边界扫描测试原理与应用

History of the Standard
1985 – JETAG (Joint European Test Action Group) 1986 – JTAG (Europe and North America) 1988 – P1149 JTAG v2 (proposal) 1990 – IEEE Std 1149.1 -1990 1993 – IEEE Std 1149.1a-1993 1994 – IEEE Std 1149.1b-1994 (BSDL) 2001 – IEEE Std 1149.1 - 2001
Intelligent Boundary Scan Solutions®
Boundary Scan Overview
「邊界掃描測試」
測試原理與應用
Intelligent Boundary Scan Solutions®
Boundary Scan Test測試之定義
所謂邊界(Boundary):係指IC腳端與內 部(功能邏輯閘)晶片間之接點。 換言之進行掃描測試IC腳端與晶片間之 接點邊界，係所謂之「邊界掃描測試」。 1990年經由IEEE 1149.1加以規格化之 BST測試，俗稱為「邊界掃描測試」 (Boundary Scan Test)
• IEEE-1149.5=> system level test • IEEE-1149.6=> Differential & AC coupled
networks
• IEEE-1532
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=> In-System-Programming
BScan Basics No. 3
Intelligent Boundary Scan Solutions®
BScan Basics
More Details on
Intelligent Boundary Scan Solutions®
• IEEE-1149.1=> digital interconnection test
• IEEE-1149.4=> mixed-signal and analog
interconnection test
Terms synonyms with IEEE Std 1149.1 Boundary Scan / BSCAN / BST JTAG (Joint Test Action Group)
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Boundary Scan Test測試之必要性
Intelligent Boundary Scan Solutions®
Intelligent Boundary Scan Solutions®
BScan Cell
Test Data In Test Clock
(TDI) (TCK)
Test Access Port
Test Mode Select (TMS)
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(TAP) TCK
Test Data Out (TDO)
No. 11
BScan Basics
IEEE-1149.1
Intelligent Boundary Scan Solutions®
Test Access Port (TAP ) 測試存取埠
Data Register
n 0
BScan Register
31 0
0
MUX
IDcode Register, opt. TDI
n
Bypass Register
0
TDO
Instructions Register TCK TMS
TAP Controller
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BScan Basics
No. 12
IEEE-1532
In-System Programming
Intelligent Boundary Scan Solutions®
TCK TMS TDO TDI
PIN2 PIN4 PIN6 PIN8
GND GND GND GND NC
TRST PIN10
BScan Basics
串接方式為TMS,TCK,TRST並聯 ，TDI,TDO串聯
Intelligent Boundary Scan Solutions®
TDI
TDO
TDO TMS TCK TDI
若PCB印刷基板採用BScan測試相容元件時， 最多僅需5條(通常為4條)之專用線，即可測試:
1. Test Data In (TDI )
2. Test Data Out
(TDO)
3. Test Mode Select (TMS) 4. Test Clock 5. Test Reset (TCK) (TRST) =>可以省略不用
<5> Non-BGA IC腳的開路測試
Βιβλιοθήκη Baidu
<6> 可在板上燒錄資料(ISP) Flash / EEPROM
(ISP) PLD / FPGA Devices <7> 內部邏輯電路之功能測試
BScan Basics
IEEE-1149.1
Testbus Signals
Intelligent Boundary Scan Solutions®
*註=>通常用六個Clock，當作一個Reset
BScan Basics
板子上整個連接到 Boundary Scan 的介面連接器
Intelligent Boundary Scan Solutions®
• I/O Interface，10PIN 100mil公的連接器
PIN1 PIN3 PIN5 PIN7 PIN9
Bscan Cell
BScan nets
BScandevice
non
BScan IC
BScandevice
BScandevice
TAP
TAP
TAP
TMS TCK
Testbus interconnection
TDI
測試存取埠
TAP = Test Access Port
9/21/2014
TMS = Test Mode Select TCK = Test Clock TDI = Test Data In TDO = Test Data Out
BScan Basics
Boundary Scan Test測試之功能
Intelligent Boundary Scan Solutions®
<1> 元件之誤插接及臨近元件的短路測試
<2> 外界電路與元件間之輸入/輸出信號監視
<3> 元件間之互接測試(Interconnecting Test)
<4> 可測試BGA元件之開路與短路作測試
• Programming devices (volatile or non-volatile)離散元件
mounted on a PCB through IEEE-1149.1 compliant TAP =>PLD / FPGA Devices • Programmable devices compliant to IEEE-1532 have a system mode and a test mode: • System mode: differentiates 4 system modal states: • Unprogrammed (在未寫入資料前) • ISC Accessed (ISC Data file寫入) • ISC Complete (ISC Data file完成 ) • Operational (驗證) • Test mode :conform to IEEE-1149.1
from different vendors can be programmed concurrently • Programming algorithm and data are separated
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Integration with Flying Probe Tester (BScan+FPT)
BScan Basics
Boundary Scan Layout information 「邊界掃描測試」 相容線路設計需知
Intelligent Boundary Scan Solutions®
Boundary Scan Test測試之原理
Intelligent Boundary Scan Solutions®
• a single device on a device programmer • a single device in-system • multiple devices concurrently in-system
• Standard conform devices of different types
BScan Basics
Intelligent Boundary Scan Solutions®
Boundary Scan Test測試之原理(二)
若PCB印刷基板採用BScan測試相容元件時， 最多僅需5條(通常為4條)之專用線，即可測試:
1. Test Data In 2. Test Data Out (TDI ) (TDO)
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IEEE-1532=> In-System-Programming
Conclusion
Intelligent Boundary Scan Solutions®
• IEEE 1532 can be used for programming of
3. Test Mode Select (TMS) 4. Test Clock 5. Test Reset (TCK) (TRST) =>可以省略不用
BScan Basics
*註=>通常用六個Clock，當作一個Reset
Intelligent Boundary Scan Solutions®
Boundary Scan Test測試之原理(三) 所謂[測試存取埠]:TAP(Test Access Port) =>係指為進行測試邏輯電路之指令，測試 數據或測試結果等數據加入輸入/輸出之串 列介面，上述4條信號線，經由外界之電 腦主機加以控制，以便執行BScan測試。
BScan Basics
TDI,TDO串接方式注意
Intelligent Boundary Scan Solutions®
• Boundary Scan controller 的連接器上的
TDI ，接到串接上第一個 BS IC 的 TDI ，第一個 BS IC 的 TDO 接第二個 IC 的 TDI，以此類推； 最後一個 IC 的 TDO 則接連接器上的 TDO。
（包含 BGA ）的開短路 測試 • Boundary Scan IC ID 檢查 • DRAM讀寫測試 • Flash , EEPROM 讀寫 測試及資料在板燒錄 (On Board programming)
•
• •
•
特性： 測試速度快（可在一分鐘之 內測完一片主機版） 主要針對有提供 Boundary Scan IC 的量測 主要針對開短路的製程問題 做測試 可分為做治具及不做治具的 方法，治具成本遠比 ICT 治具類便宜。(因測試點變少)
• 簡易型AOI功能 • 速度稍慢 • 可涵蓋所有被動零
開路測試 • 上電後電壓/電流測試
BScan Basics
件測試 • 短路測試為選擇性 考量
What Boundary Scan Can Test
• 數位邏輯 IC 零件: •
Intelligent Boundary Scan Solutions®
BScan Basics
TDO
No. 9
IEEE-1149.1
Intelligent Boundary Scan Solutions®
Standard Device
Pin Core Logic
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BScan Basics
No. 10
IEEE-1149.1
BScan Device
Pin Core Logic ... some extra “intelligence” is needed for Test Access
What FPT Can TEST?
• 類比元件的值 • 特性
Intelligent Boundary Scan Solutions®
• Resistor • Capacitor • Inductor • Transistor
• 臨近元件的短路測試 • Non-BGA IC腳的
• 無治具 ICT 測試