Abstract Time-Mapped Harmonic Balance

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ADS_Harmonic_Balance

ADS_Harmonic_Balance

Harmonic Balance Simulation on ADSGeneral Description of Harmonic Balance in Agilent ADS 1Harmonic balance is a frequency-domain analysis technique for simulating nonlinear circuits and systems. It is well-suited for simulating analog RF and microwave circuits, since these are most naturally handled in the frequency domain. Circuits that are best analyzed using HB under large signal conditions are:power amplifiersfrequency multipliersmixersoscillatorsmodulatorsHarmonic Balance Simulation calculates the magnitude and phase of voltages or currents in a potentially nonlinear circuit. Use this technique to:Compute quantities such as P1dB, third-order intercept (TOI) points, total harmonic distortion (THD), and intermodulation distortion components Perform power amplifier load-pull contour analysesPerform nonlinear noise analysisSimulate oscillator harmonics, phase noise, and amplitude limitsIn contrast, S-parameter or AC simulation modes do not provide any information on nonlinearities of circuits. Transient analysis, in the case where there are harmonics and or closely-spaced frequencies, is very time and memory consuming since the minimum time step must be compatible with the highest frequency present while the simulation must be run for long enough to observe one full period of the lowest frequency present. Harmonic balance simulation makes possible the simulation of circuits with multiple input frequencies. This includes intermodulation frequencies, harmonics, and frequency conversion between harmonics. Not only can the circuit itself produce harmonics, but each signal source (stimulus) can also produce harmonics or small-signal sidebands. The stimulus can consist of up to twelve nonharmonically related sources. The total number of frequencies in the system is limited only by such practical considerations as memory, swap space, and simulation speed.The Simulation Process 1 (FYI – skip to next section if you want to get started now)The harmonic balance method is iterative. It is based on the assumption that for a given sinusoidal excitation there exists a steady-state solution that can be approximated to satisfactory accuracy by means of a finite Fourier series. Consequently, the circuit node 1 From Agilent ADS Circuit Simulation Manual, Chap. 7, Harmonic Balance.voltages take on a set of amplitudes and phases for all frequency components. The currents flowing from nodes into linear elements, including all distributed elements, are calculated by means of a straightforward frequency-domain linear analysis. Currents from nodes into nonlinear elements are calculated in the time-domain. Generalized Fourier analysis is used to transform from the time-domain to the frequency-domain.A frequency-domain representation of all currents flowing away from all nodes is available. According to Kirchoff's Current Law (KCL), these currents should sum to zero at all nodes. The probability of obtaining this result on the first iteration is extremely small.Therefore, an error function is formulated by calculating the sum of currents at all nodes. This error function is a measure of the amount by which KCL is violated and is used to adjust the voltage amplitudes and phases. If the method converges (that is, if the error function is driven to a given small value), then the resulting voltage amplitudes and phases approximate the steady-state solution.•Designers are usually most interested in a system's steady-state behavior. Many high-frequency circuits contain long time constants that require conventionaltransient methods to integrate over many periods of the lowest-frequency sinusoid to reach steady state. Harmonic balance, on the other hand, captures the steady-state spectral response directly.•The applied voltage sources are typically multitone sinusoids that may have very narrowly or very widely spaced frequencies. It is not uncommon for the highestfrequency present in the response to be many orders of magnitude greater than the lowest frequency. Transient analysis would require an integration over anenormous number of periods of the highest-frequency sinusoid. The time involved in carrying out the integration is prohibitive in many practical cases.•At high frequencies, many linear models are best represented in the frequency domain. Simulating such elements in the time domain by means of convolutioncan results in problems related to accuracy, causality, or stability.Harmonic Balance SetupThe HB method depends on calculating currents and voltages at many harmonically related frequencies for each fundamental signal under consideration. Since we are interested in the steady state solution of a nonlinear problem, we must allow the HB simulator to use enough harmonics so that a Fourier series constructed from these harmonic amplitudes and phases can reproduce a reasonable replica of the time domain solution.Figure 1 illustrates a very basic HB simulation setup. The Harmonic Balance controller specifies several key simulation parameters. In the example below, one fundamental frequency, Freq[1]=450 MHz, is specified as an input. The index [1] shows that only one fundamental frequency is being considered. Order[1] specifies the number of harmonic frequencies to be calculated (15) for the first (and only) frequency in this case. One of the most common errors in HB simulation setup is to use too low of an order. You candetermine what order is optimum if you first simulate your circuit with a small order then increase the order in steps of 1 or 2 harmonics. When the solution stops changing within a significant bound, you have reached the optimum order. Using too high of an order is wasteful of memory, file size and simulation time, so it is not efficient to just clobber the problem with a very high order. Some user discretion is advised.Figure 1. Example of the HB controller used for a very simple single tone (frequency) simulation. In addition, power PIN is being swept from -10 to 6 dBm.ADS does not automatically pass parameters from the schematic to the display panel. Calculated node voltages are automatically transferred, but the input parameters used for independent voltage, current or power sources are not (unless they are being swept by a sweep controller setting. Then they become a parameter that is automatically passed to the display.). To transfer parameters from schematic to display, open the controller symbol, select output tab, and then add the variables to the list as seen below:The fundamental frequency of the input source must be the same as specified on the controller. The Sources-Freq Domain palette includes many sources suitable for use with HB. The single tone source P_1Tone is illustrated below. This source provides a single frequency sinusoid at a specified available power. Here we see that the internal source resistance (50 ohms) is included. The available source power is provided as PIN (indBm, which will be converted to Watts by the dbmtow function) and degrees of phase.must be specified.You could also have selected a voltage source, V_1Tone, or for multiple frequency simulations, there are V_nTone and P_nTone sources. These are often used for intermodulation distortion simulations. Voltage or current sources require an external source resistance or impedance whereas the power sources include an internal source resistance or impedance, Z.Nodes must be labeled in the harmonic balance simulation in order to transfer their voltages to the display. If currents are to be used in calculations as well, a current probe must be inserted from the Probe Components menu. An example of a PA output network is shown in the next figure. Nodes Vce and Vload are labeled using the Insert pulldown menu: Insert > Wire/Pin Label. This opens a text box where you can enter the node name you want. I_ce and I_load were measured with the current probes as shown.Figure 3. PA output circuit showing node voltage and current labels and probes. Displaying resultsThe output voltages and currents calculated by the HB analysis will contain many frequency components. You can display all of them in a spectral display by just plotting the voltage or current on an X-Y plot. Markers can be used to read out the spectral line amplitudes or powers.Figure 4. Spectrum in dBm is plotted for Vload. You can see the 15 harmonics.Often you will want to plot power in dBm. If your load impedance is real, you can use the dbm function in an equation. If the load has a complex impedance, then use the definition for sinusoidal power.30)))._(*(*5.0log(*10_+=i load I conj Vload real P dBm outThis will give you the power in dBm in all cases. This is the preferred method. Note that calculated quantities much below – 100 dBm are probably not very reliable due to the limited precision of the device modelsTo perform calculations of power and efficiency, you will want to be able to selectspecific frequency components. The harmonic index (harmindex) can be used to do this. If you plot your output variable in a table format, you will see a list of frequencies.Figure 5. Table showing the value of Pout and Pout_dBm at several harmonicfrequencies. The frequencies are printed in order and can be designated by an index, ranging from 0 for DC to Order – 1 for the highest harmonic frequency.The first frequency in the table is DC and has index 0. Fundamental is index 1. So, to select the voltage at the fundamental frequency, for example, you could write Vload[1] or to select power, Pout[1] or Pout_dBm[1] in this example. The second harmonic would bePout[2]. Of course, we do not need to draw a table to use the index. For example, the DC component of the power supply voltage can be extracted by using the 0 index: VCC[0]. Then, if the supply voltage and current were measured and passed to the output display, you could calculate DC input power byTo display the results of equations such as this, you use the table or rectangular plot features in the display panel. The data set must be changed to Equations as shown in order to find the result of the calculations.Figure 6. To plot the results of an equation in the data display, select Equations in the data setIf you want to see the time domain version of a voltage or current, the display can perform the inverse Fourier transform while plotting. Select the Time domain signal option.Figure 7. When plotting HB data, you must convert it to a scalar quantity (dB, dBm, or magnitude). Notice that a time domain conversion can also be performed by an FFT if requested.Figure 8. Example of a time domain plot from a HB simulation.Once the simulation has been run, the data is available on the display panel. You can use equations to calculate power, gain, and power added efficiency. Note the use of theindices once again.Parameter SweepsIt is possible to sweep any of the independent parameters in the HB simulation. To set upthe sweep, double click on the Harmonic Balance Controller.Figure 9. Selecting the Sweep tab allows you to sweep one independent variable.Click on the Sweep tab. Choose the parameter to be swept, the sweep type (Linear, Log), and the Start, Stop, and Step variables (or number of points instead of step-size). In this example, we are sweeping the input power to the amplifier to determine the gain compression behavior. The more sweep points chosen, the longer the simulation time and the greater the data file size.2Figure 10. A double axis plot of Pout vs Pin and PAE vs. Pin for a power amplifier.2 If two variables are to be swept, a ParamSweep controller icon from the HB menu must be added to the schematic.Figure 11. Amplifier gain vs. Pin.From this plot, we can see that the P1dB compression input power is about 4 dBm.Multiple frequency simulationsMultiple frequencies or “tones” (mainly two-tone) are widely used for evaluation of intermodulation distortion in amplifiers or mixers. In fig. 12, you can see that now two frequencies have been selected, Freq[1] and Freq[2]. Each frequency must also declarean order (number of harmonic frequencies to be considered).Figure 12. HB controller example for a two-tone PA simulation.Intermodulation distortion occurs when more than one input frequency is present in the circuit under evaluation. Therefore, additional frequencies need to be specified when setting up for this type of simulation. Two-tone simulations are generally performed with two closely spaced input frequencies. In this example, the two inputs are at 449.8 and 450.2 MHz. The frequency spacing must be small enough that the two tones are well within the signal bandwidth of the circuit under test.Maximum order corresponds to the highest order mixing product (n + m) to be considered (n*freq[1] ± m*freq[2]). There will be a frequency component in the output file corresponding to all possible combinations of n and m up to the MaxOrder limit. The simulation will run faster with lower MaxOrder and fewer harmonics of the sources, but may be less accurate. Often accurate IMD simulations will require a large maximum order. In this case, a larger number of spectral products will be summed to estimate the time domain waveform and therefore provide greater accuracy. This will increase the size of the data file and time required for the simulation. Increase the orders and MaxOrder in increments of 2 and watch for changes in the IMD output power. When no further significant change is observed, then the order is large enough. If large asymmetry is noted in the intermodulation components, higher orders are indicated..Sometimes, increasing the oversampling ratio for the FFT calculation (use the Param menu of the HB controller panel) can reduce errors. This oversampling controls the number of time points taken when converting back from time to frequency domain in the harmonic balance simulation algorithm. A larger number of time samples increases the accuracy of the tranform calculation but increases memory requirements and simulation time. Both order and oversampling should be increased until you are convinced that further increases are not worthwhile.For multiple frequency simulations, the simulation time will be reduced substantially by using the Krylov option which can be selected on the Display tab of the HB controller. The two tone source frequencies are provided with a P_nTone generator from the Sources – Freq Domain menu. The two frequencies are sometimes specified in a Var block. The same approach is used to specify frequencies in the HB controller so that the effect caused by changes in deltaF could be evaluated by changing only one variable. The available power, PIN, is specified in dBm for each source frequency.Figure 13. Two-tone source example.Displaying Results of Multitone SimulationsYou can view the result around the fundamental frequencies by disabling the autoscale function in the plot and specifying your own narrow range. The display below shows intermodulation products up to the 7th order (MaxOrder specified on the HB controller).Fig. 14.We would like to study the output voltage at the fundamental frequencies and the third-order IMD product frequencies. This can be selected from the many frequencies in the output data set by using the mix function. The desired frequencies could be selected by: (RFfreq + deltaF) V fund1 = mix(Vload,{1,0}).(RFfreq - deltaF) V fund2 = mix(Vload,{0,1})(2*(RFfreq +deltaF)-RFfreq - deltaF) V IM1 = mix(Vload,{2,-1})(2*(RFfreq - deltaF)-RFfreq + deltaF) V IM2 = mix(Vload,{-1,2})The respective indices used with the mix function to select this frequency are shown to the right. The indices in the curly brackets are ordered according to the HB fundamental analysis frequencies.Mixer SimulationsIn the case of a mixer simulation, at least 2 frequencies are always needed: LO and RF. Figure 16 shows an example of the setup used for a two-tone simulation of a mixer. The format is similar to that described above for power amplifier two tone simulations except now 3 frequencies are required. The frequency with the highest power level (in thisexample, the LO) is always the first frequency to be designated in the harmonic balance controller. Other inputs follow sequencing from highest to lowest power.Figure 16. HB controller example for a mixer simulation.The harmonic order should be higher for high amplitude signals. For the example above, the LO order is highest because it is intended to switch the mixer. The RF orders can be smaller since they are rarely of high amplitude compared with the LO.In the case of a mixer simulation, we would like to study the output voltage at the IF frequency. This must be selected from many frequencies in the output data set. A particular frequency is selected by using the mix function. In this example, the desired IF frequencies could be:LOfreq – (RFfreq + Fspacing/2) V IF = mix(Vout,{1,-1,0}).LOfreq – (RFfreq - Fspacing/2) V IF = mix(Vout,{1,0,-1})LOfreq + (RFfreq + Fspacing/2) V IF = mix(Vout,{1,1,0})LOfreq + (RFfreq - Fspacing/2) V IF = mix(Vout,{1,0,1})and the respective indices used with the mix function to select this frequency are shown to the right. The indices in the curly brackets are ordered according to the HB fundamental analysis frequencies. Thus, {1,-1,0} selects 1*LOfreq – 1*RFfreq[1]+0*RFfreq[2].DesignGuidesThere are so many types of simulations that could be performed on a mixer that it is not reasonable to try to describe them all in this tutorial. Instead, you can use the Mixer DesignGuide, a set of schematic and display templates that can be pulled into your project file. Go to the DesignGuides pulldown menu and select Mixer DesignGuide. Choose a representative sample mixer schematic to modify if you want to create your own mixer circuit. Determine whether your mixer is single ended or differential. The differential circuit templates include baluns; single-ended do not. Choose from a large set of simulation types, some with parameter sweeps, some without.Refer to the Mixer Design Guide tutorial for more information.Convergence WoesAny user of the harmonic balance simulator will eventually encounter convergence problems. Unfortunately, when this happens, no useful information is provided by the simulator. Problems with convergence generally arise when the circuit under simulation is or becomes highly nonlinear. In the case of mixers, there are inherent nonlinearities that are required for the mixing process, but these are usually not so bad unless you are seriously overdriving one of the inputs. If the simulation fails, check the biasing of the transistors. HB doesn’t do well with BJTs driven into their saturation region. If that is not the problem, then try decreasing either LO power or the RF power sweep range. You may be driving the mixer well beyond saturation when using default power levels in mixer DG templates. As a last resort, you can try using the Direct solver rather than Krylov, but this will increase simulation time by a large factor.。

IEEE Std 1159-1995,IEEE Recommended Practice for Monitoring Electric Power Quality

IEEE Std 1159-1995,IEEE Recommended Practice for Monitoring Electric Power Quality

IEEE Std 1159-1995 IEEE Recommended Practice for Monitoring Electric Power QualitySponsorIEEE Standards Coordinating Committee 22 onPower QualityApproved June 14, 1995IEEE Standards BoardAbstract: The monitoring of electric power quality of ac power systems, definitions of power quality terminology, impact of poor power quality on utility and customer equipment, and the measurement of electromagnetic phenomena are covered.Keywords: data interpretation, electric power quality, electromagnetic phenomena, monitoring, power quality definitionsIEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily members of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that have expressed an interest in partici-pating in the development of the standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, mar-ket, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and com-ments received from users of the standard. Every IEEE Standard is subjected to review at least every Þve years for revision or reafÞrmation. When a document is more than Þve years old and has not been reafÞrmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reßect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership afÞliation with IEEE. Suggestions for changes in docu-ments should be in the form of a proposed change of text, together with appropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to speciÞc applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appro-priate responses. Since IEEE Standards represent a consensus of all concerned inter-ests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason IEEE and the members of its technical com-mittees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAIntroduction(This introduction is not part of IEEE Std 1159-1995, IEEE Recommended Practice for Monitoring Electric Power Quality.)This recommended practice was developed out of an increasing awareness of the difÞculty in comparing results obtained by researchers using different instruments when seeking to characterize the quality of low-voltage power systems. One of the initial goals was to promote more uniformity in the basic algorithms and data reduction methods applied by different instrument manufacturers. This proved difÞcult and was not achieved, given the free market principles under which manufacturers design and market their products. However, consensus was achieved on the contents of this recommended practice, which provides guidance to users of monitoring instruments so that some degree of comparisons might be possible.An important Þrst step was to compile a list of power quality related deÞnitions to ensure that contributing parties would at least speak the same language, and to provide instrument manufacturers with a common base for identifying power quality phenomena. From that starting point, a review of the objectives of moni-toring provides the necessary perspective, leading to a better understanding of the means of monitoringÑthe instruments. The operating principles and the application techniques of the monitoring instruments are described, together with the concerns about interpretation of the monitoring results. Supporting information is provided in a bibliography, and informative annexes address calibration issues.The Working Group on Monitoring Electric Power Quality, which undertook the development of this recom-mended practice, had the following membership:J. Charles Smith, Chair Gil Hensley, SecretaryLarry Ray, Technical EditorMark Andresen Thomas Key John RobertsVladi Basch Jack King Anthony St. JohnRoger Bergeron David Kreiss Marek SamotyjJohn Burnett Fran•ois Martzloff Ron SmithJohn Dalton Alex McEachern Bill StuntzAndrew Dettloff Bill Moncrief John SullivanDave GrifÞth Allen Morinec David VannoyThomas Gruzs Ram Mukherji Marek WaclawlakErich Gunther Richard Nailen Daniel WardMark Kempker David Pileggi Steve WhisenantHarry RauworthIn addition to the working group members, the following people contributed their knowledge and experience to this document:Ed Cantwell Christy Herig Tejindar SinghJohn Curlett Allan Ludbrook Maurice TetreaultHarshad MehtaiiiThe following persons were on the balloting committee:James J. Burke David Kreiss Jacob A. RoizDavid A. Dini Michael Z. Lowenstein Marek SamotyjW. Mack Grady Fran•ois D. Martzloff Ralph M. ShowersDavid P. Hartmann Stephen McCluer J. C. SmithMichael Higgins A. McEachern Robert L. SmithThomas S. Key W. A. Moncrief Daniel J. WardJoseph L. KoepÞnger P. Richman Charles H. WilliamsJohn M. RobertsWhen the IEEE Standards Board approved this standard on June 14, 1995, it had the following membership:E. G. ÒAlÓ Kiener, Chair Donald C. Loughry,Vice ChairAndrew G. Salem,SecretaryGilles A. Baril Richard J. Holleman Marco W. MigliaroClyde R. Camp Jim Isaak Mary Lou PadgettJoseph A. Cannatelli Ben C. Johnson John W. PopeStephen L. Diamond Sonny Kasturi Arthur K. ReillyHarold E. Epstein Lorraine C. Kevra Gary S. RobinsonDonald C. Fleckenstein Ivor N. Knight Ingo RuschJay Forster*Joseph L. KoepÞnger*Chee Kiow TanDonald N. Heirman D. N. ÒJimÓ Logothetis Leonard L. TrippL. Bruce McClung*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. AggarwalRichard B. EngelmanRobert E. HebnerChester C. TaylorRochelle L. SternIEEE Standards Project EditorivContentsCLAUSE PAGE 1.Overview (1)1.1Scope (1)1.2Purpose (2)2.References (2)3.Definitions (2)3.1Terms used in this recommended practice (2)3.2Avoided terms (7)3.3Abbreviations and acronyms (8)4.Power quality phenomena (9)4.1Introduction (9)4.2Electromagnetic compatibility (9)4.3General classification of phenomena (9)4.4Detailed descriptions of phenomena (11)5.Monitoring objectives (24)5.1Introduction (24)5.2Need for monitoring power quality (25)5.3Equipment tolerances and effects of disturbances on equipment (25)5.4Equipment types (25)5.5Effect on equipment by phenomena type (26)6.Measurement instruments (29)6.1Introduction (29)6.2AC voltage measurements (29)6.3AC current measurements (30)6.4Voltage and current considerations (30)6.5Monitoring instruments (31)6.6Instrument power (34)7.Application techniques (35)7.1Safety (35)7.2Monitoring location (38)7.3Equipment connection (41)7.4Monitoring thresholds (43)7.5Monitoring period (46)8.Interpreting power monitoring results (47)8.1Introduction (47)8.2Interpreting data summaries (48)8.3Critical data extraction (49)8.4Interpreting critical events (51)8.5Verifying data interpretation (59)vANNEXES PAGE Annex A Calibration and self testing (informative) (60)A.1Introduction (60)A.2Calibration issues (61)Annex B Bibliography (informative) (63)B.1Definitions and general (63)B.2Susceptibility and symptomsÑvoltage disturbances and harmonics (65)B.3Solutions (65)B.4Existing power quality standards (67)viIEEE Recommended Practice for Monitoring Electric Power Quality1. Overview1.1 ScopeThis recommended practice encompasses the monitoring of electric power quality of single-phase and polyphase ac power systems. As such, it includes consistent descriptions of electromagnetic phenomena occurring on power systems. The document also presents deÞnitions of nominal conditions and of deviations from these nominal conditions, which may originate within the source of supply or load equipment, or from interactions between the source and the load.Brief, generic descriptions of load susceptibility to deviations from nominal conditions are presented to identify which deviations may be of interest. Also, this document presents recommendations for measure-ment techniques, application techniques, and interpretation of monitoring results so that comparable results from monitoring surveys performed with different instruments can be correlated.While there is no implied limitation on the voltage rating of the power system being monitored, signal inputs to the instruments are limited to 1000 Vac rms or less. The frequency ratings of the ac power systems being monitored are in the range of 45Ð450 Hz.Although it is recognized that the instruments may also be used for monitoring dc supply systems or data transmission systems, details of application to these special cases are under consideration and are not included in the scope. It is also recognized that the instruments may perform monitoring functions for envi-ronmental conditions (temperature, humidity, high frequency electromagnetic radiation); however, the scope of this document is limited to conducted electrical parameters derived from voltage or current measure-ments, or both.Finally, the deÞnitions are solely intended to characterize common electromagnetic phenomena to facilitate communication between various sectors of the power quality community. The deÞnitions of electromagnetic phenomena summarized in table 2 are not intended to represent performance standards or equipment toler-ances. Suppliers of electricity may utilize different thresholds for voltage supply, for example, than the ±10% that deÞnes conditions of overvoltage or undervoltage in table 2. Further, sensitive equipment may mal-function due to electromagnetic phenomena not outside the thresholds of the table 2 criteria.1IEEEStd 1159-1995IEEE RECOMMENDED PRACTICE FOR 1.2 PurposeThe purpose of this recommended practice is to direct users in the proper monitoring and data interpretation of electromagnetic phenomena that cause power quality problems. It deÞnes power quality phenomena in order to facilitate communication within the power quality community. This document also forms the con-sensus opinion about safe and acceptable methods for monitoring electric power systems and interpreting the results. It further offers a tutorial on power system disturbances and their common causes.2. ReferencesThis recommended practice shall be used in conjunction with the following publications. When the follow-ing standards are superseded by an approved revision, the revision shall apply.IEC 1000-2-1 (1990), Electromagnetic Compatibility (EMC)ÑPart 2 Environment. Section 1: Description of the environmentÑelectromagnetic environment for low-frequency conducted disturbances and signaling in public power supply systems.1IEC 50(161)(1990), International Electrotechnical V ocabularyÑChapter 161: Electromagnetic Compatibility. IEEE Std 100-1992, IEEE Standard Dictionary of Electrical and Electronic Terms (ANSI).2IEEE Std 1100-1992, IEEE Recommended Practice for Powering and Grounding Sensitive Electronic Equipment (Emerald Book) (ANSI).3. DeÞnitionsThe purpose of this clause is to present concise deÞnitions of words that convey the basic concepts of power quality monitoring. These terms are listed below and are expanded in clause 4. The power quality commu-nity is also pervaded by terms that have no scientiÞc deÞnition. A partial listing of these words is included in 3.2; use of these terms in the power quality community is discouraged. Abbreviations and acronyms that are employed throughout this recommended practice are listed in 3.3.3.1 Terms used in this recommended practiceThe primary sources for terms used are IEEE Std 100-19923 indicated by (a), and IEC 50 (161)(1990) indi-cated by (b). Secondary sources are IEEE Std 1100-1992 indicated by (c), IEC-1000-2-1 (1990) indicated by (d) and UIE -DWG-3-92-G [B16]4. Some referenced deÞnitions have been adapted and modiÞed in order to apply to the context of this recommended practice.3.1.1 accuracy: The freedom from error of a measurement. Generally expressed (perhaps erroneously) as percent inaccuracy. Instrument accuracy is expressed in terms of its uncertaintyÑthe degree of deviation from a known value. An instrument with an uncertainty of 0.1% is 99.9% accurate. At higher accuracy lev-els, uncertainty is typically expressed in parts per million (ppm) rather than as a percentage.1IEC publications are available from IEC Sales Department, Case Postale 131, 3, rue de VarembŽ, CH-1211, Gen•ve 20, Switzerland/ Suisse. IEC publications are also available in the United States from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA.2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA.3Information on references can be found in clause 2.4The numbers in brackets correspond to those bibliographical items listed in annex B.2IEEE MONITORING ELECTRIC POWER QUALITY Std 1159-1995 3.1.2 accuracy ratio: The ratio of an instrumentÕs tolerable error to the uncertainty of the standard used to calibrate it.3.1.3 calibration: Any process used to verify the integrity of a measurement. The process involves compar-ing a measuring instrument to a well defined standard of greater accuracy (a calibrator) to detect any varia-tions from specified performance parameters, and making any needed compensations. The results are then recorded and filed to establish the integrity of the calibrated instrument.3.1.4 common mode voltage: A voltage that appears between current-carrying conductors and ground.b The noise voltage that appears equally and in phase from each current-carrying conductor to ground.c3.1.5 commercial power: Electrical power furnished by the electric power utility company.c3.1.6 coupling: Circuit element or elements, or network, that may be considered common to the input mesh and the output mesh and through which energy may be transferred from one to the other.a3.1.7 current transformer (CT): An instrument transformer intended to have its primary winding con-nected in series with the conductor carrying the current to be measured or controlled.a3.1.8 dip: See: sag.3.1.9 dropout: A loss of equipment operation (discrete data signals) due to noise, sag, or interruption.c3.1.10 dropout voltage: The voltage at which a device fails to operate.c3.1.11 electromagnetic compatibility: The ability of a device, equipment, or system to function satisfacto-rily in its electromagnetic environment without introducing intolerable electromagnetic disturbances to any-thing in that environment.b3.1.12 electromagnetic disturbance: Any electromagnetic phenomena that may degrade the performance of a device, equipment, or system, or adversely affect living or inert matter.b3.1.13 electromagnetic environment: The totality of electromagnetic phenomena existing at a given location.b3.1.14 electromagnetic susceptibility: The inability of a device, equipment, or system to perform without degradation in the presence of an electromagnetic disturbance.NOTEÑSusceptibility is a lack of immunity.b3.1.15 equipment grounding conductor: The conductor used to connect the noncurrent-carrying parts of conduits, raceways, and equipment enclosures to the grounded conductor (neutral) and the grounding elec-trode at the service equipment (main panel) or secondary of a separately derived system (e.g., isolation transformer). See Section 100 in ANSI/NFPA 70-1993 [B2].3.1.16 failure mode: The effect by which failure is observed.a3.1.17 ßicker: Impression of unsteadiness of visual sensation induced by a light stimulus whose luminance or spectral distribution fluctuates with time.b3.1.18 frequency deviation: An increase or decrease in the power frequency. The duration of a frequency deviation can be from several cycles to several hours.c Syn.: power frequency variation.3.1.19 fundamental (component): The component of an order 1 (50 or 60 Hz) of the Fourier series of a periodic quantity.b3IEEEStd 1159-1995IEEE RECOMMENDED PRACTICE FOR 3.1.20 ground: A conducting connection, whether intentional or accidental, by which an electric circuit or piece of equipment is connected to the earth, or to some conducting body of relatively large extent that serves in place of the earth.NOTEÑ It is used for establishing and maintaining the potential of the earth (or of the conducting body) or approxi-mately that potential, on conductors connected to it, and for conducting ground currents to and from earth (or the con-ducting body).a3.1.21 ground loop: In a radial grounding system, an undesired conducting path between two conductive bodies that are already connected to a common (single-point) ground.3.1.22 harmonic (component): A component of order greater than one of the Fourier series of a periodic quantity.b3.1.23 harmonic content: The quantity obtained by subtracting the fundamental component from an alter-nating quantity.a3.1.24 immunity (to a disturbance): The ability of a device, equipment, or system to perform without deg-radation in the presence of an electromagnetic disturbance.b3.1.25 impulse: A pulse that, for a given application, approximates a unit pulse.b When used in relation to the monitoring of power quality, it is preferred to use the term impulsive transient in place of impulse.3.1.26 impulsive transient: A sudden nonpower frequency change in the steady-state condition of voltage or current that is unidirectional in polarity (primarily either positive or negative).3.1.27 instantaneous: A time range from 0.5Ð30 cycles of the power frequency when used to quantify the duration of a short duration variation as a modifier.3.1.28 interharmonic (component): A frequency component of a periodic quantity that is not an integer multiple of the frequency at which the supply system is designed to operate operating (e.g., 50 Hz or 60 Hz).3.1.29 interruption, momentary (power quality monitoring): A type of short duration variation. The complete loss of voltage (< 0.1 pu) on one or more phase conductors for a time period between 0.5 cycles and 3 s.3.1.30 interruption, sustained (electric power systems): Any interruption not classified as a momentary interruption.3.1.31 interruption, temporary (power quality monitoring):A type of short duration variation. The com-plete loss of voltage (< 0.1 pu) on one or more phase conductors for a time period between 3 s and 1 min.3.1.32 isolated ground: An insulated equipment grounding conductor run in the same conduit or raceway as the supply conductors. This conductor may be insulated from the metallic raceway and all ground points throughout its length. It originates at an isolated ground-type receptacle or equipment input terminal block and terminates at the point where neutral and ground are bonded at the power source. See Section 250-74, Exception #4 and Exception in Section 250-75 in ANSI/NFPA 70-1993 [B2].3.1.33 isolation: Separation of one section of a system from undesired influences of other sections.c3.1.34 long duration voltage variation:See: voltage variation, long duration.3.1.35 momentary (power quality monitoring): A time range at the power frequency from 30 cycles to 3 s when used to quantify the duration of a short duration variation as a modifier.4IEEE MONITORING ELECTRIC POWER QUALITY Std 1159-1995 3.1.36 momentary interruption:See: interruption, momentary.3.1.37 noise: Unwanted electrical signals which produce undesirable effects in the circuits of the control systems in which they occur.a (For this document, control systems is intended to include sensitive electronic equipment in total or in part.)3.1.38 nominal voltage (Vn): A nominal value assigned to a circuit or system for the purpose of conve-niently designating its voltage class (as 120/208208/120, 480/277, 600).d3.1.39 nonlinear load: Steady-state electrical load that draws current discontinuously or whose impedance varies throughout the cycle of the input ac voltage waveform.c3.1.40 normal mode voltage: A voltage that appears between or among active circuit conductors, but not between the grounding conductor and the active circuit conductors.3.1.41 notch: A switching (or other) disturbance of the normal power voltage waveform, lasting less than 0.5 cycles, which is initially of opposite polarity than the waveform and is thus subtracted from the normal waveform in terms of the peak value of the disturbance voltage. This includes complete loss of voltage for up to 0.5 cycles [B13].3.1.42 oscillatory transient: A sudden, nonpower frequency change in the steady-state condition of voltage or current that includes both positive or negative polarity value.3.1.43 overvoltage: When used to describe a specific type of long duration variation, refers to a measured voltage having a value greater than the nominal voltage for a period of time greater than 1 min. Typical val-ues are 1.1Ð1.2 pu.3.1.44 phase shift: The displacement in time of one waveform relative to another of the same frequency and harmonic content.c3.1.45 potential transformer (PT): An instrument transformer intended to have its primary winding con-nected in shunt with a power-supply circuit, the voltage of which is to be measured or controlled. Syn.: volt-age transformer.a3.1.46 power disturbance: Any deviation from the nominal value (or from some selected thresholds based on load tolerance) of the input ac power characteristics.c3.1.47 power quality: The concept of powering and grounding sensitive equipment in a manner that is suit-able to the operation of that equipment.cNOTEÑWithin the industry, alternate definitions or interpretations of power quality have been used, reflecting different points of view. Therefore, this definition might not be exclusive, pending development of a broader consensus.3.1.48 precision: Freedom from random error.3.1.49 pulse: An abrupt variation of short duration of a physical an electrical quantity followed by a rapid return to the initial value.3.1.50 random error: Error that is not repeatable, i.e., noise or sensitivity to changing environmental factors. NOTEÑFor most measurements, the random error is small compared to the instrument tolerance.3.1.51 sag: A decrease to between 0.1 and 0.9 pu in rms voltage or current at the power frequency for dura-tions of 0.5 cycle to 1 min. Typical values are 0.1 to 0.9 pu.b See: dip.IEEEStd 1159-1995IEEE RECOMMENDED PRACTICE FOR NOTEÑTo give a numerical value to a sag, the recommended usage is Òa sag to 20%,Ó which means that the line volt-age is reduced down to 20% of the normal value, not reduced by 20%. Using the preposition ÒofÓ (as in Òa sag of 20%,Óor implied by Òa 20% sagÓ) is deprecated.3.1.52 shield: A conductive sheath (usually metallic) normally applied to instrumentation cables, over the insulation of a conductor or conductors, for the purpose of providing means to reduce coupling between the conductors so shielded and other conductors that may be susceptible to, or that may be generating unwanted electrostatic or electromagnetic fields (noise).c3.1.53 shielding: The use of a conducting and/or ferromagnetic barrier between a potentially disturbing noise source and sensitive circuitry. Shields are used to protect cables (data and power) and electronic cir-cuits. They may be in the form of metal barriers, enclosures, or wrappings around source circuits and receiv-ing circuits.c3.1.54 short duration voltage variation:See: voltage variation, short duration.3.1.55 slew rate: Rate of change of ac voltage, expressed in volts per second a quantity such as volts, fre-quency, or temperature.a3.1.56 sustained: When used to quantify the duration of a voltage interruption, refers to the time frame asso-ciated with a long duration variation (i.e., greater than 1 min).3.1.57 swell: An increase in rms voltage or current at the power frequency for durations from 0.5 cycles to 1 min. Typical values are 1.1Ð1.8 pu.3.1.58 systematic error: The portion of error that is repeatable, i.e., zero error, gain or scale error, and lin-earity error.3.1.59 temporary interruption:See: interruption, temporary.3.1.60 tolerance: The allowable variation from a nominal value.3.1.61 total harmonic distortion disturbance level: The level of a given electromagnetic disturbance caused by the superposition of the emission of all pieces of equipment in a given system.b The ratio of the rms of the harmonic content to the rms value of the fundamental quantity, expressed as a percent of the fun-damental [B13].a Syn.: distortion factor.3.1.62 traceability: Ability to compare a calibration device to a standard of even higher accuracy. That stan-dard is compared to another, until eventually a comparison is made to a national standards laboratory. This process is referred to as a chain of traceability.3.1.63 transient: Pertaining to or designating a phenomenon or a quantity that varies between two consecu-tive steady states during a time interval that is short compared to the time scale of interest. A transient can be a unidirectional impulse of either polarity or a damped oscillatory wave with the first peak occurring in either polarity.b3.1.64 undervoltage: A measured voltage having a value less than the nominal voltage for a period of time greater than 1 min when used to describe a specific type of long duration variation, refers to. Typical values are 0.8Ð0.9 pu.3.1.65 voltage change: A variation of the rms or peak value of a voltage between two consecutive levels sustained for definite but unspecified durations.d3.1.66 voltage dip:See: sag.IEEE MONITORING ELECTRIC POWER QUALITY Std 1159-1995 3.1.67 voltage distortion: Any deviation from the nominal sine wave form of the ac line voltage.3.1.68 voltage ßuctuation: A series of voltage changes or a cyclical variation of the voltage envelope.d3.1.69 voltage imbalance (unbalance), polyphase systems: The maximum deviation among the three phases from the average three-phase voltage divided by the average three-phase voltage. The ratio of the neg-ative or zero sequence component to the positive sequence component, usually expressed as a percentage.a3.1.70 voltage interruption: Disappearance of the supply voltage on one or more phases. Usually qualified by an additional term indicating the duration of the interruption (e.g., momentary, temporary, or sustained).3.1.71 voltage regulation: The degree of control or stability of the rms voltage at the load. Often specified in relation to other parameters, such as input-voltage changes, load changes, or temperature changes.c3.1.72 voltage variation, long duration: A variation of the rms value of the voltage from nominal voltage for a time greater than 1 min. Usually further described using a modifier indicating the magnitude of a volt-age variation (e.g., undervoltage, overvoltage, or voltage interruption).3.1.73 voltage variation, short duration: A variation of the rms value of the voltage from nominal voltage for a time greater than 0.5 cycles of the power frequency but less than or equal to 1 minute. Usually further described using a modifier indicating the magnitude of a voltage variation (e.g. sag, swell, or interruption) and possibly a modifier indicating the duration of the variation (e.g., instantaneous, momentary, or temporary).3.1.74 waveform distortion: A steady-state deviation from an ideal sine wave of power frequency princi-pally characterized by the spectral content of the deviation [B13].3.2 Avoided termsThe following terms have a varied history of usage, and some may have speciÞc deÞnitions for other appli-cations. It is an objective of this recommended practice that the following ambiguous words not be used in relation to the measurement of power quality phenomena:blackout frequency shiftblink glitchbrownout (see 4.4.3.2)interruption (when not further qualiÞed)bump outage (see 4.4.3.3)clean ground power surgeclean power raw powercomputer grade ground raw utility powercounterpoise ground shared grounddedicated ground spikedirty ground subcycle outagesdirty power surge (see 4.4.1)wink。

基于语谱图的声乐分析

基于语谱图的声乐分析

技术创新《微计算机信息》(管控一体化)2010年第26卷第7-3期360元/年邮局订阅号:82-946《现场总线技术应用200例》博士论坛基于语谱图的声乐分析Analysis of vocality on Spectrogram(上海理工大学)陈青龚乾张鸣CHEN Qing GONG Qian ZHANG Ming摘要:语谱图通常从时域信号中用短时傅里叶变换计算得到,并表示成灰度图像。

为了得到更高的分辨率和更好的视觉效果来进行语音信号的处理与分析,本文利用MATLAB 的编程算法和函数库,对运算得到的语谱图使用伪彩色映射算法来观察能量分布,并对声音作进一步谐波跟踪研究,做到对不同素材的音乐性判定。

关键词:时频分析;语谱图;伪彩色映射;谐波跟踪中图分类号:TP391文献标识码:AAbstract:Spectrogram is usually calculated from the time-domain signal by short-time Fourier transform and displayed in gray scale images.In this paper,with the programming and library of MATLAB,the spectrums of speech energy distributions are mapped to pseudo-color images in order to get higher resolution and better visual effects for speech signal processing and some analysis for har -monic tracking are used to these signals from music.At last,the conclusion can contact to musical identification.Key words:Time-frequency Analysis;Spectrogram;Pseudo-color;Harmonic track文章编号:1008-0570(2010)07-3-0006-03引言语谱图是一种在语音分析以及语音合成中具有重要实用价值的时频图,它可以反映语音信号动态频谱特性,被视为语音信号的可视语言。

德国工业4.0原版

德国工业4.0原版
z
Intense research activities in universities and other research institutions Drastically increasing number of publications in recent years Large amount of funding by the German government
Model predictive control (MPC)
Modern, optimization-based control technique Successful applications in many industrial fields Can handle hard constraints on states and inputs Optimization of some performance criterion Applicable to nonlinear, MIMO systems
A system is strictly dissipative on a set W ⊆ Z with respect to the supply rate s if there exists a storage function λ such that for all (x , u ) ∈ W it holds that λ(f (x , u )) − λ(x ) ≤ s (x , u ) − ρ(x ) with ρ > 0.
k =0 x (k |t + 1) x (t + 1) state x input u t+1 u (k |t + 1) k =N
Basic MPC scheme

Empirical processes of dependent random variables

Empirical processes of dependent random variables

2
Preliminaries
n i=1
from R to R. The centered G -indexed empirical process is given by (P n − P )g = 1 n
n
the marginal and empirical distribution functions. Let G be a class of measurabrocesses that have been discussed include linear processes and Gaussian processes; see Dehling and Taqqu (1989) and Cs¨ org˝ o and Mielniczuk (1996) for long and short-range dependent subordinated Gaussian processes and Ho and Hsing (1996) and Wu (2003a) for long-range dependent linear processes. A collection of recent results is presented in Dehling, Mikosch and Sorensen (2002). In that collection Dedecker and Louhichi (2002) made an important generalization of Ossiander’s (1987) result. Here we investigate the empirical central limit problem for dependent random variables from another angle that avoids strong mixing conditions. In particular, we apply a martingale method and establish a weak convergence theory for stationary, causal processes. Our results are comparable with the theory for independent random variables in that the imposed moment conditions are optimal or almost optimal. We show that, if the process is short-range dependent in a certain sense, then the limiting behavior is similar to that of iid random variables in that the limiting distribution is a Gaussian process and the norming √ sequence is n. For long-range dependent linear processes, one needs to apply asymptotic √ expansions to obtain n-norming limit theorems (Section 6.2.2). The paper is structured as follows. In Section 2 we introduce some mathematical preliminaries necessary for the weak convergence theory and illustrate the essence of our approach. Two types of empirical central limit theorems are established. Empirical processes indexed by indicators of left half lines, absolutely continuous functions, and piecewise differentiable functions are discussed in Sections 3, 4 and 5 respectively. Applications to linear processes and iterated random functions are made in Section 6. Section 7 presents some integral and maximal inequalities that may be of independent interest. Some proofs are given in Sections 8 and 9.

一种动态消减时间自动机可达性搜索空间的方法

一种动态消减时间自动机可达性搜索空间的方法

3)本课题研究得到国家自然科学基金(No.60573085)和国家重点基础研究973计划(No.2002CB312001)的资助。

陈铭松 硕士研究生,主要研究方向为模型检验、软件测试;赵建华 教授,硕导,主要研究方向为形式化方法、软件工程及程序设计语言;李宣东 教授,博导,主要研究方向为面向对象技术、形式化方法;郑国梁 教授,博导,主要研究方向为软件工程、软件开发环境及面向对象技术。

计算机科学2007Vol 134№11一种动态消减时间自动机可达性搜索空间的方法3)陈铭松 赵建华 李宣东 郑国梁(南京大学计算机软件新技术国家重点实验室,南京大学计算机科学与技术系 南京210093)摘 要 时间自动机的可达性分析算法通常采用对符号状态的枚举来遍历其状态空间。

符号状态由位置与时间区域组成,时间区域用形如x -y ≤(<)n 的原子公式的合取式来表示。

在对时间自动机进行可达性分析的过程中,分析算法将生成大量的符号状态,往往导致对计算机内存的需求超出了可行的范围。

本文给出了一个消减符号状态个数的方法。

该方法通过对符号状态间的依赖关系进行分析,在不影响分析结果的前提下消去某些时间区域的原子公式,从而扩展符号状态。

扩展后的符号状态包含有更加多的其它的状态,通过删除掉那些被包含的符号状态可以减少算法存储的状态个数,节省存储空间。

本文最后给出了相关的案例分析,结果表明这个算法有效地减少了某些时间自动机可达性分析过程中所需的存储空间。

关键词 时间自动机,模型检验,符号状态,时间区域 An Algorithm to Dynamically R educe the State Space of TimedAutomata during the R eachability AnalysisCH EN Ming 2Song ZHAO Jian 2Hua L I Xuan 2Dong ZH EN G Guo 2Liang(National Laboratory of Novel Software Technology ,Depart ment of Computer Science and Technology ,Nanjing University ,Nanjing 210093)Abstract The reachability analysis algorithm explores the state space of a timed automaton by enumeration of symbolic states.Each symbolic state consists of a location and a time zone which are conjunctions of automatic formulae in the form x -y ≤(<)n .Sometimes the amount of generated symbolic states is very large ,the memory required to store the generated symbolic states is not feasible.In this paper ,we present an approach to reduce the memory requirement of the reachability analysis algorithm.By analyzing the dependence relation between symbolic states ,we can expand some of the symbolic states by removing specific kinds of atomic formulae without changing the reachability analysis re 2sult.The expanded states can contain more symbolic states.Removing these contained states can reduce the memory requirement of reachability analysis.The case studies presented in this paper show that our algorithm can save memory in the practical application efficiently.K eyw ords Timed automata ,Model checking ,Symbolic state ,Time zone 1 引言模型检验(model checking )[1]是一种被用来自动验证有穷状态系统的形式化技术。

A New Approach for Filtering Nonlinear Systems

A New Approach for Filtering Nonlinear Systems

computational overhead as the number of calculations demanded for the generation of the Jacobian and the predictions of state estimate and covariance are large. In this paper we describe a new approach to generalising the Kalman filter to systems with nonlinear state transition and observation models. In Section 2 we describe the basic filtering problem and the notation used in this paper. In Section 3 we describe the new filter. The fourth section presents a summary of the theoretical analysis of the performance of the new filter against that of the EKF. In Section 5 we demonstrate the new filter in a highly nonlinear application and we conclude with a discussion of the implications of this new filter1
Tቤተ መጻሕፍቲ ባይዱ
= = =
δij Q(i), δij R(i), 0, ∀i, j.
(3) (4) (5)

ADS射频仿真软件培训材料

ADS射频仿真软件培训材料
Top Half: Inductive Reactance (+jx) SHORT
25 50 100
Circles of constant Resistance
OPEN Bottom Half: Capacitive Reactance (-jx)
Lines of constant Reactance (+jx above and -jx below)
AC Simulation Controller
Set on-screen parameters in the Display tab. Turn Noise on/off: yes / no.
AC is a linear or small signal simulation and freq is usually set in the controller not the source.
S-parameters are Ratios
Usually given in dB as 20 log of the voltage ratios of the waves at the ports: incident, reflected, or transmitted.
S-parameter ratios: S out / S in
STEP 3: display the results
Netlist is automatically sent to the simulator. Simulation results (data) are written to a dataset.
Plot or list data & write equations.
• S11 - Forward Reflection (input match - impedance) • S22 - Reverse Reflection (output match - impedance) • S21 - Forward Transmission (gain or loss) These are easier to understand and • S12 - Reverse Transmission (isolation)

Plate—Form组成

Plate—Form组成

数字和DSP系统平台级设计与实现清华大学电子工程系郑友泉yqzheng@数字和DSP 系统平台级设计与实现第2页Platform 组成¾核–Processor IP –Bus/Interconnection –Peripheral IP –Application specific IP ¾软件–Drivers –Firmware –(Real-time) OS –Application software/libraries¾验证–HW/SW Co-Verification –Compliance test suites ¾原型系统–HW emulation –FPGA based prototyping –Platform prototypes (i.e. dedicated prototyping devices)–SW prototyping数字和DSP 系统平台级设计与实现第3页Platform-Based Design¾需要考虑的问题: (以及如何分割)–功能与结构,–(信号)传递与计算.数字和DSP 系统平台级设计与实现第4页SoC, IP andOn-Chip Communication本节内容¾System-on-a-Chip(SoC)¾Intellectual Property(IP)¾On-Chip Communication–Virtual Component Interface (VCI)–On-Chip Bus(OCB)–Network-on-Chip(NoC)数字和DSP系统平台级设计与实现第5页Introduction to SoC and IP数字和DSP系统平台级设计与实现第6页数字和DSP 系统平台级设计与实现第7页SoC: System on Chip¾System–各种元件和/或子系统的集合,其中各种元件和/或子系统相互连接,完成特定的功能.¾A SoC design is a “product creation process”–从明确用户需求开始;–到产品发布为止(具有用户所需要的足够功能)数字和DSP 系统平台级设计与实现第8页SoC: System on Chip¾Also named System-on-a-Chip 、System LSI, System-on-Silicon 、System-on-….¾It used to be System-on-a-board, or System-in-a cabinet, or System-in-package ( SIP )¾System–Hardware)Analog : ADC/DAC, PLL, TxRx, RF)Digital : Processor, Interface, Accelerator)Storage : SRAM, DRAM, FLASH, ROM–Software : RTOS, Device Driver and API, Applications数字和DSP 系统平台级设计与实现第9页SoC: System on Chip¾片上系统结构在单个芯片上集成了各种异构的元件;¾片上系统设计中一个重要的方面就是设计SoC 中不同实体之间的信号/信息传递方式,使得信息传递开销最小化。

001 (ISSCC tutorial)Noise Analysis in Switched-Capacitor Circuits

001 (ISSCC tutorial)Noise Analysis in Switched-Capacitor Circuits
PSD(f) f
© 2011 IEEE
IEEE International Solid-State Circuits Conference
© 2011 IEEE
Thermal Noise Power
• Nyquist showed that
PSD ( f ) = 4kT
• The total average noise power of a resistor in a certain frequency band is therefore
– Examples: Audio systems, wireless transceivers, sensor interfaces
• Electronic noise directly trades with power dissipation and speed • Electronic noise is a major concern in modern technologies with reduced VDD
• The noise of a MOSFET operating in the triode region is approximately equal to that of a resistor • In the saturation region, the thermal noise can be modeled using a drain current source with power spectral density
• We can model the noise using an equivalent voltage or current generator
2 vn
= Pn ⋅ R = 4kT ⋅ R ⋅ Δf

Kinetis MCUs I2C Timing Configuration说明书

Kinetis MCUs I2C Timing Configuration说明书

1IntroductionThe I 2C module is popular in most applications. Kinetis MCUs provide strong features on the I 2C module, which is compatible with the I 2C-bus specification and easy to interface with other devices. However, incorrect configuration may cause potential timing issues. This document shows how to configure the I 2C timing of a slave device to meet application needs which apply to Kinetis parts that contain I2C IP instead of LPI2C.2OverviewThe I 2C specification defines detailed timing specifications to enable the I 2C device to follow the same standard and make different devices working together. Figure 1. on page 1 shows the timing definition for tSU:DAT.Figure 1.Definition of I2C timingThe Kinetis IP provides register I2Cx_F to tune the timing. The reference manual provides the reference table on how to impact the I 2C baud rate and data hold time. For the slave mode, this register also heavily impacts the timing and incorrect settings mayContents1 Introduction..........................................12 Overview...............................................13 Timing issues caused byincorrect settings..............................24 Tuning the timing using registerI2Cx_F................................................35 Conclusion. (5)6 References...........................................57 Revision history.. (5)AN12377Tuning I2C Timing In Slave ModeRev. 1 — April 2019Application Notecause timing issues. There might not be a clear explanation in the reference manual, but it must be consulted to get a correct configuration.3Timing issues caused by incorrect settingsWhen configuring the I 2C for a master device, most users know how to configure the I2Cx_F register to get the expected baud rate. However, when enabling it in the slave mode, users are not aware of the I2Cx_F function during the timing tuning and do nothing with the I2Cx_F register. In most customer applications, this possibly causes a timing issue. For example, when it works in the slave mode after events (interrupt of receiving new data or transmitting complete) occur, the slave device drives the SCL low by clock stretching and waits to handle I 2C events. It releases the SCL together with the SDA after writing/reading the I 2C data register when the I2Cx_F is set to 0. This causes the master to detect a wrong signal and fail to meet the SDA setup time requirement.Figure 2.on page 2 shows the captured waveform.Figure 2.I2C signals with clock stretching Figure 3. on page 3 shows the clock stretching timing.Timing issues caused by incorrect settingsFigure 3.Clock stretching timingFigure 3. on page 3 shows the SDA and SCL release at almost the same time. For the I2C timing definition to match the values in Figure 4. on page 3, the tSU:DA T minimum value must be around 100 ns in the fast mode and 250 ns in the standard mode. Therefore, the above timing violates the specification.The tSU:DA T timing and the I2C specification give the characteristic parameters shown in Figure 4. on page 3.Figure 4.Characteristics of tSU:DAT4Tuning the timing using register I2Cx_FConfigure the I2Cx_F register to fix the timing issue and get the tSU:DA T using this formula:SDA setup time = I2C module clock period (s) x mul x SDA setup valueNote to keep the SBRC bit field to be 0 in the I2Cx_C2 register when using this solution. Get the SDA setup value from T able 1. I2C setup value on page 4.Table 1.I2C setup valueICR (hex)SDA SetupValueICR(hex)SDA SetupValueICR(hex)SDA SetupValueICR(hex)SDA SetupValue021016206430256 131120218031320 231220228032320 341324239633384 441424249634384 5515282511235448 6616322612836512 7917442717637704 8618322812838512 98194029160396400A101A402A1603A6400B121B482B1923B7680C121C482C1923C7680D141D562D2243D8960E161E642E2563E10240F221F882F3523F1408ICR : register value of bit field ICR of I2C_FSDA Setup Value : number of I2C function clockTable 1. I2C setup value on page 4 is just for reference. Set the I2Cx_F to have a sufficient margin to meet the I Ctiming.For example, when the I2CxF is set to 0x02 and the I2C module clock frequency is 48 MHz, the setup time is calculated as: Setup time = 1/48 MHz * 1 * 3 = 62.5 nsWhen the I2Cx_F value and the setup time value are bigger, they can get a longer margin by setting the big value to I2Cx_F. However, this causes the I2C bus to drop due to clock stretching. Clock stretching happens in the below condition. At the start of a single-bit communication, the master sends the first SCL clock on the bus and the slave samples this pulse and compares it with its own I2Cx_F configuration. If the slave’s baud rate is lower than the master’s baud rate, I2C IP begins to stretch the bus. For example, if the master’s baud rate is 400 kHz and the slave’s baud rate is configured to be 100 kHz by the I2Cx_F register, the final I2C SCL bus period is composed by the slave’s 100-kHz SCL low period time and master’s 400-kHz SCL high period time. The bus period is 0.5 * (1 / 100 K + 1 / 400 K) seconds, so the SCL bus is about 160 kHz.It is recommended to set the slave's baud rate higher than the master baud rate and give a sufficient margin to meet the I2C timing.Conclusion 5ConclusionThis document introduces a way to tune the I2C timing and meet the specifications by setting I2CxF correctly, which helps customers to solve I2C timing issues.6References•I²C-bus Specification, Version 6.0, 4th of April 2014•KL16 Sub-Family Reference Manual with Addendum (document KL16P80M48SF4RM)•Kinetis KL03 reference manual (document KL03P24M48SF0RM)7Revision historyT able 2. Revision history on page 5 summarizes the changes done to this document since the initial release.Table 2.Revision historyHow To Reach Us Home Page: Web Support: /support Information in this document is provided solely to enable system and software implementers to use NXP products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based on the information in this document. NXP reserves the right to make changes without further notice to any products herein.NXP makes no warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does NXP assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in NXP data sheets and/or specifications can and do vary in different applications, and actual performance may vary over time. All operating parameters, including “typicals,” must be validated for each customer application by customer's technical experts. NXP does not convey any license under its patent rights nor the rights of others. NXP sells products pursuant to standard terms and conditions of sale, which can be found at the following address: / SalesTermsandConditions.While NXP has implemented advanced security features, all products may be subject to unidentified vulnerabilities. Customers are responsible for the design and operation of their applications and products to reduce the effect of these vulnerabilities on customer’s applications and products, and NXP accepts no liability for any vulnerability that is discovered. Customers should implement appropriate design and operating safeguards to minimize the risks associated with their applications and products.NXP, the NXP logo, NXP SECURE CONNECTIONS FOR A SMARTER WORLD, COOLFLUX, EMBRACE, GREENCHIP, HIT AG, I2C BUS, ICODE, JCOP, LIFE VIBES, MIFARE, MIFARE CLASSIC, MIFARE DESFire, MIFARE PLUS, MIFARE FLEX, MANTIS, MIFARE ULTRALIGHT, MIFARE4MOBILE, MIGLO, NTAG, ROADLINK, SMARTLX, SMARTMX, ST ARPLUG, TOPFET, TRENCHMOS, UCODE, Freescale, the Freescale logo, AltiVec, C‑5, CodeTEST, CodeWarrior, ColdFire, ColdFire+, C‑Ware, the Energy Efficient Solutions logo, Kinetis, Layerscape, MagniV, mobileGT, PEG, PowerQUICC, Processor Expert, QorIQ, QorIQ Qonverge, Ready Play, SafeAssure, the SafeAssure logo, StarCore, Symphony, VortiQa, Vybrid, Airfast, BeeKit, BeeStack, CoreNet, Flexis, MXC, Platform in a Package, QUICC Engine, SMARTMOS, Tower, TurboLink, and UMEMS are trademarks of NXP B.V. All other product or service names are the property of their respective owners. AMBA, Arm, Arm7, Arm7TDMI, Arm9, Arm11, Artisan, big.LITTLE, Cordio, CoreLink, CoreSight, Cortex, DesignStart, DynamIQ, Jazelle, Keil, Mali, Mbed, Mbed Enabled, NEON, POP, RealView, SecurCore, Socrates, Thumb, TrustZone, ULINK, ULINK2, ULINK-ME, ULINK-PLUS, ULINKpro, µVision, Versatile are trademarks or registered trademarks of Arm Limited (or its subsidiaries) in the US and/or elsewhere. The related technology may be protected by any or all of patents, copyrights, designs and trade secrets. All rights reserved. Oracle and Java are registered trademarks of Oracle and/or its affiliates. The Power Architecture and word marks and the Power and logos and related marks are trademarks and service marks licensed by .© NXP B.V. 2019.All rights reserved.For more information, please visit: Forsalesofficeaddresses,pleasesendanemailto:**********************Date of release: April 2019Document identifier: AN12377。

instruction(完成)

instruction(完成)
Register-memory architectures
– One operand can be memory.
Load-store architectures
– All operands are registers (except for load/store) 3
Four Architecture Classes
Instructions for Control Flow
Instruction Format
The Role of Compilers
The MIPS Architecture
Conclusion
CDA 5155 – Spring 2012
Copyright © 2012 Prabhat Mishra
Some architectures support a decimal format
Packed decimal or binary-coded decimal (BCD)
Why?
(0.10)10 = (?)2 Answers
0.10 0.0001 0.1010 0.000110011
Some decimal fractions does not have exact representation in binary.
SPEC CPU2000 on Alpha
Sign bit is not counted
© 2003 Elsevier Science (USA). All rights reserved.
12
Addressing Mode for FFT
FFTs start or end their processing with data shuffled in a particular order.

explanatory sequential mixed method

explanatory sequential mixed method

explanatory sequential mixed method Explanatory Sequential Mixed MethodsIntroduction:Research methodology plays a crucial role in informing decision-making and understanding complex phenomena. Mixed methods research designs have gained popularity in recent years due to their ability to provide a comprehensive and holistic understanding of a research problem. One such design is the explanatory sequential mixed methods approach, which incorporates both quantitative and qualitative components in a sequential manner. This article aims to explain the explanatory sequential mixed methods design, its components, advantages, and limitations, with examples from various research studies.Components of the Explanatory Sequential Mixed Methods Design:The explanatory sequential mixed methods design consists of two distinct phases, namely the quantitative phase and the qualitative phase. In this design, the quantitative component is conducted first and is followed by the qualitative component. The purpose of the quantitative phase is to explore relationships and identify patterns in the data, while the qualitative phase aims to provide a deeper understanding of these relationships and patterns.Quantitative Phase:During the quantitative phase, researchers collect and analyze quantitative data using structured surveys, experiments, orsecondary data sources. The goal is to generate numerical data that can be analyzed using statistical techniques to test hypotheses or patterns. The findings from the quantitative analysis inform the selection of participants and the focus of the qualitative phase.Qualitative Phase:The qualitative phase involves collecting and analyzing qualitative data, such as interviews, observations, or document analysis. The purpose of this phase is to understand the underlying reasons and processes behind the quantitative findings. Qualitative data collection methods allow researchers to gather rich and detailed information that provides context and meaning to the statistical results. The qualitative analysis involves coding, categorizing, and interpreting the data to identify themes and patterns.Integration of Findings:The integration of findings is a crucial step in the explanatory sequential mixed methods design. During this stage, researchers compare and contrast the findings from both the quantitative and qualitative phases to develop a comprehensive understanding of the research problem. This integration can occur in different ways, such as comparing the results side by side, using statistical findings to interpret qualitative data, or using qualitative findings to explain statistical patterns. The aim is to provide a richer and more nuanced understanding of the research topic than could be achieved through a single method or phase.Advantages of the Explanatory Sequential Mixed Methods Design:The explanatory sequential mixed methods design offers several advantages over traditional quantitative or qualitative approaches. Firstly, it provides a more comprehensive understanding of the research problem by combining quantitative and qualitative data. The sequential nature of the design allows researchers to build on the findings from the quantitative phase and explore them in more depth during the qualitative phase. This approach strengthens the validity and reliability of the research findings.Secondly, the design allows researchers to address research questions that require both numerical data and contextual information. Some phenomena cannot be fully understood or explained by numbers alone, and qualitative data can provide valuable insights into the underlying reasons and processes.Thirdly, the design enhances triangulation, which refers to the use of multiple data sources or methods to validate findings. By combining quantitative and qualitative data, researchers can compare and contrast the different perspectives and identify converging or conflicting evidence. This strengthens the overall validity and trustworthiness of the research.Limitations of the Explanatory Sequential Mixed Methods Design:Despite its advantages, the explanatory sequential mixed methods design also has some limitations. Firstly, it requires time and resources to implement both quantitative and qualitative components. Researchers need to consider the feasibility of conducting both phases and ensure that they have the necessaryskills and expertise in both quantitative and qualitative methods.Secondly, the design may face challenges in terms of data integration and interpretation. Combining quantitative and qualitative findings can be complex and may require expertise in both types of data analysis. Researchers need to carefully consider how to integrate the findings in a meaningful and coherent manner.Example Studies:To illustrate the application of the explanatory sequential mixed methods design, three example studies are presented below:1. A study on the effectiveness of a health intervention program uses a quantitative survey to measure participants' health outcomes and satisfaction levels. The qualitative phase involves in-depth interviews with a sub-sample of participants to explore their experiences and perceptions of the program.2. A study on the impact of a teacher training program uses a quantitative pre-test and post-test design to measure changes in students' academic performance. The qualitative phase involves focus group discussions with teachers to understand their perspectives on the program's effectiveness and challenges.3. A study on the factors influencing employee satisfaction and retention uses a quantitative survey to measure employee satisfaction levels. The qualitative phase involves semi-structured interviews with a subset of employees to explore the underlying reasons for their satisfaction or dissatisfaction.Conclusion:The explanatory sequential mixed methods design offers a powerful approach to research that combines the strengths of quantitative and qualitative methods. By integrating numerical data with contextual information, this design provides a comprehensive and holistic understanding of research problems. Despite its limitations, the design has gained popularity due to its ability to address complex research questions and enhance the validity and reliability of findings. Researchers should consider the feasibility and appropriateness of this design for their specific research objectives and resources.。

基于QPR调节器谐波补偿的并网逆变器控制研究

基于QPR调节器谐波补偿的并网逆变器控制研究
第 39卷 第 3期 2020年 6月
兰州交通大学学报 JournalofLanzhouJiaotongUniversity
Vol.39No.3 Jun.2020
文章编号:1001?4373(2020)03?0067?08
DOI:10.3969/j.issn.1001?4373.2020.03.011
基于 QPR调节器谐波补偿的并网逆变器控制研究
ห้องสมุดไป่ตู้
刘宇翔1,滕青芳1,2
(1.兰州交通大学 自动化与电气工程学院,兰州 730070;2.甘肃省轨道交通电气自动化工程实验室,兰州 730070)
摘要:为改善微电网系统中的输出电能质量,针对并网逆变器输出电流中存在的谐波问题,设计了一种附加谐波补 偿器的 QPR控制器.首先,建立三相并网逆变器系统的数学模型;然后针对 QPR控制方法无法消除逆变器输出电 流中谐波的问题,构造了 QPR调节器与谐波补偿器并联的电流控制器,以实现对逆变器输出电流中谐波的抑制;最 后建立基于 QPR调节器谐波补偿的并网逆变器仿真模型.仿真结果表明,所构建的电流控制器系统具有谐波补偿 能力,采用该控制策略的并网逆变器系统具有高质量的输出电流和较小的功率及频率波动. 关键词:微电网;并网逆变器;谐波补偿;QPR调节器;电流控制器 中图分类号:TM464 文献标志码:A
68
兰州交通大学学报
第 39卷
并网逆变器中谐波的存在会使输出电流产生畸 变[2],给控制器的设计造成困难.文献[3]提出一种基 于自适应比例谐振(proportionalresonance,PR)调节器 的控制策略,其锁相环节对输出电流的相位具有锁相 能力,同时降低了系统注入电网的谐波含量,但锁相系 统的设计复杂,造成系统响应时间过长;文献[4]电流 控制器采用准比例谐振(quasiproportionalresonance, QPR)与谐波补偿器并联的控制方法,提出三电平光伏 并网逆变器控制策略,在电网不平衡条件下可有效抑 制逆变器输出电流中的谐波含量,克服了传统 PR控制 器的不足,但是未与无谐波补偿器的方法进行比较;文 献[5]提出自适应前馈补偿谐波的方法,在电压电流双 环 PI控制的基础上,增加含动态增益的补偿环节,对 PWM调制波进行重构,但忽略了直流侧波动造成的影 响;文献[6]提出一种基于电流环预测控制的选择性谐 波补偿方法,加入校正因子实现消除预测误差,达到对 低次谐波选择性补偿的目的;文献[7?8]采用神经网络 方法对控制器进行优化,该方法针对低次特征谐波进 行补偿,改善了并网电流波形的质量,但补偿精度依赖 于补偿增益的精确整定,因此存在补偿精度不高的缺 陷;文献[9]提出电压外环采用重复与 PR复合的控制 算法,重复控制消除电压谐波分量以改善输出电压波 形的质量,PR调节器以保证对基频给定电压信号的精 确跟踪,且在负载变化和负载非线性条件下有良好的 响应;文献[10]提出一种带有选择性谐波补偿器的 PR 电流控制方法,谐波补偿器能有效降低电网电流中的 谐波,但未将谐波补偿方法用于负荷变化过程.

基于经验回放Q-Learning的最优控制算法

基于经验回放Q-Learning的最优控制算法

2017年5月计算机工程与设计 May 2017第 38 卷第 5 期 COMPUTER ENGINEERING AND DESIGN Vol. 38 No. 5基于经验回放Q-Learning的最优控制算法黄小燕(成都信息工程大学控制工程学院,成都四川610225)摘要:针对实时系统的在线最优控制策略学计算开销高的缺点,提出基于经验回放和Q-Learning的最优控制算法。

采用 经验回放(experience replay,ER)对样本进行重复利用,弥孙实时系统在线获取样本少的不足;通过Q-Leam ing算法并 采用梯度下降方法对值函数参数向量进行更新;定义基于经验回放和Q-Learning的ER-Q-Learning算法,分析其计算复杂 度。

仿真结果表明,相比Q-Learning算法、S arsa算法以及批量的B LSPI算法,ER-Q-Learning算法能在有限时间内平衡 更多时间步,具有最快的收敛速度。

关键词:控制策略;经验回放;Q学习;实时系统;样本中图法分类号:T P181 文献标识号:A文章编号:1000-7024 (2017) 05-1352-04doi:10. 16208/j.issnl000-7024. 2017. 05. 043Optimal control based on experience replay and Q-LearningHUANG Xiao-yan(Control Engineering School, Chengdu University of Information Technology, Chengdu 610225, China) Abstract:Aiming at the problem of high computation cost in on-line optimal control strategy for real time system, an optimal control algorithm based on experience replay and Q-Learning was proposed. The experience replaying technique was adopted to reuse the samples, to solve the problem that real time system can not get enough samples. Through Q-Learning algorithm and gradient descent method, the parameter vector of value function was updated. The algorithm based on ER and Q-Learning was named ER-Q-Learning, and its computation cost was analyzed Results of simulation show compared with Q-Learning, Sarsa and BLSPI, ER-Q-Learning can balance more time steps than the three methods with higher convergence rate.Key words:control strategy;experience replaying;Q-Learning;real-time system;samples〇引言目前经典的在线强化学习[M]算法主要包括:动态规 划M、T D算法(包括Q学习算法和S arsa算法)和蒙 特卡洛算法[9]等,为了提高在线强化学习的学习效率和控 制策略的最优性,需要对样本进行重复利用。

安捷伦ADS信号完整性讲座(英文)

安捷伦ADS信号完整性讲座(英文)

YIELD OPTIMIZATION
OPTIMIZATION FROM LAYOUT DESIGN OF EXPERIMENT
YIELD NALYSIS
AUTOMATED FINITE METAL THICKNESS
PHYSICAL CONNECTIVITY ENGINE FAST 2.5D EM SIMULATOR
Time Domain Numeric Domain Electromagnetic Domain
• Method of Moment • Finite Element Analysis • Finite Difference Time Domain
Page 6
3DEM, Simulation and Measurement Advances for 2006 Expands SI Horizons
3DEM, Simulation and Measurement Advances for 2006 Expands SI Horizons
Serial Link Design - Simulation Challenges
• Why S-parameter are important at high data rate? • Majority of the SPICE simulator have problem dealing with S-parameter models • Majority of SPICE simulators cannot predict accurate time domain response from S-parameter interconnect models • BBSPICE have problems dealing with noisy S-parameter data • SERDES could not be modeled • Other DSP tools alone are not sufficient to model RF Channel • Integrated EM simulator are must for a successful design

APPLICATION RUNTIME DETERMINED DYNAMICAL ALLOCATIO

APPLICATION RUNTIME DETERMINED DYNAMICAL ALLOCATIO

专利名称:APPLICATION RUNTIME DETERMINEDDYNAMICAL ALLOCATION OFHETEROGENEOUS COMPUTE RESOURCES 发明人:LIPPERT, Thomas,FROHWITTER, Bernhard 申请号:EP2019/051615申请日:20190123公开号:WO2019/145354A1公开日:20190801专利内容由知识产权出版社提供专利附图:摘要:The present invention provides a method of operating a heterogeneous computing system comprising a plurality of computation nodes and a plurality of boosternodes, at least one of the plurality of computation nodes and plurality of booster nodes being arranged to compute a computation task, the computation task comprising a plurality of sub-tasks, wherein in a first computing iteration, the plurality of sub-tasks are assigned to and processed by ones of the plurality of computation nodes and booster nodes in a first distribution; and information relating to the processing of the plurality of sub-tasks by the plurality of computation nodes and booster nodes is used to generate a further distribution of the sub-tasks between the computation nodes and booster node for processing thereby in a further computing iteration.申请人:PARTEC CLUSTER COMPETENCE CENTER GMBH地址:Possartstr. 20 81679 München DE国籍:DE代理人:TOMLINSON, Edward James更多信息请下载全文后查看。

第七章 谐波平衡法仿真

第七章 谐波平衡法仿真

Use sweep plan
是否使用扫描计划
(3)Oscillator:用户可以通过设置【Oscillator】选项卡的相关参数进 行振荡器分析,如图7-5所示。在压控振荡器设计中重点介绍该选项卡的使 用。 (4)Noise:用户可以利用【Noise】选项卡对噪声分析的相关参数进行设 置,如图7-6所示。
KrylovSS_Tol= KrylovUseGMRES_Float= RecalculateWaveforms= UseCompactFreqMap= OscMode= OscPortName= IgnoreOscErrors= SweepVar= SweepPlan= Start=1 Stop=10 Step=1 Center= Span= Lin=
图7-2 谐波平衡仿真控制器
HARMONIC BALANCE
双击 图标,弹出谐波平衡控制器参数设置窗口,主要包括 【Freq】、【Sweep】、【Intial Guess】、【Oscillator】、【Noise】、 【Small-Sig】、【Params】、【Solver】、【Output】、【Display】 10个选项卡。 (1)Freq:谐波平衡法仿真需要设置仿真执行时的基准频率和高次谐波等 相关参数,用户可以通过【Freq】选项卡进行这些参数设置,如图7-3所示。 相关参数描述及说明如表7-1所示。
通过它可以模拟电路的1dB输出功率、效率以及IP3等与非线性有关的量。 谐波平衡法仿真有如下的功能: •确定电流或电压的频谱成分; •计算参数,如:三阶截取点,总谐波失真及交调失真分量; •执行电源放大器负载激励回路分析; •执行非线性噪声分析。
7.2谐波平衡法仿真面板与仿真控制器
ADS中有专门针对谐波平衡法仿真的元件面板,在“Simulation-HB”类 元件面板中包括了所有谐波平衡参数仿真需要的控件,如图7-1所示。 主要控件名称:

ADS中HARMONIC

ADS中HARMONIC

ADS中HARMONIC BALANCE学习-1第⼀章:引⾔谐波平衡分析法是⼀种⽤于获取⾮线性电路和系统的稳态相应解的⾼精度频域分析⽅法。

谐波平衡分析法假设了系统的输⼊信号是由⼀些稳态正弦信号组成。

因此,系统的响应解也应该是由稳态正弦信号叠加⽽成,这些成分包含了输⼊信号的频谱以及任何谐波分量的混合。

谐波平衡分析法纵观在谐波平衡分析法中,⽬标是计算⼀个⾮线性电路的稳态解。

在仿真过程中,表⽰电路的是⼀个由N个⾮线性常微分⽅程表⽰的系统,N代表电路的尺⼨(节点数⽬和⽀路电流)。

源和解的波形(所有的节点电压和⽀路电流)均由截断的傅⽴叶序列表⽰。

因此,⼀个成功的仿真会⽣成解答的波形傅⽴叶系数。

单⼀输⼊信号的电路需要⼀个单⼀频率的谐波平衡仿真器,其解的波形(例如节点电压)可以近似由下式表⽰:v(t)=real( sum(k)(vk*exp(j*2*pi*k*f*t)) )其中的f是输⼊信号的基础频率(基频),系数Vk是由谐波平衡分析计算得到的复傅⽴叶序列的系数,K是截断级(也就是谐波的数量),称为Order。

含有多个频率成分的输⼊信号激励的电路需要⼀个多基频的仿真。

这种情况下,稳态解的波形可以近似由下⾯截断的多维傅⽴叶序列表⽰:v(t)=real(sum(k1)sum(k2)sum(k3)....vk*exp(j*pi*(k1*f1+k2*f2.....+kn*fn)t))其中的n是源的数⽬,f1~fn是每⼀个源的频率(基频),k1~kn是每⼀个基频产⽣的谐波数。

对于解的波形的截断傅⽴叶表⽰法将N个⾮线性微分⽅程的体系转换到了频域中⼀个N*M个⾮线性代数⽅程的体系,M是所有需要考虑的频率总数,包含了基频、谐波和混合分量。

解这个⾮线性代数⽅程就能够得到傅⽴叶系数,解法成为⽜顿法。

这种⽅法是HB仿真器的外部解算器。

⽜顿法能够成功地由初始猜想出发迭代到达最终的解。

⾮线性代数⽅程系统在频域中代表了基尔霍夫电流定律。

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Time-Mapped Harmonic BalanceOgnen J.Nastov Jacob K.WhiteMotorola,Inc.Massachusetts Institute of Technology Austin,TX78730Cambridge,MA02139ojn@ white@AbstractMatrix-implicit Krylov-subspace methods have made it possible to efficiently compute the periodic steady-state of large circuits using either the time-domain shooting-Newton method or the frequency-domain harmonic balance method.However,the harmonic bal-ance methods are not so efficient at computing steady-state solu-tions with rapid transitions,and the low-order integration meth-ods typically used with shooting-Newton methods are not so effi-cient when high accuracy is required.In this paper we describe a Time-Mapped Harmonic Balance method(TMHB),a fast Krylov-subspace spectral method that overcomes the inefficiency of stan-dard harmonic balance in the case of rapid transitions.TMHB fea-tures a non-uniform grid to resolve the sharp features in the sig-nals.Results on several examples demonstrate that the TMHB me-thod achieves several orders of magnitude improvement in accuracy compared to the standard harmonic balance method.The TMHB method is also several times faster than the standard harmonic bal-ance method in reaching identical solution accuracy.1IntroductionThe exploding demand for high performance wireless products has increased the need for more efficient and accurate simulation tech-niques for communication integrated circuits.Designers of such circuits are interested in some quantities which can be computed from small-signal analysis,but many,such as harmonic and in-termodulation distortion,require the accurate computation of the circuit’s steady-state.The two most commonly used approaches to computing a circuit’s steady-state are the shooting-Newton me-thod[1],and the Harmonic Balance(HB)method[5,3].Recent al-gorithmic developments,based on preconditioned matrix-implicit Krylov-subspace algorithms[4,6,8],have made these methods even more popular as now they can be used to easily analyze cir-cuits with hundreds of devices.The advantage of the shooting-Newton method is that it is a time domain method which can select time-points based on local error estimation.Therefore,shooting-Newton methods can easily handle circuits where the solution waveform has sharp transitions. The advantage of Harmonic Balance is that it is a spectrally ac-curate method,and therefore the solution converges exponentially fast with increasing harmonics.However,the effective time-steps used by the Harmonic Balance method are uniformly spaced,and this implies that the method requires a large number of harmonics when the circuit solution contains very rapid transitions.In this paper we describe a Time-Mapped Harmonic Balance method(TMHB),a fast Krylov-subspace spectral method utiliz-ing a non-uniform grid to resolve the sharp features in the sig-nals.At the core of the method are the grid selection strategies[7] and their use in construction of a time-map function specific to the simulated circuit.In the next section we overview the stan-dard Harmonic Balance method.In Section3we detail the Time-Mapped Harmonic Balance algorithm.We derive the algorithm, give a Krylov-subspace based solution technique,describe the post-processing procedure used to obtain the actual Fourier coefficients from the TMHB solution,and detail the procedure used to construct the time-map function.In Section4we present results on several examples that demonstrate that the TMHB method achieves sev-eral orders of magnitude improvement in accuracy compared to the standard HB method.We also show that the TMHB method is sev-eral times faster than the standard HB method in reaching identical solution accuracy.Finally,conclusions are given in Section5.2Standard Harmonic BalanceConsider a circuit described with N nonlinear differential equa-tions:˙q v t i v t u t0(1) where v t R N is the vector of node voltages,q v t R N the vector of node charges(orfluxes),i v t R N the vector of resis-tive node currents,and u t R N the vector of input sources.Let the circuit be driven by a single periodic excitation input source with period T.Finding the periodic steady-state solution of this circuit consists of computing the N steady-state waveforms v t on the solution domain t0T.The periodic steady-state solution of(1)satisfies the two-point constraint:v T v0(2) In the standard HB method,the solution waveforms are approx-imated with truncated Fourier series:v tk K∑k KV k e j2πk ft(3)with K the number of harmonics considered in the truncation.The method solves for the Fourier coefficients V k.The approximation (3),in conjunction with the N circuit equations(1),results in the residual function:f V tK∑k Kj2πk f Q k e j2πk ft iK∑k KV k e j2πk ft u t(4)which is to be minimized on0T.The minimization of(4)is typically carried out by enforcing f V t0on the uniform grid of M collocation(interpolation) time-points where M2K 1.This standard HB method is more accurately referred to as pseudospectral Harmonic Balance[2].___________________________Permission to make digital/hardcopy of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage, the copyright notice, the title of the publication and its date appear, and notice is given that copying is by permission of ACM, Inc. To copy otherwise, to republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee.DAC 99, New Orleans, Louisiana(c) 1999 ACM 1-58113-109-7/99/06..$5.003Time-Mapped Harmonic BalanceIn contrast to standard Harmonic Balance,Time-Mapped Harmonic Balance(TMHB)utilizes a non-uniform grid of time-points.non-uniform grid is selected such that it has increased resolution the high-gradient regions of the solution waveforms,i.e.itthe sharp waveform features in order to obtain greater solution curacy.We now introduce the notion of pseudo time,were pseudo timeˆt is related to real time via the time-map functionλsuchtλˆt,λ00,andλT T.The time-map functiona uniform grid of pseudo time-points into the non-uniform grid real time-points.The time-map functionλis constructed in two phases.first phase is computing a grid of non-uniform time-points.non-uniform time-points are determined by examining thefrom solving the periodic steady-state problem using a Newton time-domain method with a low-order integration scheme. In the second phase,the non-uniform grid is spectrally interpolated to yieldλ.The details of this construction are given in Subsec-tion3.3.To derive the Time-Mapped Harmonic Balance(TMHB)me-thod,consider thatddt1λˆtddˆt(5)Replacing the time-derivative in(1)with(5)yields1λˆt ddˆtq vλˆt i vλˆt uλˆt0(6)and the two-point constraint becomesvλT vλ0(7) The solution waveforms in TMHB are approximated with trun-cated pseudo Fourier series:v t vλˆtk K∑k KˆVk ej2πk fˆt(8)whereˆV k are the pseudo Fourier coefficients of the solution wave-forms.Equations(6)and(8)yield the residual functionˆfˆVˆt1λˆtK∑k Kj2πk fˆQ k e j2πk fˆt iK∑k KˆVk ej2πk fˆt uˆt(9)which is to be minimized on0T.The minimization is carried out by a collocation method,enforcingˆfˆVˆt0on the uniformpseudo grid of collocation points.The non-uniform grid in real time in effect“stretches”out thoseregions of the solution waveforms with sharp features.As a re-sult,the TMHB solution v t in real time is the smoother wave-form vλˆt when viewed in pseudo time,as illustrated in Figure1.Since the waveform is smoother in pseudo time,its features aremore easily resolved with an M-point uniform pseudo grid,com-pared to resolving the original fast varying waveform in real timewith an M-point uniform real time grid in the HB method.Thusone expects better accuracy from the TMHB method.The rapid transitions in the solution waveforms are better ap-proximated with the pseudo Fourier series(8),whose buildingblocks are complex exponential basis functions with smoothly vary-ing frequencies.The greater accuracy of the TMHB method stemsfrom the smaller global truncation error of the pseudo Fourier seriesfor the(smoother)solution waveform in pseudo time,compared tothe global truncation error of the standard HB Fourier series ap-proximation of the solution waveform in real time.Figure1:The smoothing effect of the non-uniform grid of TMHB: (A)v COIL in real time;(B)time-map function;(C)v COIL in pseudo time.3.1Matrix-Implicit Krylov-Subspace Approach Equation(9)is now rewritten in the frequency domain yielding NM nonlinear algebraic equationsˆFˆVΓΛΓ1ΩΓqΓ1ˆVΓiΓ1ˆVΓu0(10) whereΩis the diagonal frequency-domain differentiation matrixΩj2πK f I Nj2πK1f I N......j2πK f I N(11)Λis the diagonal matrixΛ1λˆt1I N1λˆt2I N...1λˆt MI N(12)and I N is the identity matrix of size N.The matricesΓandΓ1 are DFT matrices that perform the conversions from pseudo time to frequency and vice-versavΓ1ˆVΓ1e j2πK fˆt1I N e j2πK fˆt1I N......e j2πK fˆt M I N e j2πK fˆt M I N(13)Since the pseudo grid is uniform,the DFT can be carried out in O NM log M operations using the FFT just as in the standard HB.Applying the Newton method to(10)results in the iterationJ lˆV l1ˆV lΓΛΓ1ΩΓC lΓ1ΓG lΓ1ˆV l1ˆV lˆFˆV l(14) where l is the Newton iteration index.The block-diagonal matricesC and G areC C1C2...C MGG1G2...G M(15)where C m dq vλˆt mdv dq v t mdvand G m di vλˆt mdvdi v t mdv,and can therefore be evaluated in real time on the non-uniform grid of real time-points t m.The Newton iteration(14)is a linear problem.Explicitly form-ing and factoring the dense TMHB Jacobian J is very expensive, O NM3.As in standard HB,a preconditioned iterative linear solver such as GMRES can be used to reduce the complexity to O NM2.Further reductions in complexity are obtained by implicitly form-ing the GMRES matrix-vector product by sequential evaluation us-ing FFTs,to O NM log M.The diagonal blocks of the Jacobian work well as a standard preconditioner in most circuit examples. Therefore the complexity of TMHB is the same O NM log M as the state-of-the-art matrix-implicit Krylov-subspace standard Har-monic Balance[4,6,8].The TMHB yields the pseudo Fourier coefficientsˆV of the volt-age waveform solutions that can be related to the real Fourier co-efficients V.Note that if time-domain waveforms are desired,due to(8),an inverse FFT readily yields the voltage waveforms at the non-uniform grid of real time-points.v t vλˆtΓ1ˆV(16) 3.2Computing the Real Time Fourier CoefficientsTo compute the real time Fourier coefficients V,we use the fol-lowing“unmap”procedure.We introduce a non-uniform oversam-pled grid in pseudo time such thatλmaps this oversampled grid in pseudo time to a uniform oversampled grid in real time.Since ˆtλ1t,(8)can be rewritten asv tk K∑k KˆVk ej2πk fλ1t(17)The summation in(17)is then evaluated to give the solution wave-forms at the oversampled uniform grid in real time.Note thatthe summation cannot be carried out by an inverse FFT since thepseudo time-pointsλ1t m form a non-uniform grid.Finally,since the v t’s are now known on a uniform grid in real time,we can usethe FFT to compute the real Fourier coefficients V.Note that this procedure actually yields more than M2K1Fourier coefficients.The additional Fourier coefficients representthe higher frequencies captured by the non-uniform grid in TMHB.These coefficients are shown to match the Fourier coefficients ofthe“exact”solution quite well(Figure2).Without oversampling,these coefficients would be zero and some of the additional accu-racy obtained by the TMHB method would be lost.In effect the M pseudo Fourier coefficientsˆV“pack”high fre-quency information content,and in order to preserve it,we mustcarry the“unmap”procedure utilizing the oversampling frequen-cies above K.The rate of oversampling is determined by the Nyquist fre-quency fσ12hmin corresponding to the smallest spacing h min inthe non-uniform grid in real time,where fromKσfσf12h min f(18)where Kσis the number of oversampling harmonics.Figure2:TMHB matching of high-frequency coefficients.The unmap procedure described above is in essence an over-sampled Fourier interpolation of the solution waveforms v t.This interpolation uses the discrete waveform values of v t at the non-uniform grid in real time to generate the discrete values of v t at the oversampled uniform grid in real time.It is crucial to use a spectrally accurate oversampled interpolation in order to preserve the accuracy of the solution.Local interpolation schemes(linear or quadratic)are not suitable for this task as they would introduce er-rors that are larger than the errors from the Fourier approximation of the solution.3.3The Time-Map FunctionThefirst step in determining the time-map functionλis to deter-mine a set of S non-uniform real time time-points.The success of the TMHB method is crucially dependent on this time-point se-lection[7],and the strategies used require an initial guess for the solution waveforms.In particular,an approximate solution is com-puted using a shooting-Newton method[5]with a low-order time integration scheme.The S non-uniform time-points for the TMHB method are then selected based on balancing two criteria:using small time-steps in the fast-varying regions of the approximate so-lution waveforms,and insuring that the time-steps do not change too rapidly.Although using a shooting-Newton method to compute the approximate solution is expensive,the cost is kept low by loos-ening the convergence tolerance.In addition,this shooting-Newton solution is useful as an initial guess for the TMHB.Given the S non-uniform real time time-points,the next step is the construction of the time-map function tλˆt that relates the uniform grid in pseudo time to the non-uniform grid in real time. In order to preserve the spectral accuracy of the TMHB method, the time-map function must be smooth,and we must be able to compute itsfirst derivative with spectral accuracy or better as it is used in(9).Furthermore,to ensure strict monotonicity of the non-uniform grid of real time-points,the time-map function must be strictly monotonic,i.e.λˆt0for allˆt0T.Finally,for unmap purposes,we also need to be able to computeλ1t.Wefirst representλˆt as a sum of a linear part and a T-periodic partλφˆttλˆtˆtλφˆt(19) The periodic partλφˆt is chosen to be a Fourier polynomial inter-polantφˆt of order S such that the interpolatory conditiont sˆt sφˆt s(20)is exactly satisfied at the points ˆts t s where t s are the Suniform real-time time-points,and ˆts are S uniform pseudo points.The interpolant φˆtis the truncated Fourier series φˆtJ∑kJΦk e j 2πk f ˆt where 2J 1S .The coefficients Φk can be computed with inverse FFT of size SΦJΦJΓ1t 1ˆt 1t SˆtS Thus the time-map function is constructed as:λˆtˆtJ∑kJΦk e j 2πk f ˆt and this approximation exactly passes through the points ˆtst s .The first derivative of the time-map function isλˆt1J∑kJj 2πk f Φk e j 2πk f ˆt (24)and is exact.The λfunction (23)and its first derivative (24)are now eval-uated at M uniform pseudo time-points to yield the M -point non-uniform grid in real time and the matrix of time-map derivatives Λ.Due to the Fourier nature of the representation (23),λˆtmay exhibit high frequency oscillations and violate the monotonicity re-quirement.In practice,for the grids selected,if S is sufficiently large,this violation rarely happens,and can be resolved by damp-ing the oscillations with an exponential filter µk ,yielding a filtered constructionλµˆtˆtJ∑kJµk Φk ej 2πk f ˆt(25)where µk e δk Sγand δand γare filter parameters.Note that thefiltered approximation no longer passes through the points ˆts t s .In addition,the filtered approximation can introduce an offset τsuch that λ0τand λT T τ.While this offset causes no problems to the TMHB method,excessive filtering can deteriorate the quality of the approximation.The values of λ1t at the oversampled uniform times t m is required in order to compute the actual Fourier coefficients.This is accomplished by applying Newton’s method to the nonlinear equa-tion λˆtm t m 0and solving for ˆt m at each time point t m .4ResultsIn this Section we compare the performance of the TMHB me-thod with standard state-of-the-art matrix-implicit Krylov-subspace Harmonic Balance [4,6,8].Both the standard HB and TMHB methods were implemented in Mica,Motorola’s SPICE-like circuit simulator.The best candidates for the TMHB method are circuits whose solution waveforms undergo rapid transitions.Many highly non-linear circuits will exhibit such waveforms.For these circuits the pseudo Fourier series solution representations of the TMHB me-thod will be much more efficient than the standard Fourier series used in the standard HB method.Four strongly nonlinear circuits were simulated with the HB and TMHB methods:a diode rectifier powered with a 50Hz sineFigure 3:DC-DC converter circuit:error in the computed Fourier coefficients of v COIL for K 50,in dB.Figure 4:DC-DC converter circuit,v COIL computed with:(A)stan-dard HB;(B)TMHB,at same number of harmonics K 50.input,a DC-DC converter with a 85kHz sine input,a BiCMOS switching mixer with a 1.8GHz square wave LO,and a BiCMOS IF preamplifier circuit driven into distortion with a 0.1V 110MHz sine input.Both the standard HB and TMHB methods in all runs used the same shooting-Newton solution guess.The Fourier coefficients V k of the “exact”solution were computed using a standard HB method with a very large number of harmonics.The four circuits were first simulated with both the standard HB and TMHB methods at a fixed number of harmonics.A plot of thefrequency-domain pointwise error εf k fV k V k in dB in each computed Fourier coefficient V k of the computed voltage v COIL ver-sus frequency in the DC-DC converter is shown in Figure 3(the number of harmonics was K 50).v COIL was chosen because it is the signal with sharpest features in the circuit.The plot illus-trates that the TMHB method computes each individual harmonic much more accurately than the standard HB.A plot of the com-puted v COIL waveforms with HB and TMHB at K 10is given in Figure 4illustrating the smaller TMHB error in the time domain.Similar results were observed for the computed waveforms in the other three circuits as well.Next,the four circuits were repeatedly simulated with the stan-dard HB and TMHB methods using increasing numbers of harmon-ics.Figures 5,6,7,and 8show the L ∞norm of the frequency-domain pointwise error εf in dB,for the computed Fourier coeffi-Figure 5:Diode rectifier circuit:L ∞of the error in i VIN ,in dB.Figure 6:DC-DC converter circuit:L ∞of the error in v COIL ,in dB.cients of a selected voltage or current waveform versus the number of harmonics K .The plots show orders of magnitude improvements in the accuracy of the TMHB solution compared to the standard HB solution.For example,at K 200the TMHB solution of v COIL in the DC-DC converter is about 100dB (5orders of magnitude)more accurate than the standard HB solution.The L ∞error as well as the errors in each individual harmonic for the remaining waveforms show the same superior error convergence properties.4.1Runtime Efficiency and Storage Requirements of TMHBA logical way to measure the runtime efficiency of the TMHB me-thod is to compare standard HB and TMHB runs achieving similar accuracies.Table 1summarizes these findings.The results were obtained on a Sun Ultra-2300MHz workstation.The accuracy εf was the L ∞norm of the frequency domain pointwise error in the computed Fourier coefficients for the waveforms used for the error convergence profile plots.The total CPU times include the time spent in the non-uniform grid selection,as well as a complete unmap of all solution wave-forms in the circuit.The complete unmap of all solution waveformsFigure 7:Switching mixer:L ∞of the error in i V 31,in dB.Figure 8:IF preamplifier:L ∞of the error in v OUT P ,in dB.is in general unnecessary in practice as only a few waveforms are of interest.A partial unmap of only the few needed waveforms can generate significant total CPU time savings for larger circuits with hundreds of waveforms.Table 1shows significant CPU runtime speedups for three of the four simulated circuits.For both the diode rectifier and the IF preamplifier,a speedup of 1.6is achieved.For the DC-DC con-verter the speedup is a factor of 6.The total CPU times T for the HB and TMHB methods in reaching a specific accuracy εf in v COIL from the DC-DC converter circuit are shown in Figure 9(A).The accuracy measure was again the L ∞norm of the frequency domain pointwise error in the com-puted Fourier coefficients.For less stringent accuracies,the total CPU times for the TMHB method are comparable to the HB CPU times due to the TMHB overhead in the non-uniform grid selection and waveform unmap.The situation is drastically different for ac-curacies better than -50dB:the TMHB becomes up to several times faster than the HB method.In addition the speedup factor grows with increases in required accuracies.The memory storage requirements for the TMHB method are the same as for the standard HB method,growing linearly with the number of harmonics K due to the storage of the Krylov subspace vectors in the GMRES linear solver.Since the TMHB method canStandard HB TMHBCircuit Nεf K T T L I L I N K T T L I L I NDiode Rectifier6-20065043.233.027********.2 6.8418714DC-DC Converter9-100100010801053248714180177156211212Switching Mixer105-13015067.321.83784562.813.1739IF Preamplifier289-1551701065861417189066251444117Table1:Comparison of the standard HB and TMHB methods at same achieved solution accuracy.N is the number of equations for the circuit andεf is the achieved accuracy in dB.K is number of harmonics,T is total CPU time,T L is linear solve time,I L is number of GMRES iterations,I N is number of Newton iterations.All times are in seconds.Figure9:DC-DC Converter:(A)total CPU time T,(B)number of harmonics K for HB and TMHB to reach a specific solution accuracyεf in v COIL.achieve the same solution accuracy as the standard HB method with a smaller number of harmonics,it follows that significant memory savings can be achieved by using the TMHB method.In particular, from Table1,we can measure the memory savings roughly as the ratio of the needed numbers of harmonics K for the standard HB and the TMHB method respectively.For example,the memory savings range from a factor of1.9for the IF preamplifier,to a factor of5.5for the DC-DC converter.Figure9(B)shows the required numbers of harmonics K needed by the HB and the TMHB methods,versus the reached accuracy in the v COIL waveform for the DC-DC converter circuit.Since the storage requirements are proportional to K the plot demonstrates that the TMHB method storage requirements at same solution ac-curacy are not only smaller than those of the HB,but also grow less rapidly for higher accuracy computations.5ConclusionsIn this paper we described the Time-Mapped Harmonic Balance method(TMHB),a fast Krylov-subspace spectral method that over-comes the limitations of standard state-of-the-art Krylov-subspace harmonic balance method for circuits with rapid transitions.The non-uniform grid in the TMHB method resolves the sharp features in the signals.The computational results show that at same num-bers of harmonics the TMHB method achieves up tofive orders of magnitude improvement in accuracy.The TMHB method re-tains the same complexity as the standard HB method,is up to six times faster than the standard HB method in reaching identical so-lution accuracy,and uses up tofive times fewer harmonics and less computer memory.The TMHB runtime speedup factor and stor-age savings favorably increase for stricter accuracy requirements, making TMHB well suited for high accuracy simulations of large strongly nonlinear circuits with rapid transitions. AcknowledgmentsThe authors would like to thank Kiran Gullapali,Jing Lee,and Brian Mulvaney for their valuable advice,help,and support dur-ing this research effort.This work was supported by grants from Motorola,Inc.,and the MAFET Consortium.References[1]Thomas J.Aprille and Timothy N.Trick.“Steady-State Anal-ysis of Nonlinear Circuits with Periodic Inputs.”Proceedings of the IEEE,V ol.60,No.1,pp.108–114,January1972. [2]C.Canuto,M.Y.Hussaini,A.Quarteroni,and T.A.Zang.Spectral Methods in Fluid Dynamics.Springer-Verlag,Berlin, New York,1987.[3]Rowan Gilmore and Michael B.Steer.“Nonlinear CircuitAnalysis Using the Method of Harmonic Balance-A Re-view of the Art.Part I-Introductory Concepts”.Int.J.on Microwave and Millimeter Wave Computer Aided Engineer-ing,V ol.1,No.1,1991.[4]P.Heikkil¨a.Object-Oriented Approach to Numerical CircuitAnalysis.Ph.D.dissertation,Helsinki University of Technol-ogy,January1992.[5]Kenneth S.Kundert,Jacob K.White,and AlbertoSangiovanni-Vincentelli.Steady-State Methods for Simulat-ing Analog and Microwave Circuits.Kluwer Academic Pub-lishers,1990.[6]R.Melville,P.Feldmann,and J.Roychowdhury.“EfficientMulti-Tone Distortion Analysis of Analog Integrated Cir-cuits”.Proceedings of the Custom Integrated Circuits Con-ference,May1995.[7]Ognen J.Nastov and Jacob K.White.“Grid Selection Strate-gies for the Time-Mapped Harmonic Balance Simulation of Circuits with Rapid Transitions.”Proceedings of the IEEE Custom Integrated Circuits Conference,May1999.[8]R.Telichevesky,K.Kundert,and J.White.“Efficient Steady-State Analysis Based on Matrix-Free Krylov-Subspace Meth-ods”.Proceedings of the IEEE Design Automation Confer-ence,pp.480–484,1995.。

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