a program, the bounds for every loop in the program must be specified, which is error prone and tedious for the user. Alternatively, one could specify this information as assertions in the source code to prevent repeated specifications of the same information [7, 8, 9]. However, there are still several disadvantages. First, the user is still required to write the assertions. Second, there is no guarantee that the user will specify the correct minimum and maximum iterations. This problem may easily occur when a user changes the loop, but forgets to update the corresponding assertion. Also, code generation strategies, such as whether to place instructions for the loop exit condition code at the beginning or end of the loop, may cause the number of loop iterations to vary by one iteration. Finally, compiler optimizations, such as loop unrolling, may affect the number of times a loop iterates. Inhibiting different code generation strategies or compiler optimizations to more easily estimate loop bounds would sacrifice performance, which is quite undesirable. It would be more desirable to have the compiler automatically and efficiently determine the bounds for each loop in a program when possible. Some work has been recently accomplished to determine the number of loop iterations automatically using abstract interpretation [10]. While this technique is quite powerful, it often results in significant analysis overhead. This paper describes three approaches that support timing analysis by bounding the number of loop iterations. First, an algorithm is presented that determines a bounded number of iterations for loops with multiple exits. Second, the user can provide information for loop-invariant variables on which the number of loop iterations depends. Finally, a method is given to accurately predict the average number of iterations for loops whose number of iterations can vary depending upon the values of counter variables of enclosing outer loops. All three of these approaches are efficiently implemented and result in less work for a user. The last approach also results in tighter timing analysis predictions. These approaches were implemented by modifying the vpo compiler [1] to analyze loops and this loop analysis information is passed to a timing analyzer [11, 12, 13] to predict performance.
∗ Computer Science Department, Florida State University, Tallahassee, FL 32306-4530, phone: (850) 644-3506, e-mail: {healy, whalley}@ † Department of Computer Systems, Uppsala University, Sweden, phone: +46-18-4717605, e-mail: mic@docs.uu.se ‡ Objectime, Inc., 226 Airport Parkway, #480, San Jose, CA 95110, phone: (408) 441-1124, e-mail: vrustagi@
2. Iterations for Loops with Multiple Exits
In this section we present a method to determine a bounded number of iterations for natural loops with
-1Copyright 1998 IEEE. Published in the Proceedings of RTAS’98.
1. Introduction
To be able to predict the best-case execution times (BCETs) and worst-case execution times (WCETs) of a program, one must know the number of iterations that can be performed by the loops in the program. Under certain conditions, such as a loop with a single exit, many compilers statically determine the exact number of loop iterations [1]. Applications for determining this number include more efficient implementations of loop unrolling [2], software pipelining [3], and exploiting parallelism across loop iterations [4]. When the number of iterations cannot be exactly determined, it would be desirable in a real-time system to know the lower and upper iteration bounds. These bounds can be used by a timing analysis tool to more accurately predict BCETs and WCETs. Many existing timing analyzers require that a user specify the number of iterations of each loop in the program. This specification may be requested interactively [5, 6]. Thus, each time the timing analyzer is invoked for
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